JP2006148441A - Imaging apparatus - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an imaging apparatus capable of properly correcting a V line defect in motion image photographing. <P>SOLUTION: The imaging apparatus is configured in such a way that any one can be selected from two kinds of methods, i.e. a method for detecting an offset component equivalent to the defect level to correct a linear defect (V line defect) generated on an image due to a defect on a vertical CCD of an imaging element (CCD), and a method for correcting the linear defect by pixel interpolation from adjacent pixel data of the V line defect. However, in motion image photographing, the correction method is selected by pixel interpolation which requires no detection of the offset component and can perform comparatively quick processing. This result leads to proper correction of the V line defect in motion image photographing. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to an imaging apparatus capable of moving image shooting.

  For example, image sensors (CCDs) used in digital cameras (imaging devices) tend to be smaller and have higher pixels, but pixel defects are increasing accordingly.

  Patent Document 1 discloses a technique for correcting pixel defects based on address data of defective pixels stored in a memory.

JP-A-7-162757

  However, although the technique disclosed in Patent Document 1 can correct a defect generated in a pixel (photodiode), a line defect (V line defect) on an image caused by a defect in a vertical transfer line (vertical CCD). It is not always possible to accurately correct this. That is, the V-line flaw has a temperature dependency and has characteristics that are not present in the pixel defect in that all signal charges passing through the defective portion of the vertical transfer line are adversely affected. It is considered that effective correction cannot be performed by simply applying the correction method for.

  In particular, when taking a video for a long time, the temperature of the image sensor rises.Therefore, a change (increase) occurs in a defective portion on the vertical transfer line due to the above temperature dependency. It is difficult to detect and apply appropriate corrections one by one during shooting.

  The present invention has been made in view of the above problems, and an object of the present invention is to provide an imaging apparatus that can appropriately correct a V-line flaw during video shooting.

  In order to solve the above problems, the invention of claim 1 is an imaging device capable of shooting a moving image, and (a) an imaging device having a vertical CCD and a horizontal CCD and capable of outputting an image relating to a subject. And (b) storage means for storing defect position data relating to the defect location on the vertical CCD, and (c) for the line-shaped scratch generated in the image due to the defect location, the defect location data. Image correction means for performing correction processing based on the image correction means, the image correction means selectively (c-1) a plurality of correction processing including correction processing by pixel interpolation using peripheral pixel information of the linear scratches And (c-2) selection control means for causing the selection execution means to select the correction processing by pixel interpolation at the time of moving image shooting.

  The invention according to claim 2 is the imaging apparatus according to claim 1, further comprising (d) a state detecting means for detecting a state relating to the moving image shooting, wherein the defect position data detects the defect location. A plurality of data having different time points; and (c-3) selecting one data from the plurality of data according to a state detected by the state detecting unit; Means for performing the correction processing based on the data;

  According to a third aspect of the present invention, in the imaging apparatus according to the second aspect of the invention, the state detecting means includes (d-1) means for detecting the state by a timer and / or a temperature sensor.

  According to a fourth aspect of the present invention, in the imaging apparatus according to any one of the first to third aspects of the present invention, (e) defect detection means for detecting the defective portion when moving image shooting is completed. .

  According to a fifth aspect of the present invention, in the imaging apparatus according to the second or third aspect of the present invention, (f) a determination for determining a shootable time of the moving image shooting based on a state detected by the state detection unit Means are further provided.

  Further, the invention of claim 6 is the imaging apparatus according to the invention of claim 5, wherein (g) display means, and (h) display control means for causing the display means to perform display relating to the shootable time of the moving image shooting. Is further provided.

  According to the first to seventh aspects of the present invention, when correction processing for a line-shaped flaw generated in an image due to a defective portion on the vertical CCD is performed at the time of moving image shooting, the peripheral pixel information of the line-shaped flaw A correction process by pixel interpolation using the above is selected from a plurality of correction processes and executed. As a result, it is possible to appropriately correct the V-line flaw during video shooting.

  In particular, according to the second aspect of the present invention, since one data is selected from a plurality of data at different time points at which a defective portion is detected according to the state relating to moving image shooting, and correction processing is performed based on the one data, Appropriate correction can be made according to

  In the invention of claim 3, since the state is detected by the timer and / or the temperature sensor, it is possible to perform appropriate correction according to the temperature change or the like.

  Further, in the invention of claim 4, since the defective portion is detected when the moving image shooting is completed, the latest defect position data usable for the next shooting can be acquired.

  According to the fifth aspect of the present invention, since the shootable time for moving image shooting is determined based on the state detected by the state detection means, it is possible to improve image quality by appropriately suppressing an increase in V-line scratches.

  According to the sixth aspect of the present invention, since the display unit displays a display relating to the shootable time for moving image shooting, the photographer can easily grasp the shootable time.

<Principal configuration of imaging device>
FIG. 1 is a diagram illustrating a main configuration of an imaging apparatus 1 according to an embodiment of the present invention. Here, FIGS. 1A to 1C correspond to a front view, a rear view, and a top view of the imaging apparatus 1, respectively.

  The imaging device 1 is configured as a digital camera and includes a photographing lens 10.

  The imaging apparatus 1 is provided with a mode switch 12 and a shutter button 13 on the top surface thereof.

  The mode changeover switch 12 is recorded in a still image shooting mode (REC mode) for capturing an image of a subject and recording the still image, a moving image mode for moving image shooting (MOVE mode), and a memory card 9 (see FIG. 2). This is a switch for switching between a playback mode (PLAY mode) for playing back an image.

  The shutter button 13 is a two-stage switch that can detect a half-pressed state (S1 on) and a fully pressed state (S2 on). When the shutter button 13 is half-pressed in the still image shooting mode, the zoom / focus motor driver 47 (see FIG. 2) is driven, and the operation of moving the shooting lens 10 to the in-focus position is performed. On the other hand, when the shutter button 13 is fully pressed in the still image shooting mode, a main shooting operation, that is, a recording shooting operation is performed.

  An LCD (Liquid Crystal Display) monitor 42 for displaying captured images and the like, an electronic viewfinder (EVF) 43, and a frame advance / zoom switch 15 are provided on the rear surface of the imaging apparatus 1.

  The frame advance / zoom switch 15 is composed of four buttons, and is a switch for instructing frame advance of a recorded image in playback mode and zooming at the time of shooting. By operating the frame advance / zoom switch 15, the zoom / focus motor driver 47 shown in FIG. 2 is driven to change the focal length related to the photographing lens 10.

  FIG. 2 is a diagram illustrating functional blocks of the imaging apparatus 1.

  The imaging device 1 includes an imaging sensor 16, a signal processing unit 2 connected to the imaging sensor 16 so as to be able to transmit data, an image processing unit 3 connected to the signal processing unit 2, and a camera control unit 40 connected to the image processing unit 3. And.

  The imaging sensor 16 is configured as an area sensor (imaging device) in which R (red), G (green), and B (blue) primary color transmission filters are arranged in a checkered pattern (Bayer array) in units of pixels. This is a pixel readout type. The temperature of the imaging sensor 16 can be detected by a temperature sensor 49 that measures the temperature in the housing of the imaging device 1.

  When charge accumulation is completed by exposure in the image sensor 16, the photoelectrically converted charge signal is shifted to the light-shielded vertical / horizontal transfer path in the image sensor 16, and is output as an image signal from here through the buffer. .

  The signal processing unit 2 includes a CDS 21, an AGC 22, and an A / D conversion unit 23, and functions as a so-called analog front end.

  The analog image signal output from the image sensor 16 is sampled by the CDS 21 and noise is removed, and then the AGC 22 multiplies the analog gain corresponding to the photographing sensitivity to perform sensitivity correction.

  The A / D conversion unit 23 is configured as a 14-bit converter, and digitizes the analog signal normalized by the AGC 22. The digitally converted image signal is subjected to predetermined image processing by the image processing unit 3 to generate an image file.

  The image processing unit 3 includes a point defect correction unit 51, a V line flaw detection unit 52, and a V line flaw correction unit 53. The image processing unit 3 includes a digital processing unit 3p, an image compression unit 36, a video encoder 38, and a memory card driver 39.

  For the image data input to the image processing unit 3, first, pixel data in which a defect exists is replaced with correction data based on a point defect address stored in advance in the point defect correction unit 51. In the V-line flaw detection unit 52 and the V-line flaw correction unit 53, a line-like flaw (hereinafter referred to as “V-line flaw”) generated on the image due to a defective portion of the vertical transfer line (vertical CCD) of the image sensor 16. (Referred to in detail later). The flaw address detected by the V line flaw detection unit 52 is stored in the flaw address memory 54.

  The digital processing unit 3p includes a pixel interpolation unit 31, a white balance control unit 32, a gamma correction unit 33, an outline enhancement unit 34, and a resolution conversion unit 35.

  Image data input to the digital processing unit 3p is written into the image memory 41 in synchronization with the reading of the image sensor 16. Thereafter, the image data stored in the image memory 41 is accessed, and various processes are performed by the digital processing unit 3p.

  In the image data in the image memory 41, first, the white balance control unit 32 performs gain correction of each RGB pixel independently, and RGB white balance correction is performed. In this white balance correction, a portion that is originally white from a photographic subject is estimated from brightness, saturation data, and the like, and an average value, a G / R ratio, and a G / B ratio for each of R, G, and B are obtained. Based on these pieces of information, the R and B correction gains are controlled.

  The white balance corrected image data is based on the contrast pattern of the surrounding 12 pixels with respect to the target pixel for G pixels having pixel values up to a high band after the pixel interpolation unit 31 masks the RGB pixels with the respective filter patterns. A spatial change in the pixel value is estimated, and an optimal pixel value is calculated and assigned to the subject pattern based on the data of the surrounding four pixels. On the other hand, the R pixel and the B pixel are interpolated based on the same color pixel values of the surrounding eight pixels.

  The pixel-interpolated image data is subjected to non-linear conversion suitable for each output device by the gamma correction unit 33, specifically, gamma correction and offset adjustment, and is stored in the image memory 41.

  The contour emphasizing unit 34 performs edge emphasis processing that makes the contour stand out with a high-pass filter corresponding to the image data.

  The image data stored in the image memory 41 is subjected to horizontal or vertical reduction or thinning to the number of pixels set by the resolution conversion unit 35, and after compression processing by the image compression unit 36, the memory card driver 39 Is recorded on the memory card 9 set in At the time of this image recording, a photographed image having a designated resolution is recorded. In addition, the resolution conversion unit 35 performs pixel thinning when displaying an image, and creates a low resolution image to be displayed on the LCD monitor 42 or the EVF 43. At the time of preview, a low resolution image of 640 × 240 pixels read out from the image memory 41 is encoded into NTSC / PAL by the video encoder 38, and this is reproduced as a field image on the LCD monitor 42 or the EVF 43.

  The camera control unit 40 includes a CPU and a memory, and is a part that comprehensively controls each unit of the imaging device 1. Specifically, the operation input performed by the photographer is processed with respect to the camera operation switch 50 having the mode switch 12 and the shutter button 13. In addition, the camera control unit 40 switches to a still image shooting mode, a moving image mode, and a playback mode in which a subject is imaged and the image data is recorded by operating the mode switch 12 by the photographer.

  In the imaging device 1, the optical aperture of the aperture 44 is fixed open by the aperture driver 45 during preview display (live view display) in which the subject is displayed on the LCD monitor 42 in a moving image manner in the shooting preparation state before the actual shooting. As for the charge accumulation time (exposure time) of the image sensor 16 corresponding to the shutter speed (SS), the camera control unit 40 calculates exposure control data based on the live view image acquired by the image sensor 16. Then, feedback control is performed on the timing generator sensor driver 46 so that the exposure time of the image sensor 16 is appropriate based on a program diagram set in advance based on the calculated exposure control data.

  Then, at the time of actual photographing, the exposure amount to the image sensor 16 is controlled by the aperture driver 45 and the timing generator sensor driver 46 according to a preset program diagram based on the light amount data measured during live view.

  The image pickup apparatus having the above configuration can detect and correct a V-line flaw in the image data acquired by the image pickup sensor 16, and these will be described below.

<V line scratch detection>
FIG. 3 is a diagram illustrating a configuration of the imaging sensor 16.

  In the image sensor 16, the charges photoelectrically converted and accumulated by each photodiode 161 are read out to a vertical CCD (hereinafter also referred to as “VCCD”) 162 provided for each vertical transfer line, and the period of one horizontal period. Is transferred to the lowermost horizontal CCD 163. Then, the charges transferred to the horizontal CCD 163 are read based on the pixel clock, whereby reading in the horizontal pixel direction is performed.

  By such an operation of the image sensor 16, scan reading is performed for each horizontal line with respect to the two-dimensional image acquired by the two-dimensionally arranged photodiodes 161.

  Here, when the photodiode 161 has a defect, the charge generated by the defect is added to the signal charge, so that it is reproduced as a point defect in the captured image. For the point defect, the point defect correction unit 51 performs correction by subtracting the pixel level corresponding to the charge generated due to the defect.

  On the other hand, when the same defective portion (scratch) Fp exists in a part of the vertical transfer line, the charge from the photodiode whose charge in the X direction is the same as that of the photodiode from which the charge is read to the defective portion Fp The image is output from the imaging sensor 16 through the vertical CCD 16f where Fp exists. For this reason, charges are added to the signal charge group Fa transferred from the upstream in the charge transfer direction Ha with respect to the defective portion Fp, and as shown in FIG. (V line scratch) Reproduced as Ga.

  In the case of the above-mentioned point defect, although there are few deterioration factors on the photographed image, in the case of the V-line scratch Ga as shown in FIG. 4, the influence on the image quality becomes very large. Below, this detection method is demonstrated.

  5 and 6 are diagrams for explaining the principle of detecting a V-line flaw.

  As described above, the V line scratch Ga (FIG. 4) occurs as a linear lightness scratch generated on the image due to the signal charge group Fa read through the defective portion Fp of the vertical CCD 162 shown in FIG. .

  Therefore, as shown in FIG. 5, after the transfer of the vertical CCD 162 is stopped for a certain period (for example, 200 horizontal periods), the amount of charge generated at the defective portion Fp is increased, and then the charge from the photodiode is transferred to the VCCD. It is assumed that the image is read out. As a result, the pixel data of the photodiode Dp from which the signal charge is read out to the defective portion Fp on the vertical CCD 162 can be emphasized and output from the imaging sensor 16.

  In the image G2 output from the imaging sensor 16 with the defect portion Fp emphasized in this way, as shown in FIG. 6, the position of the photodiode Dp (FIG. 5) from which charges are read to the defect portion Fp in the V-line scratch Ga. The pixel level of the B pixel Gp corresponding to is emphasized in direct proportion to the transfer stop period of the vertical CCD 162.

  After the image G2 as described above is read, the position (address) of the defective portion corresponding to the lower end of the V-line scratch is detected by detecting the address of the pixel Gp that is a bright spot with high brightness from the image G2. It will be possible. Hereinafter, detection of a V-line flaw by the imaging device 1 will be specifically described.

  FIG. 7 is a flowchart showing a V-line flaw detection operation in the imaging apparatus 1.

  First, after closing the diaphragm 44 corresponding to the shutter (step ST1), the high-speed discharge of charges is set in the VCCD 162 (step ST2).

  In step ST3, as described above, the transfer in the VCDD 162 is stopped for 200 horizontal transfer periods. As a result, charges are amplified at the defective portion of the VCCD 162.

  In step ST4, the pixel data is sequentially read out without transferring the charge from the photodiode from the image sensor 16 to the VCCD.

  In step ST5, it is determined whether the pixel level obtained by normalizing the level read in step ST4 by 1/200 is greater than a predetermined scratch level reference (threshold) Vref. If it is larger than the scratch level reference Vref, the process proceeds to step ST6. If it is equal to or lower than the scratch level reference Vref, the process proceeds to step ST7.

  In step ST6, the address (H, V) on the image regarding the defective pixel (scratch) larger than the scratch level reference Vref is registered in the scratch address memory 54. At this time, the scratch level (pixel value) is also registered.

  In step ST7, it is determined whether image reading from the image sensor 16 has been completed. Here, when the image reading is completed, the process proceeds to step ST8, and when it is not completed, the process returns to step ST4.

  In step ST8, the wound addresses stored in the wound address memory 54 are rearranged. In this case, for example, the order of the wound addresses is changed in descending order of the wound level, that is, in ascending order.

  In step ST9, based on the flaw addresses rearranged in step ST8, flaw addresses and flaw levels whose flaw levels fall within the upper 40 are re-registered in the flaw address memory 54. That is, defect position data relating to a defect portion on the vertical CCD 162 is stored in the flaw address memory 54. As for the scratch level, a level normalized by 1/200 times is registered for the pixel data obtained by stopping the 200 horizontal transfer period.

  The operation of the imaging apparatus 1 as described above can appropriately detect the V-line flaw, but this detection operation is performed at a predetermined temperature managed before the factory shipment of the imaging apparatus 1, for example. At the time of factory shipment, information necessary for the flaw address memory 54 is stored as default data.

  In addition, about operation | movement of said step ST8, you may make it rearrange not only based on the wound level of a V line flaw but also considering the range of a V line flaw. For example, rearrangement is performed based on information obtained from (scratch level) × (range of V line scratches). Thereby, the rearrangement in consideration of the influence of each V line scratch on the entire image can be performed.

  The V-line flaw of the image sensor 16 has temperature dependence, and this characteristic will be described below.

  FIG. 8 is a diagram for explaining the temperature dependence of the V-line flaw in the image sensor 16. 8A to 8C show an example of the state of the image sensor 16 at normal temperature (for example, 20 degrees), 30 degrees and 40 degrees, and an image Gt output from the image sensor 16. Yes.

  In the image sensor 16 at room temperature, the vertical CCD has only one defective part Fp1 recognized as a flaw as shown in FIG. 8A, and a V-line flaw generated in the image Gt output from the image sensor 16 is also present. There is only one Ga1.

  In the imaging sensor 16 at a high temperature of 30 degrees, the number of V-line flaws that are manifested increases by one depending on the temperature as compared with the normal temperature. That is, as shown in FIG. 8B, the vertical CCD defective portions recognized as flaws are two places Fp1 and Fp2, and the V-line flaws in the image Gt output from the image sensor 16 are also two Ga1 and Ga2.

  In the imaging sensor 16 at a high temperature of 40 degrees, the V-line flaws that are manifested further increase by one depending on the temperature as compared with a high temperature of 30 degrees. That is, as shown in FIG. 8C, the vertical CCDs recognized as flaws have three defect points Fp1 to Fp3, and three V-line flaws in the image Gt output from the image sensor 16 become Ga1 to Ga3. .

  As described above, in the imaging sensor 16, since the V-line scratch has temperature dependency, the above-described detection of the V-line scratch is preferably detected for each temperature.

<About V-line scratch correction>
The V-line flaw correction unit 53 of the imaging apparatus 1 can selectively perform (1) correction by offset and (2) correction by pixel interpolation on the detected V-line flaw. These two types of correction methods will be described below.

(1) Correction by Offset FIG. 9 is a diagram for explaining correction of a V-line flaw by offset.

  In the correction of the V-line flaw by the offset, first, an offset component Lo caused by the V-line flaw Ga is detected in the image G3 output from the imaging sensor 16. Then, by subtracting this offset component Lo from the pixel level of the V-line scratch Ga in the image G3, a corrected image G4 from which the scratch as image noise has been eliminated is generated.

  In such a correction method using offset, as described above, the flaw level (offset component Lo) is estimated and corrected based on the default V-line flaw data stored in the flaw address memory 54 when the image pickup apparatus 1 is shipped from the factory. However, in consideration of the characteristics of the V-line scratch having a large temperature dependency, it is preferable to obtain the offset amount (correction amount) in real time during imaging. A method for detecting the offset amount will be described.

  As shown in FIG. 10, the imaging sensor 16 has optical black portions (hereinafter referred to as “OB portions”) 16ba and 16bb for detecting a black level. Here, the charges read from each OB unit to the vertical CCD 162 are transferred to the horizontal CCD 163 first in the lower OB unit 16ba and transferred later to the horizontal CCD 163. Hereinafter, the detection of the offset amount in the case where the two defective portions Fp1 and Fp2 exist in the vertical CCD 162 will be described.

  As shown in FIG. 11, in the image G5 output from the image sensor 16, the pixel Gb2 that is read from the upper OB portion 16bb and passed through the defective portion Fp1 of the vertical CCD 162 is affected by the lower OB portion. The pixel level is increased by the above-described offset amount from the pixel Gb1 that is read from 16ba and does not pass through the defective portion Fp1 and is not affected by it. Similarly, the pixel level of the pixel Gb4 read from the upper OB portion 16bb and passing through the defective portion Fp2 of the vertical CCD 162 is increased by the above-described offset amount from the pixel Gb3 not passing through the defective portion Fp2.

  Therefore, the scratch level (offset amount) of the V line scratch Ga1 shown in FIG. 11 is obtained by subtracting the level of the pixel Gb1 from the level of the pixel Gb2, and the offset amount of the V line scratch Ga2 is calculated from the level of the pixel Gb4. This is obtained by subtracting the level of the pixel Gb3.

  Next, the detection operation of the offset amount (scratch level) in the imaging apparatus 1 will be described.

  FIG. 12 is a flowchart showing the detection operation of the scratch level of the V line scratch in the imaging apparatus 1.

  In step ST11, the shutter is released for exposure. That is, when the photographer fully presses the shutter button 13 (S2 is turned on), an operation for photographing the subject is performed.

  In step ST12, pixel data is sequentially read from the image sensor 16.

  In step ST13, the pixel data read from the image sensor 16 in step ST12 is captured.

  In step ST14, it is determined whether the pixel address read in step ST12 corresponds to the address of the V-line scratch registered in the scratch address memory 54. If the registered address is applicable, the process proceeds to step ST15. If not, the process proceeds to step ST18.

  In step ST15, the black levels of the OB portions 16ba and 16bb (FIG. 10) at both ends of the vertical CCD 162 to which the pixels read in step ST12 are transferred are detected, and the difference between these black levels is obtained to determine the scratch level. Is detected.

  In step ST16, it is determined whether the scratch level detected in step ST15 is greater than the scratch level reference Vref. If it is larger than the scratch level reference Vref, the process proceeds to step ST17. If it is equal to or lower than the scratch level reference Vref, the process proceeds to step ST18.

  In step ST17, the address (H, V) on the image regarding the defective pixel (scratch) larger than the scratch level reference Vref in step ST16 is registered in the scratch address memory 54. At this time, the scratch level is also registered.

  In steps ST18 and ST19, operations similar to those in steps ST7 and ST8 shown in FIG. 7 are performed.

  In step ST20, based on the flaw addresses rearranged in step ST19, flaw addresses and flaw levels whose flaw levels are within the top 20 are re-registered in the flaw address memory 54.

  By the operation of the image pickup apparatus 1 as described above, it is possible to detect the scratch level during photographing, and it is possible to appropriately correct the V-line scratch due to the offset.

  If information on the V line scratch detected at the time of factory shipment within a predetermined temperature range is recorded in the scratch address memory 54, the V line scratch can be corrected using this information. Faster correction processing is possible.

(2) Correction by Pixel Interpolation FIG. 13 is a diagram for explaining correction of a V-line flaw by pixel interpolation.

  In the correction of V-line flaws by pixel interpolation, replacement data is created based on the data of pixel lines located around the V-line flaws, and pixel data of V-line flaws is replaced with this replacement data.

  For example, in the image G6, pixel lines J1 and J2 of the same color arranged on the left and right of the V line scratch Ga are detected, and the pixel data of the V line scratch Ga is replaced with an average value of pixel levels related to these pixel lines J1 and J2. . As a result, a corrected image G7 from which scratches have been erased is generated.

  Such a correction method using pixel interpolation is less accurate than correction of V-line flaws due to offset, but detection of a flaw level becomes unnecessary when the location (address) of the V-line flaw is known. . In the correction method based on pixel interpolation, it is basically unnecessary to consider that the offset value of the V line scratch has temperature characteristics.

  As described above, the imaging apparatus 1 has a configuration in which two types of V-line flaw correction methods can be selected. Hereinafter, V-line flaw correction when the moving image mode is set will be described.

<V-line flaw correction in movie mode>
The V-line flaw of the image sensor 16 has temperature dependence as shown in FIG. 8, and therefore, when the temperature of the image sensor 16 rises during moving image shooting, the number of places where the V-line flaw becomes obvious increases. . In such a case, detecting the scratch level of the V-line scratch each time an image is acquired by the image sensor 16 increases the wait time and may miss a shooting opportunity.

  Therefore, in the imaging apparatus 1 at the time of moving image shooting, the V-line flaw correction unit 53 selects a V-line flaw correction method by pixel interpolation that does not require detection of a flaw level and can perform relatively quick processing, and V line When there is a concern about an increase in scratches, the moving image shooting time that causes the temperature rise of the image sensor 16 is limited. Below, the specific operation | movement in the imaging device 1 is demonstrated.

  FIG. 14 is a flowchart showing the basic operation of the imaging apparatus 1 during moving image shooting.

  In step ST21, it is determined whether the moving image mode is set. Specifically, it is determined whether or not the moving image mode is selected by the mode switch 12. If the moving image mode is set, the process proceeds to step ST22, and if not set, the process proceeds to step ST40.

  In step ST22, it is determined whether to correct the V line flaw. For example, it is determined whether or not the correction of the V-line flaw in the moving image mode is set based on an input to a screen for setting whether or not the V-line flaw correction is necessary displayed on the LCD 42. Here, when the correction of the V-line scratch is performed, the process proceeds to step ST23, and when the correction is not performed, the process proceeds to step ST41.

  In step ST23, the V-line flaw correction unit 53 sets V-line flaw correction by pixel interpolation. In other words, the V-line flaw correction unit 53 includes two processes, a correction process by pixel interpolation (see FIG. 13) using peripheral pixel information of a V-line flaw (linear flaw) and a correction process by offset (see FIG. 9). Although various types of correction methods can be selectively implemented, correction processing based on pixel interpolation is selected during moving image shooting.

  In step ST24, it is determined that it is within 30 seconds after the imaging device 1 is activated. That is, it is determined by measuring with a timer in the camera control unit 40 whether or not 30 seconds have elapsed after a power switch (not shown) of the imaging apparatus 1 is operated. If it is within 30 seconds after activation, the process proceeds to step ST27. If 30 seconds have elapsed, the process proceeds to step ST25.

  In step ST25, it is determined whether the temperature of the image sensor 16 is 20 degrees or less. Specifically, it is determined whether or not the temperature detected by the temperature sensor 49 is 20 degrees or less. If the temperature is 20 degrees or less, the process proceeds to step ST27. If the temperature exceeds 20 degrees, the process proceeds to step ST26.

  In step ST26, it is determined whether it is within 5 minutes after the end of shooting. That is, when moving image shooting or still image shooting is performed, a V-line scratch is detected, but a timer in the camera control unit 40 is used to measure whether or not 5 minutes have passed since the most recent scratch detection time. to decide. If it is within 5 minutes after the end of shooting, the process proceeds to step ST28. If 5 minutes have elapsed, the process proceeds to step ST29.

  In step ST27, a V-line flaw is corrected based on default data. That is, the V-line flaw correction by pixel interpolation shown in FIG. 13 is performed based on the V-line flaw address information (defect position data) stored in the flaw address memory 54 at the time of shipment from the factory.

  In step ST28, the V-line flaw is corrected based on the data at the previous photographing. That is, for example, based on the V-line flaw address information detected in steps ST33 and ST37 described later and stored in the flaw address memory 54, V-line flaw correction by pixel interpolation shown in FIG. 13 is performed.

  In step ST29, the V line flaw is corrected based on default data in the same operation as in step ST27.

  By the operations in steps ST24 to ST29, the default data stored in the flaw address memory 54 and the data at the previous shooting, that is, the data at the previous shooting, according to the moving image shooting state (temperature state etc.) detected by the timer or the temperature sensor. One data is selected from a plurality of data at different points in time when a defective portion on the vertical CCD is detected, and is used for correcting a V-line flaw. Thereby, appropriate correction according to the situation of moving image shooting becomes possible.

  In step ST30, the recording time is set to 20 minutes. This is because when the temperature of the image sensor 16 is determined to be relatively low (20 degrees or less) or within 5 minutes from the previous shooting, the default data or the data at the previous shooting is taken even if the moving image is shot. From this, it is estimated that there is little change in the V-line scratches, but in consideration of the subsequent rise in temperature, the video recording time is limited to 20 minutes.

  In step ST31, the remaining recording time (shootable time) is displayed on the LCD 42 (EVF 43) serving as display means, and moving image shooting is performed.

  In step ST32, it is determined whether or not to end the shooting. Specifically, it is determined whether the recordable time set in step ST30 has been reached, or whether the shutter button 13 has been operated by the photographer. Here, in the case of end of shooting, the process proceeds to step ST33, and in the case of not end, the process returns to step ST31.

  In step ST33, a V-line flaw is detected. Here, the operations of steps ST14 to ST20 shown in FIG. 12 are performed, and a flaw address recognized as a V-line flaw is detected and registered. As a result, it is possible to accurately grasp the V-line flaws that have increased along with the moving image shooting, and to record information on the V-line flaws that have been subjected to temperature compensation reflecting the current temperature of the image sensor 16. That is, the latest defect position data that can be used for the next photographing can be acquired by detecting the defective portion of the vertical CCD 162 when the moving image photographing is completed.

  In step ST34, the recording time is set to 10 minutes. Here, since the temperature of the image sensor 16 is determined to be relatively high, the recording time is limited to 10 minutes in consideration of an increase in V-line scratches.

  In step ST35 and step ST36, the same operation as in step ST31 and step ST32 is performed.

  In step ST37, the V-line flaw is detected as in step ST33.

  In step ST40, the V line flaw is corrected. That is, when a still image shooting mode other than the moving image mode is set, quick processing is not required as compared with moving image shooting, so that the V-line flaw is corrected to improve the image quality.

  In step ST41, a normal moving image shooting operation is performed. That is, when correction of the V-line flaw is unnecessary, recording can be performed up to the capacity of the memory card 9 without limiting the recording time.

  By the operation of the imaging apparatus 1 described above, a V-line flaw correction method by pixel interpolation that can be quickly processed in the moving image mode is selected, so that V-line flaw correction can be appropriately performed during moving image shooting. In addition, since the recording time (capturing time) is determined based on the moving image shooting state detected by the operations in steps ST24 to ST26, the image quality can be improved by appropriately suppressing the increase in V-line scratches.

  Note that information on the V-line flaw detected at each temperature is recorded in the flaw address memory 54 of the image pickup apparatus 1 at the time of factory shipment or the like, and when shooting a moving image, the temperature sensor 49 refers to this information. Correction may be performed by specifying a V-line flaw portion corresponding to the detected temperature. Thereby, the detection of the V-line flaw performed in step ST33 (ST37) in FIG. 14 can be omitted. However, even in this case, correction of V-line flaws by pixel interpolation is performed in order to ensure correction accuracy.

<Modification>
The scratch level (offset amount) detection at the time of photographing in the above embodiment may be performed by a method similar to the scratch level detection (FIG. 7) performed at the time of factory shipment. This detection method will be described.

  In the above embodiment, an example of a CCD for all pixel readout is shown, but it may be applied to a CCD for multiple field readout. In this case, the same correction as in the above embodiment can be performed by performing the correction after rearranging the frames once.

  FIG. 15 is a flowchart showing a flaw level detection operation according to a modification of the present invention.

  In step SP1 and step SP2, the same operation as step ST11 and step ST13 shown in FIG. 12 is performed.

  In step SP3, it is determined whether the capture process is completed. If the capture process is completed, the process proceeds to step SP4. If the capture process is not completed, the operation of step SP2 is repeated.

  In steps SP4 to SP7, operations similar to those in steps ST1 to ST4 shown in FIG. 7 are performed.

  In step SP8, the same operation as step ST14 shown in FIG. 12 is performed.

  In step SP9, a scratch level is detected. Specifically, a level normalized by 1/200 times with respect to pixel data obtained by stopping the 200 horizontal transfer period is detected as a scratch level.

  In steps SP10 to SP14, operations similar to those in steps ST16 to ST20 shown in FIG. 12 are performed.

  The operation as described above can also appropriately detect the scratch level of the V-line scratch at the time of photographing.

It is a figure showing the important section composition of imaging device 1 concerning the embodiment of the present invention. 2 is a diagram illustrating functional blocks of the imaging apparatus 1. FIG. 2 is a diagram illustrating a configuration of an image sensor 16. FIG. It is a figure for demonstrating a V line flaw. It is a figure for demonstrating the detection principle of a V line flaw. It is a figure for demonstrating the detection principle of a V line flaw. 3 is a flowchart illustrating a V-line flaw detection operation in the imaging apparatus 1. It is a figure for demonstrating the temperature dependence of the V line flaw in the image sensor. It is a figure for demonstrating correction | amendment of the V line damage | wound by offset. It is a figure for demonstrating correction | amendment of the V line damage | wound by offset. It is a figure for demonstrating correction | amendment of the V line damage | wound by offset. 4 is a flowchart illustrating a detection operation of a scratch level of a V-line scratch in the imaging apparatus 1. It is a figure for demonstrating correction | amendment of the V line flaw by pixel interpolation. It is a flowchart which shows the basic operation | movement of the imaging device 1 at the time of video recording. It is a flowchart which shows the detection operation | movement of the flaw level which concerns on the modification of this invention.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Image pick-up device 3 Image processing part 16 Image pick-up sensor 16ba, 16bb Optical black (OB) part 49 Temperature sensor 51 Point defect correction part 52 V line flaw detection part 53 V line flaw correction part 54 Flaw address memory 161 Photodiode 162 Vertical CCD
163 Horizontal CCD
Fp, Fp1, Fp2, Fp3 Defects on vertical CCD Ga, Ga1, Ga2, Ga3 V line scratches

Claims (6)

An imaging device capable of video recording,
(a) an image sensor having a vertical CCD and a horizontal CCD and capable of outputting an image related to a subject;
(b) storage means for storing defect position data relating to the defect location on the vertical CCD;
(c) image correction means for performing a correction process on the basis of the defect position data for a linear scratch generated in the image due to the defect location;
With
The image correcting means includes
(c-1) selection performing means for selectively performing a plurality of correction processes including a correction process by pixel interpolation using peripheral pixel information of the linear scratch;
(c-2) at the time of moving image shooting, a selection control means for selecting the correction processing by the pixel interpolation in the selection execution means;
An imaging device comprising: The imaging device according to claim 1,
(d) state detection means for detecting a state relating to the moving image shooting;
Further comprising
The defect position data has a plurality of data at different time points when the defect location is detected,
The image correcting means includes
(c-3) means for selecting one data from the plurality of data according to the state detected by the state detecting means, and performing the correction processing based on the one data;
An imaging device comprising: The imaging device according to claim 2,
The state detection means includes
(d-1) means for detecting the state by a timer and / or a temperature sensor;
An imaging device comprising: The imaging apparatus according to any one of claims 1 to 3,
(e) a defect detecting means for detecting the defective portion when the moving image shooting is completed;
An image pickup apparatus further comprising: In the imaging device according to claim 2 or 3,
(f) Based on the state detected by the state detection unit, a determination unit that determines a shootable time of the moving image shooting;
An image pickup apparatus further comprising: The imaging apparatus according to claim 5,
(g) display means;
(h) display control means for causing the display means to perform display related to the recordable time of the moving image shooting;
An image pickup apparatus further comprising:

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