JP2006147775A - Method for mounting semiconductor package and circuit board - Google Patents

Method for mounting semiconductor package and circuit board Download PDF

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Publication number
JP2006147775A
JP2006147775A JP2004334654A JP2004334654A JP2006147775A JP 2006147775 A JP2006147775 A JP 2006147775A JP 2004334654 A JP2004334654 A JP 2004334654A JP 2004334654 A JP2004334654 A JP 2004334654A JP 2006147775 A JP2006147775 A JP 2006147775A
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Prior art keywords
semiconductor package
copper foil
printed wiring
terminals
wiring board
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JP2004334654A
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Japanese (ja)
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Hisahiko Yoshida
久彦 吉田
Masahiko Hirata
昌彦 平田
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Panasonic Holdings Corp
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Matsushita Electric Industrial Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a method or connecting a printed wiring board by which the joint of a semiconductor package can be prevented from disconnection due to heat distortion of generated heat and the life reliability of a connection terminal can be ensured, and to provide a circuit board. <P>SOLUTION: The method for mounting a semiconductor package 9 is used to mount the land grid array semiconductor package 9 to a multilayer printed wiring board 1 including copper foil wiring layers 3, 4, 7, and 8 with more than three layers. In this case, a non-through hole to a copper foil wiring layer 3 on the inside from the outermost layer 7 among the copper foil wiring layers 3, 4, 7, and 8 is formed in the multilayer printed wiring board 1, and when the semiconductor package 9 is mounted, a part of the terminal of the semiconductor package 9 is joined with a solder 16 in the non-through hole. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、電子機器に用いられているプリント配線板に半導体パッケージを実装する技術に関し、特にランドグリッドアレイ(以下、「LGA」という)型の半導体パッケージのはんだ付け信頼性を向上させる実装技術に関する。   The present invention relates to a technique for mounting a semiconductor package on a printed wiring board used in an electronic device, and more particularly to a mounting technique for improving the soldering reliability of a land grid array (hereinafter referred to as “LGA”) type semiconductor package. .

近年、携帯型電子機器を始めとして機器の小型高機能化が進んできている。このようなことから、電子部品の実装には小型薄型化と高集積化とが求められており、半導体パッケージの下面に接続端子をグリッドアレイ状に配列してはんだで接続することにより、小型化を実現している。   In recent years, devices such as portable electronic devices are becoming smaller and more functional. For this reason, electronic components are required to be compact, thin, and highly integrated. By connecting the connection terminals in a grid array on the bottom surface of the semiconductor package and connecting them with solder, the size is reduced. Is realized.

一方、これらの接続方法は、クワッドフラットパッケージなどのように、リードで接続する方法に比べて接続部の応力緩和が少ない。このため、半導体パッケージの発熱による熱歪による応力によって接続部が断線するといった品質劣化を引き起こし易いといった問題があった。   On the other hand, these connection methods have less stress relaxation in the connection portion than the connection method using leads such as a quad flat package. For this reason, there has been a problem that quality deterioration is likely to be caused such that the connection portion is disconnected due to a stress caused by thermal strain due to heat generation of the semiconductor package.

そこで、最も応力のかかり易い4隅に、他の接続端子より大きい面積の補強用の接続端子を配置することにより、応力を分散して信頼性寿命を延ばす技術が提案されている(例えば、特許文献1参照)。
特開平9−162241号公報(第2図)
In view of this, a technique has been proposed that disperses stress and extends the reliability life by disposing reinforcing connection terminals having areas larger than those of other connection terminals at the four corners where stress is most easily applied (for example, patents). Reference 1).
JP-A-9-162241 (FIG. 2)

しかしながら、前記のような従来の技術では、補強ランドの面積を大きくすることにより応力緩和の効果が得られるが、半導体パッケージの内に補強ランドを形成する面積には限界がある。   However, in the conventional technique as described above, an effect of stress relaxation can be obtained by increasing the area of the reinforcing land, but the area for forming the reinforcing land in the semiconductor package is limited.

また、実装密度の向上に伴って高密度にはんだをマスク印刷する必要から、100ミクロン程度の厚さのステンシルを使うようになっているため、接続端子に供給されるはんだが非常に薄くなっている。このため、前記のような従来の構造では、接続端子にはんだボールを使わないLGA型の半導体パッケージは、マスク印刷で供給されたはんだのみで接続されるため、接続端子部のはんだ厚みが極端に薄くなってしまう。この構造では、はんだの歪変形量が小さいため、はんだによる応力緩和の効果が得られず接合部が破壊し易く、寿命信頼性を十分に確保できないという問題があった。   In addition, as the mounting density increases, it is necessary to mask-print the solder at a high density, so a stencil with a thickness of about 100 microns is used, so the solder supplied to the connection terminals becomes very thin. Yes. For this reason, in the conventional structure as described above, since the LGA type semiconductor package that does not use solder balls for the connection terminals is connected only with the solder supplied by mask printing, the solder thickness of the connection terminal portion is extremely large. It will be thinner. In this structure, since the strain deformation amount of the solder is small, there is a problem that the effect of stress relaxation by the solder cannot be obtained, the joint portion is easily broken, and the life reliability cannot be sufficiently secured.

本発明は、前記のような従来の問題を解決するものであり、半導体パッケージの発熱の熱歪による接続部の断線を防止でき、接続端子の寿命信頼性を確保できるプリント配線板の接続方法及び回路基板を提供することを目的とする。   The present invention solves the conventional problems as described above, and can prevent disconnection of a connection portion due to thermal distortion of heat generated in a semiconductor package, and can provide a connection method of a printed wiring board that can ensure the life reliability of a connection terminal and An object is to provide a circuit board.

前記目的を達成するために、本発明の半導体パッケージの実装方法は、3層以上の銅箔配線層を含む多層プリント配線板に、ランドグリッドアレイ型の半導体パッケージを実装する半導体パッケージの実装方法であって、前記多層プリント配線板に、前記銅箔配線層のうち最外層より内側の銅箔配線層に達する非貫通孔を形成し、前記半導体パッケージの実装の際に、前記半導体パッケージの端子の一部の端子を、前記非貫通孔内のはんだに接合させることを特徴とする。   In order to achieve the above object, a semiconductor package mounting method of the present invention is a semiconductor package mounting method in which a land grid array type semiconductor package is mounted on a multilayer printed wiring board including three or more copper foil wiring layers. In the multilayer printed wiring board, a non-through hole reaching the copper foil wiring layer inside the outermost layer of the copper foil wiring layers is formed, and when the semiconductor package is mounted, the terminals of the semiconductor package are formed. Some terminals are joined to solder in the non-through hole.

本発明の回路基板は、3層以上の銅箔配線層を含む多層プリント配線板に、ランドグリッドアレイ型の半導体パッケージが実装された回路基板であって、
前記多層プリント配線板に、前記銅箔配線層のうち最外層より内側の銅箔配線層に達する非貫通孔が形成されており、前記半導体パッケージの端子の一部の端子が、前記非貫通孔内のはんだに接合されていることを特徴とする。
The circuit board of the present invention is a circuit board in which a land grid array type semiconductor package is mounted on a multilayer printed wiring board including three or more copper foil wiring layers,
Non-through holes reaching the copper foil wiring layer inside the outermost layer of the copper foil wiring layers are formed in the multilayer printed wiring board, and some terminals of the terminals of the semiconductor package are formed in the non-through holes. It is characterized by being bonded to the inner solder.

本発明によれば、LGA型半導体パッケージをプリント配線板に接続したときに、半導体パッケージの発熱の熱歪による接続部の断線を防止でき、接続端子の寿命信頼性を確保することができる。   According to the present invention, when the LGA type semiconductor package is connected to the printed wiring board, the disconnection of the connection portion due to the thermal distortion of the heat generated in the semiconductor package can be prevented, and the life reliability of the connection terminal can be ensured.

本発明によれば、半導体パッケージの端子と多層プリント配線板との接続部分のはんだの厚さを大きくした部分があるので、LGA型半導体パッケージをプリント配線板に接続したときに、半導体パッケージの発熱の熱歪による接続部の断線を防止でき、接続端子の寿命信頼性を確保することができる。   According to the present invention, since there is a portion where the thickness of the solder at the connection portion between the terminal of the semiconductor package and the multilayer printed wiring board is increased, the heat generated in the semiconductor package when the LGA type semiconductor package is connected to the printed wiring board. The disconnection of the connection portion due to the thermal strain can be prevented, and the life reliability of the connection terminal can be ensured.

前記本発明の半導体パッケージの実装方法においては、前記一部の端子は、前記半導体パッケージの4隅に設け、前記一部の端子以外の端子より面積を大きくした端子であることが好ましい。この構成によれば、接続端子の寿命信頼性をより高めることができる。   In the semiconductor package mounting method of the present invention, it is preferable that the part of the terminals are provided at four corners of the semiconductor package and have a larger area than terminals other than the part of the terminals. According to this configuration, the life reliability of the connection terminal can be further improved.

以下、本発明の実施の形態について、図面を参照しながら説明する。図1は、本発明の一実施の形態に係る多層プリント配線板の断面図を示している。図1に示した多層プリント配線板1は、絶縁性のコア樹脂層2を備えており、コア樹脂層2の両面には銅箔配線層3、4を張り合わせている。銅箔配線層3、4にはエッチングなどによって配線パターンが形成されている。コア樹脂層2の両面には、積層樹脂層5、6が配置されており、積層樹脂層5、6にはそれぞれ、銅箔配線層7、8が接着積層されている。銅箔配線層7、8にはエッチングなどによって配線パターンが形成される。   Hereinafter, embodiments of the present invention will be described with reference to the drawings. FIG. 1 shows a cross-sectional view of a multilayer printed wiring board according to an embodiment of the present invention. A multilayer printed wiring board 1 shown in FIG. 1 includes an insulating core resin layer 2, and copper foil wiring layers 3 and 4 are bonded to both surfaces of the core resin layer 2. A wiring pattern is formed on the copper foil wiring layers 3 and 4 by etching or the like. Laminated resin layers 5 and 6 are disposed on both surfaces of the core resin layer 2, and copper foil wiring layers 7 and 8 are bonded and laminated to the laminated resin layers 5 and 6, respectively. A wiring pattern is formed on the copper foil wiring layers 7 and 8 by etching or the like.

図2は、本発明の一実施の形態に係る半導体パッケージの下面の接続端子部の平面図を示している。図2に示した半導体パッケージ9は、導体パターンにより複数の接続端子10が格子状に配列されて形成されている。半導体パッケージ9の4隅には、接続端子10より面積の大きい補強端子11が形成されている。   FIG. 2 is a plan view of the connection terminal portion on the lower surface of the semiconductor package according to the embodiment of the present invention. The semiconductor package 9 shown in FIG. 2 is formed by arranging a plurality of connection terminals 10 in a grid pattern by a conductor pattern. Reinforcing terminals 11 having a larger area than the connecting terminals 10 are formed at the four corners of the semiconductor package 9.

図3は、図1に示した多層プリント配線板のはんだ印刷時の断面図を示している。半導体パッケージ9が実装される面の銅箔配線層7には接続端子10に合わせた接続ランド12が形成されている。また、補強端子11に対応する位置には、積層樹脂層5に非貫通孔である穴13が、レーザーなどによって形成されている。穴13は、はんだ16の充填前においては、銅箔配線層3に配線パターンで形成された補強ランド14が露出している。   FIG. 3 shows a cross-sectional view of the multilayer printed wiring board shown in FIG. 1 during solder printing. On the copper foil wiring layer 7 on the surface on which the semiconductor package 9 is mounted, connection lands 12 are formed in accordance with the connection terminals 10. Further, a hole 13 which is a non-through hole is formed in the laminated resin layer 5 at a position corresponding to the reinforcing terminal 11 by a laser or the like. In the hole 13, the reinforcing land 14 formed by the wiring pattern in the copper foil wiring layer 3 is exposed before the solder 16 is filled.

印刷マスク15は、一様な厚さの金属又は樹脂プレートに多層プリント配線板1の配線パターンに合わせて複数の貫通孔を設けたものである。印刷マスク15と配線パターンとを位置合わせして重ねて配置した後、スキージングによってペースト状のはんだ16を配置する。   The printing mask 15 is formed by providing a plurality of through holes on a metal or resin plate having a uniform thickness in accordance with the wiring pattern of the multilayer printed wiring board 1. After the print mask 15 and the wiring pattern are aligned and arranged so as to overlap, paste solder 16 is arranged by squeezing.

このとき、接続ランド12の位置には印刷マスク15の厚み分のはんだ16しか供給されないのに対して、補強ランド13の位置には印刷マスク15と積層樹脂層5とを合計した厚み分のはんだ16が供給されることになる。   At this time, only the solder 16 corresponding to the thickness of the printing mask 15 is supplied to the position of the connection land 12, whereas the solder corresponding to the total thickness of the printing mask 15 and the laminated resin layer 5 is supplied to the position of the reinforcing land 13. 16 will be supplied.

図4は、本発明の一実施の形態に係る回路基板の断面図を示している。本図に示した回路基板は、図2に示した半導体パッケージ9を図1に示した多層プリント配線板にはんだ付けにより実装したものである。図3の状態において、印刷マスク15を除去した後、半導体パッケージ9および他の電子部品を位置合わせして多層プリント配線板1の上に配置し、リフロー加熱する。このことにより、接続端子10と接続ランド12、及び補強端子11と補強ランド14とは、はんだ16を介して機械的及び電気的に接続されることになる。   FIG. 4 shows a cross-sectional view of a circuit board according to an embodiment of the present invention. The circuit board shown in this figure is obtained by mounting the semiconductor package 9 shown in FIG. 2 on the multilayer printed wiring board shown in FIG. 1 by soldering. In the state of FIG. 3, after removing the printing mask 15, the semiconductor package 9 and other electronic components are aligned and placed on the multilayer printed wiring board 1 and reflow heated. Thus, the connection terminal 10 and the connection land 12 and the reinforcement terminal 11 and the reinforcement land 14 are mechanically and electrically connected via the solder 16.

このようなはんだ付けによれば、補強端子11と補強ランド14との間のはんだ16の厚みを厚くすることができるため、半導体パッケージ9の発熱によって接合部にかかる熱歪の応力が緩和されることになる。このため、接続端子の断線が防止でき、寿命信頼性を向上させることができる。   According to such soldering, since the thickness of the solder 16 between the reinforcing terminal 11 and the reinforcing land 14 can be increased, the stress of the thermal strain applied to the joint due to the heat generation of the semiconductor package 9 is relieved. It will be. For this reason, disconnection of the connection terminal can be prevented, and the life reliability can be improved.

なお、前記実施の形態の例では、非貫通孔である穴13が、銅箔配線層3まで達している例で説明したが、さらに下側の銅箔配線層4又は8にまで達するようにしてもよい。   In the example of the above-described embodiment, the hole 13 that is a non-through hole has been described as reaching the copper foil wiring layer 3, but the hole 13 further reaches the lower copper foil wiring layer 4 or 8. May be.

また、多層プリント配線板の銅箔配線層が4層の例で説明したが、3層であってもよく、5層以上であってよい。すなわち、銅箔配線層は3層以上であればよく、非貫通孔である穴13は、最外層の銅箔配線層より内側の銅箔配線層に達するようにすればよい。   Moreover, although the copper foil wiring layer of the multilayer printed wiring board demonstrated in the example of 4 layers, it may be 3 layers and may be 5 layers or more. That is, the copper foil wiring layer may be three or more layers, and the hole 13 that is a non-through hole may reach the copper foil wiring layer inside the outermost copper foil wiring layer.

以上のように、本発明は、半導体パッケージの発熱の熱歪による接続部の断線を防止でき、接続端子の寿命信頼性を確保した半導体パッケージの実装方法及び回路基板が提供できるため、LGA型半導体パッケージを用いた実装方法や回路基板に有用である。   As described above, the present invention can prevent disconnection of the connection portion due to heat distortion of the heat generation of the semiconductor package, and can provide a semiconductor package mounting method and circuit board that ensure the life reliability of the connection terminals. It is useful for mounting methods and circuit boards using packages.

本発明の一実施の形態に係る多層プリント配線板の断面図。Sectional drawing of the multilayer printed wiring board which concerns on one embodiment of this invention. 本発明の一実施の形態に係る半導体パッケージの下面の接続端子部の平面図。The top view of the connecting terminal part of the lower surface of the semiconductor package which concerns on one embodiment of this invention. 図1に示した多層プリント配線板のはんだ印刷時の断面図。Sectional drawing at the time of the solder printing of the multilayer printed wiring board shown in FIG. 本発明の一実施の形態に係る回路基板の断面図。1 is a cross-sectional view of a circuit board according to an embodiment of the present invention.

符号の説明Explanation of symbols

1 多層プリント配線板
2 コア樹脂層
3,4,7,8 銅箔配線層
5,6 積層樹脂層
9 半導体パッケージ
10 接続端子
11 補強端子
12 接続ランド
13 穴
14 補強ランド
15 印刷マスク
16 はんだ



DESCRIPTION OF SYMBOLS 1 Multilayer printed wiring board 2 Core resin layer 3, 4, 7, 8 Copper foil wiring layer 5, 6 Laminated resin layer 9 Semiconductor package 10 Connection terminal 11 Reinforcement terminal 12 Connection land 13 Hole 14 Reinforcement land 15 Print mask 16 Solder



Claims (3)

3層以上の銅箔配線層を含む多層プリント配線板に、ランドグリッドアレイ型の半導体パッケージを実装する半導体パッケージの実装方法であって、
前記多層プリント配線板に、前記銅箔配線層のうち最外層より内側の銅箔配線層に達する非貫通孔を形成し、
前記半導体パッケージの実装の際に、前記半導体パッケージの端子の一部の端子を、前記非貫通孔内のはんだに接合させることを特徴とする半導体パッケージの実装方法。
A semiconductor package mounting method for mounting a land grid array type semiconductor package on a multilayer printed wiring board including three or more copper foil wiring layers,
In the multilayer printed wiring board, a non-through hole reaching the copper foil wiring layer inside the outermost layer among the copper foil wiring layers is formed,
A method of mounting a semiconductor package, comprising: bonding a part of the terminals of the semiconductor package to solder in the non-through hole when mounting the semiconductor package.
前記一部の端子は、前記半導体パッケージの4隅に設け、前記一部の端子以外の端子より面積を大きくした端子である請求項1に記載の半導体パッケージの実装方法。   2. The method of mounting a semiconductor package according to claim 1, wherein the some of the terminals are terminals provided at four corners of the semiconductor package and having a larger area than terminals other than the one or more terminals. 3層以上の銅箔配線層を含む多層プリント配線板に、ランドグリッドアレイ型の半導体パッケージが実装された回路基板であって、
前記多層プリント配線板に、前記銅箔配線層のうち最外層より内側の銅箔配線層に達する非貫通孔が形成されており、
前記半導体パッケージの端子の一部の端子が、前記非貫通孔内のはんだに接合されていることを特徴とする回路基板。




A circuit board in which a land grid array type semiconductor package is mounted on a multilayer printed wiring board including three or more copper foil wiring layers,
In the multilayer printed wiring board, non-through holes reaching the copper foil wiring layer inside the outermost layer among the copper foil wiring layers are formed,
A circuit board, wherein some of the terminals of the semiconductor package are joined to solder in the non-through hole.




JP2004334654A 2004-11-18 2004-11-18 Method for mounting semiconductor package and circuit board Withdrawn JP2006147775A (en)

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JP2004334654A JP2006147775A (en) 2004-11-18 2004-11-18 Method for mounting semiconductor package and circuit board

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JP2004334654A Withdrawn JP2006147775A (en) 2004-11-18 2004-11-18 Method for mounting semiconductor package and circuit board

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