JP2006135208A5 - - Google Patents

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JP2006135208A5
JP2006135208A5 JP2004324641A JP2004324641A JP2006135208A5 JP 2006135208 A5 JP2006135208 A5 JP 2006135208A5 JP 2004324641 A JP2004324641 A JP 2004324641A JP 2004324641 A JP2004324641 A JP 2004324641A JP 2006135208 A5 JP2006135208 A5 JP 2006135208A5
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Prior art keywords
rare earth
light
earth element
manufacturing
light emitting
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JP2004324641A
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JP4529646B2 (en
JP2006135208A (en
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Claims (23)

基板中に所定の分布を有する希土類元素イオンの拡散領域を形成する工程と、
熱処理によって前記希土類元素イオンの分布状態を所定の分布状態に保持して前記基板の深さ方向に前記希土類元素イオンの拡散領域を移動させる工程と
を備えたことを特徴とする希土類元素イオンの拡散領域の製造方法。
Forming a rare earth element diffusion region having a predetermined distribution in the substrate;
And a step of moving the diffusion region of the rare earth element ions in the depth direction of the substrate while maintaining the distribution state of the rare earth element ions in a predetermined distribution state by heat treatment. Area manufacturing method.
基板上に形成された発光層に量子井戸と希土類元素イオンとを含んでいる発光素子の製造方法であって、
前記量子井戸に接する前記発光層を構成する材料層に前記希土類元素イオンを導入した後、
前記発光層を構成する材料層に導入された前記希土類元素イオンの分布状態を所定の分布状態に保持して前記基板の深さ方向に前記希土類元素イオンの拡散領域を移動させる熱処理を行う
ことを特徴とする発光素子の製造方法。
A method for manufacturing a light emitting device comprising a quantum well and a rare earth element ion in a light emitting layer formed on a substrate,
After introducing the rare earth element ions into the material layer constituting the light emitting layer in contact with the quantum well,
Performing a heat treatment for maintaining the distribution state of the rare earth element ions introduced into the material layer constituting the light emitting layer in a predetermined distribution state and moving the diffusion region of the rare earth element ions in the depth direction of the substrate. A method for manufacturing a light-emitting element.
前記発光層を構成する材料層に導入された前記希土類元素イオンの分布状態を所定の分布状態に保持して前記基板の深さ方向に前記希土類元素イオンの拡散領域を移動させる熱処理は、
前記希土類元素イオンが前記発光層を構成する材料層に導入された後に行われる熱処理後に行う、
ことを特徴とする請求項2記載の発光素子の製造方法。
The heat treatment for maintaining the distribution state of the rare earth element ions introduced into the material layer constituting the light emitting layer in a predetermined distribution state and moving the diffusion region of the rare earth element ions in the depth direction of the substrate,
After the heat treatment performed after the rare earth element ions are introduced into the material layer constituting the light emitting layer,
The method for manufacturing a light-emitting element according to claim 2.
前記希土類元素イオンの拡散領域における濃度分布ピーク値の位置を、前記量子井戸からフォースター機構によるエネルギー遷移が起こる範囲内にする
ことを特徴とする請求項2記載の発光素子の製造方法。
The method for manufacturing a light-emitting element according to claim 2, wherein the position of the concentration distribution peak value in the rare earth element ion diffusion region is within a range in which energy transition by the Forster mechanism occurs from the quantum well.
前記希土類元素イオンの拡散領域における濃度分布ピーク値の位置を、前記量子井戸から10nmの範囲内にする
ことを特徴とする請求項2記載の発光素子の製造方法。
The method of manufacturing a light emitting element according to claim 2, wherein the position of the concentration distribution peak value in the rare earth element ion diffusion region is within a range of 10 nm from the quantum well.
前記希土類元素イオンの拡散領域における濃度分布ピーク値の位置を、前記量子井戸からデクスター機構によるエネルギー遷移が起こる範囲内にする
ことを特徴とする請求項2記載の発光素子の製造方法。
The method of manufacturing a light emitting element according to claim 2, wherein the position of the concentration distribution peak value in the rare earth element ion diffusion region is set within a range in which energy transition from the quantum well by a Dexter mechanism occurs.
前記希土類元素イオンの拡散領域における濃度分布ピーク値の位置を、前記量子井戸から1nmの範囲内にする
ことを特徴とする請求項2記載の発光素子の製造方法。
The method of manufacturing a light emitting element according to claim 2, wherein the position of the concentration distribution peak value in the rare earth element ion diffusion region is within a range of 1 nm from the quantum well.
前記希土類元素イオンの拡散領域における濃度分布ピーク値の位置を、前記量子井戸からフォトンを介したエネルギー遷移が起こる範囲内にする
ことを特徴とする請求項2記載の発光素子の製造方法。
The method for manufacturing a light-emitting element according to claim 2, wherein the position of the concentration distribution peak value in the rare earth element ion diffusion region is within a range where energy transition from the quantum well via photons occurs.
前記発光層は、量子井戸と希土類元素イオンとシリコンを主成分とする材料層とから構成される
ことを特徴とする請求項2記載の発光素子の製造方法。
The method for manufacturing a light-emitting element according to claim 2, wherein the light-emitting layer includes a quantum well, a rare earth element ion, and a material layer mainly composed of silicon.
前記シリコンを主成分とする材料層は、シリコン系酸化物からなる
ことを特徴とする請求項2記載の発光素子の製造方法。
The method for manufacturing a light-emitting element according to claim 2, wherein the material layer mainly containing silicon is made of a silicon-based oxide.
前記希土類元素は、ユーロビウム(Eu)、プラセオジウム(Pr)、エルビウム(Er)、テルビウム(Tb)、セリウム(Ce)、ツリウム(Tm)もしくは複数種の希土類元素である
ことを特徴とする請求項2記載の発光素子の製造方法。
The rare earth element is eurobium (Eu) , praseodymium (Pr), erbium (Er), terbium (Tb), cerium (Ce), thulium (Tm), or a plurality of rare earth elements. The manufacturing method of the light emitting element of description.
前記熱処理は不活性な雰囲気中で行われる
ことを特徴とする請求項2記載の発光素子の製造方法。
The method for manufacturing a light-emitting element according to claim 2, wherein the heat treatment is performed in an inert atmosphere.
前記不活性な雰囲気はアルゴン雰囲気である
ことを特徴とする請求項12記載の発光素子の製造方法。
The method for manufacturing a light-emitting element according to claim 12, wherein the inert atmosphere is an argon atmosphere.
前記不活性な雰囲気は窒素雰囲気である
ことを特徴とする請求項12記載の発光素子の製造方法。
The method for manufacturing a light-emitting element according to claim 12, wherein the inert atmosphere is a nitrogen atmosphere.
前記不活性な雰囲気は真空雰囲気である
ことを特徴とする請求項12記載の発光素子の製造方法。
The method for manufacturing a light-emitting element according to claim 12, wherein the inert atmosphere is a vacuum atmosphere.
前記発光層を構成する材料層は、
化学的気相成長法もしくはスパッタリング法によりSiO2-x(2≧x≧0)膜で作製した後、アニール処理して形成される
ことを特徴とする請求項2記載の発光素子の製造方法。
The material layer constituting the light emitting layer is:
The method for manufacturing a light-emitting element according to claim 2, wherein the light-emitting element is formed by a chemical vapor deposition method or a sputtering method using a SiO 2 -x (2 ≧ x ≧ 0) film and then annealing.
基板上に形成された発光層に量子井戸と希土類元素イオンとを含んでいる発光素子であって、
熱処理によって、前記希土類元素イオンの分布状態を所定の分布状態に保持して前記基板の深さ方向に前記希土類元素イオンの拡散領域が移動するものである
ことを特徴とする発光素子。
A light-emitting device comprising a quantum well and a rare earth element ion in a light-emitting layer formed on a substrate,
The light-emitting element is characterized in that the rare earth element ion diffusion region moves in the depth direction of the substrate while the rare earth element ion distribution state is maintained in a predetermined distribution state by heat treatment.
前記希土類元素イオンの分布の中心位置を移動させることで発光強度が調整されたものからなる
ことを特徴とする請求項17記載の発光素子。
The light emitting device according to claim 17 , wherein the light emission intensity is adjusted by moving a center position of the distribution of the rare earth element ions.
前記希土類元素イオンの分布の中心位置を移動が熱処理により行われたものからなる
ことを特徴とする請求項17記載の発光素子。
The light emitting device according to claim 17, wherein the center position of the distribution of the rare earth element ions is moved by heat treatment.
前記希土類元素イオンがイオン注入法により前記発光層中に導入されたものからなる
ことを特徴とする請求項17記載の発光素子。
The light emitting device according to claim 17, wherein the rare earth element ions are introduced into the light emitting layer by an ion implantation method.
前記発光層は、量子井戸と希土類元素イオンとシリコンを主成分とする材料層とから構成されたものからなる
ことを特徴とする請求項17記載の発光素子。
The light emitting device according to claim 17 , wherein the light emitting layer is composed of a quantum well, a rare earth element ion, and a material layer mainly composed of silicon.
前記シリコンを主成分とする材料層は、シリコン系酸化物からなる
ことを特徴とする請求項21記載の発光素子。
The light-emitting element according to claim 21, wherein the material layer containing silicon as a main component is made of a silicon-based oxide.
前記希土類元素は、ユーロビウム(Eu)、プラセオジウム(Pr)、エルビウム(Er)、テルビウム(Tb)、セリウム(Ce)、ツリウム(Tm)もしくは複数種の希土類元素である
ことを特徴とする請求項17記載の発光素子。
The rare earth element, europium (Eu), praseodymium (Pr), erbium (Er), terbium (Tb), cerium (Ce), claim 17, characterized in that the thulium (Tm) or more of rare earth elements The light emitting element of description.
JP2004324641A 2004-11-09 2004-11-09 Rare earth element ion diffusion region manufacturing method, light emitting device manufacturing method, and light emitting device Expired - Fee Related JP4529646B2 (en)

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GB201019725D0 (en) 2010-11-22 2011-01-05 Univ Surrey Optoelectronic devices
US10957815B2 (en) 2017-09-05 2021-03-23 Sharp Kabushiki Kaisha Light-emitting device

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GB8711373D0 (en) * 1987-05-14 1987-06-17 Secr Defence Electroluminescent silicon device
EP0650200B1 (en) * 1993-10-20 1999-03-10 Consorzio per la Ricerca sulla Microelettronica nel Mezzogiorno Solid state electro-luminescent device and process for fabrication thereof
JP3027092B2 (en) * 1994-07-27 2000-03-27 シャープ株式会社 Method of forming porous silicon light emitting layer
JP3600872B2 (en) * 1996-04-30 2004-12-15 独立行政法人理化学研究所 Rare earth element doped Si material and manufacturing method thereof
JPH1117217A (en) * 1997-06-27 1999-01-22 Res Dev Corp Of Japan Manufacture of material for light-emitting element
FR2789496B1 (en) * 1999-02-10 2002-06-07 Commissariat Energie Atomique LIGHT EMITTING DEVICE AND GUIDE, WITH AN ACTIVE SILICON REGION CONTAINING RADIATION CENTERS, AND METHOD FOR MANUFACTURING SUCH A DEVICE
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