JP2006135208A5 - - Google Patents
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- JP2006135208A5 JP2006135208A5 JP2004324641A JP2004324641A JP2006135208A5 JP 2006135208 A5 JP2006135208 A5 JP 2006135208A5 JP 2004324641 A JP2004324641 A JP 2004324641A JP 2004324641 A JP2004324641 A JP 2004324641A JP 2006135208 A5 JP2006135208 A5 JP 2006135208A5
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- rare earth
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- earth element
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- light emitting
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Claims (23)
熱処理によって前記希土類元素イオンの分布状態を所定の分布状態に保持して前記基板の深さ方向に前記希土類元素イオンの拡散領域を移動させる工程と
を備えたことを特徴とする希土類元素イオンの拡散領域の製造方法。 Forming a rare earth element diffusion region having a predetermined distribution in the substrate;
And a step of moving the diffusion region of the rare earth element ions in the depth direction of the substrate while maintaining the distribution state of the rare earth element ions in a predetermined distribution state by heat treatment. Area manufacturing method.
前記量子井戸に接する前記発光層を構成する材料層に前記希土類元素イオンを導入した後、
前記発光層を構成する材料層に導入された前記希土類元素イオンの分布状態を所定の分布状態に保持して前記基板の深さ方向に前記希土類元素イオンの拡散領域を移動させる熱処理を行う
ことを特徴とする発光素子の製造方法。 A method for manufacturing a light emitting device comprising a quantum well and a rare earth element ion in a light emitting layer formed on a substrate,
After introducing the rare earth element ions into the material layer constituting the light emitting layer in contact with the quantum well,
Performing a heat treatment for maintaining the distribution state of the rare earth element ions introduced into the material layer constituting the light emitting layer in a predetermined distribution state and moving the diffusion region of the rare earth element ions in the depth direction of the substrate. A method for manufacturing a light-emitting element.
前記希土類元素イオンが前記発光層を構成する材料層に導入された後に行われる熱処理後に行う、
ことを特徴とする請求項2記載の発光素子の製造方法。 The heat treatment for maintaining the distribution state of the rare earth element ions introduced into the material layer constituting the light emitting layer in a predetermined distribution state and moving the diffusion region of the rare earth element ions in the depth direction of the substrate,
After the heat treatment performed after the rare earth element ions are introduced into the material layer constituting the light emitting layer,
The method for manufacturing a light-emitting element according to claim 2.
ことを特徴とする請求項2記載の発光素子の製造方法。 The method for manufacturing a light-emitting element according to claim 2, wherein the position of the concentration distribution peak value in the rare earth element ion diffusion region is within a range in which energy transition by the Forster mechanism occurs from the quantum well.
ことを特徴とする請求項2記載の発光素子の製造方法。 The method of manufacturing a light emitting element according to claim 2, wherein the position of the concentration distribution peak value in the rare earth element ion diffusion region is within a range of 10 nm from the quantum well.
ことを特徴とする請求項2記載の発光素子の製造方法。 The method of manufacturing a light emitting element according to claim 2, wherein the position of the concentration distribution peak value in the rare earth element ion diffusion region is set within a range in which energy transition from the quantum well by a Dexter mechanism occurs.
ことを特徴とする請求項2記載の発光素子の製造方法。 The method of manufacturing a light emitting element according to claim 2, wherein the position of the concentration distribution peak value in the rare earth element ion diffusion region is within a range of 1 nm from the quantum well.
ことを特徴とする請求項2記載の発光素子の製造方法。 The method for manufacturing a light-emitting element according to claim 2, wherein the position of the concentration distribution peak value in the rare earth element ion diffusion region is within a range where energy transition from the quantum well via photons occurs.
ことを特徴とする請求項2記載の発光素子の製造方法。 The method for manufacturing a light-emitting element according to claim 2, wherein the light-emitting layer includes a quantum well, a rare earth element ion, and a material layer mainly composed of silicon.
ことを特徴とする請求項2記載の発光素子の製造方法。 The method for manufacturing a light-emitting element according to claim 2, wherein the material layer mainly containing silicon is made of a silicon-based oxide.
ことを特徴とする請求項2記載の発光素子の製造方法。 The rare earth element is eurobium (Eu) , praseodymium (Pr), erbium (Er), terbium (Tb), cerium (Ce), thulium (Tm), or a plurality of rare earth elements. The manufacturing method of the light emitting element of description.
ことを特徴とする請求項2記載の発光素子の製造方法。 The method for manufacturing a light-emitting element according to claim 2, wherein the heat treatment is performed in an inert atmosphere.
ことを特徴とする請求項12記載の発光素子の製造方法。 The method for manufacturing a light-emitting element according to claim 12, wherein the inert atmosphere is an argon atmosphere.
ことを特徴とする請求項12記載の発光素子の製造方法。 The method for manufacturing a light-emitting element according to claim 12, wherein the inert atmosphere is a nitrogen atmosphere.
ことを特徴とする請求項12記載の発光素子の製造方法。 The method for manufacturing a light-emitting element according to claim 12, wherein the inert atmosphere is a vacuum atmosphere.
化学的気相成長法もしくはスパッタリング法によりSiO2-x(2≧x≧0)膜で作製した後、アニール処理して形成される
ことを特徴とする請求項2記載の発光素子の製造方法。 The material layer constituting the light emitting layer is:
The method for manufacturing a light-emitting element according to claim 2, wherein the light-emitting element is formed by a chemical vapor deposition method or a sputtering method using a SiO 2 -x (2 ≧ x ≧ 0) film and then annealing.
熱処理によって、前記希土類元素イオンの分布状態を所定の分布状態に保持して前記基板の深さ方向に前記希土類元素イオンの拡散領域が移動するものである
ことを特徴とする発光素子。 A light-emitting device comprising a quantum well and a rare earth element ion in a light-emitting layer formed on a substrate,
The light-emitting element is characterized in that the rare earth element ion diffusion region moves in the depth direction of the substrate while the rare earth element ion distribution state is maintained in a predetermined distribution state by heat treatment.
ことを特徴とする請求項17記載の発光素子。 The light emitting device according to claim 17 , wherein the light emission intensity is adjusted by moving a center position of the distribution of the rare earth element ions.
ことを特徴とする請求項17記載の発光素子。 The light emitting device according to claim 17, wherein the center position of the distribution of the rare earth element ions is moved by heat treatment.
ことを特徴とする請求項17記載の発光素子。 The light emitting device according to claim 17, wherein the rare earth element ions are introduced into the light emitting layer by an ion implantation method.
ことを特徴とする請求項17記載の発光素子。 The light emitting device according to claim 17 , wherein the light emitting layer is composed of a quantum well, a rare earth element ion, and a material layer mainly composed of silicon.
ことを特徴とする請求項21記載の発光素子。 The light-emitting element according to claim 21, wherein the material layer containing silicon as a main component is made of a silicon-based oxide.
ことを特徴とする請求項17記載の発光素子。 The rare earth element, europium (Eu), praseodymium (Pr), erbium (Er), terbium (Tb), cerium (Ce), claim 17, characterized in that the thulium (Tm) or more of rare earth elements The light emitting element of description.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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JP2004324641A JP4529646B2 (en) | 2004-11-09 | 2004-11-09 | Rare earth element ion diffusion region manufacturing method, light emitting device manufacturing method, and light emitting device |
Applications Claiming Priority (1)
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JP2004324641A JP4529646B2 (en) | 2004-11-09 | 2004-11-09 | Rare earth element ion diffusion region manufacturing method, light emitting device manufacturing method, and light emitting device |
Publications (3)
Publication Number | Publication Date |
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JP2006135208A JP2006135208A (en) | 2006-05-25 |
JP2006135208A5 true JP2006135208A5 (en) | 2007-10-25 |
JP4529646B2 JP4529646B2 (en) | 2010-08-25 |
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JP2004324641A Expired - Fee Related JP4529646B2 (en) | 2004-11-09 | 2004-11-09 | Rare earth element ion diffusion region manufacturing method, light emitting device manufacturing method, and light emitting device |
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JP (1) | JP4529646B2 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
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GB201019725D0 (en) | 2010-11-22 | 2011-01-05 | Univ Surrey | Optoelectronic devices |
US10957815B2 (en) | 2017-09-05 | 2021-03-23 | Sharp Kabushiki Kaisha | Light-emitting device |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB8711373D0 (en) * | 1987-05-14 | 1987-06-17 | Secr Defence | Electroluminescent silicon device |
EP0650200B1 (en) * | 1993-10-20 | 1999-03-10 | Consorzio per la Ricerca sulla Microelettronica nel Mezzogiorno | Solid state electro-luminescent device and process for fabrication thereof |
JP3027092B2 (en) * | 1994-07-27 | 2000-03-27 | シャープ株式会社 | Method of forming porous silicon light emitting layer |
JP3600872B2 (en) * | 1996-04-30 | 2004-12-15 | 独立行政法人理化学研究所 | Rare earth element doped Si material and manufacturing method thereof |
JPH1117217A (en) * | 1997-06-27 | 1999-01-22 | Res Dev Corp Of Japan | Manufacture of material for light-emitting element |
FR2789496B1 (en) * | 1999-02-10 | 2002-06-07 | Commissariat Energie Atomique | LIGHT EMITTING DEVICE AND GUIDE, WITH AN ACTIVE SILICON REGION CONTAINING RADIATION CENTERS, AND METHOD FOR MANUFACTURING SUCH A DEVICE |
JP4410894B2 (en) * | 2000-01-21 | 2010-02-03 | 富士通マイクロエレクトロニクス株式会社 | Semiconductor device |
JP2002344012A (en) * | 2001-05-17 | 2002-11-29 | Matsushita Electric Ind Co Ltd | Porous silicon substrate and light emitting-element using the same, and method for manufacturing the substrate |
US7095058B2 (en) * | 2003-03-21 | 2006-08-22 | Intel Corporation | System and method for an improved light-emitting device |
JP4815860B2 (en) * | 2004-11-11 | 2011-11-16 | ソニー株式会社 | Light emitting device and manufacturing method thereof |
JP4956916B2 (en) * | 2005-05-30 | 2012-06-20 | ソニー株式会社 | Light emitting element and light emitting device |
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2004
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