JP2006105997A5 - - Google Patents
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- Publication number
- JP2006105997A5 JP2006105997A5 JP2005292299A JP2005292299A JP2006105997A5 JP 2006105997 A5 JP2006105997 A5 JP 2006105997A5 JP 2005292299 A JP2005292299 A JP 2005292299A JP 2005292299 A JP2005292299 A JP 2005292299A JP 2006105997 A5 JP2006105997 A5 JP 2006105997A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/959,856 US7254760B2 (en) | 2004-10-05 | 2004-10-05 | Methods and apparatus for providing scan patterns to an electronic device |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006105997A JP2006105997A (ja) | 2006-04-20 |
JP2006105997A5 true JP2006105997A5 (ja) | 2008-11-13 |
Family
ID=36120724
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005292299A Pending JP2006105997A (ja) | 2004-10-05 | 2005-10-05 | 電子デバイスにスキャンパターンを提供する方法および装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7254760B2 (ja) |
JP (1) | JP2006105997A (ja) |
DE (1) | DE102005026403B4 (ja) |
TW (1) | TWI370261B (ja) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7685487B1 (en) * | 2005-03-22 | 2010-03-23 | Advanced Micro Devices, Inc. | Simultaneous core testing in multi-core integrated circuits |
US7526694B1 (en) * | 2006-08-03 | 2009-04-28 | Xilinx, Inc. | Integrated circuit internal test circuit and method of testing therewith |
US20080077835A1 (en) * | 2006-09-27 | 2008-03-27 | Khoche A Jay | Automatic Test Equipment Receiving Diagnostic Information from Devices with Built-in Self Test |
US7650547B2 (en) * | 2007-02-28 | 2010-01-19 | Verigy (Singapore) Pte. Ltd. | Apparatus for locating a defect in a scan chain while testing digital logic |
US8127186B2 (en) | 2007-02-28 | 2012-02-28 | Verigy (Singapore) Pte. Ltd. | Methods and apparatus for estimating a position of a stuck-at defect in a scan chain of a device under test |
US20080235545A1 (en) * | 2007-03-06 | 2008-09-25 | Vinay Burjinroppa Jayaram | Re-using production test scan paths for system test of an integrated circuit |
US9183105B2 (en) * | 2013-02-04 | 2015-11-10 | Alcatel Lucent | Systems and methods for dynamic scan scheduling |
CN108508352B (zh) * | 2018-04-19 | 2020-11-24 | 中国电子科技集团公司第五十八研究所 | 一种测试码生成电路 |
US11156660B1 (en) * | 2019-12-19 | 2021-10-26 | Cadence Design Systems, Inc. | In-system scan test of electronic devices |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5790562A (en) * | 1996-05-06 | 1998-08-04 | General Motors Corporation | Circuit with built-in test and method thereof |
JPH11202026A (ja) * | 1998-01-13 | 1999-07-30 | Hitachi Ltd | 不良解析手法 |
US6393594B1 (en) * | 1999-08-11 | 2002-05-21 | International Business Machines Corporation | Method and system for performing pseudo-random testing of an integrated circuit |
US6591211B1 (en) * | 1999-08-27 | 2003-07-08 | Intel Corporation | Testing unit and self-evaluating device |
US6557129B1 (en) | 1999-11-23 | 2003-04-29 | Janusz Rajski | Method and apparatus for selectively compacting test responses |
US6424926B1 (en) * | 2000-03-31 | 2002-07-23 | Intel Corporation | Bus signature analyzer and behavioral functional test method |
DE10122619C1 (de) | 2001-05-10 | 2003-02-13 | Infineon Technologies Ag | Testschaltung zum Testen einer synchronen Schaltung |
US7159145B2 (en) * | 2003-05-12 | 2007-01-02 | Infineon Technologies Ag | Built-in self test system and method |
US7321999B2 (en) * | 2004-10-05 | 2008-01-22 | Verigy (Singapore) Pte. Ltd. | Methods and apparatus for programming and operating automated test equipment |
-
2004
- 2004-10-05 US US10/959,856 patent/US7254760B2/en active Active
-
2005
- 2005-04-14 TW TW094111829A patent/TWI370261B/zh active
- 2005-06-08 DE DE102005026403A patent/DE102005026403B4/de not_active Expired - Fee Related
- 2005-10-05 JP JP2005292299A patent/JP2006105997A/ja active Pending
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