JP2006105977A - 画像の動的最適化のためのシステム及び方法 - Google Patents
画像の動的最適化のためのシステム及び方法 Download PDFInfo
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- JP2006105977A JP2006105977A JP2005276979A JP2005276979A JP2006105977A JP 2006105977 A JP2006105977 A JP 2006105977A JP 2005276979 A JP2005276979 A JP 2005276979A JP 2005276979 A JP2005276979 A JP 2005276979A JP 2006105977 A JP2006105977 A JP 2006105977A
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- 238000005457 optimization Methods 0.000 title description 4
- 238000003384 imaging method Methods 0.000 claims abstract description 58
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- 229910052716 thallium Inorganic materials 0.000 description 2
- BKVIYDNLLOSFOA-UHFFFAOYSA-N thallium Chemical compound [Tl] BKVIYDNLLOSFOA-UHFFFAOYSA-N 0.000 description 2
- 229910052684 Cerium Inorganic materials 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- XQPRBTXUXXVTKB-UHFFFAOYSA-M caesium iodide Chemical compound [I-].[Cs+] XQPRBTXUXXVTKB-UHFFFAOYSA-M 0.000 description 1
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 description 1
- 229910001634 calcium fluoride Inorganic materials 0.000 description 1
- GWXLDORMOJMVQZ-UHFFFAOYSA-N cerium Chemical compound [Ce] GWXLDORMOJMVQZ-UHFFFAOYSA-N 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
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- 229910044991 metal oxide Inorganic materials 0.000 description 1
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- 239000013307 optical fiber Substances 0.000 description 1
- 238000012634 optical imaging Methods 0.000 description 1
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Images
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/30—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from X-rays
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/60—Control of cameras or camera modules
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/70—Circuitry for compensating brightness variation in the scene
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/32—Transforming X-rays
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- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measurement Of Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
【解決手段】 本イメージング・システム(10)は、放射線源(12)と、シンチレータ組立体(24)への放射線入射に基づいて画像信号を発生するように構成された検出器組立体(14)とを含む。発生した画像信号の少なくとも1つ又はそれ以上の特性は、検出器組立体への放射線入射により決定される。画像信号の1つ又はそれ以上の特性はまた、1つ又はそれ以上の検出器動作パラメータ(40)により決定することができる。イメージング・システム(10)はまた、生成した画像信号(50)に基づいて1つ又はそれ以上の検出器動作パラメータ(40)を調整するように構成された検出器調整回路(34)を含む。
【選択図】 図1
Description
12 放射線源
14 検出器組立体
16 プロセッサ組立体
18 表示ユニット
20 放射線
22 対象物
23 検出器ユニット
24 シンチレータ組立体
26 光検出器組立体
28 読取り回路
30 アナログ・デジタル変換器
32 検出器制御回路
34 検出器調整回路
46 構成回路
48 画像処理回路
Claims (10)
- 放射線源(12)と、
画像信号を発生するように構成され、前記画像信号の1つ又はそれ以上の特性がそれへの入射放射線(20)と1つ又はそれ以上のその動作パラメータ(40)とに基づいて決定される、検出器ユニット(23)と、
前記画像信号に基づいて前記1つ又はそれ以上の検出器動作パラメータ(40)を自動的に調整するように構成された検出器調整回路(34)と、
を含むイメージング・システム(10)。 - 前記検出器調整回路(34)が、前記1つ又はそれ以上の検出器動作パラメータ(40)を実質的にリアルタイムで調整するように構成されている、請求項1記載のイメージング・システム。
- 前記放射線源(12)が、X線源、ガンマ線源、近赤外線源、赤外線源、紫外線源、電磁放射線源又は中性子ビーム源を含む、請求項1記載のイメージング・システム(10)。
- 前記検出器調整回路(34)が、前記画像信号に基づいて前記検出器ユニット(23)のビニング・モードを自動的に調整するように構成されている、請求項1記載のイメージング・システム(10)。
- 前記検出器調整回路(34)が、前記画像信号に適用するアナログ・デジタル変換ランプを自動的に調整するように構成されている、請求項1記載のイメージング・システム(10)。
- 前記検出器調整回路(34)が、前記検出器ユニットの放射線(20)への曝露時間を自動的に調整するように構成されている、請求項1記載のイメージング・システム。
- 前記検出器調整回路(34)が、前記画像信号とオペレータ選択観察モードとに基づいて前記1つ又はそれ以上の検出器動作パラメータ(40)を自動的に調整するように構成されている、請求項1記載のイメージング・システム。
- 前記検出器調整回路(34)が、前記画像信号から生成した画像内のオペレータ選択関心領域のための前記1つ又はそれ以上の検出器動作パラメータ(40)を自動的に調整するように構成されている、請求項1記載のイメージング・システム。
- 前記検出器動作パラメータ(40)が、サンプリング速度、アナログ・デジタル変換ランプ、デジタル変換のタイミング、デジタル変換におけるゲイン、ピクセル拒絶フラグ、検出器における信号対雑音比又はコントラスト・ノイズ比の少なくとも1つを含む、請求項1記載のイメージング・システム。
- 前記検出器調整回路(34)が、システム・オペレータの指令に基づいて前記画像信号の動的又は継続的調整を実行する、請求項1記載のイメージング・システム。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/955,409 US20060065844A1 (en) | 2004-09-30 | 2004-09-30 | Systems and methods for dynamic optimization of image |
Publications (1)
Publication Number | Publication Date |
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JP2006105977A true JP2006105977A (ja) | 2006-04-20 |
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ID=35335771
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Application Number | Title | Priority Date | Filing Date |
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JP2005276979A Pending JP2006105977A (ja) | 2004-09-30 | 2005-09-26 | 画像の動的最適化のためのシステム及び方法 |
Country Status (3)
Country | Link |
---|---|
US (1) | US20060065844A1 (ja) |
EP (1) | EP1643757A1 (ja) |
JP (1) | JP2006105977A (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008116376A (ja) * | 2006-11-07 | 2008-05-22 | Shimadzu Corp | X線検査装置 |
CN103424416A (zh) * | 2013-08-07 | 2013-12-04 | 华南理工大学 | 一种基于x射线的轮毂检测系统及其检测方法 |
US8841612B2 (en) | 2010-09-25 | 2014-09-23 | Hitachi High-Technologies Corporation | Charged particle beam microscope |
Families Citing this family (20)
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JP4159052B2 (ja) * | 2005-01-21 | 2008-10-01 | 独立行政法人放射線医学総合研究所 | 放射線方向性検出器及び放射線モニタリング方法、装置 |
DE102005004383B4 (de) * | 2005-01-31 | 2007-04-12 | Siemens Ag | Verfahren und Vorrichtung zur Steuerung einer bildgebenden Modalität |
US20090174554A1 (en) | 2005-05-11 | 2009-07-09 | Eric Bergeron | Method and system for screening luggage items, cargo containers or persons |
US20070041613A1 (en) * | 2005-05-11 | 2007-02-22 | Luc Perron | Database of target objects suitable for use in screening receptacles or people and method and apparatus for generating same |
US7991242B2 (en) | 2005-05-11 | 2011-08-02 | Optosecurity Inc. | Apparatus, method and system for screening receptacles and persons, having image distortion correction functionality |
US7899232B2 (en) | 2006-05-11 | 2011-03-01 | Optosecurity Inc. | Method and apparatus for providing threat image projection (TIP) in a luggage screening system, and luggage screening system implementing same |
US8494210B2 (en) | 2007-03-30 | 2013-07-23 | Optosecurity Inc. | User interface for use in security screening providing image enhancement capabilities and apparatus for implementing same |
KR20090005843A (ko) * | 2007-07-10 | 2009-01-14 | 삼성전자주식회사 | 촬상 장치 및 촬상 장치의 감도 개선 방법 |
US7915591B2 (en) * | 2007-09-12 | 2011-03-29 | Morpho Detection, Inc. | Mask for coded aperture systems |
US8129686B2 (en) | 2007-09-12 | 2012-03-06 | Morpho Detection, Inc. | Mask for coded aperture systems |
WO2009102839A2 (en) * | 2008-02-14 | 2009-08-20 | The Research Foundation Of State University Of New York | Imaging array data acquisition system and use thereof |
US8546765B2 (en) * | 2008-06-26 | 2013-10-01 | Trixell | High dynamic range X-ray detector with improved signal to noise ratio |
US8693613B2 (en) * | 2010-01-14 | 2014-04-08 | General Electric Company | Nuclear fuel pellet inspection |
US9164131B2 (en) * | 2010-05-13 | 2015-10-20 | Tektronix, Inc. | Signal recognition and triggering using computer vision techniques |
JP6025849B2 (ja) | 2011-09-07 | 2016-11-16 | ラピスカン システムズ、インコーポレイテッド | マニフェストデータをイメージング/検知処理に統合するx線検査システム |
US10302807B2 (en) | 2016-02-22 | 2019-05-28 | Rapiscan Systems, Inc. | Systems and methods for detecting threats and contraband in cargo |
JP7121470B2 (ja) * | 2017-05-12 | 2022-08-18 | キヤノン株式会社 | 画像処理システム、制御方法、及び、プログラム |
US20200058141A1 (en) * | 2018-08-14 | 2020-02-20 | Carestream Health, Inc. | Image capture and reconstruction protocol selection system |
WO2020095531A1 (ja) * | 2018-11-08 | 2020-05-14 | 株式会社日立ハイテク | 荷電粒子線装置の調整方法及び荷電粒子線装置システム |
US11516406B2 (en) * | 2020-10-28 | 2022-11-29 | Baker Hughes Oilfield Operations Llc | Adaptive borescope inspection |
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2004
- 2004-09-30 US US10/955,409 patent/US20060065844A1/en not_active Abandoned
-
2005
- 2005-09-19 EP EP05255787A patent/EP1643757A1/en not_active Ceased
- 2005-09-26 JP JP2005276979A patent/JP2006105977A/ja active Pending
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JPH10225449A (ja) * | 1997-02-14 | 1998-08-25 | Hitachi Medical Corp | 透視用ccdカメラ装置 |
JPH10295680A (ja) * | 1997-04-25 | 1998-11-10 | Toshiba Corp | X線断層撮影装置 |
JPH11122540A (ja) * | 1997-10-17 | 1999-04-30 | Hamamatsu Photonics Kk | Ccdカメラ及びccdカメラ制御装置並びにccdカメラの感度調整方法 |
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JP2008116376A (ja) * | 2006-11-07 | 2008-05-22 | Shimadzu Corp | X線検査装置 |
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Also Published As
Publication number | Publication date |
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EP1643757A1 (en) | 2006-04-05 |
US20060065844A1 (en) | 2006-03-30 |
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