JP2006098060A5 - - Google Patents

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JP2006098060A5
JP2006098060A5 JP2004280827A JP2004280827A JP2006098060A5 JP 2006098060 A5 JP2006098060 A5 JP 2006098060A5 JP 2004280827 A JP2004280827 A JP 2004280827A JP 2004280827 A JP2004280827 A JP 2004280827A JP 2006098060 A5 JP2006098060 A5 JP 2006098060A5
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Prior art keywords
probe
yoke
contact
permanent magnet
force
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JP2004280827A
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JP4557657B2 (en
JP2006098060A (en
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Priority claimed from JP2004280827A external-priority patent/JP4557657B2/en
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Publication of JP2006098060A5 publication Critical patent/JP2006098060A5/ja
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Claims (10)

3次元的に移動可能な移動部材に、一軸方向に変位自在に保持されたプローブを被測定物に接触させて走査することにより、座標位置を測定する触式プローブであって、
前記プローブに固定された永久磁石と、前記永久磁石を囲み、前記永久磁石との間に前記一軸方向に対して距離が変化するすきまをもって対向する内面を有する箱形状のヨークとを備え、
前記ヨークが前記移動部材に保持され、前記永久磁石と前記ヨークに流れる磁束によって発生する磁力により、前記プローブにかかる重力をキャンセルする力と、前記ヨークに対する前記プローブの変位に従って変化するばね要素としての力を発生させることを特徴とする接触式プローブ。
A three-dimensionally movable member movable, the probes freely held displaced in one direction by scanning in contact with the object to be measured, a contact Sawashiki probe for measuring the coordinate position,
A permanent magnet fixed to the probe, and a box-shaped yoke that surrounds the permanent magnet and has an inner surface facing the permanent magnet with a gap that changes in distance relative to the uniaxial direction ,
The yoke is held by the moving member, and a force that cancels gravity applied to the probe by a magnetic force generated by the magnetic flux flowing through the permanent magnet and the yoke, and a spring element that changes according to the displacement of the probe with respect to the yoke A contact-type probe that generates force.
3次元的に移動可能な移動部材に、一軸方向に変位自在に保持されたプローブを被測定物に接触させて走査することにより、座標位置を測定する触式プローブであって、
前記プローブに固定された永久磁石と、前記永久磁石を囲み、前記永久磁石との間に前記一軸方向に対して距離が変化するすきまをもって対向する内面を有し、前記一軸方向と異なる方向に対する開口幅が変化するテーパー部を備えた箱形状のヨークと、前記ヨークを前記プローブに対して前記テーパー部のテーパー方向に移動させるヨーク駆動手段とを備え、
前記ヨーク駆動手段を介して前記ヨークが前記移動部材に保持され、前記永久磁石と前記ヨークに流れる磁束によって発生する磁力により、前記プローブにかかる重力をキャンセルする力と、前記ヨークに対する前記プローブの変位に従って変化するばね要素としての力を発生させることを特徴とする接触式プローブ。
A three-dimensionally movable member movable, the probes freely held displaced in one direction by scanning in contact with the object to be measured, a contact Sawashiki probe for measuring the coordinate position,
A permanent magnet fixed to said probe, said enclosing a permanent magnet, wherein with a gap distance changes with respect to the axial direction between the permanent magnets have a facing inner surface, an opening to said axial direction different from a direction A box-shaped yoke having a tapered portion whose width changes, and yoke driving means for moving the yoke in the taper direction of the tapered portion with respect to the probe ;
The yoke is held by the moving member via the yoke driving means, and the force that cancels the gravity applied to the probe by the magnetic force generated by the magnetic flux flowing through the permanent magnet and the yoke, and the displacement of the probe with respect to the yoke A contact probe characterized by generating a force as a spring element that changes according to the above.
3次元的に移動可能な移動部材に、一軸方向に変位自在に保持されたプローブを被測定物に接触させて走査することにより、座標位置を測定する触式プローブであって、
前記プローブに固定された永久磁石と、前記永久磁石を囲み、前記永久磁石との間に前記一軸方向に対して距離が変化するすきまをもって対向する内面を有する箱形状のヨークと、前記ヨークを前記プローブに対して前記一軸方向に移動させるヨーク駆動手段とを備え、
前記ヨーク駆動手段を介して前記ヨークが前記移動部材に保持され、前記永久磁石と前記ヨークに流れる磁束によって発生する磁力により、前記プローブにかかる重力をキャンセルする力と、前記ヨークに対する前記プローブの変位に従って変化するばね要素としての力を発生させることを特徴とする接触式プローブ。
A three-dimensionally movable member movable, the probes freely held displaced in one direction by scanning in contact with the object to be measured, a contact Sawashiki probe for measuring the coordinate position,
A permanent magnet fixed to the probe; a box-shaped yoke that surrounds the permanent magnet and has an inner surface facing the permanent magnet with a gap that changes in distance relative to the uniaxial direction; and the yoke Yoke drive means for moving in the uniaxial direction with respect to the probe ,
The yoke is held by the moving member via the yoke driving means, and the force that cancels the gravity applied to the probe by the magnetic force generated by the magnetic flux flowing through the permanent magnet and the yoke, and the displacement of the probe with respect to the yoke A contact probe characterized by generating a force as a spring element that changes according to the above.
箱形状のヨークが、一軸方向に一定の曲率で湾曲する曲面状の内面を有することを特徴とする請求項1ないし3いずれか1項記載の接触式プローブ。   The contact probe according to any one of claims 1 to 3, wherein the box-shaped yoke has a curved inner surface curved with a constant curvature in a uniaxial direction. プローブと移動部材との相対位置を検出する検出手段が設けられており、前記検出手段の出力に基づいて前記プローブの質量を計算することを特徴とする請求項1ないし4いずれか1項記載の接触式プローブ。   The detection means which detects the relative position of a probe and a moving member is provided, The mass of the said probe is calculated based on the output of the said detection means, The Claim 1 thru | or 4 characterized by the above-mentioned. Contact probe. 移動部材がプローブの移動を制限するストッパーを有し、プローブ位置の原点出しのために、ヨーク駆動手段によってヨークを移動させて前記プローブを前記ストッパーに当接することが自在であることを特徴とする請求項2ないし5いずれか1項記載の接触式プローブ。   The moving member has a stopper for restricting the movement of the probe, and for the origin of the probe position, the yoke can be moved by the yoke driving means so that the probe can be brought into contact with the stopper. The contact type probe according to claim 2. 移動部材がプローブの移動を制限するストッパーを有し、前記プローブを移動させて前記ストッパーに当接するためのプローブ駆動手段が設けられていることを特徴とする請求項1ないし6いずれか1項記載の接触式プローブ。   7. The moving member has a stopper for restricting the movement of the probe, and probe driving means for moving the probe to abut against the stopper is provided. Contact probe. プローブ駆動手段が、プローブにローレンツ力を発生させる磁気手段を有することを特徴とする請求項7記載の接触式プローブ。   8. The contact probe according to claim 7, wherein the probe driving means includes magnetic means for generating a Lorentz force on the probe. プローブ駆動手段が、エアーの吹き付けまたは吸引によってプローブを移動させるように構成されていることを特徴とする請求項7記載の接触式プローブ。   The contact probe according to claim 7, wherein the probe driving means is configured to move the probe by blowing or sucking air. 請求項1ないし9いずれか1項記載の接触式プローブと、前記接触式プローブを被測定物上で走査するための走査手段と、前記プローブの3次元座標位置を測定する座標位置測定手段とを備えたことを特徴とする形状測定装置。   A contact probe according to any one of claims 1 to 9, scanning means for scanning the contact probe over an object to be measured, and coordinate position measurement means for measuring a three-dimensional coordinate position of the probe. A shape measuring apparatus characterized by comprising.
JP2004280827A 2004-09-28 2004-09-28 Contact type probe and shape measuring device Expired - Fee Related JP4557657B2 (en)

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JP2004280827A JP4557657B2 (en) 2004-09-28 2004-09-28 Contact type probe and shape measuring device

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JP2004280827A JP4557657B2 (en) 2004-09-28 2004-09-28 Contact type probe and shape measuring device

Publications (3)

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JP2006098060A JP2006098060A (en) 2006-04-13
JP2006098060A5 true JP2006098060A5 (en) 2007-11-15
JP4557657B2 JP4557657B2 (en) 2010-10-06

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Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4291849B2 (en) * 2006-12-20 2009-07-08 パナソニック株式会社 3D measurement probe
JP5209440B2 (en) * 2008-10-30 2013-06-12 独立行政法人理化学研究所 Shape measuring probe
JP5255422B2 (en) * 2008-12-16 2013-08-07 独立行政法人理化学研究所 Shape measuring probe
JP4850265B2 (en) * 2009-03-12 2012-01-11 パナソニック株式会社 Probe for shape measuring device and shape measuring device
JP4875180B2 (en) * 2010-03-25 2012-02-15 ファナック株式会社 Contact-type measuring device with fine contact force adjustment mechanism

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2519823B2 (en) * 1990-08-17 1996-07-31 株式会社東芝 Displacement measuring device
JPH04113210A (en) * 1990-09-03 1992-04-14 Toshiba Corp Displacement measuring device
JP3420327B2 (en) * 1994-05-26 2003-06-23 株式会社ミツトヨ Touch signal probe
JP2000155002A (en) * 1998-11-19 2000-06-06 Mitsutoyo Corp Probe for shape measurement
JP4557466B2 (en) * 2001-08-02 2010-10-06 キヤノン株式会社 Contact probe
JP4376592B2 (en) * 2003-10-31 2009-12-02 株式会社リコー Shape measuring device

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