JP2006098060A5 - - Google Patents
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- JP2006098060A5 JP2006098060A5 JP2004280827A JP2004280827A JP2006098060A5 JP 2006098060 A5 JP2006098060 A5 JP 2006098060A5 JP 2004280827 A JP2004280827 A JP 2004280827A JP 2004280827 A JP2004280827 A JP 2004280827A JP 2006098060 A5 JP2006098060 A5 JP 2006098060A5
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- JP
- Japan
- Prior art keywords
- probe
- yoke
- contact
- permanent magnet
- force
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Claims (10)
前記プローブに固定された永久磁石と、前記永久磁石を囲み、前記永久磁石との間に前記一軸方向に対して距離が変化するすきまをもって対向する内面を有する箱形状のヨークとを備え、
前記ヨークが前記移動部材に保持され、前記永久磁石と前記ヨークに流れる磁束によって発生する磁力により、前記プローブにかかる重力をキャンセルする力と、前記ヨークに対する前記プローブの変位に従って変化するばね要素としての力を発生させることを特徴とする接触式プローブ。 A three-dimensionally movable member movable, the probes freely held displaced in one direction by scanning in contact with the object to be measured, a contact Sawashiki probe for measuring the coordinate position,
A permanent magnet fixed to the probe, and a box-shaped yoke that surrounds the permanent magnet and has an inner surface facing the permanent magnet with a gap that changes in distance relative to the uniaxial direction ,
The yoke is held by the moving member, and a force that cancels gravity applied to the probe by a magnetic force generated by the magnetic flux flowing through the permanent magnet and the yoke, and a spring element that changes according to the displacement of the probe with respect to the yoke A contact-type probe that generates force.
前記プローブに固定された永久磁石と、前記永久磁石を囲み、前記永久磁石との間に前記一軸方向に対して距離が変化するすきまをもって対向する内面を有し、前記一軸方向と異なる方向に対する開口幅が変化するテーパー部を備えた箱形状のヨークと、前記ヨークを前記プローブに対して前記テーパー部のテーパー方向に移動させるヨーク駆動手段とを備え、
前記ヨーク駆動手段を介して前記ヨークが前記移動部材に保持され、前記永久磁石と前記ヨークに流れる磁束によって発生する磁力により、前記プローブにかかる重力をキャンセルする力と、前記ヨークに対する前記プローブの変位に従って変化するばね要素としての力を発生させることを特徴とする接触式プローブ。 A three-dimensionally movable member movable, the probes freely held displaced in one direction by scanning in contact with the object to be measured, a contact Sawashiki probe for measuring the coordinate position,
A permanent magnet fixed to said probe, said enclosing a permanent magnet, wherein with a gap distance changes with respect to the axial direction between the permanent magnets have a facing inner surface, an opening to said axial direction different from a direction A box-shaped yoke having a tapered portion whose width changes, and yoke driving means for moving the yoke in the taper direction of the tapered portion with respect to the probe ;
The yoke is held by the moving member via the yoke driving means, and the force that cancels the gravity applied to the probe by the magnetic force generated by the magnetic flux flowing through the permanent magnet and the yoke, and the displacement of the probe with respect to the yoke A contact probe characterized by generating a force as a spring element that changes according to the above.
前記プローブに固定された永久磁石と、前記永久磁石を囲み、前記永久磁石との間に前記一軸方向に対して距離が変化するすきまをもって対向する内面を有する箱形状のヨークと、前記ヨークを前記プローブに対して前記一軸方向に移動させるヨーク駆動手段とを備え、
前記ヨーク駆動手段を介して前記ヨークが前記移動部材に保持され、前記永久磁石と前記ヨークに流れる磁束によって発生する磁力により、前記プローブにかかる重力をキャンセルする力と、前記ヨークに対する前記プローブの変位に従って変化するばね要素としての力を発生させることを特徴とする接触式プローブ。 A three-dimensionally movable member movable, the probes freely held displaced in one direction by scanning in contact with the object to be measured, a contact Sawashiki probe for measuring the coordinate position,
A permanent magnet fixed to the probe; a box-shaped yoke that surrounds the permanent magnet and has an inner surface facing the permanent magnet with a gap that changes in distance relative to the uniaxial direction; and the yoke Yoke drive means for moving in the uniaxial direction with respect to the probe ,
The yoke is held by the moving member via the yoke driving means, and the force that cancels the gravity applied to the probe by the magnetic force generated by the magnetic flux flowing through the permanent magnet and the yoke, and the displacement of the probe with respect to the yoke A contact probe characterized by generating a force as a spring element that changes according to the above.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004280827A JP4557657B2 (en) | 2004-09-28 | 2004-09-28 | Contact type probe and shape measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004280827A JP4557657B2 (en) | 2004-09-28 | 2004-09-28 | Contact type probe and shape measuring device |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2006098060A JP2006098060A (en) | 2006-04-13 |
JP2006098060A5 true JP2006098060A5 (en) | 2007-11-15 |
JP4557657B2 JP4557657B2 (en) | 2010-10-06 |
Family
ID=36238050
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004280827A Expired - Fee Related JP4557657B2 (en) | 2004-09-28 | 2004-09-28 | Contact type probe and shape measuring device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4557657B2 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4291849B2 (en) * | 2006-12-20 | 2009-07-08 | パナソニック株式会社 | 3D measurement probe |
JP5209440B2 (en) * | 2008-10-30 | 2013-06-12 | 独立行政法人理化学研究所 | Shape measuring probe |
JP5255422B2 (en) * | 2008-12-16 | 2013-08-07 | 独立行政法人理化学研究所 | Shape measuring probe |
JP4850265B2 (en) * | 2009-03-12 | 2012-01-11 | パナソニック株式会社 | Probe for shape measuring device and shape measuring device |
JP4875180B2 (en) * | 2010-03-25 | 2012-02-15 | ファナック株式会社 | Contact-type measuring device with fine contact force adjustment mechanism |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2519823B2 (en) * | 1990-08-17 | 1996-07-31 | 株式会社東芝 | Displacement measuring device |
JPH04113210A (en) * | 1990-09-03 | 1992-04-14 | Toshiba Corp | Displacement measuring device |
JP3420327B2 (en) * | 1994-05-26 | 2003-06-23 | 株式会社ミツトヨ | Touch signal probe |
JP2000155002A (en) * | 1998-11-19 | 2000-06-06 | Mitsutoyo Corp | Probe for shape measurement |
JP4557466B2 (en) * | 2001-08-02 | 2010-10-06 | キヤノン株式会社 | Contact probe |
JP4376592B2 (en) * | 2003-10-31 | 2009-12-02 | 株式会社リコー | Shape measuring device |
-
2004
- 2004-09-28 JP JP2004280827A patent/JP4557657B2/en not_active Expired - Fee Related
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