JP2006054188A - 高圧電気機器の部品の摩耗を検出する方法及び装置 - Google Patents
高圧電気機器の部品の摩耗を検出する方法及び装置 Download PDFInfo
- Publication number
- JP2006054188A JP2006054188A JP2005235462A JP2005235462A JP2006054188A JP 2006054188 A JP2006054188 A JP 2006054188A JP 2005235462 A JP2005235462 A JP 2005235462A JP 2005235462 A JP2005235462 A JP 2005235462A JP 2006054188 A JP2006054188 A JP 2006054188A
- Authority
- JP
- Japan
- Prior art keywords
- tracer material
- insulating medium
- fluorescent tracer
- electric arc
- exposed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
- G01R31/3272—Apparatus, systems or circuits therefor
- G01R31/3274—Details related to measuring, e.g. sensing, displaying or computing; Measuring of variables related to the contact pieces, e.g. wear, position or resistance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H1/00—Contacts
- H01H1/0015—Means for testing or for inspecting contacts, e.g. wear indicator
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H33/00—High-tension or heavy-current switches with arc-extinguishing or arc-preventing means
- H01H33/70—Switches with separate means for directing, obtaining, or increasing flow of arc-extinguishing fluid
- H01H33/7015—Switches with separate means for directing, obtaining, or increasing flow of arc-extinguishing fluid characterised by flow directing elements associated with contacts
- H01H33/7076—Switches with separate means for directing, obtaining, or increasing flow of arc-extinguishing fluid characterised by flow directing elements associated with contacts characterised by the use of special materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H1/00—Contacts
- H01H1/0015—Means for testing or for inspecting contacts, e.g. wear indicator
- H01H2001/0026—Means for testing or for inspecting contacts, e.g. wear indicator wherein one or both contacts contain embedded contact wear signal material, e.g. radioactive material being released as soon as the contact wear reaches the embedded layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H1/00—Contacts
- H01H1/0015—Means for testing or for inspecting contacts, e.g. wear indicator
- H01H2001/0031—Means for testing or for inspecting contacts, e.g. wear indicator by analysing radiation emitted by arc or trace material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H9/00—Details of switching devices, not covered by groups H01H1/00 - H01H7/00
- H01H9/0005—Tap change devices
- H01H2009/0061—Monitoring tap change switching devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H33/00—High-tension or heavy-current switches with arc-extinguishing or arc-preventing means
- H01H33/70—Switches with separate means for directing, obtaining, or increasing flow of arc-extinguishing fluid
- H01H33/7015—Switches with separate means for directing, obtaining, or increasing flow of arc-extinguishing fluid characterised by flow directing elements associated with contacts
- H01H33/7023—Switches with separate means for directing, obtaining, or increasing flow of arc-extinguishing fluid characterised by flow directing elements associated with contacts characterised by an insulating tubular gas flow enhancing nozzle
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H9/00—Details of switching devices, not covered by groups H01H1/00 - H01H7/00
- H01H9/0005—Tap change devices
Landscapes
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Arc-Extinguishing Devices That Are Switches (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/917,747 US7053625B2 (en) | 2002-09-11 | 2004-08-13 | Method and apparatus for detecting wear in components of high voltage electrical equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2006054188A true JP2006054188A (ja) | 2006-02-23 |
| JP2006054188A5 JP2006054188A5 (https=) | 2006-05-25 |
Family
ID=35311765
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005235462A Pending JP2006054188A (ja) | 2004-08-13 | 2005-08-15 | 高圧電気機器の部品の摩耗を検出する方法及び装置 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7053625B2 (https=) |
| EP (1) | EP1626268B1 (https=) |
| JP (1) | JP2006054188A (https=) |
| AT (1) | ATE430307T1 (https=) |
| AU (1) | AU2005203543B2 (https=) |
| CA (1) | CA2515618A1 (https=) |
| DE (1) | DE602005014178D1 (https=) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102735976A (zh) * | 2012-07-05 | 2012-10-17 | 金施特·尼古拉·弗拉基米罗维奇 | 高压电力设备元件状态的监测方法 |
| JP2013105007A (ja) * | 2011-11-14 | 2013-05-30 | Ricoh Co Ltd | 感光体、プロセスカートリッジ及び画像形成装置 |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7038201B2 (en) * | 2002-12-13 | 2006-05-02 | Nichols Applied Technology, Llc | Method and apparatus for determining electrical contact wear |
| JP5032091B2 (ja) * | 2006-10-12 | 2012-09-26 | 株式会社東芝 | ガス絶縁開閉装置及びガス絶縁開閉装置用部品のアーク損傷検出方法 |
| EP2279548B1 (en) * | 2008-04-21 | 2015-09-16 | ABB Research Ltd. | Arc detector and associated method for detecting undesired arcs |
| US9329238B1 (en) * | 2014-11-14 | 2016-05-03 | Schneider Electric USA, Inc. | Contact wear detection by spectral analysis shift |
| CN104827490B (zh) * | 2015-05-21 | 2016-07-06 | 大连理工大学 | 基于摩擦或静电感应控制的机器人触觉系统及方法 |
| US9885659B1 (en) | 2016-10-04 | 2018-02-06 | International Business Machines Corporation | Method to determine connector metal wear via flouresence |
| US11181462B2 (en) | 2018-11-30 | 2021-11-23 | International Business Machines Corporation | Non-destructive method to determine porosity in metallic coatings |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3164006A (en) * | 1962-04-16 | 1965-01-05 | James R Alburger | Evaluation performance of liquid penetrant tracer materials |
| US3715598A (en) | 1969-06-12 | 1973-02-06 | G Tomlin | Integral fault detection system for operating electronics equipment |
| US5389792A (en) | 1993-01-04 | 1995-02-14 | Grumman Aerospace Corporation | Electron microprobe utilizing thermal detector arrays |
| US5453591A (en) | 1994-04-05 | 1995-09-26 | Abb Power T&D Company Inc. | Sensing structure for component wear in high voltage circuit interrupters |
| JPH07333369A (ja) * | 1994-06-13 | 1995-12-22 | Hitachi Ltd | 核融合装置 |
| CN1088197C (zh) | 1994-10-27 | 2002-07-24 | 西门子公司 | 开关器 |
| US5941370A (en) | 1996-09-10 | 1999-08-24 | Nichols; Bruce W. | Electrical contact wear |
| DE19936868A1 (de) * | 1999-08-05 | 2001-02-15 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Verfahren und Vorrichtung zur Herstellung von oxidischen Nanokristallen |
| US6448758B1 (en) * | 2000-01-07 | 2002-09-10 | General Electric Company | Method for determining wear and other characteristics of electrodes in high voltage equipment |
| US6777948B2 (en) * | 2002-09-11 | 2004-08-17 | Electric Power Research Institute, Inc. | Method and apparatus for detecting wear in components of high voltage electrical equipment |
| US6884998B2 (en) * | 2002-12-13 | 2005-04-26 | Nichols Applied Technology, Llc | Method and apparatus for determining electrical contact wear |
-
2004
- 2004-08-13 US US10/917,747 patent/US7053625B2/en not_active Expired - Fee Related
-
2005
- 2005-08-06 EP EP05254930A patent/EP1626268B1/en not_active Expired - Lifetime
- 2005-08-06 DE DE602005014178T patent/DE602005014178D1/de not_active Expired - Lifetime
- 2005-08-06 AT AT05254930T patent/ATE430307T1/de not_active IP Right Cessation
- 2005-08-08 CA CA002515618A patent/CA2515618A1/en not_active Abandoned
- 2005-08-09 AU AU2005203543A patent/AU2005203543B2/en not_active Ceased
- 2005-08-15 JP JP2005235462A patent/JP2006054188A/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013105007A (ja) * | 2011-11-14 | 2013-05-30 | Ricoh Co Ltd | 感光体、プロセスカートリッジ及び画像形成装置 |
| CN102735976A (zh) * | 2012-07-05 | 2012-10-17 | 金施特·尼古拉·弗拉基米罗维奇 | 高压电力设备元件状态的监测方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP1626268A3 (en) | 2007-12-26 |
| US7053625B2 (en) | 2006-05-30 |
| US20050104598A1 (en) | 2005-05-19 |
| CA2515618A1 (en) | 2006-02-13 |
| ATE430307T1 (de) | 2009-05-15 |
| EP1626268B1 (en) | 2009-04-29 |
| AU2005203543A1 (en) | 2006-03-02 |
| EP1626268A2 (en) | 2006-02-15 |
| DE602005014178D1 (de) | 2009-06-10 |
| AU2005203543B2 (en) | 2008-02-07 |
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Legal Events
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| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20060314 |
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| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20080204 |
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| A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20080502 |
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| A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20080509 |
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| A02 | Decision of refusal |
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