JP2006024588A - Substrate stage device - Google Patents

Substrate stage device Download PDF

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JP2006024588A
JP2006024588A JP2004198808A JP2004198808A JP2006024588A JP 2006024588 A JP2006024588 A JP 2006024588A JP 2004198808 A JP2004198808 A JP 2004198808A JP 2004198808 A JP2004198808 A JP 2004198808A JP 2006024588 A JP2006024588 A JP 2006024588A
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substrate
pusher
stage
fluid
substrate stage
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Yuichi Nakada
雄一 中田
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Japan Steel Works Ltd
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Japan Steel Works Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a pusher pin that prevents the lower surface of a substrate from being damaged when the pin is abutted with the lower surface for supporting the substrate. <P>SOLUTION: A substrate stage device is provided with vertically moved pusher members 2a and 2b at, at least, five spots of a substrate stage 125 and delivers and receives a substrate 126 to be treated to and from a robot by supporting the peripheral edge section and central part of the substrate 126 by means of the pusher members 2a and 2b. At least one pusher member 2b which supports the central part of the substrate 126 has a fluid blowing-out port 10 which exerts a floating force to the substrate 126, and exerts the floating force to the substrate 126 with a fluid blown out from the port 10. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、基板ステージ装置に関するものであり、特に液晶表示装置用等のガラス基板を載置する基板ステージ装置に関するものである。   The present invention relates to a substrate stage device, and more particularly to a substrate stage device on which a glass substrate for a liquid crystal display device or the like is placed.

従来の基板の処理装置として、例えば液晶パネルを製造するためのガラス基板の処理装置が知られている(例えば特許文献1)。この種の基板の処理装置では、図8に示すように、未処理の液晶基板を回転駆動ステージ65を備えたロードロック室60に搬入し、回転駆動ステージ65によつて液晶基板を処理する方向に合わせて回転すると共に、プロセス室64のプロセス雰囲気に合わせてロードロック室60内を窒素雰囲気、大気雰囲気等にコントロールした後、雰囲気コントロールされた搬送室62内に配備された搬送ロボット63にて液晶基板を窒素雰囲気、大気雰囲気等のプロセス室64内のプロセスステージ61に搬入し、レーザ照射部66からのレーザ光を基板へ照射させてプロセス処理を行う。各室60,62,64の液晶基板の出入口には、基板の搬入搬出時に開くゲート72,73,74が配設されている。   As a conventional substrate processing apparatus, for example, a glass substrate processing apparatus for manufacturing a liquid crystal panel is known (for example, Patent Document 1). In this type of substrate processing apparatus, as shown in FIG. 8, an unprocessed liquid crystal substrate is carried into a load lock chamber 60 having a rotation drive stage 65, and the liquid crystal substrate is processed by the rotation drive stage 65. In accordance with the process atmosphere of the process chamber 64, the load lock chamber 60 is controlled to a nitrogen atmosphere, an air atmosphere or the like according to the process atmosphere of the process chamber 64, and then the transfer robot 63 provided in the atmosphere-controlled transfer chamber 62 is used. The liquid crystal substrate is carried into a process stage 61 in a process chamber 64 such as a nitrogen atmosphere or an air atmosphere, and the substrate is irradiated with laser light from a laser irradiation unit 66 to perform process processing. Gates 72, 73, and 74 that are opened when the substrates are loaded and unloaded are disposed at the entrances and exits of the liquid crystal substrates in the chambers 60, 62, and 64, respectively.

なお、ロードロック室60の手前には、未処理の基板及び処理済みの基板を収容するカセット67及び基板搬送ロボット68を備えるカセットステーション70が配置されている。カセット67は、長方形をなす未処理の基板及び処理済みの基板を縦横方向の内のいずれかの方向として収容している。   In front of the load lock chamber 60, a cassette station 70 including an unprocessed substrate and a cassette 67 for storing processed substrates and a substrate transfer robot 68 is disposed. The cassette 67 accommodates a rectangular unprocessed substrate and a processed substrate as one of the vertical and horizontal directions.

液晶基板をカセット67とロードロック室60との間で搬送する基板搬送ロボット68及び、液晶基板をロードロック室60とプロセスステージ61との間で搬送する搬送ロボット63は、いずれも2枚の基板を同時に搬送可能な2つのハンドを備える。基板搬送ロボット68の各ハンドは、カセット67とロードロック室60の回転駆動ステージ65との間で、カセット67に収容された方向のままで基板の受渡しを行う。窒素雰囲気、大気雰囲気等に配備される搬送ロボット63の各ハンドは、基板を縦横両方向として載置可能である。   The substrate transfer robot 68 that transfers the liquid crystal substrate between the cassette 67 and the load lock chamber 60 and the transfer robot 63 that transfers the liquid crystal substrate between the load lock chamber 60 and the process stage 61 are both two substrates. Are equipped with two hands that can be transported simultaneously. Each hand of the substrate transfer robot 68 delivers the substrate between the cassette 67 and the rotation drive stage 65 of the load lock chamber 60 while keeping the direction accommodated in the cassette 67. Each hand of the transfer robot 63 deployed in a nitrogen atmosphere, an air atmosphere, or the like can be placed with the substrate in both vertical and horizontal directions.

プロセス室64内のプロセスステージ61には、長短辺つまり縦横を有して長方形をなす基板を長短両方向に送り可能とするX,Y駆動機構及び回動させるθ軸機構が組み込まれている。   The process stage 61 in the process chamber 64 incorporates an X and Y drive mechanism that enables a rectangular substrate having long and short sides, that is, vertical and horizontal directions, to be fed in both long and short directions, and a rotating θ-axis mechanism.

しかして、カセット67の基板を基板搬送ロボット68によつてロードロック室60の回転駆動ステージ65に載置し、基板を縦横のいずれかの方向とした後、搬送ロボット63によつて受け取り、プロセスステージ61に載置し、X,Y駆動機構によつて液晶基板に送りを与えながら、処理を与える。ここで、基板の載置方向ひいては基板に施すプロセス処理の方向をカセット67内の基板投入方向を基準として90°異なる方向に変更する必要性は、基板上に形成させる半導体等の薄膜の種類や用途によつて生ずる。   Then, the substrate of the cassette 67 is placed on the rotation drive stage 65 of the load lock chamber 60 by the substrate transport robot 68, and the substrate is placed in either the vertical or horizontal direction, and then received by the transport robot 63, and processed. It is placed on the stage 61 and processed while being fed to the liquid crystal substrate by the X, Y drive mechanism. Here, it is necessary to change the substrate mounting direction, and thus the direction of the process applied to the substrate, to a direction different by 90 ° with respect to the substrate loading direction in the cassette 67, depending on the type of thin film such as a semiconductor formed on the substrate, It depends on the application.

プロセスステージ61上で処理の終了した基板は、搬送ロボット63によつて受け取り、回転駆動ステージ65に載置し、基板を縦横のいずれかの方向とした後、基板搬送ロボット68によつてカセット67に戻す。かくして、多数の基板に対する処理が次々に行われる。   The substrate that has been processed on the process stage 61 is received by the transfer robot 63 and placed on the rotational drive stage 65, and the substrate is set in either the vertical or horizontal direction, and then the cassette 67 is set by the substrate transfer robot 68. Return to. Thus, a number of substrates are processed one after another.

このようなプロセスステージ61(基板ステージ装置)は、X,Y駆動機構及びθ軸機構が組み込まれ、例えば図5〜図7に示すように基板の処理のために、X軸ステージ120、Y軸ステージ121、θ軸機構122及びθ軸ステージ123を備えると共に、基板を昇降させるために、例えば図5に示す第1のプッシャピン昇降駆動機構124又は図7に示す第2のプッシャピン昇降駆動機構140のいずれかを備えている。X軸ステージ120及びY軸ステージ121は、基板126を載せた基板ステージ125をθ軸ステージ123を介して、基板126を半導体面上で直交するX,Y方向に移動させる機能を有し、また、θ軸機構122は、θ軸ステージ123及び基板ステージ125を中心軸線回りに回動させ、ひいては基板ステージ125に載せた基板126を回動させる機能を有する。   Such a process stage 61 (substrate stage apparatus) incorporates an X, Y drive mechanism and a θ-axis mechanism. For example, as shown in FIGS. A stage 121, a θ-axis mechanism 122, and a θ-axis stage 123 are provided, and in order to raise and lower the substrate, for example, a first pusher pin raising / lowering driving mechanism 124 shown in FIG. 5 or a second pusher pin raising / lowering driving mechanism 140 shown in FIG. Have one. The X-axis stage 120 and the Y-axis stage 121 have a function of moving the substrate stage 125 on which the substrate 126 is placed through the θ-axis stage 123 in the X and Y directions orthogonal to each other on the semiconductor surface. The θ-axis mechanism 122 has a function of rotating the θ-axis stage 123 and the substrate stage 125 around the central axis, and thus rotating the substrate 126 placed on the substrate stage 125.

図5に示す第1のプッシャピン昇降駆動機構124(リンク方式)は、昇降装置128により、基板ステージ125に対して基板126を昇降させ、搬送ロボット63にて基板126を授受させる機能を有する。この昇降装置128は、θ軸ステージ123上に水平配置したモータ130によつて正逆に駆動されるボールスクリュ機構131により、リンク部材132の下端を図上で左右に移動させ、リンク部材132の上端により、θ軸ステージ123に固設した案内部材133に沿つてアーム部材134を昇降させる。   The first pusher pin lifting / lowering drive mechanism 124 (link type) shown in FIG. 5 has a function of moving the substrate 126 up and down with respect to the substrate stage 125 by the lifting device 128 and transferring the substrate 126 by the transfer robot 63. The elevating device 128 moves the lower end of the link member 132 to the left and right in the drawing by a ball screw mechanism 131 that is driven forward and backward by a motor 130 horizontally disposed on the θ-axis stage 123, thereby The arm member 134 is moved up and down along the guide member 133 fixed to the θ-axis stage 123 by the upper end.

アーム部材134には、複数のプッシャピン135が基板ステージ125を挿通可能に設けられているため、アーム部材134の上昇によつて一組をなすプッシャピン135が基板ステージ125上面から突出し、基板126を仮想線にて示すように上昇させ、また、下降させて基板126を基板ステージ125上に載置させることができる。基板126を上昇させた状態で、基板ステージ125の上方の隙間に搬送ロボット63のアームを挿入し、基板126の授受がなされる。プッシャピン135は、図6に示すように四隅のプッシャピン135と中央部の1本のプッシャピン135とを備えて5本(又はそれ以上)が設けられている。   Since a plurality of pusher pins 135 are provided on the arm member 134 so that the substrate stage 125 can be inserted, a pair of pusher pins 135 protrudes from the upper surface of the substrate stage 125 when the arm member 134 is raised, and the substrate 126 is virtually removed. The substrate 126 can be placed on the substrate stage 125 by raising and lowering as indicated by the line. With the substrate 126 raised, the arm of the transfer robot 63 is inserted into the gap above the substrate stage 125, and the substrate 126 is transferred. As shown in FIG. 6, the pusher pins 135 are provided with five (or more) pusher pins 135 at the four corners and one pusher pin 135 at the center.

搬送ロボット63又は基板搬送ロボット68を用いて基板の受渡しを行うロードロック室60の回転駆動ステージ65についても、プッシャピン昇降駆動機構124(リンク方式)と同様の構造のプッシャピン昇降駆動機構を備え、回転駆動ステージ65の基板ステージに対して基板126を昇降させ、搬送ロボット63又は基板搬送ロボット68にて基板126を授受させる。   The rotation drive stage 65 of the load lock chamber 60 that transfers the substrate using the transfer robot 63 or the substrate transfer robot 68 is also provided with a pusher pin lifting / lowering driving mechanism having the same structure as the pusher pin lifting / lowering driving mechanism 124 (link type). The substrate 126 is moved up and down relative to the substrate stage of the drive stage 65, and the substrate 126 is transferred by the transfer robot 63 or the substrate transfer robot 68.

また、図7に示す第2のプッシャピン駆動機構140(直動方式)は、昇降装置141により、基板ステージ125に対して基板126を昇降させ、搬送ロボット63にて基板126を授受させる機能を有する。この昇降装置141は、θ軸ステージ123上に垂直配置したモータ142により、ボールスクリュ機構143を介してアーム部材144を直接的に昇降させる。アーム部材144には、複数(5本以上)のプッシャピン135が基板ステージ125を挿通可能に設けられているため、アーム部材144の上昇によつてプッシャピン135が基板ステージ125上面から突出し、基板126を仮想線にて示すように上昇させ、また、下降させて基板126を基板ステージ125上に載置させることができる。基板126を上昇させた状態で、基板ステージ125の上方の隙間に基板搬送ロボット68のアームを挿入し、基板126の授受がなされる。
特開2002−164407公報
Further, the second pusher pin drive mechanism 140 (linear motion system) shown in FIG. 7 has a function of moving the substrate 126 up and down with respect to the substrate stage 125 by the lifting device 141 and transferring the substrate 126 by the transfer robot 63. . The lifting device 141 directly lifts and lowers the arm member 144 via a ball screw mechanism 143 by a motor 142 arranged vertically on the θ-axis stage 123. Since a plurality (five or more) of pusher pins 135 are provided on the arm member 144 so as to be able to pass through the substrate stage 125, the pusher pins 135 protrude from the upper surface of the substrate stage 125 when the arm member 144 rises, and the substrate 126 is moved. The substrate 126 can be placed on the substrate stage 125 by being raised and lowered as indicated by a virtual line. With the substrate 126 raised, the arm of the substrate transfer robot 68 is inserted into the gap above the substrate stage 125, and the substrate 126 is transferred.
JP 2002-164407 A

しかしながら、上述した第1,第2のプッシャピン昇降駆動機構124,140(リンク方式、直動方式)にあつては、5本以上のプッシャピン135によつて基板126の下面を当接支持する構造となつていたため、基板126を傷つけ易いという技術的課題が存在していた。特に大形の基板126を少ない本数のプッシャピン135によつて支持する場合に、基板126を傷つける不具合が生じ易い。   However, the first and second pusher pin lifting / lowering driving mechanisms 124 and 140 (link method, linear motion method) described above have a structure in which the lower surface of the substrate 126 is abutted and supported by five or more pusher pins 135. Therefore, there is a technical problem that the substrate 126 is easily damaged. In particular, when the large substrate 126 is supported by a small number of pusher pins 135, a problem of damaging the substrate 126 is likely to occur.

本発明は、このような従来の技術的課題に鑑みてなされたもので、基板をプッシャ部材によつて支持する際、基板に浮上力を作用させることによつて傷つきを防止することを目的とし、その構成は、次の通りである。
請求項1の発明は、昇降駆動されるプッシャ部材2a,2b,12bが基板ステージ125の少なくとも5箇所に設けられ、処理を与える基板126の周縁部及び中央部をプッシャ部材2a,2b,12bによつて支持してロボットとの間で基板126の授受を行う基板ステージ装置において、
前記基板126の中央部を支持する少なくとも1つのプッシャ部材2b,12bが、基板126に浮上力を作用させる流体吹出口10,12を有し、
流体吹出口10,12から吹き出す流体によつて基板126に浮上力を作用させることを特徴とする基板ステージ装置である。
請求項2の発明は、前記周縁部のプッシャ部材2aは、基板126の非処理領域を当接支持し、中央部の流体吹出口10,12を有するプッシャ部材2b,12bは、基板126の処理領域を当接支持することを特徴とする請求項1の基板ステージ装置である。
The present invention has been made in view of the above-described conventional technical problems, and an object of the present invention is to prevent damage by applying a levitation force to a substrate when the substrate is supported by a pusher member. The configuration is as follows.
According to the first aspect of the present invention, pusher members 2a, 2b, and 12b that are driven to move up and down are provided at at least five locations on the substrate stage 125, and the peripheral and central portions of the substrate 126 to be processed are connected to the pusher members 2a, 2b, and 12b. Therefore, in the substrate stage device that supports and exchanges the substrate 126 with the robot,
At least one pusher member 2b, 12b that supports the central portion of the substrate 126 has fluid outlets 10, 12 for applying a levitation force to the substrate 126;
The substrate stage apparatus is characterized in that a floating force is applied to the substrate 126 by the fluid blown out from the fluid outlets 10 and 12.
In the invention of claim 2, the pusher member 2a at the peripheral edge abuts and supports the non-processed area of the substrate 126, and the pusher members 2b and 12b having the fluid outlets 10 and 12 at the center are used for processing the substrate 126. 2. The substrate stage apparatus according to claim 1, wherein the region is abutted and supported.

請求項1に係る発明によれば、基板の中央部を支持する少なくとも1つのプッシャ部材が、基板に浮上力を作用させる流体吹出口を有し、流体吹出口から吹き出す流体によつて基板に浮上力を作用させる。これにより、周縁部のプッシャ部材による当接支持によつて基板の変位を防止しながら、基板の中央部を支持するプッシャ部材の強い当接支持に起因する基板の傷つきが効果的に抑制され、品質良好な処理済み基板を得ることができるという著効を奏することができる。   According to the first aspect of the present invention, the at least one pusher member that supports the central portion of the substrate has the fluid outlet for applying a levitation force to the substrate, and is levitated to the substrate by the fluid blown from the fluid outlet. Apply force. Thereby, while preventing the displacement of the substrate by the abutting support by the pusher member at the peripheral portion, the damage of the substrate due to the strong abutting support of the pusher member supporting the central portion of the substrate is effectively suppressed, The remarkable effect that a processed substrate with good quality can be obtained can be obtained.

請求項2に係る発明によれば、周縁部のプッシャ部材は、基板の周縁部の非処理領域を当接支持し、中央部の流体吹出口を有するプッシャ部材は、基板の中央部の処理領域を当接支持するように配置してある。このため、周縁部のプッシャ部材の当接支持に起因する基板の傷つきは、製品の品質に影響を与えることがない。   According to the second aspect of the invention, the pusher member at the peripheral portion abuts and supports the non-processed region at the peripheral portion of the substrate, and the pusher member having the fluid outlet at the central portion is processed at the central portion of the substrate. Are arranged so as to contact and support. For this reason, the damage of the board | substrate resulting from the contact | abutting support of the pusher member of a peripheral part does not affect the quality of a product.

本発明の1実施の形態に係る基板ステージ装置について、図1〜図3を参照し、従来例と同一機能部分には同一符号を付して説明する。基板ステージ装置51(プロセスステージ)は、図1,図2に示すように基板126の処理のために、θ軸ステージ123及び基板ステージ125を備えると共に、基板126を昇降させるために、プッシャ部材2(2a,2b)の昇降駆動機構1を備えている。なお、X軸ステージ120、Y軸ステージ121及びθ軸機構122については、図示を省略してある。プッシャ部材2は、図2に示すように四隅を含む周縁部の6本のプッシャ部材2a(白抜きで示す)と中央部の3本のプッシャ部材2b(黒塗りで示す)とを備える。周縁部のプッシャ部材2aは、従来のプッシャピン135と同様の構造でよい。   A substrate stage apparatus according to an embodiment of the present invention will be described with reference to FIG. 1 to FIG. The substrate stage device 51 (process stage) includes a θ-axis stage 123 and a substrate stage 125 for processing the substrate 126 as shown in FIGS. 1 and 2, and a pusher member 2 for moving the substrate 126 up and down. (2a, 2b) elevating drive mechanism 1 is provided. The X axis stage 120, the Y axis stage 121, and the θ axis mechanism 122 are not shown. As shown in FIG. 2, the pusher member 2 includes six pusher members 2a (shown in white) at the peripheral portion including the four corners and three pusher members 2b (shown in black) in the central portion. The pusher member 2a at the peripheral edge may have the same structure as the conventional pusher pin 135.

アーム部材134には、複数のプッシャピンであるプッシャ部材2a,2bが基板ステージ125の通孔を挿通可能に設けられているため、アーム部材134の上昇によつて一組をなすプッシャ部材2a,2bが基板ステージ125上面から突出し、基板126を図1上で実線にて示す位置に上昇させ、また、下降させて基板126を基板ステージ125上に載置させることができる。   The arm member 134 is provided with pusher members 2a and 2b, which are a plurality of pusher pins, so that the through holes of the substrate stage 125 can be inserted therethrough. Therefore, a pair of pusher members 2a and 2b formed by raising the arm member 134. Protrudes from the upper surface of the substrate stage 125, and the substrate 126 can be raised to a position indicated by a solid line in FIG. 1 and lowered to place the substrate 126 on the substrate stage 125.

プッシャ部材の昇降駆動機構1は、θ軸ステージ123に水平配置する上下用モータ3と、上下用モータ3のモータ軸に取付たピニオン4と、アーム部材134に固設されるラック5とを有する。上下用モータ3によつてピニオン4を一方向に回転させ、ラック5及びアーム部材134を上昇させ、また、上下用モータ3によつてピニオン4を他方向に回転させ、ラック5及びアーム部材134を下降させる。従つて、プッシャ部材の昇降駆動機構1は、上下用モータ3の正逆の駆動により、アーム部材134ひいては全てのプッシャ部材2a,2bを昇降させる機能を有する。   The pusher member lifting / lowering drive mechanism 1 includes a vertical motor 3 horizontally disposed on the θ-axis stage 123, a pinion 4 attached to the motor shaft of the vertical motor 3, and a rack 5 fixed to the arm member 134. . The pinion 4 is rotated in one direction by the vertical motor 3 to raise the rack 5 and the arm member 134, and the pinion 4 is rotated in the other direction by the vertical motor 3 to rotate the rack 5 and the arm member 134. Is lowered. Therefore, the pusher member raising / lowering drive mechanism 1 has a function of raising and lowering the arm member 134 and thus all the pusher members 2a and 2b by the forward / reverse drive of the vertical motor 3.

周縁部のプッシャ部材2aは、基板126の周縁部の非処理領域を当接支持し、中央部のプッシャ部材2bは、基板126の中央部の処理領域を当接支持するように配置することが望まれる。基板126の周縁部にはレーザ光を照射させて行うプロセス処理を施さない非処理領域が帯状に存在することに着目し、この非処理領域を周縁部のプッシャ部材2aによつて当接支持することにより、プッシャ部材2aの当接支持に起因する傷つきを恐れることなく基板126を堅固に支持し、基板126の変位や脱落を防止することができる。なお、基板126の非処理領域は、矩形状の基板126の四周縁部に所定幅(約5mm)で存在している。   The pusher member 2a at the peripheral portion is disposed so as to abut and support the non-processed region at the peripheral portion of the substrate 126, and the pusher member 2b at the central portion is disposed so as to contact and support the process region at the central portion of the substrate 126. desired. Paying attention to the fact that a non-processed area that is not subjected to the process treatment performed by irradiating the laser beam is present in the periphery of the substrate 126, this non-processed area is abutted and supported by the pusher member 2a at the periphery. As a result, the substrate 126 can be firmly supported without fear of damage due to the contact support of the pusher member 2a, and displacement and dropout of the substrate 126 can be prevented. In addition, the non-process area | region of the board | substrate 126 exists in the four peripheral part of the rectangular-shaped board | substrate 126 with predetermined width (about 5 mm).

そして、基板126の中央部を支持するプッシャ部材2bが、図1,図3に示すように基板126に浮上力を作用させる流体吹出口10を備え、流体吹出口10から吹き出す流体によつて基板126に浮上力を作用させることができる。この流体吹出口10から吹き出す流体による浮上力は、基板126を非接触状態に浮上させる大きさでも良いが、基板126に接触するプッシャ部材2bの上端面によつて基板126を損傷しない程度以上であればよい。   The pusher member 2b that supports the central portion of the substrate 126 includes a fluid outlet 10 that applies a levitation force to the substrate 126 as shown in FIGS. A levitation force can be applied to 126. The levitation force due to the fluid blown out from the fluid outlet 10 may be large enough to cause the substrate 126 to float in a non-contact state, but not less than the extent that the upper end surface of the pusher member 2b contacting the substrate 126 is not damaged. I just need it.

具体的には、図3に示すようにプッシャ部材2bを筒状部材によつて形成し、プッシャ部材2bの下端部を図1に示すように可撓性を有する配管6を介して流体供給源7に接続してある。8は、配管6に設けた開閉弁である。また、プッシャ部材2bの上端部には、環状の軟質部材9を固着し、基板126を損傷しないように考慮してある。軟質部材9は、例えばナイロンによつて形成されている。この軟質部材9の上端開口が、流体吹出口10を構成している。図1に示す流体供給源7は、窒素を供給するようになつているが、空気その他の気体、更には液体を供することも可能である。なお、基板126の中央部を支持するプッシャ部材2bは、少なくとも1つ設けられればよい。軟質部材9は、周縁部のプッシャ部材2aの上端にも固設されている。   Specifically, the pusher member 2b is formed of a cylindrical member as shown in FIG. 3, and the lower end of the pusher member 2b is connected to the fluid supply source via the flexible pipe 6 as shown in FIG. 7 is connected. 8 is an on-off valve provided in the pipe 6. In addition, an annular soft member 9 is fixed to the upper end portion of the pusher member 2b so that the substrate 126 is not damaged. The soft member 9 is made of nylon, for example. The upper end opening of the soft member 9 constitutes the fluid outlet 10. The fluid supply source 7 shown in FIG. 1 is adapted to supply nitrogen, but it is also possible to provide air or other gas, or liquid. Note that at least one pusher member 2b that supports the central portion of the substrate 126 may be provided. The soft member 9 is also fixed to the upper end of the pusher member 2a at the peripheral edge.

次に作用について説明する。
いま、プッシャ部材2a,2bが下降し、図8に示す搬送ロボット63によつて未処理の基板126が図1に実線にて示す位置に搬送されているものとする。この状態から、昇降駆動機構1によつてプッシャ部材2a,2bを上昇させ、プッシャ部材2a,2bの上端部によつて基板126の下面を支持する。このとき、予め、開閉弁8を開き、流体供給源7にからの流体を配管6を通して中央部のプッシャ部材2bの流体吹出口10から吹き出させる。流体吹出口10から吹き出す流体によつて基板126に浮上力を作用させることにより、周縁部のプッシャ部材2aの軟質部材9が基板126の下面を当接支持する状態で、中央部のプッシャ部材2bは浮上力を作用させながら基板126の下面を支持する。
Next, the operation will be described.
Now, it is assumed that the pusher members 2a and 2b are lowered and the unprocessed substrate 126 is transferred to the position indicated by the solid line in FIG. 1 by the transfer robot 63 shown in FIG. From this state, the pusher members 2a and 2b are raised by the elevating drive mechanism 1, and the lower surface of the substrate 126 is supported by the upper ends of the pusher members 2a and 2b. At this time, the on-off valve 8 is opened in advance, and the fluid from the fluid supply source 7 is blown out from the fluid outlet 10 of the pusher member 2b at the center through the pipe 6. By applying a levitation force to the substrate 126 by the fluid blown out from the fluid outlet 10, the pusher member 2 b at the central portion is in a state where the soft member 9 of the pusher member 2 a at the peripheral portion abuts and supports the lower surface of the substrate 126. Supports the lower surface of the substrate 126 while applying a levitation force.

これにより、中央部のプッシャ部材2bの圧接に起因して基板126の中央部の処理領域を傷つけることなく、全てのプッシャ部材2a,2bによつて基板126が支持される。流体吹出口10から吹き出す流体による浮上力が弱く、基板126の中央部がプッシャ部材2bに接触する場合であつても、浮上力が作用する状態で基板126の荷重の一部のみがプッシャ部材2bに接触し、しかも軟質部材9に接触するので、基板126の中央部の処理領域を傷つけることが良好に防止される。なお、基板126への浮上力は、基板126が自重を受けて撓み変形し、その周縁部がプッシャ部材2aによつて当接支持されている状態で作用するので、全てのプッシャ部材2a,2bの高さをほぼ等しくした状態で、中央部のプッシャ部材2bの基板126への接触に伴う傷つきが良好に防止される。   Thus, the substrate 126 is supported by all the pusher members 2a and 2b without damaging the processing region in the center portion of the substrate 126 due to the pressure contact of the pusher member 2b in the center portion. Even when the floating force due to the fluid blown out from the fluid outlet 10 is weak and the central portion of the substrate 126 is in contact with the pusher member 2b, only a part of the load of the substrate 126 is applied to the pusher member 2b in a state where the floating force is applied. And in contact with the soft member 9, it is possible to satisfactorily prevent the processing region at the center of the substrate 126 from being damaged. The levitation force on the substrate 126 acts in a state in which the substrate 126 is bent and deformed by its own weight and the peripheral portion thereof is in contact with and supported by the pusher member 2a, so that all the pusher members 2a and 2b are actuated. In the state in which the heights of the pusher members 2b are substantially equal, the damage due to the contact of the pusher member 2b in the center with the substrate 126 is well prevented.

基板126がプッシャ部材2a,2bによつて支持されたなら、搬送ロボット63のハンドを退避させる。続いて、昇降駆動機構1によつてプッシャ部材2a,2bを下降させれば、プッシャ部材2a,2bが基板ステージ125の上面から没入することにより、未処理の基板126が基板ステージ125の上面に載置される。その後、開閉弁8を閉じ、流体吹出口10からの流体の吹き出しを停止する。   When the substrate 126 is supported by the pusher members 2a and 2b, the hand of the transfer robot 63 is retracted. Subsequently, when the pusher members 2 a and 2 b are lowered by the elevating drive mechanism 1, the pusher members 2 a and 2 b are immersed from the upper surface of the substrate stage 125, so that the unprocessed substrate 126 is placed on the upper surface of the substrate stage 125. Placed. Thereafter, the on-off valve 8 is closed, and the blowing of fluid from the fluid outlet 10 is stopped.

基板ステージ125に載置された基板126は、図8に示すレーザ照射部66からのレーザ光を基板126へ照射させて、処理領域に対するプロセス処理が行われる。   The substrate 126 placed on the substrate stage 125 irradiates the substrate 126 with laser light from the laser irradiation unit 66 shown in FIG.

プロセス処理が終了したなら、基板ステージ125上の処理済みの基板126を搬送ロボット63に受け渡す。基板ステージ125上の基板126は、上述と逆の動作により、搬送ロボット63に受け渡すことができる。すなわち、昇降駆動機構1によつてプッシャ部材2a,2bを上昇させ、流体吹出口10から流体を吹き出した状態で、プッシャ部材2a,2bの上端部によつて基板126の下面を支持する。処理済みの基板126が図1に実線にて示す位置にまで上昇したなら、基板126と基板ステージ125との間の隙間に搬送ロボット63のハンドを挿入する。次いで、基板126を相対的に下降させることにより、搬送ロボット63に基板126が受け渡される。なお、中央部のプッシャ部材2bは、基板126の中央部の少なくとも1箇所を支持すればよく、1本のみを装備させることもできる。   When the process is completed, the processed substrate 126 on the substrate stage 125 is transferred to the transfer robot 63. The substrate 126 on the substrate stage 125 can be transferred to the transfer robot 63 by the reverse operation to that described above. That is, the pusher members 2a and 2b are raised by the elevating drive mechanism 1 and the lower surface of the substrate 126 is supported by the upper ends of the pusher members 2a and 2b in a state where the fluid is blown out from the fluid outlet 10. When the processed substrate 126 has risen to the position indicated by the solid line in FIG. 1, the hand of the transfer robot 63 is inserted into the gap between the substrate 126 and the substrate stage 125. Next, the substrate 126 is transferred to the transfer robot 63 by lowering the substrate 126 relatively. The central pusher member 2b may support at least one location in the central portion of the substrate 126, and may be equipped with only one.

図4には、中央部のプッシャ部材12bの他の構造例を示す。このプッシャ部材12bにあつては、周縁部のプッシャ部材2aと同様の構造をなすプッシャ部材12bに筒状部材11を一体的に付属させてある。この筒状部材11の上端開口が流体吹出口12を構成し、筒状部材11の下端に可撓性を有する配管6を介して流体供給源7を接続してある。なお、開閉弁8については図示を省略してある。また、筒状部材11の上端には、環状の軟質部材9を固着し、流体吹出口12を高位置としながら、筒状部材11の上端が基板126に直接接触することに起因する傷つきを防止することができる。   FIG. 4 shows another structural example of the pusher member 12b at the center. For the pusher member 12b, the tubular member 11 is integrally attached to the pusher member 12b having the same structure as the pusher member 2a at the peripheral edge. The upper end opening of the cylindrical member 11 constitutes a fluid outlet 12, and the fluid supply source 7 is connected to the lower end of the cylindrical member 11 via a flexible pipe 6. The on-off valve 8 is not shown. In addition, an annular soft member 9 is fixed to the upper end of the cylindrical member 11 to prevent damage caused by the upper end of the cylindrical member 11 being in direct contact with the substrate 126 while the fluid outlet 12 is at a high position. can do.

しかして、流体供給源7からの窒素等の流体を配管6を通して筒状部材11の一端部に導入し、筒状部材11の他端の流体吹出口12から吹き出すことにより、上記実施の形態のプッシャ部材2bの流体吹出口10から流体を吹き出す場合と同様に、流体吹出口12から吹き出す流体によつて基板126に浮上力を作用させることができるので、上記1実施の形態と同様の作用を得ることができる。この構造例によれば、従来構造のプッシャ部材12bに筒状部材11、配管6、流体供給源7等からなる流体吹き出し装置を付加して簡単に構成することができる。また、何らかの理由により、流体吹出口12から吹き出す流体による浮上力が得られない場合には、プッシャ部材12bの軟質部材9によつて基板126が支持される。   Thus, a fluid such as nitrogen from the fluid supply source 7 is introduced into one end portion of the cylindrical member 11 through the pipe 6 and blown out from the fluid outlet 12 at the other end of the cylindrical member 11, so that Similarly to the case where the fluid is blown out from the fluid outlet 10 of the pusher member 2b, a levitation force can be applied to the substrate 126 by the fluid blown out from the fluid outlet 12, so that the same action as in the first embodiment is achieved. Obtainable. According to this structural example, it is possible to simply configure the pusher member 12b having a conventional structure by adding the fluid blowing device including the cylindrical member 11, the pipe 6, the fluid supply source 7, and the like. In addition, when the levitation force due to the fluid blown from the fluid outlet 12 cannot be obtained for some reason, the substrate 126 is supported by the soft member 9 of the pusher member 12b.

ところで、上記実施の形態の基板ステージ装置51は、プロセス室64内のプロセスステージ61であるものとしたが、処理を与える基板126の周縁部及び中央部をプッシャピンで支持する回転駆動ステージ65であつてもよい。   By the way, the substrate stage apparatus 51 of the above embodiment is the process stage 61 in the process chamber 64. However, the substrate stage apparatus 51 is a rotary drive stage 65 that supports the peripheral portion and the central portion of the substrate 126 to be processed with pusher pins. May be.

本発明の1実施の形態に係る基板ステージ装置の要部を一部断面で示す正面図。The front view which shows the principal part of the substrate stage apparatus which concerns on 1 embodiment of this invention in a partial cross section. 同じく基板ステージ装置の基板ステージを示す平面図。The top view which similarly shows the substrate stage of a substrate stage apparatus. 同じく中央部のプッシャ部材を示す断面図。Sectional drawing which similarly shows the pusher member of a center part. 中央部のプッシャ部材の他の構造例を示す図。The figure which shows the other structural example of the pusher member of a center part. 従来の基板ステージ装置を示す正面図。The front view which shows the conventional substrate stage apparatus. 同じく基板ステージ装置の基板ステージを示す平面図。The top view which similarly shows the substrate stage of a substrate stage apparatus. 従来の他の基板ステージ装置を示す正面図。The front view which shows the other conventional substrate stage apparatus. 従来の基板の処理装置の概略を示す平面図。The top view which shows the outline of the processing apparatus of the conventional board | substrate.

符号の説明Explanation of symbols

1:昇降駆動機構
2a,2b,12b:プッシャ部材
10,12:流体吹出口
51:基板ステージ装置
120:X軸ステージ
121:Y軸ステージ
122:θ軸機構
123:θ軸ステージ
125:基板ステージ
126:基板
1: Lifting drive mechanism 2a, 2b, 12b: Pusher member 10, 12: Fluid outlet 51: Substrate stage device 120: X-axis stage 121: Y-axis stage 122: θ-axis mechanism 123: θ-axis stage 125: Substrate stage 126 :substrate

Claims (2)

昇降駆動されるプッシャ部材(2a,2b,12b)が基板ステージ(125)の少なくとも5箇所に設けられ、処理を与える基板(126)の周縁部及び中央部をプッシャ部材(2a,2b,12b)によつて支持してロボットとの間で基板(126)の授受を行う基板ステージ装置において、
前記基板(126)の中央部を支持する少なくとも1つのプッシャ部材(2b,12b)が、基板(126)に浮上力を作用させる流体吹出口(10,12)を有し、
流体吹出口(10,12)から吹き出す流体によつて基板(126)に浮上力を作用させることを特徴とする基板ステージ装置。
Pusher members (2a, 2b, 12b) that are driven to move up and down are provided in at least five locations of the substrate stage (125), and pusher members (2a, 2b, 12b) are provided at the peripheral and central portions of the substrate (126) to be processed. In the substrate stage apparatus for transferring the substrate (126) to and from the robot supported by
At least one pusher member (2b, 12b) supporting the central portion of the substrate (126) has a fluid outlet (10, 12) for applying a levitation force to the substrate (126),
A substrate stage apparatus, wherein a floating force is applied to a substrate (126) by a fluid blown from a fluid outlet (10, 12).
前記周縁部のプッシャ部材(2a)は、基板(126)の非処理領域を当接支持し、中央部の流体吹出口(10,12)を有するプッシャ部材(2b,12b)は、基板(126)の処理領域を当接支持することを特徴とする請求項1の基板ステージ装置。 The pusher member (2a) at the peripheral portion abuts and supports the non-processed region of the substrate (126), and the pusher members (2b, 12b) having the fluid outlets (10, 12) at the central portion are supported by the substrate (126). The substrate stage apparatus according to claim 1, wherein the processing region is abutted and supported.
JP2004198808A 2004-07-06 2004-07-06 Substrate stage device Pending JP2006024588A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009271340A (en) * 2008-05-08 2009-11-19 Toppan Printing Co Ltd Xy step exposure device
CN105084000A (en) * 2015-06-23 2015-11-25 武汉华星光电技术有限公司 Glass placing and taking-out method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009271340A (en) * 2008-05-08 2009-11-19 Toppan Printing Co Ltd Xy step exposure device
CN105084000A (en) * 2015-06-23 2015-11-25 武汉华星光电技术有限公司 Glass placing and taking-out method

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