JP2005532538A5 - - Google Patents
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- Publication number
- JP2005532538A5 JP2005532538A5 JP2004518200A JP2004518200A JP2005532538A5 JP 2005532538 A5 JP2005532538 A5 JP 2005532538A5 JP 2004518200 A JP2004518200 A JP 2004518200A JP 2004518200 A JP2004518200 A JP 2004518200A JP 2005532538 A5 JP2005532538 A5 JP 2005532538A5
- Authority
- JP
- Japan
- Prior art keywords
- test signal
- input terminal
- cell buffer
- voltage
- differential
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/186,517 US6777946B2 (en) | 2002-07-01 | 2002-07-01 | Cell buffer with built-in test |
| PCT/US2003/020801 WO2004003576A2 (en) | 2002-07-01 | 2003-06-30 | Cell buffer with built-in test |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005532538A JP2005532538A (ja) | 2005-10-27 |
| JP2005532538A5 true JP2005532538A5 (https=) | 2006-07-27 |
Family
ID=29999296
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004518200A Pending JP2005532538A (ja) | 2002-07-01 | 2003-06-30 | 組み込みテスト付きセル・バッファ |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US6777946B2 (https=) |
| EP (1) | EP1518128A2 (https=) |
| JP (1) | JP2005532538A (https=) |
| AU (1) | AU2003265258A1 (https=) |
| WO (1) | WO2004003576A2 (https=) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7075285B2 (en) * | 2004-05-12 | 2006-07-11 | Richard Chin | Delay locked loop circuit and method for testing the operability of the circuit |
| US8519945B2 (en) | 2006-01-06 | 2013-08-27 | Pixtronix, Inc. | Circuits for controlling display apparatus |
| US7999994B2 (en) | 2005-02-23 | 2011-08-16 | Pixtronix, Inc. | Display apparatus and methods for manufacture thereof |
| US8159428B2 (en) | 2005-02-23 | 2012-04-17 | Pixtronix, Inc. | Display methods and apparatus |
| US9158106B2 (en) | 2005-02-23 | 2015-10-13 | Pixtronix, Inc. | Display methods and apparatus |
| US9261694B2 (en) | 2005-02-23 | 2016-02-16 | Pixtronix, Inc. | Display apparatus and methods for manufacture thereof |
| US8310442B2 (en) | 2005-02-23 | 2012-11-13 | Pixtronix, Inc. | Circuits for controlling display apparatus |
| US8482496B2 (en) | 2006-01-06 | 2013-07-09 | Pixtronix, Inc. | Circuits for controlling MEMS display apparatus on a transparent substrate |
| US20070205969A1 (en) | 2005-02-23 | 2007-09-06 | Pixtronix, Incorporated | Direct-view MEMS display devices and methods for generating images thereon |
| US9229222B2 (en) | 2005-02-23 | 2016-01-05 | Pixtronix, Inc. | Alignment methods in fluid-filled MEMS displays |
| US9082353B2 (en) | 2010-01-05 | 2015-07-14 | Pixtronix, Inc. | Circuits for controlling display apparatus |
| US8526096B2 (en) | 2006-02-23 | 2013-09-03 | Pixtronix, Inc. | Mechanical light modulators with stressed beams |
| US9176318B2 (en) | 2007-05-18 | 2015-11-03 | Pixtronix, Inc. | Methods for manufacturing fluid-filled MEMS displays |
| US7728604B1 (en) * | 2008-02-11 | 2010-06-01 | Xilinx, Inc. | Testing differential signal standards using device under test's built in resistors |
| US8169679B2 (en) | 2008-10-27 | 2012-05-01 | Pixtronix, Inc. | MEMS anchors |
| KR20120139854A (ko) | 2010-02-02 | 2012-12-27 | 픽스트로닉스 인코포레이티드 | 디스플레이 장치를 제어하기 위한 회로 |
| US9134552B2 (en) | 2013-03-13 | 2015-09-15 | Pixtronix, Inc. | Display apparatus with narrow gap electrostatic actuators |
| CN104034941B (zh) * | 2014-06-11 | 2017-08-08 | 台达电子企业管理（上海）有限公司 | 电压采样系统 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3812303A (en) * | 1972-10-11 | 1974-05-21 | Itt | Differential loop current detector |
| US4525663A (en) * | 1982-08-03 | 1985-06-25 | Burr-Brown Corporation | Precision band-gap voltage reference circuit |
| JP2593253B2 (ja) * | 1991-05-29 | 1997-03-26 | 富士通株式会社 | 電流測定回路 |
| AU2591897A (en) * | 1996-03-27 | 1997-10-17 | Battery & Electrochemical Research Institute, S.A. | Energy device analysis and evaluation |
| US5914606A (en) * | 1996-10-10 | 1999-06-22 | Becker-Irvin; Craig H. | Battery cell voltage monitor and method |
| US5940052A (en) * | 1997-01-15 | 1999-08-17 | Micron Technology, Inc. | Current monitor for field emission displays |
| JP3863262B2 (ja) * | 1997-09-30 | 2006-12-27 | 松下電器産業株式会社 | 電池電圧測定装置 |
| US6163862A (en) * | 1997-12-01 | 2000-12-19 | International Business Machines Corporation | On-chip test circuit for evaluating an on-chip signal using an external test signal |
| US6111529A (en) * | 1998-09-30 | 2000-08-29 | Cirrus Logic, Inc. | Accurate gain calibration of analog to digital converters |
| US6353334B1 (en) * | 2000-01-27 | 2002-03-05 | Xilinx, Inc. | Circuit for converting a logic signal on an output node to a pair of low-voltage differential signals |
| JP4210030B2 (ja) * | 2000-11-02 | 2009-01-14 | パナソニック株式会社 | 積層電圧計測装置 |
-
2002
- 2002-07-01 US US10/186,517 patent/US6777946B2/en not_active Expired - Fee Related
-
2003
- 2003-06-30 AU AU2003265258A patent/AU2003265258A1/en not_active Abandoned
- 2003-06-30 JP JP2004518200A patent/JP2005532538A/ja active Pending
- 2003-06-30 EP EP03762304A patent/EP1518128A2/en not_active Withdrawn
- 2003-06-30 WO PCT/US2003/020801 patent/WO2004003576A2/en not_active Ceased
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