JP2005515658A - 非平行ショックラインを有する超高速サンプラ - Google Patents

非平行ショックラインを有する超高速サンプラ Download PDF

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Publication number
JP2005515658A
JP2005515658A JP2003543136A JP2003543136A JP2005515658A JP 2005515658 A JP2005515658 A JP 2005515658A JP 2003543136 A JP2003543136 A JP 2003543136A JP 2003543136 A JP2003543136 A JP 2003543136A JP 2005515658 A JP2005515658 A JP 2005515658A
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JP
Japan
Prior art keywords
waveguide
transmission line
conductor
sampling
sampler
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003543136A
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English (en)
Japanese (ja)
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JP2005515658A5 (https=
Inventor
アゴストン，アゴストン
エブナー，ジョン
ペッパー，スティーヴン
プラット・デーヴィッド
Original Assignee
ピコセカンド・パルス・ラブズ
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by ピコセカンド・パルス・ラブズ filed Critical ピコセカンド・パルス・ラブズ
Publication of JP2005515658A publication Critical patent/JP2005515658A/ja
Publication of JP2005515658A5 publication Critical patent/JP2005515658A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/24—Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
    • G01R19/2509—Details concerning sampling, digitizing or waveform capturing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P5/00—Coupling devices of the waveguide type
    • H01P5/08—Coupling devices of the waveguide type for linking dissimilar lines or devices
    • H01P5/085—Coaxial-line/strip-line transitions
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L25/00—Baseband systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
    • G01R19/0053—Noise discrimination; Analog sampling; Measuring transients
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Waveguides (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP2003543136A 2001-11-02 2002-10-31 非平行ショックラインを有する超高速サンプラ Pending JP2005515658A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/053,529 US6900710B2 (en) 2001-04-10 2001-11-02 Ultrafast sampler with non-parallel shockline
PCT/US2002/035239 WO2003041212A2 (en) 2001-11-02 2002-10-31 Non-linear transmission line using varactors and non-parallel waveguide

Publications (2)

Publication Number Publication Date
JP2005515658A true JP2005515658A (ja) 2005-05-26
JP2005515658A5 JP2005515658A5 (https=) 2006-01-05

Family

ID=21984897

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003543136A Pending JP2005515658A (ja) 2001-11-02 2002-10-31 非平行ショックラインを有する超高速サンプラ

Country Status (5)

Country Link
US (2) US6900710B2 (https=)
EP (1) EP1520319A2 (https=)
JP (1) JP2005515658A (https=)
AU (1) AU2002342297A1 (https=)
WO (1) WO2003041212A2 (https=)

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US7358834B1 (en) * 2002-08-29 2008-04-15 Picosecond Pulse Labs Transmission line voltage controlled nonlinear signal processors
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US20110084778A1 (en) * 2009-10-13 2011-04-14 Patrick Zabinski Electrical circuit signal connection system
US7656250B1 (en) 2008-08-04 2010-02-02 Mayo Foundation For Medical Education And Research Differential signal termination block
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US7462956B2 (en) * 2007-01-11 2008-12-09 Northrop Grumman Space & Mission Systems Corp. High efficiency NLTL comb generator using time domain waveform synthesis technique
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US8509354B2 (en) * 2008-12-18 2013-08-13 L—3 Communications Integrated Systems L.P. System and method for improved spur reduction in direct RF receiver architectures
US8509368B2 (en) * 2008-12-18 2013-08-13 L-3 Communications Integrated Systems, L.P. System and method for clock jitter compensation in direct RF receiver architectures
US8081946B2 (en) * 2008-12-23 2011-12-20 L-3 Communications Integrated Systems L.P. Interference cancellation for reconfigurable direct RF bandpass sampling interference cancellation
US8078130B2 (en) * 2008-12-23 2011-12-13 L-3 Communications Integrated Systems L.P. Systems and methods for interference cancellation
US8417189B2 (en) 2010-06-10 2013-04-09 Anritsu Company Frequency-scalable shockline-based VNA
US8401050B1 (en) 2011-03-15 2013-03-19 L-3 Communications Integrated Systems L.P. Multiple projection sampling for RF sampling receivers
JP2015008354A (ja) * 2013-06-24 2015-01-15 富士通株式会社 伝送装置および高周波フィルタ
US11251832B2 (en) 2020-03-02 2022-02-15 L-3 Communications Integrated Systems L.P. Multiple clock sampling for Nyquist folded sampling receivers
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US12587159B1 (en) * 2023-10-26 2026-03-24 Northrop Grumman Systems Corporation Nonlinear transmission line (NLTL) with controllable harmonic output power spectrum

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Also Published As

Publication number Publication date
WO2003041212A2 (en) 2003-05-15
US7170365B2 (en) 2007-01-30
US20050128020A1 (en) 2005-06-16
EP1520319A2 (en) 2005-04-06
US20020167373A1 (en) 2002-11-14
US6900710B2 (en) 2005-05-31
WO2003041212A3 (en) 2005-02-10
AU2002342297A1 (en) 2003-05-19

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