JP2005353967A - Semiconductor manufacturing apparatus - Google Patents

Semiconductor manufacturing apparatus Download PDF

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Publication number
JP2005353967A
JP2005353967A JP2004175324A JP2004175324A JP2005353967A JP 2005353967 A JP2005353967 A JP 2005353967A JP 2004175324 A JP2004175324 A JP 2004175324A JP 2004175324 A JP2004175324 A JP 2004175324A JP 2005353967 A JP2005353967 A JP 2005353967A
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air
heat
exhaust
exposure apparatus
temperature
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JP2004175324A
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Japanese (ja)
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Makoto Nomoto
誠 野元
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Canon Inc
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Canon Inc
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Abstract

<P>PROBLEM TO BE SOLVED: To provide an exposing device capable of accomplishing positioning accuracy improvement and high throughput by removing thermal effect on the exposing device itself without incurring the enlargement of the temperature conditioning apparatus of a circulatory system in a heat treatment of a heating element. <P>SOLUTION: The apparatus reduces quantity of heat treated in the circulatory system in such a way that the heat treatment of the heating element is divided into two lines constituted by a thermal exhausting line and a circulatory line, and that the heat of the thermal exhausting line is exhausted to a factory exhausting line by taking in clean room air which does not belong to chamber environment. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は半導体製造装置に関し、特に温度環境を制御する温度調整装置を有する露光装置に関するものである。   The present invention relates to a semiconductor manufacturing apparatus, and more particularly to an exposure apparatus having a temperature adjusting device for controlling a temperature environment.

半導体製造等に用いられる露光装置は、温度変化による熱膨張の影響あるいは位置情報を検出する干渉計の誤差を防ぐために、露光装置本体をチャンバーで囲い該チャンバー内空間を空調し恒温に維持している。   In order to prevent the influence of thermal expansion due to temperature changes or the error of the interferometer that detects position information, an exposure apparatus used in semiconductor manufacturing or the like surrounds the exposure apparatus body with a chamber and air-conditions the interior of the chamber to maintain a constant temperature. Yes.

図3に従来例の空調システムの概略を示す。露光装置本体21が収容されるチャンバー22から循環エア23あるいはチャンバー22外部からクリーンルームエア24が冷却器25に供給され冷却される。冷却エア26はヒーター27により所定の温度に加熱され温調エア28となり、フィルター29を通過しチャンバー22の内部環境に吹き出される。   FIG. 3 shows an outline of a conventional air conditioning system. Circulating air 23 from the chamber 22 in which the exposure apparatus main body 21 is accommodated or clean room air 24 from the outside of the chamber 22 is supplied to the cooler 25 to be cooled. The cooling air 26 is heated to a predetermined temperature by a heater 27 to become temperature-controlled air 28, passes through a filter 29, and is blown out to the internal environment of the chamber 22.

また、温度センサー31が温調エア28の温度を検出しその信号が温調器32に入力される。温調器32は、温度センサー31の信号をもとにPIDフィードバック制御を行い、その出力をヒーター27に供給し、常に温調エア28が一定温度になるように制御を行う。このエア循環は、シロッコファン,ターボファン,あるいはラジアルファン等の送風機30により行われる。   Further, the temperature sensor 31 detects the temperature of the temperature control air 28, and the signal is input to the temperature controller 32. The temperature controller 32 performs PID feedback control based on the signal from the temperature sensor 31, supplies the output to the heater 27, and performs control so that the temperature-controlled air 28 is always at a constant temperature. This air circulation is performed by a blower 30 such as a sirocco fan, a turbo fan, or a radial fan.

循環エア23の詳細を図4に示す。チャンバー内には電装機器等の発熱体11が多数存在する。発熱体11からの熱が露光装置本体21に影響しない様にカバ−12が発熱体11を囲む様に載置され、チャンバー内エア15がカバー12内部に導入され、発熱体11の熱排気を行う。チャンバー内エア15はダクト13を通り、集合管14にて集められ循環エア23となる。つまり、循環エア23はチャンバー内部の発熱体の熱排気を兼ねている。
特開平11−329951号公報 特開2000−023892号公報
The details of the circulating air 23 are shown in FIG. There are many heating elements 11 such as electrical equipment in the chamber. The cover 12 is placed so as to surround the heat generating body 11 so that the heat from the heat generating body 11 does not affect the exposure apparatus main body 21, and the air 15 in the chamber is introduced into the cover 12, so that the heat exhausting of the heat generating body 11 is performed. Do. The air 15 in the chamber passes through the duct 13 and is collected by the collecting pipe 14 to become the circulating air 23. That is, the circulating air 23 also serves as heat exhaust for the heating element inside the chamber.
Japanese Patent Laid-Open No. 11-329951 JP 2000-023892 A

しかしながら近年の転写パターンの微細化あるいは高スループット化に伴い、電装機器等の発熱は指数的に増大する傾向にある。   However, with the recent miniaturization of transfer patterns or higher throughput, the heat generated by electrical equipment tends to increase exponentially.

従来の熱処理では送風量を増やす必要があり、これは送風機、冷却器、フィルター、ヒーター等循環エア系の温調機器全ての大型化を招く。また、装置の大型化は振動伝播による露光装置本体の位置決め精度等の性能劣化を招く。   In the conventional heat treatment, it is necessary to increase the air flow rate, which leads to an increase in the size of all the circulating air temperature control devices such as a blower, a cooler, a filter, and a heater. Further, the increase in size of the apparatus causes performance deterioration such as positioning accuracy of the exposure apparatus main body due to vibration propagation.

本発明は上記従来技術の課題を鑑みてなされたものであり、発熱体の熱処理を循環系の温調機器の大型化を招くことなく露光装置本体への熱影響を除去し、位置決め精度向上並びに高スループット化を達成できる露光装置の提供を目的とする。   The present invention has been made in view of the above-mentioned problems of the prior art, and removes the heat effect on the exposure apparatus main body without increasing the size of the circulating temperature control device by heat treatment of the heating element, and improves positioning accuracy. An object of the present invention is to provide an exposure apparatus that can achieve high throughput.

上記目的を達成するために本発明の露光装置は、発熱体の熱処理を熱排気系と循環系の2系統に分割し、熱排気系の熱をチャンバー環境外のクリーンルームエアを取り込んで工場排気に排出することにより、循環系で処理する熱量の低減化を図る。この時熱排気系は循環系と異なりエア上昇温度を厳しく管理する必要がないが、チャンバー内部の空調空間にそのまま実装すれば露光装置本体へ熱影響を与えてしまう。   In order to achieve the above object, the exposure apparatus of the present invention divides the heat treatment of the heating element into two systems, a heat exhaust system and a circulation system, and takes the heat of the heat exhaust system into the factory exhaust by taking clean room air outside the chamber environment. By exhausting, the amount of heat processed in the circulation system is reduced. At this time, unlike the circulation system, the heat exhaust system does not need to strictly control the air rising temperature, but if it is mounted in the conditioned space inside the chamber as it is, it will affect the exposure apparatus main body.

そこでダクトを2重構造とし内側を高温の熱排気系、外側を低温の循環系のダクトとすることにより、熱排気系からの露光装置本体への熱影響を除去することを特徴とする。   In view of this, the duct has a double structure, the inside is a high-temperature heat exhaust system, and the outside is a low-temperature circulation system duct, so that the heat influence on the exposure apparatus main body from the heat exhaust system is removed.

排気系を設けることにより空調系の処理熱量が低減し、装置のコンパクト化に寄与し、さらに振動伝播による露光装置の位置決め精度の悪化を防止する。   By providing an exhaust system, the amount of heat processed by the air conditioning system is reduced, contributing to downsizing of the apparatus, and further preventing deterioration in positioning accuracy of the exposure apparatus due to vibration propagation.

また、露光装置本体への排気系熱影響を防止することにより、熱膨張変化が低減し位置決め,焼き付け及び重ね合わせの各精度の向上が図れる。また、ステージ空間のエアの温度変化が低減することにより干渉計の計測誤差が減少し、計測再現性が向上する。   Further, by preventing the influence of the exhaust system heat on the exposure apparatus main body, the change in thermal expansion is reduced, and the accuracy of positioning, printing and overlaying can be improved. In addition, the measurement error of the interferometer is reduced by reducing the temperature change of the air in the stage space, and the measurement reproducibility is improved.

本発明の実施例を図1に示す。   An embodiment of the present invention is shown in FIG.

熱排気系に接続する発熱体11を囲むカバー12にチャンバー環境外のクリーンルームエア24を導入する供給ダクト1を設ける。またカバー12には熱排気ダクト2が接続され、該熱排気ダクトは排気ファン3の吸込み口に接続される。排気用ファンの排出口は工場排気ダクト4に接続される。以上が熱排気系のライン構成で空気の流れは、チャンバー環境外のクリーンルームエア24が供給ダクト1を通りカバー12内部に導かれ発熱体11の熱を奪い、熱排気ダクト1,排気ファン3を経由し工場排気ダクト4へ排出される。この時供給ダクト2,カバー12,熱排気ダクト2からなる熱排気ラインは排気ファン3の吸込み側に接続されているため陰圧となり、チャンバー内部5に熱排気ラインを実装してもチャンバー内部5を陽圧に管理すれば熱排気エア6のチャンバー内部5への洩れこみを防止でき、コンタミ混入および熱排気エア6による直接的な本体への熱影響は防止できる。   A supply duct 1 for introducing clean room air 24 outside the chamber environment is provided in the cover 12 surrounding the heating element 11 connected to the heat exhaust system. A heat exhaust duct 2 is connected to the cover 12, and the heat exhaust duct is connected to a suction port of the exhaust fan 3. An exhaust port of the exhaust fan is connected to the factory exhaust duct 4. The above is the line configuration of the heat exhaust system, and the air flow is such that the clean room air 24 outside the chamber environment passes through the supply duct 1 and is guided into the cover 12 to take the heat of the heating element 11, and the heat exhaust duct 1 and the exhaust fan 3 are connected. It is discharged to the factory exhaust duct 4 via. At this time, the heat exhaust line including the supply duct 2, the cover 12, and the heat exhaust duct 2 is connected to the suction side of the exhaust fan 3, so that a negative pressure is generated. Can be prevented from leaking into the chamber interior 5 of the hot exhaust air 6, and contamination and contamination of the main body directly by the hot exhaust air 6 can be prevented.

ただし、熱排気エア6がチャンバー内部5へ進入しなくても熱排気エア6がもつ熱はチャンバー内部5へ移動できるため熱排気ダクト2の外側に循環エアダクト7を設け2重構造とすることにより、熱排気エア6による本体側への熱影響を極めて小さくすることができる。ここで外側の循環エアダクト7を通過する循環エア23は本体に熱影響を与えないように上昇温度が低くなるように管理されたエアとする。   However, even if the hot exhaust air 6 does not enter the chamber interior 5, the heat of the hot exhaust air 6 can move to the chamber interior 5, so a circulation air duct 7 is provided outside the thermal exhaust duct 2 to form a double structure. The heat influence on the main body side by the hot exhaust air 6 can be extremely reduced. Here, the circulating air 23 that passes through the outer circulating air duct 7 is air that is controlled so that the temperature rise is low so as not to affect the main body.

図2に別の実施例を示す。本実施例では発熱体11を内部に含むカバー12の本体側の壁に循環系ダクト7で包み込む形状とし、カバー12からの熱影響を低減することが可能となる。   FIG. 2 shows another embodiment. In this embodiment, it is possible to reduce the thermal influence from the cover 12 by enclosing the cover 12 including the heating element 11 inside the main body side wall with the circulation system duct 7.

実施例1を説明する説明図。FIG. 3 is an explanatory diagram for explaining Example 1; 実施例2を説明する説明図。Explanatory drawing explaining Example 2. FIG. 従来例の循環エアを説明する説明図。Explanatory drawing explaining the circulating air of a prior art example. 従来例の循環エアを説明する説明図。Explanatory drawing explaining the circulating air of a prior art example.

符号の説明Explanation of symbols

1 供給ダクト
2 熱排気ダクト
3 排気ファン
4 工場排気ダクト
5 チャンバー内部
6 熱排気エア
7 循環エアダクト
11 発熱体
12 カバー
13 ダクト
14 集合管
15 チャンバー内エア
21 露光装置本体
22 チャンバー
23 循環エア
24 クリーンルームエア
25 冷却器
26 冷却エア
27 ヒーター
28 温調エア
29 フィルター
30 送風機
31 温度センサー
32 温調器
DESCRIPTION OF SYMBOLS 1 Supply duct 2 Thermal exhaust duct 3 Exhaust fan 4 Factory exhaust duct 5 Chamber interior 6 Thermal exhaust air 7 Circulating air duct 11 Heating body 12 Cover 13 Duct 14 Collecting pipe 15 In-chamber 21 Exposure apparatus main body 22 Chamber 23 Circulating air 24 Clean room air 25 Cooler 26 Cooling Air 27 Heater 28 Temperature Control Air 29 Filter 30 Blower 31 Temperature Sensor 32 Temperature Controller

Claims (3)

空気循環による空調機構を有する半導体露光装置において、循環系と別に熱排気系を備え、前記循環系を循環する循環空気と半導体露光装置外部の空気を取り込み、熱を外部に排気することを特徴とする露光装置。   In a semiconductor exposure apparatus having an air-conditioning mechanism by air circulation, a heat exhaust system is provided separately from the circulation system, the circulation air circulating through the circulation system and the air outside the semiconductor exposure apparatus are taken in, and the heat is exhausted outside. Exposure equipment to do. 前記排気系は排気ファンの吸込み側に接続され、陰圧に保たれていることを特徴とする請求項1に記載の露光装置。   2. The exposure apparatus according to claim 1, wherein the exhaust system is connected to a suction side of an exhaust fan and maintained at a negative pressure. 前記排気系の外側に前記循環系の空気通路を設けたことを特徴とする請求項1に記載の露光装置。   2. The exposure apparatus according to claim 1, wherein an air passage for the circulation system is provided outside the exhaust system.
JP2004175324A 2004-06-14 2004-06-14 Semiconductor manufacturing apparatus Withdrawn JP2005353967A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010219238A (en) * 2009-03-16 2010-09-30 Nuflare Technology Inc Charged-particle beam lithography system
JP2015231008A (en) * 2014-06-06 2015-12-21 トヨタ自動車株式会社 Semiconductor manufacturing apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010219238A (en) * 2009-03-16 2010-09-30 Nuflare Technology Inc Charged-particle beam lithography system
JP2015231008A (en) * 2014-06-06 2015-12-21 トヨタ自動車株式会社 Semiconductor manufacturing apparatus

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