JP2005353947A - Manufacture of semiconductor device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device capable of removing Cu bridges between wirings, while preventing occurrence of concave defects that are generated as Cu wiring is disclosed. <P>SOLUTION: An interwiring insulating film 2 is formed on a semiconductor substrate 1. A wiring groove is formed on the insulating film 2 by dry-etching. Then a barrier film 3 and a Cu seed film 4 are formed by sputtering, and a Cu film 5 is formed by electrolytic plating. The wiring groove is filled with the Cu film 5. After the Cu film 5 is annealed, an excessive Cu film is removed by CMP to form a Cu wiring. After that, pre-rinsing, DHF process at 0.1%, pure-water rinsing, and ultrasonic cleaning process are performed, in this order; and lastly, a spin-drying is performed after final rinsing in pure water. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to a Cu wiring forming step in a method for manufacturing a semiconductor device.

  In recent years, with the miniaturization and high performance of silicon semiconductor products, Cu wiring is frequently used. As a method of forming a Cu wiring, since dry etching of copper is extremely difficult, a wiring groove forming process by dry etching to an inter-wiring insulating film, a copper embedding process by electrolytic plating in the formed wiring groove, A series of steps (damascene method) of removing and planarizing an excess Cu film by mechanical polishing (hereinafter referred to as CMP) is generally performed.

  Among the above steps, in the CMP step, a large amount of particles such as abrasives, Cu polishing debris, and metal contamination remain on the polished semiconductor substrate surface, and the substrate is cleaned to remove them. Is done.

  Since Cu wiring is exposed on the substrate surface after Cu polishing, insufficient removal of these contaminations causes corrosion of Cu and the like, and causes deterioration of wiring performance, particularly short-circuiting between wirings. It becomes a big problem.

  Conventionally, as a method for cleaning a semiconductor substrate, a cleaning method using RCA cleaning has been widely performed. A typical cleaning sequence of this method includes a step of removing particles with an alkaline solution (ammonia-hydrogen peroxide solution), a step of removing an oxide film with dilute hydrofluoric acid, and an acidic solution (hydrochloric acid-hydrogen peroxide solution). It consists of the process of removing metal contamination.

  However, in this cleaning method, there is a problem that ammonia forms an ammine complex with Cu and is easily etched with respect to the Cu wiring, and hydrofluoric acid has a rough Cu surface.

  For this reason, a combination of mechanical cleaning with a brush and cleaning with an organic acid (oxalic acid) is generally performed as cleaning after Cu polishing. That is, particles are removed by mechanical friction with a brush, and oxalic acid reacts with copper oxide to form a chelate complex and dissolves in the solution to remove contamination on the Cu surface.

  However, this cleaning method can remove particles and metal contamination to some extent, but it is difficult to remove a bridge caused by Cu generated between Cu wirings by polishing. FIG. 8 shows an aspect of the bridge between wirings which is a problem here, and the mechanism in which the bridge is generated will be described below.

  In Cu CMP, polishing is terminated when the Cu film 5 and the barrier film are polished and the inter-wiring insulating film 2 is exposed. In order to prevent an increase in wiring resistance due to the thinning of the Cu film 5, The cross-sectional shape is such that the Cu film 5 is convex with respect to the inter-wiring insulating film 2. In this way, when the Cu film 5 has a shape that is convex with respect to the inter-wiring insulating film 2, the Cu film 5 that is convex during polishing extends on the inter-wiring insulating film 2 by the polishing pressure, An inter-wiring Cu bridge 6 is generated by contact with the Cu wiring (FIG. 8A).

  Further, when scratches are generated on the Cu surface due to the foreign matter being polished, the removed Cu extends on the inter-wiring insulating film, and an inter-wiring Cu bridge 6 is generated (FIG. 8B). Furthermore, when a scratch is generated on the inter-wiring insulating film, an inter-wiring Cu bridge 6 may be generated by embedding polishing scraps Cu in the scratch groove (FIG. 8C).

  The inter-wiring bridge formed as described above causes a short-circuit between wirings and causes a reduction in the yield of semiconductor products. However, the above-described conventional cleaning method cannot remove this bridge.

  On the other hand, cleaning with ozone water and hydrofluoric acid has been proposed as a cleaning method that replaces the conventional RCA cleaning, and an example in which this cleaning method is applied to a Cu wiring process is disclosed in, for example, Patent Document 1.

In this cleaning method, it is possible to remove particles and metal contamination on the substrate surface by oxidizing the Cu surface with ozone water and removing the oxide layer with hydrofluoric acid, and it is possible to remove the inter-wiring bridge due to the Cu film to some extent. is there. As a result of evaluating the removal rate of the bridge between wirings by cleaning with ozone water and hydrofluoric acid using the electronic pattern defect inspection apparatus, the inventor confirmed that 75% of the bridge can be removed by this cleaning process. did.
JP-A-8-153698

  However, when the surface of the substrate after treatment with ozone water and hydrofluoric acid is examined in detail using an optical pattern defect inspection apparatus, 1000 or more concave defects of 100 to 300 nm are generated on the surface of the wiring Cu over the entire surface of the substrate. Turned out to be.

  The shape of the concave defect generated on the Cu wiring is shown in FIG. The following can be considered as the cause of this occurrence. That is, since the oxidation-reduction potential of ozone water is as high as 1.1 V, the surface of the Cu wiring is ionized due to the battery effect and eluted into the ozone water, resulting in a concave defect.

  When a large number of concave defects are generated on the surface of the wiring Cu as described above, there is a possibility that the wiring resistance is increased and further the wiring is disconnected, and ozone water cannot be applied to the Cu wiring process.

  Therefore, an object of the present invention is to provide a processing method capable of effectively removing a wiring-to-wiring bridge without causing a concave defect on a Cu wiring surface in a cleaning step after CMP. To do.

  In order to solve the above problems, a method of manufacturing a semiconductor device according to the present invention includes a step of forming an insulating layer on a substrate, a step of forming a groove in the insulating layer, and a copper thin film on the insulating layer. A step of embedding the inside of the groove with the copper thin film, a step of chemically mechanically polishing the copper thin film to remove the copper thin film in a region other than the groove, and a surface side of the substrate after the polishing. In order to reduce the adhesion between the thin film and the insulating layer, a chemical solution treatment step and a physical cleaning treatment step on the surface side of the substrate after the chemical solution treatment are provided.

  It is preferable that the copper thin film in the groove is used as a copper wiring.

  The chemical solution is preferably either dilute hydrofluoric acid or oxalic acid.

  Preferably, the physical cleaning is performed using any one of ultrasonic cleaning, fluid cleaning, and steam cleaning, and the cleaning water used for the ultrasonic cleaning is pure water or dissolved gas water in which a gas is dissolved in pure water. More preferably.

  The dissolved gas is preferably any one of hydrogen, nitrogen, oxygen, carbon dioxide, and argon.

  In the Cu wiring formation process, by performing the process of the present invention after CMP of the Cu film, it is possible to remove the Cu wiring bridge existing after the CMP without generating new defects such as concave defects on the Cu surface. Thus, the occurrence of a short circuit between wirings can be prevented in advance.

(Embodiment 1)
Embodiments of the present invention will be described below with reference to the drawings.

  FIG. 1 shows a processing flow in Embodiment 1 of the present invention, and FIG. 2 shows a sectional view of a semiconductor substrate immediately after CMP. The outline of each processing step will be described below.

  After forming the inter-wiring insulating film 2 on the semiconductor substrate 1 and further forming the wiring groove in the insulating film 2 by dry etching, the barrier film 3 and the Cu seed film 4 are formed by sputtering, and then the Cu film 5 is formed by electrolytic plating. The wiring trench is filled with a Cu film 5.

  After the Cu film 5 is annealed, excess Cu film in the region other than the wiring trench is removed by CMP to form a Cu wiring.

  As shown in FIG. 2, the polished substrate surface includes particles such as abrasives and polishing debris, metal contamination, contamination such as bridges between wirings, and defects. Among these, the Cu bridge 6 between the wirings causes a short circuit between the wirings as described above, which causes a decrease in the yield of the semiconductor product.

  Next, in order to remove the Cu bridge 6 generated between the wirings, a cleaning process is performed using a single wafer type spin cleaning apparatus. FIG. 3 shows a manufacturing process explanatory diagram after the CMP process in the first embodiment of the present invention, and the details will be described below.

  First, the substrate surface including the Cu film 5 and the inter-wiring insulating film 2 is hydrophilized by pre-rinsing with pure water, and then treated with 0.1% DHF for several seconds to adhere the Cu bridge 6 and the inter-wiring insulating film. (FIG. 3A). The DHF process is performed at a DHF flow rate of 1.0 liter / minute and a wafer rotational speed of 500 r. p. m. I went under the condition.

  Here, Cu in the bridge portion 6 is extruded onto the inter-wiring insulating film by the polishing pressure at the time of CMP, and the adhesive force at the interface between Cu and the insulating film is not chemically strong. Therefore, DHF can easily penetrate into the interface by the DHF treatment, and the adhesion can be remarkably reduced by etching the oxide layer present at the interface between Cu and the insulating film. Next, after washing and removing DHF on the substrate surface with pure water rinsing, ultrasonic cleaning is performed for 10 seconds by applying an ultrasonic wave having a frequency of 1.6 MHz and an output of 10 W to the pure water for cleaning, thereby reducing adhesion. The removed Cu bridge 6 is removed and removed (FIG. 3B). The flow rate of pure water during ultrasonic cleaning is 1.0 liter / minute, and the wafer rotation speed during processing is 500 rpm. p. m. Met.

  Finally, after the final rinse with pure water, the wafer rotation speed is 1500 r. p. m. Perform spin drying at Further, at the time of rinsing with pure water, the flow rate of pure water is 1.0 liter / minute, and the wafer rotational speed during processing is 500 r. p. m. Went to each.

  As described above, according to the present embodiment, the adhesion between Cu and the insulating film is remarkably reduced by the DHF treatment, so that the Cu bridge can be removed with a smaller force than physical cleaning in normal foreign matter removal. Therefore, Cu bridge removal and residue removal between wirings can be performed with little damage to the substrate surface.

  When the bridge removal rate by the cleaning treatment shown in the present embodiment was evaluated using an electronic pattern defect inspection apparatus as in the case of the ozone water and hydrofluoric acid treatment, the removal rate was 92%, It was confirmed that the removal rate was higher than that of ozone water and hydrofluoric acid treatment.

  In addition, as for concave defects, as a result of evaluation using an optical pattern defect inspection apparatus in the same manner as in the treatment with ozone water and hydrofluoric acid, the occurrence of concave defects was zero.

  Further, when pure water in which hydrogen gas is dissolved by 1% is used as the cleaning water used in the ultrasonic cleaning process, micro bubbles in the pure water vibrate by ultrasonic waves and this physically acts on the Cu bridge 6. The effect of removing the Cu bridge can be enhanced. The same effect can be obtained by using nitrogen, oxygen, carbon dioxide, or argon in addition to hydrogen as the dissolved gas.

  In addition, when the bridge removal rate and the Cu surface defect were evaluated when the DHF treatment and the ultrasonic cleaning treatment were performed at the same time, the bridge removal rate was as good as 90%, but the Cu surface defect was 80 pieces. It was found that damage to the surface occurred.

  This is considered because the effect that the Cu surface is slightly etched by DHF is amplified by the ultrasonic wave, and the Cu surface is excessively etched.

  Furthermore, as a result of conducting the same defect evaluation for the case where the ultrasonic cleaning process is performed first and then the DHF process is performed, the number of Cu surface defects is zero and good, but the bridge removal rate is 35%. It has been found that this is significantly lower than when the method of the present invention is used.

  This is because, although the adhesion between the Cu bridge 6 and the insulating film 2 is weakened by the DHF treatment, there is no subsequent step of removing the Cu bridge 6 by applying a physical impact.

  Therefore, as shown in the present embodiment, it has been found that the physical treatment after the chemical treatment is performed can most effectively remove the bridge and has few Cu surface defects.

  In this embodiment, if the DHF process, the ultrasonic cleaning process, the rinsing and the drying process are continuously performed in the same chamber, it is not necessary to transfer between processes, and the processing time can be minimized. It is.

(Embodiment 2)
FIG. 4 shows a processing flow in the second embodiment of the present invention.

  In the present embodiment, oxalic acid is used to reduce the adhesion between the Cu bridge and the insulating layer. Although oxalic acid does not react with metallic Cu, it has a property of forming a chelate bond with Cu and dissolving it with respect to Cu oxide. For this reason, when oxalic acid permeates the interface between the Cu bridge and the inter-wiring insulating film, the thin Cu oxide layer formed at the interface can be dissolved, and the adhesion between the Cu bridge and the insulating film can be reduced. The oxalic acid treatment in this treatment is performed by a single-wafer type spin treatment apparatus in the same manner as the DHF treatment in the first embodiment, and the oxalic acid flow rate is set to 1.0 liter / min using oxalic acid having a concentration of 10%. I went for tens of seconds.

  After the oxalic acid treatment, the Cu bridge was removed by physical washing after washing away the chemical solution with pure water rinse, and then pure water rinse and spin drying were performed.

  FIG. 5 shows the dependency of the Cu bridge removal rate on the processing method, and FIG. 6 shows the dependency of the number of concave defects formed on the Cu surface on the processing method.

  As can be seen from FIG. 5, the Cu bridge removal rate in this embodiment is 90%, which is almost the same as the removal rate in the case of using the DHF treatment in Embodiment 1, and ozone water and hydrofluoric acid. It was confirmed that the removal rate was higher than that of the treatment. In addition, the number of concave defects was zero, which was the same as in the first embodiment.

  As described above, also in the present embodiment, as in the case of the first embodiment, the Cu bridge can be efficiently removed without generating a concave defect on the Cu surface, the wiring short-circuit can be reduced, and the product yield can be improved. Reliability can be improved.

(Embodiment 3)
FIG. 7 shows a processing flow in the third embodiment of the present invention.

  In this embodiment, fluid cleaning or steam cleaning is used as the physical cleaning process.

Here, the fluid cleaning is a cleaning by applying a local pressure by injecting pure water from a nozzle together with a high-pressure gas, for example, N ₂ . In addition, steam cleaning means that the physical cleaning power is increased by a water stream containing water vapor having a temperature of around 100 ° C., which is generated by mixing water vapor of 100 ° C. or higher and pure water, and then spraying this from a nozzle. To get.

  After the treatment with DHF, oxalic acid, or the like, the above-described fluid cleaning or vapor cleaning is used as the physical cleaning treatment, whereby a bridge removal rate equivalent to that in the case of ultrasonic cleaning can be obtained.

  The method for manufacturing a semiconductor device according to the present invention is particularly useful for manufacturing a semiconductor device having Cu wiring.

Processing flow diagram in Embodiment 1 of the present invention Sectional view of a semiconductor substrate immediately after CMP Manufacturing process explanatory drawing after CMP process in Embodiment 1 of this invention Processing flow diagram in Embodiment 2 of the present invention The figure which shows the cleaning process method dependence of Cu bridge removal rate The figure which shows the cleaning processing method dependence of the number of concave defects Processing flow diagram in Embodiment 3 of the present invention Diagram showing the mode of bridge between wires The figure which shows the shape of the concave defect on Cu wiring

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Semiconductor substrate 2 Inter-wiring insulating film 3 Barrier film 4 Cu seed film 5 Cu film 6 Inter-wiring Cu bridge

Claims (6)

Forming an insulating layer on the substrate;
Forming a groove in the insulating layer;
Forming a copper thin film on the insulating layer and filling the groove with the copper thin film;
Chemical mechanical polishing the copper thin film to remove the copper thin film in regions other than the grooves;
Treating the surface side of the substrate after the polishing with a chemical solution in order to reduce the adhesion between the copper thin film and the insulating layer;
A method for manufacturing a semiconductor device, comprising a step of physically cleaning the surface side of the substrate after the chemical treatment. 2. The method of manufacturing a semiconductor device according to claim 1, wherein the copper thin film in the groove is used as a copper wiring. 3. The method of manufacturing a semiconductor device according to claim 1, wherein the chemical solution is one of dilute hydrofluoric acid and oxalic acid. 2. The method of manufacturing a semiconductor device according to claim 1, wherein the physical cleaning is performed using any one of ultrasonic cleaning, fluid cleaning, and vapor cleaning. 5. The method of manufacturing a semiconductor device according to claim 4, wherein the cleaning water used for the ultrasonic cleaning is pure water or dissolved gas water obtained by dissolving a gas in pure water. 6. The method of manufacturing a semiconductor device according to claim 5, wherein the dissolved gas is any one of hydrogen, nitrogen, oxygen, carbon dioxide, and argon.

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