JP2005351760A - Distortion measuring method and system - Google Patents

Distortion measuring method and system Download PDF

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JP2005351760A
JP2005351760A JP2004172816A JP2004172816A JP2005351760A JP 2005351760 A JP2005351760 A JP 2005351760A JP 2004172816 A JP2004172816 A JP 2004172816A JP 2004172816 A JP2004172816 A JP 2004172816A JP 2005351760 A JP2005351760 A JP 2005351760A
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reference point
predetermined pattern
vector
point
distortion
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JP4806767B2 (en
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Yuichiro Noda
雄一郎 野田
Takechika Sugita
武親 杉田
Toshihisa Enoki
敏寿 榎木
Shinya Toyama
真也 外山
Masahiro Yokomichi
政裕 横道
Tetsuo Kitazoe
徹郎 北添
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Miyazaki Prefecture
University of Miyazaki NUC
Minebea AccessSolutions Inc
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Miyazaki Prefecture
University of Miyazaki NUC
Honda Lock Manufacturing Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a distortion measuring method and a system which makes possible, automatization of distortion tests, elimination of skilled testers, stable and fair tests because of quantification of criterion, and distortion tests of gradually curved mirrors (complex curvature mirror) which was conventionally difficult. <P>SOLUTION: By using a predetermined software, a reflection image measured data which is obtained by reflecting a pattern of predetermined dots 12 provided on a screen 4 to the reflection surface (curved surface 5a) of an test object mirror 5, and reflection image theory data of the predetermined dot pattern which is obtained by calculating based on a design value used for forming the reflection surface 5a of the test object mirror 5 are compared so as to measure the distortion of the test object. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、歪み検査方法及びその装置に関し、特に、ミラー等の反射面の歪みを検査する方法及び装置に関するものである。   The present invention relates to a distortion inspection method and apparatus, and more particularly to a method and apparatus for inspecting distortion of a reflecting surface such as a mirror.

従来、JIS規格によるミラーの歪み検査では、目盛間隔10mmの同心円目盛とその中心を通る8等分線を描いたつい立てをミラーに正対させ、つい立ての目盛中心の穴から、鏡面の同心円目盛の像を写せるような装置を用いて、鏡像(同心円)の平均半径と最大(又は最小)半径の比(歪み率[%])を求め、歪みの度合いを定量化している。しかし、実際の量産工場では、前述のような検査を行うのは効率が落ちるため、ミラー面に複数の直線を写し、鏡像(直線)の曲り具合を見ることで、歪み検査を行っている。   Conventionally, in mirror distortion inspection according to the JIS standard, a concentric circle with a 10 mm graduation and an 8-segment line that passes through the center of the mirror are directly opposed to the mirror. The ratio of the average radius of the mirror image (concentric circle) to the maximum (or minimum) radius (distortion rate [%]) is obtained by using an apparatus capable of projecting a scale image, and the degree of distortion is quantified. However, in an actual mass production factory, it is less efficient to perform the inspection as described above, so a plurality of straight lines are copied on the mirror surface, and the distortion inspection is performed by checking the degree of bending of the mirror image (straight line).

また、ミラーではないが、CD(コンパクトディスク)を成形するためのスタンパの歪み測定方法に関する技術が知られており、これは、測定対象となるスタンパの表面で反射させてできる参照模様の反射像と、予め準備した歪みのないスタンパの反射像とを比較するものであり、その測定方法としてビデオカメラの画像データをパソコンで処理して比較するものである(特許文献1参照。)。
特開平7−83624号公報
Further, a technique related to a method for measuring distortion of a stamper for forming a CD (compact disc), which is not a mirror, is known. This is a reflection image of a reference pattern formed by reflection on the surface of a stamper to be measured. And a reflection image of a stamper prepared in advance without distortion, and as a measuring method thereof, image data of a video camera is processed by a personal computer and compared (see Patent Document 1).
JP-A-7-83624

しかしながら、上記従来技術においては、以下に示す問題があった。   However, the above prior art has the following problems.

まず、JIS規格によるミラーの歪み検査については、
(1)ミラーの形状が異形状であるため、同心円目盛を写した場合、鏡像が得られない範囲がでる。
(2)一般的にはミラーの外周部、特に極端に張り出している範囲(鏡像の得られない範囲)に歪みが出やすいため、適正な検査とならない場合がある。
(3)検査に時間が掛かり効率が悪い。
(4)本JIS規格が適用できるのは、単一の平面ミラー及び単一半径の球面ミラーであり、近年、視野を広く見せられるために利用が拡大している徐変曲面ミラーについては適用不可能である。
First, about the distortion inspection of the mirror by JIS standard,
(1) Since the shape of the mirror is irregular, when a concentric scale is copied, there is a range where a mirror image cannot be obtained.
(2) Generally, since the distortion tends to occur in the outer peripheral portion of the mirror, particularly in an extremely protruding range (a range where a mirror image cannot be obtained), an appropriate inspection may not be performed.
(3) Inspection takes time and efficiency is poor.
(4) This JIS standard can be applied to single plane mirrors and spherical mirrors with a single radius, and is not applicable to gradually changing curved mirrors that have been used in recent years to expand their field of view. Is possible.

次に、現状の量産工場でのミラーの歪み検査については、
(5)目視による官能検査となるため、検査者の熟練を要する。
(6)判定基準があいまいであるため、検査結果が検査者の主観に左右される。
(7)徐変曲面ミラー等、平面及び単一曲面以外のミラーの場合は、判定が更に困難になる。
(8)歪み限度(限度見本)に近い検査体に対しては、判定に時間を要する場合がある。
Next, about the distortion inspection of the mirror in the current mass production factory,
(5) Since it is a visual sensory test, skill of the inspector is required.
(6) Since the criterion is ambiguous, the test result depends on the subjectivity of the inspector.
(7) In the case of a mirror other than a flat surface and a single curved surface, such as a gradually changing curved surface mirror, the determination becomes more difficult.
(8) For an inspection object close to the strain limit (limit sample), it may take time to determine.

さらに、特許文献1(特開平7−83624)については、
(9)完全に歪みのないスタンパを形成することは難しく、また、歪みのないことを確認することも困難である。そのため基準となる画像データの信頼性が問題となる。
Furthermore, with respect to Patent Document 1 (Japanese Patent Laid-Open No. 7-83624),
(9) It is difficult to form a stamper that is completely free of distortion, and it is also difficult to confirm that there is no distortion. Therefore, the reliability of the reference image data becomes a problem.

このため本発明は、検査対象の反射面に所定の模様を反射させて得られる反射像実測データと、前記検査対象の反射面を形成するために用いた設計値を基に所定のソフトウェアを用いて演算して求めた前記所定模様の反射像理論データとを比較することにより前記検査対象の反射面の歪みを測定することを第1の特徴とする。   For this reason, the present invention uses predetermined software based on the reflection image actual measurement data obtained by reflecting a predetermined pattern on the reflection surface to be inspected and the design value used for forming the reflection surface to be inspected. The first feature is that the distortion of the reflection surface to be inspected is measured by comparing the reflection image theoretical data of the predetermined pattern obtained by calculation in the above.

次に、請求項1記載の歪み測定方法において、前記所定模様は均等に配列したドットからなる模様であり、反射像実測データのドットの位置と反射像理論データのドットの位置とを比較して前記検査対象の反射面の歪みを測定することを第2の特徴とする。   Next, in the distortion measurement method according to claim 1, the predetermined pattern is a pattern composed of uniformly arranged dots, and the positions of the dots in the reflected image actual measurement data are compared with the positions of the dots in the reflected image theoretical data. A second feature is that the distortion of the reflection surface to be inspected is measured.

また、請求項1又は請求項2記載の歪み測定方法において、前記ソフトウェアが、前記検査対象物の反射面の理論曲面の形状を所定の三次曲線で定義するステップと、前記三次曲線を用いて求められた所定数の基準点を用いて、前記反射面の理論曲面を点群で近似するステップと、前記点群中の基準点の単位法線ベクトルを求めるステップと、前記所定模様の位置データと、前記理論曲面上の点群中の基準点の位置データと、前記反射面で反射した前記所定模様が写像されるカメラの位置データとから、前記基準点と前記所定模様を結ぶベクトルと、前記基準点と前記カメラを結ぶベクトルとを算出し、前記基準点と前記所定模様を結ぶベクトルと、前記基準点と前記カメラを結ぶベクトルとのなす角を二等分する単位ベクトルを算出するステップと、該単位ベクトルと、前記点群中の基準点の単位法線ベクトルとの差が最小になる点を探索して求めるステップとを備えたことを第3の特徴とする。   Further, in the strain measuring method according to claim 1 or 2, the software determines the shape of the theoretical curved surface of the reflecting surface of the inspection object using a predetermined cubic curve and the cubic curve. A step of approximating a theoretical curved surface of the reflecting surface by a point group using a predetermined number of reference points, a step of obtaining a unit normal vector of the reference point in the point group, and position data of the predetermined pattern; A vector connecting the reference point and the predetermined pattern from the position data of the reference point in the point group on the theoretical curved surface and the position data of the camera to which the predetermined pattern reflected by the reflecting surface is mapped, A vector that connects a reference point and the camera is calculated, and a unit vector that bisects an angle formed by a vector that connects the reference point and the predetermined pattern and a vector that connects the reference point and the camera is calculated. And-up, and the unit vector, a third feature that the difference between the unit normal vector of the reference point in the point group and a step of determining by searching the point where the minimum.

そして、歪み測定装置であって、検査対象の反射面に所定模様を反射させて反射像実測データを得る手段と、該反射像実測データと、前記検査対象の反射面を形成するために用いた設計値を基に所定のソフトウェアを用いて演算して求めた所定模様の反射像理論データとを比較する比較手段とを備えたことを第4の特徴とする。   And it is a distortion measuring device, which is used to form a reflection image actual measurement data by reflecting a predetermined pattern on the reflection surface of the inspection object, and to form the reflection image actual measurement data and the reflection surface of the inspection object A fourth feature is provided with a comparison means for comparing the reflection image theoretical data of a predetermined pattern obtained by calculation using predetermined software based on the design value.

さらに、請求項4記載の歪み測定装置において、前記所定模様は均等に配列したドットからなる模様であり、反射像実測データのドットの位置と反射像理論データのドットの位置を測定する測定手段を備えたことを第5の特徴とする。   5. The distortion measuring apparatus according to claim 4, wherein the predetermined pattern is a pattern composed of uniformly arranged dots, and measuring means for measuring the positions of the dots of the reflected image actual measurement data and the dots of the reflected image theoretical data is provided. The fifth feature is that it is provided.

加えて、請求項4又は請求項5記載の歪み測定装置において、前記ソフトウェアが、前記検査対象物の反射面の理論曲面の形状を所定の三次曲線で定義する手段と、前記三次曲線を用いて求められた所定数の基準点を用いて、前記反射面の理論曲面を点群で近似する手段と、前記点群中の基準点の単位法線ベクトルを求める手段と、前記所定模様の位置データと、前記理論曲面上の点群中の基準点の位置データと、前記反射面で反射した前記所定模様が写像されるカメラの位置データとから、前記基準点と前記所定模様を結ぶベクトルと、前記基準点と前記カメラを結ぶベクトルとを算出し、前記基準点と前記所定模様を結ぶベクトルと、前記基準点と前記カメラを結ぶベクトルとのなす角を二等分する単位ベクトルを算出する手段と、該単位ベクトルと、前記点群中の基準点の単位法線ベクトルとの差が最小になる点を探索して求める手段とを備えたことを第6の特徴とする。   In addition, in the distortion measuring apparatus according to claim 4 or 5, the software uses a means for defining a shape of a theoretical curved surface of a reflection surface of the inspection object with a predetermined cubic curve, and the cubic curve. Means for approximating the theoretical curved surface of the reflecting surface by a point group using the determined predetermined number of reference points; means for determining a unit normal vector of the reference point in the point group; and position data of the predetermined pattern A vector connecting the reference point and the predetermined pattern from the position data of the reference point in the point group on the theoretical curved surface and the position data of the camera to which the predetermined pattern reflected by the reflecting surface is mapped, Means for calculating a vector connecting the reference point and the camera, and calculating a unit vector that bisects an angle formed by a vector connecting the reference point and the predetermined pattern and a vector connecting the reference point and the camera; And simply And a vector, and the sixth aspect of the difference between the unit normal vector of the reference point in the point cloud is equipped with means for determining by searching point to be minimized.

本発明に係る車両用ドアハンドル装置によれば、以下に示す優れた効果を有する。
(1)歪み検査の自動化が可能となり、熟練した検査者が不要となる。
(2)判定基準が定量化されるため、安定かつ公平な検査が可能となる。
(3)従来困難とされた徐変曲面ミラー(複合曲率ミラー)の歪み検査が可能となる。
The vehicle door handle device according to the present invention has the following excellent effects.
(1) The distortion inspection can be automated, and a skilled inspector becomes unnecessary.
(2) Since determination criteria are quantified, stable and fair inspection is possible.
(3) Distortion inspection of a gradually changing curved mirror (composite curvature mirror), which has been difficult in the past, can be performed.

以下、本発明を実施するための最良の形態を図面に示す実施例に基づいて説明する。図1は、本発明に係る歪み測定装置の一実施例を平面から見た模式図である。図2は、発明に係る歪み測定装置の一実施例を正面から見た模式図である。図3は、ドットパターンが描かれたスクリーンの平面図であり、図4は、検査対象のミラーに図3のスクリーンのドットパターンが写っている状態を示す説明図である。図5は、検査の緩急を領域によって分ける場合の説明図である。図6は、理論データのドット分布と実測データのドット分布の比較による良否判定のイメージ図である。図7は、理論曲面を三次曲線を用いて点群で表示した際の概念図であり、図8は、探索のための基準点を表示した状況を示す説明図である。図9乃至図13は、探索方法の概念を示す説明図である。図14は、写像位置の計算方法の概念を示す説明図である。図15は、算出された曲面上のドットの写影位置を示す平面図であり、図16は、図15を平面写真上に変換して写影した平面図である。   Hereinafter, the best mode for carrying out the present invention will be described based on an embodiment shown in the drawings. FIG. 1 is a schematic view of an embodiment of a strain measuring device according to the present invention as viewed from the top. FIG. 2 is a schematic view of an embodiment of the strain measuring apparatus according to the invention as viewed from the front. FIG. 3 is a plan view of a screen on which a dot pattern is drawn, and FIG. 4 is an explanatory diagram showing a state in which the dot pattern of the screen of FIG. 3 is reflected on a mirror to be inspected. FIG. 5 is an explanatory diagram in the case where the speed of inspection is divided by region. FIG. 6 is a conceptual diagram of pass / fail judgment by comparing the dot distribution of theoretical data and the dot distribution of measured data. FIG. 7 is a conceptual diagram when a theoretical curved surface is displayed as a point group using a cubic curve, and FIG. 8 is an explanatory diagram showing a situation where reference points for searching are displayed. 9 to 13 are explanatory diagrams showing the concept of the search method. FIG. 14 is an explanatory diagram showing the concept of the mapping position calculation method. FIG. 15 is a plan view showing the calculated positions of the dots on the curved surface, and FIG. 16 is a plan view obtained by converting FIG. 15 onto a plane photograph.

本発明に係る歪み測定装置1は、図1に示すように、ミラー搬入部2、検査部3、搬出部8からなり、ダイレクトドライブのロータリモータ(図示せず)にてインデックス9を回転させ、検査体であるミラー5を各ステージ10に移載するものである。検査部3は暗箱となっており、内部天面には、図2、図3に示すように、カメラ6のレンズ部6aを挿通するためのレンズ挿通孔4aが中央部に形成され、等ピッチで格子状に並んだ複数のドット12が描かれたスクリーン4が取付けられている。このスクリーン4と正対してミラー5が置かれ、ミラー5中心の上方には、ミラー5全体を撮像するべくカメラ6が設置されている。また、撮像時のコントラストを上げるため、スクリーン4に正対した位置に照明装置7が配設されている。図4は、このミラー5の反射面5aに、スクリーン4に描かれたドット12の一部が写っている状態を示しており、ミラー5の反射面5a中央部には、カメラ6に装着されたレンズ6aが写っている。この際、ミラー5の大きさ、形状によって、スクリーン4上のドット12は、ミラー5の反射面5aに全部写る場合もある。ミラー5は徐変曲面ミラーであるので、図4の左端から右側中央部の範囲では、ドット12は略等ピッチで格子状に並んで写っているが、右側中央部から右端側の範囲では、ドット12のピッチが右端側に向かうほど徐々に短くなるように写っている。測定装置1は、ソフトウェアまたはソフトウェアにて算出した理論データを記録した参照テーブルを実装したパソコン11と接続されている。   As shown in FIG. 1, the distortion measuring apparatus 1 according to the present invention includes a mirror carry-in unit 2, an inspection unit 3, and a carry-out unit 8. The index 9 is rotated by a direct drive rotary motor (not shown), The mirror 5 as an inspection object is transferred to each stage 10. The inspection unit 3 is a dark box, and as shown in FIGS. 2 and 3, a lens insertion hole 4a for inserting the lens unit 6a of the camera 6 is formed in the central portion on the inner top surface, and the pitch is equal. A screen 4 on which a plurality of dots 12 arranged in a grid is drawn is attached. A mirror 5 is placed in front of the screen 4, and a camera 6 is installed above the center of the mirror 5 to capture the entire mirror 5. In addition, an illuminating device 7 is disposed at a position facing the screen 4 in order to increase the contrast during imaging. FIG. 4 shows a state in which a part of the dots 12 drawn on the screen 4 is reflected on the reflection surface 5a of the mirror 5, and the mirror 6 is attached to the camera 6 at the center of the reflection surface 5a. The lens 6a is shown. At this time, depending on the size and shape of the mirror 5, all the dots 12 on the screen 4 may be reflected on the reflection surface 5 a of the mirror 5. Since the mirror 5 is a gradually changing curved surface mirror, in the range from the left end of FIG. 4 to the right center portion, the dots 12 are shown in a lattice pattern at substantially equal pitches, but in the range from the right center portion to the right end side, It is shown that the pitch of the dots 12 is gradually shortened toward the right end side. The measuring device 1 is connected to a personal computer 11 on which a reference table that records software or theoretical data calculated by software is mounted.

ソフトウェアによって算出された「理論データ」とは、検査部3暗箱内の撮像条件(ミラー5とカメラ6間の距離h1、ミラー5とスクリーン4間の距離h2など)において、ミラー5の反射面に写るであろう反射像を反射面の曲率値などの設計値を基にベクトル解析による探索法により理論的に算出したドット座標のことをいい、本発明は、歪み検査の際に「理論データ」を基準として良否判定を行うことを特徴とするものである。この方法によれば、反射面が単純曲率(すなわち、単一半径)の曲面だけでなく複数の曲率を有する複合曲率面であっても検出することができる。本発明においては、このベクトル解析探索法を用いて算出した「理論データ」を利用しているが、その他の方法で算出したデータを利用してもよい。   The “theoretical data” calculated by the software is the reflection surface of the mirror 5 under the imaging conditions in the inspection unit 3 dark box (distance h1 between the mirror 5 and the camera 6, distance h2 between the mirror 5 and the screen 4, etc.). Refers to the dot coordinates theoretically calculated by the search method by vector analysis based on the design value such as the curvature value of the reflection surface of the reflection image that will be reflected, the present invention is "theoretical data" in the distortion inspection It is characterized in that pass / fail judgment is performed with reference to the above. According to this method, it is possible to detect not only a curved surface having a simple curvature (that is, a single radius) but also a complex curvature surface having a plurality of curvatures. In the present invention, “theoretical data” calculated using this vector analysis search method is used, but data calculated by other methods may be used.

インデックス9が回転し、ミラー5が所定の姿勢にて検査部3に搬送されると、ミラー5面にスクリーン4上のドット12が鏡像として写りこむ。これらのドット分布を暗箱天面にあるカメラ6にて撮像し、一般的な画像処理の手法により全てのドット12のエッジを検出して円でのフィッティングをした後、その中心点を「鏡像のドット分布(x’,y’)」として座標出力する。この座標値(x’,y’)と、「理論データ」から得られる座標値(x,y)を比較する。パソコン11にて両者の同一座標同士の座標値のズレ量(差分)を算出し、適宜の算術式によってミラー5の歪み度合を定量化する。ここでいう算術式とは、全ての座標値のズレ量の2乗を累積したもの(下記数式1)でもよいし、領域によって検査の緩急を設けることもできる(下記数式2)。そして、下記数式1及び数式2に示すΔ値が大きいほど歪んでいるとみなし、規定のしきい値未満のものを合格と判定する。 When the index 9 rotates and the mirror 5 is conveyed to the inspection unit 3 in a predetermined posture, the dots 12 on the screen 4 are reflected as a mirror image on the surface of the mirror 5. These dot distributions are imaged by the camera 6 on the top of the dark box, the edges of all the dots 12 are detected by a general image processing method, and fitting with a circle is performed. The coordinates are output as “dot distribution (x ′ n , y ′ n )”. This coordinate value (x ′ n , y ′ n ) is compared with the coordinate value (x n , y n ) obtained from “theoretical data”. The personal computer 11 calculates the deviation (difference) between the coordinate values of the same coordinates, and quantifies the degree of distortion of the mirror 5 by an appropriate arithmetic expression. Here, the arithmetic expression may be an accumulation of the squares of the deviation amounts of all coordinate values (the following mathematical expression 1), or an inspection may be provided depending on the region (the following mathematical expression 2). And it considers that it is distorting, so that the (DELTA) value shown to following Numerical formula 1 and Numerical formula 2 is large, and it determines with a thing less than a regulation threshold value as a pass.

(数式1)
Δ=(x1-x'1)2+(y1-y'1)2+(x2-x'2)2+(y2-y'2)2+・・・+(xn-x'n)2+(yn-y'n)2
(Formula 1)
Δ = (x 1 -x ' 1 ) 2 + (y 1 -y' 1 ) 2 + (x 2 -x ' 2 ) 2 + (y 2 -y' 2 ) 2 + ... + (x n- x ' n ) 2 + (y n -y' n ) 2

(数式2)
Δ=a{(x0-x'0)2+(y0-y'0)2+(x0-x'0)2+(y1-y'1)2+(x-1-x'-1)2+(y1-y'1)2+(x-1-x'-1)2
+(y0-y'0)2+(x-1-x'-1)2+(y-1-y'-1)2+(x0-x'0)2+(y-1-y'-1)2+(x1-x'1)2+(y-1-y'-1)2
+(x1-x'1)2+(y0-y'0)2+(x1-x'1)2+(y1-y'1)2}
+b{(x0-x'0)2+(y2-y'2)2+(x-1-x'-1)2+(y2-y'2)2+(x-2-x'-2)2+(y2-y'2)2+(x-2-x'-2)2
+(y1-y'1)2+(x-2-x'-2)2+(y0-y'0)2+(x-2-x'-2)2+(y-1-y'-1)2+(x-2-x'-2)2
+(y-2-y'-2)2+(x-1-x'-1)2+(y-2-y'-2)2+(x0-x'0)2+(y-2-y'-2)2+(x1-x'1)2
+(y-2-y'-2)2+(x2-x'2)2+(y-2-y'-2)2+(x2-x'2)2+(y-1-y'-1)2+(x2-x'2)2+(y0-y'0)2
+(x2-x'2)2+(y1-y'1)2+(x2-x'2)2+(y2-y'2)2+(x1-x'1)2+(y2-y'2)2}
+c{(x0-x'0)2+(y3-y'3)2+(x-1-x'-1)2+(y3-y'3)2+(x-2-x'-2)2+(y3-y'3)2+(x-3-x'-3)2
+(y3-y'3)2+(x-3-x'-3)2+(y2-y'2)2+(x-3-x'-3)2+(y1-y'1)2+(x-3-x'-3)2+(y0-y'0)2
+(x-3-x'-3)2+(y-1-y'-1)2+(x-3-x'-3)2+(y-2-y'-2)2+(x-3-x'-3)2+(y-3-y'-3)2
+(x-2-x'-2)2+(y-3-y'-3)2+((x-1-x'-1)2+(y-3-y'-3)2+(x0-x'0)2+(y-3-y'-3)2
+(x1-x'1)2+(y-3-y'-3)2+(x2-x'2)2+(y-3-y'-3)2+(x3-x'3)2+(y-3-y'-3)2+(x3-x'3)2
+(y-2-y'-2)2+(x3-x'3)2+(y-1-y'-1)2+(x3-x'3)2+(y0-y'0)2+(x3-x'3)2+(y1-y'1)2
+(x3-x'3)2+(y2-y'2)2+(x3-x'3)2+(y3-y'3)2+(x2-x'2)2+(y3-y'3)2+(x1-x'1)2
+(y3-y'3)2}
(Formula 2)
Δ = a {(x 0 -x ' 0 ) 2 + (y 0 -y' 0 ) 2 + (x 0 -x ' 0 ) 2 + (y 1 -y' 1 ) 2 + (x -1 -x ' -1 ) 2 + (y 1 -y' 1 ) 2 + (x -1 -x ' -1 ) 2
+ (y 0 -y ' 0 ) 2 + (x -1 -x' -1 ) 2 + (y -1 -y ' -1 ) 2 + (x 0 -x' 0 ) 2 + (y -1- y ' -1 ) 2 + (x 1 -x' 1 ) 2 + (y -1 -y ' -1 ) 2
+ (x 1 -x ' 1 ) 2 + (y 0 -y' 0 ) 2 + (x 1 -x ' 1 ) 2 + (y 1 -y' 1 ) 2 }
+ b {(x 0 -x ' 0 ) 2 + (y 2 -y' 2 ) 2 + (x -1 -x ' -1 ) 2 + (y 2 -y' 2 ) 2 + (x -2- x ' -2 ) 2 + (y 2 -y' 2 ) 2 + (x -2 -x ' -2 ) 2
+ (y 1 -y ' 1 ) 2 + (x -2 -x' -2 ) 2 + (y 0 -y ' 0 ) 2 + (x -2 -x' -2 ) 2 + (y -1- y ' -1 ) 2 + (x -2 -x' -2 ) 2
+ (y -2 -y '-2) 2 + (x -1 -x' -1) 2 + (y -2 -y '-2) 2 + (x 0 -x' 0) 2 + (y - 2 -y ' -2 ) 2 + (x 1 -x' 1 ) 2
+ (y -2 -y ' -2 ) 2 + (x 2 -x' 2 ) 2 + (y -2 -y ' -2 ) 2 + (x 2 -x' 2 ) 2 + (y -1- y ' -1 ) 2 + (x 2 -x' 2 ) 2 + (y 0 -y ' 0 ) 2
+ (x 2 -x ' 2 ) 2 + (y 1 -y' 1 ) 2 + (x 2 -x ' 2 ) 2 + (y 2 -y' 2 ) 2 + (x 1 -x ' 1 ) 2 + (y 2 -y ' 2 ) 2 }
+ c {(x 0 -x ' 0 ) 2 + (y 3 -y' 3 ) 2 + (x -1 -x ' -1 ) 2 + (y 3 -y' 3 ) 2 + (x -2- x ' -2 ) 2 + (y 3 -y' 3 ) 2 + (x -3 -x ' -3 ) 2
+ (y 3 -y ' 3 ) 2 + (x -3 -x' -3 ) 2 + (y 2 -y ' 2 ) 2 + (x -3 -x' -3 ) 2 + (y 1 -y ' 1 ) 2 + (x -3 -x' -3 ) 2 + (y 0 -y ' 0 ) 2
+ (x -3 -x ' -3 ) 2 + (y -1 -y' -1 ) 2 + (x -3 -x ' -3 ) 2 + (y -2 -y' -2 ) 2 + ( x -3 -x ' -3 ) 2 + (y -3 -y' -3 ) 2
+ (x -2 -x ' -2 ) 2 + (y -3 -y' -3 ) 2 + ((x -1 -x ' -1 ) 2 + (y -3 -y' -3 ) 2 + (x 0 -x ' 0 ) 2 + (y -3 -y' -3 ) 2
+ (x 1 -x ' 1 ) 2 + (y -3 -y' -3 ) 2 + (x 2 -x ' 2 ) 2 + (y -3 -y' -3 ) 2 + (x 3 -x ' 3 ) 2 + (y -3 -y' -3 ) 2 + (x 3 -x ' 3 ) 2
+ (y -2 -y ' -2 ) 2 + (x 3 -x' 3 ) 2 + (y -1 -y ' -1 ) 2 + (x 3 -x' 3 ) 2 + (y 0 -y ' 0 ) 2 + (x 3 -x' 3 ) 2 + (y 1 -y ' 1 ) 2
+ (x 3 -x ' 3 ) 2 + (y 2 -y' 2 ) 2 + (x 3 -x ' 3 ) 2 + (y 3 -y' 3 ) 2 + (x 2 -x ' 2 ) 2 + (y 3 -y ' 3 ) 2 + (x 1 -x' 1 ) 2
+ (y 3 -y ' 3 ) 2 }

数式2の場合、ミラー5を図5に示すようにA、B、Cの3つの領域に分け、領域Aの演算には係数aを割り当て、また、領域Bの演算には係数bを割り当て、また、領域Cの演算には係数cを割り当てる。そして、それぞれの係数a、b、cには検査が厳しい程大きな数値を割り当てる。領域Aをミラー5中心部、領域Cをミラー5外周部、領域Bをその中間部とすれば、中心部に近くなる程歪み検査は厳しくする必要があるため、aの値が一番大きく、b、cの順に値が小さくなる。   In the case of Equation 2, the mirror 5 is divided into three areas A, B, and C as shown in FIG. 5, and a coefficient a is assigned to the calculation of the area A, and a coefficient b is assigned to the calculation of the area B. In addition, a coefficient c is assigned to the calculation of the region C. A large numerical value is assigned to each of the coefficients a, b, and c as the inspection is severer. If the area A is the center part of the mirror 5, the area C is the outer peripheral part of the mirror 5, and the area B is the middle part thereof, the distortion inspection needs to be stricter as it is closer to the center part. The value decreases in the order of b and c.

また、「反射像の理論データのドット分布」と「反射像の実測データのドット分布」の比較による良否判定のイメージを図6に示す。本実施例では、図6に示すように、実測データのドットのサイズを、理論データのドットの位置との差分が大きい程拡大して表示されているが、他の方法、例えば、理論データのドット分布との差分の大きさによって、ドットの色を変えて表示する方法でも良い。   FIG. 6 shows an image of pass / fail judgment by comparing “dot distribution of theoretical data of reflected image” and “dot distribution of measured data of reflected image”. In this embodiment, as shown in FIG. 6, the dot size of the actual measurement data is enlarged and displayed as the difference from the dot position of the theoretical data is larger. A method may be used in which the dot color is changed depending on the size of the difference from the dot distribution.

次に、「反射像の理論データ」を算出するソフトウェアの構成について説明する。本ソフトウェアは、三次曲線で定義された曲面反射像の写像のシミュレーションソフトウェアであり、基本となる三次曲線を基に、いくつかの基準点を算出し、それらの基準点を座標の回転や移動を行って、曲面形状を点群で表現した後、点群中の各基準点の法線ベクトル、写像を取り込むカメラの位置(レンズの位置)、などから背景のスクリーン上に描かれた所定模様(本実施例では、ドット)が写像のどの位置になるかをシミュレートするようにしたものである。本発明では、曲面上の反射位置の探索方法に特徴を有している。   Next, a software configuration for calculating “theoretical data of the reflected image” will be described. This software is a simulation software for mapping the curved reflection image defined by the cubic curve. Based on the basic cubic curve, several reference points are calculated, and these reference points are rotated and moved. After the curved surface shape is expressed as a point cloud, a predetermined pattern (on the background screen) is drawn from the normal vector of each reference point in the point cloud, the camera position (lens position) to capture the mapping, etc. In the present embodiment, the position of the dot in the mapping is simulated. The present invention is characterized by a method for searching for a reflection position on a curved surface.

車に取り付けられるドアミラーは、単一半径の曲面よりも、複数の半径で合成された曲面にする方が視野も広くとれ、かつコンパクト化が可能となるために、その利用が拡大している。しかし、そのような曲面が正確に成形されているかの確認は容易ではない。そこで、理想曲面を求め、その理想曲面に背景がどのように写るのかをシミュレートし、製品と比較することにより、製品が精度良く製作されているかどうかを検査することができる。   The use of a door mirror attached to a car has a wider field of view and can be made more compact by using a curved surface composed of a plurality of radii than a curved surface having a single radius. However, it is not easy to confirm whether such a curved surface is accurately formed. Therefore, it is possible to inspect whether the product is manufactured with high accuracy by obtaining an ideal curved surface, simulating how the background appears on the ideal curved surface, and comparing it with the product.

本発明では、背景に等ピッチに配置したドットのパターンを描いたスクリーン4を置いた状態において、三次曲面鏡(ミラー5)のどの位置にドットが写るのかを探索し、理想曲面での写像を求めることができる。以下、その方法を説明する。   In the present invention, in the state where the screen 4 depicting the pattern of dots arranged at an equal pitch is placed on the background, the position where the dots appear on the cubic curved mirror (mirror 5) is searched, and the mapping on the ideal curved surface is performed. Can be sought. The method will be described below.

(点群による曲面の近似表現)
まず、ミラーの曲面5aの点群による近似表現について、図7を用いて説明する。図7(a)、図7(b)に示すように、球体GLの中心は、互いに直交する軸X、軸Y、軸Zの交点であり、この交点を原点(0,0,0)とする。また、球体GLの外周面と軸Yとの交点で、図面左側の交点を北極NP、図面右側の交点を南極SPとし、北極NPと南極SPを結ぶ球体GL外周上の大円を子午線MEとする。子午線MEは、単一半径の曲線である。ミラー5の曲面は、まず、図7(a)に示すように、子午線ME上の北極NP近傍の単一半径の曲線20の途中から部分的に三次曲線21で定義される。この単一半径の曲線20上にいくつかの基準点22aを求め、また、三次曲線21上にいくつかの基準点22bを求め、これらの基準点(基準点22aと基準点22bとを合わせた点)を、軸Yを回転軸として球体GLの外周面に沿って回転移動を行い、図7(b)に示すように、曲面5aを基準点22a、22bからなる点群23により近似表現した。図7(a)、図7(b)において、円C1は、基準点23b中の所定の一点の回転軌道を示したものである。また、この手法で作成した探索のための基準点22a、22bを表示した状況を図8に示す。点群23は、単一半径の曲面上の基準点22aと徐変曲面上の基準点22bで構成されている。単一半径の曲面と徐変曲面との境界は、円弧で示されている。尚、本実施例では、基準点22a、22bを北極NP寄りに配置して回転を行ったが、他の位置に配置して回転することもできる。
(Approximate expression of curved surface by point cloud)
First, the approximate expression by the point group of the curved surface 5a of the mirror will be described with reference to FIG. As shown in FIGS. 7A and 7B, the center of the sphere GL is the intersection of the axes X, Y, and Z that are orthogonal to each other, and this intersection is defined as the origin (0, 0, 0). To do. Further, at the intersection of the outer circumferential surface of the sphere GL and the axis Y, the intersection on the left side of the drawing is the north pole NP, the intersection on the right side of the drawing is the south pole SP, and the great circle on the outer circumference of the sphere GL connecting the north pole NP and the south pole SP is the meridian ME To do. The meridian ME is a single radius curve. First, as shown in FIG. 7A, the curved surface of the mirror 5 is partially defined by a cubic curve 21 from the middle of a single radius curve 20 near the north pole NP on the meridian ME. Several reference points 22a are obtained on the single radius curve 20, and several reference points 22b are obtained on the cubic curve 21, and these reference points (the reference points 22a and 22b are combined). The point 5) is rotationally moved along the outer peripheral surface of the sphere GL with the axis Y as the rotation axis, and as shown in FIG. 7B, the curved surface 5a is approximated by a point group 23 including reference points 22a and 22b. . In FIG. 7A and FIG. 7B, a circle C1 indicates a rotation trajectory at a predetermined point in the reference point 23b. Further, FIG. 8 shows a situation in which the reference points 22a and 22b for search created by this method are displayed. The point group 23 includes a reference point 22a on a curved surface having a single radius and a reference point 22b on a gradually changing curved surface. The boundary between the single radius curved surface and the gradually changing curved surface is indicated by an arc. In the present embodiment, the reference points 22a and 22b are arranged near the north pole NP and rotated. However, the reference points 22a and 22b can be arranged and rotated at other positions.

(探索方法)
次に、探索方法を図9乃至図13を用いて説明する。まず、図9に示すように、背景(スクリーン4上)のドットPm(ドット12)が理論曲面上に写影される位置Ptは、その写影位置Ptの法線ベクトル(以下、ベクトルは下線を引いて表示する)が、写影位置PtとドットPmとを結ぶベクトルPtPmと、写影位置Ptとレンズ6a中心の位置Pcとを結ぶベクトルPtPcとのなす角αを二等分することは、公知の事実である。換言すれば、ベクトルPtPmと法線ベクトルとのなす角βは、ベクトルPtPmと法線ベクトルとのなす角βに等しい。このような条件下では、ベクトルPtPmPtPcとのなす角を二等分する単位ベクトルと写影位置Ptの単位法線ベクトルとは等しくなるので、単位ベクトルと単位法線ベクトルとの差は「0」である。そこで、探索を以下の手順で行った。
(1)図10に示すように、ミラー5の曲面5aを近似表現した点群中の各基準点Pt(iは整数)について、曲面の基本式より、全点の単位法線ベクトル (iは整数)のデータをあらかじめ理論的に算出しておく。
(2)次に、背景のスクリーン4上に描かれたドットPm(iは整数)、カメラのレンズ中心の位置Pc、曲面上の所定の位置Pt(iは整数)の各点を結ぶ二つのベクトル(PtPm (iは整数)とPt Pc(iは整数))がなす角を二等分する単位ベクトル (iは整数)と、上記(1)で予め算出した単位法線ベクトル (iは整数)との差が最小になる点を理論的に算出する。本実施例では、図11に示すように、まず、スクリーン4上のレンズ挿通孔4aに近い位置に配置された基準点Pmについて、曲面上の全点Ptに対して上記演算を行い、単位ベクトルと単位法線ベクトルとの差を比較し、単位ベクトルと単位法線ベクトルとの差が最小となる基準点を求める。このようにして理論的に求められた点をPaとする。点Paは、本実施例では、図11に示すように、Pt11と同位置の点である。
(3)次に、図12に示すように、求められた点Paに隣接する周囲の8点を基に各中間点(図12における16個の白点)を求める。
(4)そして、求められた16個の中間点と、もとの点(図12における9個の黒点)との合計25個の基準点から、それらの25個の基準点の単位法線ベクトルと、上記した背景のドットPm、カメラのレンズ中心の位置Pc、前記25個の各基準点を結ぶ二つのベクトルがなす角を二等分する単位ベクトルとの差が最小の基準点を求め、この基準点を点Pbとする。ここで、もとの点(図12における9個の黒点)の単位法線ベクトルのデータは、上記(1)で予め算出されているので、16個の中間点(Ptw(i=1〜16))の単位法線ベクトルnw (i=1〜16)を新たに求めておく必要がある。本実施例では、図12に示すように、単位法線ベクトルnw を有する点Ptwが、点Pbである。
(5)さらに、求められた点PbをPaとして(3)に戻って処理を繰り返す。具体的には、図13に示すように、上記(4)で求めた点Pb(Paに置き換える)に隣接する周囲の8点を基に各中間点(図13の二点鎖線枠内における16個の白点)を求め、求められた16個の中間点と、もとの点(図13の二点鎖線枠内における9個の黒点)との合計25個の点から、それらの単位法線ベクトルと、上記した背景のドットPm、カメラのレンズ中心の位置Pc、前記曲面上の25個の基準点の位置の各点を結ぶ二つのベクトルがなす角を二等分する単位ベクトルと求められた点の単位法線ベクトルとの差が、最小となる基準点を求める。ここで、もとの点(図13の二点鎖線枠内における9個の黒点)の単位法線ベクトルのデータは、上記(4)で既に算出されているので、16個の中間点(図13の二点鎖線枠内の16個の白丸)の単位法線ベクトルを新たに求めておく必要がある。
(6)上記(3)〜(6)の探索を、探索範囲を狭めながら繰り返し行い、基準点Pmが理論的にミラー曲面5aに写像されるべき位置を近似的に求めることができる。尚、上記(3)〜(6)の演算において、単位ベクトルと単位法線ベクトルとの差が、所定範囲内に収まった場合には、単位ベクトルと単位法線ベクトルとが一致したとみなして探索を終了する。
(7)このようにして、スクリーン4上の全てのドットPm(iは整数)について探索範囲を狭めながら繰り返し探索を行うことにより、ドットPmが理論曲面5a上に写影される位置を、全て近似的に求めることができる。
(Search method)
Next, the search method will be described with reference to FIGS. First, as shown in FIG. 9, the position Pt at which the dot Pm (dot 12) of the background (on the screen 4) is projected onto the theoretical curved surface is the normal vector n (hereinafter, the vector is The angle α formed by the vector PtPm connecting the projection position Pt and the dot Pm and the vector PtPc connecting the projection position Pt and the center position Pc of the lens 6a is bisected. Is a known fact. In other words, the β angle between vector PtPm and the normal vector n, is equal to β the angle between the vector PtPm and the normal vector n. Under such conditions, the unit vector that bisects the angle formed by the vectors PtPm and PtPc is equal to the unit normal vector at the projection position Pt, so the difference between the unit vector and the unit normal vector is “ 0 ". Therefore, the search was performed according to the following procedure.
(1) As shown in FIG. 10, with respect to each reference point Pt i (i is an integer) in the point group that approximates the curved surface 5a of the mirror 5, the unit normal vector n i of all points is obtained from the basic equation of the curved surface. (I is an integer) data is theoretically calculated in advance.
(2) Next, the dots Pm i (i is an integer) drawn on the background screen 4, the camera lens center position Pc, and a predetermined position Pt i (i is an integer) on the curved surface are connected. A unit vector N i (i is an integer) that bisects an angle formed by two vectors ( PtPm i (i is an integer) and Pt i Pc (i is an integer)), and the unit method calculated in advance in (1) above The point where the difference from the line vector n i (i is an integer) is minimized is theoretically calculated. In this embodiment, as shown in FIG. 11, first, the lens insertion hole 4a reference point Pm 1, which is located closer to the on screen 4, perform the above calculation for all the points Pt i on the curved surface, The difference between the unit vector and the unit normal vector is compared, and a reference point that minimizes the difference between the unit vector and the unit normal vector is obtained. The point theoretically obtained in this way is defined as Pa. In this embodiment, the point Pa is a point at the same position as Pt 11 as shown in FIG.
(3) Next, as shown in FIG. 12, each intermediate point (16 white points in FIG. 12) is obtained based on the surrounding eight points adjacent to the obtained point Pa.
(4) Then, from the total of 25 reference points of the obtained 16 intermediate points and the original point (9 black points in FIG. 12), unit normal vectors of these 25 reference points And a reference point having a minimum difference between the above-described background dot Pm 1 , the position Pc of the camera lens center, and the unit vector that bisects the angle formed by the two vectors connecting the 25 reference points. This reference point is defined as a point Pb. Here, since the unit normal vector data of the original point (9 black points in FIG. 12) is calculated in advance in the above (1), there are 16 intermediate points (Ptw i (i = 1 to 1)). It is necessary to newly obtain the unit normal vector nw i (i = 1 to 16) of 16)). In this embodiment, as shown in FIG. 12, the PTW 5 that it has a unit normal vector nw 5, a point Pb.
(5) Further, the obtained point Pb is set as Pa, and the process returns to (3) to repeat the process. Specifically, as shown in FIG. 13, each intermediate point (16 in the two-dot chain line frame in FIG. 13) is based on the surrounding eight points adjacent to the point Pb (replaced by Pa) obtained in (4) above. White points), and from the total of 25 points including the obtained 16 intermediate points and the original points (9 black dots in the two-dot chain line frame in FIG. 13), the unit method A unit vector that bisects the angle formed by the two vectors connecting the line vector, the background dot Pm 1 , the camera lens center position Pc, and the 25 reference point positions on the curved surface; A reference point having a minimum difference between the obtained point and the unit normal vector is obtained. Here, since the unit normal vector data of the original point (9 black dots in the two-dot chain line in FIG. 13) has already been calculated in the above (4), 16 intermediate points (see FIG. It is necessary to newly obtain a unit normal vector (16 white circles in 13 two-dot chain lines).
(6) the search for the (3) to (6), repeated while narrowing the search range, the reference points Pm 1 is a position to be mapped to the theoretically mirror curved surface 5a can be determined approximately. In the above operations (3) to (6), if the difference between the unit vector and the unit normal vector is within a predetermined range, it is considered that the unit vector and the unit normal vector match. End the search.
(7) In this way, by repeatedly searching for all the dots Pm i (i is an integer) on the screen 4 while narrowing the search range, the positions where the dots Pm i are mapped onto the theoretical curved surface 5a are determined. , All can be obtained approximately.

(写像を求める)
そして、曲面上の写影位置が求められた後、この状況を一枚の写真にした場合のドットの位置を求めることができる。このとき、図14に示すように曲面形状の頂点をXY平面の原点に置き、曲面上のドットの写影位置がXY平面のどの位置に映るのかを求めれば良い。このとき、曲面上に写影されたドットの位置Ptとカメラのレンズ中心の位置Pcとを結ぶ線分と、XY平面との交点位置Pfが、その求める位置となる。図15は、算出された曲面上のドットの写影位置Ptを示す平面図であり、図16は、図15の曲面上の点Ptがカメラのフィルムに写像された際の位置Pfを示す平面図であり、このドットPfを示す位置データが、反射像理論データである。
(Request map)
Then, after the projection position on the curved surface is obtained, the position of the dot when this situation is made a single photograph can be obtained. At this time, as shown in FIG. 14, the vertex of the curved surface shape is placed at the origin of the XY plane, and the position of the projected position of the dot on the curved surface on the XY plane may be obtained. At this time, the intersection position Pf between the line segment connecting the dot position Pt projected on the curved surface and the camera lens center position Pc and the XY plane is the position to be obtained. FIG. 15 is a plan view showing the calculated dot projection position Pt on the curved surface, and FIG. 16 is a plane showing the position Pf when the point Pt on the curved surface in FIG. 15 is mapped to the camera film. The position data indicating the dot Pf is reflection image theory data.

このように構成されたソフトウェアを用いて反射像理論データを算出し、予めパソコンに参照テーブルとして記憶させ、検査時にこの参照テーブルの反射像理論データと反射像実測データとを比較すればよい。以上のような、曲面上の各点法線ベクトルと、背景の所定模様とカメラの位置とからなるベクトル方向を比較して所定模様が写り込む位置を探索する手法は、非常にユニークであり、高速な計算処理を実現することができる。   The reflected image theoretical data is calculated using the software configured as described above, stored in advance as a reference table in a personal computer, and the reflected image theoretical data in the reference table and the reflected image actual measurement data are compared at the time of inspection. The method of searching for the position where the predetermined pattern is reflected by comparing the vector direction consisting of each point normal vector on the curved surface and the predetermined pattern of the background and the position of the camera as described above is very unique, High-speed calculation processing can be realized.

本発明に係る歪み測定装置の一実施例を平面から見た模式図である。It is the schematic diagram which looked at one Example of the distortion measuring apparatus which concerns on this invention from the plane. 本発明に係る歪み測定装置の一実施例を正面から見た模式図である。It is the schematic diagram which looked at one Example of the distortion measuring apparatus which concerns on this invention from the front. スクリーンの平面図である。It is a top view of a screen. 検査対象のミラーに図3のスクリーンが写っている状態を示す説明図である。It is explanatory drawing which shows the state in which the screen of FIG. 3 is reflected in the mirror to be examined. 検査の緩急を領域によって分ける場合の説明図である。It is explanatory drawing in the case of classifying the speed of inspection by area. 理論データのドット分布と実測データのドット分布の比較による良否判定のイメージ図である。It is an image figure of the quality determination by comparison of the dot distribution of theoretical data and the dot distribution of measured data. 理論曲面を三次曲線を用いて点群で表示した際の概念図である。It is a conceptual diagram at the time of displaying a theoretical curved surface with a point cloud using a cubic curve. 探索のための基準点を表示した状況を示す説明図である。It is explanatory drawing which shows the condition which displayed the reference point for a search. 探索方法の概念を示す説明図である。It is explanatory drawing which shows the concept of the search method. 探索方法の概念を示す説明図である。It is explanatory drawing which shows the concept of the search method. 探索方法の概念を示す説明図である。It is explanatory drawing which shows the concept of the search method. 探索方法の概念を示す説明図である。It is explanatory drawing which shows the concept of the search method. 探索方法の概念を示す説明図である。It is explanatory drawing which shows the concept of the search method. 写像位置の算出方法の概念を示す説明図である。It is explanatory drawing which shows the concept of the calculation method of a mapping position. 算出された曲面上のドットの写影位置を示す平面図である。It is a top view which shows the projection position of the dot on the calculated curved surface. 図15を平面写真上に変換して写影した平面図である。FIG. 16 is a plan view obtained by converting FIG. 15 onto a plane photograph and projecting it.

符号の説明Explanation of symbols

1 歪み測定装置
2 ミラー搬入部
3 検査部
4 スクリーン
4a レンズ挿通孔
5 ミラー
5a 曲面
6 カメラ
6a レンズ
7 照明装置
8 ミラー搬出部
9 インデックス
10 ステージ
11 パソコン
12 ドット
20 単一半径の曲線
21 三次曲線
22a 単一半径の曲線から求めた基準点
22b 三次曲線から求めた基準点
23 点群
DESCRIPTION OF SYMBOLS 1 Distortion measuring apparatus 2 Mirror carrying-in part 3 Inspection part 4 Screen 4a Lens insertion hole 5 Mirror 5a Curved surface 6 Camera 6a Lens 7 Illuminating device 8 Mirror carrying-out part 9 Index 10 Stage 11 Personal computer 12 Dot 20 Single radius curve 21 Tertiary curve 22a Reference point 22b obtained from a single radius curve 23b Reference point 23b obtained from a cubic curve

Claims (6)

検査対象の反射面に所定の模様を反射させて得られる反射像実測データと、
前記検査対象の反射面を形成するために用いた設計値を基に所定のソフトウェアを用いて演算して求めた前記所定模様の反射像理論データとを比較することにより前記検査対象の反射面の歪みを測定することを特徴とする歪み測定方法。
Reflected image actual measurement data obtained by reflecting a predetermined pattern on the reflection surface to be inspected,
By comparing the reflection image theoretical data of the predetermined pattern calculated by using predetermined software based on the design value used to form the reflection surface of the inspection target, Distortion measuring method characterized by measuring distortion.
前記所定模様は均等に配列したドットからなる模様であり、反射像実測データのドットの位置と反射像理論データのドットの位置とを比較して前記検査対象の反射面の歪みを測定することを特徴とする請求項1記載の歪み測定方法。   The predetermined pattern is a pattern composed of uniformly arranged dots, and the distortion of the reflection surface to be inspected is measured by comparing the positions of the dots of the reflection image actual measurement data and the dots of the reflection image theoretical data. The distortion measuring method according to claim 1, wherein: 前記ソフトウェアが、
前記検査対象物の反射面の理論曲面の形状を所定の三次曲線で定義するステップと、
前記三次曲線を用いて求められた所定数の基準点を用いて、前記反射面の理論曲面を点群で近似するステップと、
前記点群中の基準点の単位法線ベクトルを求めるステップと、
前記所定模様の位置データと、前記理論曲面上の点群中の基準点の位置データと、前記反射面で反射した前記所定模様が写像されるカメラの位置データとから、前記基準点と前記所定模様を結ぶベクトルと、前記基準点と前記カメラを結ぶベクトルとを算出し、前記基準点と前記所定模様を結ぶベクトルと、前記基準点と前記カメラを結ぶベクトルとのなす角を二等分する単位ベクトルを算出するステップと、
該単位ベクトルと、前記点群中の基準点の単位法線ベクトルとの差が最小になる点を探索して求めるステップとを備えたことを特徴とする請求項1又は請求項2記載の歪み測定方法。
The software is
Defining the shape of the theoretical curved surface of the reflecting surface of the inspection object with a predetermined cubic curve;
Approximating the theoretical curved surface of the reflecting surface with a point group using a predetermined number of reference points determined using the cubic curve;
Obtaining a unit normal vector of a reference point in the point cloud;
From the position data of the predetermined pattern, the position data of the reference point in the point group on the theoretical curved surface, and the position data of the camera to which the predetermined pattern reflected by the reflecting surface is mapped, the reference point and the predetermined pattern Calculate a vector connecting a pattern, a vector connecting the reference point and the camera, and bisect an angle formed by a vector connecting the reference point and the predetermined pattern and a vector connecting the reference point and the camera Calculating a unit vector;
3. The distortion according to claim 1, further comprising a step of searching for and finding a point at which a difference between the unit vector and a unit normal vector of a reference point in the point group is minimized. Measuring method.
検査対象の反射面に所定模様を反射させて反射像実測データを得る手段と、
該反射像実測データと、前記検査対象の反射面を形成するために用いた設計値を基に所定のソフトウェアを用いて演算して求めた所定模様の反射像理論データとを比較する比較手段とを備えたことを特徴とする歪み測定装置。
Means for reflecting a predetermined pattern on the reflection surface to be inspected to obtain reflected image measurement data;
Comparison means for comparing the reflected image actual measurement data with the reflected image theoretical data of a predetermined pattern obtained by calculation using predetermined software based on the design value used for forming the reflection surface to be inspected. A distortion measuring device comprising:
前記所定模様は均等に配列したドットからなる模様であり、反射像実測データのドットの位置と反射像理論データのドットの位置を測定する測定手段を備えたことを特徴とする請求項4記載の歪み測定装置。   5. The predetermined pattern according to claim 4, wherein the predetermined pattern is a pattern composed of uniformly arranged dots, and comprises a measuring means for measuring the positions of the dots of the reflected image actual measurement data and the dots of the reflected image theoretical data. Strain measuring device. 前記ソフトウェアが、
前記検査対象物の反射面の理論曲面の形状を所定の三次曲線で定義する手段と、
前記三次曲線を用いて求められた所定数の基準点を用いて、前記反射面の理論曲面を点群で近似する手段と、
前記点群中の基準点の単位法線ベクトルを求める手段と、
前記所定模様の位置データと、前記理論曲面上の点群中の基準点の位置データと、前記反射面で反射した前記所定模様が写像されるカメラの位置データとから、前記基準点と前記所定模様を結ぶベクトルと、前記基準点と前記カメラを結ぶベクトルとを算出し、前記基準点と前記所定模様を結ぶベクトルと、前記基準点と前記カメラを結ぶベクトルとのなす角を二等分する単位ベクトルを算出する手段と、
該単位ベクトルと、前記点群中の基準点の単位法線ベクトルとの差が最小になる点を探索して求める手段とを備えたことを特徴とする請求項4又は請求項5記載の歪み測定装置。
The software is
Means for defining the shape of the theoretical curved surface of the reflecting surface of the inspection object by a predetermined cubic curve;
Means for approximating the theoretical curved surface of the reflecting surface with a point group using a predetermined number of reference points determined using the cubic curve;
Means for determining a unit normal vector of a reference point in the point cloud;
From the position data of the predetermined pattern, the position data of the reference point in the point group on the theoretical curved surface, and the position data of the camera to which the predetermined pattern reflected by the reflecting surface is mapped, the reference point and the predetermined pattern Calculate a vector connecting a pattern, a vector connecting the reference point and the camera, and bisect an angle formed by a vector connecting the reference point and the predetermined pattern and a vector connecting the reference point and the camera Means for calculating a unit vector;
6. The distortion according to claim 4, further comprising means for searching for and finding a point at which a difference between the unit vector and a unit normal vector of a reference point in the point group is minimized. measuring device.
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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008149712A1 (en) * 2007-06-01 2008-12-11 University Of Miyazaki Distortion inspecting apparatus and distortion inspecting method
JP2009236754A (en) * 2008-03-27 2009-10-15 Fukuoka Prefecture Distortion measurement method, and distortion measurement system
JP2011203241A (en) * 2010-03-25 2011-10-13 Mitsubishi Electric Research Laboratories Inc Method for reconstructing surface of specular object from low-density reflection correspondence
JP2013508714A (en) * 2009-10-21 2013-03-07 サン−ゴバン グラス フランス How to analyze the quality of glazing units
CN111025701A (en) * 2019-12-30 2020-04-17 凌云光技术集团有限责任公司 Curved surface liquid crystal screen detection method

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62293133A (en) * 1986-06-12 1987-12-19 Tokai Rika Co Ltd Mirror distortion measuring instrument
JPH0783624A (en) * 1993-09-10 1995-03-28 Idemitsu Material Kk Measurement method and device for strain of molding stamper
JPH09222313A (en) * 1996-02-19 1997-08-26 Mitsubishi Automob Eng Co Ltd Method and device for measuring distortion of mirror surface with gradually changing curvature of complex curved-surface mirror
JP2000111326A (en) * 1999-11-17 2000-04-18 Mazda Motor Corp Screen for inspecting state of surface and inspecting apparatus and inspecting method using the screen
WO2002042715A1 (en) * 2000-11-22 2002-05-30 Saint-Gobain Glass France Method and device for analysing the surface of a substrate
JP2003097931A (en) * 2001-09-21 2003-04-03 Olympus Optical Co Ltd Method and device for optical inspection

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62293133A (en) * 1986-06-12 1987-12-19 Tokai Rika Co Ltd Mirror distortion measuring instrument
JPH0783624A (en) * 1993-09-10 1995-03-28 Idemitsu Material Kk Measurement method and device for strain of molding stamper
JPH09222313A (en) * 1996-02-19 1997-08-26 Mitsubishi Automob Eng Co Ltd Method and device for measuring distortion of mirror surface with gradually changing curvature of complex curved-surface mirror
JP2000111326A (en) * 1999-11-17 2000-04-18 Mazda Motor Corp Screen for inspecting state of surface and inspecting apparatus and inspecting method using the screen
WO2002042715A1 (en) * 2000-11-22 2002-05-30 Saint-Gobain Glass France Method and device for analysing the surface of a substrate
JP2004514882A (en) * 2000-11-22 2004-05-20 サン−ゴバン グラス フランス Method and apparatus for scanning substrate surface
JP2003097931A (en) * 2001-09-21 2003-04-03 Olympus Optical Co Ltd Method and device for optical inspection

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008149712A1 (en) * 2007-06-01 2008-12-11 University Of Miyazaki Distortion inspecting apparatus and distortion inspecting method
JPWO2008149712A1 (en) * 2007-06-01 2010-08-26 国立大学法人 宮崎大学 Strain inspection apparatus and strain inspection method
US8553082B2 (en) 2007-06-01 2013-10-08 University Of Miyazaki Distortion inspecting apparatus and distortion inspecting method
JP2009236754A (en) * 2008-03-27 2009-10-15 Fukuoka Prefecture Distortion measurement method, and distortion measurement system
JP2013508714A (en) * 2009-10-21 2013-03-07 サン−ゴバン グラス フランス How to analyze the quality of glazing units
JP2011203241A (en) * 2010-03-25 2011-10-13 Mitsubishi Electric Research Laboratories Inc Method for reconstructing surface of specular object from low-density reflection correspondence
CN111025701A (en) * 2019-12-30 2020-04-17 凌云光技术集团有限责任公司 Curved surface liquid crystal screen detection method
CN111025701B (en) * 2019-12-30 2022-06-07 凌云光技术股份有限公司 Curved surface liquid crystal screen detection method

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