JP2005340663A - Capacitor - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a capacitor for reinforcing the adhesion strength of an external electrode by increasing an area for connecting a dummy electrode to the external electrode. <P>SOLUTION: In the capacitor, an internal electrode layer 2 is interposed between adjacent dielectric layers inside a laminate 1 in which a plurality of dielectric layers are laminated, an arc-shaped chamfering section is formed at the corner section between the side and main surface of the laminate 1, and the external electrode 3 connected to one end of the internal electrode layer 2 is deposited from the side to the main surface of the laminate 1. In the capacitor, the dummy electrode 5 for annularly exposing the outer-periphery section 6 is interposed at the chamfering section of the laminate 1, or from the chamfering section to the main surface between the dielectric layers positioned near the main surface of the laminate 1, and the external electrode 3 is connected to the entire exposed section of the dummy electrode 5. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to a capacitor used in a high-density integrated circuit such as a multi-layer monolithic ceramic capacitor.

  Conventionally, capacitors such as multi-layer monolithic ceramic capacitors have been used in high-density integrated circuits.

  Such a capacitor has, for example, an internal electrode layer interposed between adjacent dielectric layers in a multilayer body formed by laminating a plurality of dielectric layers, and an angle between a side surface and a main surface of the multilayer body. A chamfered portion having a circular arc cross section is formed in the portion, and an external electrode connected to one end of the internal electrode layer is attached from the side surface to the main surface of the laminate (for example, known) Patent Document 1).

  In the conventional capacitor described above, a dummy electrode connected to the external electrode is interposed between the dielectric layers located in the vicinity of the main surface of the multilayer body, and the coupling between the multilayer body and the external electrode is increased by increasing the bond between the metals. It is trying to strengthen the adhesive strength.

In addition, as a method of forming the external electrode of the capacitor, an electroless plating film is deposited starting from one end of the internal electrode layer and one end of the dummy electrode led to the surface of the multilayer body, and the electroless plating film is formed on the multilayer body. A method of continuously forming the side surface is known (see, for example, Patent Document 2).
JP-A-9-129476 Japanese Patent Laid-Open No. 2004-40085

  However, in the conventional capacitor, since the internal electrode layer is not led out to the main surface of the multilayer body, the adhesive strength of the external electrode on the main surface of the multilayer body is weaker than the adhesive strength on the side surface.

  In particular, when the external electrode includes an electroless plating film, it is difficult to strengthen the bond between the dielectric layer and the external electrode. Therefore, the adhesion strength of the external electrode on the main surface of the laminate is Since there is no connection with the electrode layer, it becomes very weak, and the adhesive strength when mounted on the circuit board via solder or the like is insufficient.

  The present invention has been devised in view of the above-described problems, and an object thereof is to provide a capacitor in which the area for connecting the dummy electrode and the external electrode is increased and the adhesive strength of the external electrode is increased. .

  In the capacitor of the present invention, an internal electrode layer is interposed between adjacent dielectric layers inside a laminate formed by laminating a plurality of dielectric layers, and an angle between the side surface of the laminate and the main surface is set. In a capacitor in which a curved chamfered portion is formed in a part and an external electrode connected to one end of the internal electrode layer is attached from the side surface to the main surface of the multilayer body, the capacitor is positioned near the main surface of the multilayer body. A dummy electrode having an outer peripheral portion exposed annularly from the chamfered portion or the chamfered portion to the main surface of the laminate, and the external electrode connected to the entire exposed portion of the dummy electrode. It is characterized by.

  In the capacitor of the present invention, the external electrode includes an electroless plating film deposited from one end of the internal electrode layer led to the surface of the laminate and the outer periphery of the dummy electrode. The electroless plating film is formed continuously from the side surface to the main surface of the laminate.

  Furthermore, in the capacitor of the present invention, the dielectric layers and the dummy electrodes are alternately laminated in the vicinity of the main surface of the multilayer body, and the outer peripheral portion of the dummy electrodes forms an annual ring shape on the surface of the multilayer body. It is exposed to.

Furthermore, in the capacitor of the present invention, the thickness T _{1 of the} dummy electrode in the stacking direction of the stacked body and the exposed width W _{1 of the} dummy electrode exposed at the chamfered portion of the stacked body are “W ₁ > T ₁ ”. It is set to satisfy the relational expression of

Furthermore, in the capacitor of the present invention, the exposed width W _{1 of the} dummy electrode and the derived width W ₂ of the internal electrode layer derived on the side surface of the multilayer body satisfy the relational expression “W ₁ > W ₂ ”. It is characterized by being set to.

Furthermore, in the capacitor according to the present invention, the dielectric layers and the dummy electrodes are alternately stacked in the vicinity of the main surface of the multilayer body, and adjacent to the surface of the multilayer body in the longitudinal section of the multilayer body. the relationship between the shortest distance D ₂ between the ends of the internal electrode layers adjacent derived the shortest distance D ₁ of the between the ends of the dummy electrodes on the same side of the stack "D 1 _{<D 2"} It is set so that it may satisfy | fill.

  According to the capacitor of the present invention, between the dielectric layers located in the vicinity of the main surface of the multilayer body, a chamfered portion of the multilayer body, or a dummy electrode having an outer peripheral portion exposed annularly from the chamfered portion to the main surface, Since the external electrode is connected over the entire exposed portion of the dummy electrode, the annularly exposed dummy electrode increases the area for connecting the dummy electrode and the external electrode, so that the adhesive strength of the external electrode can be increased.

  Further, according to the capacitor of the present invention, the external electrode is formed including an electroless plating film deposited from one end of the internal electrode layer led to the surface of the laminate and the outer periphery of the dummy electrode, Since the electroless plating film is continuously formed from the side surface to the main surface of the laminate, the external electrode can be formed with high precision, and the bonding between the metals on the portion where the external electrode is attached increases, and the external electrode The adhesive strength of the can be increased.

  Furthermore, according to the capacitor of the present invention, the dielectric layers and the dummy electrodes are alternately laminated in the vicinity of the main surface of the multilayer body so that the outer peripheral portion of the dummy electrodes forms an annual ring shape on the surface of the multilayer body. Since it is exposed, the area where the outer peripheral portion of the dummy electrode is connected to the external electrode is efficiently increased, so that the adhesive strength of the external electrode can be further increased.

Furthermore, according to the capacitor of the present invention, the thickness T _{1 of the} dummy electrode in the stacking direction of the stacked body and the exposed width W _{1 of the} dummy electrode exposed at the chamfered portion of the stacked body are “W ₁ > T ₁ ”. Since the area for connecting the dummy electrode and the external electrode is increased, the adhesive strength of the external electrode can be increased.

Furthermore, the capacitor of the present invention is set so that the exposed width W ₁ of the dummy electrode and the derived width W ₂ of the internal electrode layer derived on the side surface of the multilayer body satisfy the relational expression “W ₁ > W ₂ ”. As a result, the area where the dummy electrode and the external electrode are connected increases in the vicinity of the main surface of the laminate, so that the adhesive strength when mounted on the circuit board via solder or the like is increased.

Furthermore, in the capacitor of the present invention, dielectric layers and dummy electrodes are alternately laminated in the vicinity of the main surface of the multilayer body, and the end of the adjacent dummy electrode led to the surface of the multilayer body in the longitudinal section of the multilayer body. the shortest distance D ₂ between the ends of the internal electrode layers "D 1 _{<D 2"} is set so as to satisfy the relational expression of an adjacent derived on the same side of the minimum distance D ₁ and the laminate between parts As a result, the area for connecting the dummy electrode and the external electrode increases in the vicinity of the main surface of the laminate, so that the adhesive strength when mounted on the circuit board via solder or the like is increased.

  Hereinafter, the present invention will be described in detail with reference to the accompanying drawings.

  These are the top views which looked at the capacitor | condenser concerning one Embodiment of this invention from upper direction, FIG. 2 is the sectional drawing. In the capacitor shown in the figure, an internal electrode layer 2 is interposed in a laminated body 1 formed by laminating a plurality of dielectric layers, and an external electrode 3 is deposited from the side surface to the main surface of the laminated body 1. It has a structure.

The dielectric layer constituting the multilayer body 1 is made of, for example, a dielectric material having a high dielectric constant mainly composed of BaTiO ₃ , CaTiO ₃ , SrTiO _3, etc., and has a thickness of, for example, 1 μm to 1 layer. Set to 3 μm. Further, the number of laminated dielectric layers in the laminated body 1 is set to 20 to 2000 layers, for example.

  In addition, a chamfered portion having an arcuate cross section is formed at a corner portion between the side surface and the main surface of the laminate 1 so as not to cause defects such as chipping. The radius of the arc of the chamfered portion is set to 30 to 80 μm, for example.

  The internal electrode layer 2 is interposed between adjacent dielectric layers inside the multilayer body 1, and as the material, for example, a conductive material mainly composed of a metal such as Ni, Cu, Cu—Ni, Ag—Pd is used. The thickness is set to 0.5 μm to 2 μm, for example. The pair of internal electrode layers 2 facing each other through the dielectric layer has a capacitance formed in the facing region, and one end thereof is led out to a different side surface of the laminate 1. In the capacitor of this embodiment, the pair of internal electrode layers 2 facing each other through the dielectric layer are led out to the facing side surfaces.

  The external electrode 3 deposited from the side surface to the main surface of the multilayer body 1 is made of, for example, a conductor material such as Cu having low conductivity and not easily eroded by solder, and the thickness thereof is set to 5 to 10 μm, for example. The The external electrode 3 is connected to one end of the internal electrode layer 2 led out to the side surface, and is electrically connected to a capacitance formed inside the stacked body 1. In the capacitor according to the present embodiment, the surface of the external electrode 3 has a solder material layer 4 such as solder or Sn (not shown in FIG. ) Is formed. The brazing material layer 4 is set to a thickness of 4 to 5 μm, for example.

  FIG. 3 is a plan view in which the external electrode 3 is removed from the capacitor of this embodiment. A plurality of dummy electrodes 5 that are less involved in the formation of capacitance are formed between the dielectric layers located in the vicinity of the main surface of the multilayer body 1, and the chamfered portion of the multilayer body 1, or the outer peripheral portion from the chamfered portion to the main surface A dummy electrode 5 having an annularly exposed 6 is interposed, and the external electrode 3 is connected over the entire exposed portion of the dummy electrode 5. The outer peripheral portion 6 of the dummy electrode 5 exposed in an annular shape increases the area for connecting the dummy electrode 5 and the external electrode 3, so that the adhesion strength of the external electrode 3 when mounted on the circuit board via solder or the like is increased. be able to.

  In the capacitor of this embodiment, as shown in FIG. 3, dielectric layers and dummy electrodes 5 are alternately stacked in the vicinity of the main surface of the multilayer body 1, and the outer peripheral portion 6 of these dummy electrodes 5 is The surface of the laminate 1 is exposed so as to form an annual ring. Since the area where the outer peripheral portion 6 of the dummy electrode 5 and the external electrode 3 are connected efficiently increases, the adhesive strength of the external electrode 3 can be further increased.

FIG. 4 shows a partially enlarged view of FIG. As shown in FIG. 4, the thickness T ₁ of the dummy electrode 5 in the stacking direction of the stacked body 1 and the exposed width W ₁ of the dummy electrode 3 exposed at the chamfered portion of the stacked body 1 are “W ₁ > T _1. "Is set to satisfy the relational expression". " In the capacitor of the present embodiment, for example, when the thickness T ₁ of the dummy electrode 5 according to the laminating direction of the multilayer body 1 is 1.2 [mu] m, the exposed width W ₁ of the dummy electrode 3 which is exposed to the chamfered portion of the laminated body 1 Was set to 1.5 to 3 μm. Thereby, since the area which connects the dummy electrode 5 and the external electrode 3 increases, the adhesive strength of the external electrode 3 can be made higher. Furthermore, in the capacitor of the present embodiment, the exposed portion W ₁ is made wider as it approaches the main surface side of the multilayer body 1.

On the other hand, the exposed width W ₁ of the dummy electrode 5 and the derived width W ₂ of the internal electrode layer 2 derived on the side surface of the multilayer body 1 are set so as to satisfy the relational expression “W ₁ > W ₂ ”. . In the capacitor of the present embodiment, for example, the derived width W ₂ of the internal electrode layer 2 derived on the side surface of the multilayer body 1 is set to 1.2 μm, which is substantially the same as the thickness of the internal electrode layer 2. exposed width _{W 1} of the dummy electrode 3 was set to 1.5～3Myuemu. This also increases the area where the dummy electrode 5 and the external electrode 3 are connected in the vicinity of the main surface of the laminate 1, thereby further increasing the adhesive strength.

Furthermore, dielectric layers and dummy electrodes 5 are alternately stacked in the vicinity of the main surface of the stacked body 1, and end portions of adjacent dummy electrodes 5 led out to the surface of the stacked body 1 in the longitudinal section of the stacked body 1. the shortest distance D ₂ between the ends of the internal electrode layer 2 adjacent to the shortest distance derived D ₁ and on the same side of the stack 1 between are set to satisfy the relationship of "D 1 _{<D 2"} The This also increases the area where the dummy electrode 5 and the external electrode 3 are connected in the vicinity of the main surface of the laminate 1, so that the adhesive strength when mounted on the circuit board via solder or the like is increased. In the capacitor according to the present embodiment, one dielectric layer is interposed between the end portions of the dummy electrode 5, whereas two dielectric layers are interposed between the end portions of the internal electrode layer 2. It was made to be.

  The capacitor of this embodiment is manufactured by the following manufacturing method.

First, a slurry-like ceramic slurry is prepared by adding and mixing a suitable organic solvent, glass frit, organic binder, etc. to a dielectric material powder mainly composed of BaTiO ₃ , CaTiO ₃ , SrTiO _3, etc. A ceramic green sheet having a predetermined shape and a predetermined thickness is formed from the ceramic slurry using a conventionally known doctor blade method, and Ni, Cu, Cu-Ni, Ag are formed on the main surface of the obtained ceramic green sheet. -Conductor paste obtained by adding and mixing a suitable organic solvent, organic binder, etc. to a powder of a metal material such as Pd in a predetermined pattern by screen printing or the like known in the past, and a conductor pattern and dummy serving as a capacitance forming electrode A conductor pattern to be a conductor is formed. The conductor pattern may be formed by depositing and transferring a film formed using an electroforming method such as plating of a predetermined pattern.

  Next, a predetermined number of ceramic green sheets on which conductor patterns are formed are laminated on a support base, and a large laminate is formed by pressurizing and heating the laminated conductor patterns and ceramic green sheets. A green laminate block is formed by cutting the body into predetermined dimensions.

  And the obtained unbaked laminated body is baked at a temperature of, for example, 1100 ° C. to 1400 ° C., and the obtained laminated block is further chamfered at the corners of the side surface and the main surface by barrel polishing, etc. Starting from one end of the internal electrode layer 2 and the dummy electrode 5 exposed on the surface of the laminated body 1, a Cu electroless plating film is deposited until it is continuously formed from the side surface to the main surface of the laminated body 1. Thus, the external electrode 3 is deposited and formed.

In the capacitor of this embodiment, the dummy electrode 5 is interposed at the corner between the side surface and the main surface of the multilayer body 1, and when the barrel polishing is performed, the dummy electrode 5 is removed from the chamfered portion or the chamfered portion of the multilayer body 1. The dummy electrode 5 is exposed over the main surface. In addition, since the dielectric layer is made of BaTiO ₃ or the like, it is easier to scrape than the dummy electrode 5 made of Ni or the like, so that the outer peripheral portion 6 of the dummy electrode 3 extends from the chamfered portion or the chamfered portion to the main surface of the laminate 1. Exposed. As a result, the electroless plating film for forming the external electrode 3 is deposited starting from the outer peripheral portion 6 of the dummy electrode 5, so that the external electrode can be formed with high accuracy and the metal on the portion where the external electrode 3 is deposited. Bonding between the two increases, and the adhesive strength of the external electrode 3 can be increased. As the outer peripheral portion 6 is closer to the main surface side, the amount of scraping by the barrel polishing is larger and the diameter is smaller. Therefore, when a plurality of outer peripheral portions 6 are overlapped and exposed, an annual ring shape as shown in FIG. It will be exposed to form.

  Further, depending on the thickness of the dummy electrode 5 in the vicinity of the main surface, the internal electrode layer 2 in the region where the dummy electrode 5 is formed in the stacking direction has a shape whose cross section is bent toward the center of the stack. This further facilitates exposing the main surface side of the dummy electrode 5 when barrel polishing is performed.

  In addition, this invention is not limited to embodiment mentioned above, A various change, improvement, etc. are possible in the range which does not deviate from the summary of this invention.

  For example, in the capacitor of this embodiment, the plan view of FIG. 1 shows a multiple-type ceramic capacitor in which two external electrodes 3 are formed on the same side surface and two capacitor elements are provided in one laminated body. However, the number of external electrodes 3 is not limited to two on the same side, but may be three or more.

  In the present embodiment, a brazing material layer such as solder is formed directly on the surface of the external electrode 3, but Ni or the like is interposed between the external electrode 3 and the brazing material layer in order to further suppress solder erosion. The intermediate layer may be formed. Note that the thickness of the intermediate layer is set to, for example, 2 to 3 μm.

It is a top view which shows one Embodiment of the capacitor | condenser of this invention. It is sectional drawing which shows one Embodiment of the capacitor | condenser of this invention. It is a top view which removed the external electrode from one Embodiment of the capacitor | condenser of this invention. FIG. 3 is a partially enlarged view of FIG. 2.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 ... Laminated body 2 ... Internal electrode layer 3 ... External electrode 4 ... Brazing material layer 5 ... Dummy electrode 6 ... Outer peripheral part

Claims (6)

An internal electrode layer is interposed between adjacent dielectric layers in a multilayer body formed by laminating a plurality of dielectric layers, and a curved chamfer is formed at a corner between the side surface and the main surface of the multilayer body. Forming a portion, from the side surface of the laminate to the main surface, in a capacitor to which an external electrode connected to one end of the internal electrode layer is deposited,
Between the dielectric layers located in the vicinity of the main surface of the multilayer body, a chamfered portion of the multilayer body, or a dummy electrode having an outer peripheral portion annularly exposed from the chamfered portion to the main surface, and an exposed portion of the dummy electrode A capacitor characterized in that the external electrodes are connected throughout. The external electrode is formed including an electroless plating film deposited from one end of the internal electrode layer led to the surface of the laminate and the outer periphery of the dummy electrode, and the electroless plating film The capacitor according to claim 1, wherein the capacitor is continuously formed from a side surface to a main surface of the laminate. The dielectric layers and the dummy electrodes are alternately stacked in the vicinity of the main surface of the multilayer body, and the outer peripheral portions of the dummy electrodes are exposed so as to form an annual ring on the surface of the multilayer body. The capacitor according to claim 1 or 2, wherein the capacitor is characterized in that: The thickness T _{1 of the} dummy electrode in the stacking direction of the stacked body and the exposed width W _{1 of the} dummy electrode exposed at the chamfered portion of the stacked body are set so as to satisfy the relational expression “W ₁ > T ₁ ”. The capacitor according to claim 1, wherein the capacitor is provided. Wherein the exposed width W ₁ of the dummy electrodes, and deriving the width W ₂ of the inner electrode layers which are led out to the side surface of the laminated body is set so as to satisfy the relationship of "W _{1> W 2"} The capacitor according to any one of claims 1 to 4. The dielectric layers and the dummy electrodes are alternately stacked in the vicinity of the main surface of the multilayer body, and between the outer peripheral portions of adjacent dummy electrodes led to the surface of the multilayer body in the longitudinal section of the multilayer body. it is set so as to satisfy the relational expression and the shortest distance D ₂ between the ends of the internal electrode layers adjacent derived on the same side of the shortest distance D ₁ and the laminate is "D 1 _{<D 2"} The capacitor according to claim 1, wherein the capacitor is characterized in that

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