JP2005289767A - Method of manufacturing metal oxide coating film - Google Patents

Method of manufacturing metal oxide coating film Download PDF

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JP2005289767A
JP2005289767A JP2004110152A JP2004110152A JP2005289767A JP 2005289767 A JP2005289767 A JP 2005289767A JP 2004110152 A JP2004110152 A JP 2004110152A JP 2004110152 A JP2004110152 A JP 2004110152A JP 2005289767 A JP2005289767 A JP 2005289767A
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metal oxide
metal
fluoro complex
substrate
oxide film
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Yukinari Sekiguchi
幸成 関口
Shinjiro Doken
新二郎 堂見
Yasuhiro Saito
靖弘 斉藤
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Nippon Sheet Glass Co Ltd
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Nippon Sheet Glass Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a metal oxide coating film having a uniform film thickness even when a metal oxide other than SiO<SB>2</SB>is film-formed by a liquid phase deposition method. <P>SOLUTION: In the method of manufacturing the metal oxide coating film formed by depositing the metal oxide on a base body by dipping the base body in a treating liquid to contain a metallic fluorocomplex and a scavenger for chemically capturing fluorine ion from the metallic fluorocomplex, the oxide of the metal is deposited by adding the metallic fluorocomplex to the treating liquid. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、液相から金属酸化物被膜を基体上に析出させる金属酸化物被膜の製造方法に関する。   The present invention relates to a method for producing a metal oxide film in which a metal oxide film is deposited on a substrate from a liquid phase.

金属酸化物被膜を形成する方法の一つとして、処理液中での自己析出・成長型の成膜反応により、処理液中に基体を浸漬させるだけで成膜可能である液相析出(Liquid Phase Deposition:LPD)法を、本出願人らはこれまでに数多く提案してきた。   As one of the methods for forming metal oxide coatings, liquid phase deposition (Liquid Phase), which allows film formation by simply immersing the substrate in the processing solution, is performed by a self-deposition and growth type film forming reaction The applicants have so far proposed many Deposition (LPD) methods.

このLPD法は、基体材料や形状を問わず、処理液中から酸化物もしくはオキシ水酸化物を金属フルオロ錯体の加水分解平衡反応を利用して、より安定なフルオロ錯体を形成する物質(捕捉剤あるいは開始剤とも呼ばれる)を加えることにより、質量作用の法則に従い平衡を酸化物側にシフトさせ、基体上に安定な金属酸化物薄膜として均一に析出・成長させる技術である。このような反応は、この金属をMとすると、次の化学式1と化学式2で表される。   This LPD method is a substance (capturing agent) that forms a more stable fluoro complex by utilizing hydrolysis equilibrium reaction of metal fluoro complex with oxide or oxyhydroxide from the treatment liquid regardless of the base material or shape. (Also referred to as an initiator) to shift the equilibrium to the oxide side in accordance with the law of mass action and to deposit and grow uniformly as a stable metal oxide thin film on the substrate. Such a reaction is represented by the following chemical formula 1 and chemical formula 2, where M is this metal.

(化1)
[MF6-x(OH)x]2- + (6−x)H2O ⇔ [M(OH)6]2- + (6−x)HF
ただし、xは通常0〜5の整数であるが、化学量論比から外れる場合も考えられる。
(化2)
[M(OH)6]2- ⇒ MO2
(Chemical formula 1)
[MF 6-x (OH) x ] 2 + (6-x) H 2 O ⇔ [M (OH) 6 ] 2 + (6-x) HF
However, x is usually an integer of 0 to 5, but it may be deviated from the stoichiometric ratio.
(Chemical formula 2)
[M (OH) 6 ] 2- ⇒ MO 2

LPD法は、まず化学式1において、捕捉剤を添加するとフッ化水素が消費されるので、化学式1の平衡反応式を[M(OH)6]2-が生成する方向へシフトさせることになる。すると、この[M(OH)6]2-が脱水縮合反応を起こして、化学式2のようにMO2で示される金属酸化物が析出する。 In the LPD method, first, in Formula 1, when a scavenger is added, hydrogen fluoride is consumed. Therefore, the equilibrium reaction formula of Formula 1 is shifted in the direction in which [M (OH) 6 ] 2− is generated. Then, this [M (OH) 6 ] 2− causes a dehydration condensation reaction, and a metal oxide represented by MO 2 is deposited as shown in Chemical Formula 2.

この捕捉剤としては、ホウ酸(H3BO3),FeCl2,FeCl3,NaOH,NH3,Al,Ti,Fe,Ni,Mg,Cu,Zn,Si,SiO2,CaO,B23,Al23,MgO等が知られている。上述したいずれの捕捉剤を用いても、処理液中で安定なフルオロ錯化合物やフッ化物を生成するため、析出が阻害されることはない。特にホウ酸では、不純物が析出することがないことが知られている。この方法は、捕捉剤の添加量(濃度)で平衡反応を制御でき、様々な金属酸化物を析出することができる(例えば、特開平4−338136号公報参照)。 As this scavenger, boric acid (H 3 BO 3 ), FeCl 2 , FeCl 3 , NaOH, NH 3 , Al, Ti, Fe, Ni, Mg, Cu, Zn, Si, SiO 2 , CaO, B 2 O 3 , Al 2 O 3 , MgO and the like are known. Even if any of the above-mentioned scavengers is used, a stable fluoro complex compound or fluoride is generated in the treatment liquid, so that precipitation is not hindered. In particular, boric acid is known not to precipitate impurities. In this method, the equilibrium reaction can be controlled by the addition amount (concentration) of the scavenger, and various metal oxides can be precipitated (see, for example, JP-A-4-338136).

また、この捕捉剤の添加の方法としては、本出願人が特開昭58−161944号公報にて、以下のような開示を行っている。すなわち、ガラスを処理液に浸漬した後に、処理液にホウ酸を添加して、処理液のシリカ膜生成能力を一定に維持する処理方法である。   Further, as a method for adding this scavenger, the present applicant has disclosed the following in Japanese Patent Application Laid-Open No. 58-161944. In other words, after the glass is immersed in the treatment liquid, boric acid is added to the treatment liquid to maintain the silica film forming ability of the treatment liquid constant.

また、SiO2を析出する場合には、ケイフッ化水素酸にホウ酸を連続的に添加して、フィルタリング処理を行いながら処理液を循環させることにより、成膜レートを維持し、品質の安定した膜を得る技術が提案されている(例えば、特開平3−112806号公報参照)。この方法では、連続的な成膜が可能であり、廃液コストを下げることに成功している。 In addition, when depositing SiO 2 , boric acid is continuously added to hydrofluoric acid, and the treatment liquid is circulated while performing the filtering treatment, thereby maintaining the film formation rate and stabilizing the quality. A technique for obtaining a film has been proposed (see, for example, JP-A-3-112806). In this method, continuous film formation is possible, and the waste liquid cost has been successfully reduced.

特開平4−338136号公報JP-A-4-338136 特開昭58−161944号公報JP 58-161944 特開平3−112806号公報Japanese Patent Laid-Open No. 3-112806

上述のLPD法は、様々な金属酸化物を析出させることが可能であるが、SiO2以外の金属酸化物では材料固有の性質から、液中に析出物が少なからず発生する。従来技術で示した連続的な成膜プロセスに、このような材料を適用しようとすると、基体上だけでなく液中に多量の析出物が発生してしまうために、フィルタリング処理による処理液の循環が行えず、長期にわたって連続成膜することが困難であった。 The above-described LPD method can deposit various metal oxides, but metal oxides other than SiO 2 generate a considerable amount of precipitates in the liquid due to the inherent properties of the material. If such a material is applied to the continuous film formation process shown in the prior art, a large amount of precipitates are generated not only on the substrate but also in the liquid. However, it was difficult to continuously form a film over a long period of time.

したがって、SiO2以外の金属酸化物では、初期に金属フルオロ錯体とホウ酸を混合した後は、処理液における金属酸化物の析出能力が無くなるまでの期間しか、金属酸化物を析出させることができなかった。このために、コスト高となる問題があった。 Therefore, in the case of metal oxides other than SiO 2 , the metal oxide can be precipitated only after the initial mixing of the metal fluoro complex and boric acid until the metal oxide is not deposited in the treatment liquid. There wasn't. For this reason, there has been a problem of high costs.

また、液中に析出物が多量に発生してしまう反応系では、金属酸化物被膜の形成時に液中の析出物が取り込まれ、均一な膜を得ることも難しかった。   Further, in a reaction system in which a large amount of precipitates are generated in the liquid, it is difficult to obtain a uniform film because the precipitates in the liquid are taken in when the metal oxide film is formed.

本発明は、このような従来技術の問題に着目してなされたものである。その目的は、LPD法において、SiO2以外の金属酸化物を成膜する場合でも、均一な膜厚を有する金属酸化物被膜の製造方法を提供することである。 The present invention has been made paying attention to such problems of the prior art. The object is to provide a method for producing a metal oxide film having a uniform film thickness even when a metal oxide other than SiO 2 is formed in the LPD method.

本発明者らは鋭意研究を重ねた結果、LPD法において、処理液に捕捉剤を添加するのではなく、処理液に金属フルオロ錯体を添加すれば、成膜速度をできるだけ一定に保つことができ、しかも液中に金属酸化物が析出することを抑制できることを見出した。   As a result of intensive studies, the inventors have been able to keep the deposition rate as constant as possible in the LPD method by adding a metal fluoro complex to the treatment liquid instead of adding a scavenger to the treatment liquid. And it discovered that it could suppress that a metal oxide precipitates in a liquid.

すなわち、本発明は、請求項1に記載の発明として、
金属フルオロ錯体と該金属フルオロ錯体からフッ素イオンを化学的に捕捉する捕捉剤とを含みうる処理液に基体を浸漬して、前記金属の酸化物を前記基体上に析出させる金属酸化物被膜の製造方法において、
前記処理液に前記金属フルオロ錯体を添加することによって、前記金属の酸化物を析出させることを特徴とする金属酸化物被膜の製造方法である。
That is, the present invention is the invention according to claim 1,
Manufacture of a metal oxide film in which a substrate is immersed in a treatment solution that may contain a metal fluoro complex and a scavenger that chemically captures fluorine ions from the metal fluoro complex, thereby depositing the metal oxide on the substrate. In the method
It is a method for producing a metal oxide film, wherein the metal oxide is precipitated by adding the metal fluoro complex to the treatment liquid.

請求項2に記載の発明として、
前記金属フルオロ錯体の添加を、間欠的および/または連続的に行う請求項1に記載の金属酸化物被膜の製造方法である。
As invention of Claim 2,
The method for producing a metal oxide film according to claim 1, wherein the metal fluoro complex is added intermittently and / or continuously.

請求項3に記載の発明として、
前記金属フルオロ錯体の添加量を、前記金属酸化物の析出量に応じて調整する請求項1または2に記載の金属酸化物被膜の製造方法である。
As invention of Claim 3,
It is a manufacturing method of the metal oxide film of Claim 1 or 2 which adjusts the addition amount of the said metal fluoro complex according to the precipitation amount of the said metal oxide.

請求項4に記載の発明として、
前記処理液に浸漬した前記基体を揺動する請求項1〜3のいずれか1項に記載の金属酸化物被膜の製造方法である。
As invention of Claim 4,
It is a manufacturing method of the metal oxide film of any one of Claims 1-3 which rock | fluctuate the said base | substrate immersed in the said process liquid.

請求項5に記載の発明として、
前記揺動は、少なくとも前記金属フルオロ錯体を添加したときに行う請求項4に記載の金属酸化物被膜の製造方法である。
As invention of Claim 5,
The said rocking | fluctuation is a manufacturing method of the metal oxide film of Claim 4 performed when the said metal fluoro complex is added at least.

請求項6に記載の発明として、
前記捕捉剤がホウ酸である請求項1〜5のいずれか1項記載の金属酸化物被膜の製造方法である。
As invention of Claim 6,
The method for producing a metal oxide film according to claim 1, wherein the scavenger is boric acid.

請求項7に記載の発明として、
前記金属フルオロ錯体がSnのフルオロ錯体である請求項1〜6のいずれか1項に記載の金属酸化物被膜の製造方法である。
As invention of Claim 7,
The method for producing a metal oxide film according to any one of claims 1 to 6, wherein the metal fluoro complex is a fluoro complex of Sn.

本発明は、LPD法による金属酸化物被膜の製造方法において、処理液に金属フルオロ錯体を添加して金属酸化物被膜を析出させることを特徴としている。金属フルオロ錯体の添加の方法としては、間欠的あるいは連続的に添加すればよい。さらに、被膜の析出量に合わせて、金属フルオロ錯体の添加量を調整するとよい。   The present invention is characterized in that in the method for producing a metal oxide film by the LPD method, a metal fluoro complex is added to a treatment liquid to deposit a metal oxide film. As a method for adding the metal fluoro complex, it may be added intermittently or continuously. Furthermore, it is good to adjust the addition amount of a metal fluoro complex according to the precipitation amount of a film.

なお、従来知られているLPD法は、処理液に捕捉剤であるホウ酸を添加する方法であり、この場合、SiO2以外の金属酸化物では、液中に金属酸化物が析出することを抑制できなかった。 The conventionally known LPD method is a method of adding boric acid as a scavenger to the treatment liquid. In this case, in the case of a metal oxide other than SiO 2 , the metal oxide is precipitated in the liquid. Could not be suppressed.

その理由として、詳細は不明であるが以下のように考えられる。
まず、金属フルオロ錯体と捕捉剤とが共存すると、[MF6-x(OH)x]2-のxが様々な値をとる金属フルオロ錯体の中間体が存在する。この中間体は、一度、[M(OH)6]2-で表されるオキシ水酸化物の形になると、上述した化学式2の反応が支配的になる。こうなると、目的とする基体上だけではなく、処理液中でも金属酸化物が多量に析出し、沈殿物になると推測している。
Although the details are unknown, the reason is as follows.
First, when the metal fluoro complex and the scavenger coexist, intermediates of the metal fluoro complex in which x of [MF 6-x (OH) x ] 2− has various values exist. Once this intermediate is in the form of an oxyhydroxide represented by [M (OH) 6 ] 2− , the reaction of Formula 2 described above becomes dominant. In this case, it is presumed that not only on the target substrate but also in the treatment liquid, a large amount of metal oxide precipitates and becomes a precipitate.

この沈殿物の発生メカニズムに関し、従来技術と本発明における違いを、化学反応の観点から詳しく考察する。   The difference between the conventional technology and the present invention will be discussed in detail from the viewpoint of the chemical reaction with respect to the generation mechanism of the precipitate.

・捕捉剤(ホウ酸)を添加する方法
処理液にホウ酸を添加し始めた当初では、ホウ酸の添加量が少なく、金属フルオロ錯体からフッ素イオンを捕捉する反応が十分に行われず、中間体の金属フルオロ錯体が処理液中に多く存在している。そして、ホウ酸の添加量がある量となった時点で、オキシ水酸化物が多量に生成されるに至る。この結果、金属酸化物が多量に析出するようになり、沈殿物になる。
・ Method of adding scavenger (boric acid) At the beginning of adding boric acid to the treatment liquid, the amount of boric acid added was small, and the reaction to capture fluorine ions from the metal fluorocomplex was not performed sufficiently. There are many metal fluorocomplexes in the treatment liquid. When the amount of boric acid added reaches a certain level, a large amount of oxyhydroxide is generated. As a result, a large amount of the metal oxide is precipitated and becomes a precipitate.

・金属フルオロ錯体を添加する方法
これに対して、本発明の処理液に金属フルオロ錯体を添加する方法では、添加の初期から十分に金属フルオロ錯体からフッ素イオンを捕捉する反応が行われ、速やかにオキシ水酸化物が生成され始める。この結果、金属酸化物は順次コンスタントに析出するものと考えられ、沈殿物は発生しない。
なお、一度に多量の金属フルオロ錯体を添加すると、沈殿物が発生する虞があるので、金属フルオロ錯体の添加量を調整することが好ましい。
On the other hand, in the method of adding a metal fluoro complex to the treatment liquid of the present invention, a reaction for sufficiently capturing fluorine ions from the metal fluoro complex is performed from the beginning of the addition, and the method is quickly performed. Oxyhydroxide begins to be produced. As a result, it is considered that the metal oxide is constantly and constantly deposited, and no precipitate is generated.
In addition, since there exists a possibility that a precipitate may generate | occur | produce when a large amount of metal fluoro complexes are added at once, it is preferable to adjust the addition amount of a metal fluoro complex.

また、処理液の寿命についても、従来技術と本発明における違いを、化学反応の観点から詳しく考察する。   Further, regarding the lifetime of the treatment liquid, the difference between the conventional technique and the present invention will be considered in detail from the viewpoint of chemical reaction.

・捕捉剤(ホウ酸)を添加する方法
この反応系では、金属酸化物の析出によって、金属フルオロ錯体の供給はなく消費される一方なので、ある時点で析出は止まってしまう。
-Method of adding the scavenger (boric acid) In this reaction system, the metal fluoro complex is not supplied due to the precipitation of the metal oxide, so that the precipitation stops at a certain point.

・金属フルオロ錯体を添加する方法
これに対して、本発明の方法では、析出によって消費される金属フルオロ錯体を補充しているので、析出効率がよく、液寿命も長くすることができる。
-Method of adding a metal fluoro complex In contrast, in the method of the present invention, since the metal fluoro complex consumed by precipitation is supplemented, the deposition efficiency is good and the liquid life can be extended.

本発明において、金属フルオロ錯体の添加方法は、間欠的であってもよいし、連続的であってもよい。また、間欠添加と連続添加を組み合わせてもよい。例えば、製造の初期には、金属フルオロ錯体を間欠的に添加した後に、連続的に添加してもよい。   In the present invention, the method for adding the metal fluoro complex may be intermittent or continuous. Moreover, you may combine intermittent addition and continuous addition. For example, at the initial stage of production, the metal fluoro complex may be added intermittently and then continuously.

さらに、金属酸化物の析出量と均一性を向上させるために、金属フルオロ錯体を連続的に一定量を添加しながら、一時的にその添加量を増やしてもよい。また、添加のタイミングや添加量は適宜設定するとよい。   Furthermore, in order to improve the precipitation amount and uniformity of the metal oxide, the addition amount may be temporarily increased while continuously adding a certain amount of the metal fluoro complex. Moreover, the timing and amount of addition may be set as appropriate.

金属フルオロ錯体を添加する具体的な方法としては、チュービングポンプ等を使用して、連続的に添加してもよいし、またチュービングポンプとタイマー等を使用して、一定時間毎に間欠的に添加してもよい。   As a specific method of adding a metal fluoro complex, it may be added continuously using a tubing pump or the like, or intermittently added at regular intervals using a tubing pump and a timer. May be.

処理液の原料として使用する金属フルオロ錯体としては、処理液中で安定して存在し、捕捉剤の存在により析出可能な材料であれば、特に限定されない。例えば、金属フッ化水素酸や金属フッ化アンモニウム塩あるいは、これらを混合したものが挙げられる。また、金属としては、Ti,Fe,Sn,Zn,V,Zr,WおよびIn等が挙げられる。そのなかでもSnを用いた場合は、特に本発明の効果を顕著に確認することができる。   The metal fluoro complex used as the raw material for the treatment liquid is not particularly limited as long as it is a material that is stably present in the treatment liquid and can be precipitated by the presence of the scavenger. For example, metal hydrofluoric acid, metal ammonium fluoride salt, or a mixture thereof can be used. Examples of the metal include Ti, Fe, Sn, Zn, V, Zr, W, and In. Among these, when Sn is used, the effect of the present invention can be confirmed particularly remarkably.

本発明における初期の処理液は、金属フルオロ錯体と捕捉剤を混合したものでも、捕捉剤のみとしたものでもよい。   The initial treatment liquid in the present invention may be a mixture of a metal fluoro complex and a scavenger or only a scavenger.

本発明で使用する基体としては、処理液に含まれる金属フルオロ錯体から金属酸化物がその表面に析出可能な材料であれば、特に限定されない。例えば、Si,ガラス,セラミックス,樹脂等の材料の中から、用途に応じて適宜選択すればよい。   The substrate used in the present invention is not particularly limited as long as the metal oxide can be deposited on the surface from the metal fluoro complex contained in the treatment liquid. For example, what is necessary is just to select suitably from materials, such as Si, glass, ceramics, and resin, according to a use.

基体は、処理液に浸漬する前に、表面の有機物等の不純物を除去するために、洗浄を行うことが好ましい。例えば、基体としてガラスを使用する場合には、アルカリ洗浄した後に純水洗浄をするとよい。   The substrate is preferably washed in order to remove impurities such as organic substances on the surface before being immersed in the treatment liquid. For example, when glass is used as the substrate, pure water cleaning is preferably performed after alkali cleaning.

基体を処理液に接触させておく手段としては、処理液に対して耐久性を有する治具を使用して、反応容器に直接固定するか、上部から吊り下げればよい。耐久性を有する材料としては、例えば、フッ素樹脂,ポリエチレン,ポリプロピレン,ポリカーボネート,またはメチルペンテン樹脂等が挙げられる。   As a means for bringing the substrate into contact with the treatment liquid, a jig having durability against the treatment liquid may be used to fix the substrate directly to the reaction vessel or to hang it from above. Examples of the material having durability include fluorine resin, polyethylene, polypropylene, polycarbonate, or methylpentene resin.

また、より均一な膜厚の金属酸化物を析出させるために、処理液中で基体を搖動するとよい。このとき、搖動時間、距離、速度は特に限定されない。搖動する時期は、金属フルオロ錯体を添加するタイミングに合わせて行うとよい。   In order to deposit a metal oxide having a more uniform film thickness, the substrate is preferably shaken in the treatment liquid. At this time, the peristaltic time, distance, and speed are not particularly limited. The timing of peristaltic movement may be adjusted in accordance with the timing of adding the metal fluoro complex.

さらに、処理液濃度を均一にするために、撹拌や超音波照射を行ってもよい。処理液の撹拌は、析出物が基体に近づかないように、析出物が堆積する領域を避けて行うことが好ましい。例えば、処理液の上部をプロペラで撹拌する方法や、基体を浸漬する容器のほかに、容器と連通管で繋げられたサブタンクを設けて、サブタンクにて撹拌を行い、自然拡散により処理液濃度を均一化する方法がある。   Furthermore, in order to make the treatment liquid concentration uniform, stirring or ultrasonic irradiation may be performed. The stirring of the treatment liquid is preferably performed while avoiding a region where the precipitate is deposited so that the precipitate does not approach the substrate. For example, in addition to a method of stirring the upper part of the processing liquid with a propeller or a container in which the substrate is immersed, a sub tank connected to the container by a communication pipe is provided, stirring is performed in the sub tank, and the concentration of the processing liquid is increased by natural diffusion. There is a way to make it uniform.

本発明によれば、LPD法における処理液に、金属フルオロ錯体を添加することにより、成膜レートを一定に維持することができる。この結果、本発明による金属酸化物被膜の製造方法は、プロセスの制御が行いやすく、均一な金属酸化物被膜を得ることができる。また、比較的厚い金属酸化物被膜を得ることができる。さらに、不要な液中析出物を抑制できるので、原料コストを低減することができる。   According to the present invention, the film formation rate can be kept constant by adding a metal fluoro complex to the treatment liquid in the LPD method. As a result, the method for producing a metal oxide film according to the present invention makes it easy to control the process, and a uniform metal oxide film can be obtained. Also, a relatively thick metal oxide film can be obtained. Furthermore, since unnecessary precipitates in the liquid can be suppressed, the raw material cost can be reduced.

以下、本発明による金属酸化物被膜の製造方法を、実施例や比較例を用いて説明する。
[実施例1]
実施例1は、金属酸化物被膜としてSnO2膜を、基体であるSi基板上に形成した例である。本発明における金属酸化物被膜の製造工程を以下に示す。
Hereinafter, the manufacturing method of the metal oxide film by this invention is demonstrated using an Example or a comparative example.
[Example 1]
Example 1 is an example in which a SnO 2 film was formed on a Si substrate as a substrate as a metal oxide film. The manufacturing process of the metal oxide film in the present invention is shown below.

1.処理液の調製
2.基板の準備
3.初期の処理液の調製
4.基板を処理液に浸漬
5.処理液に金属フルオロ錯体の添加
6.基板の取り上げ
7.基板の洗浄・乾燥
1. 1. Preparation of treatment solution 2. Preparation of substrate 3. Preparation of initial treatment solution 4. Immerse the substrate in the processing solution 5. Addition of metal fluoro complex to treatment solution 6. Picking up the substrate Substrate cleaning / drying

まず、SnO2膜を形成するための金属フルオロ錯体は、以下の手順で作製した。フッ化スズ粉末をフッ化水素水に溶解し、Snの濃度が1.5mol/Lとなるように金属フルオロ錯体溶液を調製した。フッ素イオン捕捉剤としては、0.5mol/Lの濃度に調製したホウ酸水溶液を用いた。 First, a metal fluoro complex for forming a SnO 2 film was prepared by the following procedure. The tin fluoride powder was dissolved in hydrogen fluoride water to prepare a metal fluoro complex solution so that the Sn concentration was 1.5 mol / L. As the fluorine ion scavenger, an aqueous boric acid solution prepared at a concentration of 0.5 mol / L was used.

調製した金属フルオロ錯体溶液とホウ酸水溶液を適当量の水で希釈し、Snの濃度を0.01mol/L、ホウ酸濃度を0.48mol/Lに調製とし、初期の処理液とした。図1に概念的に示す製造装置を用いて、基体上に金属酸化物被膜を形成した。   The prepared metal fluorocomplex solution and boric acid aqueous solution were diluted with an appropriate amount of water to prepare a Sn concentration of 0.01 mol / L and a boric acid concentration of 0.48 mol / L as an initial treatment solution. A metal oxide film was formed on the substrate using the manufacturing apparatus conceptually shown in FIG.

この初期の処理液1にSi基板2を浸漬した後、金属フルオロ錯体溶液5をチュービングポンプ4により吸い上げ、配管41を通じて2時間おきに一定量ずつ添加した。基板2を所定時間浸漬した後に、これを引き上げ純水で洗浄し乾燥して、SnO2膜の形成されたSi基板2を得た。 After immersing the Si substrate 2 in the initial treatment liquid 1, the metal fluoro complex solution 5 was sucked up by the tubing pump 4 and added at a constant rate through the pipe 41 every 2 hours. After the substrate 2 was immersed for a predetermined time, it was pulled up, washed with pure water and dried to obtain a Si substrate 2 on which a SnO 2 film was formed.

また、Si基板には、予めマスキング剤を塗布しておき、SnO2膜の形成後にマスキング剤を剥離し、その段差を触針式表面粗さ計(Alpha-Step、KLA-TENCOR社製)にて測定し、SnO2膜の膜厚とした。さらに、基板の浸漬時間を順次変化させて、浸漬時間と得られたSnO2膜の膜厚の関係を調べて図2に示した。 In addition, a masking agent is applied to the Si substrate in advance, and after the SnO 2 film is formed, the masking agent is peeled off, and the step is applied to a stylus type surface roughness meter (Alpha-Step, manufactured by KLA-TENCOR). The thickness of the SnO 2 film was measured. Further, the relationship between the immersion time and the thickness of the obtained SnO 2 film was examined by sequentially changing the immersion time of the substrate, and is shown in FIG.

図2より、本発明の処理液に金属フルオロ錯体を添加すれば、浸漬時間と膜厚は正比例の関係にあることがわかった。なお、膜厚が約800nmを超えると、捕捉剤のホウ酸濃度が低下し、金属フルオロ錯体を添加しても十分に金属フルオロ錯体を捕捉する反応が行えなくなるため、成膜速度が低下していた。   From FIG. 2, it was found that when a metal fluoro complex was added to the treatment liquid of the present invention, the immersion time and the film thickness were in a directly proportional relationship. Note that when the film thickness exceeds about 800 nm, the boric acid concentration of the scavenger decreases, and even when the metal fluoro complex is added, the reaction for sufficiently capturing the metal fluoro complex cannot be performed, so the film deposition rate is decreased. It was.

また、得られた金属酸化物被膜のSEM観察を実施した。観察条件は破断面から15度傾けて、加速電圧を10kV、照射電流を10μA、撮影倍率を5万倍とした。得られたSEM写真を図3〜図5に示す。   Moreover, SEM observation of the obtained metal oxide film was implemented. The observation conditions were tilted 15 degrees from the fracture surface, the acceleration voltage was 10 kV, the irradiation current was 10 μA, and the imaging magnification was 50,000 times. The obtained SEM photographs are shown in FIGS.

図3〜図5の結果から、膜厚が1μm以下で均一な膜厚の金属酸化物被膜が得られることが確認できた。   From the results of FIGS. 3 to 5, it was confirmed that a metal oxide film having a uniform film thickness of 1 μm or less can be obtained.

得られた金属酸化物被膜に対して、透明な粘着性テープ(5mm幅)を貼り付けた後に勢い良く引き剥がす方法で密着性を評価したところ、剥離しない程度の密着性を有していることを確認した。   When the adhesiveness was evaluated by a method of peeling off vigorously after applying a transparent adhesive tape (5 mm width) to the obtained metal oxide film, the metal oxide film had adhesiveness that would not peel off. It was confirmed.

[実施例2]
この実施例2は、被膜形成時に基板を揺動させた例である。金属フルオロ錯体溶液とホウ酸水溶液は、実施例1と同様の手順で作製した。
[Example 2]
Example 2 is an example in which the substrate was swung during film formation. A metal fluoro complex solution and an aqueous boric acid solution were prepared in the same procedure as in Example 1.

この実施例2の金属酸化物被膜は、つぎの手順で作製した(図6参照)。初期の処理液は実施例1同様とし、Si基板2を処理液1に浸漬した後、上下動機構6によって上下方向に搖動させた。Si基板2は、クランプ62によって上下動機構6のシャフト61に接続されている。なお、上下動機構6は、例えば、ギヤ・クランク機構や、リニアモータなどにより、上下動するようになっていればよい。   The metal oxide film of Example 2 was produced by the following procedure (see FIG. 6). The initial treatment liquid was the same as in Example 1, and after the Si substrate 2 was immersed in the treatment liquid 1, it was rocked in the vertical direction by the vertical movement mechanism 6. The Si substrate 2 is connected to the shaft 61 of the vertical movement mechanism 6 by a clamp 62. The vertical movement mechanism 6 may be moved up and down by, for example, a gear / crank mechanism or a linear motor.

基板2を浸漬している間は、金属フルオロ錯体溶液5をチュービングポンプ4により吸い上げ、配管41を通じて2時間おきに一定量ずつ添加した。一定時間浸漬した後に、これを引き上げ純水で洗浄し乾燥して、SnO2膜の形成されたSi基板2を得た。 While the substrate 2 was immersed, the metal fluoro complex solution 5 was sucked up by the tubing pump 4 and added through the pipe 41 at a constant rate every 2 hours. After being immersed for a certain period of time, this was pulled up, washed with pure water and dried to obtain a Si substrate 2 on which a SnO 2 film was formed.

また実施例1と同様にして、得られたSnO2膜の膜厚を測定した。得られた膜厚を実施例1の結果とともに表1に示す。表1より、搖動なしと比較して、搖動ありの場合では面内ばらつきがさらに低減し、均一な膜となっていることを確認した。 Further, the film thickness of the obtained SnO 2 film was measured in the same manner as in Example 1. The obtained film thickness is shown in Table 1 together with the results of Example 1. From Table 1, it was confirmed that in-plane variation was further reduced and a uniform film was obtained in the case of the presence of peristalsis as compared to the case without peristalsis.

(表1)
──────────────────────
揺動 膜 厚
−−−−−−−−−−−−−−−−−−−−−
実施例1 なし 400±20nm
実施例2 あり 530±10nm
──────────────────────
(Table 1)
──────────────────────
Oscillation film thickness ---------------------
Example 1 None 400 ± 20 nm
Example 2 Available 530 ± 10 nm
──────────────────────

得られた金属酸化物被膜に対して、透明な粘着性テープ(5mm幅)を貼り付けた後に勢い良く引き剥がす方法で密着性を評価したところ、剥離しない程度の密着性を有していることを確認した。   When the adhesiveness was evaluated by a method of peeling off vigorously after applying a transparent adhesive tape (5 mm width) to the obtained metal oxide film, the metal oxide film had adhesiveness that would not peel off. It was confirmed.

なお、実施例1と実施例2に比較により、搖動した実施例2の方が大きな膜厚となっているが、これは、搖動によって基板近傍における金属酸化物の析出が効率的に行われたためと考えられる。   In comparison with Example 1 and Example 2, the film thickness of Example 2 that was perturbed was larger, but this was because the metal oxide was efficiently deposited in the vicinity of the substrate by the perturbation. it is conceivable that.

[比較例1]
比較例1における金属酸化物被膜の製造工程を以下に示す。
[Comparative Example 1]
The manufacturing process of the metal oxide film in Comparative Example 1 is shown below.

1.処理液の調製
2.基板の準備
3.初期の処理液の調製
4.基板を処理液に浸漬
5.処理液にホウ酸添加
6.基板の取り上げ
7.基板の洗浄・乾燥
1. 1. Preparation of treatment solution 2. Preparation of substrate 3. Preparation of initial treatment solution 4. Immerse the substrate in the processing solution 5. Add boric acid to treatment solution 6. Picking up the substrate Substrate cleaning / drying

金属フルオロ錯体とホウ酸は実施例1と同様の手順で作製した。
本比較例の金属酸化物被膜はつぎの手順で作製した。金属フルオロ錯体とホウ酸を適当量の水で希釈し、Snの濃度を0.03mol/L、ホウ酸濃度を0.28mol/Lに調製としたものを初期の処理液とした。初期処理液にSi基体を浸漬した後、ホウ酸をチュービングポンプにより2時間おきに一定量ずつ添加した。一定時間浸漬後、基体を引き上げ純水で洗浄し乾燥して、SnO2膜を形成したSi基板を得た。
A metal fluoro complex and boric acid were prepared in the same procedure as in Example 1.
The metal oxide film of this comparative example was produced by the following procedure. An initial treatment solution was prepared by diluting a metal fluoro complex and boric acid with an appropriate amount of water and adjusting the Sn concentration to 0.03 mol / L and boric acid concentration to 0.28 mol / L. After immersing the Si substrate in the initial treatment solution, boric acid was added in a constant amount every 2 hours by a tubing pump. After immersion for a certain time, the substrate was pulled up, washed with pure water and dried to obtain a Si substrate on which a SnO 2 film was formed.

また実施例1と同様にして、得られたSnO2膜の膜厚を測定した。その結果を図2に示す。図2より、処理液にホウ酸を添加した場合には、浸漬時間と膜厚は比例関係にあるものの、その直線性は悪く、膜厚が約300nmで限界となる。その後、基板を処理液に浸漬し続けても、膜厚は増加しなかった。 Further, the film thickness of the obtained SnO 2 film was measured in the same manner as in Example 1. The result is shown in FIG. From FIG. 2, when boric acid is added to the treatment liquid, the immersion time and the film thickness are in a proportional relationship, but the linearity is poor and the film thickness is limited to about 300 nm. Thereafter, the film thickness did not increase even when the substrate was continuously immersed in the treatment liquid.

以上、実施例1と比較例1との比較により、本発明の製造方法は、膜厚の制御性のよいことがわかった。   As described above, it was found from the comparison between Example 1 and Comparative Example 1 that the manufacturing method of the present invention has good film thickness controllability.

本発明に用いうる製造装置の一例を模式的に説明する概略図である。It is the schematic explaining typically an example of the manufacturing apparatus which can be used for this invention. 実施例1、比較例1で得られる金属酸化物被膜の成膜レートを示す図である。It is a figure which shows the film-forming rate of the metal oxide film obtained in Example 1 and Comparative Example 1. 実施例1で得た金属酸化物被膜(膜厚100nm)のSEM写真を示す図である。2 is a view showing an SEM photograph of a metal oxide film (film thickness: 100 nm) obtained in Example 1. FIG. 実施例1で得た金属酸化物被膜(膜厚300nm)のSEM写真を示す図である。It is a figure which shows the SEM photograph of the metal oxide film (film thickness of 300 nm) obtained in Example 1. 実施例1で得た金属酸化物被膜(膜厚900nm)のSEM写真を示す図である。It is a figure which shows the SEM photograph of the metal oxide film (film thickness of 900 nm) obtained in Example 1. 実施例2に用いうる製造装置で、基板を揺動している様子を模式的に説明する図である。It is a figure which illustrates typically a mode that the board | substrate is rock | fluctuated with the manufacturing apparatus which can be used for Example 2. FIG.

符号の説明Explanation of symbols

1:処理液、
2:基体(Si基板)、
3:容器、
4:ポンプ、
41:配管、
5:金属フルオロ錯体溶液、
6:上下動機構、
61:シャフト、
62:クランプ、
1: treatment liquid,
2: Base (Si substrate),
3: Container,
4: Pump,
41: piping,
5: Metal fluoro complex solution,
6: Vertical movement mechanism,
61: shaft,
62: Clamp,

Claims (7)

金属フルオロ錯体と該金属フルオロ錯体からフッ素イオンを化学的に捕捉する捕捉剤とを含みうる処理液に基体を浸漬して、前記金属の酸化物を前記基体上に析出させる金属酸化物被膜の製造方法において、
前記処理液に前記金属フルオロ錯体を添加することによって、前記金属の酸化物を析出させることを特徴とする金属酸化物被膜の製造方法。
Manufacture of a metal oxide film in which a substrate is immersed in a treatment solution that may contain a metal fluoro complex and a scavenger that chemically captures fluorine ions from the metal fluoro complex, thereby depositing the metal oxide on the substrate. In the method
A method for producing a metal oxide film, wherein the metal oxide is precipitated by adding the metal fluoro complex to the treatment liquid.
前記金属フルオロ錯体の添加を、間欠的および/または連続的に行う請求項1に記載の金属酸化物被膜の製造方法。   The method for producing a metal oxide film according to claim 1, wherein the metal fluoro complex is added intermittently and / or continuously. 前記金属フルオロ錯体の添加量を、前記金属酸化物の析出量に応じて調整する請求項1または2に記載の金属酸化物被膜の製造方法。   The manufacturing method of the metal oxide film of Claim 1 or 2 which adjusts the addition amount of the said metal fluoro complex according to the precipitation amount of the said metal oxide. 前記処理液に浸漬した前記基体を揺動する請求項1〜3のいずれか1項に記載の金属酸化物被膜の製造方法。   The method for producing a metal oxide film according to any one of claims 1 to 3, wherein the substrate immersed in the treatment liquid is rocked. 前記揺動は、少なくとも前記金属フルオロ錯体を添加したときに行う請求項4に記載の金属酸化物被膜の製造方法。   The method for producing a metal oxide film according to claim 4, wherein the rocking is performed at least when the metal fluoro complex is added. 前記捕捉剤がホウ酸である請求項1〜5のいずれか1項記載の金属酸化物被膜の製造方法。   The method for producing a metal oxide film according to claim 1, wherein the scavenger is boric acid. 前記金属フルオロ錯体がSnのフルオロ錯体である請求項1〜6のいずれか1項に記載の金属酸化物被膜の製造方法。   The method for producing a metal oxide film according to claim 1, wherein the metal fluoro complex is a fluoro complex of Sn.
JP2004110152A 2004-04-02 2004-04-02 Method of manufacturing metal oxide coating film Pending JP2005289767A (en)

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JP5440180B2 (en) * 2008-01-29 2014-03-12 コニカミノルタ株式会社 Method for manufacturing substrate for magnetic recording medium
US9742036B2 (en) * 2005-11-18 2017-08-22 Sony Corporation Anode material, anode and battery
CN113853451A (en) * 2020-06-30 2021-12-28 松下知识产权经营株式会社 Laminated film structure and method for manufacturing laminated film structure

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US9742036B2 (en) * 2005-11-18 2017-08-22 Sony Corporation Anode material, anode and battery
JP5440180B2 (en) * 2008-01-29 2014-03-12 コニカミノルタ株式会社 Method for manufacturing substrate for magnetic recording medium
CN113853451A (en) * 2020-06-30 2021-12-28 松下知识产权经营株式会社 Laminated film structure and method for manufacturing laminated film structure
KR20220165723A (en) * 2020-06-30 2022-12-15 파나소닉 아이피 매니지먼트 가부시키가이샤 Laminated film structure and manufacturing method of the multilayer film structure
KR102584916B1 (en) * 2020-06-30 2023-10-05 파나소닉 아이피 매니지먼트 가부시키가이샤 Laminated film structure and manufacturing method of the stacked film structure
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