JP2005241629A - Inspection device, inspection method, and manufacturing method for semiconductor device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an ID chip inspection device, and an inspection method using the inspection device, capable of performing noncontact supplying of a signal or power source voltage to an ID chip, and increasing the throughput of the inspection processing. <P>SOLUTION: This inspection device has two or more inspecting electrodes, two or more inspecting antennas, a position control means, a means for applying a voltage to each of the two or more antennas, and a means for measuring each potential of the two or more inspecting electrodes. By the position control means, two or more ID chips and the two or more inspecting electrodes are lapped over with intervals between, the two or more ID chips and the individual two or more inspecting antennas are lapped over with intervals between, and moreover the two or more ID chips are interposed between the two or more inspecting electrodes and the two or more individual inspecting antennas. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

  The present invention relates to an ID chip inspection apparatus, an inspection method, and a semiconductor device manufacturing method using the inspection method capable of wireless communication.

  Semiconductor devices typified by ID chips capable of transmitting and receiving data such as identification information wirelessly are being put to practical use in various fields, and further expansion of the market is expected as a new type of communication information terminal. . An ID chip is also called a wireless tag, an RFID (Radio frequency identification) tag, or an IC tag, and a type having an antenna and an integrated circuit (IC chip) formed using a semiconductor substrate is currently practical. It is becoming.

  The ID chip is formed through various manufacturing processes, and an inspection process is provided at the final stage of each manufacturing process. If a defective product can be identified at an early stage of the process before it is completed as a product, the subsequent process can be omitted for the ID chip. Therefore, providing an inspection process is a very effective means from the viewpoint of cost reduction.

  The inspection process includes an inspection process for specifying a defect from the appearance and an inspection process (an electric operation inspection process) for specifying a defect from an electrical operation. If the antenna is already connected to the integrated circuit in the stage before the ID chip is separated, the latter electrical operation inspection process is performed by separating the ID chip from the plurality of ID chips by dicing etc. This is mainly done after the first time. When the antenna is already connected to the integrated circuit, the signal or power supply voltage is supplied to the ID chip in a non-contact manner from the reader / writer for inspection in the electrical operation inspection step, and the ID chip to be inspected is checked. It can be determined whether or not the integrated circuit operates normally.

  As described above, the electrical operation inspection process performed in the stage before separating the ID chips is effective in reducing the cost in mass production of ID chips. However, shortening the time spent in the electrical operation inspection process described above is one of the important issues in mass production of ID chips. As the area of the ID chip is reduced and the number of ID chips formed from one substrate is increased, the demand for shortening the time spent in the electrical operation inspection process is increased, and the inspection apparatus with higher throughput is required. Suggestion is desired.

  If the inspection apparatus has an anti-collision function that can read signals from a plurality of ID chips, it is considered that the inspection efficiency can be increased to some extent. However, the number of ID chips that can read a signal by using the anti-collision function is about several tens at most per second. Thus, for example, assuming that about 600,000 ID chips are formed on one substrate, and the number of ID chips that can read signals per second using the anti-collision function is 30, It takes about 5.5 hours to inspect all the ID chips formed on a single substrate. Therefore, even if an inspection device having an anti-collision function is used, it is still difficult to shorten the time spent in the electrical operation inspection process, which hinders TAT (Turn Around Time) from being shortened. .

  In view of the above problems, in the present invention, an ID chip inspection apparatus that can supply a signal or power supply voltage to an ID chip in a non-contact manner and can increase the throughput of an inspection process, and the inspection apparatus are used. It is an issue to provide the inspection method.

  In the present invention, a power supply voltage or a signal is supplied to a plurality of chips (hereinafter referred to as ID chips or semiconductor devices) formed over a substrate using an antenna to operate each of the plurality of ID chips. The outputs from the plurality of ID chips are read using electrostatic induction, and the operation states of the plurality of ID chips are inspected.

Specifically, in the inspection method of the present invention, a plurality of inspection electrodes (inspection electrodes) are arranged so as to overlap the antennas of the plurality of ID chips with a space therebetween. An ID chip having an antenna is also called a wireless chip.
Next, using a test antenna (test antenna), a signal or a power supply voltage is supplied to the antenna of each of the plurality of ID chips, and the plurality of ID chips are operated. When a signal is output from each of the plurality of ID chips, a voltage is applied to the antenna included in each of the plurality of ID chips to be charged. As a result, among the plurality of inspection electrodes, the inspection electrode overlapping the antenna of each of the plurality of ID chips is charged by electrostatic induction.

  The amount of charge accumulated in each inspection electrode depends on the operating state and total area of the ID chip overlapping the inspection electrode. Therefore, by grasping the potential of the inspection electrode and the total area of the ID chip overlapping the inspection electrode, it is possible to grasp the operation state of the ID chip overlapping the inspection electrode.

  Furthermore, in the present invention, the direction of the plurality of inspection electrodes is changed a plurality of times while keeping the distance between the antenna and the inspection electrode included in the ID chip. Specifically, the region where the inspection electrode and the ID chip overlap can be changed by rotating the inspection electrode while keeping the distance between the antenna and the inspection electrode. Each time the orientation of the plurality of inspection electrodes is changed, the potential of the inspection electrode is measured. Then, the potential of the inspection electrode obtained by measuring a plurality of times, the position of one or a plurality of ID chips overlapping with the inspection electrode during measurement, and the total area of the ID chip overlapping with the inspection electrode, Accumulate as data. Note that the total area of the ID chip overlapping the inspection electrode can be indirectly grasped from the position of the inspection electrode and the position of the ID chip.

  Next, by using a restoration algorithm (for example, a Fourier transform method) that reproduces a two-dimensional distribution from one-dimensional data, which is used in computed tomography (CT), each ID is obtained from the accumulated data. A relative value of the voltage applied to the antenna of the chip can be obtained. That is, as a result, it can be said that the value of the voltage applied to the antenna of each ID chip can be read without contact. The operation state of each ID chip can be grasped from the relative value of the voltage applied to the antenna of each ID chip.

  Typical examples of the restoration algorithm include a successive approximation method, a Fourier transform method using a projected cut surface theorem, and a superposition integration method. The present invention may use these other restoration algorithms.

  The inspection apparatus of the present invention using the inspection method includes a plurality of inspection electrodes, a plurality of inspection antennas, position control means (position control means, alignment apparatus), and the plurality of inspection antennas. Means for applying voltage (voltage supply means, means for supplying voltage, voltage supply apparatus), means for measuring potentials of the plurality of test electrodes (potential measurement means, means for measuring potential, potential measurement apparatus); have. Further, in addition to the above-described configuration, the data having the measured potentials of the plurality of inspection electrodes as information and the data having the positions of the plurality of ID chips and the positions of the plurality of inspection electrodes as information are analyzed. In addition, there may be provided means (analysis means) for obtaining data including the operation state of the ID chip as information.

  The position control means has a function of controlling the positional relationship between the plurality of inspection electrodes, the plurality of inspection antennas, and the plurality of ID chips to be inspected. Specifically, the position control means includes a plurality of inspection electrodes and a plurality of inspection electrodes so that the plurality of inspection electrodes and the plurality of inspection antennas face each other with a plurality of ID chips to be inspected therebetween. The positions of the inspection antenna and the plurality of ID chips can be controlled. Further, the position control means has a function of controlling the orientation of the plurality of inspection electrodes while keeping the distance between the plurality of inspection electrodes and the plurality of ID chips.

  Note that there may be one or more position control means. For example, the inspection apparatus of the present invention includes a first position control unit having a function of controlling a positional relationship between a plurality of inspection electrodes, a plurality of inspection antennas, and a plurality of ID chips, and a plurality of inspection electrodes. You may have the 2nd position control means which has a function to change direction. Also, for example, the first position control means having a function of controlling the positional relationship between the plurality of inspection electrodes and the plurality of ID chips, the function of controlling the positional relationship between the plurality of inspection antennas and the plurality of ID chips. And second position control means having a third position control means having a function of controlling the orientation of the plurality of inspection electrodes. Thus, the number of position control means can be determined by the function to share.

  According to the present invention, the signal or power supply voltage can be supplied to the ID chip in a non-contact manner with the above configuration, and the number of potential measurements can be drastically suppressed as the number of ID chips increases. And the throughput of the inspection process can be further increased.

  In the case of an ID chip formed using a semiconductor substrate, since the semiconductor substrate functions as a conductor to shield radio waves, signals are easily attenuated, and radio waves can be uniformly transmitted to all antennas of the ID chip. difficult. However, when an ID chip is formed using an insulating substrate that is less likely to interfere with radio waves than a semiconductor substrate, such as a glass substrate or a plastic substrate, all the ID chips have an ID chip compared to when a semiconductor substrate is used. Radio waves can be sent uniformly by the antenna.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings. However, the present invention can be implemented in many different modes, and it is easy for those skilled in the art to change the modes and details in various ways without departing from the spirit and scope of the present invention. Understood. Therefore, the present invention is not construed as being limited to the description of this embodiment mode.

  The configuration of the inspection apparatus of the present invention will be described with reference to FIG. FIG. 1A shows a cross-sectional view of one embodiment of the inspection apparatus of the present invention. In FIG. 1A, reference numeral 101 corresponds to a substrate to be inspected, and a plurality of ID chips 102 are formed on the substrate 101. As shown in FIG. 1A, the inspection apparatus of the present invention includes a plurality of inspection electrodes 103, a plurality of inspection antennas 104, position control means 105 to 107, potential measurement means 108, and voltage supply means. 109.

  In the inspection apparatus of the present invention shown in FIG. 1A, the position control means 105 to 107 are used to overlap the inspection electrode 103 and the inspection antenna 104 with the substrate 101 to be inspected therebetween. Can do. Specifically, the position control unit 105 can control the position and orientation of the inspection antenna 104 in the same plane. Further, the position control means 106 can control the relative position and orientation of the substrate 101 in the same plane with respect to the inspection antenna 104 and the distance between the inspection antenna 104 and the substrate 101. Further, the position control means 107 can control the distance between the inspection electrode 103 and the substrate 101.

  Specifically, the position control means 105 has a function of controlling the movement of the inspection antenna 104 in the X-axis direction, and an inspection antenna in the Y-axis direction that is orthogonal to the X-axis direction and in the same plane as the X-axis direction. And a function of controlling the direction of the inspection antenna 104 in the same plane as the X-axis direction and the Y-axis direction.

  More specifically, the position control means 106 has a function for controlling the relative movement of the substrate 101 in the X-axis direction, a function for controlling the relative movement of the substrate 101 in the Y-axis direction, It has a function of controlling the relative orientation of the substrate 101 in the same plane as the Y-axis direction and a function of controlling the distance between the inspection antenna 104 and the substrate 101.

  FIG. 1A shows an example of position control means 107 that controls the distance between the substrate 101 and the inspection electrode 103 by injecting a high-pressure gas toward the substrate 101 as in a hovercraft. Note that the control of the interval is not limited to that using a high-pressure gas, and a fluid having a constant flow rate or pressure can be used. As the fluid, liquid can be used in addition to gas. In addition, it is also possible to use a fluid such as a viscous gel.

  1A shows an example in which the positional relationship among the inspection electrode 103, the inspection antenna 104, and the substrate 101 is controlled by three position control means 105 to 107. The number of position control means used in the inspection apparatus is not limited to this configuration. The position control means used in the inspection apparatus of the present invention has a function of controlling the positional relationship among the plurality of inspection electrodes 103, the plurality of inspection antennas 104, and the plurality of ID chips 102 to be inspected. The number and form are not limited to the structure shown in FIG.

  Note that the positional relationship between the inspection antenna 104 and the substrate 101 in the same plane may be controlled using a marker formed on the substrate 101 as a reference. In this case, as shown in FIG. 1B, a camera 110 for capturing the position of the marker may be used.

  The voltage supply means 109 controls application of an alternating voltage to each of the plurality of inspection antennas 104. A signal or a power supply voltage can be supplied to the ID chip 102 by applying the AC voltage to each of the plurality of inspection antennas 104.

  The potential measuring means 108 corresponds to means for measuring the potentials of the plurality of inspection electrodes 103. The potential measured by the potential measuring means 108 may be the amount of change in potential within a specific time, or may be a waveform obtained by the time change of potential. The potential generated at the inspection electrode 103 includes the operation state of the ID chip 102 as information.

  In addition to the above-described configuration, the inspection apparatus according to the present invention also includes data having the measured potentials of the plurality of inspection electrodes as information, the positions of the plurality of ID chips, and the positions of the plurality of inspection electrodes. It is also possible to have means for analyzing the data that is included in the data and obtaining data including the operation state of the ID chip as information.

  Next, the structure of the ID chip 102 illustrated in FIG. FIG. 2A shows a perspective view of the substrate 101. A plurality of ID chips 102 are formed on the substrate 101. FIG. 2B shows an enlarged view of the ID chip 102. Each of the plurality of ID chips 102 includes an integrated circuit 201 and an antenna 202.

  In addition, a substrate that contains an insulator such as a glass substrate such as barium borosilicate glass or alumino borosilicate glass, or a plastic substrate, rather than a substrate that functions as a conductor and shields radio waves, such as a semiconductor substrate or a stainless steel substrate. However, since shielding of radio waves can be suppressed, it is suitable as the substrate 101 to be inspected. Therefore, in the case of using the substrate 101 including an insulator, the integrated circuit 201 is preferably formed using a semiconductor element having a thin semiconductor film which is insulated and separated, for example, a thin film transistor.

  The integrated circuit 201 generates a signal or a power supply voltage by rectifying or shaping the alternating voltage applied to the antenna 202. The integrated circuit 201 can perform various arithmetic processes or operations such as reading and writing data using the generated signal or power supply voltage, and can apply the voltage of the signal obtained as a result to the antenna 202.

  Next, the structure of the inspection electrode 103 illustrated in FIG. FIG. 3A is a perspective view of the inspection electrode 103. Each of the plurality of inspection electrodes 103 shown in FIG. 3A has a strip shape and is arranged in parallel in the same plane. Note that FIG. 3A shows a state where a plurality of inspection electrodes 103 are formed on a flat support 301. As shown in FIG. 1A, when the distance between the substrate 101 and the inspection electrode 103 is controlled using the position control means 107, the surface of the support 301 on which the inspection electrode 103 is formed is provided. A hole 302 through which a high-pressure gas can be injected to the substrate 101 side is provided. However, when the gap between the inspection electrode 103 and the substrate 101 is not controlled by ejecting high-pressure gas, it is not always necessary to form the plurality of inspection electrodes 103 on the flat support 301. It is only necessary that the positional relationship between the plurality of inspection electrodes 103 can be fixed.

  Next, the structure of the inspection antenna 104 illustrated in FIG. FIG. 3B is a perspective view of the inspection antenna 104. FIG. 3B shows an example in which a plurality of inspection antennas 104 are formed on a flat support 303. A plurality of inspection antennas 104 shown in FIG. 3B are arranged so as to correspond to a plurality of ID chips to be inspected. An AC voltage is applied to each inspection antenna 104 by the voltage supply means 109.

  Note that FIG. 3B illustrates an example in which the plurality of inspection antennas 104 and the plurality of ID chips 102 correspond one-to-one, but the present invention is not limited to this structure. One inspection antenna 104 may correspond to two or more ID chips 102, and conversely, two or more inspection antennas 104 may correspond to one ID chip 102. However, if the magnetic flux in the area where the antenna 202 is formed is uniform between the ID chips 102, the operating state of the ID chips 102 can be grasped more accurately, so that a plurality of inspection antennas 104 can be obtained. It is desirable that the plurality of ID chips 102 correspond one-to-one.

  Next, in FIG. 4A, the substrate 101 on which the ID chip 102 is formed, the support body 301 on which the inspection electrode 103 is formed, and the support body 303 on which the inspection antenna 104 is formed are overlapped. It shows how they are matched. The smaller the distance between the antenna of the ID chip 102 and the inspection electrode 103, the more accurately the operation state of the ID chip 102 can be grasped. Therefore, the distance between the antenna of the ID chip 102 and the inspection electrode 103 is preferably as close as possible to control. Therefore, in FIG. 4A, the substrate 101 and the support 301 are overlapped so that the ID chip 102 and the inspection electrode 103 are sandwiched between the substrate 101 and the support 301. In FIG. 4A, in order to clarify the positional relationship between the inspection electrode 103 and the ID chip 102, the inspection electrode 103 is shown as being shown through the support 303. Yes.

  The substrate 101 is sandwiched between the support body 301 and the support body 303, and thus the ID chip 102 is sandwiched between the inspection electrode 103 and the inspection antenna 104. With the above configuration, a signal or power supply voltage is supplied from the inspection antenna 104 to the ID chip 102 using electromagnetic induction, and as a result, a voltage is applied from the ID chip 102 to the inspection electrode 103 by electrostatic induction. A signal flow can be formed.

  Note that the transmission method of the signal or power supply voltage from the inspection antenna 104 to the ID chip 102 is not limited to the electromagnetic coupling method and the electromagnetic induction method, and a microwave method or other transmission methods may be used.

  FIG. 5A is an enlarged view showing a state where the ID chip 102 and the inspection antenna 104 shown in FIG. Note that in FIG. 5A, the substrate 101 is omitted in order to clarify the state in which the ID chip 102 and the inspection antenna 104 overlap. As described with reference to FIG. 2B, the ID chip 102 includes the integrated circuit 201 and the antenna 202, and each antenna 202 overlaps the corresponding inspection antenna 104.

  FIG. 5B is an enlarged view of the ID chip 102 and the inspection antenna 104 illustrated in FIG. The inspection antenna 104 and the antenna 202 are spaced apart to such an extent that a signal or power supply voltage can be supplied from the inspection antenna 104 to the antenna 202 using electromagnetic induction.

In practice, the substrate 101 is provided between the inspection antenna 104 and the antenna 202.
However, instead of a semiconductor substrate that easily shields radio waves, a glass substrate, a plastic substrate, or the like that is less likely to block radio waves than a semiconductor substrate and passes therethrough is used as the substrate 101, so that all antennas 202 included in the ID chip 102 can Radio waves can be sent more uniformly.

  Next, FIG. 4B illustrates a state in which the support body 301 illustrated in FIG. 4A is rotated. The support 301 is rotated while maintaining a distance between the inspection electrode 103 and the ID chip 102. When the support 301 is rotated, the inspection electrodes 103 are also rotated, and the position of the ID chip 102 overlapping with each inspection electrode 103 is changed.

  A change in the position of the ID chip 102 overlapping the inspection electrode 103 due to the rotation of the inspection electrode 103 will be described with reference to FIG. In FIG. 6, for the sake of easy understanding, an example in which 5 × 5 ID chips 102 and nine inspection electrodes 103 are used will be described.

  FIG. 6A shows a state in which a plurality of inspection electrodes 103 and a plurality of ID chips 102 are overlapped. In FIG. 6A, five ID chips 102 overlap with one inspection electrode 103. Further, not all the inspection electrodes 103 overlap with the ID chip 102, and there are inspection electrodes 103 that do not overlap with the ID chip 102.

  FIG. 6B illustrates a state in which the plurality of inspection electrodes 103 and the plurality of ID chips 102 overlap when the plurality of inspection electrodes 103 illustrated in FIG. 6A are rotated. By rotating the plurality of inspection electrodes 103, the position of the ID chip 102 overlapping the inspection electrode 103 is changed. That is, each inspection electrode 103 overlaps with an ID chip 102 different from the case of FIG.

  The AC voltage generated in each inspection electrode 103 is applied to the number of ID chips 102 overlapping the inspection electrode 103, the region where the inspection electrode 103 and the ID chip 102 overlap, and the antenna 202 of each ID chip 102. The amplitude and waveform vary depending on the value of the AC voltage applied. Therefore, in the case of FIG. 6A and the case of FIG. 6B, the value of the AC voltage generated in each inspection electrode 103 is not necessarily the same.

  The number of each ID chip 102 overlapping with the inspection electrode 103 and the area where the inspection electrode 103 and the ID chip 102 overlap can be predicted in advance by calculation. In addition, when all the ID chips 102 are operating normally, the amplitude and waveform of the AC voltage applied to the antenna 202 of each ID chip 102 are also calculated in advance or measured in advance. Can be obtained. Therefore, when all the ID chips 102 operate normally, the amplitude and waveform of the AC voltage generated by electrostatic induction in the inspection electrode 103 can be predicted to some extent.

  When an ID chip 102 that overlaps with the inspection electrode 103 is mixed with a defective one, the amplitude and waveform of the AC voltage generated at the inspection electrode 103 is normally operated for all the ID chips 102. This is not the case. Therefore, when the amplitude and waveform of the AC voltage generated in the inspection electrode 103 are different from those predicted, an operation failure occurs in any of the ID chips 102 overlapping the inspection electrode 103. Can be predicted.

  FIG. 7 illustrates a state where one of the inspection electrodes 103 illustrated in FIG. 6B and the ID chip 102 overlap each other. In FIG. 7, it is assumed that among the ID chips 102 overlapping with the inspection electrode 103, an operation failure occurs in the ID chip indicated by 102 a. The larger the area of the region where the ID chip 102a that is defective in operation and the inspection electrode 103 overlap, the farther the amplitude and waveform of the alternating voltage generated at the inspection electrode 103 is from the normal case. Accordingly, it is possible to calculate the ratio of the ID chips 102 other than the ID chip 102a occupying among all the ID chips 102 overlapping with one inspection electrode 103.

  Furthermore, by changing the position of the inspection electrode 103 with respect to the ID chip 102 a plurality of times, the IDs that are operating normally among all the ID chips 102 that overlap with the single inspection electrode 103 at each position. The proportion of the chip 102 can be obtained. The operating state of each ID chip 102 can be grasped from the ratio of the ID chip 102 operating normally obtained for each position.

  The number of times of changing the positional relationship between the inspection electrode 103 and the ID chip 102 can be arbitrarily set by the practitioner. In addition, the practitioner can arbitrarily set the positional relationship between each inspection electrode 103 and each ID chip 102 during each measurement. However, each test electrode 103 and each ID chip at the time of each measurement is determined so that the operation state of each ID chip 102 can be determined from the value of the AC voltage of each test electrode 103 obtained by all measurements. It is important to define the positional relationship 102 and set the number of times to change the positional relationship.

  Note that the operation state of each ID chip 102 can be grasped more accurately by taking the layout of the antenna 202 in the ID chip 102 into consideration.

  In the present embodiment, the position of the ID chip 102 that overlaps each inspection electrode 103 is changed by rotating the inspection electrode 103. However, the present invention is not limited to this configuration. As long as the relative positional relationship between the inspection electrode 103 and the ID chip 102 can be changed, the ID chip 102 may be rotated instead of the inspection electrode 103. However, even when the ID chip 102 is rotated, the positional relationship between the inspection antenna 104 and the antenna 202 included in the ID chip 102 is fixed.

  Note that it is not necessary to operate all the ID chips 102 simultaneously at the time of inspection. For example, the ID chips 102 may be operated one by one, or the ID chips 102 may be operated by being divided into several groups.

  In addition, the operation state of the ID chip 102 may be selected into a plurality of ranks depending on the operation state, instead of selecting the operation state between good and bad. The extent to which the operating state of the ID chip 102 is different from the operating state of the normal ID chip 102 is determined by the practitioner by appropriately setting a standard to determine that the ID chip 102 is not normal. Is possible.

  In addition, it is not always necessary that the AC voltage serving as a reference for comparison is based on an ID chip that has already been confirmed to be normal. The operation state of the ID chip may be confirmed by comparing AC voltages generated in the plurality of inspection electrodes with each other, and the quality thereof may be determined. In this case, it is important to make a comparison in consideration of the area of the ID chip overlapping each inspection electrode. Further, the operation state of the ID chip may be confirmed by comparing with the value of the AC voltage calculated by the simulation, and the quality thereof may be determined.

  In this embodiment, a more specific configuration of the inspection apparatus of the present invention will be described with reference to FIG.

  The inspection apparatus of this embodiment shown in FIG. 8 includes a plurality of inspection electrodes 801, a plurality of inspection antennas 802, position control means 803, and voltage supply means 804 that applies a voltage to each of the plurality of inspection antennas 802. And a potential measuring means 805 for measuring the potentials of the plurality of inspection electrodes 801. Further, the inspection apparatus according to the present embodiment includes the data having the potentials of the plurality of inspection electrodes 801 measured by the potential measuring unit 805 as information, the positions of the plurality of ID chips, and the positions of the plurality of inspection electrodes 801. Means (analyzing means) 806 for analyzing the data as information and obtaining data including the operation state of the ID chip as information is provided. Reference numeral 807 corresponds to an ID chip to be inspected.

  In this embodiment, the analysis unit 806 includes a man-machine I / F 808, a measurement controller 809, a measurement sequencer 810, a selection circuit 816, and a signal analyzer 817. The voltage supply means 804 includes an oscillator 811, a signal source 812, a modulation circuit 813, and an antenna controller 814. In this embodiment, a signal processing circuit 815 is used as the potential measuring means 805.

  Next, the operation of the inspection apparatus of this embodiment will be described.

  First, when a measurement start instruction is input to the man-machine I / F 808, the measurement start instruction is input to the measurement controller 809 as information. Then, the measurement controller 809 inputs, as information, an instruction to control the positions of the ID chip 807 to be inspected, the inspection antenna 802, and the inspection electrode 801 to the position control unit 803.

  Then, the antenna included in the ID chip 807 and the inspection antenna 802 are overlapped with a certain interval by the position control means 803. Further, the position control means 803 causes the antenna of the ID chip 807 and the inspection electrode 801 to overlap each other with a certain interval.

  Further, the measurement controller 809 inputs a measurement start instruction as information to the measurement sequencer 810. Then, the measurement sequencer 810 controls the voltage supply means 804 and applies an AC voltage to the inspection antenna 802. Specifically, the frequency of the AC voltage generated in the oscillator 811 is converted in the signal source 812 and supplied to the modulation circuit 813. On the other hand, the antenna controller 814 generates a signal for controlling the operation of the ID chip 807 and inputs the signal to the modulation circuit 813. The modulation circuit 813 modulates the supplied AC voltage in accordance with the signal input from the antenna controller 814 and supplies the modulated AC voltage to the inspection antenna 802.

  When an AC voltage is supplied to the inspection antenna 802, a signal and a power supply voltage are supplied to the ID chip 807 by electromagnetic induction, and the ID chip 807 operates. When the ID chip 807 operates, an AC voltage is supplied from the antenna of the ID chip 807 to the inspection electrode 801 by electrostatic induction. The AC voltage supplied to the inspection electrode 801 includes the operation state of the ID chip 807 as information.

  The AC voltage generated in the inspection electrode 801 is supplied to the signal processing circuit 815. In the signal processing circuit 815, the value of the alternating voltage generated in each inspection electrode 801 is processed. Specifically, the difference in AC voltage generated between the inspection electrodes 801 is calculated. The AC voltage generated in the inspection electrode 801 may contain various noises (noise). Since the frequency and voltage of the noise generated in each inspection electrode 801 are relatively close, the noise can be removed to some extent by calculating the difference in the value of the AC voltage generated between the inspection electrodes 801. The noise and the frequency and voltage become closer as the positions of the inspection electrodes 801 are closer. Therefore, it is more desirable to calculate the difference in AC voltage generated between the inspection electrodes 801 located closer to each other.

  Note that the waveform and amplitude of the AC voltage generated in each inspection electrode 801 vary depending on the operating state of the ID chip 807. For this reason, the calculated AC voltage difference includes the operation state of the ID chip 807 as information. Therefore, the signal having the calculated AC voltage difference as information (operation information signal) includes the operation state of the ID chip 807 as information. The operation information signal is input to the selection circuit 816.

  The selection circuit 816 sequentially selects the plurality of input operation information signals and inputs them to the signal analyzer 817. In the signal analyzer 817, the input operation information signal is amplified, then A / D converted to digital, and processed. Note that A / D conversion is not always necessary, and the arithmetic processing may be performed in analog. The arithmetic processing is performed in order to analyze the operating state of the ID chip 807 that overlaps the inspection electrode 801 during measurement. Therefore, the contents of the arithmetic processing can be appropriately selected by the designer.

  The operation information signal subjected to the arithmetic processing is input to the measurement controller 809.

  Then, the positional control unit 803 changes the positional relationship between the inspection electrode 801 and the ID chip 807, repeats the above-described operation a plurality of times, and inputs a plurality of operation-processed operation information signals to the measurement controller 809. In the measurement controller 809, the position of each ID chip 807 and the ratio of the overlapping area of the ID chip 807 that overlaps each inspection electrode 801 at each measurement and the input operation information signal that has been processed are input. The operating state is specified, and the quality of the ID chip 807 is determined.

  The inspection apparatus of the present invention is not limited to the configuration shown in FIG.

  In this embodiment, an example of a functional configuration of an ID chip used in the present invention will be described with reference to FIG.

  In FIG. 9, 900 corresponds to an antenna, and 901 corresponds to an integrated circuit. The antenna 900 includes an antenna coil 902 and a capacitor element 903 formed in the antenna coil 902. The integrated circuit 901 includes a demodulation circuit 909, a modulation circuit 904, a rectifier circuit 905, a microprocessor 906, a memory 907, and a switch 908 for applying load modulation to the antenna 900. Note that the memory 907 is not limited to one, and a plurality of memories 907 may be used, such as SRAM, flash memory, ROM, or FRAM (registered trademark).

  A signal transmitted as a radio wave from the reader / writer is converted into an AC electrical signal by electromagnetic induction in the antenna coil 902. The demodulation circuit 909 demodulates the alternating electrical signal and transmits it to the subsequent microprocessor 906. The rectifier circuit 905 generates a power supply voltage using an alternating electrical signal and supplies the power supply voltage to the subsequent microprocessor 906.

  The microprocessor 906 performs various arithmetic processes according to the input signal. The memory 907 stores programs and data used in the microprocessor 906, and can also be used as a work area during arithmetic processing. The signal sent from the microprocessor 906 to the modulation circuit 904 is modulated into an alternating electrical signal. The switch 908 can apply load modulation to the antenna coil 902 in accordance with an alternating electrical signal from the modulation circuit 904. The reader / writer can read the signal from the microprocessor 906 as a result of receiving the load modulation applied to the antenna coil 902 by radio waves.

  Note that the ID chip shown in FIG. 9 is merely an example of an ID chip used as an inspection target in the inspection apparatus of the present invention, and the present invention is not limited to the above configuration. The signal transmission method is not limited to the electromagnetic coupling method as shown in FIG. 9, and an electromagnetic induction method, a microwave method, or other transmission methods may be used.

  This embodiment can be implemented in combination with the first embodiment.

  Next, the timing for performing the inspection method of the present invention in the ID chip manufacturing process will be described. Note that in this embodiment, an isolated TFT is illustrated as a semiconductor element, but the semiconductor element included in the integrated circuit is not limited to this, and any circuit element can be used. For example, in addition to the TFT, a memory element, a diode, a photoelectric conversion element, a resistance element, a coil, a capacitor element, an inductor, and the like can be typically given.

  First, as illustrated in FIG. 10A, a separation layer 501 is formed over a substrate 500 by a sputtering method. As the substrate 500, for example, a substrate that can withstand a processing temperature in a subsequent manufacturing process, such as a glass substrate such as barium borosilicate glass or alumino borosilicate glass, and that is less likely to interfere with radio waves than a semiconductor substrate in an inspection process is used. .

  As the separation layer 501, a layer containing silicon as its main component, such as amorphous silicon, polycrystalline silicon, single crystal silicon, or microcrystalline silicon (including semi-amorphous silicon) can be used. The peeling layer 501 can be formed by a sputtering method, a plasma CVD method, or the like. In this embodiment, amorphous silicon having a thickness of about 500 nm is formed by a sputtering method and used as the peeling layer 501.

  Note that the separation layer 501 is not limited to silicon, and the separation layer 501 may be formed using a material that can be selectively removed by etching.

  Next, a base film 502 is formed over the peeling layer 501. As the base film 502, when the semiconductor element is later bonded to the support with an adhesive, an alkali metal or alkaline earth metal such as Na contained in the support or the adhesive is used for the semiconductor element. It is formed to prevent diffusion into the semiconductor film and adversely affect the characteristics of the semiconductor element. The base film 502 also has a role of protecting the semiconductor element from the etchant when the peeling layer 501 is etched. Accordingly, an insulating film such as silicon oxide, silicon nitride, or silicon nitride oxide that can suppress diffusion of alkali metal or alkaline earth metal into the semiconductor film and can protect the semiconductor element from an etchant used for etching silicon. It is desirable to form using. In this embodiment, a silicon nitride oxide film is formed to a thickness of 10 nm to 400 nm (preferably 50 nm to 300 nm) using a plasma CVD method. Note that the base film 502 may be a single-layer insulating film or a stack of a plurality of insulating films.

  Next, a semiconductor film is formed over the base film 502. The semiconductor film is preferably formed without being exposed to the air after the base film 502 is formed. The thickness of the semiconductor film is 20 to 200 nm (preferably 40 to 170 nm). Note that the semiconductor film may be an amorphous semiconductor, a semi-amorphous semiconductor, or a polycrystalline semiconductor. As the semiconductor, not only silicon but also silicon germanium can be used. When silicon germanium is used, the concentration of germanium is preferably about 0.01 to 4.5 atomic%.

Note that the semiconductor film may be crystallized by a known technique. Known crystallization methods include a thermal crystallization method using an electric furnace, a laser crystallization method using laser light, and a lamp annealing crystallization method using infrared light. Alternatively, a crystallization method using a catalytic element can be used. For example, when laser crystallization is used, before laser crystallization, thermal annealing is performed on the semiconductor film at 500 ° C. for 1 hour in order to increase the resistance of the semiconductor film to the laser. By using a solid-state laser capable of continuous oscillation and irradiating laser light of the second harmonic to the fourth harmonic of the fundamental wave, a crystal having a large grain size can be obtained. For example, typically, it is desirable to use the second harmonic (532 nm) or the third harmonic (355 nm) of an Nd: YVO ₄ laser (fundamental wave 1064 nm). Specifically, laser light emitted from a continuous wave YVO ₄ laser is converted into a harmonic by a non-linear optical element to obtain laser light with an output of 10 W. Then, it is preferably formed into a rectangular or elliptical laser beam on the irradiation surface by an optical system and irradiated onto the semiconductor film. At this time, the energy density of approximately 0.01 to 100 MW / cm ² (preferably 0.1 to 10 MW / cm ²⁾ is required. Then, irradiation is performed at a scanning speed of about 10 to 2000 cm / sec.

  Alternatively, laser crystallization may be performed using a frequency band that is significantly higher than a frequency band of several tens to several hundreds Hz that is normally used, with an oscillation frequency of pulsed laser light of 10 MHz or higher. It is said that the time from irradiating a semiconductor film with laser light by pulse oscillation until the semiconductor film is completely solidified is several tens to several hundreds nsec. Therefore, by using the above frequency band, it is possible to irradiate the next pulse of laser light from when the semiconductor film is melted by the laser light to solidification. Accordingly, since the solid-liquid interface can be continuously moved in the semiconductor film, a semiconductor film having crystal grains continuously grown in the scanning direction is formed. Specifically, a set of crystal grains having a width of 10 to 30 μm in the scanning direction of the included crystal grains and a width of about 1 to 5 μm in a direction perpendicular to the scanning direction can be formed. By forming single crystal grains extending long along the scanning direction, it is possible to form a semiconductor film having almost no crystal grain boundaries in at least the channel direction of the TFT.

  Laser crystallization may be performed by irradiating a continuous-wave fundamental laser beam and a continuous-wave harmonic laser beam in parallel, or a continuous-wave fundamental laser beam and a pulse oscillation harmonic. You may make it irradiate with the laser beam of a wave in parallel.

  Note that laser light may be irradiated in an inert gas atmosphere such as a rare gas or nitrogen. Thereby, roughness of the semiconductor surface due to laser light irradiation can be suppressed, and variation in threshold value caused by variation in interface state density can be suppressed.

  By irradiating the above-described semiconductor film with laser light, a semiconductor film with higher crystallinity is formed. Note that a polycrystalline semiconductor may be formed in advance by a sputtering method, a plasma CVD method, a thermal CVD method, or the like.

  In this embodiment, the semiconductor film is crystallized, but the process may be advanced to a process to be described later while the amorphous silicon film or the microcrystalline semiconductor film is not crystallized. A TFT using an amorphous semiconductor or a microcrystalline semiconductor has an advantage that a manufacturing cost can be reduced and a yield can be increased because the number of manufacturing steps is smaller than that of a TFT using a polycrystalline semiconductor.

Note that a semi-amorphous semiconductor is a film including a semiconductor having an intermediate structure between an amorphous semiconductor and a semiconductor having a crystal structure (including single crystal and polycrystal). This semi-amorphous semiconductor is a semiconductor having a third state which is stable in terms of free energy, and is a crystalline one having a short-range order and having a lattice strain, and having a grain size of 0.5 to 20 nm. It can be dispersed in a single crystal semiconductor. The semi-amorphous semiconductor has its Raman spectrum shifted to a lower wavenumber than 520 cm ⁻¹ , and diffraction peaks of (111) and (220), which are considered to be derived from the Si crystal lattice in X-ray diffraction, are observed. . Further, hydrogen or halogen is contained at least 1 atomic% or more as a neutralizing agent for dangling bonds. Here, for convenience, such a semi-amorphous semiconductor is referred to as SAS. Further, by adding a rare gas element such as helium, argon, krypton, or neon to further promote lattice distortion, stability is improved and a good semi-amorphous semiconductor can be obtained.

  Next, as shown in FIG. 10A, the semiconductor film is patterned to form an island-shaped semiconductor film 503. Then, as shown in FIG. 10B, various semiconductor elements typified by TFTs are formed using the island-shaped semiconductor film 503. Note that in FIG. 10B, the base film 502 and the island-shaped semiconductor film 503 are in contact with each other; however, depending on the semiconductor element, an electrode, an insulating film, or the like is provided between the base film 502 and the island-shaped semiconductor film 503. May be formed. For example, in the case of a bottom gate TFT which is one of semiconductor elements, a gate electrode and a gate insulating film are formed between a base film 502 and an island-shaped semiconductor film 503.

  In FIG. 10B, a top-gate TFT 504 is formed using an island-shaped semiconductor film 503. Specifically, a gate insulating film 507 is formed so as to cover the island-shaped semiconductor film 503, a conductive film is formed over the gate insulating film 507, and patterning is performed, whereby the gate electrode 508 is formed. Then, using the gate electrode 508 or a resist pattern formed and patterned as a mask, an impurity imparting n-type is added to the island-shaped semiconductor film 503 to form a source region, a drain region, an LDD region, and the like. To do. Note that although the TFT 504 is an n-type here, an impurity imparting p-type conductivity is added in the case of a p-type TFT. The TFT 504 can be formed through the above series of steps.

Note that after the gate insulating film 507 is formed, a process of hydrogenating the island-shaped semiconductor film 503 is performed by performing heat treatment at 300 to 450 ° C. for 1 to 12 hours in an atmosphere containing 3 to 100% hydrogen. May be. Further, plasma hydrogenation (using hydrogen excited by plasma) may be performed as another means of hydrogenation. By this hydrogenation step, dangling bonds can be terminated by thermally excited hydrogen. In addition, even if defects are formed in the semiconductor film by bending the support after the semiconductor element is bonded to the flexible support in a later step, hydrogenation in the semiconductor film is caused by hydrogenation. By setting the concentration to 1 × 10 ¹⁹ to 1 × 10 ²² atoms / cm ^3, preferably 1 × 10 ^{19 to} 5 × 10 ²⁰ atoms / cm ³ , the defects are terminated by hydrogen contained in the semiconductor film. be able to. In order to terminate the defect, the semiconductor film may contain halogen.

  Note that a method for manufacturing a TFT is not limited to the above-described structure.

  Next, a passivation film 505 is formed so as to cover the TFT 504. As the passivation film 505, it is preferable to use a silicon nitride film or a silicon nitride oxide film that can prevent alkali metal or alkaline earth metal from entering the TFT 504. With the above structure, since the TFT 504 is covered with the base film 502 and the passivation film 505, alkali metal such as Na or alkaline earth metal diffuses into the semiconductor film used for the semiconductor element, and the characteristics of the semiconductor element are increased. It can prevent a bad influence more.

  Next, a first interlayer insulating film 510 is formed so as to cover the passivation film 505. Then, after forming contact holes in the gate insulating film 507, the passivation film 505, and the first interlayer insulating film 510, wirings 513 and 514 connected to the TFT 504 through the contact holes are in contact with the first interlayer insulating film 510. To form.

  Next, as shown in FIG. 10C, a second interlayer insulating film 515 is formed over the first interlayer insulating film 510. The second interlayer insulating film 515 is formed so as to have an opening at a position where the wiring 514 is partially exposed. Note that as the first interlayer insulating film 510 and the second interlayer insulating film 515, an organic resin film, an inorganic insulating film, and an insulating film including a Si—O—Si bond formed using a siloxane-based material (hereinafter, referred to as an insulating film) (Referred to as a siloxane-based insulating film) or the like. The siloxane insulating film may have at least one of fluorine, an alkyl group, and aromatic hydrocarbon in addition to hydrogen as a substituent.

  Next, as shown in FIG. 10D, an antenna 519 is formed over the second interlayer insulating film 515. The antenna 519 can be formed using a conductive material including one or more metals such as Ag, Au, Cu, Pd, Cr, Mo, Ti, Ta, W, and Al, or a metal compound. The antenna 519 is connected to the wiring 514. Note that in FIG. 10D, the antenna 519 is directly connected to the wiring 514; however, the ID chip of the present invention is not limited to this structure. For example, the antenna 519 and the wiring 514 may be electrically connected using a separately formed wiring.

  The antenna 519 can be formed by a printing method, a photolithography method, an evaporation method, a droplet discharge method, or the like. In this embodiment, the antenna 519 is formed with a single conductive film, but an antenna 519 in which a plurality of conductive films are stacked can also be formed.

  The droplet discharge method means a method of forming a predetermined pattern by discharging droplets containing a predetermined composition from the pores, and includes an ink jet method and the like in its category. The printing method includes a screen printing method and an offset printing method. By using a printing method or a droplet discharge method, the antenna 519 can be formed without using an exposure mask. In addition, unlike the photolithography method, there is no waste of material that is removed by etching in the droplet discharge method and the printing method. In addition, since it is not necessary to use an expensive exposure mask, the cost for manufacturing the ID chip can be suppressed.

  In the case of using a droplet discharge method or various printing methods, for example, conductive particles in which Cu is coated with Ag can be used. Note that in the case where the antenna 519 is formed by a droplet discharge method, it is preferable that treatment for increasing the adhesion of the antenna 519 be performed on the surface of the second interlayer insulating film 515.

  As a method for improving the adhesion, specifically, for example, a method of attaching a metal or a metal compound capable of improving the adhesion of the conductive film or the insulating film to the surface of the second interlayer insulating film 515 by catalytic action. An organic insulating film having high adhesion to the conductive film or insulating film to be formed, a method of attaching a metal or a metal compound to the surface of the second interlayer insulating film 515, and a surface of the second interlayer insulating film 515. Examples include a method of performing surface modification by performing plasma treatment under atmospheric pressure or reduced pressure. Examples of the metal having high adhesion to the conductive film or insulating film include titanium, titanium oxide, 3d transition elements such as Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, and Zn. Is mentioned. Examples of the metal compound include the above-described metal oxides, nitrides, and oxynitrides. Examples of the organic insulating film include polyimide and siloxane insulating films.

  When the metal or metal compound attached to the second interlayer insulating film 515 has conductivity, the sheet resistance is controlled so that the normal operation of the antenna is not hindered. Specifically, the average thickness of the conductive metal or metal compound is controlled to be, for example, 1 to 10 nm, or the metal or metal compound is partially or entirely insulated by oxidation. You can do it. Alternatively, the deposited metal or metal compound may be selectively removed by etching except for the region where the adhesion is desired to be improved. Alternatively, the metal or the metal compound may be selectively attached only to a specific region by using a droplet discharge method, a printing method, a sol-gel method, or the like, instead of attaching the metal or the metal compound to the entire surface of the substrate in advance. Note that the metal or metal compound does not need to be a completely continuous film on the surface of the second interlayer insulating film 515, and may be dispersed to some extent.

  After the antenna 519 is formed, a protective layer 521 is formed over the second interlayer insulating film 515 so as to cover the antenna 519. The protective layer 521 is formed using a material that can protect the antenna 519 when the peeling layer 501 is removed later by etching. For example, the protective layer 521 can be formed by applying an epoxy-based, acrylate-based, or silicon-based resin soluble in water or alcohol over the entire surface.

In this example, a water-soluble resin (manufactured by Toagosei Co., Ltd .: VL-WSHL10) is applied by spin coating so as to have a film thickness of 30 μm, and after exposure for 2 minutes for temporary curing, UV light is applied to the back surface. Exposure to 2.5 minutes and exposure from the surface for a total of 12.5 minutes to perform main curing to form the protective layer 521. In addition, when laminating | stacking several organic resin, there exists a possibility that it may melt | dissolve partially at the time of application | coating or baking with the solvent currently used between organic resins, or adhesiveness may become high too much. Therefore, when the second interlayer insulating film 515 and the protective layer 521 are both made of an organic resin that is soluble in the same solvent, the second interlayer insulating film is removed so that the protective layer 521 can be removed smoothly in the subsequent process. It is preferable to form an inorganic insulating film (SiN _x film, SiN _x O _y film, AlN _x film, or AlN _x O _y film) so as to cover 515.

  Next, as shown in FIG. 11A, a groove 522 is formed in order to separate the ID chips. The groove 522 may be formed to such an extent that the release layer 501 is exposed. The groove 522 can be formed by dicing, scribing, or the like. Note that the groove 522 is not necessarily formed when the ID chip formed over the substrate 500 does not need to be separated.

  Next, as shown in FIG. 11B, it is inspected whether the ID chip operates normally. 523 is an inspection electrode, and 524 is an inspection antenna. Then, the ID chip 525 is sandwiched between the inspection electrode 523 and the inspection antenna 524, and the antenna 529 is sandwiched between the substrate 500 and the inspection electrode 523.

When the inspection is completed, the peeling layer 501 is removed by etching as shown in FIG. In this embodiment, fluorine halide is used as an etching gas, and the gas is introduced from the groove 522. In this embodiment, for example, ClF ₃ (chlorine trifluoride) is used under the conditions of temperature: 350 ° C., flow rate: 300 sccm, atmospheric pressure: 6 Torr, and time: 3 h. Alternatively, a gas in which nitrogen is mixed with ClF ₃ gas may be used. By using halogenated fluorine such as ClF ₃ , the peeling layer 501 is selectively etched, and the substrate 500 can be peeled from the TFT 504. The halogenated fluorine may be a gas or a liquid.

  Next, as illustrated in FIG. 12, the peeled TFT 504 and the antenna 519 are attached to a support 531 using an adhesive 530. As the adhesive 530, a material capable of bonding the support 531 and the base film 502 is used. As the adhesive 530, for example, various curable adhesives such as a reactive curable adhesive, a thermosetting adhesive, a photocurable adhesive such as an ultraviolet curable adhesive, and an anaerobic adhesive can be used.

  As the support 531, an organic material such as flexible paper or plastic can be used. Alternatively, a flexible inorganic material may be used as the support 531. As the plastic substrate, ARTON (manufactured by JSR) made of polynorbornene with a polar group can be used. Polyester represented by polyethylene terephthalate (PET), polyethersulfone (PES), polyethylene naphthalate (PEN), polycarbonate (PC), nylon, polyetheretherketone (PEEK), polysulfone (PSF), polyetherimide (PEI), polyarylate (PAR), polybutylene terephthalate (PBT), polyimide, acrylonitrile butadiene styrene resin, polyvinyl chloride, polypropylene, polyvinyl acetate, acrylic resin and the like. The support 531 preferably has a high thermal conductivity of about 2 to 30 W / mK in order to diffuse the heat generated in the integrated circuit.

  Also, as shown in FIG. 12, after removing the protective layer 521, an adhesive 532 is applied on the second interlayer insulating film 515 so as to cover the antenna 519, and a cover material 533 is bonded thereto. The cover material 533 can be made of a flexible organic material such as paper or plastic, like the support 531. The adhesive 532 is formed using a material that can bond the cover material 533 to the second interlayer insulating film 515 and the antenna 519. As the adhesive 532, for example, various curable adhesives such as a reactive curable adhesive, a thermosetting adhesive, a photocurable adhesive such as an ultraviolet curable adhesive, and an anaerobic adhesive can be used.

  The ID chip is completed through the above-described steps. By the above manufacturing method, an extremely thin integrated circuit having a total film thickness of 0.3 μm to 3 μm, typically about 2 μm, can be formed between the support 531 and the cover material 533. Note that the thickness of the integrated circuit includes not only the thickness of the semiconductor element itself but also the thicknesses of various insulating films and interlayer insulating films formed between the adhesive 530 and the adhesive 532. Further, the area occupied by the integrated circuit included in the ID chip can be set to 5 mm square or less, more desirably about 0.3 mm square to 4 mm square.

  Note that the mechanical strength of the ID chip can be increased by positioning the integrated circuit at a more central position between the support 531 and the cover member 533. Specifically, when the distance between the support 531 and the cover member 533 is d, the adhesive is adjusted so that the distance between the support 531 and the center in the thickness direction of the integrated circuit satisfies the following formula 1. It is desirable to control the thickness of the adhesive 532 at 530.

  If a serial number is engraved on the semiconductor film or insulating film used for the ID chip, for example, even if the ID chip before storing data in the ROM is illegally passed to a third party due to theft, etc. The distribution route can be determined to some extent from the serial number. In this case, it is more effective to engrave the serial number at a position where the semiconductor device cannot be erased unless it is disassembled to such an extent that it cannot be restored.

  Note that the method for peeling the integrated circuit from the substrate 500 is not limited to the method using etching of the silicon film as shown in this embodiment, and various other methods can be used. For example, a metal oxide film can be provided between a substrate having high heat resistance and an integrated circuit, and the integrated circuit can be peeled by weakening the metal oxide film by crystallization. For example, the integrated layer can be peeled from the substrate by breaking the peeling layer by laser light irradiation. Further, for example, the integrated circuit can be peeled from the substrate by mechanically removing the substrate on which the integrated circuit is formed or removing the substrate by etching with a solution or gas.

  In order to ensure the flexibility of the ID chip, in the case where an organic resin is used for the adhesive 530 in contact with the base film 502, a silicon nitride film or a silicon nitride oxide film is used as the base film 502 so that the organic resin can be replaced with Na or the like. The alkali metal or alkaline earth metal can be prevented from diffusing into the semiconductor film.

  In addition, when the surface of the object has a curved surface, and the ID chip support bonded to the curved surface is bent so as to have a curved surface drawn by movement of the generatrix such as a cone surface or a column surface, It is desirable to align the direction of the bus and the direction in which the TFT carrier moves. With the above configuration, even if the support is bent, it can be suppressed that the characteristics of the TFT are affected thereby. In addition, by setting the ratio of the area occupied by the island-shaped semiconductor film in the integrated circuit to 1 to 30%, it is possible to further suppress the influence of the TFT characteristics even if the support is bent. .

  In the present invention, the inspection process is not always performed at the timing shown in this embodiment. The inspection process can be performed any time after the antenna and the integrated circuit are completed.

  Note that although an example in which the antenna is formed over the same substrate as the integrated circuit has been described in this embodiment, the present invention is not limited to this structure. An antenna formed over another substrate and an integrated circuit may be attached to each other.

  In general, the frequency of radio waves used in an ID chip is 13.56 MHz and 2.45 GHz, and it is very important to increase the versatility to form an ID chip so that radio waves of that frequency can be detected. Is important to.

  In addition, the ID chip of this embodiment has an advantage that radio waves are less shielded than an ID chip formed using a semiconductor substrate, and the signal can be prevented from being attenuated by shielding the radio waves.

And since it is not necessary to use a semiconductor substrate, the cost of the ID chip can be greatly reduced. For example, a case where a silicon substrate having a diameter of 12 inches is used is compared with a case where a glass substrate of 730 × 920 mm ² is used. The area of the former silicon substrate is about 73000 mm ² , while the area of the latter glass substrate is about 672000 mm ² , and the glass substrate corresponds to about 9.2 times the silicon substrate. When the area of the latter glass substrate is about 672000 mm ² , ignoring the area consumed by dividing the substrate, it is calculated that about 672,000 1 mm square ID chips can be formed, and the number is about 9.2 times that of the silicon substrate. It is equivalent to the number of Capital investment for mass production of ID chips requires less cost when using a 730 × 920 mm ² glass substrate than when using a 12 inch diameter silicon substrate. It can be done in a third. Further, in the present invention, the glass substrate can be used again after the integrated circuit is peeled off. Therefore, cost can be significantly reduced as compared with the case of using a silicon substrate, even in view of the cost of filling a damaged glass substrate or cleaning the surface of the glass substrate. Even if the glass substrate is discarded without being reused, the cost of a 730 × 920 mm ² glass substrate is about half that of a silicon substrate having a diameter of 12 inches, thus greatly reducing the cost of the ID chip. You can see that

Therefore, it can be seen that when a glass substrate of 730 × 920 mm ² is used, the price of the ID chip can be reduced to about 1/30 compared to the case of using a 12-inch diameter silicon substrate. Since the ID chip is expected to be used on the premise that it is disposable, the ID chip of the present invention, which can significantly reduce the cost, is very useful for the above application.

  This embodiment can be implemented in combination with Embodiment 1 or Embodiment 2.

  In this embodiment, an example of timing for performing the inspection process will be described.

  The inspection process for inspecting the electrical operation of the ID chip can be performed whenever the antenna and the integrated circuit are completed and the antenna and the integrated circuit are electrically connected. Therefore, it can be performed before separating the ID chip, after separating the ID chip, and after peeling the ID chip from the substrate.

  FIG. 13A simply shows the flow of an ID chip manufacturing process in the case where an inspection is performed before the ID chip is separated. In FIG. 13A, before the ID chip 1301 is separated, the operation state of the ID chip 1301 is inspected using the inspection electrode 1302 and the inspection antenna coil 1303. When the inspection is completed, the ID chip 1301 is separated using the blade 1304, and then the ID chip 1301 is peeled off from the substrate 1300 by etching.

  FIG. 13B simply shows the flow of a manufacturing process of an ID chip when an inspection is performed after the ID chip is separated. In FIG. 13B, after the ID chip 1311 is separated by the blade 1314, the operation state of the ID chip 1311 is inspected using the inspection electrode 1312 and the inspection antenna coil 1313. When the inspection is completed, the ID chip 1311 is peeled off the substrate 1310 by etching.

  FIG. 13C simply shows the flow of a manufacturing process of an ID chip when an inspection is performed after the ID chip is peeled off. In FIG. 13C, the separated ID chip 1321 is peeled off from the substrate 1320 by etching and then attached to the tape 1324. The ID chip 1321 may be attached to the tape 1324 before peeling. Then, the operation state of the ID chip 1321 is inspected using the inspection electrode 1322 and the inspection antenna coil 1323 while being attached to the tape 1324. When the inspection is completed, the ID chip 1321 is peeled from the tape 1324. By using the tape 1324 whose adhesive strength is reduced by irradiation with ultraviolet light, it is possible to prevent an excessive force from being applied to the ID chip 1321 at the time of peeling.

  When the inspection is performed after the ID chip 1321 is peeled off as shown in FIG. 13C, even if the substrate 1320 is a semiconductor substrate, radio waves can be uniformly transmitted to all antennas included in the ID chip in the inspection process. it can.

  In this embodiment, the process of separating the substrate after separating the ID chip has been described. However, the present invention is not limited to this structure. For example, the ID chip may be separated by performing dicing in a state where the ID chip is bonded to the tape after peeling. In this case, the inspection step may be performed after the ID chip is bonded to the tape and before the separation, or after the separation.

  This embodiment can be implemented in combination with the first to third embodiments.

  In the present embodiment, a description will be given of how to identify an ID chip determined to be defective after the inspection is completed.

  FIG. 14A shows a top view of the ID chip 1401 before inspection. The ID chip 1401 is formed on the substrate 1400, and similarly, a marker 1402 is formed on the substrate 1400. At the time of inspection, the ID chip 1401 can be aligned with reference to the marker 1402.

  After the inspection, for example, as shown in FIG. 14B, it is assumed that among the ID chips 1401, the ID chip 1401a and the ID chip 1401b are determined to be defective. In this case, the ID chip 1401a and the ID chip 1401b are marked with an ink or a laser so that they can be visually recognized.

  Then, as shown in FIG. 14C, after the ID chip 1401 is separated and peeled from the substrate 1400, the ID chip 1401a determined to be defective and the ID chip 1401b are selected and made into a lot-out. it can.

  This embodiment can be implemented in combination with the first to fourth embodiments.

  In this embodiment, a shape of a groove formed when a plurality of integrated circuits formed over one substrate is peeled will be described. FIG. 15A shows a top view of the substrate 703 in which the groove 701 is formed. FIG. 15B is a cross-sectional view taken along line A-A ′ in FIG.

  The integrated circuit 702 is formed over the peeling layer 704, and the peeling layer 704 is formed over the substrate 703. The groove 701 is formed between the integrated circuits 702 and has a depth enough to expose the release layer 704. Further, in this embodiment, the plurality of integrated circuits 702 are partially separated, not completely, by the grooves 701.

  Next, an etching gas is supplied from the groove 701 shown in FIGS. 15A and 15B and the peeling layer 704 is removed by etching, as shown in FIGS. 15C and 15D. . FIG. 15C corresponds to a top view of the substrate 703 in which the groove 701 is formed, and FIG. 15D corresponds to a cross-sectional view taken along line A-A ′ in FIG. It is assumed that the etching of the peeling layer 704 has progressed from the groove 701 to the region indicated by the broken line 705 by etching. As shown in FIGS. 15C and 15D, the plurality of integrated circuits 702 are separated from each other by the groove 701 in a state of being partially connected to each other, and thus the peeling layer 704 is etched. It is possible to prevent the integrated circuits 702 from moving without support later.

  When the state shown in FIGS. 15C and 15D is formed, a tape, a substrate, or the like to which an adhesive is attached is separately prepared, and the integrated circuit 702 is peeled from the substrate 703. The plurality of separated integrated circuits 702 are attached to a support body before or after being separated from each other.

  Note that this embodiment shows an example of a method for manufacturing an ID chip, and the method for manufacturing an ID chip of the present invention is not limited to the structure shown in this embodiment.

  This embodiment can be implemented in combination with the first to fifth embodiments.

Sectional drawing of the inspection apparatus of this invention. The perspective view of the board | substrate 101, and the enlarged view of ID chip 102. FIG. The perspective view of the electrode 103 for a test | inspection, and the perspective view of the antenna 104 for a test | inspection. The figure which shows a mode that the board | substrate 101, the support body 301, and the support body 303 are piled up, and the figure which shows a mode that the support body 301 shown to FIG. 4 (A) is rotated. The enlarged view of a mode that the ID chip 102 and the inspection antenna 104 overlap. The figure which shows a mode that the some electrode 103 for an inspection and the some ID chip 102 have overlapped. FIG. 7 is a diagram illustrating a state in which one of the inspection electrodes 103 illustrated in FIG. 6B and an ID chip 102 overlap each other. The block diagram which shows the more concrete structure of the test | inspection apparatus of this invention. The block diagram which shows the functional structure of ID chip. FIG. 6 shows a manufacturing process of an ID chip. FIG. 6 shows a manufacturing process of an ID chip. FIG. 6 shows a manufacturing process of an ID chip. The figure which shows the flow of the manufacturing process of ID chip. FIG. 9 is a top view of an ID chip 1401. The figure which shows the shape of the groove | channel formed when peeling the some integrated circuit formed on one board | substrate.

Explanation of symbols

101 Substrate 102 ID chip 102a ID chip 103 Inspection electrode 104 Inspection antenna 105 Position control means 106 Position control means 107 Position control means 108 Potential measurement means 109 Voltage supply means 110 Camera 1300 Substrate 1301 ID chip 1302 Inspection electrode 1303 For inspection Antenna coil 1304 Blade 1310 Substrate 1311 ID chip 1312 Inspection electrode 1313 Inspection antenna coil 1314 Blade 1320 Substrate 1321 ID chip 1322 Inspection electrode 1323 Inspection antenna coil 1324 Tape 1400 Substrate 1401 ID chip 1401a ID chip 1401b ID chip 1402 Marker 201 Integrated circuit 202 Antenna 301 Support body 302 Hole 303 Support body 500 Substrate 501 Release layer 502 Base film 50 The semiconductor film 504 TFT
505 Passivation film 507 Gate insulating film 508 Gate electrode 510 Interlayer insulating film 513 Wiring 514 Wiring 515 Interlayer insulating film 519 Antenna 521 Protective layer 522 Groove 523 Inspection electrode 524 Inspection antenna 525 ID chip 529 Antenna 530 Adhesive 531 Support 532 Adhesion Agent 533 Cover material 701 Groove 702 Integrated circuit 703 Substrate 704 Release layer 705 Broken line 801 Inspection electrode 802 Inspection antenna 803 Position control means 804 Voltage supply means 805 Potential measurement means 806 Analysis means 807 ID chip 808 Man machine I / F
809 Measurement controller 810 Measurement sequencer 811 Oscillator 812 Signal source 813 Modulation circuit 814 Antenna controller 815 Signal processing circuit 816 Selection circuit 817 Signal analyzer 900 Antenna 901 Integrated circuit 902 Antenna coil 903 Capacitance element 904 Modulation circuit 905 Rectification circuit 906 Micro Processor 907 memory 908 switch 909 demodulation circuit

Claims (19)

A plurality of inspection electrodes; a plurality of inspection antennas; position control means; a means for applying a voltage to each of the plurality of inspection antennas; and a means for measuring potentials of the plurality of inspection electrodes. And
By the position control means, a plurality of chips and the plurality of inspection electrodes are overlapped with an interval, the plurality of chips and the plurality of inspection antennas are overlapped with an interval, and the plurality of the plurality of inspection electrodes are overlapped. An inspection apparatus, wherein a chip is sandwiched between the plurality of inspection electrodes and the plurality of inspection antennas. A plurality of inspection electrodes; a plurality of inspection antennas; position control means; a means for applying a voltage to each of the plurality of inspection antennas; and a means for measuring potentials of the plurality of inspection electrodes. And
Analyzing the data having the measured potentials of the plurality of inspection electrodes as information and the data having the positions of the plurality of chips and the positions of the plurality of inspection electrodes as information, information on the operation state of the chips Means for obtaining data including
By the position control means, a plurality of chips and the plurality of inspection electrodes are overlapped with an interval, the plurality of chips and the plurality of inspection antennas are overlapped with an interval, and the plurality of the plurality of inspection electrodes are overlapped. An inspection apparatus, wherein a chip is sandwiched between the plurality of inspection electrodes and the plurality of inspection antennas. A plurality of inspection electrodes; a plurality of inspection antennas; position control means; a means for applying a voltage to each of the plurality of inspection antennas; and a means for measuring potentials of the plurality of inspection electrodes. And
The position control means superimposes the plurality of chips formed on the substrate and the plurality of inspection electrodes at intervals, and overlaps the plurality of chips and the plurality of inspection antennas at intervals. In addition, the plurality of chips can be sandwiched between the plurality of inspection electrodes and the plurality of inspection antennas,
The inspection apparatus, wherein the substrate is sandwiched between the plurality of chips and the plurality of inspection antennas by the position control means. A plurality of inspection electrodes; a plurality of inspection antennas; position control means; a means for applying a voltage to each of the plurality of inspection antennas; and a means for measuring potentials of the plurality of inspection electrodes. And
Analyzing the data having the measured potentials of the plurality of inspection electrodes as information and the data having the positions of the plurality of chips and the positions of the plurality of inspection electrodes as information, information on the operation state of the chips Means for obtaining data including
The position control means superimposes the plurality of chips formed on the substrate and the plurality of inspection electrodes at intervals, and overlaps the plurality of chips and the plurality of inspection antennas at intervals. In addition, the plurality of chips can be sandwiched between the plurality of inspection electrodes and the plurality of inspection antennas,
The inspection apparatus, wherein the substrate is sandwiched between the plurality of chips and the plurality of inspection antennas by the position control means.   5. The inspection apparatus according to claim 3, wherein the substrate is an insulator.   6. The inspection apparatus according to claim 5, wherein the substrate is a glass substrate or a plastic substrate. In any one of Claims 1 thru | or 6,
The position control means controls the distance between the plurality of chips and the plurality of inspection electrodes by flowing a fluid. Using the antenna of each of the plurality of chips, supplying a signal or power supply voltage to each of the plurality of chips in a non-contact manner,
The inspection electrode is moved while being overlapped with an arbitrary part or all of the antenna of each of the plurality of chips with a gap between them,
An inspection method characterized by grasping an operation state of each of the plurality of chips from a voltage of the inspection electrode and a position of the inspection electrode with respect to the plurality of chips. By overlapping the antennas and inspection electrodes of each of the plurality of chips with a gap therebetween, a signal or a power supply voltage is supplied to each of the plurality of chips in a non-contact manner,
The inspection electrode is moved while being overlapped with an arbitrary part or all of the antenna of each of the plurality of chips at an interval,
An inspection method characterized by grasping an operation state of each of the plurality of chips from a voltage of the inspection electrode and a position of the inspection electrode with respect to the plurality of chips.   10. The inspection method according to claim 8, wherein the chip includes a substrate, an antenna and an integrated circuit over the substrate, and the substrate is an insulator.   The inspection method according to claim 10, wherein the substrate is a glass substrate or a plastic substrate.   The inspection according to any one of claims 8 to 11, wherein the distance between the inspection electrode and the antenna of each of the plurality of chips is controlled by flowing a fluid. Method. In any one of Claims 8 to 12,
The operation state of each of the plurality of chips can be grasped by calculating the voltage applied to the antenna of each of the plurality of chips by using a successive approximation method, a Fourier transform method using a projection cut surface theorem, or a superposition integration method. Inspection method characterized by performing. A plurality of TFTs are formed on the substrate,
An antenna is formed on the TFT,
Forming an interlayer insulating film on the antenna;
A plurality of chips are formed by forming a protective layer on the interlayer insulating film so as to cover the antenna,
Using the antenna of each of the plurality of chips, supplying a signal or power supply voltage to each of the plurality of chips in a non-contact manner,
The inspection electrode is moved while being overlapped with an arbitrary part or all of the antenna of each of the plurality of chips with a gap between them,
From the voltage of the inspection electrode and the position of the inspection electrode with respect to the plurality of chips, perform an inspection to grasp the operating state of each of the plurality of chips,
Peeling off the substrate and the TFT and antenna of the chip that has been inspected,
A method of manufacturing a semiconductor device, wherein the peeled TFT and the antenna are bonded to a support. A plurality of TFTs are formed on the substrate,
An antenna is formed on the TFT,
Forming an interlayer insulating film on the antenna;
A plurality of chips are formed by forming a protective layer on the interlayer insulating film so as to cover the antenna,
By overlapping the antennas and inspection electrodes of each of the plurality of chips with a gap therebetween, a signal or a power supply voltage is supplied in a non-contact manner to each of the plurality of chips,
The inspection electrode is moved while being overlapped with an arbitrary part or all of the antenna of each of the plurality of chips with a gap between them,
From the voltage of the inspection electrode and the position of the inspection electrode with respect to the plurality of chips, perform an inspection to grasp the operating state of each of the plurality of chips,
Peeling off the substrate and the TFT and antenna of the chip that has been inspected,
A method of manufacturing a semiconductor device, wherein the peeled TFT and the antenna are bonded to a support.   16. The method for manufacturing a semiconductor device according to claim 14, wherein the substrate used for the chip is an insulator.   17. The method for manufacturing a semiconductor device according to claim 16, wherein the substrate is a glass substrate or a plastic substrate.   18. The semiconductor according to claim 14, wherein the distance between the inspection electrode and the antenna included in each of the plurality of chips is controlled by flowing a fluid. Device manufacturing method. In any one of Claims 14 thru / or Claim 18,
The operation state of each of the plurality of chips can be grasped by calculating the voltage applied to the antenna of each of the plurality of chips by using a successive approximation method, a Fourier transform method using a projection cut surface theorem, or a superposition integration method. A method for manufacturing a semiconductor device, characterized by using an inspection method.

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