JP2005223151A - Welded device terminal inspecting apparatus - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a welded device terminal inspecting apparatus for inspecting poor welding between a device main body such as a capacitor or a cell, and terminal members at a low cost. <P>SOLUTION: Two light receiving units 22 and 32 are arranged to aim at a working point 6y whereto a laser beam is applied, and receive luminous fluxes from the working point 6y. A scattered light sensing unit inspects the luminous flux received by the light receiving unit 22, one of the two light receiving units, and senses the intensity of the scattered light having the same frequency as the laser beam. A temperature sensing unit senses the intensity of thermal infrared rays in the luminous flux received by the other light receiving unit 32. A laser output sensing unit is supplied with a laser output signal indicating the magnitude of the power of the laser beam applied to the working point 6y. A controlling unit determines the acceptability of the welding accomplished at the working point 6y based on the intensity of the scattered light sensed by the scattered light sensing unit on the intensity of the thermal infrared rays sensed by the temperature sensing unit, and on the laser output signal supplied to the laser output sensing unit. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

  The present invention relates to a device terminal welding inspection apparatus.

Conventionally, for example, a coin-type capacitor 2 as shown in FIG. 4 is used as a backup power source for a mobile device such as a mobile phone. In this capacitor 2, terminal members 6 and 8 are welded to the electrode surfaces of the main body 4, and the portions 6a and 8a indicated by diagonal lines of the terminal members 6 and 8 are reflow-soldered, for example, on a printed circuit board. (For example, refer to Patent Document 1).
JP-A-6-151230

  By the way, if there is a defect in the welded portion between the main body 4 and the terminal members 6 and 8, it causes a trouble when the capacitor 2 is mounted, and causes a malfunction after the mounting. Therefore, it is desirable to inspect the welded part.

  However, if an inspection process for inspecting the welded portion is provided after the welding process for welding the terminal members 6 and 8, the manufacturing cost increases, which is not practical.

  In view of such a situation, the present invention is intended to provide a device terminal welding inspection apparatus that can inspect a welding failure between a device body such as a capacitor and a battery and a terminal member at low cost.

  In order to solve the above-described problems, the present invention provides a device terminal welding inspection apparatus configured as follows.

  The device terminal welding inspection apparatus includes two light receiving units, a scattered light detection unit, a temperature detection unit, a laser output detection unit, and a control unit. The two light receiving portions are arranged so as to look at a processing point for irradiating a laser beam for welding the terminal member to the device main body, and receive a light beam from the processing point. The scattered light detection unit detects the intensity of the scattered light having the same wavelength component as that of the laser beam for the light beam received by one of the light receiving units. The said temperature detection part detects the intensity | strength of a thermal infrared ray about the light beam received by the said other light-receiving part. The laser output detection unit receives a laser output signal indicating the magnitude of the power of the laser beam applied to the processing point. The control unit is based on the scattered light intensity detected by the scattered light detection unit, the thermal infrared intensity detected by the temperature detection unit, and the laser output signal input to the laser output detection unit. Whether the device main body and the terminal member are welded at the processing point is determined.

  In the above configuration, the intensity of scattered light from the processing point differs between when the device main body and the terminal member are arranged in the correct positional relationship with respect to the processing point and when it is not. Such a difference that causes poor welding is caused by the intensity of the laser beam applied to the processing point, that is, the laser output signal input to the laser output detection unit, and the intensity of the scattered light from the processing point, that is, the scattered light detection unit. Can be detected based on the intensity of the scattered light detected by.

  Moreover, since the heat transfer phenomenon of the heat generated by laser welding is different between the normal state in which the terminal member is in close contact with the device body and the case where it is not, the manner of temperature rise at the processing point is different. Such a difference that causes welding failure can be detected by monitoring the temperature of the processing point, that is, the intensity of thermal infrared rays detected by the temperature detection unit.

  According to the above configuration, the welding process for welding the terminal member to the device body and the inspection process for inspecting the welded portion are performed in parallel, and the inspection process can be completed almost simultaneously with the end of the welding process. An inspection process may not be provided later.

  According to the device terminal welding inspection apparatus of the present invention, it is possible to inspect for poor welding between a device body such as a capacitor and a battery and a terminal member at a low cost.

  Examples of the present invention will be described below with reference to FIGS.

  As shown in FIG. 1, the device terminal welding inspection apparatus is configured in combination with a laser welding machine. That is, the laser welding machine spot welds the terminal members 6 and 8 to each electrode surface of the device body 4 of the coin-type capacitor 2, for example. In the drawing, the portions indicated by reference numerals 6x, 6y, 8x, and 8y are processing points where the laser beam emitted from the emission unit 12 of the laser welding machine is condensed and spot-welded.

  As described later, the laser welding machine outputs a laser output signal indicating the magnitude of the power of the laser beam, and the laser output signal is input to the control unit 40 of the device terminal welding inspection apparatus. . For example, YAG laser welder ML-2150A manufactured by Miyachi Technos Co., Ltd. is used as the laser welder. Since this YAG laser welding machine controls laser power with a predetermined waveform pattern by sampling the laser output in the lamp excitation module in real time, it can output a laser output signal in real time.

  In the device terminal welding inspection apparatus, two types of light receiving portions 22 and 32 are arranged so as to receive a light beam from the processing point so as to look at the processing point where the laser beam from the laser welding machine is condensed. Yes.

  One light receiving unit 22 is for detecting scattered light from a processing point associated with laser beam irradiation. That is, the light beam received by the light receiving unit 22 is transmitted through a band-pass filter (not shown) through the same wavelength component as the laser beam irradiated by the laser welding machine, and is received by a photodiode (not shown). These band-pass filters and photodiodes (not shown) constitute a part of the scattered light detection unit 20 in FIG.

  The other light receiving part 32 is for detecting the temperature of the processing point. That is, the light beam received by the light receiving unit 32 is transmitted by a thermal infrared ray through a band-pass filter (not shown) and received by a photodiode (not shown). These band-pass filters and photodiodes (not shown) constitute a part of the temperature detection unit 30 in FIG.

  In FIG. 1, the light receiving portions 22 and 32 are shown only for the processing point 6y. However, when the laser beam of the laser welding machine is branched and a plurality of processing points are welded at the same time, for each location. The light-receiving portions 22 and 32 may be provided in the main body.

  FIG. 2 is a block diagram of the device terminal welding inspection apparatus. The control unit 40 is connected to the laser welding machine 10, the scattered light detection unit 20, the temperature detection unit 30, the display unit 42, the operation unit 44, and the storage unit 46.

  The control unit 40 controls the entire device terminal welding inspection apparatus. The control unit 40 is connected to the laser welding machine 10 and receives a laser output signal indicating the magnitude of the power of the laser beam applied to the processing point. The scattered light detection unit 20 detects the intensity of the scattered light having the same wavelength component as that of the laser beam for the light beam received by the light receiving unit 22 and sends a scattered light detection signal to the control unit 40. The temperature detection unit 30 detects the intensity of thermal infrared light corresponding to the temperature of the processing point for the light beam received by the light receiving unit 32 and sends a temperature detection signal to the control unit 40. The display unit 42 is a monitor or the like for displaying data to the operator. The operation unit 44 is a switch or the like operated by an operator. The storage unit 46 is a ROM that stores an operation program of the control unit 40, a memory that temporarily stores data, and the like.

  FIG. 3 shows an example of a change in signal output in one-shot spot welding. The laser output signal of the laser welding machine 10 indicated by reference numeral 14 changes with a predetermined waveform pattern. The scattered light detection signal from the scattered light detection unit 20 indicated by reference numeral 24 changes in a pattern substantially similar to the laser output signal 14 of the laser welding machine 10. The temperature detection signal from the temperature detection unit 30 indicated by reference numeral 34 rises to the maximum temperature 36 and then falls.

  Based on the output of these signals 14, 24, and 34, the controller 40 determines whether or not welding is good.

Specifically, the control unit 40 samples the laser output signal 14 at predetermined time intervals and adds the sampling data. The added data P ₁ corresponds to the area of the portion indicated by the solid line hatched in FIG. Similarly, the scattered light detection signal 24 is sampled at predetermined time intervals, and the sampling data is added. The added data P ₂ corresponds to the area of the portion indicated by the dotted line hatching in FIG. For the temperature detection signal 34, sampling is performed at predetermined time intervals, holds the peak value P _3. The peak value P ₃ corresponds to the highest temperature indicated by reference numeral 36 in FIG. 3.

After the end of one shot of laser welding, the control unit 40 determines the quality of welding based on the _three data P ₁ , P ₂ , and P ₃ .

Specifically, when the following expressions (1) and (2) are satisfied at the same time, it is determined as “good”, and when at least one of the expressions (1) and (2) is not satisfied, “ It is determined as “bad”.
P ₁ −Δ ₁ <K ₂ × P ₂ <P ₁ + Δ ₂ (1)
T ₁ <K ₃ × P ₃ <T ₂ (2)
Here, Δ ₁ , Δ ₂ , T ₁ , T ₂ , K ₂ , K ₃ are predetermined constants.

  That is, when the device main body 4 and the terminal members 6 and 8 are arranged in a correct positional relationship with respect to the processing point, and when the device main body 4 and the terminal members 6 and 8 are not, for example, as indicated by the chain line in FIG. The strength of is different. Such a difference that causes poor welding is caused by the intensity of the laser beam irradiated to the processing point, that is, the laser output signal 14 input to the control unit 40, and the intensity of scattered light from the processing point, that is, the scattered light detection unit. The intensity of the scattered light detected by 20, that is, the scattered light detection signal 24 can be detected by comparing with the equation (1).

  Further, since the heat transfer phenomenon of heat generated by laser welding is different between the normal state in which the terminal members 6 and 8 are in close contact with the device body 4 and the case where the terminal members 6 and 8 are not, for example, as shown by the chain line in FIG. The mode of temperature rise is different. Such a difference that causes a welding failure is detected by monitoring the temperature of the processing point, that is, the intensity of the thermal infrared rays detected by the temperature detection unit 30, that is, the temperature detection signal 34, by the equation (2). Can do.

  The device terminal welding inspection apparatus configured as described above can determine the quality of welding almost simultaneously with the end of the welding process. Since the inspection process proceeds in parallel with the welding process by the laser welding machine, the inspection can be performed at low cost.

  In addition, this invention is not limited to the said Example, It is possible to implement in another various aspect.

  For example, the data processing for determining the quality of welding may be other than integration of a laser output signal and scattered light detection signal, and peak hold of a temperature detection signal.

It is a principal part block diagram of the device terminal welding inspection apparatus which shows embodiment of this invention. It is a block diagram of this apparatus. It is a graph which shows the change of the signal output in this apparatus. It is the (a) front view and (b) bottom view which show the example which welded the terminal member to the device main body.

Explanation of symbols

4 Body (Device body)
6 Terminal member 6x, 6y Machining point 8 Terminal member 8x, 8y Machining point 20 Scattered light detection unit 22 Light receiving unit 30 Temperature detection unit 32 Light receiving unit 40 Control unit

Claims (1)

Two light receiving portions arranged so as to stare at a processing point for irradiating a laser beam for welding a terminal member to the device body, and receiving a light beam from the processing point;
A scattered light detector that detects the intensity of scattered light having the same wavelength component as the laser beam for the light beam received by one of the light receivers;
For the light beam received by the other light receiving unit, a temperature detecting unit for detecting the intensity of thermal infrared radiation,
A laser output detector that receives a laser output signal indicating the magnitude of the power of the laser beam applied to the processing point;
Based on the scattered light intensity detected by the scattered light detection unit, the thermal infrared intensity detected by the temperature detection unit, and the laser output signal input to the laser output detection unit, the device body at the processing point A device terminal welding inspection apparatus, comprising: a control unit that determines whether or not welding between the terminal member and the terminal member is acceptable.

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