JP2005201641A - Test piece conveying device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a conveying device for conveying a test piece to a target portion (for example, an optical measuring part), capable of conveying the test piece to the target portion with a proper attitude. <P>SOLUTION: This device 1 for conveying the test piece 2 with the attitude orthogonal to the conveyance direction D1 is provided with a pair of constraining faces 70A, 70B for constraining the test piece 2 in the D3, D4 directions. Preferably, the constraining faces 70A, 70B are provided with guide parts 71A, 71B for regulating the end position of the test piece 2 when the test piece 2 is transferred from specific mounting parts 40a, 40b to other mounting parts 40a, 40b. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

  The present invention relates to a transport apparatus for transporting a test piece to a target site (for example, an optical measurement unit).

  As an apparatus for transporting a test piece to an optical measurement unit or the like, there is an apparatus provided with a clamp mechanism configured to be reciprocally movable as disclosed in Patent Document 1, for example. As shown in FIGS. 9 to 11 of the present application, the transport device 9 disclosed in the above document has a rail 91 in which a plurality of concave portions 90 are arranged in the transport direction D1, and in this rail 91, a clamp is provided. By using the mechanism 92, the test pieces 93 are sequentially transferred to the adjacent recesses 90, whereby a plurality of test pieces 93 are conveyed. The clamp mechanism 92 has upper and lower sandwiching elements 95 and 96 held by the case 94. The upper and lower pinching elements 95 and 96 are swingable and can clamp one end portion of the test piece 93. The upper and lower pinching elements 95 and 96 are linked to a swing arm 98 that reciprocally swings according to the rotational movement of the rotary cam 97 in the drawing. It is comprised so that it may reciprocate to D1, D2. The sandwiching elements 95 and 96 are swingable in the vertical direction and are urged in the direction in which the tip ends open. The lower pinching element 96 is connected to an elevating cam 99 that moves up and down according to the rotational movement of the rotary cam 97, and swings according to the vertical movement of the elevating cam 99. On the other hand, the upper sandwiching element 95 is attached to the lower sandwiching element 96 when the lower sandwiching element 96 is further swung upward after the lower sandwiching element 96 comes into close contact with the lower sandwiching element 96 when swung upward. It can be swung upward while in close contact.

  As shown in FIGS. 12A to 12C, in the transport device 9, first, the lower sandwiching element 96 is swung upward to lift one end of the test piece 93 by the lower sandwiching element 96. The test piece 93 is lifted with one end of the test piece 93 held between the pinching elements 95 and 96 by bringing the lower pinching element 96 into close contact with the upper pinching element 95. Such an operation can be performed by rotating the rotary cam 97 (see FIGS. 9 to 11) and moving the elevating cam 99 upward. As expected from FIG. 9, the test piece 93 is further moved to a portion corresponding to the adjacent concave portion 90 by swinging the swing arm 98 in the D1 direction and moving the clamp mechanism 92 in the D1 direction. . Thereafter, the lower pinching element 96 is swung downward to move one end portion of the test piece 93 downward, while opening the tip portions of the pinching elements 95, 96, so that the test piece 93 is placed in the adjacent recess 90. Is transferred. The clamp mechanism 92 is returned to the original position by being moved in the D2 direction by the swing of the swing arm 98 in the D2 direction. By repeating such an operation, the test piece 93 is conveyed while being sequentially moved to the adjacent recesses 90.

  As described above, the conveying device 9 is configured to lift one end of the test piece 93 and repeatedly transfer the test piece 93 to the adjacent recess 90. Therefore, the dimensions of D1 and D2 in the drawing of the recess 90 have a margin with respect to the width dimension of the test piece 93 so that the test piece 93 can be easily lifted by applying a force to one end of the test piece 93. It is necessary to set it to a different dimension. For the same reason, it is necessary to provide flexibility in the longitudinal direction of the test piece 93 when the test piece 93 is placed in the recess 90. Therefore, the test piece 93 is placed in the concave portion 90 in a state where it is relatively easy to move in the length direction and the width direction. On the other hand, in the clamping mechanism 92, after the test piece 93 is lifted by the lower pinching element 96, the test piece 93 is pinched by the upper and lower pinching elements 95, 96. Therefore, a position shift is likely to occur after the test piece 93 is lifted by the lower pinching element 96 until the test piece 93 is pinched by the upper and lower pinching elements 95 and 96. As a result, the test piece 93 is transferred to the adjacent concave portion 90 in the displaced position, and finally, the test piece 93 is transported to the optical measurement unit in the displaced position.

  Further, since the transport device 9 transports the test piece 93 to the optical measurement unit as described above, when the test piece 93 is transported to the optical measurement unit, the test piece 93 has a sample such as urine. Is supplied. Therefore, when the test piece 93 is transported, an excessive sample may adhere to the test piece 93. In this case, the excessive test piece 93 is interposed between the test piece 93 and the concave portion 90, and the concave portion The test piece 93 may stick to 90. In such a case, the positional deviation as described above is more likely to occur.

JP 2000-55923 A

  This invention makes it a subject to enable a test piece to be conveyed to the target site | part with a suitable attitude | position.

  According to a first aspect of the present invention, there is provided an apparatus for transporting a test piece having a long shape in one direction in a posture in which the one direction is orthogonal to the transport direction, and the test piece is restrained in the one direction. There is provided a test piece transporting device including a pair of restraining surfaces for the purpose.

  The pair of constraining surfaces are preferably provided so as to extend in the transport direction at an interval corresponding to the dimension in the one direction of the test piece in a direction orthogonal to the transport direction.

  The test piece transport device further includes, for example, a plurality of placement units arranged in the transport direction for supporting the test piece, and a feeding unit for transferring the test piece to a placement unit adjacent in the transport direction. It is configured as a provision.

  The feeding means is configured to have a plurality of notches arranged in the transport direction, for example. The feeding means can be configured as having a plurality of feeding elements provided at intervals in the orthogonal direction. In this case, it is preferable that a plurality of notches are provided in each feed element, and a plurality of notches of each feed element are provided in a corresponding positional relationship in the orthogonal direction with respect to a plurality of notches of other feed elements.

  The plurality of notches are preferably formed in the same or substantially the same shape, and each notch is preferably configured to have an inclined surface for transporting the test piece in a posture inclined with respect to the transport direction. Each notch is preferably provided with a stopper portion for preventing the test piece from moving in the direction opposite to the conveying direction.

  For example, the test piece transporting apparatus includes a plurality of rails provided at intervals in the orthogonal direction. In this case, it is preferable that a plurality of placement portions are provided on each rail, and the plurality of placement portions of each rail are provided in a corresponding positional relationship in the one direction.

  The feeding means is configured to rotate, for example, in order to transfer a test piece supported by a specific placement unit to another placement unit adjacent to the specific placement unit in the transport direction. The In this case, a guide part for restricting the position of the end of the test piece when the test piece is transferred from the specific placement part to the other placement part is provided on the pair of restraining surfaces. It is preferable to provide it.

  The guide unit is configured to have a plurality of arc surfaces arranged in the transport direction, for example. Each arc surface is preferably provided so as to correspond to the movement locus when the test piece in the movement locus of the feeding means contacts the feeding means.

  According to a second aspect of the present invention, there is provided an apparatus for transporting a test piece having a long shape in one direction in a posture in which the one direction is orthogonal to the transport direction, and the transport for supporting the test piece. And a plurality of placement units arranged side by side in a direction orthogonal to the direction of conveyance and a plurality of feeding elements for transferring a test piece to a placement unit adjacent in the conveyance direction, and Each of the feeding elements has a plurality of notches of the same or substantially the same shape arranged in the transport direction, and each of the notches is for transporting the test piece in a posture inclined with respect to the transport direction. There is provided a test strip transporting device having an inclined surface.

  Preferably, each notch is provided with a stopper portion for preventing the test piece from moving in the direction opposite to the transport direction.

  The test strip transport apparatus 1 shown in FIG. 1 is for transporting the test strip 2 while pitch-feeding it in the transport direction D1 from the test strip supply site to the photometric site, for example. The test strip transport apparatus 1 is configured to be adapted to transport a test strip 2 having a long shape in one direction, and includes a transport table 3, a pair of rails 4A and 4B, a first feed member 5, and a pair. Second feeding members 6A, 6B and a pair of restraining walls 7A, 7B.

  The transfer table 3 defines a transfer area and supports the pair of rails 4A and 4B and the pair of restraining walls 7A and 7B. The transport table 3 is provided with a first slit 31 and a pair of second slits 32A and 32B. The first slit 31 is for allowing the first feed member 5 to move, and is formed between the pair of second slits 32A and 32B so as to extend in the directions of arrows D1 and D2 in the drawing. . The second slits 32A and 32B are for allowing the movement of the second feed members 6A and 6B, and are formed between the pair of restraining walls 7A and 7B so as to extend in the directions D1 and D2 in the figure. ing.

  The pair of rails 4A and 4B are for supporting the test piece 2, and are formed so as to extend in the D1 and D2 directions at regular intervals in the D3 and D4 directions in the figure. Each rail 4A, 4B is provided with a plurality of mounting portions 40a, 40b so as to be aligned in the direction D1, D2 in the drawing. The plurality of placement portions 40a (40b) in each rail 4A (4B) are formed in shapes and positions corresponding to the plurality of placement portions 40b (40a) in the other rail 4B (4A). That is, in the pair of rails 4A (4B), the test piece 2 is supported in a state parallel to the directions D3 and D4.

  As shown in FIG. 2, the first feed member 5 is used for moving the test piece 2 supplied from the outside of the apparatus, for example, to the placement portions 40 a and 40 b located on the most D2 side in the pair of rails 4 </ b> A and 4 </ b> B. It is configured to move circularly by a drive mechanism 8 (see FIGS. 5 and 6) described later. As shown in FIGS. 1 and 2, the first feeding member 5 has a feeding surface 50 for causing interference with the test piece 2 when the test piece 2 is moved. According to the circular motion of the first feed member 5, the feed surface 50 is selected from a state of projecting from the upper surface 30 of the transport table 3 via the first slit 31 and a state of not projecting. . That is, the feed surface 50 is selected so that it moves in a state where the test piece 2 can be moved and a state where it moves in a state where the test piece 2 cannot be moved.

  As shown in FIGS. 1 and 3, the pair of second feeding members 6A and 6B is configured so that the test piece 2 placed on the specific placement portions 40a and 40b in the pair of rails 4A and 4B is placed adjacent to the test piece 2. This is for sequentially feeding pitches to the mounting portions 40a and 40b, and is configured to move circularly by a drive mechanism 8 (see FIGS. 5 and 6) described later. Each of the second feeding members 6A and 6B has a plurality of notches 60A and 60B arranged in the D1 and D2 directions. The plurality of notches 60A (60B) in each second feed member 6A (6B) are formed at positions corresponding to the plurality of notches 60B (60A) of the other second feed member 6B (6A).

  Each notch 60A (60B) passes through the corresponding two mounting portions 40a (40b) in the rail 4A (4B) when the second feed member 6A (6B) is caused to make a circular motion. A pitch between notches 60A (60B) adjacent in the D1 and D2 directions is set. Each notch 60A, 60B has inclined surfaces 61A, 61B and stopper portions 62A, 62B, as clearly shown in FIGS. 4 (a) and 4 (b). As shown in FIG. 4 (a), the inclined surfaces 61A and 61B allow the back surface 20 of the test piece 2 to be moved when the test piece 2 is moved between the adjacent mounting portions 40a and 40b in the rails 4A and 4B. It is for making it closely_contact | adhere and conveying the test piece 2 in the inclined state. On the other hand, as shown in FIG. 4B, the stoppers 62A and 62B are configured so that when the test piece 2 cannot be transported in an appropriate inclined state, the test piece 2 is in the transport direction with respect to the notches 60A and 60B. This is to prevent the movement in the direction D2 in the figure, which is the direction opposite to D1. The stopper portions 62A and 62B are formed as standing surfaces.

  As shown in FIG. 1, the pair of restraining walls 7A and 7B are for suppressing the movement of the test piece 2 in the longitudinal direction when the test piece 2 is conveyed, and in the directions of arrows D3 and D4, The test piece 2 is provided at an interval corresponding to the length dimension. Each constraining wall 7A (7B) has constraining surfaces 70A and 70B facing the other constraining wall 7B (7A). Suppression of movement of the test piece 2 in the longitudinal directions D3 and D4 is substantially secured by the restraining surfaces 70A and 70B. The restraint surfaces 70A and 70B are provided with guide portions 71A and 71B for suppressing lifting of both end portions 21 and 22 of the test piece 2 when the test piece 2 is conveyed. The guide portions 71A and 71B have a plurality of notches 72A and 72B opened downward. Inner surfaces 72Aa and 72Ba of the notches 72A and 72B are formed in an arc shape. That is, the inner surfaces 72Aa and 72Ba of the cutouts 72A and 72B are formed on the end portions 21 and 22 of the test piece 2 when the test piece 2 is transferred from the placement units 40a and 40b to the adjacent placement units 40a and 40b. The form corresponds to an ideal trajectory. Therefore, the guide portions 71A and 71B correct the positions of the end portions 21 and 22 of the test piece 2 in a situation where the test piece 2 is conveyed in an inappropriate posture (see, for example, FIG. 4B). And has a role of transporting the test piece 2 in an appropriate posture (see FIG. 4A).

  As shown in FIG. 5 and FIG. 6, the drive mechanism 8 generates the rotational force from the motor 80 via the first to fourth pulleys 81 to 84, the first feed member 5 and the pair of second feed members 6 </ b> A, It is for transmitting to 6B and rotating these feed members 6A and 6B.

  The motor 80 has a gear 80 </ b> A coupled to the rotation shaft 80 a of the motor 80, and the rotational force from the motor 80 is applied to the first pulley 81 via the gear 80 </ b> A and the gear 81 </ b> A provided on the first pulley 81. Entered. The rotational state of the rotating shaft 80a of the motor 80 is controlled by a control means (not shown), and the rotational speed of the feed members 6A and 6B is adjusted between the gear 80A and the gear 81A to a target speed. A damping mechanism may be provided.

  In the drive mechanism 8, the first feed member 5 and the pair of second feed members 6 </ b> A and 6 </ b> B are supported by the pulleys 81 to 84 via the first and second connecting members 85 and 86.

  The first connecting member 85 includes first and second main shaft portions 85a and 85b, and first to third follower shaft portions 85c to 85e. In the first and second main shaft portions 85a and 85b, a bracket 87 is provided. Is supported rotatably. On the other hand, the second connecting member 86 includes first and second main shaft portions 86a and 86b, and first to third follower shaft portions 86c to 86e. In the first and second main shaft portions 86a and 86b, The bracket 88 is rotatably supported.

  The first and second main shaft portions 85a and 85b (86a and 86b) of the first connecting member 85 (second connecting member 86) are extended in the directions D3 and D4, and the first and third pulleys 81 and 83 ( The second and fourth pulleys 82 and 84) are integrated so as not to rotate relative to each other. That is, the first and second main shaft portions 85a and 85b (86a and 86b) are rotated together with the first and third pulleys 81 and 83 (second and fourth pulleys 82 and 84).

  The first driven shaft portion 85c (86c) of the first connecting member 85 (second connecting member 86) is inserted so as to be rotatable relative to the first feed member 5 in a state extending in the directions D3 and D4. Are connected to the first and second main shaft portions 85a and 85b (86a and 86b) via arm portions 85f and 85g (86f and 86g) extending in the directions D1 and D2. That is, the first driven shaft portion 85c (86c) is provided at a portion offset in the D1 and D2 directions with respect to the first and second main shaft portions 85a and 85b (86a and 86b). Accordingly, the first driven shaft portion 85c (86c) is provided with the first and second main shaft portions 85a and 85b (in response to the rotation of the first and third pulleys 81 and 83 (second and fourth pulleys 82 and 84)). Rotate around 86a, 86b). Thereby, according to rotation of the 1st-4th pulleys 81-84, the 1st feed member 5 is made to rotationally move, and the state which can move the test piece 2 with the feed surface 50 of the 1st feed member 5; The state of being unable to move is repeatedly achieved.

  The second and third follower shaft portions 85d and 85e (86d and 86e) of the first connecting member (second connecting member) 85 (86) extend in the D3 and D4 directions, and the second feed member 6A (6B). ) And is connected to the first and second main shaft portions 85a and 85b (86a and 86b) via arm portions 85h and 85i (86h and 86i) extending in the directions D1 and D2. It has been. That is, the second and third follower shaft portions 85d and 85e (86d and 86e) are provided at portions offset in the D1 and D2 directions with respect to the first and second main shaft portions 85a and 85b (86a and 86b). In response to the rotation of the first and second pulleys 81 and 82 (third and fourth pulleys 83 and 84), the first and second main shaft portions 85a and 85b (86a and 86b) are rotated. Thereby, according to rotation of the 1st-4th pulleys 81-84, 2nd feed member 6A, 6B is circularly moved.

  The second feed members 6A and 6B are arranged so that the cutouts 60A and 60B pass through the portions corresponding to the mounting portions 40a and 40b of the rails 4A and 4B when the second members 6A and 6B make a circular motion. You can make a circular motion. That is, the positions of the cutouts 60A and 60B and the lengths of the arms 85h, 85i, 86h, and 86i in the connecting members 85 and 86 are set so that the cutouts 60A and 60B pass through the target portion. Therefore, when the first to fourth pulleys 81 to 84 are rotated to cause the second feed members 6A and 6B to move circularly, the test piece 2 can be transported by the notches 60A and 60B, and the state in which the test piece 2 cannot be transported. Is repeated.

  Next, the conveyance operation of the test piece 2 in the test piece conveyance apparatus 1 will be described. However, in the test piece transport apparatus 1, the pulleys 81 to 84 are rotated by rotating the rotating shaft 80a of the motor 80, and the first and second feed members 5, 6A, 6B are rotated. Under the circumstances. In the following description, the transport process will be described focusing on one test piece 2, but actually, a plurality of test pieces 2 are transported continuously and simultaneously.

  As shown in FIG. 2, the test piece 2 is supplied to the end portion 41A (41B) on the D2 direction side of the rail 4A (4B), for example, by a test piece supply device (not shown). Is done. The test piece 2 is moved on the rail 4A (4B) by the feed surface 50 of the first feed member 5 according to the circular motion of the first feed member 5, and is positioned on the most D2 direction side in the rail 4A (4B). To the mounting unit 40a (40b). At this time, as shown in FIG. 1, the test piece 2 is positioned between the restraining walls 7A and 7B.

  As shown in FIG. 7A to FIG. 7F, the test piece 2 supplied to the mounting portion 40a (40b) is adjacent by one cycle of circular motion of the second feeding member 6A (6B). It is transferred to the mounting part 40a (40b).

  Specifically, first, as shown in FIGS. 7A to 7C, the notch 60 </ b> A (60 </ b> B) of the second feeding member 6 </ b> A (6 </ b> B) is moved from the lower side to the upper side of the transport table 3. When passing through the mounting portion 40a (40b) of 4A (4B), the test piece 2 of the mounting portion 40a (40b) is lifted by the notch 60A (60B). At this time, in the cutout 60A (60B), the inclined surface 61A (61B) first interferes with the test piece 2, but the movement of the test piece 2 in the direction D2 is suppressed by the stopper portion 62A (62B). Such a movement suppressing effect can be obtained also when the sample is attached to the test piece 2 and the back surface 20 of the test piece 2 is adhered to the mounting portion 40a (40b). As a result, the test piece 2 is lifted by its own weight while being in close contact with the inclined surface 61A (61B) while being located at the deepest portion of the notch 60A (60B). Therefore, the test piece 2 is lifted while maintaining parallelism with respect to the transport direction D1. Moreover, since the movement of the test piece 2 in the longitudinal directions D3 and D4 is restricted by the restraining surface 70A (70B) of the restraining wall 7A (7B), the position of the test piece 2 in the longitudinal directions D3 and D4 is also appropriate. (See FIG. 1).

  Next, as shown in FIGS. 7C to 7E, the notch 60A (60B) of the second feed member 6A (6B) passes above the rails 4A and 4B while drawing an arc locus. As a result, the test piece 2 is moved from the placement portion 40a (40b) to the placement portion 40a (40b) adjacent in the transport direction D1. At this time, as expected from FIGS. 1 and 3, the restraint surface 70A (70B) of the restraint wall 7A (7B) suppresses the movement of the test piece 2 in the longitudinal directions D3 and D4, The upward movement of the end portions 21 and 22 of the test piece 2 is suppressed by the inner surface 72Aa (72Ba) of the notch 72A (72B) in the guide portion 71A (71B). In other words, the test piece 2 is moved to the adjacent placement portion 40a (40b) while maintaining the posture when lifted by the notch 60A (60B).

  Subsequently, as shown in FIGS. 7E and 7F, the notch 60A (60B) of the second feed member 6A (6B) is placed from the upper side to the lower side of the transport table 3 so as to be placed downward. When passing through (40b), the test piece 2 is transferred from the notch 60A (60B) to the mounting portion 40a (40b).

  Such transfer of the test piece 2 to the adjacent mounting portions 40a (40b) is repeatedly performed by circular motions of a plurality of cycles of the second feeding member 6A (6B). When the transfer of the test piece 2 for a certain number of times is completed, the test piece 2 is transferred to the mounting portion 40a (40b) located on the most D1 direction side in the rail 4A (4B). Thereafter, as shown in FIGS. 8A to 8D, the mounting portion 40a located on the most D1 direction side in the rail 4A (4B) according to the circular motion of the second feeding member 6A (6B). (40b) is transferred to the upper surface 30 of the transfer table 3. At this time, the specimen is analyzed for the test piece 2 by, for example, light irradiation and reception of reflected light at that time.

  As expected from FIGS. 8A to 8D, the test piece 2 transferred to the upper surface 30 of the transport table 3 is in a circular motion of the next cycle in the second feeding member 6A (6B). The second feed member 6A (6B) is moved to the end portion of the upper surface 30 of the transport table 3 by the end face 63A (63B). At this time, the next test piece 2 is transferred from the mounting portion 40a (40b) to the upper surface 30 of the transport table 3. In the circular motion of the next cycle in the second feeding member 6A (6B), the next test piece 2 is moved to the end portion on the upper surface 30 of the transfer table 3, so that the test piece 2 falls from the transfer table 3. Be made. Thereby, the test piece 2 is accommodated in the disposal box (not shown) provided adjacent to the conveyance table 3, for example.

  In the test strip transport apparatus 1, movement of the test strip 2 in the longitudinal direction is suppressed in the entire process of transporting the test strip 2. Further, in the process of transferring the test piece 2 to the adjacent placement unit 40a (40b), the parallelism with respect to the directions D3 and D4 orthogonal to the transport direction D1 of the test piece 2 is maintained. Therefore, in the test piece transport apparatus 1, even when the test piece 2 is in the intended posture in the process of transporting the test piece 2, and finally the test piece 2 is transported to the target site, The piece 2 has a desired posture without being displaced.

  The present invention is not limited to the embodiments described above, and can be variously modified. For example, other mechanisms such as a cam mechanism can be adopted as the drive mechanism for circularly moving the first and second feeding members.

It is a perspective view which shows the principal part of the test strip conveying apparatus which concerns on this invention. FIG. 2 is a cross-sectional view for explaining the operation of the first feeding member in the test piece transport apparatus shown in FIG. 1 and corresponding to a cross section taken along line II-II in FIG. 1. It is a principal part side view for demonstrating the operation | movement of the 2nd sending member and the function of a guide part in the test strip conveying apparatus shown in FIG. It is a principal part side view for demonstrating the structure and function of a notch in a 2nd feed member. It is a perspective view for demonstrating the drive mechanism in the test strip conveying apparatus shown in FIG. It is a top view for demonstrating the drive mechanism shown in FIG. It is a principal part side view for demonstrating the operation | movement for conveying a test piece. It is a principal part side view for demonstrating the operation | movement for conveying a test piece. It is a perspective view which shows an example of the conventional test piece conveyance apparatus. It is the perspective view which abbreviate | omitted and showed a part of test piece conveyance apparatus shown in FIG. It is sectional drawing which follows the XI-XI line of FIG. FIG. 10 is a cross-sectional view for explaining the operation of the clamp mechanism in the test piece transport apparatus shown in FIG. 9 and corresponding to a cross section taken along line XI-XI in FIG. 9.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Test piece conveyance apparatus 2 Test piece 21, 22 End part (A) of a test piece 4A, 4B Rail 40A, 40B (Rail) mounting part 6A, 6B 2nd feed member (feed means)
60A, 60B (second feed means) notches 70A, 70B constraining surfaces 61A, 61B (notched) inclined surfaces 62A, 62B (notched) stopper portions 71A, 71B guide portions 72Aa, 72Ba (guide portion) inner surfaces (arc) surface)
D1 Transport direction

Claims (13)

An apparatus for transporting a test piece having a long shape in one direction in a posture in which the one direction is orthogonal to the transport direction,
A test piece transport apparatus comprising a pair of restraining surfaces for restraining the test piece in the one direction.   2. The pair of restraining surfaces according to claim 1, wherein the pair of constraining surfaces are provided so as to extend in the transport direction at an interval corresponding to the dimension in the one direction of the test piece in a direction orthogonal to the transport direction. Test piece conveying device. A plurality of placement units arranged in the transport direction and supporting the test piece; and a feeding means for transferring the test piece to the placement unit adjacent in the transport direction;
The test strip transport apparatus according to claim 1, further comprising:   The test piece transport apparatus according to claim 3, wherein the feeding means has a plurality of notches arranged in the transport direction. The feeding means has a plurality of feeding elements provided at intervals in a direction orthogonal to the transport direction,
The plurality of notches are provided in each feed element,
The test piece transport apparatus according to claim 4, wherein the plurality of notches of each feeding element are provided in a corresponding positional relationship in the orthogonal direction with respect to the plurality of notches of the other feeding elements. The plurality of notches are formed in the same or substantially the same shape,
Each said notch is a test piece conveyance apparatus of Claim 4 or 5 which has the inclined surface for conveying a test piece with the attitude | position inclined with respect to the said conveyance direction.   The test piece transport apparatus according to claim 4, wherein each notch is provided with a stopper portion for preventing the test piece from moving in a direction opposite to the transport direction. A plurality of rails provided at intervals in a direction orthogonal to the conveying direction;
The plurality of placement portions are provided on each rail,
The test piece transport apparatus according to any one of claims 1 to 7, wherein the plurality of mounting portions of each rail are provided in a corresponding positional relationship in the orthogonal direction.   The feeding means is configured to rotate so as to transfer the test piece supported by the specific placement unit to another placement unit adjacent to the specific placement unit in the transport direction. The test strip transport apparatus according to claim 3, wherein   The pair of restraining surfaces are provided with a guide portion for restricting the position of the end portion of the test piece when the test piece is transferred from the specific placement portion to the other placement portion. The test strip conveying apparatus according to claim 9. The guide part has a plurality of arc surfaces arranged in the transport direction,
The test piece transporting device according to claim 10, wherein each of the arc surfaces corresponds to a movement locus when the test piece in the movement locus of the feeding means comes into contact with the feeding means. An apparatus for transporting a test piece having a long shape in one direction in a posture in which the one direction is orthogonal to the transport direction,
A plurality of placement units arranged side by side in the direction perpendicular to the transport direction and the transport direction for supporting the test piece;
A plurality of feeding elements for transferring a test piece to a mounting portion adjacent in the transport direction;
And having
Each feeding element has a plurality of notches of the same or substantially the same shape arranged in the transport direction,
Each said notch has an inclined surface for conveying a test piece in the attitude | position inclined with respect to the said conveyance direction, The test piece conveyance apparatus characterized by the above-mentioned.   The test piece transport apparatus according to claim 12, wherein each notch is provided with a stopper portion for preventing the test piece from moving in a direction opposite to the transport direction.

Images