JP2005159332A5 - - Google Patents
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- JP2005159332A5 JP2005159332A5 JP2004312684A JP2004312684A JP2005159332A5 JP 2005159332 A5 JP2005159332 A5 JP 2005159332A5 JP 2004312684 A JP2004312684 A JP 2004312684A JP 2004312684 A JP2004312684 A JP 2004312684A JP 2005159332 A5 JP2005159332 A5 JP 2005159332A5
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- ultrafine carbon
- channel formation
- semiconductor device
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Claims (15)
前記チャネル形成領域は、極細炭素繊維で形成され、
前記極細炭素繊維の間には、前記極細炭素繊維の間を充填する部材が形成されていることを特徴とする半導体装置。 A source region, a channel formation region, and a drain region stacked in the thickness direction of the substrate, a gate insulating film surrounding the channel formation region, and at least a portion of the channel formation region overlap with each other with the gate insulating film interposed therebetween. It has a gate electrode,
The channel forming region is formed of ultra fine carbon fiber ,
A member filling the space between the ultrafine carbon fibers is formed between the ultrafine carbon fibers .
前記極細炭素繊維の間を充填する部材は、半導体材料で形成されていることを特徴とする半導体装置。 In claim 1 ,
Member for filling between the ultrafine carbon fibers, wherein a that is formed of a semi-conductor material.
前記極細炭素繊維の間を充填する部材は、絶縁材料で形成されていることを特徴とする半導体装置。 In claim 1 ,
The member filling the space between the ultrafine carbon fibers is made of an insulating material.
前記チャネル形成領域は、一本の極細炭素繊維で形成されていることを特徴とする半導体装置。 In any one of Claims 1 thru | or 3 ,
The channel formation region is formed of a single ultrafine carbon fiber.
前記チャネル形成領域は、複数の極細炭素繊維で形成されていることを特徴とする半導体装置。 In any one of Claims 1 thru | or 3 ,
The channel formation region is formed of a plurality of ultrafine carbon fibers.
前記基板の厚さ方向に積層されたソース領域、チャネル形成領域、及びドレイン領域は柱状形状であり、
柱状形状である前記チャネル形成領域を、複数有することを特徴とする半導体装置。 In any one of 請 Motomeko 1 to claim 5,
The source region, the channel formation region, and the drain region stacked in the thickness direction of the substrate have a columnar shape,
It said channel formation region is a columnar shape, a semiconductor device characterized by a plurality.
前記ゲート電極は、柱状形状である複数の前記チャネル形成領域で共通することを特徴とする半導体装置。The semiconductor device according to claim 1, wherein the gate electrode is common to the plurality of channel formation regions having a columnar shape.
前記基板の厚さ方向に積層されたソース領域、チャネル形成領域、及びドレイン領域は柱状形状であり、
前記ゲート電極は、柱状形状である前記チャネル形成領域の両サイドに形成されることを特徴とする半導体装置。 In any one of Claims 1 thru | or 5 ,
The source region, the channel formation region, and the drain region stacked in the thickness direction of the substrate have a columnar shape,
The gate electrode is formed on both sides of the channel formation region having a columnar shape .
前記極細炭素繊維は、グラファイトナノファイバ、カーボンナノファイバ、カーボンナノチューブ、チューブ状グラファイト、カーボンナノコーン、又はコーン状グラファイトであることを特徴とする半導体装置。 In any one of Claims 1 thru | or 8 ,
The ultrafine carbon fiber is a graphite nanofiber, a carbon nanofiber, a carbon nanotube, a tube-like graphite, a carbon nanocone, or a cone-like graphite.
前記金属元素を含む領域上に極細炭素繊維を形成し、
前記極細炭素繊維の間を充填する部材を形成し、
前記極細炭素繊維を包囲するゲート絶縁膜を形成し、
前記ゲート絶縁膜に接するゲート電極を形成し、
前記極細炭素繊維と接続する導電性を有する第2の領域を形成することを特徴とする半導体装置の作製方法。 A region including a metal element is selectively formed over the first region having conductivity,
Forming an ultrafine carbon fiber on the region containing the metal element;
Forming a member filling the space between the ultrafine carbon fibers;
Forming a gate insulating film surrounding the ultrafine carbon fiber;
Forming a gate electrode in contact with the gate insulating film;
A method for manufacturing a semiconductor device, wherein the second region having conductivity connected to the ultrafine carbon fiber is formed.
前記金属元素を含む領域上に極細炭素繊維を形成した後、半導体材料を形成し、
前記半導体材料に、レーザ光を照射して前記極細炭素繊維の間を半導体材料で充填し、
前記半導体材料の一部を除去した後、
前記極細炭素繊維を包囲するゲート絶縁膜を形成し、
前記ゲート絶縁膜に接するゲート電極を形成し、
前記極細炭素繊維と接続する導電性を有する第2の領域を形成することを特徴とする半導体装置の作製方法。 A region including a metal element is selectively formed over the first region having conductivity,
After the formation of ultrafine carbon fibers on a region including the metal element to form a semiconductor material,
Wherein the semiconductor material is irradiated with laser light by filling between the ultrafine carbon fibers semiconductor materials,
After removing a portion of the semiconductor materials,
Forming a gate insulating film surrounding the ultrafine carbon fiber;
Forming a gate electrode in contact with the gate insulating film;
A method for manufacturing a semiconductor device, comprising forming a second region having conductivity connected to the ultrafine carbon fiber.
前記レーザ光は、連続発振のレーザから照射されるレーザ光であることを特徴とする半導体装置の作製方法。 In claim 11 ,
The method for manufacturing a semiconductor device, wherein the laser light is laser light emitted from a continuous wave laser.
前記金属元素は、ニッケル、鉄、コバルト、白金、ゲルマニウム、チタン、又はパラジウムから選ばれた元素、または前記元素を主成分とする合金材料若しくは化合物であることを特徴とする半導体装置の作製方法。 In any one of Claims 10 to 12 ,
The metal elemental a method for manufacturing a semiconductor device comprising nickel, iron, cobalt, platinum, germanium, titanium, or an element selected from palladium, or that an alloy material or a compound mainly containing the element .
前記導電性を有する第1の領域及び前記導電性を有する第2の領域は、ソース領域及びドレイン領域であることを特徴とする半導体装置の作製方法。 In any one of Claims 10 to 13 ,
The method for manufacturing a semiconductor device, wherein the first region having conductivity and the second region having conductivity are a source region and a drain region.
前記極細炭素繊維は、グラファイトナノファイバ、カーボンナノファイバ、カーボンナノチューブ、チューブ状グラファイト、カーボンナノコーン、又はコーン状グラファイトであることを特徴とする半導体装置の作製方法。 In any one of Claims 10 to 14 ,
The ultrafine carbon fibers, a method for manufacturing a semiconductor device comprising graphite nanofibers, carbon nanofibers, carbon nanotubes, tubular graphite, that the carbon nano cone or cone-like graphite.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004312684A JP4762522B2 (en) | 2003-10-28 | 2004-10-27 | Method for manufacturing semiconductor device |
Applications Claiming Priority (3)
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JP2003368159 | 2003-10-28 | ||
JP2003368159 | 2003-10-28 | ||
JP2004312684A JP4762522B2 (en) | 2003-10-28 | 2004-10-27 | Method for manufacturing semiconductor device |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2010271734A Division JP5250615B2 (en) | 2003-10-28 | 2010-12-06 | Semiconductor device |
Publications (3)
Publication Number | Publication Date |
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JP2005159332A JP2005159332A (en) | 2005-06-16 |
JP2005159332A5 true JP2005159332A5 (en) | 2007-11-22 |
JP4762522B2 JP4762522B2 (en) | 2011-08-31 |
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Family Applications (1)
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JP2004312684A Expired - Fee Related JP4762522B2 (en) | 2003-10-28 | 2004-10-27 | Method for manufacturing semiconductor device |
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JP (1) | JP4762522B2 (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7829883B2 (en) * | 2004-02-12 | 2010-11-09 | International Business Machines Corporation | Vertical carbon nanotube field effect transistors and arrays |
US7135773B2 (en) * | 2004-02-26 | 2006-11-14 | International Business Machines Corporation | Integrated circuit chip utilizing carbon nanotube composite interconnection vias |
WO2006038504A1 (en) * | 2004-10-04 | 2006-04-13 | Matsushita Electric Industrial Co., Ltd. | Vertical field effect transistor and method for making the same |
CN101687631A (en) * | 2007-03-28 | 2010-03-31 | 昆南诺股份有限公司 | Nanowire circuit architecture |
WO2009004793A1 (en) * | 2007-07-03 | 2009-01-08 | Panasonic Corporation | Semiconductor device, semiconductor device manufacturing method and image display device |
WO2009137222A2 (en) * | 2008-04-11 | 2009-11-12 | Sandisk 3D, Llc | Memory cell that includes a carbon nano-tube reversible resistance-switching element and methods of forming the same |
JP2011187901A (en) * | 2010-03-11 | 2011-09-22 | Canon Inc | Method of manufacturing semiconductor device |
JP6250210B2 (en) * | 2017-04-11 | 2017-12-20 | ユニサンティス エレクトロニクス シンガポール プライベート リミテッドUnisantis Electronics Singapore Pte Ltd. | Semiconductor device |
CN113471298A (en) * | 2021-06-23 | 2021-10-01 | Tcl华星光电技术有限公司 | Thin film transistor, display panel and electronic device |
Family Cites Families (1)
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KR100360476B1 (en) * | 2000-06-27 | 2002-11-08 | 삼성전자 주식회사 | Vertical nano-size transistor using carbon nanotubes and manufacturing method thereof |
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2004
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