JP2005027474A5 - - Google Patents

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Publication number
JP2005027474A5
JP2005027474A5 JP2003270456A JP2003270456A JP2005027474A5 JP 2005027474 A5 JP2005027474 A5 JP 2005027474A5 JP 2003270456 A JP2003270456 A JP 2003270456A JP 2003270456 A JP2003270456 A JP 2003270456A JP 2005027474 A5 JP2005027474 A5 JP 2005027474A5
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JP
Japan
Prior art keywords
inverter
test
shipping
automatic
program
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
JP2003270456A
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Japanese (ja)
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JP2005027474A (en
Filing date
Publication date
Application filed filed Critical
Priority to JP2003270456A priority Critical patent/JP2005027474A/en
Priority claimed from JP2003270456A external-priority patent/JP2005027474A/en
Priority to CN 200480017475 priority patent/CN1809955A/en
Priority to PCT/JP2004/008190 priority patent/WO2005004319A1/en
Priority to TW093119195A priority patent/TW200509511A/en
Publication of JP2005027474A publication Critical patent/JP2005027474A/en
Publication of JP2005027474A5 publication Critical patent/JP2005027474A5/ja
Abandoned legal-status Critical Current

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Claims (3)

被試験物としてのインバータを駆動する出荷自動試験装置であって前記インバータに所望の電圧・電流を発生させる試験用プログラムを備えたものにおいて、前記試験用プログラムの設定により前記インバータの加速時間および減速時間を可変として自動制御し、前記インバータの保護機能を自動にて試験可能としたことを特徴とするインバータの出荷自動試験装置。 An automatic shipping test apparatus for driving an inverter as a device under test, which includes a test program for generating a desired voltage / current in the inverter, and the acceleration time and deceleration of the inverter according to the setting of the test program An inverter automatic shipping test apparatus, wherein the inverter is automatically controlled with variable time, and the protection function of the inverter can be automatically tested. 前記試験用プログラムが前記インバータ内の不良なパワー半導体を破損させる所定の高電圧又は高電流を前記インバータに発生させるプログラムを備えていることを特徴とする請求項１記載のインバータの出荷自動試験装置。 Predetermined according to claim 1, wherein the inverter shipping automatic test apparatus characterized by a high voltage or high current and a program to be generated in the inverter damaging the defective power semiconductor of said test program in said inverter . 請求項２記載のインバータの出荷自動試験装置を被試験物としてのインバータの入力側に接続し、前記インバータの出力側に無負荷の試験用モータを接続し、前記出荷試験装置の試験用プログラムの設定により、前記インバータに対して前記試験用モータの急加速ならびに急減速を繰り返し行わせることで、前記インバータ内の不良なパワー半導体に高電圧又は高電流を与えて破損させ、初期不良品を摘出することを可能としたことを特徴とするインバータの出荷自動試験方法。 An automatic shipping test apparatus for an inverter according to claim 2 is connected to an input side of an inverter as a test object, an unloaded test motor is connected to an output side of the inverter, and a test program for the shipping test apparatus is By setting the inverter to repeatedly accelerate and decelerate the test motor repeatedly , the defective power semiconductor in the inverter is damaged by applying high voltage or high current, and initial defective products are extracted. Inverter shipping automatic test method characterized in that it can be done.
JP2003270456A 2003-07-02 2003-07-02 Apparatus and method for delivery automatic inspection for inverter Abandoned JP2005027474A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2003270456A JP2005027474A (en) 2003-07-02 2003-07-02 Apparatus and method for delivery automatic inspection for inverter
CN 200480017475 CN1809955A (en) 2003-07-02 2004-06-11 Device and method for automatically performing inverter shipment test
PCT/JP2004/008190 WO2005004319A1 (en) 2003-07-02 2004-06-11 Device and method for automatically performing inverter shipment test
TW093119195A TW200509511A (en) 2003-07-02 2004-06-29 Test device and method for automatically performing converter shipping

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003270456A JP2005027474A (en) 2003-07-02 2003-07-02 Apparatus and method for delivery automatic inspection for inverter

Publications (2)

Publication Number Publication Date
JP2005027474A JP2005027474A (en) 2005-01-27
JP2005027474A5 true JP2005027474A5 (en) 2006-08-03

Family

ID=33562620

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003270456A Abandoned JP2005027474A (en) 2003-07-02 2003-07-02 Apparatus and method for delivery automatic inspection for inverter

Country Status (4)

Country Link
JP (1) JP2005027474A (en)
CN (1) CN1809955A (en)
TW (1) TW200509511A (en)
WO (1) WO2005004319A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006320164A (en) * 2005-05-16 2006-11-24 Asmo Co Ltd Motor controller and motor apparatus
JP5537837B2 (en) 2009-05-27 2014-07-02 サンデン株式会社 Motor control device
JP5251768B2 (en) * 2009-07-17 2013-07-31 株式会社ニコン Test apparatus and test method
KR101995139B1 (en) * 2017-12-29 2019-09-24 재단법인 한국기계전기전자시험연구원 Jig for testing inverter
KR101995140B1 (en) * 2017-12-29 2019-09-24 재단법인 한국기계전기전자시험연구원 Jig for testing converter
CN109683593B (en) * 2018-12-29 2021-09-21 上海辛格林纳新时达电机有限公司 Method and equipment for testing basic functions of pulse type servo driver

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1038965A (en) * 1996-07-25 1998-02-13 Sony Corp Method for evaluating reliability of semiconductor device
FR2782855B1 (en) * 1998-08-25 2000-11-17 Jouan DEVICE FOR CONTROLLING THE ROTATION SPEED OF AN ELECTRIC MOTOR AND CENTRIFUGATION APPARATUS EQUIPPED WITH SUCH A DEVICE
JP2001320894A (en) * 2000-05-08 2001-11-16 Matsushita Electric Ind Co Ltd Motor drive device

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