JP2004317509A5 - - Google Patents
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- JP2004317509A5 JP2004317509A5 JP2004115164A JP2004115164A JP2004317509A5 JP 2004317509 A5 JP2004317509 A5 JP 2004317509A5 JP 2004115164 A JP2004115164 A JP 2004115164A JP 2004115164 A JP2004115164 A JP 2004115164A JP 2004317509 A5 JP2004317509 A5 JP 2004317509A5
- Authority
- JP
- Japan
- Prior art keywords
- mass
- error bars
- individual error
- charge number
- ions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Claims (34)
前記質量スペクトルデータにおいて認められるn種のイオンの質量/電荷数を測定する工程と、
測定された前記n種のイオンの各々の質量/電荷数について、個々のエラーバーを算出する工程とを含み、
イオン種の真正の、正確な、実際の、または許容できる質量/電荷数が、算出された個々のエラーバーの範囲内となる確率または信頼性が、x%に等しいか、またはそれよりも大きく、x≧50である質量分析方法。 Obtaining mass spectral data using a mass spectrometer;
Measuring the mass / charge number of the n ions found in the mass spectral data;
Calculating individual error bars for the measured mass / charge number of each of the n types of ions,
The probability or reliability that the true / accurate / actual / acceptable mass / charge number of the ionic species is within the calculated individual error bars is equal to or greater than x%. And x ≧ 50 mass spectrometry method.
前記1以上の関心対象の質量/電荷数が、前記異種のイオンの少なくとも一部のエラーバーの範囲内に入るか否かを知るために、前記質量スペクトルデータにおいて認められた前記異種のイオンの少なくとも一部の測定された質量/電荷数および算出された個々のエラーバーの少なくとも一部を調べる工程とを含む先行する請求項のいずれかに記載の方法。 Further, the step of limiting the mass / charge number of the one or more objects of interest and whether the mass / charge number of the one or more objects of interest falls within the error bars of at least some of the different ions. And prior to the step comprising examining at least a portion of the measured mass / charge number and at least a portion of the calculated individual error bar of at least a portion of the heterogeneous ions found in the mass spectral data to know. The method in any one of.
前記1以上の関心対象の質量/電荷数が、前記複数の質量スペクトルから認められた前記異種のイオンの少なくとも一部のエラーバーの範囲内に入るか否かを知るために、期間中に得られた前記複数の質量スペクトルから認められた前記異種のイオンの測定された質量/電荷数および算出された個々のエラーバーを調べる工程とを含む先行する請求項のいずれかに記載の方法。 Further, limiting the mass / charge number of the one or more objects of interest;
In order to know whether the one or more mass / charge numbers of interest falls within the error bars of at least some of the heterogeneous ions found from the plurality of mass spectra. Examining the measured mass / charge number and the calculated individual error bars of the heterogeneous ions found from the plurality of mass spectra obtained.
前記処理システムが、質量スペクトルデータを得て、前記質量スペクトルデータにおいて認められたn種のイオンの質量/電荷数を測定し、測定された前記n種のイオンのそれぞれの質量/電荷数について、個々のエラーバーを算出するように構成されており、
イオン種の真正の、正確な、実際の、または許容できる質量/電荷数が、算出された個々のエラーバーの範囲内となる確率または信頼性が、x%に等しいか、またはそれよりも大きく、x≧50である質量分析計。 Including a mass spectrometer and a processing system,
The processing system obtains mass spectral data, measures the mass / charge number of the n ions recognized in the mass spectral data, and for each mass / charge number of the measured n ions, It is configured to calculate individual error bars,
The probability or reliability that the true / accurate / actual / acceptable mass / charge number of the ionic species is within the calculated individual error bars is equal to or greater than x%. X = 50 mass spectrometer.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0308278A GB0308278D0 (en) | 2003-04-10 | 2003-04-10 | Mass spectrometer |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2004317509A JP2004317509A (en) | 2004-11-11 |
JP2004317509A5 true JP2004317509A5 (en) | 2007-05-24 |
JP4497455B2 JP4497455B2 (en) | 2010-07-07 |
Family
ID=9956545
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004115164A Expired - Lifetime JP4497455B2 (en) | 2003-04-10 | 2004-04-09 | Mass spectrometer |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP4497455B2 (en) |
CA (1) | CA2464004C (en) |
DE (2) | DE102004017272A1 (en) |
GB (2) | GB0308278D0 (en) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2405991B (en) * | 2003-08-22 | 2005-08-31 | Micromass Ltd | Mass spectrometer |
US20050080578A1 (en) * | 2003-10-10 | 2005-04-14 | Klee Matthew S. | Mass spectrometry spectral correction |
US8078427B2 (en) * | 2006-08-21 | 2011-12-13 | Agilent Technologies, Inc. | Calibration curve fit method and apparatus |
JP4894929B2 (en) * | 2007-12-20 | 2012-03-14 | 株式会社島津製作所 | Mass spectrometer |
GB0909289D0 (en) | 2009-05-29 | 2009-07-15 | Micromass Ltd | Method of processing mass spectral data |
US9773090B2 (en) | 2010-06-10 | 2017-09-26 | International Business Machines Corporation | Method computer program and system to analyze mass spectra |
DE112012000959B4 (en) * | 2011-02-23 | 2017-06-01 | Leco Corporation | Correction of the transit time drift in transit time mass spectrometers |
KR101390878B1 (en) * | 2013-07-16 | 2014-04-30 | 국방과학연구소 | A method of identification of spores-forming bacillus using in-situ maldi-tof mass spectrometer and analysis system |
EP3050074B1 (en) | 2013-09-23 | 2020-08-26 | Micromass UK Limited | Peak assessment for mass spectrometers |
GB201316876D0 (en) * | 2013-09-23 | 2013-11-06 | Micromass Ltd | Peak assessment for mass spectrometers |
EP3204961A4 (en) * | 2014-10-08 | 2018-06-06 | DH Technologies Development PTE. Ltd. | Grouping amplitudes of tof extractions to detect convolution due to resolution saturation |
CN106024571B (en) | 2015-03-25 | 2018-08-24 | 萨默费尼根有限公司 | system and method for mass calibration |
WO2017178453A1 (en) * | 2016-04-14 | 2017-10-19 | Roche Diagnostics Gmbh | Method for determining a concentration of a target analyte in a sample of bodily fluid |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6120856A (en) * | 1984-07-09 | 1986-01-29 | Jeol Ltd | Cleavage peak display system for mass spectrum |
JPS62124456A (en) * | 1985-11-26 | 1987-06-05 | Jeol Ltd | Automatic calibration system for mass spectrometric analysis data |
JPH08212969A (en) * | 1995-02-08 | 1996-08-20 | Hitachi Ltd | Mass spectrometer date processing device |
JPH10132786A (en) * | 1996-10-30 | 1998-05-22 | Shimadzu Corp | Mass spectroscope |
GB9801565D0 (en) * | 1998-01-23 | 1998-03-25 | Micromass Ltd | Method and apparatus for the correction of mass errors in time-of-flight mass spectrometry |
US6229142B1 (en) * | 1998-01-23 | 2001-05-08 | Micromass Limited | Time of flight mass spectrometer and detector therefor |
US6437325B1 (en) * | 1999-05-18 | 2002-08-20 | Advanced Research And Technology Institute, Inc. | System and method for calibrating time-of-flight mass spectra |
WO2004023132A1 (en) * | 2002-09-05 | 2004-03-18 | National Institute Of Advanced Industrial Science And Technology | Biopolymer automatic identifying method |
-
2003
- 2003-04-10 GB GB0308278A patent/GB0308278D0/en not_active Ceased
-
2004
- 2004-04-06 GB GB0407830A patent/GB2401721B/en not_active Expired - Lifetime
- 2004-04-07 DE DE200410017272 patent/DE102004017272A1/en not_active Withdrawn
- 2004-04-07 DE DE200420005563 patent/DE202004005563U1/en not_active Expired - Lifetime
- 2004-04-08 CA CA2464004A patent/CA2464004C/en not_active Expired - Lifetime
- 2004-04-09 JP JP2004115164A patent/JP4497455B2/en not_active Expired - Lifetime
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