JP2004311623A - Inspection method and device for electronic component - Google Patents

Inspection method and device for electronic component Download PDF

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Publication number
JP2004311623A
JP2004311623A JP2003101393A JP2003101393A JP2004311623A JP 2004311623 A JP2004311623 A JP 2004311623A JP 2003101393 A JP2003101393 A JP 2003101393A JP 2003101393 A JP2003101393 A JP 2003101393A JP 2004311623 A JP2004311623 A JP 2004311623A
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Prior art keywords
external connection
electrode terminal
connection electrode
electronic component
angle
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Inventor
Sei Sekinaga
聖 関永
Koichi Matsushita
浩一 松下
Hiroshi Matsushima
博 松島
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Panasonic Holdings Corp
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Matsushita Electric Industrial Co Ltd
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Priority to JP2003101393A priority Critical patent/JP2004311623A/en
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • H01L2224/48465Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA

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  • Measuring Leads Or Probes (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To measure accurately the bond strength of an electrode terminal for external connection on the interface between the electrode terminal for external connection and the electrode. <P>SOLUTION: In the inspection method of an electronic component, the bond strength of the electrode terminal 101 for external connection is inspected from the broken form of the joint 105 by applying a shearing force to the joint 105 of the electrode 103 and the electrode terminal 101, by pushing the electrode terminal 101 joined to the electrode 103 of an electronic component from lateral. The pushing direction of the electrode terminal 101 has an angle 302 inclined upward to the surface of the electrode 103. As a result, the angle 302 is given to the electronic component, and the electrode terminal 101 is sheared aslant, so that vertical upward component of force can be generated in the joint 105. As a result, the bond strength of the electrode terminal 101 for external connection can be measured accurately, and quality decision of electrode formation becomes enable. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

【0001】
【発明の属する技術分野】
この発明は、電子部品の電極形成の良否判定方法に用いる電子部品の検査方法および検査装置に関するものである。
【0002】
【従来の技術】
図7は、電子部品106の一例を示す。電子部品106の構成は、電子素子001を電子素子保護樹脂002で保護し、電子素子電極004から樹脂内部ワイヤー配線003とランド103と基板内配線パターン107を経由して外部接続用電極端子101に接続する。
【0003】
基板104は、外部接続用電極端子101の形成位置に対応して基板配線パターン107中に形成されたランド103と、このランド103の形成位置にて開口した開口部を有する基板配線パターン保護膜102とを有する。
【0004】
基板配線パターン保護膜102は、基板104の表面に形成される基板配線パターン107を保護するために基板104の表面上に形成する。
【0005】
外部接続用電極端子101は、微細な電子素子電極004の代わりに他の電気機器に実装し易くする為に、前記、基板104が有するランド103に外部接続用電極端子101を形成する。その為、前記、ランド103の表面異常や外部接続用電極端子101の形成時の異常等があった場合、外部接続用電極端子101が市場で問題になることがある為、電極形成の良否判定が必要である。一般的に電極形成の良否判定は、外部接続用電極端子101を容易に判定できるシェア測定方法およびその測定装置を用いていた(例えば特許文献1)。
【0006】
図8に、従来のシェア測定方法およびその測定装置を示す。従来、外部接続用電極端子101の良否判定方法は、電子部品106に角度を与えずシェア測定をする方法であった。従来の測定方法および測定装置では、図8のように、外部接続用電極端子101に対して、ツール201を外部接続用電極端子101の直ぐ横にセットし、さらに基板配線パターン保護膜102の上にセットし試料台301を移動方向303に移動させることによって外部接続用電極端子101の電極形成の良否判定を行う方法およびその測定装置であった(測定結果は表1参照)。
【0007】
従来のシェア測定(図8)では、外部接続用電極端子101とランド103間の界面105で外部接続用電極端子101が全て剥れるもの(破壊モードA(図2参照))が発生せず、全てが外部接続用電極端子101中で破断が発生する、いわゆるバルク破壊でかつ、ツールでバルク破壊面表面を擦った様なもの(バルタ破壊2モードC(図4参照))となり外部接続用電極端子101の電極形成の良否判定ができない。従来のシェア測定方法の接続強度は、平均10.8N(9.42N〜12.8N)の値を示す。108は外部接続用電極端子101の破壊界面である。
【0008】
【特許文献1】
特開平06−252220号公報
【0009】
【発明が解決しようとする課題】
前記従来の構成では、ツールの押圧方向が電子部品106の電極(ランド)103の表面に対してほぼ平行であったため、外部接続用電極端子101と電極(ランド)103との接合部に作用する力も、電極に対してほぼ平行であった。
【0010】
また、基板上にパターン保護膜が存在し、ツールを外部接続用電極端子(はんだボール)101と電極(ランド)103間の界面にセットすることができないため、界面の外部接続用電極端子101の接続強度を測定することができない場合がある。このため、外部接続用電極端子101を電極103から引き剥がそうとする力は十分ではなく、外部接続用電極端子101の接合強度を正確に検査できなかったという課題があった。
【0011】
したがって、この発明の目的は、外部接続用電極端子101と電極103間の界面における外部接続用電極端子101の接続強度を正確に測定することができる電子部品の検査方法および検査装置を提供することである。
【0012】
【課題を解決するための手段】
上記課題を解決するためにこの発明の請求項1記載の電子部品の検査方法は、電子部品106の電極103に接合した外部接続用電極端子101を側方から押圧することにより、前記電極103と前記外部接続用電極端子101との接合部に対してせん断作用を与え、前記外部接続用電極端子101の接合強度を検査する電子部品106の検査方法であって、前記外部接続用電極端子101を押圧する方向は、前記電極103の表面に対して上向きに傾斜した角度を有する。
【0013】
このように、外部接続用電極端子101を押圧する方向は、電極103の表面に対して上向きに傾斜した角度を有するので、電子部品106に角度を与え、外部接続用電極端子101を斜めにシェアすることで、接合部に垂直上方向分力402を発生させることができる。このため、接合部に外部接続用電極端子101を電極103から引き剥がそうとする力を加えることができるため、外部接続用電極端子101の接続強度を正確に測定することができ、電極形成の良否判定が可能になる。
【0014】
請求項2記載の電子部品の検査方法は、請求項1記載の電子部品の検査方法において、外部接続用電極端子101を押圧する方向が水平方向であり、前記外部接続用電極端子101を押圧する前に、水平面に対して下向きに傾斜した角度を有するように電子部品106を設置する。このように、外部接続用電極端子101を押圧する方向が水平方向であり、外部接続用電極端子101を押圧する前に、水平面に対して下向きに傾斜した角度を有するように電子部品106を設置するので、外部接続用電極端子101を水平方向に押圧することにより、その押圧方向が電極の表面に対して上向きに傾斜した角度を有する。このため、電子部品106の設置状態を変更するだけで請求項1と同様の作用効果が得られる。
【0015】
請求項3記載の電子部品の検査装置は、電子部品106を載置する試料台301と、前記電子部品106の電極103に接合した外部接続用電極端子101を側方から押圧することにより、前記電極103と前記外部接続用電極端子101との接合部に対してせん断作用を与えるツール201と、前記ツール201により破壊された前記外部接続用電極端子101の接合強度を検査する検査手段とを備えた電子部品106の検査装置であって、前記試料台301の前記電子部品106の載置面が、前記ツール201の押圧方向に沿って下向きに傾斜した角度を有する。
【0016】
このように、試料台301の電子部品106の載置面が、ツールの押圧方向に沿って下向きに傾斜した角度を有するので、電子部品106に角度を与え、外部接続用電極端子101と電極103との界面105である接合部に垂直上方向分力402を発生させることができる。これにより、外部接続用電極端子101を電極103から引き剥がす力が発生するので、界面105での破壊モードが発生する。このように外部接続用電極端子101、電極界面105で破壊することから外部接続用電極端子101の接続強度を正確に測定することができ、電極形成の良否判定が可能になる。
【0017】
【発明の実施の形態】
この発明の第1の実施の形態を図1〜図5に基づいて説明する。図1は、本発明の第1の実施の形態における外部接続用電極端子101の斜めシェア測定方法およびその測定装置の説明図である。なお、電子部品106の構成は図7と同様であり、同じ部材には同じ符号を付してその説明を省略する。
【0018】
図1に示すように、この電子部品106の検査装置(シェア測定装置)は、電子部品106を載置する試料台301と、電子部品106の電極103に接合した外部接続用電極端子101を側方から押圧することにより、電極103と外部接続用電極端子101との接合部105に対してせん断作用を与えるツール201と、ツール201により破壊された外部接続用電極端子101の接合強度を検査する検査手段とを備えている。また、試料台301の電子部品106の載置面が、ツール201の押圧方向に沿って下向きに傾斜した角度を有する。これに伴い、外部接続用電極端子101を押圧する方向は、電極103の表面に対して上向きに傾斜した角度を有する。
【0019】
電極形成の良否判定を行う際には、角度302のある試料台301に電子部品106の外部接続用電極端子101を上向きにした電子部品106を載せた状態の外部接続用電極端子101に対して、ツール201を外部接続用電極端子101の直ぐ横にセットし、さらに基板配線パターン保護膜102の上にセットし試料台301を移動方向303に移動させることによって外部接続用電極端子101の電極形成の良否判定を行う。
【0020】
この場合、電子部品106の外部接続用電極端子101は、Cu配線にNi−Auめっきされたランド開口径Φ0.4mmのランド103に、材質がSn−Ag−Cu系のはんだボールで形成されたボール径Φ0.6mmの外部接続用電極端子101である。この電子部品106の外部接続用電極端子101を上向きにし、測定装置の試料台301の角度302を15°,30°,45°に設定した試料台301の上にセットする。ツール201は、0.3mm幅を使用し、測定時のツール201の位置は、外部接続用電極端子101の直ぐ横にセットし、さらに基板配線パターン保護膜102の界面から1μm上に上昇させた位置にセットする。測定は、ツール102を固定した状態で試料台301を1mm/sのスピードで移動方向303に移動させた。また、外部接続用電極端子101を押圧する方向(移動方向303)は水平方向であり、応力401を生じさせる。外部接続用電極端子101を押圧する前に、水平面に対して下向きに傾斜した角度を有するように電子部品106を設置してもよい。402は垂直方向分力、403は水平方向分力である。
【0021】
本実施形態のシェア測定方法の測定結果を表1に示す。従来のシェア測定(図8)では、外部接続用電極端子101とランド103間の界面105で外部接続用電極端子101が全て剥れるもの(破壊モードA(図2))が発生せず、全てが、外部接続用電極端子101中で破断が発生する、いわゆるバルク破壊でかつ、ツール201でバルク破壊面表面を擦った様なもの(バルク破壊2モードC(図4))となり外部接続用電極端子101の電極形成の良否判定ができない。シェア測定方法の接続強度は、平均10.8N(9.42N〜12.8N)の値を示す。
【0022】
【表1】

Figure 2004311623
【0023】
つぎに、本実施形態の斜めシェア測定方法および測定装置を用いて、電子部品106に角度302を15°,30°,45°の3条件を与えた場合の測定結果について説明する。斜めシェア測定(図1)の角度302が15°の場合、破壊モードが全て外部接続用電極端子101中のバルク破壊でかつ、外部接続用電極端子101が引きちぎられランド103に外部接続用電極端子101が完全にとれていない様なもの(バルク破壊1モードB(図3)となり、従来のシェア測定(図8)の外部接続用電極端子101のバルク破壊2モードC(図4)とは破壊モードが異なり、外部接続用電極端子101中で引きちぎられた破壊形状から垂直方向分力402が発生したと考えられる。次に角度302を15°から30°に大きくすると、破壊モードが従来のシェア測定(図8)の外部接続用電極端子101のバルク破壊2モードC(図4)とは破壊モードが異なる3種類の破壊モードが発生する。1つは、前記の角度302が15°と同じバルク破壊1モードB(図3)が発生(発生数:15/25)する。2つめは、角度15°より大きな垂直方向分力402が発生し、外部接続用電極端子101とランド(電極)103との界面105(接合部)に垂直方向分力402が作用し、外部接続用電極端子101をランド103から引き剥がす界面105の剥れモードA(図2)が発生(発生数:4/25)する。3つめは、外部接続用電極端子101の表面付近を削り取り、外部接続用電極端子101がランド103と繋がった状態で残ったもの(残りモードD(図5))が発生(発生数:6/25)する。さらに角度302を30°から45°に大きくすると、破壊モードが前記の角度302が15°と30°で発生していた外部接続用電極端子101のバルク破壊1モードB(図3)が発生せず、前記の角度302が30°で発生していた、界面105の剥れモードA(図2)(発生数:3/25)と外部接続用電極端子101残りモードD(図5)(発生数:22/25)の発生となる。
【0024】
今回の斜めシェア測定方法および測定装置では、界面105の剥れモードA(図2)以外に、バルク破壊1モードB(図3)と、外部接続用電極端子101残りモードD(図5)が発生した。
【0025】
剥れモードA(図2)、バルク破壊1モードB(図3)については、垂直方向分力402の大きさと、界面105の接続強度の関係でモードが分かれる。界面105の接続強度が垂直方向分力402より低い場合剥れモードA(図2)が発生し、界面105の接続強度が垂直方向分力402より高い場合バルク破壊1モードB(図3)が発生する。界面105の接続強度は外部接続用電極端子101ごとにばらつきがあり接続強度が異なる。また、測定時のツール201と外部接続用電極端子101の接点場所により垂直方向分力402が異なる。このことから、30°では、剥れモードA(図2)、バルク破壊1モードB(図3)が発生した。
【0026】
さらに、残りモードD(図5)は測定時のツール201が外部接続用電極端子101の上部に接している場合、界面105に垂直方向分力402が加わらず、外部接続用電極端子101の上部を擦るような破断が発生する。30°に比べ45°で残りモードD(図5)の発生率が高いのは、ツール201が45°の方がボール上部に接する為である。また、30°でも残りモードD(図5)が発生しているのは、外部接続用電極端子101の形状にばらつきがあることと、測定時のツール201の設定にばらつきがあるためである。
【0027】
斜めシェア測定方法の接続強度は、角度15°で、平均8.47N(7.17N〜9.43N)の値を示す。角度30°では、平均6.07N(3.17N〜7.19N)の値を示す。角度45°では、平均4.64N(2.69N〜6.38N)の値を示す。
【0028】
以上の結果から、従来のシェア測定(図8)に角度302を与えることにより、外部接続用電極端子101と電極(ランド103)との接合部に作用する力(垂直方向分力402)が発生し、電極形成の良否判定を可能にすることができる。また、測定時の角度302については最も界面105の剥がれモードAの発生率の高い30°が最適である。但し、評価試料により外部接続用電極端子101の形状などが異なることがある。外部接続用電極端子101の形状が異なった場合、測定時の角度302とモードの発生率の関係が異なるため、電極形成の良否判定をする際は、適正な角度302を検討することが必要である。
【0029】
この発明の第2の実施の形態を図6に基づいて説明する。図6は、本発明の第2の実施の形態における外部接続用電極端子の斜めシェア測定方法およびその測定装置の説明図である。なお、電子部品106の構成は図7と同様であり、同じ部材には同じ符号を付してその説明を省略する。
【0030】
図6に示すように、電極形成の良否判定を行う際には、角度302のある試料台301に電子部品106の外部接続用電極端子101を上向きにした電子部品106を載せた状態の外部接続用電極端子101に対して、ツール201を外部接続用電極端子101の直ぐ横にセットし、さらに基板配線パターン保護膜102の上にセットしツール201を移動方向303に移動させることによって外部接続用電極端子101の電極形成の良否判定を行う。その他の構成効果は、第1の実施の形態と同様である。
【0031】
以上のように、従来のシェア測定(図8)では、外部接続用電極端子101とランド103間の界面105での破壊モードA(図2)が発生せず、全て外部接続用電極端子101のバルク破壊2モードC(図4)となり外部接続用電極端子101の電極形成の良否判定ができない。
【0032】
しかしながら、本実施形態の斜めシェア測定方法および測定装置(図1、図2)を用いて、電子部品106に角度302を与え、外部接続用電極端子101とランド(電極)103との界面105(接合部)に垂直方向分力402を発生させることにより、外部接続用電極端子101をランド103から引き剥がす力が発生するので、界面105での破壊モードが発生する。このように電極端子、基板ランド界面105で破壊することから外部接続用電極端子101の電極形成の良否判定を可能にすることができる。
【0033】
【発明の効果】
この発明の請求項1記載の電子部品の検査方法によれば、外部接続用電極端子101を押圧する方向は、電極103の表面に対して上向きに傾斜した角度を有するので、電子部品106に角度を与え、外部接続用電極端子101を斜めにシェアすることで、接合部に垂直上方向分力402を発生させることができる。このため、接合部に外部接続用電極端子101を電極103から引き剥がそうとする力を加えることができるため、外部接続用電極端子101の接続強度を正確に測定することができ、電極形成の良否判定が可能になる。
【0034】
請求項2では、外部接続用電極端子101を押圧する方向が水平方向であり、外部接続用電極端子101を押圧する前に、水平面に対して下向きに傾斜した角度を有するように電子部品106を設置するので、外部接続用電極端子101を水平方向に押圧することにより、その押圧方向が電極103の表面に対して上向きに傾斜した角度を有する。このため、電子部品106の設置状態を変更するだけで請求項1と同様の作用効果が得られる。
【0035】
この発明の請求項3記載の電子部品の検査装置によれば、試料台301の電子部品106の載置面が、ツールの押圧方向に沿って下向きに傾斜した角度を有するので、電子部品106に角度を与え、外部接続用電極端子101と電極103との界面105である接合部に垂直上方向分力402を発生させることができる。これにより、外部接続用電極端子101を電極103から引き剥がす力が発生するので、界面105での破壊モードが発生する。このように外部接続用電極端子101、電極界面105で破壊することから外部接続用電極端子101の接続強度を正確に測定することができ、電極形成の良否判定が可能になる。
【図面の簡単な説明】
【図1】(a)はこの発明の第1の実施の形態における斜めシェア測定前の説明図、(b)は斜めシェア測定後の説明図である。
【図2】剥がれモードAの説明図である。
【図3】バルク破壊1モードBの説明図である。
【図4】バルク破壊2モードCの説明図である。
【図5】残りモードDの説明図である。
【図6】(a)はこの発明の第2の実施の形態における斜めシェア測定前の説明図、(b)は斜めシェア測定後の説明図である。
【図7】(a)は電子部品の断面図、(b)は外部接続用電極端子側平面図である。
【図8】(a)は従来例のシェア測定前の説明図、(b)はシェア測定後の説明図である。
【符号の説明】
001 電子素子
002 電子素子保護樹脂
003 樹脂内部ワイヤー配線
004 電子素子電極
101 外部接続用電極端子
102 基板配線パターン保護膜
103 ランド
104 基板
105 界面
106 電子部品パッケージ
107 基板内配線パターン
108 外部接続用電極端子の破壊界面
201 ツール
301 試料台
302 角度
303 移動方向
401 応力
402 垂直方向分力
403 水平方向分力[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to an inspection method and an inspection device for an electronic component used in a method for determining the quality of electrode formation of an electronic component.
[0002]
[Prior art]
FIG. 7 shows an example of the electronic component 106. The configuration of the electronic component 106 is such that the electronic element 001 is protected by the electronic element protective resin 002, and the electronic element electrode 004 is connected to the external connection electrode terminal 101 via the resin internal wire wiring 003, the land 103 and the wiring pattern 107 in the board. Connecting.
[0003]
The substrate 104 includes a land 103 formed in the substrate wiring pattern 107 corresponding to the position where the external connection electrode terminal 101 is formed, and a substrate wiring pattern protection film 102 having an opening opened at the position where the land 103 is formed. And
[0004]
The substrate wiring pattern protection film 102 is formed on the surface of the substrate 104 to protect the substrate wiring pattern 107 formed on the surface of the substrate 104.
[0005]
The external connection electrode terminal 101 is formed on the land 103 of the substrate 104 so as to be easily mounted on another electric device instead of the fine electronic element electrode 004. Therefore, if there is an abnormality in the surface of the land 103 or an abnormality during the formation of the external connection electrode terminal 101, the external connection electrode terminal 101 may become a problem in the market. is necessary. Generally, the quality of the electrode formation has been determined using a shear measurement method and a measurement device that can easily determine the external connection electrode terminal 101 (for example, Patent Document 1).
[0006]
FIG. 8 shows a conventional shear measuring method and its measuring device. Conventionally, the pass / fail judgment method of the external connection electrode terminal 101 is a method of performing a shear measurement without giving an angle to the electronic component 106. In the conventional measuring method and measuring apparatus, as shown in FIG. 8, the tool 201 is set immediately next to the external connection electrode terminal 101 with respect to the external connection electrode terminal 101, and And moving the sample table 301 in the moving direction 303 to determine the quality of the electrode formation of the external connection electrode terminal 101 and a measuring apparatus therefor (see Table 1 for the measurement results).
[0007]
In the conventional shear measurement (FIG. 8), there is no occurrence of a case where the external connection electrode terminal 101 is completely peeled off at the interface 105 between the external connection electrode terminal 101 and the land 103 (destruction mode A (see FIG. 2)). All are fractures in the external connection electrode terminals 101, which are so-called bulk fractures, and the surface of the bulk fracture surface is rubbed with a tool (Balta fracture 2 mode C (see FIG. 4)). It is impossible to judge whether or not the electrode of the terminal 101 is good. The connection strength of the conventional shear measurement method indicates an average value of 10.8 N (9.42 N to 12.8 N). Reference numeral 108 denotes a destruction interface of the external connection electrode terminal 101.
[0008]
[Patent Document 1]
Japanese Patent Application Laid-Open No. 06-252220
[Problems to be solved by the invention]
In the above-described conventional configuration, the pressing direction of the tool is substantially parallel to the surface of the electrode (land) 103 of the electronic component 106, and thus acts on the joint between the external connection electrode terminal 101 and the electrode (land) 103. The force was also approximately parallel to the electrodes.
[0010]
In addition, since the pattern protection film exists on the substrate and the tool cannot be set at the interface between the external connection electrode terminal (solder ball) 101 and the electrode (land) 103, the external connection electrode terminal 101 at the interface cannot be set. In some cases, connection strength cannot be measured. For this reason, there is a problem that the force for peeling the external connection electrode terminal 101 from the electrode 103 is not sufficient, and the bonding strength of the external connection electrode terminal 101 cannot be accurately inspected.
[0011]
Therefore, an object of the present invention is to provide an electronic component inspection method and an inspection device that can accurately measure the connection strength of the external connection electrode terminal 101 at the interface between the external connection electrode terminal 101 and the electrode 103. It is.
[0012]
[Means for Solving the Problems]
In order to solve the above-mentioned problem, the method for inspecting an electronic component according to claim 1 of the present invention includes pressing the external connection electrode terminal 101 joined to the electrode 103 of the electronic component 106 from the side, thereby forming A method of inspecting an electronic component 106 for applying a shearing action to a joint portion with the external connection electrode terminal 101 and inspecting a bonding strength of the external connection electrode terminal 101, wherein the external connection electrode terminal 101 The pressing direction has an angle inclined upward with respect to the surface of the electrode 103.
[0013]
As described above, since the direction in which the external connection electrode terminal 101 is pressed has an angle inclined upward with respect to the surface of the electrode 103, an angle is given to the electronic component 106, and the external connection electrode terminal 101 is obliquely shared. By doing so, a vertical upward component force 402 can be generated at the joint. For this reason, a force for peeling the external connection electrode terminal 101 from the electrode 103 can be applied to the joint, so that the connection strength of the external connection electrode terminal 101 can be accurately measured, and the electrode formation Pass / fail judgment becomes possible.
[0014]
According to a second aspect of the present invention, in the electronic component inspection method of the first aspect, a direction in which the external connection electrode terminal 101 is pressed is a horizontal direction, and the external connection electrode terminal 101 is pressed. Before, the electronic component 106 is installed so as to have a downwardly inclined angle with respect to the horizontal plane. In this manner, the electronic component 106 is installed so that the direction in which the external connection electrode terminal 101 is pressed is the horizontal direction, and before pressing the external connection electrode terminal 101, the electronic component 106 has an angle inclined downward with respect to the horizontal plane. Therefore, by pressing the external connection electrode terminal 101 in the horizontal direction, the pressing direction has an angle inclined upward with respect to the surface of the electrode. Therefore, the same operation and effect as those of the first aspect can be obtained only by changing the installation state of the electronic component 106.
[0015]
The electronic component inspection apparatus according to claim 3, wherein the sample stage 301 on which the electronic component 106 is mounted and the external connection electrode terminal 101 joined to the electrode 103 of the electronic component 106 are pressed from the side, and A tool 201 for applying a shearing action to a joint between the electrode 103 and the external connection electrode terminal 101, and inspection means for inspecting the bonding strength of the external connection electrode terminal 101 broken by the tool 201. The mounting surface for the electronic component 106 of the sample table 301 has an angle inclined downward along the pressing direction of the tool 201.
[0016]
As described above, since the mounting surface of the electronic component 106 of the sample stage 301 has an angle inclined downward along the pressing direction of the tool, the electronic component 106 is given an angle, and the external connection electrode terminal 101 and the electrode 103 are provided. A vertical upward component force 402 can be generated at the joint, which is the interface 105 with the interface. This generates a force for peeling the external connection electrode terminal 101 from the electrode 103, so that a destruction mode at the interface 105 occurs. As described above, the connection strength of the external connection electrode terminal 101 can be accurately measured since the external connection electrode terminal 101 and the electrode interface 105 are broken, so that the quality of the electrode formation can be determined.
[0017]
BEST MODE FOR CARRYING OUT THE INVENTION
A first embodiment of the present invention will be described with reference to FIGS. FIG. 1 is an explanatory diagram of a method for measuring the oblique shear of an external connection electrode terminal 101 and a measuring device according to the first embodiment of the present invention. The configuration of the electronic component 106 is the same as that of FIG. 7, and the same members are denoted by the same reference numerals and description thereof will be omitted.
[0018]
As shown in FIG. 1, the inspection device (shear measurement device) for the electronic component 106 includes a sample table 301 on which the electronic component 106 is mounted and an external connection electrode terminal 101 joined to the electrode 103 of the electronic component 106. A tool 201 that exerts a shearing action on a joint 105 between the electrode 103 and the external connection electrode terminal 101 by pressing from the side, and the bonding strength of the external connection electrode terminal 101 broken by the tool 201 are inspected. Inspection means. Further, the mounting surface of the electronic component 106 of the sample table 301 has an angle inclined downward along the pressing direction of the tool 201. Accordingly, the direction in which the external connection electrode terminal 101 is pressed has an angle inclined upward with respect to the surface of the electrode 103.
[0019]
When the quality of the electrode formation is determined, the external connection electrode terminal 101 in a state where the electronic component 106 with the external connection electrode terminal 101 of the electronic component 106 facing upward is placed on the sample stage 301 having an angle 302. The tool 201 is set immediately beside the external connection electrode terminal 101, and further set on the substrate wiring pattern protective film 102, and the sample stage 301 is moved in the movement direction 303 to form the electrode of the external connection electrode terminal 101. Is determined.
[0020]
In this case, the external connection electrode terminal 101 of the electronic component 106 is formed of a Sn-Ag-Cu-based solder ball on a land 103 having a land opening diameter of 0.4 mm, which is obtained by plating a Ni-Au plating on a Cu wiring. This is an external connection electrode terminal 101 having a ball diameter of 0.6 mm. The electrode terminal 101 for external connection of the electronic component 106 is turned upward, and the angle 302 of the sample stage 301 of the measuring apparatus is set on the sample stage 301 set at 15 °, 30 °, and 45 °. The tool 201 has a width of 0.3 mm, and the position of the tool 201 at the time of measurement is set immediately beside the electrode terminal 101 for external connection, and is further raised 1 μm above the interface of the substrate wiring pattern protective film 102. Set to position. In the measurement, the sample stage 301 was moved in the movement direction 303 at a speed of 1 mm / s with the tool 102 fixed. The direction in which the external connection electrode terminal 101 is pressed (moving direction 303) is a horizontal direction, and generates a stress 401. Before the external connection electrode terminal 101 is pressed, the electronic component 106 may be installed so as to have a downwardly inclined angle with respect to the horizontal plane. 402 is a vertical component, and 403 is a horizontal component.
[0021]
Table 1 shows the measurement results of the shear measurement method according to the present embodiment. In the conventional shear measurement (FIG. 8), there is no case where the external connection electrode terminal 101 is completely peeled off at the interface 105 between the external connection electrode terminal 101 and the land 103 (destruction mode A (FIG. 2)). Is a so-called bulk fracture in which a break occurs in the external connection electrode terminal 101 and the surface of the bulk fracture surface is rubbed with the tool 201 (bulk fracture 2 mode C (FIG. 4)). It is impossible to judge whether or not the electrode of the terminal 101 is good. The connection strength of the shear measurement method indicates an average value of 10.8 N (9.42 N to 12.8 N).
[0022]
[Table 1]
Figure 2004311623
[0023]
Next, a description will be given of measurement results when the angle 302 is given to the electronic component 106 at three conditions of 15 °, 30 °, and 45 ° using the oblique shear measuring method and the measuring apparatus of the present embodiment. When the angle 302 in the oblique shear measurement (FIG. 1) is 15 °, the destruction mode is all bulk destruction in the external connection electrode terminal 101, and the external connection electrode terminal 101 is torn off and the land 103 is connected to the external connection electrode terminal. 101 is not completely removed (bulk destruction 1 mode B (FIG. 3), and is destructed from bulk destruction 2 mode C (FIG. 4) of the external connection electrode terminal 101 in the conventional shear measurement (FIG. 8). It is considered that the modes were different, and a vertical component force 402 was generated from the broken shape torn in the external connection electrode terminal 101. Next, when the angle 302 was increased from 15 ° to 30 °, the breaking mode became the conventional share. Three types of destruction modes, which are different from the destruction mode 2 (FIG. 4) of the external connection electrode terminal 101 in the measurement (FIG. 8), occur. (The number of occurrences: 15/25), the second is that a vertical component force 402 greater than an angle of 15 ° is generated, and the external connection electrode terminal 101 is generated. A vertical component force 402 acts on an interface 105 (junction) between the electrode 105 and the land (electrode) 103, and a peeling mode A (FIG. 2) of the interface 105 that peels off the external connection electrode terminal 101 from the land 103 occurs ( The third is that the vicinity of the surface of the external connection electrode terminal 101 is scraped off and the external connection electrode terminal 101 remains connected to the land 103 (remaining mode D (FIG. 5)). When the angle 302 is further increased from 30 ° to 45 °, the external connection electrode terminal 101 in which the destruction mode occurs at the angles 302 of 15 ° and 30 °. Bulk break of One mode B (FIG. 3) did not occur, and the peeling mode A (FIG. 2) (number of occurrences: 3/25) of the interface 105, in which the angle 302 was generated at 30 °, and an external connection electrode terminal 101 The remaining mode D (FIG. 5) (number of occurrences: 22/25) occurs.
[0024]
In this oblique shear measurement method and measurement apparatus, in addition to the peeling mode A of the interface 105 (FIG. 2), the mode 1 of bulk destruction B (FIG. 3) and the remaining mode D of the external connection electrode terminal 101 (FIG. 5) are provided. Occurred.
[0025]
The peeling mode A (FIG. 2) and the bulk destruction 1 mode B (FIG. 3) are divided depending on the relationship between the magnitude of the vertical component force 402 and the connection strength of the interface 105. When the connection strength at the interface 105 is lower than the vertical component force 402, the peeling mode A (FIG. 2) occurs, and when the connection strength at the interface 105 is higher than the vertical component force 402, the bulk fracture 1 mode B (FIG. 3) occurs. appear. The connection strength of the interface 105 varies from one external connection electrode terminal 101 to another connection strength. Further, the vertical component force 402 differs depending on the contact point between the tool 201 and the external connection electrode terminal 101 at the time of measurement. From this, at 30 °, peeling mode A (FIG. 2) and bulk destruction 1 mode B (FIG. 3) occurred.
[0026]
Further, in the remaining mode D (FIG. 5), when the tool 201 at the time of measurement is in contact with the upper part of the external connection electrode terminal 101, no vertical component force 402 is applied to the interface 105 and the upper part of the external connection electrode terminal 101. Rupture occurs. The reason why the occurrence rate of the remaining mode D (FIG. 5) is higher at 45 ° than at 30 ° is that the tool 201 is in contact with the upper part of the ball at 45 °. The reason why the remaining mode D (FIG. 5) occurs even at 30 ° is that there is a variation in the shape of the external connection electrode terminal 101 and a variation in the setting of the tool 201 at the time of measurement.
[0027]
The connection strength of the oblique shear measurement method shows an average value of 8.47 N (7.17 N to 9.43 N) at an angle of 15 °. At an angle of 30 °, the average value is 6.07 N (3.17 N to 7.19 N). At an angle of 45 °, the average value is 4.64 N (2.69 N to 6.38 N).
[0028]
From the above results, by giving the angle 302 to the conventional shear measurement (FIG. 8), a force (vertical component 402) acting on the joint between the external connection electrode terminal 101 and the electrode (land 103) is generated. However, it is possible to determine the quality of electrode formation. As for the angle 302 at the time of measurement, 30 ° where the occurrence rate of the peeling mode A at the interface 105 is the highest is optimal. However, the shape of the external connection electrode terminal 101 may differ depending on the evaluation sample. When the shape of the external connection electrode terminal 101 is different, the relationship between the angle 302 at the time of measurement and the mode occurrence rate is different. Therefore, when judging the quality of electrode formation, it is necessary to consider an appropriate angle 302. is there.
[0029]
A second embodiment of the present invention will be described with reference to FIG. FIG. 6 is an explanatory diagram of the oblique shear measuring method and the measuring device of the external connection electrode terminal according to the second embodiment of the present invention. The configuration of the electronic component 106 is the same as that of FIG. 7, and the same members are denoted by the same reference numerals and description thereof will be omitted.
[0030]
As shown in FIG. 6, when the quality of the electrode formation is determined, the external connection in a state where the electronic component 106 with the external connection electrode terminal 101 of the electronic component 106 facing upward is placed on the sample stage 301 having an angle 302. The tool 201 is set directly beside the electrode terminal 101 for external connection with respect to the electrode terminal 101 for external connection. The quality of the electrode formation of the electrode terminal 101 is determined. Other configuration effects are the same as those of the first embodiment.
[0031]
As described above, in the conventional shear measurement (FIG. 8), the destruction mode A (FIG. 2) at the interface 105 between the external connection electrode terminal 101 and the land 103 does not occur, and all of the external connection electrode terminal 101 Bulk destruction 2 mode C (FIG. 4) is established, and the quality of the electrode formation of the external connection electrode terminal 101 cannot be determined.
[0032]
However, the angle 302 is given to the electronic component 106 by using the oblique shear measurement method and the measurement device (FIGS. 1 and 2) of the present embodiment, and the interface 105 ( By generating a vertical component force 402 at the bonding portion), a force for peeling the external connection electrode terminal 101 from the land 103 is generated, so that a destruction mode at the interface 105 occurs. As described above, since the electrode is broken at the interface between the electrode terminal and the substrate land 105, it is possible to determine whether the electrode of the external connection electrode terminal 101 is good or not.
[0033]
【The invention's effect】
According to the electronic component inspection method according to the first aspect of the present invention, the direction in which the external connection electrode terminal 101 is pressed has an angle inclined upward with respect to the surface of the electrode 103. And the external connection electrode terminal 101 is obliquely shared, so that a vertical upward component force 402 can be generated at the joint. For this reason, a force for peeling the external connection electrode terminal 101 from the electrode 103 can be applied to the joint, so that the connection strength of the external connection electrode terminal 101 can be accurately measured, and the electrode formation Pass / fail judgment becomes possible.
[0034]
In the second aspect, the direction in which the external connection electrode terminal 101 is pressed is a horizontal direction, and before pressing the external connection electrode terminal 101, the electronic component 106 is tilted downward with respect to a horizontal plane. Since the external connection electrode terminal 101 is pressed in the horizontal direction, the pressing direction has an angle inclined upward with respect to the surface of the electrode 103. Therefore, the same operation and effect as those of the first aspect can be obtained only by changing the installation state of the electronic component 106.
[0035]
According to the electronic component inspection apparatus according to the third aspect of the present invention, the mounting surface of the electronic component 106 of the sample stage 301 has an angle inclined downward along the pressing direction of the tool. By giving an angle, a vertical upward component force 402 can be generated at a joint portion which is an interface 105 between the external connection electrode terminal 101 and the electrode 103. This generates a force for peeling the external connection electrode terminal 101 from the electrode 103, so that a destruction mode at the interface 105 occurs. As described above, since the external connection electrode terminal 101 and the electrode interface 105 are broken, the connection strength of the external connection electrode terminal 101 can be accurately measured, and the quality of the electrode formation can be determined.
[Brief description of the drawings]
FIG. 1A is an explanatory diagram before oblique shear measurement according to a first embodiment of the present invention, and FIG. 1B is an explanatory diagram after oblique shear measurement.
FIG. 2 is an explanatory diagram of a peeling mode A.
FIG. 3 is an explanatory diagram of a mode 1 of bulk destruction.
FIG. 4 is an explanatory diagram of bulk destruction 2 mode C.
FIG. 5 is an explanatory diagram of a remaining mode D.
FIG. 6A is an explanatory diagram before oblique shear measurement according to a second embodiment of the present invention, and FIG. 6B is an explanatory diagram after oblique shear measurement.
7A is a cross-sectional view of an electronic component, and FIG. 7B is a plan view of an external connection electrode terminal.
FIG. 8A is an explanatory diagram of a conventional example before a shear measurement, and FIG. 8B is an explanatory diagram after a shear measurement.
[Explanation of symbols]
001 Electronic element 002 Electronic element protection resin 003 Resin internal wire wiring 004 Electronic element electrode 101 External connection electrode terminal 102 Substrate wiring pattern protection film 103 Land 104 Substrate 105 Interface 106 Electronic component package 107 Internal wiring pattern 108 External connection electrode terminal Interface 201 tool 301 sample stage 302 angle 303 moving direction 401 stress 402 vertical component 403 horizontal component

Claims (3)

電子部品の電極に接合した外部接続用電極端子を側方から押圧することにより、前記電極と前記外部接続用電極端子との接合部に対してせん断作用を与え、前記外部接続用電極端子の接合強度を検査する電子部品の検査方法であって、前記外部接続用電極端子を押圧する方向は、前記電極の表面に対して上向きに傾斜した角度を有することを特徴とする電子部品の検査方法。By pressing the external connection electrode terminal joined to the electrode of the electronic component from the side, a shearing action is given to the joint between the electrode and the external connection electrode terminal, and the external connection electrode terminal is joined. A method for inspecting an electronic component for inspecting strength, wherein a direction in which the external connection electrode terminal is pressed has an angle inclined upward with respect to a surface of the electrode. 外部接続用電極端子を押圧する方向が水平方向であり、前記外部接続用電極端子を押圧する前に、水平面に対して下向きに傾斜した角度を有するように電子部品を設置する請求項1記載の電子部品の検査方法。2. The electronic component according to claim 1, wherein a direction in which the external connection electrode terminal is pressed is a horizontal direction, and the electronic component is installed so as to have a downwardly inclined angle with respect to a horizontal plane before pressing the external connection electrode terminal. 3. Inspection method for electronic components. 電子部品を載置する試料台と、前記電子部品の電極に接合した外部接続用電極端子を側方から押圧することにより、前記電極と前記外部接続用電極端子との接合部に対してせん断作用を与えるツールと、前記ツールにより破壊された前記外部接続用電極端子の接合強度を検査する検査手段とを備えた電子部品の検査装置であって、前記試料台の前記電子部品の載置面が、前記ツールの押圧方向に沿って下向きに傾斜した角度を有することを特徴とする電子部品の検査装置。The sample stage on which the electronic component is placed and the external connection electrode terminal joined to the electrode of the electronic component are pressed from the side, so that a shearing action is exerted on the joint between the electrode and the external connection electrode terminal. And a test means for testing the bonding strength of the external connection electrode terminals broken by the tool, wherein the mounting surface of the electronic component of the sample table is An inspection device for an electronic component, wherein the inspection device has an angle inclined downward along a pressing direction of the tool.
JP2003101393A 2003-04-04 2003-04-04 Inspection method and device for electronic component Pending JP2004311623A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021057567A (en) * 2019-09-27 2021-04-08 日亜化学工業株式会社 Inspection method of semiconductor element
US11573169B2 (en) 2019-09-27 2023-02-07 Nichia Corporation Method of testing a semiconductor element with improved pressing force direction

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021057567A (en) * 2019-09-27 2021-04-08 日亜化学工業株式会社 Inspection method of semiconductor element
JP7144692B2 (en) 2019-09-27 2022-09-30 日亜化学工業株式会社 Semiconductor device inspection method
US11573169B2 (en) 2019-09-27 2023-02-07 Nichia Corporation Method of testing a semiconductor element with improved pressing force direction

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