JP2004245860A5 - - Google Patents
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- Publication number
- JP2004245860A5 JP2004245860A5 JP2003032399A JP2003032399A JP2004245860A5 JP 2004245860 A5 JP2004245860 A5 JP 2004245860A5 JP 2003032399 A JP2003032399 A JP 2003032399A JP 2003032399 A JP2003032399 A JP 2003032399A JP 2004245860 A5 JP2004245860 A5 JP 2004245860A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003032399A JP4409183B2 (en) | 2003-02-10 | 2003-02-10 | Inspection device |
TW093101906A TWI303321B (en) | 2003-02-10 | 2004-01-28 | Examined apparatus |
KR1020040007609A KR101042118B1 (en) | 2003-02-10 | 2004-02-05 | Examined apparatus |
CNB2004100040950A CN100374898C (en) | 2003-02-10 | 2004-02-09 | Detecting device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003032399A JP4409183B2 (en) | 2003-02-10 | 2003-02-10 | Inspection device |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2004245860A JP2004245860A (en) | 2004-09-02 |
JP2004245860A5 true JP2004245860A5 (en) | 2006-03-30 |
JP4409183B2 JP4409183B2 (en) | 2010-02-03 |
Family
ID=33018758
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003032399A Expired - Fee Related JP4409183B2 (en) | 2003-02-10 | 2003-02-10 | Inspection device |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP4409183B2 (en) |
KR (1) | KR101042118B1 (en) |
CN (1) | CN100374898C (en) |
TW (1) | TWI303321B (en) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006184303A (en) * | 2004-12-24 | 2006-07-13 | Olympus Corp | Image inspecting device |
JP5136835B2 (en) * | 2007-10-29 | 2013-02-06 | 株式会社ニコン | microscope |
EP2175302B1 (en) | 2007-08-07 | 2018-09-19 | Nikon Corporation | Microscope |
JP5109583B2 (en) * | 2007-10-29 | 2012-12-26 | 株式会社ニコン | Inverted microscope |
KR100949342B1 (en) * | 2009-04-17 | 2010-03-26 | 한국기계연구원 | Jig of microscope for view of side |
JP5522989B2 (en) | 2009-07-08 | 2014-06-18 | オリンパス株式会社 | Observation optical system and microscope equipped with the same |
KR101652355B1 (en) * | 2015-03-30 | 2016-08-31 | (주)넥스틴 | optical apparatus for examining pattern image of semiconductor wafer |
KR101652356B1 (en) * | 2015-03-30 | 2016-08-31 | (주)넥스틴 | optical apparatus for examining pattern image of semiconductor device |
JP6267401B2 (en) * | 2015-06-26 | 2018-01-31 | ソニー・オリンパスメディカルソリューションズ株式会社 | Surgical microscope apparatus and surgical microscope system |
KR200484944Y1 (en) | 2016-01-06 | 2017-11-13 | (주) 파루 | Structure of temperature controller equipped with an insulating member |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN88211074U (en) * | 1988-02-05 | 1988-08-17 | 周纪征 | Tele-periscope |
CN2033127U (en) * | 1988-07-01 | 1989-02-22 | 张福庆 | Tube included angle-changable periscopic sight |
CN2156129Y (en) * | 1993-04-13 | 1994-02-16 | 季凤林 | Submarine for tourism |
JPH07174552A (en) * | 1993-11-05 | 1995-07-14 | Olympus Optical Co Ltd | Apparatus for detecting focal point |
JP3827429B2 (en) * | 1997-04-03 | 2006-09-27 | オリンパス株式会社 | Surgical microscope |
JP2002277750A (en) | 2001-03-15 | 2002-09-25 | Olympus Optical Co Ltd | Inspecting device |
JP2002303795A (en) * | 2001-04-04 | 2002-10-18 | Olympus Optical Co Ltd | Inverted microscope |
-
2003
- 2003-02-10 JP JP2003032399A patent/JP4409183B2/en not_active Expired - Fee Related
-
2004
- 2004-01-28 TW TW093101906A patent/TWI303321B/en not_active IP Right Cessation
- 2004-02-05 KR KR1020040007609A patent/KR101042118B1/en not_active IP Right Cessation
- 2004-02-09 CN CNB2004100040950A patent/CN100374898C/en not_active Expired - Fee Related