JP2004230117A5 - - Google Patents

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Publication number
JP2004230117A5
JP2004230117A5 JP2003060636A JP2003060636A JP2004230117A5 JP 2004230117 A5 JP2004230117 A5 JP 2004230117A5 JP 2003060636 A JP2003060636 A JP 2003060636A JP 2003060636 A JP2003060636 A JP 2003060636A JP 2004230117 A5 JP2004230117 A5 JP 2004230117A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2003060636A
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Japanese (ja)
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JP2004230117A (ja
JP4141288B2 (ja
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Publication date
Application filed filed Critical
Priority to JP2003060636A priority Critical patent/JP4141288B2/ja
Priority claimed from JP2003060636A external-priority patent/JP4141288B2/ja
Publication of JP2004230117A publication Critical patent/JP2004230117A/ja
Publication of JP2004230117A5 publication Critical patent/JP2004230117A5/ja
Application granted granted Critical
Publication of JP4141288B2 publication Critical patent/JP4141288B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP2003060636A 2003-01-30 2003-01-30 シワ・レプリカ像の鑑別法 Expired - Lifetime JP4141288B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003060636A JP4141288B2 (ja) 2003-01-30 2003-01-30 シワ・レプリカ像の鑑別法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003060636A JP4141288B2 (ja) 2003-01-30 2003-01-30 シワ・レプリカ像の鑑別法

Publications (3)

Publication Number Publication Date
JP2004230117A JP2004230117A (ja) 2004-08-19
JP2004230117A5 true JP2004230117A5 (zh) 2006-05-18
JP4141288B2 JP4141288B2 (ja) 2008-08-27

Family

ID=32958915

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003060636A Expired - Lifetime JP4141288B2 (ja) 2003-01-30 2003-01-30 シワ・レプリカ像の鑑別法

Country Status (1)

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JP (1) JP4141288B2 (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4579046B2 (ja) * 2005-04-28 2010-11-10 株式会社資生堂 肌状態解析方法、肌状態解析装置、肌状態解析プログラム、及び該プログラムが記録された記録媒体
JP4717595B2 (ja) * 2005-11-08 2011-07-06 株式会社 資生堂 肌状態解析方法、肌状態解析装置、肌状態解析プログラム、及び該プログラムが記録された記録媒体
KR101260722B1 (ko) 2005-04-28 2013-05-06 가부시키가이샤 시세이도 피부 상태 해석 방법, 피부 상태 해석 장치, 및 피부 상태 해석 프로그램을 기록한 기록 매체
FR2891641B1 (fr) * 2005-10-04 2007-12-21 Lvmh Rech Procede et appareil de caracterisation des imperfections de la peau et procede d'appreciation de l'effet anti-vieillissement d'un produit cosmetique.
JP4909686B2 (ja) * 2006-09-08 2012-04-04 学校法人東京理科大学 表皮組織定量化装置及びプログラム
JP5263991B2 (ja) * 2008-05-23 2013-08-14 ポーラ化成工業株式会社 肌のキメ及び／又はシワの鑑別法及び鑑別装置、肌の鑑別プログラム、並びに皮膚外用剤の選択方法
JP5635762B2 (ja) * 2009-11-11 2014-12-03 ポーラ化成工業株式会社 乳頭形状又はコラーゲン様構造の算出方法
CN112603259B (zh) * 2019-09-18 2022-04-19 荣耀终端有限公司 一种皮肤粗糙度检测方法及电子设备

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