JP2004221560A5 - - Google Patents
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- JP2004221560A5 JP2004221560A5 JP2003426644A JP2003426644A JP2004221560A5 JP 2004221560 A5 JP2004221560 A5 JP 2004221560A5 JP 2003426644 A JP2003426644 A JP 2003426644A JP 2003426644 A JP2003426644 A JP 2003426644A JP 2004221560 A5 JP2004221560 A5 JP 2004221560A5
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前記ビームをズーム機能を有する光学系に入射させることによって、照射面において結像させ、且つエネルギー分布の均一な線状ビームを形成し、
前記ズーム機能を有する光学系を作用させることによって、照射面における線状ビームの大きさを変化させることを特徴とするレーザ照射方法。 Into a uniform beam energy distribution at the rectangular laser beam emitted from a laser oscillator by using a de-I full tractive optics,
By entering the beam optical system having a's over beam function is Oite imaged on the irradiation surface, and to form a uniform linear beam energy distribution,
Laser irradiation method comprising the Rukoto is for work an optical system having a zoom function, varying the size of the linear beam on the irradiation surface.
前記ビームを単位共役比デザインを有する光学系に入射させることによって、照射面において結像させ、且つエネルギー分布の均一な線状ビームを形成することを特徴とするレーザ照射方法。 Into a uniform beam energy distribution at the rectangular laser beam emitted from a laser oscillator by using a de-I full tractive optics,
By entering the beam optical system having a single position conjugate ratio design, is Oite imaged on the irradiation surface, and the laser irradiation method, which comprises forming a homogeneous linear beam energy distribution.
前記ビームを単位共役比デザインを有する光学系に入射させることによって、照射面において結像させ、且つエネルギー分布の均一な線状ビームを形成し、
前記単位共役比デザインを有する光学系を作用させることによって、照射面における線状ビームの大きさを変化させることを特徴とするレーザ照射方法。 Into a uniform beam energy distribution at the rectangular laser beam emitted from a laser oscillator by using a de-I full tractive optics,
By entering the beam optical system having a single position conjugate ratio design, is Oite imaged on the irradiation surface, and to form a uniform linear beam energy distribution,
By the action of an optical system having a unit conjugate ratio design, the laser irradiation method characterized by changing the size of the linear beam on the irradiation surface.
前記レーザ発振器から射出されるレーザビームを矩形状でエネルギー分布の均一なビームに変換するディフラクティブオプティクスと、
前記ビームを照射面に結像させ、前記ビームの大きさを前記照射面において変化させるズーム機能を有する光学系とを有することを特徴とするレーザ照射装置。 A laser oscillator;
A diffusion tractive optics into a uniform beam of energy distribution of the laser beam emitted from the laser oscillator in a rectangular shape,
Before millet over beam is imaged on the irradiation surface, the laser irradiation apparatus, comprising an optical system having a zoom function of the size of the beam is changed in the irradiated surface.
前記レーザ発振器から射出されるレーザビームを矩形状でエネルギー分布の均一なビームに変換するディフラクティブオプティクスと、
前記ビームを照射面に結像させる単位共役比デザインの光学系とを有することを特徴とするレーザ照射装置。 A laser oscillator;
A diffusion tractive optics into a uniform beam of energy distribution of the laser beam emitted from the laser oscillator in a rectangular shape,
Laser irradiation apparatus, comprising an optical system unit conjugate ratio designed to image before millet over beam on the irradiation surface.
前記レーザ発振器から射出されるレーザビームを矩形状でエネルギー分布の均一なビームに変換するディフラクティブオプティクスと、
前記ビームを照射面に結像させ、前記ビームの大きさを前記照射面において変化させる単位共役比デザインの光学系とを有することを特徴とするレーザ照射装置。 A laser oscillator;
A diffusion tractive optics into a uniform beam of energy distribution of the laser beam emitted from the laser oscillator in a rectangular shape,
Before millet over beam is imaged on the irradiation surface, the laser irradiation apparatus, comprising an optical system unit conjugate ratio design to a size of the beam is changed in the irradiated surface.
前記半導体膜に、レーザ発振器から射出したレーザビームをディフラクティブオプティクスに入射させた後、ズーム機能を有する光学系に入射させて形成したエネルギー分布の均一な線状ビームを照射することによって前記半導体膜を結晶化する半導体装置の作製方法であって、
前記ズーム機能を有する光学系を作用させることによって、前記半導体膜に照射する線状ビームの大きさを変化させることを特徴とする半導体装置の作製方法。 A semiconductor film is formed on the substrate ,
A laser beam emitted from a laser oscillator is incident on the diffractive optics on the semiconductor film, and then incident on an optical system having a zoom function to irradiate a linear beam with a uniform energy distribution. A method for manufacturing a semiconductor device for crystallizing
A method for manufacturing a semiconductor device , wherein the size of a linear beam applied to the semiconductor film is changed by applying an optical system having the zoom function .
前記半導体膜に、レーザ発振器から射出したレーザビームをディフラクティブオプティクスに入射させた後、単位共役比デザインの光学系に入射させて形成したエネルギー分布の均一な線状ビームを照射することによって前記半導体膜を結晶化することを特徴とする半導体装置の作製方法。 A semiconductor film is formed on the substrate ,
The semiconductor film is irradiated with a linear beam having a uniform energy distribution formed by making a laser beam emitted from a laser oscillator enter a diffractive optics and then entering an optical system having a unit conjugate ratio design. A method for manufacturing a semiconductor device, characterized by crystallizing a film .
前記半導体膜に、レーザ発振器から射出したレーザビームをディフラクティブオプティクスに入射させた後、単位共役比デザインの光学系に入射させて形成したエネルギー分布の均一な線状ビームを照射することによって前記半導体膜を結晶化する半導体装置の作製方法であって、
前記単位共役比デザインの比を変えることによって、前記半導体膜に照射する前記線状ビームの大きさを変化させることを特徴とする半導体装置の作製方法。 A semiconductor film is formed on the substrate ,
The semiconductor film is irradiated with a linear beam having a uniform energy distribution formed by making a laser beam emitted from a laser oscillator enter a diffractive optics and then entering an optical system having a unit conjugate ratio design. A method for manufacturing a semiconductor device for crystallizing a film,
The method for manufacturing a semiconductor device, characterized in that said by Rukoto changing the ratio of the unit conjugate ratio design, thereby varying ized the magnitude of the linear beam to be irradiated to the semiconductor film.
In any one of claims 11 to 13, wherein the laser oscillator, Ar laser, Kr laser, CO 2 laser, YAG laser, YVO 4 laser, YLF laser, YAlO 3 laser, Y 2 O 3 laser, alexandrite laser Ti: A method for manufacturing a semiconductor device, which is selected from sapphire laser and helium cadmium laser.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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JP2003426644A JP4515088B2 (en) | 2002-12-25 | 2003-12-24 | Method for manufacturing semiconductor device |
Applications Claiming Priority (2)
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JP2002375653 | 2002-12-25 | ||
JP2003426644A JP4515088B2 (en) | 2002-12-25 | 2003-12-24 | Method for manufacturing semiconductor device |
Publications (3)
Publication Number | Publication Date |
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JP2004221560A JP2004221560A (en) | 2004-08-05 |
JP2004221560A5 true JP2004221560A5 (en) | 2007-02-15 |
JP4515088B2 JP4515088B2 (en) | 2010-07-28 |
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JP2003426644A Expired - Fee Related JP4515088B2 (en) | 2002-12-25 | 2003-12-24 | Method for manufacturing semiconductor device |
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Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2006148086A (en) * | 2004-10-20 | 2006-06-08 | Semiconductor Energy Lab Co Ltd | Laser irradiation method, laser irradiation apparatus, and manufacturing method of semiconductor device |
US8138058B2 (en) * | 2006-11-24 | 2012-03-20 | Semiconductor Energy Laboratory Co., Ltd. | Substrate with marker, manufacturing method thereof, laser irradiation apparatus, laser irradiation method, light exposure apparatus, and manufacturing method of semiconductor device |
CN114442289A (en) * | 2021-12-31 | 2022-05-06 | 河南中光学集团有限公司 | High-power laser irradiation zooming optical system |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH0385729A (en) * | 1989-08-30 | 1991-04-10 | Hitachi Ltd | Wiring formation |
JPH09270393A (en) * | 1996-03-29 | 1997-10-14 | Sanyo Electric Co Ltd | Laser light irradiation device |
JP3512624B2 (en) * | 1998-03-13 | 2004-03-31 | 三菱電機株式会社 | Laser processing apparatus and method for wiring board processing |
JP2000066133A (en) * | 1998-06-08 | 2000-03-03 | Sanyo Electric Co Ltd | Laser light irradiation device |
JP4353554B2 (en) * | 1998-07-08 | 2009-10-28 | 三洋電機株式会社 | Laser light irradiation device |
JP2000202664A (en) * | 1999-01-08 | 2000-07-25 | Sumitomo Heavy Ind Ltd | Lasder drilling method |
JP2000277450A (en) * | 1999-03-24 | 2000-10-06 | Matsushita Electric Ind Co Ltd | Laser anneal device and manufacture of thin-film transistor using the same |
JP3919419B2 (en) * | 2000-03-30 | 2007-05-23 | キヤノン株式会社 | Illumination apparatus and exposure apparatus having the same |
JP2002043245A (en) * | 2000-07-31 | 2002-02-08 | Fujitsu Ltd | Method of forming crystalline semiconductor thin film |
JP2002189174A (en) * | 2000-12-20 | 2002-07-05 | Olympus Optical Co Ltd | Illuminator for microscope |
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2003
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