JP2004197109A - Composition for removing adhesive of circuit joint and method for removing using the composition - Google Patents

Composition for removing adhesive of circuit joint and method for removing using the composition Download PDF

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JP2004197109A
JP2004197109A JP2004068937A JP2004068937A JP2004197109A JP 2004197109 A JP2004197109 A JP 2004197109A JP 2004068937 A JP2004068937 A JP 2004068937A JP 2004068937 A JP2004068937 A JP 2004068937A JP 2004197109 A JP2004197109 A JP 2004197109A
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adhesive
composition
solvent
connection
peeling
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Isao Tsukagoshi
功 塚越
Atsuo Nakajima
敦夫 中島
Koji Kobayashi
宏治 小林
Yukihisa Hirozawa
幸寿 廣澤
Misao Oguchi
美佐夫 小口
Hiroshi Matsuoka
寛 松岡
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Showa Denko Materials Co Ltd
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Hitachi Chemical Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a composition for removing, efficiently removing an adhesive on a part requiring repair and excellent in connection reliability, and to provide a method for removing. <P>SOLUTION: The composition for removing comprises 100 pts. wt. mixed solvent of oxygen-containing organic solvent with a nitrogen-containing organic solvent and having ≥110°C boiling point and 0.5-50 pts. wt. fine particles of a porous material insoluble in the above-mentioned solvents, and the method comprises wiping off and cleaning up the unneeded part with the composition for removing. <P>COPYRIGHT: (C)2004,JPO&NCIPI

Description

本発明は接着剤による回路や電極等の接続部の補修に好適な剥離用組成物およびそれを用いた剥離方法に関する。   The present invention relates to a stripping composition suitable for repairing a connection portion such as a circuit or an electrode with an adhesive, and a stripping method using the same.

電子部品の小型薄型化に伴い、これらに用いる回路や電極等は、高密度、高精細化している。これら微細回路等の接続は、接着剤による方法が最近多用されるようになってきた。この場合、接着剤中に導電性粒子を配合し加圧により接着剤の厚み方向に電気的接続をえるもの(例えば特許文献1)と、導電性粒子を用いないで接続時の加圧により電極面の微細凹凸により電気的接続をえるもの(例えば特許文献2)がある。   As electronic components become smaller and thinner, circuits, electrodes, and the like used for these components are becoming higher in density and higher in definition. For connection of these fine circuits and the like, a method using an adhesive has recently been frequently used. In this case, a conductive particle is blended in an adhesive and an electrical connection is made in the thickness direction of the adhesive by pressing (for example, Patent Document 1), and an electrode is formed by pressing during connection without using conductive particles. There is a device that obtains electrical connection by fine irregularities on the surface (for example, Patent Document 2).

これら接着剤による接続において、電気的接続が不良であったり、接続後に電子部品や回路が不良になった場合、接続部間を剥離し、残った接着剤を溶剤や剥離液等で除去した後、再度良品を接着剤により接続することがおこなわれる。この時、例えば液晶デイスプレイパネルのような多数の接続用回路を有する1つの電子部品に、多数の例えばICチップのような他の電子部品を接続する場合、前記の接着剤除去法では、周辺部の他の接続部にまで影響し、接続不良や信頼性が低下する問題があった。   In the connection with these adhesives, if the electrical connection is poor or the electronic components and circuits become defective after the connection, peel off between the connection parts and remove the remaining adhesive with a solvent or a peeling liquid etc. Then, the non-defective product is connected again with the adhesive. At this time, in the case where a large number of other electronic components such as an IC chip are connected to one electronic component having a large number of connection circuits such as a liquid crystal display panel, in the case of the method of removing the adhesive, the peripheral portion is not used. There is a problem in that it affects other connection parts, resulting in poor connection and reduced reliability.

また、最近ではこの様な用途に使用される接着剤は、接続信頼性に優れることから熱や紫外線等による硬化型が多用されるが、その場合の適当な剥離液がなく接続不良や信頼性が低下する問題を抱えながら使用されていた。これらの対策として先に本発明者等は、補修を要する接着剤面積とほぼ等しい所定形状の多孔質シ−トに剥離液を含ませ、補修を要する接着剤と接触させて剥離させる試みを提案した(特許文献3)。   In recent years, adhesives used in such applications are often used in the form of heat or ultraviolet rays for curing because of their excellent connection reliability. Had been used while having the problem of decreasing. As a countermeasure for these problems, the present inventors have previously proposed an attempt to include a stripping liquid in a porous sheet having a predetermined shape substantially equal to the area of the adhesive requiring repair, and to peel the porous sheet into contact with the adhesive requiring repair. (Patent Document 3).

特開昭55−104007号公報JP-A-55-104007 特開昭60−262430号公報JP-A-60-262430 特開平03−283284号JP-A-03-283284

特許文献3(特開平03−283284号公報)の方法は、限定領域の極めて有効な剥離方法であるが、所定形状の多孔質シ−トを補修が必要な部分のみに形成するため、シ−トの正確な切断や裁置、および剥離液の含浸が必要なことから作業性に欠けるきらいがある。また、剥離液中に酸やハロゲン系溶剤を含む場合に、電食が発生し易く接続信頼性が不十分であった。加えて、ガラスエポキシ基板上の回路を接続するような場合に、剥離を要する接着剤の形成面がこれと同様な接着剤材質の近傍にある場合には、剥離液の程度次第で下地の基板の接着剤や回路と基板の接着剤をも劣化させてしまう欠点があった。   The method disclosed in Patent Document 3 (Japanese Patent Application Laid-Open No. 03-283284) is an extremely effective peeling method for a limited area. However, since a porous sheet having a predetermined shape is formed only in a portion requiring repair, a sheet is formed. The workability is lacking due to the necessity of accurate cutting and setting of the sheet and the impregnation of the stripping solution. In addition, when an acid or a halogen-based solvent is contained in the stripping solution, electrolytic corrosion is easily generated, and connection reliability is insufficient. In addition, when connecting a circuit on a glass epoxy substrate, if the surface of the adhesive that needs to be peeled is near an adhesive material similar to this, the underlying substrate depends on the level of the peeling liquid. However, there is a disadvantage that the adhesive of the present invention and the adhesive of the circuit and the substrate are also deteriorated.

本発明は、上記欠点を解消すべくなされたものであり、補修が必要な部分のみの接着剤を効率良く剥離でき、かつ接続信頼性に優れた剥離用組成物及び剥離方法を提案するものである。   The present invention has been made in order to solve the above-mentioned disadvantages, and proposes a peeling composition and a peeling method which can efficiently peel off an adhesive only in a portion requiring repair and have excellent connection reliability. is there.

本発明は、沸点が110℃以上の含酸素系有機溶剤と含窒素系有機溶剤との混合溶剤100重量部に対し、この溶剤に不溶性の多孔質体微粉0.5〜50重量部を含有してなる回路接続部の接着剤剥離用組成物、および剥離を要する接着剤部に前記組成物を接触させ、暫時接触後にこれらを取り除き清浄化する剥離方法に関する。   The present invention contains 0.5 to 50 parts by weight of a porous fine powder insoluble in a solvent based on 100 parts by weight of a mixed solvent of an oxygen-containing organic solvent having a boiling point of 110 ° C. or higher and a nitrogen-containing organic solvent. The present invention relates to a method for peeling off an adhesive at a circuit connecting portion, and a method for bringing the composition into contact with an adhesive portion which needs to be peeled off, removing the contact after a temporary contact, and cleaning.

本発明によれば、必要部の接着剤を効率良く剥離できるので作業性に優れる。また剥離剤の液状物は、非ハロゲン系の有機溶剤のみであり接続信頼性の維持が可能である。   ADVANTAGE OF THE INVENTION According to this invention, since the adhesive agent of a required part can be peeled efficiently, it is excellent in workability. Further, the liquid material of the release agent is only a non-halogen organic solvent, and the connection reliability can be maintained.

本発明に用いる有機溶剤について説明すると、接着剤を分解または膨潤、溶解する性質を持つもので、特に硬化後の接着剤を分解または膨潤、溶解し易いものが好ましい。そのため本発明における必須溶剤として、沸点(760mmHg)が110℃以上の含酸素系有機溶剤と含窒素系有機溶剤との混合溶剤を用いる。この様な溶剤は、例えば(株)講談社発行、溶剤ハンドブック、第7刷、632頁〜756頁に示されておりこれらを適用できる。本発明は上記のように沸点(760mmHg)が110℃以上の含酸素系有機溶剤と含窒素系有機溶剤との混合溶剤をもちいることを必須とするが、所望により沸点が100℃以下の有機溶剤を適宜配合してもよい。   The organic solvent used in the present invention will be described in detail. The organic solvent has a property of decomposing, swelling, and dissolving the adhesive, and particularly, a solvent which is easy to decompose, swell, and dissolve the cured adhesive is preferable. Therefore, a mixed solvent of an oxygen-containing organic solvent and a nitrogen-containing organic solvent having a boiling point (760 mmHg) of 110 ° C. or higher is used as an essential solvent in the present invention. Such a solvent is disclosed in, for example, Kodansha Co., Ltd., Solvent Handbook, 7th edition, pages 632 to 756, and these can be applied. The present invention requires the use of a mixed solvent of an oxygen-containing organic solvent and a nitrogen-containing organic solvent having a boiling point (760 mmHg) of 110 ° C. or higher as described above. You may mix | blend a solvent suitably.

これらの溶剤を例示すると、含酸素有機溶剤としては、ジアセトンアルコ−ル(沸点168℃)、アセトニルアセトン(191℃)、メシチルオキサイド(129℃)、ジイソブチルケトン(168℃)、ホロン(198℃)、イソホロン(215℃)、2−ヘキサノン(127℃)、メチルイソブチルケトン(116℃)、2−ヘプタノン(150℃)、4−ヘプタノン(144℃)、シクロヘキサノン(155℃)、メチルシクロヘキサノン(170℃)、アセトフェノン(202℃)等である。これらの中では、1分子中に2個以上のカルボニル基を有するものが、特に硬化後の接着剤を分解または膨潤しやすく好ましい。また、含酸素有機溶剤としては、上記ケトン類のほか、エステル類、エーテル類、フェノール類が適用可能である。エステル類としては、酢酸ブチル(沸点126℃)、ギ酸ペンチル(130℃)酢酸ペンチル(150℃)、酢酸ベンジル(213℃)等がある。エーテル類としては、ジブチルエーテル(142℃)、ジヘキシルエーテル(226℃)、アニソール(153℃)、フェネトソール(172℃)、メトキシトルエン(172℃)、ベンジルエチルエーテル(189℃)、トリオキサン(114℃)、ジエチレングリコールジエチルエーテル(188℃)等がある。含窒素有機溶剤としては、ホルムアミド(沸点210℃)、N,N−ジメチルホルムアミド(153℃)、N,N−ジメチルアセトアミド(166℃)、N,N−ジエチルホルムアミド(177℃)、アセトアミド(221℃)、N−メチルホルムアミド(180℃)、N−メチルピロリドン(202℃)、ニトロプロパン(131℃)、ニトロベンゼン(211℃)、2−ピロリドン(245℃)等がある。これらは任意に混合して用いることもできる。これらの沸点は揮発性抑制の点から110℃以上が適用可能であり、120℃以上が好ましく、140℃以上がより好ましい。   Examples of these solvents include diacetone alcohol (boiling point: 168 ° C.), acetonylacetone (191 ° C.), mesityl oxide (129 ° C.), diisobutyl ketone (168 ° C.), and holon ( 198 ° C), isophorone (215 ° C), 2-hexanone (127 ° C), methyl isobutyl ketone (116 ° C), 2-heptanone (150 ° C), 4-heptanone (144 ° C), cyclohexanone (155 ° C), methylcyclohexanone (170 ° C.), acetophenone (202 ° C.) and the like. Among these, those having two or more carbonyl groups in one molecule are particularly preferable since the cured adhesive is easily decomposed or swelled. Further, as the oxygen-containing organic solvent, in addition to the above ketones, esters, ethers, and phenols are applicable. Examples of the esters include butyl acetate (boiling point: 126 ° C.), pentyl formate (130 ° C.), pentyl acetate (150 ° C.), and benzyl acetate (213 ° C.). As ethers, dibutyl ether (142 ° C.), dihexyl ether (226 ° C.), anisole (153 ° C.), phenetosol (172 ° C.), methoxytoluene (172 ° C.), benzyl ethyl ether (189 ° C.), trioxane (114 ° C.) ), Diethylene glycol diethyl ether (188 ° C.) and the like. Examples of the nitrogen-containing organic solvent include formamide (boiling point: 210 ° C.), N, N-dimethylformamide (153 ° C.), N, N-dimethylacetamide (166 ° C.), N, N-diethylformamide (177 ° C.), acetamide (221) C), N-methylformamide (180C), N-methylpyrrolidone (202C), nitropropane (131C), nitrobenzene (211C), 2-pyrrolidone (245C) and the like. These can be arbitrarily mixed and used. From the viewpoint of suppressing volatility, these boiling points can be applied at 110 ° C. or higher, preferably at 120 ° C. or higher, and more preferably at 140 ° C. or higher.

剥離液中の溶剤は酸やハロゲン系溶剤を含有しない、非ハロゲン系の有機溶剤であることが、接続信頼性を保持することから必要である。溶剤の粘度は、低い方が剥離すべき接着剤への浸透性がよく好ましい。またSP値は8以上、より好ましくは10以上が、接着剤の浸蝕作用が大きいので好ましい。本発明に用いる多孔質体微粉は、内部または表面に多数の小さな空隙を有するものであり、剥離用組成物の溶剤に不溶性であることが必要である。剥離用組成物を補修が必要な部分のみに形成するためには適用回路類の精細性の点から、空隙の孔径は100μm以下が好ましく、より好ましくは40μm以下である。空隙の度合いをしめす指標として、本発明おいてはBET法比表面積(ASTMD−3037−73)が、1m/g以上のものが好ましく、10m/g以上のものがより好ましく適用できる。 It is necessary that the solvent in the stripping solution be a non-halogen organic solvent containing no acid or halogen solvent, in order to maintain connection reliability. The lower the viscosity of the solvent is, the better the permeability to the adhesive to be peeled is. Further, the SP value is preferably 8 or more, more preferably 10 or more, since the erosion action of the adhesive is large. The porous fine powder used in the present invention has a large number of small voids inside or on the surface, and is required to be insoluble in the solvent of the stripping composition. In order to form the peeling composition only on the portion requiring repair, the pore size of the void is preferably 100 μm or less, more preferably 40 μm or less, from the viewpoint of the fineness of the applied circuits. In the present invention, a BET specific surface area (ASTMD-3037-73) of 1 m 2 / g or more is preferably used as an index indicating the degree of voids, and more preferably 10 m 2 / g or more.

また多孔質体の吸油量(JIS K5101)が20以上であるものも好ましく適用できる。本発明に用いる多孔質体微粉が溶剤に溶解性であると、剥離用組成物の揺変性や溶剤の保持性が低下してしまい好ましくないが、これらの特性が大幅に低下せず実用上問題なければ若干の膨潤程度は差支えない。これら多孔質体微粉を例示すると、炭酸カルシウムやマグネシウムなどの炭酸塩、水酸化アルミニウムやマグネシウムなどの水酸化物、酸化亜鉛やマグネシウムなどの酸化物、シリカやスメクタイト、タルク等のケイ酸及びケイ酸塩、スチレンやエポキシ樹脂などのポリマ粒子類などがある。ポリマ粒子類の場合、溶剤による変質防止のため架橋体が好ましい。また、カ−ボンなどの導電性を有するものも、清浄化工程の摩擦により発生する静電気除去作用があり好ましい。これら粒子類は、添加量を少なくしても揺変性を得られることから微粒子状が好ましく、その粒径は10μm以下、より好ましくは粒径1μm以下である。また、架橋ポリマの多孔質シ−ト類や吸水性樹脂類を、粉砕等により微粉化したものも適用可能である。この場合の微粉の大きさは数mm以下、好ましくは数百μm以下と比較的大きなサイズのものまで適用できるので、剥離用組成物中への分散が容易であり、さらに溶剤の保持量を多量とすることが可能となり好ましい。微粉化したものと前記微粒子状の物は混合して用いることも可能である。   In addition, a porous body having an oil absorption (JIS K5101) of 20 or more can also be preferably used. When the porous fine powder used in the present invention is soluble in a solvent, the thixotropic properties of the release composition and the retention of the solvent decrease, which is not preferable. However, these properties are not significantly reduced, and there is a practical problem. If not, the degree of swelling may be small. Examples of these porous fine powders include carbonates such as calcium carbonate and magnesium, hydroxides such as aluminum hydroxide and magnesium, oxides such as zinc oxide and magnesium, and silicic acids and silicic acids such as silica, smectite, and talc. Salts and polymer particles such as styrene and epoxy resin. In the case of polymer particles, a crosslinked body is preferable for preventing deterioration by a solvent. Also, conductive materials such as carbon are preferable because they have an action of removing static electricity generated by friction in the cleaning step. These particles are preferably in the form of fine particles since thixotropicity can be obtained even with a small amount of addition, and the particle size is 10 μm or less, more preferably 1 μm or less. Further, those obtained by pulverizing a porous sheet of a crosslinked polymer or a water-absorbing resin by pulverization or the like can also be used. In this case, since the size of the fine powder can be applied to a relatively large size of several mm or less, preferably several hundred μm or less, the fine powder can be easily dispersed in the peeling composition, and the amount of the solvent retained is large. It is possible and preferable. It is also possible to use a mixture of the finely divided material and the finely divided material.

以上よりなる組成物を液状に調整して、本発明になる剥離用組成物を得る。液状とする理由は、補修が必要な部分のみに容易に形成容易とするためである。この時、組成物の粘度(JIS K6833)は、100cps以上が好ましく、800cps以上がより好ましい。粘度の上限は、100、000cps程度のペ−スト状までの広い範囲が適用できる。また同法によるチキソトロピックインデックスは、1.2以上が好ましく、1.5以上がより好ましい。粘度が低いと接着剤への浸透性に優れ、チキソトロピックインデックスが大きいと細部への精密な形成性が向上する。これらの理由から多孔質体微粉の添加量は、前記溶剤100重量部に対し0.5〜50重量部が適用可能であり、1〜20重量部がより好ましい。剥離用組成物中には、例えば使用溶剤に可溶な増粘剤としてのポリマ類や、剥離すべき接着剤への溶剤の浸透性を増進する界面活性剤、形成領域を明示するための着色材、などを必要に応じて使用することもできる。   The above composition is adjusted to a liquid state to obtain the release composition according to the present invention. The reason why the liquid is used is that it can be easily formed only in a portion requiring repair. At this time, the viscosity (JIS K6833) of the composition is preferably 100 cps or more, and more preferably 800 cps or more. As the upper limit of the viscosity, a wide range up to a paste of about 100,000 cps can be applied. The thixotropic index according to the same method is preferably 1.2 or more, more preferably 1.5 or more. When the viscosity is low, the permeability to the adhesive is excellent, and when the thixotropic index is large, the precision in forming fine details is improved. For these reasons, the amount of the porous fine powder to be added is preferably 0.5 to 50 parts by weight, more preferably 1 to 20 parts by weight, based on 100 parts by weight of the solvent. In the peeling composition, for example, a polymer as a thickener soluble in the solvent used, a surfactant that enhances the permeability of the solvent to the adhesive to be peeled, a coloring to clearly indicate a formation area Materials can be used as needed.

以上よりなる剥離用組成物を用いた剥離方法について説明する。まず補修を要する接続部の相互の接合部を必要に応じて剥離させ、剥離を要する接着剤面を露出させる。この時例えば接着剤のガラス転移点以上に加熱しながら行うと剥離が容易である。補修面積が微小の場合など、接合部に剥離用組成物が簡単に浸入出来る場合、本工程は省略することもできる。次に、剥離を要する接着剤露出面に剥離用組成物を形成し暫時接触させる。形成手段としては、剥離用組成物が液状なので、例えば刷毛、デイスペンサ、シルクスクリ−ン等適宜選択出来る。この時、周辺部への悪影響を防止するためマスキングテ−プ等により、除去しない部分を保護しても良い。接触時間は、接着剤を分解または溶解する時間で決定する。この時高沸点溶剤の揮発を抑制出来る程度に加熱しながら行うと、接着剤を分解または溶解することがさらに容易となり作業時間の短縮に有効である。この後、剥離用組成物の形成面を、布、紙、綿棒等で拭きとるか、これらにアセトンやアルコ−ル等の溶剤を含浸させたもので拭きとる等により、接着剤を取り除き清浄化する。   A stripping method using the above-described stripping composition will be described. First, the mutual joints of the connection portions requiring repair are peeled off as necessary, and the adhesive surface requiring peeling is exposed. At this time, for example, when the heating is performed while the temperature is higher than the glass transition point of the adhesive, the peeling is easy. This step can be omitted when the peeling composition can easily penetrate into the joint, such as when the repair area is very small. Next, a peeling composition is formed on the exposed surface of the adhesive which needs to be peeled off, and is brought into contact with the adhesive temporarily. As the forming means, since the peeling composition is in a liquid state, for example, a brush, a dispenser, a silk screen or the like can be appropriately selected. At this time, a portion which is not removed may be protected by a masking tape or the like in order to prevent a bad influence on a peripheral portion. The contact time is determined by the time for dissolving or dissolving the adhesive. At this time, if the heating is performed to such an extent that volatilization of the high boiling point solvent can be suppressed, the adhesive can be more easily decomposed or dissolved, which is effective in shortening the working time. Thereafter, the surface on which the release composition is formed is wiped off with a cloth, paper, a cotton swab, or the like, or is wiped with a cloth impregnated with a solvent such as acetone or alcohol to remove the adhesive and clean. I do.

本発明が適用される接着剤は、硬化剤が触媒硬化型の例えばエポキシ樹脂が主成分であると好適である。すなわち、回路接続用接着剤は短時間硬化が求められることから、開環重合を開始させる触媒硬化型が用いられる。一方、基板や基板と回路との接着剤は重付加型が多用され、これらの硬化物の構造が異なるために耐溶剤性に差を生じる。一般的に触媒硬化型に比べ重付加型は、高度に網状化されないと機械的物性の発現が不十分なため、硬化反応を十分に行い製品化されており耐溶剤性が強い。触媒硬化型の例としては、ベンジルジメチルアミン等の第3アミン、2メチルイミダゾ−ル等のイミダゾ−ル類、ルイス酸やオニウム塩などのカチオン触媒がある。重付加型の例としては、ポリアミン、フェノ−ルノボラックやレゾ−ル、ポリメルカプタン、酸無水物などである。   The adhesive to which the present invention is applied preferably has a curing agent mainly composed of a catalyst-curing type epoxy resin, for example. That is, since the adhesive for circuit connection needs to be cured in a short time, a catalyst-curable type for initiating ring-opening polymerization is used. On the other hand, as a substrate or an adhesive between the substrate and the circuit, a polyaddition type is frequently used, and since the structures of these cured products are different, a difference occurs in solvent resistance. In general, the polyaddition type, which is not sufficiently formed into a network, has insufficient mechanical properties when compared with the catalyst-curing type, and therefore has a sufficient curing reaction to produce a product and has high solvent resistance. Examples of the catalyst-curable type include tertiary amines such as benzyldimethylamine, imidazoles such as 2-methylimidazole, and cationic catalysts such as Lewis acids and onium salts. Examples of the polyaddition type include polyamine, phenol novolak and resole, polymercaptan and acid anhydride.

本発明によれば、剥離を要する接着剤部に剥離用組成物を形成し暫時接触させる。この時多孔質体微粉を含有しているので、剥離用組成物は揺変(チキソトロピ−)性を有し、剥離を要する接着剤部に剥離用組成物を形成する時は液状で比較的低粘度のため形成が容易であるが、形成後の静置により増粘剤として作用し必要部外への流出を防ぎ補修が必要な部分のみへの形成を容易にする。また多孔質体微粉の空隙部に充填されていた溶剤は、接触過程で接着剤との界面にしみだし剥離を要する接着剤部を常時湿潤して、接着剤と任意の時間接触することができる。この時、組成物中に沸点が高い化合物を含むので揮発しにくい。また剥離用組成物中には、接着剤を分解または溶解、膨潤する性質が強い有機溶剤を含有しているので、剥離可能な状態にすることができる。剥離用組成物中の溶剤は有機溶剤のみなので、補修部および/またはその周辺部の接続信頼性を保持することが可能であり、剥離液中に酸やハロゲン系溶剤を含有しないので、特にこの効果が顕著である。   According to the present invention, a peeling composition is formed on the adhesive portion that needs to be peeled off, and is temporarily contacted. At this time, since the porous fine powder is contained, the peeling composition has a thixotropic property, and is relatively liquid and relatively low when the peeling composition is formed on the adhesive portion requiring peeling. Although it is easy to form due to its viscosity, it acts as a thickener when left standing after formation to prevent it from flowing out of the required parts and facilitate formation of only those parts requiring repair. In addition, the solvent filled in the voids of the porous fine powder exudes to the interface with the adhesive during the contact process and constantly wets the adhesive that needs to be peeled off, and can be in contact with the adhesive for an arbitrary time. At this time, since the composition contains a compound having a high boiling point, it is difficult to volatilize. Moreover, since the peeling composition contains an organic solvent having a strong property of decomposing, dissolving, and swelling the adhesive, the composition can be in a peelable state. Since the solvent in the stripping composition is only an organic solvent, it is possible to maintain the connection reliability of the repaired portion and / or its peripheral portion, and the stripping solution contains no acid or halogen-based solvent. The effect is remarkable.

以下、本発明を実施例により具体的に説明する。
参考例1〜3
(1)剥離用組成物の作成
アセトニルアセトンにアエロジル130(高純度シリカ、粒径約16mμ、BET法比表面積130m/g、130と略)の配合比(重量比で、1部…参考例1、5部…参考例2、10部…参考例3)を変えて、乳鉢で練り添加した。参考例1〜3の粘度(JIS K6833)およびチキソトロピックインデックス(TI)は、250cps,1.3(参考例1)、800cps,2.0(参考例2)、1500cps,3.5(参考例1)であった。
(2)接続体
ITO回路端子を有するガラス基板と、接続幅が10mmのFPC回路基板(いずれも回路幅50μm,回路間隔50μm)3枚を間隔0.5mmで、異方導電性接着フィルム(イミダゾ−ル系の触媒型硬化剤含有のエポキシ系接着剤が主成分、日立化成工業株式会社製商品名アニソルムAC−7073、厚み25μm)を用いて、170℃−20kg/cm−20秒で導電接続した。本接続条件により接着剤は硬化し十分な接続信頼性が得られることを確認した。
(3)剥離
上記(2)の接続体の中央のFPC回路基板のみを、機械的に静かに剥がした。このガラス基板及びFPC回路基板の剥離面には接続により硬化した接着剤が残存した。この剥離面上に(1)の剥離用組成物をテトラフルオロエチレン製のスパチュラにより厚さ約2〜3mmとなるように形成した。この時参考例1〜3の番号が後になるほど粘度が高くペ−スト状に近い状態であり、形成が容易であった。その状態で30分放置した後、綿棒でこすり接着剤及び剥離用組成物を除去し、さらにアセトンを含浸した綿棒で清浄化した。同様にFPC回路も清浄化した。両者とも剥離用組成物の他部への浸透がなく、必要部のみの剥離が可能であった。
(4)再接続
前項でえた清浄化したガラス基板及びFPCを用いて、前記と同様にAC−7073により再接続した。再接続を行ったFPC回路部の接続抵抗及び、これと隣接するFPC回路の接続抵抗と、接着剤の除去を実施する前の接続抵抗との差は、±0.5Ω以内で、各実施例とも接続抵抗の上昇は見られなかった。また参考例1〜3に用いたFPCは、銅箔とポリイミド基材の接着剤として、やはりエポキシ系接着剤が主成分(硬化剤はヘキサヒドロ無水フタル酸/ジシアンジアミド系)であったが、この接着剤の劣化は見られなかった。この理由として、FPC接着剤は重付加型であるのに対し、異方導電性接着フィルムの接着剤は開環重合を開始させる触媒硬化型であり、硬化物の構造が異なるために剥離性に差を生じたものと考えられる。
Hereinafter, the present invention will be described specifically with reference to examples.
Reference Examples 1-3
(1) Preparation of stripping composition Mixing ratio of Aerosil 130 (high-purity silica, particle size of about 16 μm, BET specific surface area of 130 m 2 / g, abbreviated as 130) to acetonylacetone (1 part by weight ratio; reference) Example 1, 5 parts Reference Example 2, 10 parts Reference Example 3 was changed and kneaded and added in a mortar. The viscosity (JIS K6833) and thixotropic index (TI) of Reference Examples 1 to 3 were 250 cps, 1.3 (Reference Example 1), 800 cps, 2.0 (Reference Example 2), 1500 cps, 3.5 (Reference Example). 1).
(2) Connection body A glass substrate having an ITO circuit terminal and three FPC circuit boards having a connection width of 10 mm (both having a circuit width of 50 μm and a circuit interval of 50 μm) having an interval of 0.5 mm and an anisotropic conductive adhesive film (Imidazo) Conductivity at 170 ° C.-20 kg / cm 2 -20 seconds using an epoxy adhesive containing a catalyst-type curing agent containing a catalyst as a main component and a trade name of Anisorm AC-7073, manufactured by Hitachi Chemical Co., Ltd., having a thickness of 25 μm. Connected. It was confirmed that the adhesive was cured under these connection conditions and sufficient connection reliability was obtained.
(3) Peeling Only the FPC circuit board at the center of the connection body of the above (2) was mechanically gently peeled off. The adhesive cured by connection remained on the peeled surfaces of the glass substrate and the FPC circuit board. On the release surface, the release composition of (1) was formed to a thickness of about 2 to 3 mm using a spatula made of tetrafluoroethylene. At this time, the higher the number of Reference Examples 1 to 3, the higher the viscosity and the state was close to a paste-like state, and the formation was easy. After allowing to stand in that state for 30 minutes, the adhesive and the stripping composition were removed by rubbing with a cotton swab, and further cleaned with a cotton swab impregnated with acetone. Similarly, the FPC circuit was cleaned. In both cases, there was no permeation into other parts of the stripping composition, and only the necessary parts could be stripped.
(4) Reconnection Using the cleaned glass substrate and FPC obtained in the preceding section, reconnection was performed using AC-7073 in the same manner as described above. The difference between the connection resistance of the reconnected FPC circuit part, the connection resistance of the adjacent FPC circuit, and the connection resistance before the removal of the adhesive was within ± 0.5Ω. No increase in connection resistance was observed. In the FPC used in Reference Examples 1 to 3, an epoxy-based adhesive was also a main component (a curing agent was hexahydrophthalic anhydride / dicyandiamide-based) as an adhesive between a copper foil and a polyimide substrate. No deterioration of the agent was observed. The reason for this is that the FPC adhesive is a polyaddition type, whereas the adhesive for the anisotropic conductive adhesive film is a catalyst-curable type that initiates ring-opening polymerization, and the structure of the cured product is different, resulting in poor peelability. It is considered that there was a difference.

比較例1
参考例1〜3と同様であるが、剥離用組成物の多孔質体微粉を含まない場合である。この場合、剥離用組成物を形成放置した際に隣接するFPC回路部にまで流れてしまい、隣接したFPCの接続抵抗が上昇してしまった。
Comparative Example 1
Same as Reference Examples 1 to 3, but without the porous fine powder of the release composition. In this case, when the peeling composition was formed and allowed to flow, it flowed to the adjacent FPC circuit portion, and the connection resistance of the adjacent FPC increased.

実施例1〜5
(1)剥離用組成物の作成
アセトニルアセトン(AA)/N−メチルピロリドン(NMP)/アエロジル(AE)130(高純度シリカ、粒径約16mμ、BET法比表面積130m/g、130と略)の配合比を表1のように変えて、乳鉢で練り添加した。これらの粘度(JIS K6833)およびチキソトロピックインデックス(TI)は、実施例1(1000cps,TI2.1)、実施例2(250、1.3)、実施例3(700、2.1)、実施例4(1500、3.5)、実施例5(500、1.9)であった。
(2)接続体
ITO回路端子を有するガラス基板と、接続幅が10mmのFPC回路基板(いずれも回路幅50μm,回路間隔50μm)3枚を間隔0.5mmで、異方導電性接着フィルム(イミダゾ−ル系の触媒型硬化剤含有のエポキシ系接着剤が主成分、日立化成工業株式会社製商品名アニソルムAC−7073、厚み25μm)を用いて、170℃−20kg/cm−20秒で導電接続した。本接続条件により接着剤は硬化し十分な接続信頼性が得られることを確認した。
(3)剥離
上記(2)の接続体の中央のFPC回路基板のみを、機械的に静かに剥がした。このガラス基板及びFPC回路基板の剥離面には接続により硬化した接着剤が残存した。この剥離面上に(1)の剥離用組成物をテトラフルオロエチレン製のスパチュラにより厚さ約2〜3mmとなるように形成した。その状態で30分放置した後、綿棒でこすり接着剤及び剥離用組成物を除去し、さらにアセトンを含浸した綿棒で清浄化した。同様にFPC回路も清浄化した。両者とも剥離用組成物の他部への浸透がなく、必要部のみの剥離が可能であった。
(4)再接続
前項でえた清浄化したガラス基板及びFPCを用いて、前記と同様にAC−7073により再接続した。再接続を行ったFPC回路部の接続抵抗及び、これと隣接するFPC回路の接続抵抗と、接着剤の除去を実施する前の接続抵抗との差は、±0.5Ω以内で、各実施例とも接続抵抗の上昇は見られなかった。また実施例1〜5に用いたFPCは、銅箔とポリイミド基材の接着剤として、やはりエポキシ系接着剤が主成分(硬化剤はヘキサヒドロ無水フタル酸/ジシアンジアミド系)であったが、この接着剤の劣化は見られなかった。この理由として、FPC接着剤は重付加型であるのに対し、異方導電性接着フィルムの接着剤は開環重合を開始させる触媒硬化型であり、硬化物の構造が異なるために剥離性に差を生じたものと考えられる。
Examples 1 to 5
(1) Preparation of stripping composition Acetonylacetone (AA) / N-methylpyrrolidone (NMP) / Aerosil (AE) 130 (high-purity silica, particle diameter of about 16 μm, BET specific surface area of 130 m 2 / g, 130 (Abbreviation) was changed as shown in Table 1 and kneaded in a mortar. These viscosities (JIS K6833) and thixotropic index (TI) were measured in Example 1 (1000 cps, TI 2.1), Example 2 (250, 1.3), Example 3 (700, 2.1), and Example 4 (1500, 3.5) and Example 5 (500, 1.9).
(2) Connection body A glass substrate having an ITO circuit terminal and three FPC circuit boards having a connection width of 10 mm (both having a circuit width of 50 μm and a circuit interval of 50 μm) having an interval of 0.5 mm and an anisotropic conductive adhesive film (Imidazo) Conductivity at 170 ° C.-20 kg / cm 2 -20 seconds using an epoxy adhesive containing a catalyst-type curing agent containing a catalyst as a main component and a trade name of Anisorm AC-7073, manufactured by Hitachi Chemical Co., Ltd., having a thickness of 25 μm. Connected. It was confirmed that the adhesive was cured under these connection conditions and sufficient connection reliability was obtained.
(3) Peeling Only the FPC circuit board at the center of the connection body of the above (2) was mechanically gently peeled off. The adhesive cured by connection remained on the peeled surfaces of the glass substrate and the FPC circuit board. On the release surface, the release composition of (1) was formed to a thickness of about 2 to 3 mm using a spatula made of tetrafluoroethylene. After allowing to stand in that state for 30 minutes, the adhesive and the stripping composition were removed by rubbing with a cotton swab, and further cleaned with a cotton swab impregnated with acetone. Similarly, the FPC circuit was cleaned. In both cases, there was no permeation into other parts of the stripping composition, and only the necessary parts could be stripped.
(4) Reconnection Using the cleaned glass substrate and FPC obtained in the preceding section, reconnection was performed using AC-7073 in the same manner as described above. The difference between the connection resistance of the reconnected FPC circuit part, the connection resistance of the adjacent FPC circuit, and the connection resistance before the removal of the adhesive was within ± 0.5Ω. No increase in connection resistance was observed. In the FPC used in Examples 1 to 5, an epoxy-based adhesive was also used as an adhesive (a curing agent was hexahydrophthalic anhydride / dicyandiamide-based) as an adhesive between a copper foil and a polyimide substrate. No deterioration of the agent was observed. The reason for this is that the FPC adhesive is a polyaddition type, whereas the adhesive for the anisotropic conductive adhesive film is a catalyst-curable type that initiates ring-opening polymerization, and the structure of the cured product is different, resulting in poor peelability. It is considered that there was a difference.

実施例6〜10
実施例1〜5と同様であるが、剥離用組成物の種類と組成をかえた。すなわち新しくジアセトンアルコ−ル(DA)、ジイソブチルケトン(DB)、ホルムアミド(HA),スメクタイトSAN(合成スメクタイト、BET法比表面積750m/g,SAN)である。各実施例とも剥離用組成物が揺変性を有しているので形成が容易であり、形成後の静置により増粘して必要部外への流出を防ぎ補修が必要な部分のみへの形成が容易であった。また再接続部の接続抵抗の上昇は見られず良好な再接続が可能であった。
Examples 6 to 10
Same as Examples 1 to 5, except that the type and composition of the release composition were changed. That is, diacetone alcohol (DA), diisobutyl ketone (DB), formamide (HA), and smectite SAN (synthetic smectite, BET specific surface area 750 m 2 / g, SAN) are new. In each of the examples, since the release composition has thixotropy, it is easy to form, and it is thickened by standing after formation to prevent it from flowing out of the required part and to form only the part that needs repair. Was easy. Also, no increase in connection resistance at the reconnection portion was observed, and good reconnection was possible.

Figure 2004197109
Figure 2004197109

実施例11
実施例3の剥離用組成物を用いて、接続体の構成を変えた。すなわち、半導体チップ(3×10mm,高さ0.5mm,主面の4辺周囲にバンプとよばれる100μm角、高さ20μmの突起した金電極が存在)のバンプ配置と対応した接続端子を有する厚み1mmのガラスエポキシ基板(回路は銅箔で厚み18μm、接着剤は、エポキシ樹脂が主成分で硬化剤はジアミノジフェニルメタン/イミダゾ−ル系)を用意した。実施例1と同様に、異方導電性接着フィルム(イミダゾ−ル系アニオン重合触媒硬化剤含有のエポキシ系接着剤が主成分、日立化成工業株式会社製商品名アニソルムAC−8201、厚み30μm)を用いて、170℃−20kg/cm−20秒で導電接続した。本接続条件により接着剤は硬化し十分な接続信頼性が得られることを確認した。上記に続いて接続体を熱盤上で180℃に加熱しながら、剪断力を加えながら静かにはがした。この剥離面に実施例1と同様に剥離用組成物を形成した。20分放置後、テトラフルオロエチレン製のピンセットを用いて、除去、清浄化、および再接続を行なった。両実施例共に剥離用組成物の他部への浸透がなく、必要部のみの接着剤除去が可能であった。また再接続後の接続抵抗は良好であり、信頼性に優れていた。
Example 11
Using the peeling composition of Example 3, the structure of the connector was changed. That is, it has connection terminals corresponding to the bump arrangement of a semiconductor chip (3 × 10 mm, height 0.5 mm, protruding gold electrodes of 100 μm square and 20 μm height called bumps around four main surface sides). A glass epoxy substrate having a thickness of 1 mm (a circuit was made of copper foil and had a thickness of 18 μm, an adhesive was mainly composed of an epoxy resin, and a curing agent was a diaminodiphenylmethane / imidazole system) was prepared. In the same manner as in Example 1, an anisotropic conductive adhesive film (an epoxy resin containing an imidazole-based anionic polymerization catalyst curing agent as a main component, trade name: Anisolm AC-8201, manufactured by Hitachi Chemical Co., Ltd., thickness: 30 μm) was used. The conductive connection was performed at 170 ° C.-20 kg / cm 2 -20 seconds. It was confirmed that the adhesive was cured under these connection conditions and sufficient connection reliability was obtained. Subsequent to the above, the connector was gently peeled off while applying a shearing force while being heated to 180 ° C. on a hot platen. A release composition was formed on the release surface in the same manner as in Example 1. After standing for 20 minutes, removal, cleaning, and reconnection were performed using tweezers made of tetrafluoroethylene. In both examples, there was no permeation into the other part of the peeling composition, and only the necessary part of the adhesive could be removed. The connection resistance after reconnection was good, and the reliability was excellent.

実施例12
実施例11と同様であるが、半導体チップを強制的に剥離せずに、接続部周辺の接着剤はみ出し部に剥離用組成物を形成し、24時間放置後に剥離したところ、簡単に剥離可能であった。以下実施例11と同様な評価を実施したが、良好な再接続が可能であった。以上の実施例11、12においても、異方導電性接着フィルムとガラスエポキシ基板との硬化物の構造が異なるために、ガラスエポキシ基板の接着剤の劣化は目視観測では認められなかった。
Example 12
Same as Example 11, but without forcibly peeling the semiconductor chip, forming a peeling composition on the adhesive protruding portion around the connection portion and peeling it after standing for 24 hours. there were. Thereafter, the same evaluation as in Example 11 was performed, but good reconnection was possible. Also in Examples 11 and 12 above, since the structures of the cured products of the anisotropic conductive adhesive film and the glass epoxy substrate were different, deterioration of the adhesive of the glass epoxy substrate was not observed by visual observation.

Claims (3)

沸点が110℃以上の含酸素系有機溶剤と含窒素系有機溶剤との混合溶剤100重量部に対し、この溶剤に不溶性の多孔質体微粉0.5〜50重量部を含有してなる回路接続部の接着剤剥離用組成物。 A circuit connection comprising 0.5 to 50 parts by weight of a porous fine powder insoluble in a solvent based on 100 parts by weight of a mixed solvent of an oxygen-containing organic solvent having a boiling point of 110 ° C. or higher and a nitrogen-containing organic solvent. Part of the composition for peeling off the adhesive. 剥離を要する回路接続部に請求項1の組成物を接触させ、暫時接触後に清拭・清浄化することからなる回路接続部の剥離方法。 A method for peeling off a circuit connecting portion, comprising: bringing the composition of claim 1 into contact with a circuit connecting portion requiring peeling, and wiping / cleaning after temporary contact. 回路接続部の接着剤が、触媒硬化型のエポキシ樹脂を主成分とするものである請求項2記載の回路接続部の剥離方法。
3. The method according to claim 2, wherein the adhesive of the circuit connecting portion is mainly composed of a catalyst-curable epoxy resin.
JP2004068937A 1994-11-25 2004-03-11 Composition for removing adhesive of circuit joint and method for removing using the composition Pending JP2004197109A (en)

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JP2004068937A JP2004197109A (en) 1994-11-25 2004-03-11 Composition for removing adhesive of circuit joint and method for removing using the composition

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006241389A (en) * 2005-03-07 2006-09-14 Hitachi Chem Co Ltd Adhesive-removing material
JP2006241390A (en) * 2005-03-07 2006-09-14 Hitachi Chem Co Ltd Material for removing circuit-connecting adhesive
JP2006351765A (en) * 2005-06-15 2006-12-28 Shimadzu Corp Integrated circuit package and optical detector or radiation detector provided therewith
KR100723194B1 (en) 2005-03-08 2007-05-29 삼성전기주식회사 Patch Remover Composite, Process For Preparing The Same And Patch Removing Method Using The Same

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006241389A (en) * 2005-03-07 2006-09-14 Hitachi Chem Co Ltd Adhesive-removing material
JP2006241390A (en) * 2005-03-07 2006-09-14 Hitachi Chem Co Ltd Material for removing circuit-connecting adhesive
KR100723194B1 (en) 2005-03-08 2007-05-29 삼성전기주식회사 Patch Remover Composite, Process For Preparing The Same And Patch Removing Method Using The Same
JP2006351765A (en) * 2005-06-15 2006-12-28 Shimadzu Corp Integrated circuit package and optical detector or radiation detector provided therewith
JP4604865B2 (en) * 2005-06-15 2011-01-05 株式会社島津製作所 Method for removing an integrated circuit from an integrated circuit package

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