JP2004179373A - Electronic parts package and its sealing method - Google Patents

Electronic parts package and its sealing method Download PDF

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Publication number
JP2004179373A
JP2004179373A JP2002343537A JP2002343537A JP2004179373A JP 2004179373 A JP2004179373 A JP 2004179373A JP 2002343537 A JP2002343537 A JP 2002343537A JP 2002343537 A JP2002343537 A JP 2002343537A JP 2004179373 A JP2004179373 A JP 2004179373A
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JP
Japan
Prior art keywords
container
lid
electronic component
component package
opening
Prior art date
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JP2002343537A
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Japanese (ja)
Inventor
Hiroshi Emoto
洋 江本
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Kyocera Crystal Device Corp
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Kyocera Crystal Device Corp
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Filing date
Publication date
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Priority to JP2002343537A priority Critical patent/JP2004179373A/en
Publication of JP2004179373A publication Critical patent/JP2004179373A/en
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Abstract

<P>PROBLEM TO BE SOLVED: To provide an electronic parts package capable of realizing improved reliability as electronic parts by reducing damage to a container for mounting electronic parts thereon by a beam being welding means used for sealing and suppressing the formation and occurrence of hole and crack or the like, in the electronic parts package for hermetically sealing the container by covering it with a lid. <P>SOLUTION: The container 1 at an opening top of which a metalized layer 2 is formed, and of the lid 3 where plate thickness T2 of an outer periphery end 3b is formed thinner than a principal section 3a are used. After the lid 3 is put on the container opening, the outer periphery end 3b of the lid 3 or its end boundary is irradiated thereon or therealong with laser light for heating and melting thereof. Consequently, the container 1 and the lid 3 are melted and joined with each other to realize the hermetically sealed electronic parts package. <P>COPYRIGHT: (C)2004,JPO

Description

【0001】
【発明の属する技術分野】
本発明は、一辺を開口して空間を形成した容器内部に圧電振動体や半導体などの電子部品を搭載し、その容器開口部にリッドを被せ、その後、容器とリッドとを溶融接合して電子部品を気密封止する電子部品パッケ−ジとその封止方法に関する。
特に、気密封止の際にレ−ザビ−ムを使用する構造に最適な電子部品パッケ−ジとその封止方法に関する発明である。
【0002】
【従来の技術】
従来のこの種のパッケ−ジ構造では、本出願人が提案した特開平8−46075号(特願平6−197573号)公報に記載されたものがある。
【0003】
【発明が解決しようとする課題】
ここでの電子部品パッケ−ジに用いる技術は、気密封止の際、電子ビ−ム溶接あるいはレ−ザビ−ム溶接を用いることにより行うもので、容器の開口頂部に形成するメタライズ層の厚さをこれまでより厚めに形成した容器を使用し、これに前記溶接技術を用いてビ−ムをリッドの上から照射してリッドを加熱溶融することで、容器の開口頂部の金属メッキ層と溶融接合させ、封止するものである。このように構成したことにより、それまでと比較して、溶融接合の際のビ−ム照射による過熱による容器の損傷を防いだ電子部品パッケ−ジの提供を実現していた。
【0004】
しかしながら、上述のように構成したとしても、電子ビ−ム溶接あるいはレ−ザビ−ム溶接に必要な照射エネルギ−量に変化はなく、依然として大きく、したがって、時として容器に穴が明いたり、クラックが発生する等、電子部品としての信頼性を損なう損傷の発生が生じていた。
【0005】
また、図2に示す如き外形寸法が容器31の外形寸法aより小さくしたリッド32を用いる構成もあるが、この場合にも、リッド32の端部へ照射するレ−ザのエネルギ−の制御が極めて難しいものとなる。レ−ザはその特性からあるサイズのスポット径を有し、その多くはリッド32の端部に照射されるが、制御の困難さからその一部は図示するように容器1頂部の外周側に直接照射されることになり、結果として容器1の頂部に形成されたメタライズ層31aは大きなエネルギ−をそのまま受けることになる。この場合、前出の公報記載の構成と較べ、レ−ザがメタライズ層31aを突き抜ける可能性が増し、その場合、メタライズ層31aが保護する層下の容器自体が蒙るダメ−ジはさらに大きく、電子部品としての信頼性を大きく損なうものとなることが予想される。
【0006】
尚、図2において、リッド32の左端部はレ−ザの照射により容器31頂部のメタライズ層31aと溶融接着した状態を示している。
【0007】
本発明は上記課題を解消するためになされたものであって、リッドの形状に着目することでリッドの強度を落さず、レ−ザのエネルギ−量を小さくしても充分な封止を実現したものである。これによって、リッド本来の強度を劣化させることなく、溶接の際の容器に対するレ−ザ−ビ−ムや電子ビ−ムによるダメ−ジを軽減させ、容器に対する穴あきやクラックの発生等を抑え、更には、封止後の加熱に対しても容器の歪みの発生を抑えることにも配慮し、信頼性をより高めた電子部品パッケ−ジを提供しようとするものである。
【0008】
【課題を解決するための手段】
上記目的を達成するために、本発明に関わる電子部品パッケ−ジにおいては、容器の開口頂部を塞ぐリッドの外周端部板厚を薄く形成し、このリッドを容器開口頂部に載置後、リッドの板厚が薄い外周端部、あるいは容器の開口頂部との境界周辺にレ−ザを照射して両者を溶融接合し、電子部品搭載後の容器を封止するようにしたものである。
これにより、レ−ザの小さな照射エネルギ−でも充分な溶融接合を実現出来、結果、封止時おける容器に対するダメ−ジを最低限に抑え込むことを実現したものである。
【0009】
【発明の実施の形態】
以下、本発明による電子部品パッケ−ジの実施形態を図面を参照しながら説明する。
図1は本発明に関わる電子部品パッケ−ジ(電子部品は図示せず)の一実施形態を示す断面図である。
尚、図1にあって、メタライズ層は、容器の寸法と較べ非常に薄いものであることから、本発明を理解し易くするためにデフォルメした形で現している。
【0010】
ここで、溶接時に使用するレ−ザについて説明する。溶接に用いるレ−ザとして、エキシマレ−ザ、炭酸ガスレ−ザ、YAGレ−ザが知られている。この中で、封止溶接やスポット溶接、シ−ム溶接に適したものとしてはYAGレ−ザが挙げられる。
このYAGレ−ザは、波長が短く、集光性に優れることから、本発明の如き小さな電子部品の溶接に必要とされるφ0.2〜0.3ミリ程度の微小なスポット径を得る事が容易であり、加工材料に対して与える熱影響を比較的少なく抑えることが期待できるレ−ザである。したがって、YAGレ−ザでは、低い出力で微小なエリアの加工が可能となるので、加工に適した材料として、光の吸収率が高い金属、セラミック等に対して歪みの少ない溶接加工を実現出来るものである。
また、炭酸ガスレ−ザの場合は、加工に適した材料としては金属があり、エキシマレ−ザの場合は、加工に適した材料としては、ガラス、樹脂、セラミックス等を挙げることが出来る。
【0011】
図1において、1は絶縁材であって、熱膨張係数が小さい材質、例えばセラミック材を用い、一辺を開口して形成した空間に圧電振動体や半導体などの電子部品(図示せず)を搭載出来る一辺を1.5〜数ミリメ−トル程度とした長方形の容器である。2は容器1の開口頂部全周に形成されたメタライズ層であって、タングステン層2a、ニッケルメッキ等の金属メッキ層2bを順次積層して形成されている。
【0012】
3は前記容器1の開口頂部に被せるリッドであって、全体の外形寸法Xは、容器1の外形寸法Aより小さく、容器1の開口部寸法Bより大きく形成されている。更に、このリッド3に段差を形成して外周端部3bとし、主要部分3aの板厚T1と較べてその板厚T2を薄く形成している。
この時のリッド3の主要部分3aは、上からの押圧に耐え、電子部品を保護出来る強度を維持する必要からこれまでと同程度の厚さを有するとともに、その寸法は容器開口部寸法Bを上回って形成されている。この時の、外周端部3bを含めたリッド3全体の外形寸法Xは、容器1の外形寸法Aより幾分小さめに形成されている。したがって、リッド3の主要部分3aより外側に形成される外周端部3bは、後工程のレ−ザによる溶融接合に備え、容器1の開口頂部の幅Cより狭く形成されることになる。
【0013】
このようにリッド3の主要部分3aと外周端部3bの板厚、寸法を形成したリッド3は、上からの押力に対しては、板厚部分であるリッド3の主要部分3aと容器1の開口頂部の内周側で支えることになり、これまでと同様の厚さのリッド主要部分3aで対応出来るので、その強度は従来形状のリッドと比較しても劣ることはなく、板厚T1の厚みを増すことなく、従来と同程度の厚さで充分となる。また、リッド3の主要部分3aと外周端部3bとの段差は、プレス、あるいはハ−フエッチングにより容易に形成することが出来、その後、表面保護等を目的として必要により金属メッキ層(図示せず)が形成される。
更に、リッド3に用いる材質としては、後工程になる封止時の加熱工程を考慮して、前記容器1の熱膨張率、この場合はセラミック材の熱膨張率に近いものとしてコバ−ル材が適当である。
【0014】
以下、以上の構成において、本発明に関わる電子部品パッケ−ジおよびその気密封止方法について、図1を参照しつつ順を追って詳述する。
先ず、容器1の頂部全周にわたってタングステン層2aを印刷により形成する。
この時のタングステン層2aの厚みは、この後の気密封止のための加熱溶融時の容器1に対するダメ−ジによる影響を抑え、軽減することを考慮して、10〜30μm程度とすることが望ましいものである。
【0015】
この後、前記タングステン層2aの表面に金属メッキ層2bを形成する。具体的には、ニッケルメッキ層を形成するが、必要により更にその上に金メッキ層(図示せず)を形成することも可能である。
【0016】
以上の如くして開口頂部にメタライズ層2を形成した容器1の内部に、圧電振動体や半導体などの電子部品を搭載した(図示せず)後、図示するようにリッド3を、その主要部分3aが容器1の開口部を塞ぐ位置となるように位置合わせしつつ容器1に被せる。
この時のリッド3の外形寸法Xは、前述の通り容器1のメタライズ層2上に載置可能な寸法、換言すると容器1の外形寸法Aより僅かに小さな外形寸法で形成され、封止のための容器1開口頂部のメタライズ層2との溶融接合に支障がない寸法を確保している。
【0017】
ここで、これまでの各部寸法の関係ついてみると、
容器1の外形寸法A > リッド3の外形寸法X > リッド3の主要部分寸法Y > 容器1の開口部寸法B
の関係が成り立つことが理解出来る。
【0018】
次に、以上のようにして容器1の開口頂部上に載置されたリッド3の外周端部3b上、あるいは容器1の開口頂部のメタライズ層2との境界付近に、例えばYAGレ−ザを用い、スポット径がφ0.2〜0.3ミリ程度のレ−ザを照射してリッド3の外周端部3bを溶融して容器1の開口頂部、この場合、メタライズ層2を介して溶融接合し、電子部品を搭載している容器1を気密封止する。
【0019】
この時のYAGレ−ザが照射するエネルギ−は、溶融するリッド3の外周端部3bの板厚T2が従来のそれと較べて薄くなった分だけ抑えることが出来るもので、例えば、これまでの板厚と較べて半分の厚さで形成した場合には、目安としてはその照射するレ−ザのエネルギ−の量をほぼ半分に減らすことが期待出来ることになる。
これにより、照射するエネルギ−量の減少とともに容器1の開口頂部へのダメ−ジも減らすことが出来るので、従来あった溶接時のレ−ザによる加熱を原因とする容器1の穴あき、クラックの発生等、最終製品である電子部品の信頼性を損なう影響を減らすことが出来るものである。
【0020】
以上の実施形態の説明では、リッド3の外周端部3bの板厚を薄くした例として段差を持たせたが、他の実施形態として、前記リッド3の外周端部の板厚が、その主要部分3aから外周端部側に向かって薄くなるようにテ−パ−を持たせて形成(図示せず)しても、本発明の所期の効果を得られることは説明するまでもない。
【0021】
また、溶接手段として、YAGレ−ザを用いて説明したが、本発明では特にこれに限定されるものではなく、容器1やリッド3に使用する材質等に応じてその他の溶接手段、例えばエキシマレ−ザや、炭酸ガスレ−ザ、あるいはその他の電子ビ−ムを適宜選択し、使用しても本発明の所期の目的を達成し、効果を得ることが期待出来るものであることは説明するまでもない。
【0022】
尚、リッド3の溶融個所に対するレ−ザの照射条件は、加熱による容器1へのダメ−ジの影響を少しでも抑えることを考慮して、通常は常温、不活性ガスの雰囲気の環境下で行われるが、必ずしも不活性ガスの雰囲気の環境下である必要はなく、真空の環境下であっても問題はない。
【0023】
また、容器1の材質の一実施形態として、セラミック材を用いて説明したが、絶縁体であれば他の材質でも問題はなく、例えば樹脂材で形成しても本発明の所期の効果が期待できることは説明するまでもない。
【0024】
更に、メタライズ層2の一実施形態として、タングステン層と金属メッキ層を積層した構成を用いて説明したが、タングステン層を、モリブデン(元素記号Mo)層に置き換えても本発明の所期の効果を期待することが出来る。
【0025】
更に、容器1とリッド3の材質の熱膨張率は、封止時に加えられる熱に対し、互いに影響を与えることを防ぐとともに、気密封止後に加熱された場合でも膨張率の違いによる封止部分での歪みの発生を抑えることから、同じか、その差が少ない組合せとすることがよい。
【0026】
【発明の効果】
以上詳述の通り、本発明に関わる電子部品パッケ−ジおよびその気密封止方法によれば、封止時におけるレ−ザビ−ムによる加熱溶融の際での電子部品を搭載する容器1へのダメ−ジを軽減させることが出来るので、信頼性が向上した電子部品パッケ−ジを提供できる効果が期待出来る。
また、容器1とリッド3に使用する材質の組合せを考慮することにより、気密封止後の加熱に対しても、封止部分での歪みの発生を抑えることが出来、封止後のパッケ−ジの信頼性向上に一層の効果が期待出来る。
【0027】
更に、リッドの外周端部にテ−パを形成した他の実施形態の場合では、封止に用いるレ−ザビ−ムがテ−パの角度によってそのままビ−ムの光源側に反射して戻ることがなくなることから、ビ−ム光源の損傷を防ぐ効果も期待出来るものである。
【図面の簡単な説明】
【図1】本発明に関わる電子部品パッケ−ジの一実施形態を示す断面図である。
【図2】従来の電子部品パッケ−ジ構成の一例を示す断面図である。
【符号の説明】
1 容器
2 メタライズ層
2a タングステン層
2b 金属メッキ層
3 リッド
3a リッドの主要部分
3b リッドの外周端部
A 容器の外形寸法
B 容器の開口部寸法
C 容器頂部の幅
X リッドの外形寸法
Y リッド主要部部分の寸法
T1 リッド主要部分の板厚
T2 リッド外周端部の板厚
[0001]
TECHNICAL FIELD OF THE INVENTION
According to the present invention, an electronic component such as a piezoelectric vibrator or a semiconductor is mounted inside a container in which one side is opened to form a space, and a lid is placed over the opening of the container. The present invention relates to an electronic component package for hermetically sealing components and a sealing method therefor.
In particular, the present invention relates to an electronic component package most suitable for a structure using a laser beam at the time of hermetic sealing and a sealing method therefor.
[0002]
[Prior art]
A conventional package structure of this type is disclosed in Japanese Patent Application Laid-Open No. 8-46075 (Japanese Patent Application No. 6-197573) proposed by the present applicant.
[0003]
[Problems to be solved by the invention]
The technology used for the package of electronic parts here is that which is performed by using electron beam welding or laser beam welding at the time of hermetic sealing, and the thickness of the metallized layer formed on the top of the opening of the container. By using a container having a larger thickness than before and irradiating a beam from above on the lid using the above-described welding technique to heat and melt the lid, a metal plating layer at the top of the opening of the container is formed. It is to be fused and sealed. With this configuration, it has been possible to provide an electronic component package that prevents damage to the container due to overheating due to beam irradiation during fusion bonding, as compared with the prior art.
[0004]
However, even with the above-described configuration, the amount of irradiation energy required for electron beam welding or laser beam welding does not change and is still large, so that the container sometimes has holes or cracks. For example, damages that impair the reliability of the electronic component have occurred.
[0005]
A lid 32 having an outer dimension smaller than the outer dimension a of the container 31 as shown in FIG. 2 may be used. In this case, too, the energy of the laser irradiated to the end of the lid 32 is controlled. It will be extremely difficult. The laser has a spot diameter of a certain size due to its characteristics, and most of the spot is irradiated to the end of the lid 32, but part of the laser is located on the outer peripheral side of the top of the container 1 as shown in the drawing because of difficulty in control. Direct irradiation is performed, and as a result, the metallized layer 31a formed on the top of the container 1 receives large energy as it is. In this case, the possibility that the laser penetrates the metallized layer 31a is increased as compared with the configuration described in the above-mentioned publication, in which case the damage to the container itself under the layer protected by the metallized layer 31a is further increased, It is expected that the reliability as an electronic component will be greatly impaired.
[0006]
In FIG. 2, the left end of the lid 32 is in a state of being melted and bonded to the metallized layer 31a on the top of the container 31 by laser irradiation.
[0007]
SUMMARY OF THE INVENTION The present invention has been made to solve the above-described problem, and by paying attention to the shape of the lid, sufficient sealing can be achieved even if the laser energy is reduced without reducing the strength of the lid. It has been realized. As a result, the laser beam or electronic beam damage to the container during welding can be reduced without deteriorating the inherent strength of the lid, and the occurrence of holes and cracks in the container can be suppressed. Further, an object of the present invention is to provide an electronic component package with higher reliability in consideration of suppressing occurrence of distortion of a container even after heating after sealing.
[0008]
[Means for Solving the Problems]
In order to achieve the above object, in an electronic component package according to the present invention, a lid for closing a top portion of an opening of a container is formed to have a small thickness at an outer peripheral end portion. A laser is applied to the outer peripheral end having a small thickness or the periphery of the boundary with the top of the opening of the container, and the two are melt-bonded to seal the container after the electronic components are mounted.
As a result, sufficient fusion bonding can be achieved even with a small irradiation energy of the laser, and as a result, damage to the container during sealing can be minimized.
[0009]
BEST MODE FOR CARRYING OUT THE INVENTION
Hereinafter, embodiments of an electronic component package according to the present invention will be described with reference to the drawings.
FIG. 1 is a sectional view showing an embodiment of an electronic component package (electronic components are not shown) according to the present invention.
In FIG. 1, since the metallized layer is very thin compared to the dimensions of the container, it is shown in a deformed form so that the present invention can be easily understood.
[0010]
Here, a laser used at the time of welding will be described. Excimer lasers, carbon dioxide lasers, and YAG lasers are known as lasers used for welding. Among them, a YAG laser is suitable for sealing welding, spot welding, and seam welding.
Since this YAG laser has a short wavelength and excellent light-collecting properties, it can obtain a fine spot diameter of about 0.2 to 0.3 mm required for welding small electronic components as in the present invention. It is a laser which is easy to perform and can be expected to suppress the thermal influence on the work material relatively small. Therefore, in the YAG laser, it is possible to process a small area with a low output, and as a material suitable for the processing, it is possible to realize a welding process with a small distortion to a metal, a ceramic or the like having a high light absorption rate. Things.
In the case of a carbon dioxide laser, a metal is a material suitable for processing, and in the case of an excimer laser, examples of a material suitable for processing include glass, resin, and ceramics.
[0011]
In FIG. 1, reference numeral 1 denotes an insulating material, which is made of a material having a small coefficient of thermal expansion, for example, a ceramic material, and has electronic components (not shown) such as a piezoelectric vibrator and a semiconductor mounted in a space formed by opening one side. It is a rectangular container whose one side is about 1.5 to several millimeters. Reference numeral 2 denotes a metallized layer formed all around the top of the opening of the container 1, and is formed by sequentially laminating a tungsten layer 2a and a metal plating layer 2b such as nickel plating.
[0012]
Reference numeral 3 denotes a lid that covers the top of the opening of the container 1, and the entire outer dimension X is smaller than the outer dimension A of the container 1 and larger than the opening B of the container 1. Further, a step is formed in the lid 3 to form an outer peripheral end 3b, and the plate thickness T2 is formed thinner than the plate thickness T1 of the main portion 3a.
At this time, the main portion 3a of the lid 3 has the same thickness as before because it needs to withstand pressure from above and maintain a strength capable of protecting the electronic components, and its size is the same as the container opening dimension B. It is formed to exceed. At this time, the outer dimension X of the entire lid 3 including the outer peripheral end 3b is formed slightly smaller than the outer dimension A of the container 1. Therefore, the outer peripheral end 3b formed outside the main portion 3a of the lid 3 is formed to be narrower than the width C of the top of the opening of the container 1 in preparation for fusion bonding by a laser in a later step.
[0013]
The lid 3 having the thickness and dimensions of the main portion 3a and the outer peripheral end portion 3b of the lid 3 is formed such that the main portion 3a of the lid 3, which is the plate thickness portion, and the container 1 against the pressing force from above. And the lid main portion 3a having the same thickness as before can be used. Therefore, its strength is not inferior to that of the conventional lid, and the plate thickness T1 Without increasing the thickness, a thickness comparable to that of the related art is sufficient. The step between the main portion 3a and the outer peripheral end 3b of the lid 3 can be easily formed by pressing or half etching, and thereafter, if necessary, for the purpose of surface protection or the like, a metal plating layer (not shown). Are formed.
Further, as the material used for the lid 3, considering the heating process at the time of sealing which will be a subsequent process, the thermal expansion coefficient of the container 1, in this case, a material close to the thermal expansion coefficient of the ceramic material, Is appropriate.
[0014]
Hereinafter, the electronic component package and the method for hermetically sealing the electronic component package according to the present invention in the above configuration will be described in order with reference to FIG.
First, the tungsten layer 2a is formed by printing over the entire circumference of the top of the container 1.
At this time, the thickness of the tungsten layer 2a is set to about 10 to 30 μm in consideration of suppressing and reducing the influence of damage to the container 1 during heating and melting for hermetic sealing. It is desirable.
[0015]
Thereafter, a metal plating layer 2b is formed on the surface of the tungsten layer 2a. Specifically, a nickel plating layer is formed, but if necessary, a gold plating layer (not shown) can be further formed thereon.
[0016]
After mounting an electronic component such as a piezoelectric vibrator or a semiconductor (not shown) inside the container 1 having the metallized layer 2 formed on the top of the opening as described above, the lid 3 is attached as shown in FIG. The container 3 is put on the container 1 while being positioned so that the position 3a closes the opening of the container 1.
At this time, the outer dimension X of the lid 3 is formed as a dimension that can be placed on the metallized layer 2 of the container 1 as described above, in other words, an outer dimension slightly smaller than the outer dimension A of the container 1. The dimensions which do not hinder the fusion bonding with the metallized layer 2 at the top of the opening of the container 1 are secured.
[0017]
Here, the relationship between the dimensions of each part up to now
External dimensions A of container 1> External dimensions X of lid 3> Main part dimensions Y of lid 3> Opening dimension B of container 1
It can be understood that the relationship holds.
[0018]
Next, for example, a YAG laser is placed on the outer peripheral end 3b of the lid 3 placed on the top of the opening of the container 1 or near the boundary with the metallized layer 2 at the top of the opening of the container 1. A laser having a spot diameter of about 0.2 to 0.3 mm is irradiated to melt the outer peripheral end 3b of the lid 3 and melt-bonded via the top of the opening of the container 1, in this case via the metallized layer 2. Then, the container 1 on which the electronic components are mounted is hermetically sealed.
[0019]
At this time, the energy irradiated by the YAG laser can be suppressed by the thickness T2 of the outer peripheral end 3b of the lid 3 to be melted which is smaller than that of the conventional one. In the case where the thickness is formed to be half the plate thickness, it is expected that the amount of energy of the laser to be irradiated can be reduced to almost half as a standard.
As a result, the amount of energy to be irradiated can be reduced and the damage to the top of the opening of the container 1 can be reduced. Therefore, the hole and crack in the container 1 caused by the conventional heating by the laser at the time of welding can be obtained. It is possible to reduce the effect of impairing the reliability of the electronic component as the final product, such as the occurrence of cracks.
[0020]
In the above description of the embodiment, a step is provided as an example in which the thickness of the outer peripheral end 3b of the lid 3 is reduced. However, as another embodiment, the thickness of the outer peripheral end of the lid 3 is mainly It goes without saying that the desired effect of the present invention can be obtained even if a taper is formed (not shown) so as to become thinner from the portion 3a toward the outer peripheral end side.
[0021]
Further, although a YAG laser has been described as a welding means, the present invention is not particularly limited to this, and other welding means such as an excimer laser may be used in accordance with the material used for the container 1 and the lid 3. It is described that the intended purpose of the present invention can be achieved and the effect can be obtained even if a laser, a carbon dioxide laser, or another electron beam is appropriately selected and used. Not even.
[0022]
Irradiation conditions of the laser to the melting point of the lid 3 are usually set at room temperature and in an atmosphere of an inert gas in consideration of minimizing the influence of damage to the container 1 due to heating. Although it is performed, it is not always necessary to be in an atmosphere of an inert gas atmosphere, and there is no problem even in a vacuum environment.
[0023]
Further, as an embodiment of the material of the container 1, a ceramic material has been described. However, other materials may be used as long as they are insulators. Needless to say, what can be expected.
[0024]
Further, as one embodiment of the metallized layer 2, a structure in which a tungsten layer and a metal plating layer are stacked has been described. However, even if the tungsten layer is replaced with a molybdenum (element symbol Mo) layer, the expected effect of the present invention is achieved. Can be expected.
[0025]
Further, the thermal expansion coefficient of the material of the container 1 and the lid 3 prevents the heat applied at the time of sealing from affecting each other, and the sealing portion due to the difference in the expansion rate even when heated after hermetic sealing. Therefore, it is preferable to use the same combination or a combination having a small difference between them in order to suppress the occurrence of distortion in the above.
[0026]
【The invention's effect】
As described above in detail, according to the electronic component package and the method of hermetically sealing the same according to the present invention, the package for mounting the electronic component upon heating and melting by the laser beam at the time of sealing is used. Since the damage can be reduced, an effect of providing an electronic component package with improved reliability can be expected.
In addition, by considering the combination of materials used for the container 1 and the lid 3, it is possible to suppress the occurrence of distortion in the sealed portion even when heating after hermetic sealing. Further effects can be expected to improve the reliability of the device.
[0027]
Further, in another embodiment in which a taper is formed at the outer peripheral end of the lid, the laser beam used for sealing is reflected back to the light source side of the beam as it is depending on the angle of the taper. Therefore, the effect of preventing damage to the beam light source can be expected.
[Brief description of the drawings]
FIG. 1 is a sectional view showing an embodiment of an electronic component package according to the present invention.
FIG. 2 is a cross-sectional view showing an example of a conventional electronic component package configuration.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Container 2 Metallized layer 2a Tungsten layer 2b Metal plating layer 3 Lid 3a Principal part of lid 3b Outer end of lid A External dimensions of container B Dimension of opening of container C Width of top of container X External dimensions of lid Y Principal part of lid Dimension of part T1 Thickness of main part of lid T2 Thickness of outer peripheral end of lid

Claims (9)

一辺を開口して空間を形成した容器内部に圧電振動体や半導体などの電子部品を搭載し、その容器開口部にリッドを被せ、容器とリッドとを溶融接合して電子部品を封止する電子部品パッケ−ジにおいて、
容器の開口頂部に、少なくとも金属メッキ層を積層してメタライズ層を形成し、リッドは、板厚を主要部分より薄くした外周端部を形成し、
上記リッドを容器開口部に載置後、リッドの外周端部と容器開口頂部とを溶接手段により加熱して溶融接合し、気密封止した構造としたことを特徴とする電子部品パッケ−ジ。
An electronic component that mounts an electronic component such as a piezoelectric vibrator or a semiconductor inside a container with one side open to form a space, covers the container opening with a lid, and melt-bonds the container and the lid to seal the electronic component In the parts package,
At the top of the opening of the container, at least a metal plating layer is laminated to form a metallized layer, and the lid forms an outer peripheral end portion whose plate thickness is thinner than the main portion,
An electronic component package, wherein the lid is placed in the container opening, and the outer peripheral end of the lid and the container opening top are heated and melt-bonded by welding means to form a hermetically sealed structure.
請求項1に記載の電子部品パッケ−ジにおいて、
前記リッドの外形寸法を、容器の開口部に載置して溶接出来るように容器の外形寸法より僅かに小さくするとともに、
主要部分の外形寸法を、容器開口部寸法より大とし、かつ、外周端部の板厚と較べて厚く形成したことを特徴とする電子部品パッケ−ジ。
The electronic component package according to claim 1,
The outer dimensions of the lid are slightly smaller than the outer dimensions of the container so that the lid can be placed and welded on the opening of the container,
An electronic component package characterized in that an outer dimension of a main part is larger than a dimension of an opening of a container and is formed to be thicker than a plate thickness of an outer peripheral end.
請求項1に記載の電子部品パッケ−ジにおいて、
前記リッドの外周端部の板厚を、主要部分と較べて薄くなるように段差を持たせて形成したことを特徴とする電子部品パッケ−ジ。
The electronic component package according to claim 1,
An electronic component package characterized in that the lid is formed so as to have a step so that a thickness of an outer peripheral end portion of the lid is smaller than a main portion.
請求項1に記載の電子部品パッケ−ジにおいて、
前記リッドの外周端部は、容器の開口頂部の幅より狭く形成したことを特徴とする電子部品パッケ−ジ
The electronic component package according to claim 1,
An electronic component package, wherein an outer peripheral end of the lid is formed narrower than a width of an opening top of a container.
請求項1に記載の電子部品パッケ−ジにおいて、
前記リッドの外周端部の板厚を、リッドの主要部側から外周端部側に向かって薄くなるようにテ−パ−を持たせて形成したことを特徴とする電子部品パッケ−ジ。
The electronic component package according to claim 1,
An electronic component package, wherein a taper is formed so that a thickness of an outer peripheral end portion of the lid decreases from a main portion side of the lid toward an outer peripheral end portion.
請求項1に記載の電子部品パッケ−ジにおいて、
前記容器の材質として、絶縁材を使用したものであることを特徴とする電子部品パッケ−ジ。
The electronic component package according to claim 1,
An electronic component package, wherein an insulating material is used as a material of the container.
請求項1に記載の電子部品パッケ−ジにおいて、
前記容器とリッドを、熱膨張係数が同じ、あるいは近い材質を組み合わせて形成したことを特徴とする電子部品パッケ−ジ。
The electronic component package according to claim 1,
An electronic component package wherein the container and the lid are formed by combining materials having the same or similar thermal expansion coefficients.
請求項1に記載の電子部品パッケ−ジにおいて、
前記容器をセラミック材で、リッドをコバ−ル材で形成したことを特徴とする電子部品パッケ−ジ。
The electronic component package according to claim 1,
An electronic component package wherein the container is formed of a ceramic material and the lid is formed of a cover material.
一辺を開口して空間を形成した容器内部に圧電振動体や半導体などの電子部品を搭載し、その容器開口部にリッドを被せ、容器とリッドとを溶融接合して電子部品を封止する電子部品パッケ−ジの封止方法において、
開口頂部に、少なくとも金属メッキ層を積層してメタライズ層を形成した容器と、
外周端部の板厚を主要部板厚より薄く形成したリッドを用い、
上記リッドを容器開口部に載置後、リッドの外周端部と容器の開口頂部とをYAGレ−ザを用いて溶融接合し、気密封止した構造としたことを特徴とする電子部品パッケ−ジの封止方法。
An electronic component that mounts an electronic component such as a piezoelectric vibrator or a semiconductor inside a container with one side open to form a space, covers the opening of the container, melts the container and the lid, and seals the electronic component In the method of sealing a component package,
At the top of the opening, at least a container having a metallized layer formed by laminating a metal plating layer,
Using a lid formed with a plate thickness of the outer peripheral part thinner than the main part plate thickness,
An electronic component package having a structure in which after the lid is placed on the container opening, the outer peripheral end of the lid and the opening top of the container are melt-bonded using a YAG laser and hermetically sealed. J sealing method.
JP2002343537A 2002-11-27 2002-11-27 Electronic parts package and its sealing method Pending JP2004179373A (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006128517A (en) * 2004-10-29 2006-05-18 Kyocera Kinseki Corp Method for manufacturing electronic component
EP1911677A1 (en) * 2005-08-05 2008-04-16 Kirin Beer Kabushiki Kaisha Production method of hermetically sealed container for drink or food
JP2013140876A (en) * 2012-01-05 2013-07-18 Seiko Epson Corp Manufacturing method of electronic device, electronic device, piezoelectric oscillator, and electronic apparatus
JP2014094524A (en) * 2012-11-12 2014-05-22 Brother Ind Ltd Liquid discharge apparatus and piezoelectric actuator

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006128517A (en) * 2004-10-29 2006-05-18 Kyocera Kinseki Corp Method for manufacturing electronic component
EP1911677A1 (en) * 2005-08-05 2008-04-16 Kirin Beer Kabushiki Kaisha Production method of hermetically sealed container for drink or food
EP1911677A4 (en) * 2005-08-05 2012-04-25 Kirin Brewery Production method of hermetically sealed container for drink or food
JP2013140876A (en) * 2012-01-05 2013-07-18 Seiko Epson Corp Manufacturing method of electronic device, electronic device, piezoelectric oscillator, and electronic apparatus
JP2014094524A (en) * 2012-11-12 2014-05-22 Brother Ind Ltd Liquid discharge apparatus and piezoelectric actuator

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