JP2004150851A - METHOD FOR MEASURING POSITRON ANNIHILATION gamma-RAY SPECTROSCOPY BY PHOTON INDUCTION AND SHORT-LIVED ATOMIC NUCLEUS LEVEL - Google Patents
METHOD FOR MEASURING POSITRON ANNIHILATION gamma-RAY SPECTROSCOPY BY PHOTON INDUCTION AND SHORT-LIVED ATOMIC NUCLEUS LEVEL Download PDFInfo
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Abstract
Description
【0001】
【発明の属する技術分野】
本発明は、基本的には、レーザー逆コンプトン高エネルギーX線による陽電子・電子対生成を陽電子消滅γ線分光分析に結びつけたものであり、従来の陽電子を試料外部から導入していた手法では陽電子を試料内部まで導入する事は不可能であったが、透過性の高いレーザー逆コンプトン高エネルギーX線を用い、試料内部から陽電子を生成させる事により、試料内部深いところでの陽電子消滅γ線分光を行うことが可能である。
【0002】
このことにより、従来の陽電子消滅γ線分光では不可能であった、非破壊による構造体内部の測定を可能とし、また、内部の3次元情報までも得られるというメリットがある。また、試料を真空中に置く陽電子ビームによる手法では難しかった揮発性の高い試料や、放射性同位元素の蒸発による飛散が懸念される高温で測定する必要性がある試料に関しても、容易に安全に測定を行えるというメリットがある。
【0003】
さらに、レーザー逆コンプトン高エネルギーX線は直進性に優れ、ビームの広がりはほとんどない。レーザー逆コンプトンによって生成された10MeV程度以上のX線が試料に照射された際に、試料からの散乱X線は電子対生成によるものがほとんどである。このことからX線のビーム径から外れて出てくるX線は試料内部で散乱されたものであり、この散乱X線の検出は試料内部での対生成を示している。この散乱X線との同時計測を行う事で、陽電子消滅γ線分光におけるS/N比の向上や陽電子消滅寿命測定などへ利用できる。つまり、従来行われてきた手法で、陽電子の試料中への入射の情報を、散乱X線の検出により行えるメリットがある。
【0004】
また、レーザー逆コンプトン高エネルギーX線の極れた直進性により、不要なX線の放出はなく、大掛かりな遮蔽は必要ない。
【0005】
【従来の技術】
従来行われてきた陽電子消滅γ線分光分析法は、放射性同位元素から直接得られる陽電子を用いるか、放射性同位元素や高エネルギー放射線による電子対生成によって得られる陽電子を引出し、輸送あるいは蓄積し、陽電子ビームとして用いるものであった。これらの手法はどれも、試料外部から陽電子を試料内部に入射する事により試料の分析を行う方法である。
【0006】
しかし、陽電子は透過性が悪く、試料の深い部分の測定を行う事は不可能であり、非破壊で構造体内部の分析を行う事は不可能であった。また陽電子の試料内部への導入も、真空中で陽電子ビームを形成して入射させるか、試料表面に放射性同位元素を密着させ、直接試料内部へ陽電子を導入させる必要があった。これらの方法では試料を真空中に置くか、試料温度を上昇させると同時に放射性同位元素も同様に温度上昇させる必要性があった。
【0007】
また、構造体内部の見えない部分の状態を知る方法としては高エネルギーX線による透過像による方法があるが、この方法では3次元構造を知る事は不可能である。
【0008】
従来、試料深部の陽電子消滅γ線分光を行うため、高エネルギーのX線を得る方法としては、電子線をターゲットにぶつけることによる制動X線や高エネルギーγ線を放出する核種の利用などがあるが、それらはどれもレーザー逆コンプトン高エネルギーX線に比べ、高エネルギーX線・γ線が放出される立体角が広く、多くのX線が無駄になり遮蔽も必要となる。また直進性も悪く、離れた場所での測定は不可能であり、対生成の情報、特に時間情報を得ることは難しい。
【0009】
【発明が解決しようとする課題】
試料内部深くの陽電子消滅γ線分光分析を行うことは、陽電子を試料外部から導入すると困難であり、試料の表面近傍(数mm程度)の分析しか行えないので、試料内部の深い部分を非破壊で陽電子消滅γ線分光分析を行う事は不可能である。
【0010】
また、従来の陽電子消滅γ線分光では、放射性同位元素を用いるか、陽電子ビームを用いる必要がある。放射性同位元素を用いる場合、放射性同位元素を試料内部に置く必要があり、例えば、高温での測定の際には放射性同位元素の蒸発による飛散の危険性があり、容易には行えない。陽電子ビームを用いる際には陽電子を真空中を輸送する必要があり、そのために試料を真空中に置く必要がある。その結果、揮発性が高い試料では測定が難しく、やはり高温での測定には限界がある。
【0011】
一方、構造体の二次元透過像は従来得ることが出来ているが、三次元像を得る手法を利用することは難しかった。
【0012】
【課題を解決するための手段】
本発明では、試料内部から陽電子を発生させ、しかもこの陽電子発生のために透過性に優れたレーザー逆コンプトン高エネルギーX線を用いているので、試料内部深くの測定が可能となる。レーザー逆コンプトンX線を1mmまで細くすることは可能であり、陽電子分光に使う消滅γ線をコリメートする(線束を平行にする)ことにより、試料内部の1mm3オーダーの微細な部分の測定を行うことも可能である。同様に、他の実験手法、例えば、試料に負荷をかけながらその場で陽電子消滅γ線分光を行うことは困難であったが、この方法では容易に行うことができる。
【0013】
また、試料が空気中やガス中に置かれても問題なくレーザー逆コンプトンX線を試料に誘導できるため測定が容易に行える。
一方、試料から放出されるγ線は、ほとんど陽電子・電子の2光子対消滅により放出される511keVの消滅γ線であり、これは従来からポジトロン・エミッション・トモグラフィー(PET)により3次元情報を取り出すのに用いられている。試料内部でのレーザー逆コンプトンX線による陽電子・電子対生成はそれぞれの部位の元素に依存し、重い元素ほど効率は高くなる傾向があり、構造体の見えない部分の3次元情報を得ることも可能である。
【0014】
【発明の実施の形態】
レーザー逆コンプトン光エネルギーX線のビーム上に試料を設置することにより、内部に陽電子が生成される。他はほぼ通常の陽電子消滅γ線分光と同じ方法でドップラー広がり法、同時計測ドップラー広がり法等の測定が可能である。
【0015】
陽電子消滅寿命測定に関しては二つの方法が考えられ、1)レーザー逆コンプトン高エネルギーX線をサブピコ秒までパルス化し、パルスの信号と消滅γ線の時刻情報を得ることで寿命測定を行う。その時刻情報は、パルス化された前記X線が陽電子を生成させ、その陽電子が消滅する際に発生するγ線の時刻情報である。2)レーザー逆コンプトン高エネルギーX線のビーム軌道からわずかにずれた外部で、陽電子・電子対生成時に散乱されたX線を検知し、その時刻情報と、消滅γ線の時刻情報により陽電子消滅寿命を測定する、と言うものである。
【0016】
陽電子消滅γ線分光の位置依存性を測定するにはビームをコリメートし、消滅γ線もコリメートする事で可能である。
構造体の3次元画像を得るには、試料をレーザー逆コンプトン高エネルギーX線ビーム上に置き、通常のPETによる手法で陽電子の消滅した部位を知り、その情報を蓄積する事で構造体内部の画像を得ることができる。
【0017】
本発明において用いられるレーザー逆コンプトン高エネルギーX線、短寿命原子核準位、電子対生成、及び陽子・電子の2光子対消滅について説明する。
(1)レーザー逆コンプトン高エネルギーX線について
コンプトン散乱では、電子に高エネルギーX線が衝突し、電子が弾き飛ばされると共に、X線が散乱する。高エネルギーX線は、持っていたエネルギーの一部を電子に与えるため、散乱後のエネルギーは小さくなる。そこで、レーザー逆コンプトン散乱とは、この現象とは逆で、高速で運動する電子からレーザー光がエネルギーを得て、高エネルギーX線となる現象である。その特長は、高輝度、エネルギー可変、準単色、高指向性で、物質を介在しないで生成される。その結果、放射化などがなく極めてクリーンな光源であり、指向性が良いことから遮蔽なども大掛かりな必要がない。
【0018】
(2)短寿命原子核準位について
一般的に、γ線を吸収することによって、原子核は、その原子核に固有の状態(振動数)が変化する。この状態が励起状態であるが、これは原子核固有の、かつ、不連続な値となる。したがって、この振動数を準位と呼び、通常、エネルギーの単位で表される。また、ある準位から異なる準位へ移行することを遷移という。基底状態とは最もエネルギーが低い準位であり、通常、準位とは基底状態からどれだけエネルギーが高い状態にあるかを示している。そこで、励起状態にある原子核は、ある時間経つと、自然に基底状態に遷移する。これは確率的な現象で、通常、励起状態に存在する時間を「寿命」といい、「短寿命」とはこの時間が著しく短いことである。
【0019】
(3)陽電子・電子対生成について
陽電子と電子の対が作られる過程をいい、高エネルギーのX線又はγ線が物質にぶつかる時にエネルギーが物質に変ったものと考えられる。アインシュタインの式E=mc2でエネルギーと質量が換算できるが、電荷等の物理の保存量を満たした状態で高エネルギーX線、γ線又は高速粒子のエネルギーから電子と陽子の対が生成される。
【0020】
(3)陽子、電子の2光子対消滅について
上記アインシュタインの式でエネルギーが物質に変換される過程で、陽電子・電子の対生成が起こるが、これとは逆の過程で物質がエネルギーにも変換される。一つの光子(γ線やX線)から対生成が起こったが、この際、運動量を保存するために外部の原子核等に運動量を与えないと対生成が起こらない。しかし、その逆の対消滅の場合は、複数の光子(消滅γ線)を放出することが可能であり、その結果、運動量を保存して消滅することが可能である。光子(消滅γ線)の数は少ないほど消滅の確率は高く(寿命が短い)、その結果、物質中ではほとんどが2つの光子(消滅γ線)を放出して陽電子・電子の対消滅が起こる。この場合、放出される光子は、運動量を保存するため、ほぼ反対方向に放出され、ポジトロン・エミッション・トモグラフィー(PET)では、この2つの光子を観測することで、消滅した部分の情報を得ることができる。これを3次元化することにより、試料の3次元情報を得ることができる。
【0021】
【実施例】
ドップラー広がり測定をステンレス製ボルトについて行った。図3に示されるように、ステンレス製のボルトをレーザー逆コンプトン高エネルギーX線ビーム上に置き、その直角方向から半導体検出器(Geディテクター)により陽電子消滅γ線のエネルギーを測定した。半導体検出器周辺はほとんどバックグランドがなく、遮蔽もまったく置かずに測定を行った。
【0022】
その結果を図1(レーザー逆コンプトン光エネルギーX線による陽電子消滅γ線ピークの測定)に示す。今までの陽電子消滅γ線分光法では、このような部品の内部の陽電子消滅γ線のドップラー広がりを測定する事はできなかった。
【0023】
又、図2(レーザー逆コンプトン光エネルギーX線による陽電子消滅γ線2光子同時計測によるピークの測定)には、放出される2つの消滅γ線を同時計測する事により、S/N比を改善した場合の実施例も示す。
【0024】
図1では、陽電子が試料内部で形成され、消滅していることを示しており、又検出器周辺に特別な遮蔽等を施さずに得られた信号の周囲に雑音となる信号が無いことを示している。この信号自体、いろいろな情報を含んでおり、この信号の形からいろいろなことが議論でき、既に実用可能なものである。
【0025】
図2は、陽電子消滅時に放出される2光子両方のエネルギー測定を行い、それを2次元化することで、バックグランドを著しく減少させ、信号の裾野まで見ることを可能にすることで、元素分析なども可能となる。
【0026】
上記S/N比(Signal−to−Noise ratio)とは、有効な信号成分に対するノイズ成分の割合を示し、その値が大きいほどノイズが少ない良好な信号であることを意味している。
【0027】
このS/N比については、実際に観測したいイベントが起きた場合、即ち、電子対生成又は原子核の励起が起きた場合は、X線が光軸から外れて散乱されてくるので、その散乱X線を検出することで、観測対象のイベントが起こったことを知り、その時だけ検出器に入って来た信号を取り込む(ゲートを開く)ことができるようにゲートを制御する。これに対し、観測したくない信号が(ノイズ)が来た時はゲートを閉めて取り込まないようにするためにゲートを制御する。その結果、ノイズ部分が減り、SN比の改善につながることになる。
【0028】
【発明の効果】
従来、放射性同位元素や、陽電子ビームにより行われてきた陽電子消滅γ線分光は金属、半導体などの欠陥、ボイドなどに非常に敏感であり、多くの研究に利用されてきた。しかし、陽電子を試料内部深くに導入する事が困難であり、実際に使われる構造物に応用する事が出来なかった。
【0029】
今回発明された手法で陽電子を試料内部から生成すると、試料内部の陽電子消滅γ線分光が可能となる。また、レーザー逆コンプトン高エネルギーX線は透過性、直進性に優れ、比較的離れた場所まで誘導でき、ビームの散乱は空気中ではほとんどなく、遮蔽を必要としない。そのため、例えば航空機の金属疲労の診断などにも利用が可能となる。
【図面の簡単な説明】
【図1】レーザー逆コンプトン光エネルギーX線による陽電子消滅γ線ピークの測定例を示す図である。
【図2】レーザー逆コンプトン光エネルギーX線による陽電子消滅γ線2光子同時計測によるピークの測定例を示す図である。
【図3】ステンレスボルト内部の陽電子消滅γ線エネルギーの測定例を示す図(上から見た図)である。[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention basically combines positron-electron pair generation by laser inverse Compton high energy X-rays with positron annihilation γ-ray spectroscopy. Although it was impossible to introduce neutrons into the sample, positron annihilation γ-ray spectroscopy was performed deep inside the sample by generating positrons from the inside of the sample using laser-transverse Compton high-energy X-rays with high transparency. It is possible to do.
[0002]
As a result, there is a merit that non-destructive measurement inside the structure, which is impossible with conventional positron annihilation γ-ray spectroscopy, and even three-dimensional information inside can be obtained. In addition, easily and safely measure highly volatile samples, which were difficult with the positron beam method in which the sample is placed in a vacuum, and samples that need to be measured at high temperatures where there is a concern that the radioisotope may be scattered by evaporation. There is a merit that can be performed.
[0003]
Further, laser-inverse Compton high energy X-rays have excellent straightness and little beam spread. When an X-ray of about 10 MeV or more generated by a laser inverse Compton is irradiated on a sample, most of the X-ray scattered from the sample is generated by an electron pair. Therefore, the X-rays coming out of the beam diameter of the X-rays are scattered inside the sample, and the detection of the scattered X-rays indicates the generation of a pair inside the sample. By performing simultaneous measurement with this scattered X-ray, it can be used for improving the S / N ratio in positron annihilation γ-ray spectroscopy and measuring the positron annihilation lifetime. In other words, there is a merit that the information on the incidence of the positron into the sample can be detected by the detection of the scattered X-rays by the conventionally performed method.
[0004]
Also, due to the extreme straightness of the laser inverted Compton high energy X-rays, there is no unnecessary emission of X-rays, and there is no need for extensive shielding.
[0005]
[Prior art]
Conventional positron annihilation γ-ray spectroscopy uses positrons obtained directly from radioisotopes, or extracts, transports, or accumulates positrons obtained by the generation of electron pairs by radioisotopes or high-energy radiation. It was used as a beam. Each of these methods is a method of analyzing a sample by injecting a positron into the sample from outside the sample.
[0006]
However, the positron has poor permeability, making it impossible to measure the deep part of the sample, and it is impossible to analyze the inside of the structure in a non-destructive manner. The introduction of positrons into the sample also requires forming a positron beam in vacuum and injecting the positrons, or bringing the radioisotope into close contact with the sample surface and introducing the positrons directly into the sample. In these methods, it was necessary to place the sample in a vacuum or to raise the temperature of the sample and simultaneously raise the temperature of the radioisotope.
[0007]
Further, as a method of knowing the state of the invisible portion inside the structure, there is a method using a transmission image using high-energy X-rays. However, it is impossible to know a three-dimensional structure by this method.
[0008]
Conventionally, methods for obtaining high-energy X-rays for performing positron annihilation γ-ray spectroscopy in the deep part of a sample include the use of nuclides that emit high-energy γ-rays or damped X-rays by hitting an electron beam against a target. However, each of them has a wider solid angle at which high-energy X-rays and γ-rays are emitted than laser-inverse Compton high-energy X-rays, wastes many X-rays, and requires shielding. Further, the straightness is poor, so that measurement at a remote place is impossible, and it is difficult to obtain information on pair generation, particularly time information.
[0009]
[Problems to be solved by the invention]
It is difficult to perform positron annihilation gamma-ray spectroscopy deep inside the sample if positrons are introduced from the outside of the sample, and only analysis near the surface of the sample (about several mm) can be performed. It is impossible to perform positron annihilation gamma-ray spectroscopy at
[0010]
Further, in conventional positron annihilation γ-ray spectroscopy, it is necessary to use a radioisotope or a positron beam. When a radioisotope is used, it is necessary to place the radioisotope inside the sample. For example, at the time of measurement at a high temperature, there is a risk of scattering due to evaporation of the radioisotope, which cannot be easily performed. When using a positron beam, it is necessary to transport the positron in a vacuum, and therefore, the sample must be placed in a vacuum. As a result, it is difficult to measure a sample having high volatility, and there is a limit to the measurement at a high temperature.
[0011]
On the other hand, a two-dimensional transmission image of a structure has been conventionally obtained, but it has been difficult to use a method of obtaining a three-dimensional image.
[0012]
[Means for Solving the Problems]
In the present invention, since positrons are generated from the inside of the sample, and a laser inverted Compton high-energy X-ray having excellent transparency is used for the generation of the positrons, it is possible to measure deep inside the sample. It is possible to thin the laser Compton X-ray to 1 mm, (collimates the flux) annihilation γ-rays collimating used in positron spectroscopy by, to measure the fine portion of the sample inside of 1 mm 3 orders It is also possible. Similarly, it was difficult to perform positron annihilation γ-ray spectroscopy in-situ while applying a load to the sample, but it can be easily performed by this method.
[0013]
In addition, even if the sample is placed in the air or gas, laser reverse Compton X-rays can be guided to the sample without any problem, so that measurement can be performed easily.
On the other hand, the γ-rays emitted from the sample are almost 511 keV annihilation γ-rays emitted by the annihilation of two photon pairs of positrons and electrons, which conventionally extract three-dimensional information by positron emission tomography (PET). It is used for Positron / electron pair generation by laser inverse Compton X-ray inside the sample depends on the element at each site, and the efficiency tends to be higher for heavier elements, and it is possible to obtain three-dimensional information on the invisible part of the structure. It is possible.
[0014]
BEST MODE FOR CARRYING OUT THE INVENTION
By placing the sample on the beam of the laser Compton light energy X-ray, a positron is generated inside. Other than that, it is possible to measure by the same method as ordinary positron annihilation γ-ray spectroscopy, such as the Doppler spread method and the simultaneous measurement Doppler spread method.
[0015]
Two methods can be considered for positron annihilation lifetime measurement. 1) Laser inverse Compton high-energy X-rays are pulsed to subpicoseconds, and the lifetime is measured by obtaining a pulse signal and time information of annihilation γ-rays. The time information is time information of γ-rays generated when the pulsed X-rays generate positrons and the positrons disappear. 2) Detects X-rays scattered during positron-electron pair generation outside the laser inverse Compton high-energy X-ray beam slightly deviated from its trajectory. The positron annihilation lifetime is obtained based on the time information and the annihilation γ-ray time information. Is measured.
[0016]
To measure the position dependence of positron annihilation gamma ray spectroscopy, it is possible to collimate the beam and collimate the annihilation gamma rays.
In order to obtain a three-dimensional image of the structure, the sample is placed on a laser inverse Compton high-energy X-ray beam, the site where the positrons have disappeared is determined by a normal PET method, and the information is accumulated to obtain the inside of the structure. Images can be obtained.
[0017]
The laser inverse Compton high energy X-rays, short-lived nuclear levels, electron pair generation, and two-photon annihilation of protons and electrons used in the present invention will be described.
(1) Laser Compton high-energy X-rays In Compton scattering, high-energy X-rays collide with electrons, causing the electrons to be repelled and the X-rays to be scattered. High-energy X-rays give a part of the energy they have to electrons, so that the energy after scattering is small. Therefore, the laser inverse Compton scattering is a phenomenon opposite to this phenomenon, in which a laser beam obtains energy from electrons moving at high speed and becomes high-energy X-rays. Its features are high brightness, variable energy, quasi-monochromatic, and high directivity, and are produced without intervening substances. As a result, the light source is an extremely clean light source without activation or the like, and since it has good directivity, there is no need for a large-scale shielding or the like.
[0018]
(2) Short-Lived Nuclear Level Generally, the state (frequency) of a nucleus changes by absorbing γ-rays. This state is an excited state, which is a nucleus-specific and discontinuous value. Therefore, this frequency is called a level, and is usually expressed in units of energy. A transition from one level to another level is called transition. The ground state is a level having the lowest energy, and the level generally indicates how much energy is higher than the ground state. Thus, the nucleus in the excited state naturally transitions to the ground state after a certain time. This is a stochastic phenomenon. Usually, the time that exists in the excited state is called “lifetime”, and “short life” means that this time is extremely short.
[0019]
(3) Positron-electron pair generation A process in which a positron-electron pair is formed. It is considered that when high-energy X-rays or γ-rays collide with a substance, the energy is changed to a substance. While the formula E = mc 2 Einstein can be converted energy and mass, high energy X-rays, pairs from the energy of the electron and proton γ-rays or fast particles are produced in a state filled with storage amount of physical charge such .
[0020]
(3) Two-photon pair annihilation of protons and electrons A pair of positrons and electrons is generated in the process of converting energy into a substance according to the above Einstein's equation, but the substance is also converted into energy in the reverse process. Is done. Pair generation occurs from one photon (γ-ray or X-ray). At this time, no pair generation occurs unless momentum is given to an external nucleus or the like in order to conserve momentum. However, in the case of the opposite pair annihilation, a plurality of photons (annihilation gamma rays) can be emitted, and as a result, the annihilation can be performed while preserving the momentum. The smaller the number of photons (annihilation gamma rays), the higher the probability of annihilation (short lifetime). As a result, most of the material emits two photons (annihilation gamma rays) and the positron-electron annihilation occurs. . In this case, the emitted photons are emitted in almost the opposite direction in order to conserve momentum, and positron emission tomography (PET) provides information on the disappeared portion by observing these two photons. Can be. By making this three-dimensional, three-dimensional information of the sample can be obtained.
[0021]
【Example】
Doppler spread measurements were performed on stainless steel bolts. As shown in FIG. 3, a stainless steel bolt was placed on a laser inverted Compton high energy X-ray beam, and the energy of the positron annihilation γ-ray was measured by a semiconductor detector (Ge detector) from a perpendicular direction. The measurement was performed without any background around the semiconductor detector and without any shielding.
[0022]
The results are shown in FIG. 1 (measurement of positron annihilation γ-ray peak by laser Compton light energy X-ray). Until now, positron annihilation γ-ray spectroscopy could not measure the Doppler spread of positron annihilation γ-rays inside such parts.
[0023]
Also, in Figure 2 (measurement of peaks by simultaneous measurement of two positron annihilation gamma rays by laser Compton light energy X-rays), the S / N ratio is improved by measuring two emitted annihilation gamma rays simultaneously. An example in which this is done is also shown.
[0024]
FIG. 1 shows that positrons are formed and disappear inside the sample, and that there is no noise signal around the signal obtained without any special shielding around the detector. Is shown. This signal itself contains various information, and various things can be discussed from the form of this signal, and it is already practical.
[0025]
Fig. 2 shows the elemental analysis by measuring the energy of both two photons emitted when the positron annihilates, and making it two-dimensional, so that the background can be significantly reduced and the bottom of the signal can be seen. And so on.
[0026]
The S / N ratio (Signal-to-Noise ratio) indicates a ratio of a noise component to an effective signal component, and a larger value indicates a better signal with less noise.
[0027]
Regarding this S / N ratio, when an event to be actually observed occurs, that is, when electron pair generation or nuclear excitation occurs, X-rays are scattered off the optical axis. By detecting the line, it is known that an event to be observed has occurred, and the gate is controlled so that the signal that has entered the detector can be captured (open the gate) only at that time. On the other hand, when a signal (noise) that is not desired to be observed comes, the gate is controlled so as to close the gate and prevent the signal from being captured. As a result, the noise portion is reduced, which leads to an improvement in the SN ratio.
[0028]
【The invention's effect】
Conventionally, positron annihilation γ-ray spectroscopy performed with radioisotopes and positron beams is very sensitive to defects such as metals and semiconductors, voids, and the like, and has been used in many studies. However, it was difficult to introduce the positron deep inside the sample, and it was not possible to apply it to the structures actually used.
[0029]
When positrons are generated from inside the sample by the method invented this time, positron annihilation gamma ray spectroscopy inside the sample becomes possible. In addition, the laser inverted Compton high energy X-ray has excellent transparency and straightness, can be guided to a relatively distant place, has almost no scattering of the beam in the air, and does not require shielding. Therefore, it can be used for diagnosis of metal fatigue of an aircraft, for example.
[Brief description of the drawings]
FIG. 1 is a diagram showing an example of measurement of a positron annihilation γ-ray peak by laser inverse Compton light energy X-ray.
FIG. 2 is a diagram illustrating an example of peak measurement by simultaneous positron annihilation γ-ray two-photon measurement using laser inverse Compton light energy X-rays.
FIG. 3 is a diagram showing a measurement example of positron annihilation γ-ray energy inside a stainless steel bolt (a diagram viewed from above).
Claims (7)
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JP2004219187A (en) * | 2003-01-14 | 2004-08-05 | Japan Atom Energy Res Inst | Isotope analysis method in high precision, high s/n, and high efficiency by nuclear isomer generation using laser inverse compton gamma ray |
JP2008002940A (en) * | 2006-06-22 | 2008-01-10 | Ihi Corp | Remote x-ray fluoroscopic device and method |
JP2009008560A (en) * | 2007-06-28 | 2009-01-15 | National Institute Of Advanced Industrial & Technology | Nondestructive inspection method and apparatus |
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CN110146524B (en) * | 2019-04-10 | 2021-09-28 | 清华大学 | CT scanning and reconstruction method based on inverse Compton scattering source and imaging system |
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