JP2004110017A5 - - Google Patents

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JP2004110017A5
JP2004110017A5 JP2003304711A JP2003304711A JP2004110017A5 JP 2004110017 A5 JP2004110017 A5 JP 2004110017A5 JP 2003304711 A JP2003304711 A JP 2003304711A JP 2003304711 A JP2003304711 A JP 2003304711A JP 2004110017 A5 JP2004110017 A5 JP 2004110017A5
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light
scanning
interference filter
laser microscope
function
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可視領域にスペクトルを有する第１のレーザ光を試料上で走査して蛍光を励起する第１の走査光学系と、
試料からの蛍光を前記第１のレーザ光の光路から分離する第１ダイクロイックミラーと、第１ダイクロイックミラーで分離された蛍光を検出する光検出器と、
第１ダイクロイックミラーと光検出器との間に配置され前記第１のレーザ光を遮断し所望の蛍光を透過する測光フィルタと、
紫外または赤外領域にスペクトルを有する第２のレーザ光を試料上の特定の部位に導入するための第２の走査光学系と、
第１ダイクロイックミラーと光検出器との間に配置され前記第２のレーザ光の透過を制限する吸収フィルタとを備えたことを特徴とする走査型レーザ顕微鏡。 A first scanning optical system that excites fluorescence by scanning a sample with a first laser beam having a spectrum in the visible region;
A first dichroic mirror that separates fluorescence from the sample from the optical path of the first laser beam; a photodetector that detects fluorescence separated by the first dichroic mirror;
A photometric filter that is disposed between the first dichroic mirror and the photodetector and blocks the first laser light and transmits desired fluorescence;
A second scanning optical system for introducing a second laser beam having a spectrum in the ultraviolet or infrared region into a specific site on the sample;
A scanning laser microscope comprising: an absorption filter that is disposed between a first dichroic mirror and a photodetector and restricts transmission of the second laser light. 請求項２試料を観察するための第１のレーザ光を試料上で走査する第１の走査光学系と、
試料からの光を前記第１のレーザ光の光路から分岐する第１光分岐素子と、
第１光分岐素子で分離された試料からの光を検出する光検出器と、
試料を刺激または操作するための第２のレーザ光を試料上の特定の部位に照射するための第２の走査光学系と、
第１光分岐素子と光検出器との間に配置され、所望の観察光を透過する第１の機能及び第２のレーザ光の透過を制限する第２の機能を有する波長選択素子とを備えたことを特徴とする走査型レーザ顕微鏡。 A first scanning optical system that scans a sample with a first laser beam for observing the sample;
A first light branching element that branches light from the sample from the optical path of the first laser light;
A photodetector for detecting light from the sample separated by the first optical branching element;
A second scanning optical system for irradiating a specific part on the sample with a second laser beam for stimulating or manipulating the sample;
A wavelength selection element that is disposed between the first optical branching element and the photodetector and has a first function for transmitting desired observation light and a second function for limiting transmission of the second laser light; A scanning laser microscope characterized by that. 前記波長選択素子は、前記第１の機能を有する第１の干渉フィルタと、前記第２の機能を有する第２の干渉フィルタであり、
前記光検出器と前記第１の干渉フィルタが複数設けられ、
これらの光検出器に向けて試料からの光を分光する第２光分岐素子を第１光分岐素子と光検出器との間に備え、
前記第２の干渉フィルタは、第１光分岐素子と第２光分岐素子との間に配置され、
前記第１の干渉フィルタは、それぞれの光検出器と第２光分岐素子との間に配置されることを特徴とする請求項２記載の走査型レーザ顕微鏡。 The wavelength selection element is a first interference filter having the first function and a second interference filter having the second function,
A plurality of the photodetector and the first interference filter;
A second optical branching element that splits light from the sample toward these photodetectors is provided between the first optical branching element and the photodetector,
The second interference filter is disposed between the first optical branch element and the second optical branch element,
The scanning laser microscope according to claim 2, wherein the first interference filter is disposed between each photodetector and the second optical branching element. 前記光検出器と前記測光フィルタが複数設けられ、これらの光検出器に向けて試料からの蛍光を分光する第２ダイクロイックミラーを前記第１ダイクロイックミラーと光検出器との間に備え、前記吸収フィルタは、前記第１ダイクロイックミラーと前記第２ダイクロイックミラーとの間に配置され、前記測光フィルタはそれぞれの光検出器と前記第２ダイクロイックミラーとの間に配置されることを特徴とする請求項１に記載の走査型レーザ顕微鏡。A plurality of the photodetectors and the photometric filters are provided, and a second dichroic mirror that separates fluorescence from the sample toward the photodetectors is provided between the first dichroic mirror and the photodetector, and the absorption The filter is disposed between the first dichroic mirror and the second dichroic mirror, and the photometric filter is disposed between each photodetector and the second dichroic mirror. 2. A scanning laser microscope according to 1. 前記第２のレーザ光の波長を切り換える波長切り換え部と、この第２のレーザ光の波長に応じて前記吸収フィルタを切り換えるフィルタ切り換え部とを備えることを特徴とする請求項１に記載の走査型レーザ顕微鏡。2. The scanning type according to claim 1, further comprising: a wavelength switching unit that switches a wavelength of the second laser light; and a filter switching unit that switches the absorption filter in accordance with the wavelength of the second laser light. Laser microscope. 前記第２の走査光学系は、前記第１の走査光学系を備えた走査型レーザ顕微鏡本体に対して着脱可能であることを特徴とする請求項１又は２に記載の走査型レーザ顕微鏡。The scanning laser microscope according to claim 1, wherein the second scanning optical system is detachable from a scanning laser microscope main body provided with the first scanning optical system. 前記測光フィルタは、前記第１のレーザ光の透過率が０．０１％以下であり、前記吸収フィルタは、前記第２のレーザ光の透過率が０．０１％以下であることを特徴とする請求項１に記載の走査型レーザ顕微鏡。The photometric filter has a transmittance of the first laser beam of 0.01% or less, and the absorption filter has a transmittance of the second laser beam of 0.01% or less. The scanning laser microscope according to claim 1. 前記波長選択素子は、干渉フィルタであることを特徴とする請求項２に記載の走査型レーザ顕微鏡。The scanning laser microscope according to claim 2, wherein the wavelength selection element is an interference filter. 前記波長選択素子は、前記第１の機能を有する第１の干渉フィルタと、前記第２の機能を有する第２の干渉フィルタであることを特徴とする請求項８に記載の走査型レーザ顕微鏡。The scanning laser microscope according to claim 8, wherein the wavelength selection element is a first interference filter having the first function and a second interference filter having the second function. 前記第２のレーザ光の波長を切り換える波長切り換え部と、この第２のレーザ光の波長に応じて前記第２の干渉フィルタを切り換えるフィルタ切り換え部とを備えたことを特徴とする請求項９に記載の走査型レーザ顕微鏡。10. The apparatus according to claim 9, further comprising: a wavelength switching unit that switches a wavelength of the second laser light; and a filter switching unit that switches the second interference filter in accordance with the wavelength of the second laser light. The scanning laser microscope described. 前記波長選択素子は、前記第１の機能を有する第１干渉フィルタ膜と、前記第２の機能を有する第２干渉フィルタ膜を有することを特徴とする請求項８に記載の走査型レーザ顕微鏡。The scanning laser microscope according to claim 8, wherein the wavelength selection element includes a first interference filter film having the first function and a second interference filter film having the second function. 前記波長選択素子は、前記第２のレーザ光の透過率が０．０１％以下であることを特徴とする請求項２に記載の走査型レーザ顕微鏡。The scanning laser microscope according to claim 2, wherein the wavelength selection element has a transmittance of the second laser beam of 0.01% or less. 前記波長選択素子は、前記第１の機能を有する第１の干渉フィルタと、前記第２の機能を有する第２の干渉フィルタであることを特徴とする請求項１２に記載の走査型レーザ顕微鏡。The scanning laser microscope according to claim 12, wherein the wavelength selection element is a first interference filter having the first function and a second interference filter having the second function. 前記波長選択素子は、基板の一方の面に前記第１の機能を果たす第１の干渉フィルタ膜を持ち、他方の面に前記第２の機能を果たす第２の干渉フィルタ膜を持つ干渉フィルタであることを特徴とする請求項１２に記載の走査型レーザ顕微鏡。The wavelength selection element is an interference filter having a first interference filter film that performs the first function on one surface of a substrate and a second interference filter film that performs the second function on the other surface. The scanning laser microscope according to claim 12, wherein the scanning laser microscope is provided. 前記第２レーザ光は、紫外光または赤外光であることを特徴とする請求項１２に記載の走査型レーザ顕微鏡。The scanning laser microscope according to claim 12, wherein the second laser light is ultraviolet light or infrared light. 前記第２レーザ光は、紫外光または赤外光であることを特徴とする請求項２に記載の走査型レーザ顕微鏡。The scanning laser microscope according to claim 2, wherein the second laser light is ultraviolet light or infrared light. 前記波長選択素子は、前記第１の機能を有する第１の干渉フィルタと、前記第２の機能を有する第２の干渉フィルタであることを特徴とする請求項１６に記載の走査型レーザ顕微鏡。The scanning laser microscope according to claim 16, wherein the wavelength selection element is a first interference filter having the first function and a second interference filter having the second function. 前記光検出器と前記第１の干渉フィルタが複数設けられ、これらの光検出器に向けて試料からの光を分光する第２光分岐素子を前記第１光分岐素子と前記光検出器との間に備え、前記第２の干渉フィルタは、前記第１光分岐素子と前記第２光分岐素子との間に配置され、前記第１の干渉フィルタは、それぞれの光検出器と第２光分岐素子との間に配置されることを特徴とする請求項１７に記載の走査型レーザ顕微鏡。A plurality of the light detectors and the first interference filter are provided, and a second light branching element that splits light from a sample toward the light detectors is defined as the first light branching element and the light detector. The second interference filter is disposed between the first optical branching element and the second optical branching element, and the first interference filter includes the respective photodetectors and the second optical branching The scanning laser microscope according to claim 17, wherein the scanning laser microscope is disposed between the elements. 所望の観察光は、前記第１のレーザ光で励起された蛍光であることを特徴とする請求項２に記載の走査型レーザ顕微鏡。The scanning laser microscope according to claim 2, wherein the desired observation light is fluorescence excited by the first laser light.


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Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4576150B2 (en) * 2004-04-20 2010-11-04 オリンパス株式会社 Scanning laser microscope
JP4804726B2 (en) * 2004-06-16 2011-11-02 オリンパス株式会社 Scanning optical observation device
JP2006003747A (en) * 2004-06-18 2006-01-05 Olympus Corp Optical scanning type observation apparatus
DE102004044626B4 (en) 2004-09-13 2008-11-20 Leica Microsystems Cms Gmbh Method for investigating transport processes
JP4867253B2 (en) * 2004-10-06 2012-02-01 株式会社ニコン Microscope device and laser unit
DE102005013949A1 (en) * 2005-03-26 2006-09-28 Carl Zeiss Meditec Ag scanning device
EP1882967B1 (en) 2005-05-16 2013-07-03 Olympus Corporation Scanning examination apparatus
JP4769035B2 (en) * 2005-07-12 2011-09-07 オリンパス株式会社 Scanning observation device
JP4793626B2 (en) * 2005-06-10 2011-10-12 横河電機株式会社 Confocal microscope
JP5095935B2 (en) 2005-11-15 2012-12-12 オリンパス株式会社 Microscope equipment
JP4867354B2 (en) * 2006-01-16 2012-02-01 横河電機株式会社 Confocal microscope
JP4922628B2 (en) * 2006-03-03 2012-04-25 オリンパス株式会社 Scanning laser microscope
JP4939855B2 (en) * 2006-06-29 2012-05-30 オリンパス株式会社 Illumination device and laser scanning microscope
EP2434327A1 (en) * 2006-12-22 2012-03-28 Nikon Corporation Laser scan confocal microscope
EP1953579B1 (en) 2007-02-05 2010-01-13 Olympus Corporation Scanning laser microscope
JP5058625B2 (en) * 2007-02-19 2012-10-24 オリンパス株式会社 Laser microscope
JP5555061B2 (en) 2010-06-09 2014-07-23 オリンパス株式会社 Observation apparatus and observation method
CN103901009B (en) * 2014-04-22 2016-11-23 许昌学院 A kind of laser-induced fluorescence detection system of optical fiber scan type
JP6539508B2 (en) 2015-06-12 2019-07-03 オリンパス株式会社 Microscope system
CN108427207A (en) * 2017-12-31 2018-08-21 浙江红谱科技有限公司 Infrared image emerging system and method with instruction function
CN109724954B (en) * 2018-12-07 2021-01-26 北京超维景生物科技有限公司 Fluorescence collection device, miniature two-photon microscope and two-photon imaging method

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06160724A (en) * 1992-11-17 1994-06-07 Nikon Corp Flash photolysis microscope
JP3384072B2 (en) * 1993-12-27 2003-03-10 株式会社ニコン Confocal microscope
JP3849176B2 (en) * 1996-06-11 2006-11-22 株式会社ニコン Optical scanning microscope
JP3917731B2 (en) * 1996-11-21 2007-05-23 オリンパス株式会社 Laser scanning microscope
JP4468507B2 (en) * 1999-03-24 2010-05-26 オリンパス株式会社 Scanning laser microscope

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