JP2004006368A - Diffusion replenishment electron source, its manufacturing method, and electron application device - Google Patents

Diffusion replenishment electron source, its manufacturing method, and electron application device Download PDF

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Publication number
JP2004006368A
JP2004006368A JP2003155372A JP2003155372A JP2004006368A JP 2004006368 A JP2004006368 A JP 2004006368A JP 2003155372 A JP2003155372 A JP 2003155372A JP 2003155372 A JP2003155372 A JP 2003155372A JP 2004006368 A JP2004006368 A JP 2004006368A
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Japan
Prior art keywords
single crystal
source
electron
electron source
filament
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JP2003155372A
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JP4040531B2 (en
Inventor
Hiroyuki Shinada
品田 博之
Satoru Fukuhara
福原  悟
Katsuhiro Kuroda
黒田 勝広
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Hitachi Ltd
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Hitachi Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/06Sources
    • H01J2237/063Electron sources
    • H01J2237/06308Thermionic sources
    • H01J2237/06316Schottky emission

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  • Cold Cathode And The Manufacture (AREA)
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Abstract

<P>PROBLEM TO BE SOLVED: To realize a diffusion replenishment type electron source that is used for an electron beam application device such as an electron microscope or electron beam lithography device or the like, that has a high electron flow density and is actuated stably over a long period, and is highly resistant against any mechanical shock during the fabrication process and also has a high yield rate completing fabrication process in a short time. <P>SOLUTION: A needle-like single crystal wire 1 of a refractory metal such as W, Mo or Re is joined to the tip of a hairpin-shaped filament 2 of a refractory metal such as Mo or Re. Powders of metals such as Ti, Zr, Hf, Y, Th, Sc, Be, which have a lower work function and lower electric negativity than that of the single crystal wire 1, or compound powders of these are made into a slurry by means of an organic solvent in which butyl acetate or isoamyl acetate is added into cellulose nitrate are applied near the joint between the single crystal wire 1 and the filament 2, and they are sintered by heating in a vacuum to prepare the source of replenishment 3. <P>COPYRIGHT: (C)2004,JPO

Description

【0001】
【産業上の利用分野】
本発明は、電子顕微鏡や電子線描画装置等の電子線応用装置に用いられる電子源に係り、特に、高輝度で長寿命、高安定で、かつ、製作歩留りの良い拡散補給型電子源、その製作法及び電子応用装置に関するものである。
【0002】
【従来の技術】
従来、電子線描画装置、走査型電子顕微鏡等の電子線応用装置の電子源として、六硼化ランタン熱電子源やW<310>電界放出電子源が用いられてきた。しかし、近年、これらに代わって、六硼化ランタン熱電子源より高輝度で、W<310>電界放出電子源より取り扱いが容易で、かつ、安定な電子放出が得られる拡散補給型と呼ばれる電子源が使用されてきている。これは、ジルコニウムやチタニウム等の金属および酸素等よりなる補給源を電子源自体に設け、その補給源から熱拡散により針状タングステンW<100>単結晶先端に補給して吸着層を形成させ、単結晶先端の仕事関数を減少させたものである(特開昭59−49065、米国特許番号3814975)。これにより、高輝度で安定な電子放出が得られる。この電子源を使用する場合には、W<100>単結晶先端を1000〜2000Kに加熱した状態で電場を印加する。すると、電子の鏡像ポテンシャルと電場によって生じるポテンシャル障壁よりも高いエネルギーを持つ熱励起された電子や、ポテンシャル障壁を透過する電子が放出される。ところで、上記単結晶先端の表面に吸着させる金属や酸素等の補給源を形成する方法としては、水素化合物粉末を酢酸イソアミルでスラリー状にして塗布し、その後、酸素雰囲気中で高温加熱し、焼結して固める方法(米国特許番号3814975、特開平6−76731)や、酸化物粉末を塗布後に真空中で高温に加熱して焼結させる方法(特開昭59−49065)等がある。
【0003】
【発明が解決しようとする課題】
しかし、このような拡散補給型電子源においては、電子放出をする針状単結晶先端の表面に吸着させる金属や酸素等の補給源の製作には、補給源粉末の塗布と、真空中での高温加熱による焼結とが必要である。以上に挙げた補給源の製作方法においては、粉末を塗布する際の溶剤としては、一般に酢酸イソアミルが挙げられており、それ以外では、水、またはシンナー等の有機溶剤が使われていた。しかし、これらの溶剤では、通常は、乾燥すると塗布した補給源がもろくなり、高温加熱で焼結する前に剥げ落ちてしまうという問題があった。また、有機溶剤によっては、高温加熱後も完全に蒸発せず、単結晶先端に拡散することで電子の放出を阻害するという問題もあった。
【0004】
本発明は、このような課題を解決するためになされたもので、補給源粉末の塗布後に、有機溶剤が乾燥しても上記粉末が剥げ落ちることがなく、かつ、高温で加熱することで短時間に有機溶剤が蒸発し、電子放出を阻害することのない拡散補給型電子源、その製作法及び電子応用装置を提供することを目的とする。
【0005】
【課題を解決するための手段】
この目的を達成するために、本発明においては、高融点金属よりなるフィラメントの先端部に高融点金属よりなる単結晶線を接合し、このフィラメントと単結晶線との接合部、または少なくともその一方に補給源粉末をニトロセルロースを含有する有機溶剤によりスラリー状にして塗布し、真空中で加熱して上記粉末を焼結して補給源とする。このとき、フィラメント及び単結晶線としては、W、MoまたはReのいずれかの材質を用い、また補給源粉末としては、Ti、Zr、Hf、Y、Th、Sc、Be、Laのうちの少なくとも一種類の金属粉末、またはその化合物粉末を用いる。その典型的な例として、単結晶線として<100>結晶方位のW単結晶線を用い、かつ、塗布する補給源粉末としてはZrの酸化物を用いる。
【0006】
【作用】
この拡散補給型電子源の製作法においては、針状単結晶の先端部に仕事関数の低い金属原子を拡散補給するための補給源を製作する場合に、その補給源を形成する金属粉末、またはその酸化物等の補給源粉末を、ニトロセルロースを含有させた有機溶剤によりスラリー状にして塗布するので、有機溶剤の乾燥後も、補給源となる金属粉末やその化合物粉末は、ニトロセルロースによって強力に保持される。そのため、塗布した粉末が、機械的な衝撃により剥げ落ちることがない。さらに、ニトロセルロースは火薬の一種であり、高温になると爆発的に気化する。したがって、補給源粉末を焼結させる際の高温加熱により、有機溶剤に含まれるニトロセルロースの炭素、水素、窒素等はその時に気化するため、粉末焼結後は、それらの不純物は完全に除去される。したがって、有機溶剤に含まれる炭素、水素、窒素等が電子源の単結晶先端部に拡散吸着し、電子放出を阻害するようなことがない。
【0007】
【実施例】
本発明に係る拡散補給型電子源の構造及びその製作法について、以下に実施例に基づいて説明する。ただし、本実施例では、電子源を構成する材料としてはタングステンを、補給源の材料としてはジルコニウムと酸素を使用している。図1に、本発明に係る拡散補給型電子源の構成図を示す。
【0008】
まず、直径0.15mmのタングステン多結晶線をヘアピン型に成型してフィラメント2とし、このフィラメント2の中央先端部の頂点に軸方位<100>のタングステン単結晶線を接合し、先端をNaOH水溶液中で電解研磨して単結晶チップ1を作成する。次に、酢酸イソアミル中にニトロセルロースを10%程度混合した溶剤により仕事関数の低い酸化ジルコニウムの粉末をスラリー状にしたものを、フィラメント2の先端部や単結晶チップ1の中間部、又は単結晶チップ1の付け根に塗布し補給源3とした。ここで4は、フィラメント2がスポット熔接されているステンレス等の端子であり、5はセラミック碍子である。
【0009】
次に、補給源粉末である酸化ジルコニウム粉末を上記の方法により塗布し、大気中で数時間自然乾燥させた後、高真空容器中に図2のごとく配置した。図2は、電子源の製作、評価を行うための装置構成を示したものである。単結晶チップ1、フィラメント2、補給源3等からなる電子源は、単結晶チップ1の先端のみが突出するようにサプレッサ電極20が被せられた状態で、引出電極10に対向して取付けられている。このサプレッサ電極20は、単結晶先端以外の部分から放出される不要の熱電子を抑制するための電極であり、単結晶チップ1およびフィラメント2に対して、負の電位がサプレッサ用電源8により与えられている。引出電極10には、高電圧の引出電源7により、単結晶チップ1よりも正の電位が与えられるようになっている。単結晶チップ1から放出される電子の総電流を計測するための電流計9が、引出電源7に直列に接続され、また、フィラメント2は加熱電源6により通電加熱できるようになっている。引出電極10で引き出された電子ビーム21は、蛍光体を塗布した蛍光板11に照射される。蛍光板11には中心に小孔があり、その下には、電子ビームの電流強度を測定するためのファラデーカップ12が取付けられている。蛍光板11中心の小孔を抜けてきた電子ビーム21はファラデーカップ12に入射し、電流計13により測定される。次に、電子源の立ち上げ、および評価実験手順を示す。
【0010】
まず、加熱電源6によりフィラメント2を通電加熱して、補給源3を焼結させる。この時、温度は、まず、1000K程度まで5分以上かけて上昇させ、それからゆっくりと加熱電流を増加させ、約1800Kまで30分以上かけて上昇させる。これにより、補給源3の焼結は、ほぼ完了する。その後、引出電源7により、引出電極10との間に高電圧を徐々に印加し、電圧2kV程度で固定する。すると、補給源から金属原子が針状の単結晶先端部に拡散し、先端の(100)結晶面に仕事関数の低い吸着面を形成する。これにより電子放出が始まり、電流計9で計測している放出電子の総電流が次第に増加してくる。そして、約1時間以内に蛍光板11に円形の電子放出パターンが現われる。この円形の放出パターンを図3に示す。放出電子ビームの電子流密度は、単結晶チップの先端の曲率半径に応じ、0.05〜1mA/srの範囲の値が得られた。
【0011】
以上の作業により数十本の電子源を製作したが、いずれも、補給源3の焼結後1時間以内で円形の正常な電子放出パターンが得られ、その後、放出電子流は安定していた。これと比較するために、酸化ジルコニウム粉末を他の各種溶剤を用いて塗布したところ、真空容器にセット中に補給源3が剥げ落ちてしまい、電子が放出されない事故や、また、補給源焼結後から電子放出が始まるまでに48時間以上もかかるなどの問題が発生した。
【0012】
以上の結果をまとめた表が、図4である。図4で示した評価項目の強度に関しては、次のようなテストで評価した。すなわち、酸化ジルコニウム補給源を塗布し大気中で数時間放置して乾燥させた電子源を、金属のケースに入れて固定し、5cmの高さからコンクリートの床に落下させ、補給源が剥げ落ちないかを実験した。また、正常な電子放出が得られたと判断する基準として、図3のような、円形の電子放出パターンが得られることとした。以上の結果によると、落下試験により補給源が剥げ落ちないのは、ニトロセルロース+酢酸イソアミル、およびニトロセルロース+酢酸ブチル(以上は通称コロジオン液と呼ばれる)で塗布した場合と、メタクリル酸メチル+アセトンで塗布した場合とであることがわかった。一方、焼結後から正常な電子放出が得られるまでの時間は、コロジオン液の場合が最も短時間であり、メタクリル酸メチル+アセトンでは、48時間以上と非常に時間がかかることが分かった。
【0013】
以上のように、有機溶剤にニトロセルロースを含んだ、いわゆる、コロジオン液と呼ばれるもので酸化ジルコニウム粉末を塗布すると、焼結前の強度が飛躍的に向上し、しかも、焼結後、電子ビームが放出され始めるまでの時間も短くてすむことがわかった。
【0014】
以上の実施例では、酸化ジルコニウムを補給源とした電子源について説明したが、これに限らず、Ti、Zr、Hf、Y、Th、Sc、Be、Laの化合物粉末を塗布した電子源においても、酸化ジルコニウムの場合と同様の強度効果が得られ、また、電子放出も確認できた。
【0015】
【発明の効果】
以上説明したように、本発明に係る拡散補給型電子源、その製作法及び電子応用装置においては、補給源粉末をニトロセルロースを含有する有機溶剤によりスラリー状にして塗布することにより、製作過程での機械的衝撃に対して強く、しかも、短時間で製作工程が終了し、歩留りの良い、かつ、安定な電子放出が得られる拡散補給型電子源が実現された。
【図面の簡単な説明】
【図1】本発明に係る拡散補給型電子源の構成図である。
【図2】本発明に係る電子源の製作及び特性評価を行なう装置の構成図である。
【図3】電子源から正常な電子放出が得られた時の蛍光板の発光パターンである。
【図4】各種溶剤を用いて製作された補給源の強度と電子放出までの所要時間とを比較した表である。
【符号の説明】
1…単結晶チップ       2…フィラメント
3…補給源          4…端子
5…セラミック碍子      6…加熱電源
7…引出電源         8…サプレッサ用電源
9…電流計          10…引出電極
11…蛍光板         12…ファラデーカップ
13…電流計         20…サプレッサ電極
21…電子ビーム
[0001]
[Industrial applications]
The present invention relates to an electron source used for an electron beam application device such as an electron microscope or an electron beam lithography device, and in particular, a high-brightness, long-life, high-stable, and diffusion-supply-type electron source with a good production yield, The present invention relates to a manufacturing method and an electronic application device.
[0002]
[Prior art]
Conventionally, a lanthanum hexaboride thermionic electron source or a W <310> field emission electron source has been used as an electron source for an electron beam application apparatus such as an electron beam lithography apparatus and a scanning electron microscope. However, in recent years, instead of these, a so-called diffusion-supply type electron, which has higher luminance than a lanthanum hexaboride thermionic source, is easier to handle than a W <310> field emission electron source, and provides stable electron emission. Sources are being used. That is, a replenishing source made of a metal such as zirconium or titanium and oxygen is provided in the electron source itself, and replenished from the replenishing source to the tip of the needle-like tungsten W <100> single crystal by thermal diffusion to form an adsorption layer. The work function at the tip of the single crystal is reduced (JP-A-59-49065, U.S. Pat. No. 3,814,975). Thereby, high-luminance and stable electron emission can be obtained. When using this electron source, an electric field is applied while the tip of the W <100> single crystal is heated to 1000 to 2000K. Then, thermally excited electrons having higher energy than a potential barrier generated by the mirror potential of the electrons and the electric field, and electrons transmitted through the potential barrier are emitted. By the way, as a method of forming a supply source of metal or oxygen to be adsorbed on the surface of the tip of the single crystal, a hydrogen compound powder is applied in a slurry state with isoamyl acetate, and then heated at a high temperature in an oxygen atmosphere and fired. There is a method of sintering and hardening (U.S. Pat. No. 3,814,975, JP-A-6-76731) and a method of sintering by heating the oxide powder at a high temperature in vacuum after coating (JP-A-59-49065).
[0003]
[Problems to be solved by the invention]
However, in such a diffusion supply type electron source, in order to manufacture a supply source of metal or oxygen to be adsorbed on the surface of the tip of the needle-like single crystal for emitting electrons, application of a supply source powder and vacuum Sintering by high-temperature heating is required. In the above-described method for producing a replenishing source, isoamyl acetate is generally used as a solvent for applying the powder, and other than that, water or an organic solvent such as thinner is used. However, with these solvents, there is a problem that the applied replenishment source is usually brittle when dried, and peels off before sintering at high temperature. In addition, some organic solvents do not completely evaporate even after heating at a high temperature, and disperse at the tip of the single crystal, thereby inhibiting the emission of electrons.
[0004]
The present invention has been made in order to solve such a problem, and after applying a replenishment source powder, the powder does not peel off even when the organic solvent is dried, and is short-circuited by heating at a high temperature. An object of the present invention is to provide a diffusion-supplying electron source which does not hinder electron emission by evaporating an organic solvent in a time, a method of manufacturing the electron source, and an electronic application device.
[0005]
[Means for Solving the Problems]
In order to achieve this object, in the present invention, a single-crystal wire made of a high-melting-point metal is joined to the tip of a filament made of a high-melting-point metal, and a joint between the filament and the single-crystal wire, or at least one of them. The replenishing source powder is applied in a slurry state with an organic solvent containing nitrocellulose, and then heated in a vacuum to sinter the powder to obtain a replenishing source. At this time, any material of W, Mo or Re is used as the filament and the single crystal wire, and at least one of Ti, Zr, Hf, Y, Th, Sc, Be, and La is used as the replenishing source powder. One kind of metal powder or its compound powder is used. As a typical example, a W single crystal line having a <100> crystal orientation is used as a single crystal line, and an oxide of Zr is used as a supply source powder to be applied.
[0006]
[Action]
In this method of manufacturing a diffusion-supplying electron source, when manufacturing a supply source for diffusing and supplying metal atoms having a low work function to the tip of a needle-like single crystal, a metal powder forming the supply source, or The replenishing source powder such as oxides is applied in a slurry form with an organic solvent containing nitrocellulose, so even after the organic solvent is dried, the replenishing source metal powder and its compound powder can be strongly used by the nitrocellulose. Is held. Therefore, the applied powder does not peel off due to mechanical impact. In addition, nitrocellulose is a type of explosive and vaporizes explosively at high temperatures. Therefore, the carbon, hydrogen, nitrogen, etc. of the nitrocellulose contained in the organic solvent are vaporized at that time due to high temperature heating when sintering the replenishment source powder, so that after the powder sintering, those impurities are completely removed. You. Therefore, carbon, hydrogen, nitrogen, and the like contained in the organic solvent are not diffused and adsorbed at the tip of the single crystal of the electron source, thereby preventing the emission of electrons.
[0007]
【Example】
The structure of a diffusion-supplying electron source according to the present invention and a method of manufacturing the same will be described below based on examples. However, in this embodiment, tungsten is used as a material of the electron source, and zirconium and oxygen are used as materials of the replenishment source. FIG. 1 shows a configuration diagram of a diffusion supply type electron source according to the present invention.
[0008]
First, a polycrystalline tungsten wire having a diameter of 0.15 mm is molded into a hairpin type to form a filament 2. A tungsten single crystal wire having an axial orientation of <100> is joined to the apex of the center tip of the filament 2, and the tip is a NaOH aqueous solution. The single crystal chip 1 is formed by electrolytic polishing in the inside. Next, a slurry of zirconium oxide powder having a low work function in the form of a slurry with a solvent obtained by mixing about 10% of nitrocellulose in isoamyl acetate is used as the tip of the filament 2, the middle of the single crystal chip 1, or the single crystal. It was applied to the base of the chip 1 to form a supply source 3. Here, 4 is a terminal made of stainless steel or the like to which the filament 2 is spot-welded, and 5 is a ceramic insulator.
[0009]
Next, a zirconium oxide powder as a replenishment source powder was applied by the above-described method, air-dried for several hours in the air, and then placed in a high vacuum container as shown in FIG. FIG. 2 shows an apparatus configuration for manufacturing and evaluating an electron source. The electron source including the single crystal chip 1, the filament 2, the replenishing source 3, and the like is attached to the extraction electrode 10 in a state where the suppressor electrode 20 is covered so that only the tip of the single crystal chip 1 protrudes. I have. The suppressor electrode 20 is an electrode for suppressing unnecessary thermoelectrons emitted from portions other than the tip of the single crystal. A negative potential is applied to the single crystal chip 1 and the filament 2 by the power supply 8 for the suppressor. Have been. A higher potential than the single crystal chip 1 is applied to the extraction electrode 10 by the extraction power supply 7 of a high voltage. An ammeter 9 for measuring the total current of electrons emitted from the single crystal chip 1 is connected in series to an extraction power source 7, and the filament 2 can be energized and heated by a heating power source 6. The electron beam 21 extracted by the extraction electrode 10 is applied to the phosphor plate 11 coated with a phosphor. The fluorescent plate 11 has a small hole in the center, and a Faraday cup 12 for measuring the current intensity of the electron beam is mounted below the small hole. The electron beam 21 that has passed through the small hole at the center of the fluorescent plate 11 enters the Faraday cup 12 and is measured by the ammeter 13. Next, the startup of the electron source and the procedure of the evaluation experiment will be described.
[0010]
First, the filament 2 is energized and heated by the heating power source 6 to sinter the supply source 3. At this time, the temperature is first raised to about 1000 K in 5 minutes or more, and then the heating current is slowly increased to about 1800 K in 30 minutes or more. Thereby, the sintering of the supply source 3 is almost completed. Thereafter, a high voltage is gradually applied between the extraction electrode 10 and the extraction power source 7 and the voltage is fixed at about 2 kV. Then, metal atoms are diffused from the replenishment source to the tip of the needle-like single crystal, and an adsorption surface having a low work function is formed on the (100) crystal face at the tip. Thus, electron emission starts, and the total current of the emitted electrons measured by the ammeter 9 gradually increases. Then, a circular electron emission pattern appears on the fluorescent screen 11 within about one hour. This circular emission pattern is shown in FIG. The electron flow density of the emitted electron beam was in the range of 0.05 to 1 mA / sr, depending on the radius of curvature of the tip of the single crystal chip.
[0011]
Although several tens of electron sources were manufactured by the above operation, a normal circular electron emission pattern was obtained within one hour after sintering of the replenishment source 3, and thereafter, the emitted electron current was stable. . For comparison, when the zirconium oxide powder was applied using various other solvents, the replenishing source 3 was peeled off while being set in the vacuum container, and an electron was not released. Problems such as 48 hours or more are required until electron emission starts later.
[0012]
FIG. 4 is a table summarizing the above results. The strength of the evaluation items shown in FIG. 4 was evaluated by the following test. That is, an electron source coated with a zirconium oxide replenishing source, left to stand in the air for several hours, and dried is placed in a metal case, fixed, dropped on a concrete floor from a height of 5 cm, and the replenishing source is peeled off. Experimented to see if there is any. In addition, as a criterion for determining that normal electron emission was obtained, a circular electron emission pattern as shown in FIG. 3 was obtained. According to the above results, the replenishment source did not peel off in the drop test when it was coated with nitrocellulose + isoamyl acetate and nitrocellulose + butyl acetate (these are generally called collodion solution), and when methyl methacrylate + acetone It was found that this was the case with the application. On the other hand, it was found that the time required for normal electron emission after sintering was the shortest in the case of the collodion solution, and it took 48 hours or more in the case of methyl methacrylate + acetone.
[0013]
As described above, when zirconium oxide powder is applied with a so-called collodion solution containing nitrocellulose in an organic solvent, the strength before sintering is dramatically improved, and after sintering, the electron beam is irradiated. It was found that the time required for the release to begin was short.
[0014]
In the above embodiment, an electron source using zirconium oxide as a replenishing source has been described. However, the present invention is not limited to this, and an electron source coated with a compound powder of Ti, Zr, Hf, Y, Th, Sc, Be, and La may be used. The same strength effect as in the case of zirconium oxide was obtained, and electron emission was also confirmed.
[0015]
【The invention's effect】
As described above, in the diffusion supply type electron source according to the present invention, the method of manufacturing the same, and the electronic application apparatus, the supply source powder is applied in a slurry state with an organic solvent containing nitrocellulose, and is applied during the manufacturing process. A diffusion-supply type electron source that is resistant to mechanical shock, completes the manufacturing process in a short time, and has a good yield and stable electron emission is realized.
[Brief description of the drawings]
FIG. 1 is a configuration diagram of a diffusion supply type electron source according to the present invention.
FIG. 2 is a configuration diagram of an apparatus for manufacturing and evaluating characteristics of an electron source according to the present invention.
FIG. 3 is a light emission pattern of a fluorescent plate when normal electron emission is obtained from an electron source.
FIG. 4 is a table comparing the strength of a replenishment source manufactured using various solvents and the time required for electron emission.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 ... Single crystal chip 2 ... Filament 3 ... Supply source 4 ... Terminal 5 ... Ceramic insulator 6 ... Heating power supply 7 ... Extraction power supply 8 ... Suppressor power supply 9 ... Ammeter 10 ... Extraction electrode 11 ... Fluorescent plate 12 ... Faraday cup 13 ... Electric current Total 20: suppressor electrode 21: electron beam

Claims (9)

高融点金属よりなるフィラメントと、当該フィラメントの先端部に接合された高融点金属よりなる単結晶線と、上記フィラメントと上記単結晶線との接合部または少なくともその一方に形成された補給源とを有し、
該補給源は、補給源材料を、ニトロセルロースに酢酸ブチルまたは酢酸イソアミルを添加した有機溶剤によりスラリー状にして塗布された後、真空中で加熱することにより形成されたことを特徴とする拡散補給型電子源。
A filament made of a high melting point metal, a single crystal line made of a high melting point metal joined to the tip of the filament, and a replenishment source formed at a joint or at least one of the filament and the single crystal line. Have
The replenishment source is formed by applying a replenishment source material in the form of a slurry with an organic solvent obtained by adding butyl acetate or isoamyl acetate to nitrocellulose, and then applying the slurry in a vacuum to form a replenishment source. Type electron source.
請求項1に記載の拡散補給型電子源において、
前記フィラメントおよび単結晶線として、W、Mo、またはReのいずれかを含む金属を用いたことを特徴とする拡散補給型電子源。
The diffusion-supplying electron source according to claim 1,
A diffusion-supplying electron source, wherein a metal containing any of W, Mo, and Re is used as the filament and the single crystal wire.
請求項1に記載の拡散補給型電子源において、
前記補給源材料は、Ti、Zr、Hf、Y、Th、Sc、Be、Laを含む群から選ばれる少なくとも一種類の金属の酸化物であることを特徴とする拡散補給型電子源。
The diffusion-supplying electron source according to claim 1,
A diffusion supply electron source, wherein the supply source material is an oxide of at least one metal selected from the group including Ti, Zr, Hf, Y, Th, Sc, Be, and La.
請求項1から3のいずれか1項に記載の拡散補給型電子源において、
前記単結晶線は、W<100>方位の単結晶を含有することを特徴とする拡散補給型電子源。
The diffusion supply electron source according to any one of claims 1 to 3,
The single crystal line contains a single crystal having a W <100> orientation.
請求項1から4のいずれか1項に記載の拡散補給型電子源を用いたことを特徴とする電子応用装置。An electronic application device using the diffusion supply type electron source according to any one of claims 1 to 4. 高融点金属よりなるフィラメントの先端部に、高融点金属よりなる単結晶線を接合し、
前記フィラメントと前記単結晶線との接合部または少なくともその一方に、補給源材料を、ニトロセルロースに酢酸ブチルまたは酢酸イソアミルを添加した有機溶剤によりスラリー状にして塗布し、
当該接合部を真空中で加熱して当該スラリーを焼結することにより補給源を形成することを特徴とする電子源の製作法。
A single crystal wire made of high melting point metal is joined to the tip of a filament made of high melting point metal,
A supply source material is applied in a slurry form with an organic solvent obtained by adding butyl acetate or isoamyl acetate to nitrocellulose, at a joint or at least one of the filament and the single crystal wire,
A method for manufacturing an electron source, comprising forming a replenishing source by sintering the slurry by heating the joint in a vacuum.
請求項6に記載の電子源の製作法において、
上記補給源材料として、Ti、Zr、Hf、Y、Th、Sc、Be、Laを含む群から選ばれる少なくとも一種類の金属の酸化物を用いることを特徴とする電子源の製作法。
The method for manufacturing an electron source according to claim 6,
A method for manufacturing an electron source, characterized in that an oxide of at least one metal selected from the group including Ti, Zr, Hf, Y, Th, Sc, Be, and La is used as the supply source material.
請求項6に記載の電子源の製作法において、
前記フィラメントおよび単結晶線として、W、Mo、またはReのいずれかを含む金属を用いたことを特徴とする電子源の製作法。
The method for manufacturing an electron source according to claim 6,
A method of manufacturing an electron source, wherein a metal containing any of W, Mo, and Re is used as the filament and the single crystal wire.
請求項6に記載の電子源の製作法において、
前記単結晶線として、W<100>方位の単結晶を用いることを特徴とする電子源の製作法。
The method for manufacturing an electron source according to claim 6,
A method of manufacturing an electron source, wherein a single crystal having a W <100> orientation is used as the single crystal line.
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006312615A (en) * 2005-05-09 2006-11-16 Nippon Kenko Kagaku Kenkyu Center:Kk Deodorizing film preparation
JP2009238443A (en) * 2008-03-26 2009-10-15 Univ Waseda Electron source, and manufacturing method of electron source

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006312615A (en) * 2005-05-09 2006-11-16 Nippon Kenko Kagaku Kenkyu Center:Kk Deodorizing film preparation
JP2009238443A (en) * 2008-03-26 2009-10-15 Univ Waseda Electron source, and manufacturing method of electron source

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