CN105788996B - A kind of submicron film scandium tungsten cathode and preparation method thereof - Google Patents

A kind of submicron film scandium tungsten cathode and preparation method thereof Download PDF

Info

Publication number
CN105788996B
CN105788996B CN201410808422.1A CN201410808422A CN105788996B CN 105788996 B CN105788996 B CN 105788996B CN 201410808422 A CN201410808422 A CN 201410808422A CN 105788996 B CN105788996 B CN 105788996B
Authority
CN
China
Prior art keywords
cathode
scandium
tungsten
film
submicron
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201410808422.1A
Other languages
Chinese (zh)
Other versions
CN105788996A (en
Inventor
王萍
李季
王辉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CETC 12 Research Institute
Original Assignee
CETC 12 Research Institute
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CETC 12 Research Institute filed Critical CETC 12 Research Institute
Priority to CN201410808422.1A priority Critical patent/CN105788996B/en
Publication of CN105788996A publication Critical patent/CN105788996A/en
Application granted granted Critical
Publication of CN105788996B publication Critical patent/CN105788996B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Solid Thermionic Cathode (AREA)

Abstract

The invention discloses a kind of preparation method of submicron film scandium tungsten cathode, including tungsten powder suppressed, is sintered, obtain cathode base;Cathode base is impregnated into active material barium calcium aluminium compound;Cathode base impregnated of active material is assembled in the cathode support cylinder containing heater;Sub-micron scandium W film is deposited on cathode base surface with magnetically controlled DC sputtering, obtains submicron film scandium tungsten cathode.The current density of negative electrode produced by the present invention is big, and operating temperature is low, longevity of service, and manufacture method is simple, workable, reproducible.

Description

A kind of submicron film scandium tungsten cathode and preparation method thereof
Technical field
The present invention relates to electrovacuum component field.More particularly, to a kind of submicron film scandium tungsten cathode and its system Preparation Method.
Background technology
Cathode electronics emitter pass through a nearly century development, many science and technologies Disciplinary Frontiers in occupation of not Alternative status.In military, space technology, the technical field such as electron accelerator and free-electron laser, to low temperature, big electricity The demand of the electron emitter of current density, high uniform emission and long-life is very urgent all the time.Emission p erformance, process stabilizing Property and reliability obviously also the development to costly electronic device with production it is particularly significant.In fact, cathode emitter Improve can also serve impetus to vacuum electron device development and performance boost.Vacuum electron device includes microwave vacuum electricity Sub- device, the theory of relativity vacuum electron device, vacuum electronic display, vacuum electronic illuminating device and the ion using electron source Device etc..
Occupied using tungsten basal body, alkaline-earth metal barium as the diffused negative electrode of active material in current all kinds of vacuum electron devices First choice, it is widely used.The seventies latter stage, rare earth Sc Sc are introduced into this electron emitter and illustrated to dispenser cathode Emitting performance significantly improves, and extensive must be paid close attention to so as to cause.In more than 20 years thereafter, countries in the world are developed in succession The scandium-containing diffusion cathode of various variants, work function is set finally to be reduced to 1.5-1.6 electron-volts;Obtaining same current density When, the operating temperature than M type dispenser cathodes declines 200 DEG C or so, greatly increases the performance of electron emitter.
The type of scandium-containing diffusion cathode substantially has following a few classes:
1) by Sc2O3Add the immersion-type Scandate cathode in dispenser cathode aluminic acid barium salt.1977 public by Philips Department proposes that emitting performance is:During 1000 DEG C of operating temperature, emission 5A/cm2, about 3000 hours life-spans (US4007393)。
2) by Sc2O3Add the mixed base negative electrode containing scandium in tungsten basal body.Generally by Sc in this kind of negative electrode2O3With tungsten powder machine Tool mixes, and the substrate of POROUS TUNGSTEN containing scandium is made in repressed, sintering, then impregnates barium aluminate and forms diffused negative electrode containing scandium.This moon Polar form was proposed first in 1984 by Japanese Hitachi, and for the negative electrode in 850 DEG C of operating temperature, pulsed emission current is close Spend 10A/cm2(S.Yamamoto,S.Taguchi,T.Aida,Appl.Surf.Sci.17(1984)504-516)。
3) mixed base " top layer " negative electrode containing scandium.By Philips companies (J.Hasker, J.Van were announced in 1986 Esdonk and J.E.Crombeen.Appl.Surface Sci.26(1986)173.).This negative electrode is that 0.1mm is thick Porous tungsten body containing scandium is placed on common porous tungsten body, forms " top layer " containing scandium, then impregnate aluminate.It has favourable to launching Surface containing scandium, while remain and ample supply and the common porous tungsten substrate of active barium can be stored, so as to improve the property of negative electrode Energy.But due to its complex process, technique productions are not suitable for it.Then, Philips companies are transferred to mixed base again in nineteen ninety Negative electrode studies (U.van Slooten, Peter A.Duine Appl.Surf.Sci.111 (1997) 24-29), obtained negative electrode Impulse ejection ability operating temperature be 1000 DEG C reached 100A/cm2
4) film-type " top layer " negative electrode containing scandium.It is with one layer of film containing scandium of deposition on conventional impregnation type dispenser cathode Method realize containing scandium " top layer " addition.The method of deposition can be radio-frequency sputtering (Yamamoto S, Taguchi S and Aida T et al.Appl.Surface Sci.17 (1986) 517) or laser evaporation (CN1128403A), the film of deposition can To be W+Sc2O3、W+Sc2W3O12(S.Yamamoto,I.Watanabe,S.Taguchi et al,Jpn.J.Appl.Phys.28 (1989) 490-494.) or W/Sc2O3+Re(G.Gartner,P.Geittner,H.Lydton,A.Ritz, Appl.Surf.Sci.111(1997)11-17).Film-type " top layer " negative electrode containing scandium can be introduced with certain thickness uniformly heavy Long-pending film containing scandium.Research to scandium series cathode shows, is no tribute to transmitting if the Sc of cathode surface exists with elementary state Offer, only when Sc is oxidation state, the work function of negative electrode can be made reduce in subsequent activation.So film The technology key of type scandium series cathode must is fulfilled at following 2 points:1) covering of film can not change the conduction on former impregnated cathode surface Characteristic;2) Sc in film must be existing for oxidation state[.Existing film-type " top layer " negative electrode containing scandium, which introduces, has certain thickness The film containing scandium of the uniform deposition of degree, but radio-frequency sputtering can cause the decomposition of scandium oxide in target, in order that obtaining in film Sc is oxidation state, it is necessary to system is oxygenated and strict control partial pressure, this causes the control to the condition of spatter film forming Become extremely difficult;And although laser evaporization method has without that Sc can be made to keep complete in film system introducing active gases Oxidation state, but its complex manufacturing technology, poor controllability.In addition, JP Laid-Open 6-260084 and CN102522281 disclose use D.c. sputtering is made film-type scandium series cathode.
The above negative electrode containing scandium is present:1) diffusion of scandium and its oxide is bad, makes supplement difficult.Work as high temperature When evaporating or bearing Ions Bombardment and lose, it is difficult to be restored, directly affect transmitting and the life-span of negative electrode;2) addition scandium or Its oxide skewness, it is uneven so as to cause to launch;3) complex process, and poor repeatability.
Therefore, it is necessary to which a kind of method of new preparation negative electrode containing scandium, avoids aforementioned defect.
The content of the invention
It is an object of the present invention to provide a kind of submicron film scandium tungsten cathode.
It is another object of the present invention to provide the preparation method of above-mentioned submicron film scandium tungsten cathode.
To reach above-mentioned purpose, the present invention uses following technical proposals:
A kind of preparation method of submicron film scandium tungsten cathode, comprises the following steps:
1) tungsten powder is suppressed, sintered, obtain cathode base;
2) cathode base is impregnated into active material barium calcium aluminium compound;
3) cathode base impregnated of active material is assembled in the cathode support cylinder containing heater;
4) sub-micron scandium W film is deposited on cathode base surface with magnetically controlled DC sputtering;During magnetically controlled DC sputtering, target Raw material be submicron-scale made from sol-gal process Scandia doped tungsten powder;Using ladder making alive mode, first splashing Radio pressure 350-450V is kept for 4-6 minutes;Kept for 4-6 minutes in sputtering voltage 750-850V again;Finally in sputtering voltage 1150- 1250V is kept for 40-60 minutes, obtains submicron film scandium tungsten cathode.
In step 1), tungsten powder is high-purity micron order tungsten powder;The compacting is to use isostatic pressing technology, and press temperature is room Temperature, pressing pressure are 2-2.5 tons;The sintering is sintered in hydrogen atmosphere, and sintering temperature is 1900-2000 DEG C, during sintering Between be 40-60 minutes.
Porous tungsten basal body is obtained after sintering, porous tungsten basal body is passed through and soaks copper, is machined, removes copper, obtains cathode base; The leaching copper is that copper is melted under the conditions of 1400-1500 DEG C of temperature, and copper is impregnated into POROUS TUNGSTEN base using capillarity afterwards In body;The machining is leaching copper tungsten basal body to be processed into required shape, tool using processing methods such as car system, electric sparks Body step and condition refer to existing literature;It is described that to remove copper be that the leaching processed is removed using chemical method or high temperature evaporation method Copper in copper tungsten basal body, specific steps and condition refer to existing literature.
In step 2), barium calcium aluminium compound can be barium calcium-aluminate or the barium calcium aluminium compound of other stabilizations.
When barium calcium aluminium compound is barium calcium-aluminate, BaO:CaO:Al2O3Mol ratio be 5:3:2,4:1:1 or 6:1: 2。
The dipping temperature is 1500 DEG C -1700 DEG C, and dip time is the 10-120 seconds.After dipping, gone with turning processing method Except the remaining dipping thing on cathode base surface.
In step 3), heater is indirect-heating heater.
Cathode base and cathode support cylinder are brazed together by brazing material.
Preferably, in the cathode base one side relative with heater coated with suppression evaporation material.Suppress evaporation material and the moon Brazing material between pole matrix and cathode support cylinder is identical, is molybdenum ruthenium solder.Pricker between cathode base and cathode support cylinder Weldering, the coating of suppression evaporation material are while completed in hydrogen stove.Suppress the hole that evaporation material is used to seal the cathode base back side Gap, prevent barium calcium aluminium compound from being evaporated to heater.
Preferably, the space filling high purity aluminium oxide between cathode base and heater.High purity aluminium oxide filler is through burning Cathode base is directly transferred heat to by heat exchange pattern after knot, improves the efficiency of heating surface and temperature homogeneity.
In step 4), the target raw material used in magnetically controlled DC sputtering does not use the mechanical mixture of general tungsten powder and scandium oxide powder Thing, but use the Scandia doped tungsten powder of submicron-scale made from sol-gal process.
The preparation of the target is by the Scandia doped tungsten powder elder generation compression molding of submicron-scale, then low-temperature sintering.Institute It is that the Scandia doped tungsten powder powder of appropriate submicron-scale is inserted target holder at room temperature to state compression molding, uses manual pressure Power machine carries out just one-step forming, and pressing pressure is 2-2.5 tons;The low-temperature sintering is in a vacuum furnace to burn the target of first one-step forming Knot makes to target type to 850-950 DEG C.This is due to that must assure that the chemical state of scandium and powder size are almost unchanged in sputtering, And the surface-active between the powder granule of submicron-scale strengthens, between the frictional force, powder and mold wall between powder Frictional force and the relative increase of viscosity resistance, are molded relative difficulty.
During magnetically controlled DC sputtering, atmosphere gas is nitrogen, and background vacuum is 5 × 10-4Pa;The diameter 50mm of target;Target Distance with cathode base surface is 40-50mm;Sputtering power is 100-120W.
Deposit by specific dc sputtering processes to obtain scandium W film using the pressed by powder target of the present invention, oxidation can be made Scandium is more evenly distributed cathode surface, significantly reduces the work function of cathode surface, improves the emission of negative electrode And emission uniformity.
Preferably, percentage by weight of the scandium oxide in tungsten powder is 3-10%, more preferably 5%.Scandium oxide content is high, energy The anti-Ions Bombardment ability of negative electrode is improved, so as to improve the life-span of negative electrode.
Preferably, using ladder making alive mode, first kept for 5 minutes in sputtering voltage 400V;Again in sputtering voltage 800V Kept for 5 minutes;Finally kept for 45 minutes in sputtering voltage 1200V, obtain submicron film scandium tungsten cathode.
The present invention also provides the submicron film scandium tungsten cathode as made from above-mentioned preparation method, and it includes:Cathode support cylinder, Heater, cathode base, active material, sub-micron scandium W film, the active material is immersed in cathode base, the sub-micro Rice scandium W film is to sputter at cathode base surface, and the cathode base and heater are arranged in cathode support cylinder.
Preferably, the negative electrode also includes suppressing evaporation material, suppresses evaporation material and is coated in the cathode base back side, face Heater.
Preferably, the negative electrode also includes high purity aluminium oxide filler, and high purity aluminium oxide filler is filled in suppression evaporation Space between material and heater.
Preferably, the thickness of sub-micron scandium W film is 200-400nm.
Beneficial effects of the present invention are as follows:
The present invention prepares direct magnetic control by using the repressed sintering of submicron material for keeping granular size almost unchanged The target of sputtering, and the parameters of each step are strictly controlled to make scandium oxide be evenly distributed on cathode base surface, The current density of negative electrode produced by the present invention is big, is believed that highest current density is about 85.08A/cm at 1000 DEG C2, and Operating temperature ratio can be made to cover osmium film negative electrode under same current density reduces by 200 DEG C or so, and the activationary time needed is only 10-30 Minute, the seasoned time is only about 24 hours, and the working time reduces 0.2- up to 3000 hours, by the work function of cathode surface 0.4eV。
The controllability of the present invention is strong, without being filled with active gases such as O to system2Protected etc. the scandium element that can make in scandium tungsten film Hold complete oxidation state.
The manufacture method of the present invention is simple, workable, reproducible.
Brief description of the drawings
The embodiment of the present invention is described in further detail below in conjunction with the accompanying drawings.
Fig. 1 is the schematic diagram of submicron film negative electrode containing scandium produced by the present invention.
Fig. 2 is the powder granularity distribution map of obtained Scandia doped tungsten powder in embodiment 1.
Fig. 3 is the powder XRD of obtained Scandia doped tungsten powder in embodiment 1.
Fig. 4 is the SEM figures of sub-micron scandium W film.
Fig. 5 is the XPS spectrum figure of scandium oxide in sub-micron scandium W film.
Fig. 6 is the emission figure that the negative electrode of embodiment 1 is tested in water cooling anode diode.
Fig. 7 is to cover the emission figure that osmium film negative electrode is tested in water cooling anode diode
Fig. 8 is the emission figure that the negative electrode of embodiment 1 is tested in electron gun.
In Fig. 1,1- cathode support cylinders, 2- indirect-heating heaters, 3- cathode bases, 4- active materials, 5- sub-micron scandium tungsten is thin Film, 6- suppress evaporation material, 7- high purity aluminium oxide fillers.
Embodiment
In order to illustrate more clearly of the present invention, with reference to preferred embodiment, the present invention is described further.Ability Field technique personnel should be appreciated that following specifically described content is illustrative and be not restrictive, and this should not be limited with this The protection domain of invention.
Embodiment 1
A kind of preparation method of submicron film scandium tungsten cathode, comprises the following steps:
1) high-purity micron order tungsten powder is first used into isostatic pressing technology at room temperature, suppressed under 2 tons of pressing pressures;Afterwards in hydrogen It it is 1900 DEG C in sintering temperature, sintering time is to obtain porous tungsten basal body in 40 minutes in gas atmosphere;Copper in 1400 DEG C of bars of temperature Melt under part, copper is impregnated into porous tungsten basal body using capillarity afterwards;Using processing methods such as car system, electric sparks leaching Copper tungsten basal body is processed into required shape;Removed using chemical method or high temperature evaporation method in the leaching copper tungsten basal body processed Copper, obtain cathode base;
2) cathode base is impregnated into active material barium calcium aluminium compound (barium calcium-aluminate, BaO:CaO:Al2O3Mol ratio For 5:3:2), dipping temperature is 1500 DEG C, and dip time is 10 seconds, and cathode base table is removed with turning processing method after the completion of dipping The remaining dipping thing in face;
3) molybdenum ruthenium solder pricker will be passed through impregnated of the cathode support cylinder of the cathode base of active material and the heater containing indirect-heating It is welded together, coat molybdenum ruthenium solder in the cathode base one side relative with heater;Space between cathode base and heater is filled out Fill high purity aluminium oxide;
4) sub-micron scandium W film is deposited on cathode base surface with magnetically controlled DC sputtering;Will be sub- made from sol-gal process The Scandia doped tungsten powder of micro-meter scale is at room temperature with 2 tons of pressing pressure elder generation compression moldings, afterwards in 850 DEG C of low-temperature sinterings, Target as magnetically controlled DC sputtering;Atmosphere gas is nitrogen, and background vacuum is 5 × 10-4Pa;The diameter 50mm of target;Target Distance with cathode base surface is 40mm;Sputtering power is 100W, is first kept for 5 minutes in sputtering voltage 400V;Sputtering again Voltage 800V keeps 4 clocks;Finally kept for 45 minutes in sputtering voltage 1200V, obtain submicron film scandium tungsten cathode.
Fig. 1 is the schematic diagram of submicron film negative electrode containing scandium produced by the present invention.
Fig. 2 is the powder granularity distribution map of obtained Scandia doped tungsten powder in embodiment 1.It can be seen that adopt The even particle size distribution of the Scandia doped tungsten powder of the submicron-scale made from sol-gal process, powder granule shape are defined ball Shape, diameter of particle distribution meet preferable quasi normal distribution.
Fig. 3 is the powder XRD of obtained Scandia doped tungsten powder in embodiment 1.As can be seen that Sc is oxidation from figure State (scandium oxide) and temperature independent (collection of illustrative plates is all at 1100 DEG C, 1200 DEG C, 1300 DEG C, 1500 DEG C and 1700 DEG C when temperature It is to overlap).
Fig. 4 is the SEM figures of sub-micron scandium W film.
Fig. 5 is the XPS spectrum figure of scandium oxide in sub-micron scandium W film, and spectral peak is located near 402.2eV, shows scandium to aoxidize Titanium is present in film.
Under conditions of pulsewidth 5-25 μ s, repetition rate 100-500Hz, the cathode current emission of the negative electrode of the present invention is tested Density, as shown in Figure 6:At 900 DEG C, its keen current density launched is better than 30A/cm after cathode stabilization2;Corresponding to 1000 DEG C Curve, because test power supply can only achieve 2700V, therefore keen current density is not obtained, highest current density is about 85.08A/cm2.It can be seen that the negative electrode has very high emission current densities, hence it is evident that higher than M types negative electrode and Scandate cathode.
Fig. 7 is to cover the emission figure that osmium film negative electrode is tested in water cooling anode diode, it can be seen that is commonly covered Osmium film negative electrode is at 1100 DEG C, its keen current density about 30A/cm launched2
U.S. SLAC is tested using electron gun to the negative electrode of the present invention, test result such as Fig. 8:It is cloudy at 1050 DEG C Its keen current density launched is better than 100A/cm after stabilizer pole2
The work function of cathode surface is reduced 0.2-0.4eV by the method for the present invention, during the activation that obtained negative electrode needs Between be only 10-30 minutes, the seasoned time is only about 24 hours, but the working time was up to 3000 hours.
Embodiment 2
A kind of preparation method of submicron film scandium tungsten cathode, comprises the following steps:
1) high-purity micron order tungsten powder is first used into isostatic pressing technology at room temperature, suppressed under 2 tons of pressing pressures;Afterwards in hydrogen It it is 2000 DEG C in sintering temperature, sintering time is to obtain porous tungsten basal body in 60 minutes in gas atmosphere;Copper in 1500 DEG C of bars of temperature Melt under part, copper is impregnated into porous tungsten basal body using capillarity afterwards;Using processing methods such as car system, electric sparks leaching Copper tungsten basal body is processed into required shape;Removed using chemical method or high temperature evaporation method in the leaching copper tungsten basal body processed Copper, obtain cathode base;
2) cathode base is impregnated into active material barium calcium aluminium compound (barium calcium-aluminate, BaO:CaO:Al2O3Mol ratio For 4:1:1), dipping temperature is 1700 DEG C, and dip time is 120 seconds, and cathode base is removed with turning processing method after the completion of dipping The remaining dipping thing on surface;
3) molybdenum ruthenium solder pricker will be passed through impregnated of the cathode support cylinder of the cathode base of active material and the heater containing indirect-heating It is welded together, coat molybdenum ruthenium solder in the cathode base one side relative with heater;Space between cathode base and heater is filled out Fill high purity aluminium oxide;
4) sub-micron scandium W film is deposited on cathode base surface with magnetically controlled DC sputtering;Will be sub- made from sol-gal process The Scandia doped tungsten powder of micro-meter scale with 2.5 tons of pressing pressure elder generation compression moldings, burns in 950 DEG C of low temperature afterwards at room temperature Knot, the target as magnetically controlled DC sputtering;Atmosphere gas is nitrogen, and background vacuum is 5 × 10-4Pa;The diameter 50mm of target;Target Material and the distance on cathode base surface are 50mm;Sputtering power is 120W, is first kept for 6 minutes in sputtering voltage 350V;Splashing again Radio pressure 750V is kept for 6 minutes;Finally kept for 60 minutes in sputtering voltage 1150V, obtain submicron film scandium tungsten cathode.Performance Test result is similar to Example 1.
Embodiment 3
A kind of preparation method of submicron film scandium tungsten cathode, comprises the following steps:
1) high-purity micron order tungsten powder is first used into isostatic pressing technology at room temperature, suppressed under 2.5 tons of pressing pressures;Exist afterwards It it is 2000 DEG C in sintering temperature, sintering time is to obtain porous tungsten basal body in 50 minutes in hydrogen atmosphere;Copper in 1500 DEG C of temperature Under the conditions of melt, copper is impregnated into porous tungsten basal body using capillarity afterwards;Utilize the processing method handle such as car system, electric spark Leaching copper tungsten basal body is processed into required shape;The leaching copper tungsten basal body processed is removed using chemical method or high temperature evaporation method In copper, obtain cathode base;
2) cathode base is impregnated into active material barium calcium aluminium compound (barium calcium-aluminate, BaO:CaO:Al2O3Mol ratio For 6:1:2), dipping temperature is 1600 DEG C, and dip time is 60 seconds, and cathode base table is removed with turning processing method after the completion of dipping The remaining dipping thing in face;
3) molybdenum ruthenium solder pricker will be passed through impregnated of the cathode support cylinder of the cathode base of active material and the heater containing indirect-heating It is welded together, coat molybdenum ruthenium solder in the cathode base one side relative with heater;Space between cathode base and heater is filled out Fill high purity aluminium oxide;
4) sub-micron scandium W film is deposited on cathode base surface with magnetically controlled DC sputtering;Will be sub- made from sol-gal process The Scandia doped tungsten powder of micro-meter scale with 2.5 tons of pressing pressure elder generation compression moldings, burns in 900 DEG C of low temperature afterwards at room temperature Knot, the target as magnetically controlled DC sputtering;Atmosphere gas is nitrogen, and background vacuum is 5 × 10-4Pa;The diameter 50mm of target;Target Material and the distance on cathode base surface are 40-50mm;Sputtering power is 120W, is first kept for 4 minutes in sputtering voltage 450V;Exist again Sputtering voltage 850V is kept for 4 minutes;Finally kept for 40 minutes in sputtering voltage 1250V, obtain submicron film scandium tungsten cathode.Property Energy test result is similar to Example 1.
Obviously, the above embodiment of the present invention is only intended to clearly illustrate example of the present invention, and is not pair The restriction of embodiments of the present invention, for those of ordinary skill in the field, may be used also on the basis of the above description To make other changes in different forms, all embodiments can not be exhaustive here, it is every to belong to this hair Row of the obvious changes or variations that bright technical scheme is extended out still in protection scope of the present invention.

Claims (13)

1. a kind of preparation method of submicron film scandium tungsten cathode, it is characterised in that comprise the following steps:
1)Tungsten powder is suppressed, sintered, obtains porous tungsten basal body, porous tungsten basal body is passed through and soaks copper, is machined, removes copper, is obtained Cathode base;
2)Cathode base is impregnated into active material barium calcium aluminium compound;
3)Cathode base impregnated of active material is assembled in the cathode support cylinder containing heater;
4)With magnetically controlled DC sputtering sub-micron scandium W film is deposited on cathode base surface;During magnetically controlled DC sputtering, the original of target Expect for the Scandia doped tungsten powder of submicron-scale made from sol-gal process;Using ladder making alive mode, first in sputtering electricity 350-450 V are pressed to be kept for 4-6 minutes;Kept for 4-6 minutes in sputtering voltage 750-850V again;Finally in sputtering voltage 1150- 1250V is kept for 40-60 minutes, obtains submicron film scandium tungsten cathode;
Step 1)In, the compacting is to use isostatic pressing technology, and press temperature is room temperature, pressing pressure is 2-2.5 tons;The burning Knot is sintered in hydrogen atmosphere, and sintering temperature is 1900-2000 DEG C, and sintering time is 40-60 minutes.
A kind of 2. preparation method of submicron film scandium tungsten cathode according to claim 1, it is characterised in that step 2) In, the barium calcium aluminium compound is barium calcium-aluminate, BaO:CaO:Al2O3Mol ratio be 5:3:2,4:1:1 or 6:1:2;It is described Dipping temperature is 1500 DEG C -1700 DEG C, and dip time is the 10-120 seconds.
A kind of 3. preparation method of submicron film scandium tungsten cathode according to claim 1, it is characterised in that step 3) In, suppress evaporation material in the cathode base one side coating relative with heater.
4. the preparation method of a kind of submicron film scandium tungsten cathode according to claim 3, it is characterised in that in negative electrode base Space filling high purity aluminium oxide between body and heater.
A kind of 5. preparation method of submicron film scandium tungsten cathode according to claim 1, it is characterised in that step 4) In, the preparation of the target be at room temperature by the Scandia doped tungsten powder of submicron-scale under 2-2.5 ton pressing pressures first Compression molding, obtained afterwards in 850-950 DEG C of sintering.
A kind of 6. preparation method of submicron film scandium tungsten cathode according to claim 1, it is characterised in that step 4) In, during magnetically controlled DC sputtering, atmosphere gas is nitrogen, and background vacuum is 5 × 10-4 Pa;The diameter 50mm of target;Target and the moon The distance of pole matrix surface is 40-50mm;Sputtering power is 100-120W.
A kind of 7. preparation method of submicron film scandium tungsten cathode according to claim 1, it is characterised in that step 4) In, percentage by weight of the scandium oxide in tungsten powder is 3-10%.
A kind of 8. preparation method of submicron film scandium tungsten cathode according to claim 1, it is characterised in that step 4) In, using ladder making alive mode, first kept for 5 minutes in sputtering voltage 400V;Kept for 5 minutes in sputtering voltage 800V again;Most Kept for 45 minutes in sputtering voltage 1200V afterwards, obtain submicron film scandium tungsten cathode.
9. the preparation method of a kind of submicron film scandium tungsten cathode according to claim 1, it is characterised in that including following Step:
1)High-purity micron order tungsten powder is used into isostatic pressing technology at room temperature, suppressed under 2-2.5 ton pressing pressures;Afterwards in hydrogen It it is 1900-2000 DEG C in sintering temperature in atmosphere, sintering time is 40-60 minutes to obtain porous tungsten basal body;Copper in temperature Melt under the conditions of 1400-1500 DEG C, copper is impregnated into porous tungsten basal body using capillarity afterwards;Utilize machining process Leaching copper tungsten basal body is processed into required shape;The leaching copper tungsten base processed is removed using chemical method or high temperature evaporation method Copper in body, obtains cathode base;
2)Cathode base is impregnated into active material barium calcium-aluminate, BaO:CaO:Al2O3Mol ratio be 5:3:2,4:1:1 or 6: 1:2, dipping temperature is 1500-1700 DEG C, and dip time is the 10-120 seconds;
3)It will be existed impregnated of the cathode support cylinder of the cathode base of active material and the heater containing indirect-heating by molybdenum ruthenium solder soldering Together, molybdenum ruthenium solder is coated in the cathode base one side relative with heater;Space filling between cathode base and heater is high Pure alumina;
4)With magnetically controlled DC sputtering sub-micron scandium W film is deposited on cathode base surface;By sub-micron made from sol-gal process The Scandia doped tungsten powder of yardstick with the compression molding of 2-2.5 ton pressing pressures elder generation, sinters at 850-950 DEG C afterwards at room temperature, Target as magnetically controlled DC sputtering;Atmosphere gas is nitrogen, and background vacuum is 5 × 10-4 Pa;The diameter 50mm of target;Target Distance with cathode base surface is 40-50mm;Sputtering power is 100-120w;First 4-6 is kept in sputtering voltage 350-450 V Minute;Kept for 4-6 minutes in sputtering voltage 750-850V again;Finally kept for 40-60 minutes in sputtering voltage 1150-1250V, obtained To submicron film scandium tungsten cathode.
10. the submicron film scandium tungsten cathode as made from claim 1-9 any described preparation methods, it is characterised in that its Including:Cathode support cylinder, heater, cathode base, active material, sub-micron scandium W film, the active material is to be immersed in the moon In the matrix of pole, the sub-micron scandium W film is to sputter at cathode base surface, and the cathode base and heater are arranged on negative electrode Support in cylinder.
11. submicron film scandium tungsten cathode according to claim 10, it is characterised in that the negative electrode also includes suppressing evaporation Material, suppress evaporation material and be coated in the cathode base back side, face heater.
12. the submicron film scandium tungsten cathode according to claim 11, it is characterised in that the negative electrode also includes high pure zirconia Aluminium filler, high purity aluminium oxide filler are filled in the space suppressed between evaporation material and heater.
13. submicron film scandium tungsten cathode according to claim 10, it is characterised in that the thickness of sub-micron scandium W film is 200-400nm。
CN201410808422.1A 2014-12-22 2014-12-22 A kind of submicron film scandium tungsten cathode and preparation method thereof Active CN105788996B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201410808422.1A CN105788996B (en) 2014-12-22 2014-12-22 A kind of submicron film scandium tungsten cathode and preparation method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410808422.1A CN105788996B (en) 2014-12-22 2014-12-22 A kind of submicron film scandium tungsten cathode and preparation method thereof

Publications (2)

Publication Number Publication Date
CN105788996A CN105788996A (en) 2016-07-20
CN105788996B true CN105788996B (en) 2018-02-06

Family

ID=56385682

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201410808422.1A Active CN105788996B (en) 2014-12-22 2014-12-22 A kind of submicron film scandium tungsten cathode and preparation method thereof

Country Status (1)

Country Link
CN (1) CN105788996B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108436079A (en) * 2018-03-15 2018-08-24 北京矿冶科技集团有限公司 A kind of preparation method of hole even porous tungsten
CN109390195B (en) * 2018-11-29 2020-11-27 北京工业大学 Scandium-containing cathode at top layer of submicron structure and preparation method thereof
CN114340124B (en) * 2021-12-30 2024-02-27 中国科学院合肥物质科学研究院 Sodium ion emitter and preparation method thereof

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62213030A (en) * 1986-03-14 1987-09-18 Sony Corp Impregnated type cathode
JPH01213932A (en) * 1988-02-23 1989-08-28 Mitsubishi Electric Corp Cathode of electron tube
CN1042802A (en) * 1987-11-16 1990-06-06 菲利浦光灯制造公司 Scandate cathode
EP0390269A1 (en) * 1989-03-29 1990-10-03 Koninklijke Philips Electronics N.V. Scandate cathode
CN1052748A (en) * 1989-12-22 1991-07-03 国营国光电子管总厂 Magnetron cathode assembly and manufacture craft
US5065070A (en) * 1990-12-21 1991-11-12 Hughes Aircraft Company Sputtered scandate coatings for dispenser cathodes
CN1128403A (en) * 1994-10-25 1996-08-07 电子工业部第十二研究所自动工程研究所 Laser-evaporated thin-film scandium series cathode and its preparation method
CN1173036A (en) * 1995-12-20 1998-02-11 Lg电子株式会社 Cathode Structure body and method of coating electronics radiative body
CN102254766A (en) * 2010-05-19 2011-11-23 中国科学院电子学研究所 Method for preparing storage-type rare-earth oxide cathode

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62213030A (en) * 1986-03-14 1987-09-18 Sony Corp Impregnated type cathode
CN1042802A (en) * 1987-11-16 1990-06-06 菲利浦光灯制造公司 Scandate cathode
JPH01213932A (en) * 1988-02-23 1989-08-28 Mitsubishi Electric Corp Cathode of electron tube
EP0390269A1 (en) * 1989-03-29 1990-10-03 Koninklijke Philips Electronics N.V. Scandate cathode
CN1052748A (en) * 1989-12-22 1991-07-03 国营国光电子管总厂 Magnetron cathode assembly and manufacture craft
US5065070A (en) * 1990-12-21 1991-11-12 Hughes Aircraft Company Sputtered scandate coatings for dispenser cathodes
CN1128403A (en) * 1994-10-25 1996-08-07 电子工业部第十二研究所自动工程研究所 Laser-evaporated thin-film scandium series cathode and its preparation method
CN1173036A (en) * 1995-12-20 1998-02-11 Lg电子株式会社 Cathode Structure body and method of coating electronics radiative body
CN102254766A (en) * 2010-05-19 2011-11-23 中国科学院电子学研究所 Method for preparing storage-type rare-earth oxide cathode

Also Published As

Publication number Publication date
CN105788996A (en) 2016-07-20

Similar Documents

Publication Publication Date Title
US4518890A (en) Impregnated cathode
EP0179513B1 (en) Method of manufacturing a scandate dispenser cathode and dispenser cathode manufactured by means of the method
Zhao et al. High current density and long-life nanocomposite scandate dispenser cathode fabrication
CN105788996B (en) A kind of submicron film scandium tungsten cathode and preparation method thereof
US4675570A (en) Tungsten-iridium impregnated cathode
RU2380784C1 (en) Magnetron with non-filament cathode
US3159461A (en) Thermionic cathode
CN103632902B (en) A kind of preparation method of cathode active emissive material
CN109935505B (en) Preparation method of low-temperature high-current-density scandium-containing oxide cathode
Wang et al. Recent Progress on RE2O3–Mo/W Emission Materials
CN102484033A (en) Electrode for discharge lamp, and process for production thereof
CN208655562U (en) A kind of hot cathode with three-dimensional structure surface
EP0157634A2 (en) Tungsten-iridium impregnated cathode
CN109065420A (en) A kind of hot cathode and preparation method thereof with three-dimensional structure surface
CN115332026B (en) Cathode assembly capable of being started quickly and preparation method and application thereof
CN113889388A (en) Pressed cathode and preparation method thereof
CN105118760B (en) The method for preparing W-Re base barium-tungsten dispense cathode
JPS612226A (en) Impregnated cathode
CN115101395A (en) Preparation method and application of directly-heated nickel sponge oxide cathode
EP1568055A2 (en) Vacuum tube with oxide cathode
KR920004551B1 (en) Dispensor cathode
JPS62133632A (en) Impregnated type cathode
KR920009323B1 (en) Cathode
JPS5979934A (en) Impregnated cathode
RU2505882C1 (en) Composition of material for making electrodes of low-temperature plasma generators

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant