JP2004004039A5 - - Google Patents

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Publication number
JP2004004039A5
JP2004004039A5 JP2003107773A JP2003107773A JP2004004039A5 JP 2004004039 A5 JP2004004039 A5 JP 2004004039A5 JP 2003107773 A JP2003107773 A JP 2003107773A JP 2003107773 A JP2003107773 A JP 2003107773A JP 2004004039 A5 JP2004004039 A5 JP 2004004039A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2003107773A
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JP2004004039A (ja
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Publication date
Priority claimed from US10/121,356 external-priority patent/US6825651B2/en
Application filed filed Critical
Publication of JP2004004039A publication Critical patent/JP2004004039A/ja
Publication of JP2004004039A5 publication Critical patent/JP2004004039A5/ja
Withdrawn legal-status Critical Current

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JP2003107773A 2002-04-12 2003-04-11 電子システムにおける被給電要素に関する電流特性を求めるためのテスト方法 Withdrawn JP2004004039A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/121,356 US6825651B2 (en) 2002-04-12 2002-04-12 Test method for characterizing currents associated with powered components in an electronic system

Publications (2)

Publication Number Publication Date
JP2004004039A JP2004004039A (ja) 2004-01-08
JP2004004039A5 true JP2004004039A5 (ja) 2006-06-15

Family

ID=28790311

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003107773A Withdrawn JP2004004039A (ja) 2002-04-12 2003-04-11 電子システムにおける被給電要素に関する電流特性を求めるためのテスト方法

Country Status (2)

Country Link
US (1) US6825651B2 (ja)
JP (1) JP2004004039A (ja)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7420794B2 (en) * 2001-05-16 2008-09-02 John Mezzalingua Associates, Inc. Compact spark gap for surge protection of electrical componentry
US6930872B2 (en) * 2001-05-16 2005-08-16 John Mezzalingua Associates, Inc. Spark gap device
US7532000B2 (en) 2006-08-03 2009-05-12 The Boeing Company Method and system for measurement of current flows in fastener arrays
CN102472792B (zh) * 2010-05-19 2014-11-12 松下电器产业株式会社 集成电路电流测定用装置及集成电路电流测定用适配器
RU2499374C2 (ru) * 2012-01-24 2013-11-20 Общество с ограниченной ответственностью "Тегас Электрик" Плата печатная
CN103064010B (zh) * 2013-01-08 2015-04-15 浙江大学 基于希尔伯特-黄变换的模拟电路故障元件参数估计方法
KR20150052563A (ko) * 2013-11-06 2015-05-14 삼성전자주식회사 검사 장치 및 방법
US9651585B2 (en) * 2013-12-18 2017-05-16 National Instruments Corporation Via layout techniques for improved low current measurements
FR3089539B1 (fr) * 2018-12-10 2021-04-09 Continental Automotive France Poignée de portière avec des moyens de réduction d’un rayonnement en communication ultra haute fréquence
DE102019121980A1 (de) * 2019-01-22 2020-07-23 Roman Nachsel Hochstrom-Bauelement
CN113777387B (zh) * 2021-11-11 2022-02-15 武汉精熔潮电气科技有限公司 基于无铁芯的霍尔检测导体稳态瞬态电流的方法及其应用

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5469064A (en) * 1992-01-14 1995-11-21 Hewlett-Packard Company Electrical assembly testing using robotic positioning of probes
JP3214766B2 (ja) * 1992-08-06 2001-10-02 アジレント・テクノロジーズ・インク 接続検査のための装置
US5888837A (en) * 1996-04-16 1999-03-30 General Electric Company Chip burn-in and test structure and method
US6087842A (en) * 1996-04-29 2000-07-11 Agilent Technologies Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry
KR19980015274A (ko) * 1996-08-20 1998-05-25 김광호 모터의 이상상태 감지장치 및 이상상태 감지방법
JPH11223505A (ja) * 1997-12-03 1999-08-17 Mitsutoyo Corp 誘導型位置測定装置
JP2000099551A (ja) * 1998-09-18 2000-04-07 Sony Corp 集積回路の電流見積装置およびその方法
US6504392B2 (en) * 1999-03-26 2003-01-07 International Business Machines Corporation Actively controlled heat sink for convective burn-in oven
TW484249B (en) * 2000-10-20 2002-04-21 Hon Hai Prec Ind Co Ltd Antenna module

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