JP2003523245A5 - - Google Patents

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Publication number
JP2003523245A5
JP2003523245A5 JP2001561212A JP2001561212A JP2003523245A5 JP 2003523245 A5 JP2003523245 A5 JP 2003523245A5 JP 2001561212 A JP2001561212 A JP 2001561212A JP 2001561212 A JP2001561212 A JP 2001561212A JP 2003523245 A5 JP2003523245 A5 JP 2003523245A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001561212A
Other versions
JP4128776B2 (ja
JP2003523245A (ja
Filing date
Publication date
Priority claimed from PT102423A external-priority patent/PT102423A/pt
Application filed filed Critical
Publication of JP2003523245A publication Critical patent/JP2003523245A/ja
Publication of JP2003523245A5 publication Critical patent/JP2003523245A5/ja
Application granted granted Critical
Publication of JP4128776B2 publication Critical patent/JP4128776B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2001561212A 2000-02-25 2001-02-26 角膜表面と角膜厚さとの両方の形状を測定する測定システム Expired - Fee Related JP4128776B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
PT102423 2000-02-25
PT102423A PT102423A (pt) 2000-02-25 2000-02-25 Sistema para medir topografia de ambas as superficies corneanas e a espessura da cornea
PCT/PT2001/000002 WO2001062140A1 (en) 2000-02-25 2001-02-26 System to measure the topography of both corneal surfaces and corneal thickness

Publications (3)

Publication Number Publication Date
JP2003523245A JP2003523245A (ja) 2003-08-05
JP2003523245A5 true JP2003523245A5 (ja) 2007-12-06
JP4128776B2 JP4128776B2 (ja) 2008-07-30

Family

ID=20085932

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001561212A Expired - Fee Related JP4128776B2 (ja) 2000-02-25 2001-02-26 角膜表面と角膜厚さとの両方の形状を測定する測定システム

Country Status (8)

Country Link
US (1) US6913358B2 (ja)
EP (1) EP1127533B1 (ja)
JP (1) JP4128776B2 (ja)
AT (1) ATE384472T1 (ja)
AU (1) AU2001236256A1 (ja)
DE (1) DE60132510T2 (ja)
PT (1) PT102423A (ja)
WO (1) WO2001062140A1 (ja)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE50202312D1 (de) 2002-04-05 2005-03-31 Sis Ag Surgical Instr Systems Vorrichtung und Verfahren zur Bestimmung von geometrischen Messwerten eines Auges
WO2008141304A2 (en) 2007-05-11 2008-11-20 Amo Manufacturing Usa, Llc Combined wavefront and topography systems and methods
US7988290B2 (en) * 2007-06-27 2011-08-02 AMO Wavefront Sciences LLC. Systems and methods for measuring the shape and location of an object
US7976163B2 (en) 2007-06-27 2011-07-12 Amo Wavefront Sciences Llc System and method for measuring corneal topography
EP2242418B1 (en) * 2007-12-21 2011-08-03 SIFI MEDTECH S.r.l. Dual scheimpflug system for three- dimensional analysis of an eye
US7988293B2 (en) * 2008-11-14 2011-08-02 AMO Wavefront Sciences LLC. Method of qualifying light spots for optical measurements and measurement instrument employing method of qualifying light spots
MX2011009197A (es) * 2009-03-04 2011-11-18 Aaren Scientific Inc Sistema para caracterizar una cornea y obtener una lente oftalmica.
US8622546B2 (en) 2011-06-08 2014-01-07 Amo Wavefront Sciences, Llc Method of locating valid light spots for optical measurement and optical measurement instrument employing method of locating valid light spots
JP6323743B2 (ja) * 2013-12-13 2018-05-16 大日本印刷株式会社 光走査装置、照明装置、投射装置および光学素子
CN110430799B (zh) * 2017-02-23 2022-03-29 艾维斯技术有限责任公司 用于光学角膜地形图和断层扫描的相干激光

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4019813A (en) * 1976-01-19 1977-04-26 Baylor College Of Medicine Optical apparatus for obtaining measurements of portions of the eye
US5095386A (en) * 1990-05-01 1992-03-10 Charles Lescrenier Optical system for generating lines of light using crossed cylindrical lenses
BE1007225A3 (nl) 1993-06-17 1995-04-25 Philips Electronics Nv Differentiele belastingtrap met stapsgewijs variabele impedantie.
US5867250A (en) * 1996-05-03 1999-02-02 Baron; William S. Apparatus and method for optically mapping front and back surface topographies of an object
US6575573B2 (en) * 2001-10-17 2003-06-10 Carl Zeiss Ophthalmic Systems, Inc. Method and apparatus for measuring a corneal profile of an eye

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