JP2003346916A - Failure diagnosis device and method for cell voltage detecting circuit - Google Patents
Failure diagnosis device and method for cell voltage detecting circuitInfo
- Publication number
- JP2003346916A JP2003346916A JP2002152400A JP2002152400A JP2003346916A JP 2003346916 A JP2003346916 A JP 2003346916A JP 2002152400 A JP2002152400 A JP 2002152400A JP 2002152400 A JP2002152400 A JP 2002152400A JP 2003346916 A JP2003346916 A JP 2003346916A
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- cell
- failure diagnosis
- reference voltage
- detection circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
Landscapes
- Tests Of Electric Status Of Batteries (AREA)
- Charge And Discharge Circuits For Batteries Or The Like (AREA)
- Secondary Cells (AREA)
- Electric Propulsion And Braking For Vehicles (AREA)
Abstract
Description
【０００１】[0001]
【発明の属する技術分野】本発明は、組電池のセル電圧
を検出するセル電圧検出回路の故障箇所を特定すること
ができる診断装置および故障診断方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a diagnostic device and a diagnostic method capable of specifying a failure location of a cell voltage detection circuit for detecting a cell voltage of a battery pack.
【０００２】[0002]
【従来の技術】従来、複数のセルから構成される組電池
のセル電圧を検出する回路の故障診断装置が知られてい
る。特開平１１−２５２８０９号公報には、組電池の総
電圧ＶＡを検出するとともに、各セル電圧を検出して加
算することにより加算電圧ＶＴを求めて、両電圧値Ｖ
Ａ，ＶＴを比較して一致しなければ、異常が発生したと
判定する技術が開示されている。2. Description of the Related Art Conventionally, there has been known a failure diagnosis device for a circuit for detecting a cell voltage of a battery pack composed of a plurality of cells. Japanese Patent Application Laid-Open No. H11-252809 discloses that a total voltage VA of an assembled battery is detected, and an added voltage VT is obtained by detecting and adding each cell voltage.
A technique is disclosed in which A and VT are compared and if they do not match, it is determined that an abnormality has occurred.
【０００３】[0003]
【発明が解決しようとする課題】しかしながら、従来の
故障診断装置では、両電圧値ＶＡ，ＶＴが不一致であっ
た場合に、いずれの箇所に故障が発生したかを特定する
ことができなかった。However, in the conventional failure diagnosis apparatus, when both the voltage values VA and VT do not match, it is not possible to specify which part of the failure has occurred.
【０００４】本発明の目的は、セル電圧検出回路の故障
診断を行うセル電圧検出回路の故障診断装置および故障
診断方法を提供することにある。An object of the present invention is to provide a failure diagnosis device and a failure diagnosis method for a cell voltage detection circuit for performing a failure diagnosis of a cell voltage detection circuit.
【０００５】[0005]
【課題を解決するための手段】（１）本発明によるセル
電圧検出回路の故障診断装置は、組電池を構成するセル
のセル電圧を検出するセル電圧検出回路と、セル電圧検
出回路に基準電圧を印加する基準電圧印加回路と、基準
電圧を印加するセル電圧検出回路を切り替える印加電圧
切替回路と、印加された基準電圧をセル電圧検出回路に
て検出された検出電圧と、印加された基準電圧とに基づ
いて、セル電圧検出回路の故障診断を行う故障診断回路
とを備えることにより、上記目的を達成する。
（２）本発明によるセル電圧検出回路の故障診断方法
は、組電池を構成するセルのセル電圧を検出するセル電
圧検出回路に基準電圧を印加し、印加された基準電圧を
セル電圧検出回路にて検出し、印加された基準電圧をセ
ル電圧検出回路にて検出された検出電圧と、実際に印加
された基準電圧とに基づいて、セル電圧検出回路の故障
診断を行うことにより、上記目的を達成する。(1) A failure diagnosis apparatus for a cell voltage detection circuit according to the present invention comprises: a cell voltage detection circuit for detecting a cell voltage of a cell constituting a battery pack; and a reference voltage applied to the cell voltage detection circuit. A reference voltage application circuit for applying a reference voltage, an application voltage switching circuit for switching a cell voltage detection circuit for applying a reference voltage, a detection voltage obtained by detecting the applied reference voltage by the cell voltage detection circuit, and an applied reference voltage. The above object is achieved by providing a failure diagnosis circuit for performing failure diagnosis of the cell voltage detection circuit based on the above. (2) In the failure diagnosis method for a cell voltage detection circuit according to the present invention, a reference voltage is applied to a cell voltage detection circuit for detecting a cell voltage of a cell constituting a battery pack, and the applied reference voltage is applied to the cell voltage detection circuit. The above-mentioned object is achieved by performing a failure diagnosis of the cell voltage detection circuit based on the detected voltage detected by the cell voltage detection circuit and the actually applied reference voltage. To achieve.
【０００６】[0006]
【発明の効果】本発明によるセル電圧検出回路の故障診
断装置およびセル電圧検出回路の故障診断方法によれ
ば、セルごとに設けられるセル電圧検出回路に印加され
た基準電圧を検出した検出電圧と、実際に印加された基
準電圧とに基づいて、セル電圧検出回路の故障診断を行
うことにより、セル電圧検出回路の故障を確実に検出す
ることができる。According to the apparatus for diagnosing failure of a cell voltage detection circuit and the method of diagnosing failure of a cell voltage detection circuit according to the present invention, the detection voltage detected by detecting the reference voltage applied to the cell voltage detection circuit provided for each cell is provided. By performing the failure diagnosis of the cell voltage detection circuit based on the actually applied reference voltage, the failure of the cell voltage detection circuit can be reliably detected.
【０００７】[0007]
【発明の実施の形態】図１および図２は、本発明による
セル電圧検出回路の故障診断装置の一実施の形態の構成
を示す図である。組電池１は、８つのセルＣ１〜Ｃ８を
直列に接続して構成される。容量調整回路Ｅ１〜Ｅ８
は、各セルＣ１〜Ｃ８ごとにセルと並列に接続されて、
対応するセルを放電させることによる容量調整を行い、
各セル間の容量バラツキを抑制する。1 and 2 are diagrams showing the configuration of an embodiment of a failure diagnosis apparatus for a cell voltage detection circuit according to the present invention. The assembled battery 1 is configured by connecting eight cells C1 to C8 in series. Capacity adjustment circuits E1 to E8
Are connected in parallel with the cells for each of the cells C1 to C8,
Perform capacity adjustment by discharging the corresponding cell,
Capacitance variation between cells is suppressed.
【０００８】切替スイッチ部５は、ＣＰＵ１０から送ら
れる制御信号Ｉに基づいて、スイッチＳＷ１〜ＳＷ８を
切り替える。制御信号ＩがＬoレベルの時は、ＳＷ１〜
ＳＷ８をセル電圧回路側にセットし、制御信号ＩがＨi
レベルの時は、ＳＷ１〜ＳＷ８を基準電圧回路側にセッ
トする。図１では、スイッチＳＷ１〜ＳＷ８が全てセル
電圧回路側にセットされている状態を示しており、この
状態では、後述するセル電圧検出回路３により、各セル
電圧を検出することができる。The switch unit 5 switches the switches SW1 to SW8 based on a control signal I sent from the CPU 10. When the control signal I is at the Lo level, SW1 to SW1
SW8 is set on the cell voltage circuit side, and the control signal I is set to Hi.
At the time of level, SW1 to SW8 are set to the reference voltage circuit side. FIG. 1 shows a state in which the switches SW1 to SW8 are all set on the cell voltage circuit side. In this state, each cell voltage can be detected by a cell voltage detection circuit 3 described later.
【０００９】セル電圧検出回路３は、差動増幅部Ｄ１〜
Ｄ８を備える。スイッチＳＷ１〜ＳＷ８がセル電圧回路
側にセットされている時は、差動増幅部Ｄ１〜Ｄ８の出
力にて、対応するセルＣ１〜Ｃ８のセル電圧Ｖc1〜Ｖc8
を検出する。一方、スイッチＳＷ１〜ＳＷ８が基準電圧
回路側にセットされている時は、差動増幅部Ｄ１〜Ｄ８
に印加される基準電圧を検出する。検出した電圧値は、
それぞれＣＰＵ１０に送信される。なお、基準電圧と
は、セル電圧検出回路３の故障診断時に用いられる電圧
のことである。The cell voltage detection circuit 3 includes differential amplifiers D1 to D1.
D8. When the switches SW1 to SW8 are set on the cell voltage circuit side, the cell voltages Vc1 to Vc8 of the corresponding cells C1 to C8 are output from the differential amplifiers D1 to D8.
Is detected. On the other hand, when the switches SW1 to SW8 are set on the reference voltage circuit side, the differential amplifiers D1 to D8
The reference voltage applied to is detected. The detected voltage value is
Each is transmitted to the CPU 10. Note that the reference voltage is a voltage used at the time of failure diagnosis of the cell voltage detection circuit 3.
【００１０】図２は、セル電圧検出回路３の診断回路部
の詳細な構成を示す図である。診断回路部は、切替スイ
ッチ部５と、セル電圧検出回路３の故障診断を行う際に
用いられる基準電圧を設定する基準電圧設定部６と、基
準電圧設定部６で設定された基準電圧をセル電圧検出回
路３に印加するためのアナログスイッチＩＣ部７と、Ｃ
ＰＵ１０とを備える。アナログスイッチＩＣ部７は、基
準電圧を印加する切替スイッチ部５を定めるマルチプレ
クサＭＰＸ１と、接地電圧を印加する切替スイッチ部５
を定めるマルチプレクサＭＰＸ２とを有する。上述した
ように、切替スイッチ部５は、ＣＰＵから送られる制御
信号Ｉに基づいて、スイッチＳＷ１〜ＳＷ８の切替を行
い、制御信号ＩがＨiレベルの場合には、スイッチＳＷ
１〜ＳＷ８を基準電圧回路側にセットする。FIG. 2 is a diagram showing a detailed configuration of the diagnostic circuit section of the cell voltage detecting circuit 3. As shown in FIG. The diagnostic circuit unit includes a changeover switch unit 5, a reference voltage setting unit 6 that sets a reference voltage used when performing a failure diagnosis of the cell voltage detection circuit 3, and a reference voltage set by the reference voltage setting unit 6. An analog switch IC unit 7 for applying a voltage to the voltage detection circuit 3;
PU10. The analog switch IC unit 7 includes a multiplexer MPX1 that determines a switch unit 5 that applies a reference voltage, and a switch unit 5 that applies a ground voltage.
And a multiplexer MPX2 that determines As described above, the changeover switch unit 5 switches the switches SW1 to SW8 based on the control signal I sent from the CPU, and when the control signal I is at the Hi level, the switch SW5
1 to SW8 are set on the reference voltage circuit side.
【００１１】Ｄ／Ａコンバータを有する基準電圧設定部
６は、ＣＰＵ１０から送られる制御信号に基づいて、故
障診断に用いる基準電圧のアナログ信号を発生して、ア
ナログスイッチＩＣ部７のマルチプレクサＭＰＸ１のＸ
ポートに送る。基準電圧は任意の値を設定することがで
きるが、本実施の形態では、2.0（Ｖ）〜4.5（Ｖ）の範
囲の電圧値を基準電圧として用いる。アナログスイッチ
ＩＣ部７は、ＣＰＵ１０から送られる制御信号Ａ，Ｂ，
Ｃに基づいて、基準電圧を印加するセル間を切り替え
る。基準電圧を印加するセル間の切替方法について、図
３を用いて説明する。A reference voltage setting section 6 having a D / A converter generates an analog signal of a reference voltage used for failure diagnosis based on a control signal sent from the CPU 10, and outputs an X signal of the multiplexer MPX1 of the analog switch IC section 7.
Send to port. Although any value can be set as the reference voltage, in this embodiment, a voltage value in the range of 2.0 (V) to 4.5 (V) is used as the reference voltage. The analog switch IC unit 7 includes control signals A, B,
Switching between cells to which the reference voltage is applied is performed based on C. A method for switching between cells to which a reference voltage is applied will be described with reference to FIG.
【００１２】図３は、ＣＰＵ１０の制御信号Ｉ，Ａ，
Ｂ，Ｃの信号レベルに応じて、いずれのセル間に基準電
圧が印加されるかを示す表である。制御信号ＩがＬoレ
ベルの時は、ＭＰＸ１，２の端子Ｘと端子Ｘ0〜Ｘ７間
は、全てオフとなる。制御信号ＩがＨiレベルの場合に
は、制御信号Ａ，Ｂ，Ｃのレベルに応じて、ＭＰＸ１，
２は、ともに各々の端子Ｘと端子Ｘ0〜Ｘ7のうちのいず
れか１つの端子との間がオンとなる。例えば、制御信号
Ａ，Ｂ，Ｃの全てがＬoレベルの場合には、図３に示す
ように、端子Ｘと端子Ｘ0との間がオンとなる。この場
合、差動増幅部Ｄ１のプラス側には基準電圧設定部６で
設定された基準電圧ＶdがＭＰＸ１を介して印加され、
マイナス側にはＭＰＸ２を介して接地電圧（０Ｖ）が印
加される。従って、差動増幅部Ｄ１は、印加される基準
電圧Ｖdを入力電圧Ｖin1として検出して、ＣＰＵ１０に
出力する。FIG. 3 shows control signals I, A,
9 is a table showing which reference voltage is applied between which cells according to the signal levels of B and C. When the control signal I is at the Lo level, the terminals X of the MPXs 1 and 2 and the terminals X0 to X7 are all turned off. When the control signal I is at the Hi level, MPX1, MPX1 and MPX1 are controlled according to the levels of the control signals A, B and C.
No. 2 turns on between each terminal X and any one of the terminals X0 to X7. For example, when all of the control signals A, B, and C are at the Lo level, as shown in FIG. 3, the connection between the terminal X and the terminal X0 is turned on. In this case, the reference voltage Vd set by the reference voltage setting unit 6 is applied to the positive side of the differential amplifying unit D1 via the MPX1,
The ground voltage (0 V) is applied to the negative side via MPX2. Therefore, the differential amplifier D1 detects the applied reference voltage Vd as the input voltage Vin1 and outputs the same to the CPU 10.
【００１３】同様に、制御信号（Ａ，Ｂ，Ｃ）の信号レ
ベルが（Ｈ，Ｌ，Ｌ）の時には、差動増幅部Ｄ２に基準
電圧Ｖdが入力電圧Ｖin2として印加され、（Ｌ，Ｈ，
Ｌ）の時には、差動増幅部Ｄ３に基準電圧Ｖdが入力電
圧Ｖin3として印加される。差動増幅部Ｄ４〜Ｄ８に基
準電圧Ｖdを印加するときの制御信号（Ａ，Ｂ，Ｃ）の
信号レベルはそれぞれ、（Ｈ，Ｈ，Ｌ）、（Ｌ，Ｌ，
Ｈ）、（Ｈ，Ｌ，Ｈ）、（Ｈ，Ｈ，Ｌ）、（Ｈ，Ｈ，
Ｈ）である。なお、差動増幅部Ｄ８のマイナス側は接地
されているので、ＭＰＸ２を介して接地電圧が印加され
ることは無い。Similarly, when the signal level of the control signal (A, B, C) is (H, L, L), the reference voltage Vd is applied to the differential amplifier D2 as the input voltage Vin2, and (L, H) ,
In the case of L), the reference voltage Vd is applied to the differential amplifier D3 as the input voltage Vin3. The signal levels of the control signals (A, B, C) when applying the reference voltage Vd to the differential amplifiers D4 to D8 are (H, H, L), (L, L,
H), (H, L, H), (H, H, L), (H, H,
H). Since the minus side of the differential amplifier D8 is grounded, no ground voltage is applied via the MPX2.
【００１４】セル電圧検出回路３の故障診断方法につい
て説明する。ＣＰＵ１０は、制御信号ＩをＨレベルにす
ることにより、スイッチＳＷ１〜ＳＷ８を基準電圧回路
側にセットする。差動増幅部Ｄ１の故障診断を行う場合
は、制御信号（Ａ，Ｂ，Ｃ）の信号レベルを（Ｌ，Ｌ，
Ｌ）とする。これにより、差動増幅部Ｄ１には、基準電
圧Ｖdが印加されるので、差動増幅部Ｄ１は、基準電圧
Ｖdを入力電圧Ｖin1として検出して、ＣＰＵ１０に出力
する。ＣＰＵ１０は、差動増幅部Ｄ１にて検出された電
圧Ｖin1と実際に印加した基準電圧Ｖdとを比較し、両電
圧の差が所定の範囲内になければ、差動増幅部Ｄ１に故
障があると判定する。本実施の形態では、基準電圧Ｖd
を2.0（Ｖ）および4.3（Ｖ）とし、所定の範囲を0.15
（Ｖ）とする。A method of diagnosing a failure of the cell voltage detection circuit 3 will be described. The CPU 10 sets the switches SW1 to SW8 to the reference voltage circuit side by setting the control signal I to the H level. When performing a failure diagnosis of the differential amplifier D1, the signal level of the control signal (A, B, C) is set to (L, L,
L). As a result, the reference voltage Vd is applied to the differential amplifier D1, so that the differential amplifier D1 detects the reference voltage Vd as the input voltage Vin1 and outputs it to the CPU 10. The CPU 10 compares the voltage Vin1 detected by the differential amplifier D1 with the reference voltage Vd actually applied. If the difference between the two voltages is not within a predetermined range, the differential amplifier D1 has a failure. Is determined. In the present embodiment, the reference voltage Vd
Are 2.0 (V) and 4.3 (V), and the predetermined range is 0.15
(V).
【００１５】図４は、本発明によるセル電圧検出回路の
故障診断装置による故障診断制御手順を示す一実施の形
態のフローチャートである。ステップＳ１から始まる処
理は、ＣＰＵ１０にて行われる。ステップＳ１では、制
御信号ＩをＬoレベルからＨiレベルに切り替える。これ
により、スイッチＳＷ１〜ＳＷ８がセル電圧回路側から
基準電圧回路側に切り替えられる。次のステップＳ２で
は、診断基準電圧Ｖdを4.3（Ｖ）とするデジタル信号を
基準電圧設定部６に送信する。本実施の形態では、各セ
ルの過充電時の電圧が4.5（Ｖ）であるので、基準電圧
Ｖdを4.3（Ｖ）に設定することにより、過充電検知領域
での故障診断を行う。FIG. 4 is a flowchart of an embodiment showing a fault diagnosis control procedure by the fault diagnosis device for the cell voltage detection circuit according to the present invention. The process starting from step S1 is performed by the CPU 10. In step S1, the control signal I is switched from the Lo level to the Hi level. Thereby, the switches SW1 to SW8 are switched from the cell voltage circuit side to the reference voltage circuit side. In the next step S2, a digital signal for setting the diagnostic reference voltage Vd to 4.3 (V) is transmitted to the reference voltage setting unit 6. In this embodiment, since the voltage at the time of overcharging of each cell is 4.5 (V), failure diagnosis in the overcharge detection region is performed by setting the reference voltage Vd to 4.3 (V).
【００１６】診断基準電圧Ｖdを4.3（Ｖ）に設定する
と、ステップＳ３に進む。ステップＳ３では、故障診断
を行うセル間に応じて、制御信号Ａ，Ｂ，Ｃの信号レベ
ルを切り替える。セルＣ１に対応する差動増幅部Ｄ１の
故障診断を行う場合には、制御信号Ａ，Ｂ，Ｃを全てＬ
oレベルとする。これにより、差動増幅部Ｄ１は、印加
される基準電圧Ｖdを入力電圧Ｖin1として検出して、Ｃ
ＰＵ１０に出力する。次のステップＳ４では、差動増幅
部Ｄ１で検出した電圧Ｖin1とステップＳ２で設定した
基準電圧Ｖdとの差が所定の範囲内（0.15（Ｖ））であ
るか否かを判定する。電圧Ｖin1とＶdとの差が所定の範
囲内であると判定するとステップＳ５に進み、両電圧差
が所定の範囲内に無いと判定するとステップＳ１１に進
む。ステップＳ１１では、差動増幅部Ｄ１に故障が発生
したと判定して、本フローチャートによる処理を終了す
る。When the diagnostic reference voltage Vd is set to 4.3 (V), the process proceeds to step S3. In step S3, the signal levels of the control signals A, B, and C are switched according to the cells for which the failure diagnosis is performed. When performing a failure diagnosis of the differential amplifier D1 corresponding to the cell C1, all the control signals A, B, and C are set to L.
o level. Thereby, the differential amplifier D1 detects the applied reference voltage Vd as the input voltage Vin1, and
Output to PU10. In the next step S4, it is determined whether or not the difference between the voltage Vin1 detected by the differential amplifier D1 and the reference voltage Vd set in step S2 is within a predetermined range (0.15 (V)). When it is determined that the difference between the voltages Vin1 and Vd is within a predetermined range, the process proceeds to step S5, and when it is determined that the two voltage differences are not within the predetermined range, the process proceeds to step S11. In step S11, it is determined that a failure has occurred in the differential amplifying unit D1, and the processing according to this flowchart ends.
【００１７】ステップＳ５では、全ての差動増幅部Ｄ１
〜Ｄ８に対して、故障診断を行ったか否かを判定する。
全ての差動増幅部Ｄ１〜Ｄ８に対して故障診断を行って
いないと判定すると、ステップＳ３に戻って、故障診断
を行っていない差動増幅部に対して、上述したステップ
Ｓ３，Ｓ４の処理を行う。全ての差動増幅部Ｄ１〜Ｄ８
に対して故障診断を行ったと判定すると、ステップＳ６
に進む。In step S5, all the differential amplifiers D1
It is determined whether or not failure diagnosis has been performed for D8.
If it is determined that the failure diagnosis has not been performed on all the differential amplifiers D1 to D8, the process returns to step S3, and the processing in steps S3 and S4 described above is performed on the differential amplifiers on which the failure diagnosis has not been performed. I do. All differential amplifiers D1 to D8
If it is determined that failure diagnosis has been performed for
Proceed to.
【００１８】ステップＳ６では、各セルの過放電時の電
圧が1.8（Ｖ）であるので、診断基準電圧Ｖdを2.0
（Ｖ）とするデジタル信号を基準電圧設定部６に送信す
る。すなわち、ステップＳ６以降の処理では、過放電検
知領域での故障診断を行う。ステップＳ６に続くステッ
プＳ７では、故障診断を行うセル間に応じて、制御信号
Ａ，Ｂ，Ｃの信号レベルを切り替える。ステップＳ７で
行う処理は、ステップＳ３で行った処理と同じである。
故障診断を行うセル間に応じて制御信号Ａ，Ｂ，Ｃの信
号レベルを切り替えると、ステップＳ８に進む。ステッ
プＳ８では、ステップＳ７の信号レベル切替制御により
基準電圧が印加される差動増幅部で検出した電圧Ｖin
と、ステップＳ６で設定した基準電圧Ｖdとの差が所定
の範囲内（0.15（Ｖ））であるか否かを判定する。電圧
ＶinとＶdとの差が所定の範囲内であると判定するとス
テップＳ９に進み、両電圧差が所定の範囲内に無いと判
定するとステップＳ１２に進む。ステップＳ１２では、
差動増幅部Ｄ１に故障が発生したと判定して、本フロー
チャートによる処理を終了する。In step S6, since the voltage of each cell at the time of overdischarge is 1.8 (V), the diagnostic reference voltage Vd is set to 2.0.
A digital signal of (V) is transmitted to the reference voltage setting unit 6. That is, in the processing after step S6, a failure diagnosis is performed in the overdischarge detection area. In step S7 following step S6, the signal levels of the control signals A, B, and C are switched in accordance with the cells to be subjected to failure diagnosis. The processing performed in step S7 is the same as the processing performed in step S3.
When the signal levels of the control signals A, B, and C are switched according to the cells for which the failure diagnosis is performed, the process proceeds to step S8. In step S8, the voltage Vin detected by the differential amplifier to which the reference voltage is applied by the signal level switching control in step S7.
It is determined whether or not the difference between the reference voltage and the reference voltage Vd set in step S6 is within a predetermined range (0.15 (V)). When it is determined that the difference between the voltages Vin and Vd is within a predetermined range, the process proceeds to step S9, and when it is determined that the two voltage differences are not within the predetermined range, the process proceeds to step S12. In step S12,
It is determined that a failure has occurred in the differential amplifier D1, and the processing according to this flowchart ends.
【００１９】ステップＳ９では、全ての差動増幅部Ｄ１
〜Ｄ８に対して、基準電圧Ｖdを2.0（Ｖ）とした時の故
障診断を行ったか否かを判定する。全ての差動増幅部Ｄ
１〜Ｄ８に対して故障診断を行っていないと判定する
と、ステップＳ７に戻って、故障診断を行っていない差
動増幅部に対して、上述したステップＳ７，Ｓ８の処理
を行う。全ての差動増幅部Ｄ１〜Ｄ８に対して故障診断
を行ったと判定すると、ステップＳ１０に進む。ステッ
プＳ１０では、制御信号ＩをＨiレベルからＬoレベルに
切り替えて、本フローチャートによる処理を終了する。
これにより、スイッチＳＷ１〜ＳＷ８は、基準電圧回路
側からセル電圧回路側に切り替えられるとともに、ＭＰ
Ｘ１，２からの出力が禁止される。In step S9, all the differential amplifiers D1
It is determined whether or not a failure diagnosis has been performed for D8 through D8 when the reference voltage Vd is 2.0 (V). All differential amplifiers D
If it is determined that the failure diagnosis has not been performed on 1 to D8, the process returns to step S7, and the above-described processing of steps S7 and S8 is performed on the differential amplifier that has not performed the failure diagnosis. If it is determined that failure diagnosis has been performed on all the differential amplifiers D1 to D8, the process proceeds to step S10. In step S10, the control signal I is switched from the Hi level to the Lo level, and the processing according to this flowchart ends.
Thereby, the switches SW1 to SW8 are switched from the reference voltage circuit side to the cell voltage circuit side, and
Outputs from X1 and X2 are prohibited.
【００２０】なお、ステップＳ１１またはステップＳ１
２にて、差動増幅部に故障が発生したと判定された場合
には、不図示のインジケータやスピーカにより、故障が
生じたことを知らせることができる。この場合、故障診
断は、各差動増幅部Ｄ１〜Ｄ８ごとに行うので、故障が
発生した差動増幅部を特定して故障が生じたことを報知
することができる。In step S11 or step S1
If it is determined in step 2 that a failure has occurred in the differential amplifying unit, the occurrence of the failure can be notified by an indicator or speaker (not shown). In this case, since the failure diagnosis is performed for each of the differential amplifiers D1 to D8, the occurrence of the failure can be notified by specifying the differential amplifier in which the failure has occurred.
【００２１】（１）本実施の形態におけるセル電圧検出
回路の故障診断装置によれば、差動増幅部Ｄ１〜Ｄ８に
印加された基準電圧を検出した検出電圧Ｖinと、実際に
印加された基準電圧Ｖdとに基づいて、差動増幅部Ｄ１
〜Ｄ８の故障診断を行うことにより、差動増幅部Ｄ１〜
Ｄ８の故障を確実に検出することができる。基準電圧を
印加する差動増幅部Ｄ１〜Ｄ８は、アナログスイッチＩ
Ｃ部７にて順次切り替えられるので、全ての差動増幅部
Ｄ１〜Ｄ８の故障診断を行うことができる。また、故障
診断に用いられる基準電圧は、ＣＰＵ１０からの指令に
基づいて基準電圧設定部６にて任意の値に設定すること
ができるので、差動増幅部Ｄ１〜Ｄ８の電圧検出範囲の
全域に渡る故障診断を行うことができる。(1) According to the failure diagnosis device for the cell voltage detection circuit in the present embodiment, the detection voltage Vin that detects the reference voltage applied to the differential amplifiers D1 to D8 and the reference voltage that is actually applied Based on the voltage Vd, the differential amplifier D1
To D8, the differential amplifiers D1 to D1
The failure of D8 can be reliably detected. The differential amplifiers D1 to D8 for applying the reference voltage include the analog switch I
Since the switching is sequentially performed by the C unit 7, the failure diagnosis of all the differential amplifier units D1 to D8 can be performed. Further, the reference voltage used for the failure diagnosis can be set to an arbitrary value by the reference voltage setting unit 6 based on a command from the CPU 10, so that the reference voltage is set in the entire voltage detection range of the differential amplifiers D1 to D8. Diagnosis of faults can be performed.
【００２２】（２）複数のセルを接続して構成される組
電池では、セル電圧を検出することにより、組電池の過
充電および過放電を防止する機能を備えるものが多い。
従って、故障診断に用いる基準電圧をセルの過充電電圧
領域の値、および、過放電電圧領域の値に各々設定して
診断することにより、差動増幅部Ｄ１〜Ｄ８の過充電検
知領域および過放電電圧領域での故障診断を各々行い、
確実に組電池の過充電および過放電を防止することがで
きる。本実施の形態におけるセル電圧検出回路の故障診
断装置のように、１回の故障診断時に基準電圧をセルの
過充電電圧領域の値に設定した後、過放電電圧領域の値
に設定することにより、一度に過充電および過放電検知
領域での故障診断を行うことができる。(2) Many battery packs formed by connecting a plurality of cells have a function of preventing overcharge and overdischarge of the battery pack by detecting a cell voltage.
Therefore, by setting the reference voltage used for failure diagnosis to the value of the overcharge voltage region and the value of the overdischarge voltage region of the cell and performing diagnosis, the overcharge detection region and the overcharge detection region of the differential amplifiers D1 to D8 are determined. Perform each fault diagnosis in the discharge voltage range,
Overcharge and overdischarge of the battery pack can be reliably prevented. By setting the reference voltage to the value of the overcharge voltage region of the cell at the time of one failure diagnosis and setting the value to the value of the overdischarge voltage region as in the failure diagnosis device of the cell voltage detection circuit in the present embodiment. In addition, failure diagnosis in the overcharge and overdischarge detection areas can be performed at one time.
【００２３】（３）差動増幅部Ｄ１〜Ｄ８の故障診断を
行う際には、スイッチＳＷ１〜ＳＷ８をセル電圧回路側
から基準電圧回路側に切り替えることにより、差動増幅
部Ｄ１〜Ｄ８に基準電圧を印加するようにした。これに
より、故障診断時には、容量調整回路Ｅ１〜Ｅ８と差動
増幅部Ｄ１〜Ｄ８とが切り離されるので、セルＣ１〜Ｃ
８の容量調整の有無に関わらず、故障診断を行うことが
できる。すなわち、セルＣ１〜Ｃ８の容量調整を行って
いる時にセル電圧検出回路３（差動増幅部Ｄ１〜Ｄ８）
の故障診断を行う場合でも、容量調整を中断する必要は
ない。(3) When diagnosing failures of the differential amplifiers D1 to D8, the switches SW1 to SW8 are switched from the cell voltage circuit side to the reference voltage circuit side, so that the differential amplifiers D1 to D8 are referenced. A voltage was applied. As a result, at the time of failure diagnosis, the capacity adjustment circuits E1 to E8 and the differential amplifiers D1 to D8 are disconnected, and thus the cells C1 to C8 are disconnected.
The fault diagnosis can be performed regardless of whether the capacity adjustment is performed or not. That is, when the capacity adjustment of the cells C1 to C8 is performed, the cell voltage detection circuit 3 (differential amplifiers D1 to D8)
It is not necessary to interrupt the capacity adjustment even when performing a failure diagnosis of the.
【００２４】（４）従来の故障診断方法のように、組電
池の総電圧ＶＡを検出するとともに、各セル電圧を検出
して加算することにより加算電圧ＶＴを求めて、両電圧
を比較する方法では、いずれのセル電圧検出回路に故障
が生じたかを特定することができない。また、ある一つ
のセル電圧検出回路の検出値がプラス側にずれるととも
に、別のセル電圧検出回路の検出値がマイナス側にずれ
て、加算電圧ＶＴを求めた時に両者のずれ幅が相殺され
る場合には、故障が無いと判定される可能性もある。こ
れに対して、本実施の形態におけるセル電圧検出回路の
故障診断装置では、セル電圧を検出する差動増幅部ごと
に故障診断を行うので、故障が生じた差動増幅部を確実
に特定することができる。また、セル電圧と組電池の総
電圧との電圧サンプリングを考慮する必要もない。(4) A method of detecting the total voltage VA of the assembled battery and detecting and adding each cell voltage to obtain an added voltage VT as in the conventional failure diagnosis method, and comparing the two voltages. In this case, it is impossible to identify which cell voltage detection circuit has failed. Further, the detection value of one cell voltage detection circuit shifts to the plus side, and the detection value of another cell voltage detection circuit shifts to the minus side, so that when the addition voltage VT is obtained, the difference between the two is offset. In such a case, it may be determined that there is no failure. On the other hand, in the failure diagnosis device for the cell voltage detection circuit according to the present embodiment, the failure diagnosis is performed for each differential amplifier that detects the cell voltage, so that the differential amplifier in which the failure has occurred is reliably specified. be able to. Also, there is no need to consider voltage sampling of the cell voltage and the total voltage of the assembled battery.
【００２５】（５）所定の数のセルを接続してモジュー
ルを構成する組電池においては、１つのモジュール内に
含まれる電圧検出回路に基準電圧を印加して、電圧検出
回路の故障診断を行うことも考えられる。すなわち、印
加する基準電圧をモジュールを構成するセル数で割った
値と、電圧検出回路で検出された電圧値とを比較するこ
とにより、故障診断を行う方法である。しかし、この方
法では、セルの過充電検知領域での故障診断を行う際に
は、満充電時のセル電圧にモジュールを構成するセル数
を乗じた電圧を基準電圧として印加する必要があるの
で、コストアップにつながる可能性がある。本実施の形
態のセル電圧検出回路の故障診断装置によれば、セル単
位ごとに基準電圧を印加して故障診断を行うので、上述
したような問題は生じることはない。また、印加する基
準電圧をモジュールを構成するセル数で割った値を基準
値とする方法に比べて、精度良く確実に故障診断を行う
ことができる。(5) In a battery pack comprising a predetermined number of cells connected to form a module, a reference voltage is applied to a voltage detection circuit included in one module to diagnose the voltage detection circuit. It is also possible. In other words, a failure diagnosis is performed by comparing a value obtained by dividing the applied reference voltage by the number of cells constituting the module with a voltage value detected by the voltage detection circuit. However, in this method, when performing a failure diagnosis in the overcharge detection area of the cell, it is necessary to apply a voltage obtained by multiplying the cell voltage at the time of full charge by the number of cells constituting the module as a reference voltage, There is a possibility that the cost will increase. According to the failure diagnosis device for a cell voltage detection circuit of the present embodiment, the failure is diagnosed by applying a reference voltage for each cell, so that the above-described problem does not occur. Further, the failure diagnosis can be performed more accurately and reliably than a method in which a value obtained by dividing the applied reference voltage by the number of cells constituting the module is used as the reference value.
【００２６】本発明は、上述した一実施の形態に限定さ
れることはない。例えば、故障診断時に用いる基準電圧
は、上述した4.3（Ｖ）や2.0（Ｖ）に限定されることは
なく、任意の値を設定することができる。また、上述し
た一実施の形態の説明では、過充電検知領域の故障診断
と過放電検知領域の故障診断を同時に行ったが、別々に
行うこともできる。さらに、本発明が、組電池を構成す
るセル数や、基準電圧を印加する差動増幅部Ｄ１〜Ｄ８
を順次切り替える方法に限定されることもなく、組電池
を使用する製品についても何ら限定されることはない。
本実施の形態におけるセル電圧検出回路の故障診断装置
は、例えば、組電池を走行駆動源とする電気自動車に搭
載することができる。The present invention is not limited to the above embodiment. For example, the reference voltage used at the time of failure diagnosis is not limited to 4.3 (V) or 2.0 (V) described above, but may be set to any value. In the description of the above-described embodiment, the failure diagnosis in the overcharge detection area and the failure diagnosis in the overdischarge detection area are performed at the same time, but may be performed separately. Further, the present invention provides a method for controlling the number of cells constituting a battery pack and the differential amplifiers D1 to D8 for applying a reference voltage.
Are not limited to the method of sequentially switching the battery packs, and the product using the assembled battery is not limited at all.
The failure diagnosis device for a cell voltage detection circuit according to the present embodiment can be mounted, for example, on an electric vehicle using a battery pack as a driving source.
【００２７】特許請求の範囲の構成要素と一実施の形態
の構成要素との対応関係は次の通りである。すなわち、
差動増幅部Ｄ１〜Ｄ８がセル電圧検出回路を、基準電圧
設定部６，アナログスイッチＩＣ部７が基準電圧印加回
路を、基準電圧設定部６が変更部を、アナログスイッチ
ＩＣ部７が印加電圧切替回路を、ＣＰＵ１０が故障診断
回路を、容量調整回路Ｅ１〜Ｅ８が容量調整回路を、ス
イッチＳＷ１〜ＳＷ８が切り離し手段をそれぞれ構成す
る。なお、本発明の特徴的な機能を損なわない限り、各
構成要素は上記構成に限定されるものではない。The correspondence between the components of the claims and the components of the embodiment is as follows. That is,
The differential amplifiers D1 to D8 are a cell voltage detection circuit, the reference voltage setting unit 6 and the analog switch IC unit 7 are a reference voltage application circuit, the reference voltage setting unit 6 is a change unit, and the analog switch IC unit 7 is an applied voltage. The switching circuit, the CPU 10 constitutes a failure diagnosis circuit, the capacitance adjustment circuits E1 to E8 constitute a capacitance adjustment circuit, and the switches SW1 to SW8 constitute disconnection means. Note that each component is not limited to the above configuration as long as the characteristic functions of the present invention are not impaired.
【図１】本発明によるセル電圧検出回路の故障診断装置
の一実施の形態の構成を示す図FIG. 1 is a diagram showing the configuration of an embodiment of a failure diagnosis device for a cell voltage detection circuit according to the present invention.
【図２】セル電圧検出回路の診断時に用いられる基準電
圧印加回路の詳細な構成を示す図FIG. 2 is a diagram showing a detailed configuration of a reference voltage application circuit used for diagnosis of a cell voltage detection circuit.
【図３】ＣＰＵの制御信号Ｉ，Ａ，Ｂ，Ｃの信号レベル
に応じて、いずれのセル間に基準電圧が印加されるかを
示す表FIG. 3 is a table showing which reference voltage is applied between any of the cells according to the signal levels of control signals I, A, B, and C of the CPU;
【図４】本発明によるセル電圧検出回路の故障診断装置
による故障診断制御手順を示す一実施の形態のフローチ
ャートFIG. 4 is a flowchart of an embodiment showing a failure diagnosis control procedure by the failure diagnosis device for the cell voltage detection circuit according to the present invention.
１…組電池、３…セル電圧検出回路、５…切替スイッチ
部、６…基準電圧設定部、７…アナログスイッチＩＣ
部、１０…ＣＰＵ、Ｃ１〜Ｃ８…セル、Ｄ１〜Ｄ８…差
動増幅部、Ｅ１〜Ｅ８…容量調整回路、ＳＷ１〜ＳＷ８
…スイッチDESCRIPTION OF SYMBOLS 1 ... assembled battery, 3 ... cell voltage detection circuit, 5 ... changeover switch part, 6 ... reference voltage setting part, 7 ... analog switch IC
Section, 10: CPU, C1 to C8: cell, D1 to D8: differential amplifier section, E1 to E8: capacity adjustment circuit, SW1 to SW8
…switch
フロントページの続き (72)発明者 森田 剛 神奈川県横浜市神奈川区宝町２番地 日産 自動車株式会社内 (72)発明者 上島 宇貴 神奈川県横浜市神奈川区宝町２番地 日産 自動車株式会社内 Ｆターム(参考） 2G016 CB11 CC01 CC04 CC07 CC12 CC16 CC27 CD04 CD14 5G003 BA03 EA09 GC05 5H030 AA03 AA04 FF43 FF44 Continuation of front page (72) Inventor Takeshi Morita Nissan 2, Takaracho, Kanagawa-ku, Yokohama, Kanagawa Automobile Co., Ltd. (72) Inventor Uki Ueshima Nissan 2, Takaracho, Kanagawa-ku, Yokohama, Kanagawa Automobile Co., Ltd. F-term (reference) 2G016 CB11 CC01 CC04 CC07 CC12 CC16 CC27 CD04 CD14 5G003 BA03 EA09 GC05 5H030 AA03 AA04 FF43 FF44
Claims (8)
れて、対応するセルのセル電圧を検出するセル電圧検出
回路と、 前記セル電圧検出回路に基準電圧を印加する基準電圧印
加回路と、 前記基準電圧を印加する前記セル電圧検出回路を切り替
える印加電圧切替回路と、 前記印加された基準電圧を前記セル電圧検出回路にて検
出された検出電圧と、前記印加された基準電圧とに基づ
いて、前記セル電圧検出回路の故障診断を行う故障診断
回路とを備えることを特徴とするセル電圧検出回路の故
障診断装置。1. A cell voltage detection circuit provided for each of a plurality of cells constituting a battery pack and detecting a cell voltage of a corresponding cell, a reference voltage application circuit for applying a reference voltage to the cell voltage detection circuit An applied voltage switching circuit that switches the cell voltage detection circuit that applies the reference voltage; a detection voltage detected by the cell voltage detection circuit based on the applied reference voltage; and an applied voltage based on the applied reference voltage. A failure diagnosis circuit for performing a failure diagnosis of the cell voltage detection circuit.
診断装置において、 前記基準電圧印加回路は、前記印加する基準電圧を変更
する変更部を有することを特徴とするセル電圧検出回路
の故障診断装置。2. The failure diagnosis apparatus for a cell voltage detection circuit according to claim 1, wherein said reference voltage application circuit has a changing unit for changing said applied reference voltage. Failure diagnosis device.
路の故障診断装置において、 前記基準電圧は、前記セルの過充電電圧領域の値である
ことを特徴とするセル電圧検出回路の故障診断装置。3. The failure diagnosis device for a cell voltage detection circuit according to claim 1, wherein the reference voltage is a value in an overcharge voltage region of the cell. Diagnostic device.
路の故障診断装置において、 前記基準電圧は、前記セルの過放電電圧領域の値である
ことを特徴とするセル電圧検出回路の故障診断装置。4. The failure diagnosis device for a cell voltage detection circuit according to claim 1, wherein the reference voltage is a value in an overdischarge voltage region of the cell. Diagnostic device.
路の故障診断装置において、 前記基準電圧印加回路は、前記セルの過充電電圧領域の
値および前記セルの過放電電圧領域の値をそれぞれ基準
電圧として印加し、 前記故障診断回路は、前記印加される基準電圧を用いて
一度に過充電検知領域および過放電検知領域の故障診断
を行うことを特徴とするセル電圧検出回路の故障診断装
置。5. The failure diagnosis device for a cell voltage detection circuit according to claim 1, wherein the reference voltage application circuit is configured to determine a value of an overcharge voltage region of the cell and a value of an overdischarge voltage region of the cell. Each of which is applied as a reference voltage, wherein the failure diagnosis circuit performs failure diagnosis of the overcharge detection area and the overdischarge detection area at a time using the applied reference voltage. apparatus.
検出回路の故障診断装置において、 前記複数のセルごとに設けられて、対応するセルの容量
調整を行う容量調整回路と、 前記容量調整回路と前記セル電圧検出回路とを切り離す
切り離し手段とをさらに備え、 前記切り離し手段は、前記基準電圧印加回路により前記
セル電圧検出回路に前記基準電圧を印加する時は、前記
容量調整回路と前記セル電圧検出回路とを切り離すこと
を特徴とするセル電圧検出回路の故障診断装置。6. The failure diagnosis device for a cell voltage detection circuit according to claim 1, wherein a capacitance adjustment circuit is provided for each of the plurality of cells and adjusts a capacitance of a corresponding cell. The cell voltage detecting circuit further includes a disconnecting unit that disconnects the cell voltage detecting circuit.The disconnecting unit includes, when applying the reference voltage to the cell voltage detecting circuit by the reference voltage applying circuit, the capacitance adjusting circuit. A failure diagnosis device for a cell voltage detection circuit, wherein the failure diagnosis device is separated from the cell voltage detection circuit.
検出回路の故障診断装置において、 前記故障診断回路は、前記印加された基準電圧を前記セ
ル電圧検出回路にて検出された検出電圧と、前記印加さ
れた基準電圧との差が所定の範囲外であるときに、前記
セル電圧検出回路に故障が発生したと判定することを特
徴とするセル電圧検出回路の故障診断装置。7. The failure diagnosis device for a cell voltage detection circuit according to claim 1, wherein said failure diagnosis circuit detects said applied reference voltage by said cell voltage detection circuit. A failure diagnosis device for a cell voltage detection circuit, wherein it is determined that a failure has occurred in the cell voltage detection circuit when a difference between a voltage and the applied reference voltage is outside a predetermined range.
れて、対応するセルのセル電圧を検出するセル電圧検出
回路の故障診断を行うセル電圧検出回路の故障診断方法
は、 前記セル電圧検出回路に基準電圧を印加し、 前記印加された基準電圧を前記セル電圧検出回路にて検
出し、 前記印加された基準電圧を前記セル電圧検出回路にて検
出された検出電圧と、実際に印加された基準電圧とに基
づいて、前記セル電圧検出回路の故障診断を行うことを
特徴とするセル電圧検出回路の故障診断方法。8. A failure diagnosis method for a cell voltage detection circuit provided for each of a plurality of cells constituting a battery pack and performing a failure diagnosis of a cell voltage detection circuit for detecting a cell voltage of a corresponding cell, comprising: A reference voltage is applied to a detection circuit, the applied reference voltage is detected by the cell voltage detection circuit, and the applied reference voltage is actually applied to a detection voltage detected by the cell voltage detection circuit. A failure diagnosis of the cell voltage detection circuit based on the obtained reference voltage.
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| JP2002152400A JP3780977B2 (en) | 2002-05-27 | 2002-05-27 | Failure diagnosis device and failure diagnosis method for cell voltage detection circuit |
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