JP2003247955A5 - - Google Patents
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- JP2003247955A5 JP2003247955A5 JP2002051778A JP2002051778A JP2003247955A5 JP 2003247955 A5 JP2003247955 A5 JP 2003247955A5 JP 2002051778 A JP2002051778 A JP 2002051778A JP 2002051778 A JP2002051778 A JP 2002051778A JP 2003247955 A5 JP2003247955 A5 JP 2003247955A5
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- 238000001514 detection method Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 1
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002051778A JP3871944B2 (ja) | 2002-02-27 | 2002-02-27 | 外観検査装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002051778A JP3871944B2 (ja) | 2002-02-27 | 2002-02-27 | 外観検査装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2003247955A JP2003247955A (ja) | 2003-09-05 |
JP2003247955A5 true JP2003247955A5 (enrdf_load_stackoverflow) | 2005-04-07 |
JP3871944B2 JP3871944B2 (ja) | 2007-01-24 |
Family
ID=28663668
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2002051778A Expired - Fee Related JP3871944B2 (ja) | 2002-02-27 | 2002-02-27 | 外観検査装置 |
Country Status (1)
Country | Link |
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JP (1) | JP3871944B2 (enrdf_load_stackoverflow) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4252381B2 (ja) * | 2003-07-03 | 2009-04-08 | 株式会社ジェイテクト | 外観検査装置 |
JP5506359B2 (ja) * | 2009-12-11 | 2014-05-28 | 三菱重工業株式会社 | き裂検査装置及びき裂解析装置、方法、並びにプログラム |
JP5501998B2 (ja) * | 2011-03-08 | 2014-05-28 | Ntn株式会社 | 検査装置および検査方法 |
KR101272939B1 (ko) | 2011-07-07 | 2013-06-11 | 현대자동차주식회사 | 자기 영상 검사장치 |
CN105352916B (zh) * | 2015-11-27 | 2018-04-17 | 江苏理工学院 | 基于激光衍射的细纱机罗拉表面质量检测装置及工作方法 |
CN106093060A (zh) * | 2016-08-25 | 2016-11-09 | 成都贝森伟任科技有限责任公司 | 一种圆柱体制品外观检测系统 |
CN110174407B (zh) * | 2019-06-05 | 2020-12-15 | 江南大学 | 一种基于机器视觉的钢筘质量检测装置 |
JP6830716B1 (ja) * | 2020-12-01 | 2021-02-17 | 和光技研工業有限会社 | 外面検査装置 |
CN113777042B (zh) * | 2021-09-17 | 2024-07-05 | 宁波星帆信息科技有限公司 | 轴类产品的视觉检测装置 |
CN115615998B (zh) * | 2022-12-13 | 2023-04-07 | 浙江工业大学 | 一种圆形磁芯侧面缺陷检测装置及其方法 |
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2002
- 2002-02-27 JP JP2002051778A patent/JP3871944B2/ja not_active Expired - Fee Related
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