JP2003207406A - Semiconductor sensor device - Google Patents

Semiconductor sensor device

Info

Publication number
JP2003207406A
JP2003207406A JP2002004075A JP2002004075A JP2003207406A JP 2003207406 A JP2003207406 A JP 2003207406A JP 2002004075 A JP2002004075 A JP 2002004075A JP 2002004075 A JP2002004075 A JP 2002004075A JP 2003207406 A JP2003207406 A JP 2003207406A
Authority
JP
Japan
Prior art keywords
temperature
semiconductor sensor
pressure
circuit board
base plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2002004075A
Other languages
Japanese (ja)
Other versions
JP4244372B2 (en
Inventor
Shuji Sato
修治 佐藤
Shigeki Koide
茂樹 小出
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Seiki Co Ltd
Original Assignee
Nippon Seiki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Seiki Co Ltd filed Critical Nippon Seiki Co Ltd
Priority to JP2002004075A priority Critical patent/JP4244372B2/en
Publication of JP2003207406A publication Critical patent/JP2003207406A/en
Application granted granted Critical
Publication of JP4244372B2 publication Critical patent/JP4244372B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

<P>PROBLEM TO BE SOLVED: To provide a semiconductor sensor device with improved detection precision of temperature by further improving linearity in a temperature-voltage characteristics which represents relationship between temperature and output voltage. <P>SOLUTION: A pressure guiding part 1a comprises a pressure guiding hole 1c to guide in a fluid. A base plate 3 is provided with; a hole 3c to transmit the pressure and temperature of the fluid to a semiconductor sensor 4; and a mounting part 3b on which the semiconductor sensor 4 is disposed. By bonding a flange part 3a extended from the mounting part 3b to the pressure guiding part 1a, one end of the pressure guiding hole 1c is closed. A circuit board 5 is disposed on the base plate 3, and comprises a housing hole 5a to house the semiconductor sensor 4 with which the board 5 is electrically connected. A constant current source circuit 20 supplies a prescribed constant current to a bridge circuit 21. A temperature characteristics adjusting means 20g adjusts temperature characteristics, and is so disposed on the circuit board 5 as to be close to the base plate 3. <P>COPYRIGHT: (C)2003,JPO

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、半導体基板上にピ
エゾ抵抗効果を有する感圧素子を形成し、前記感圧素子
を用いてブリッジ回路を構成する半導体センサを用いた
半導体センサ装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor sensor device using a semiconductor sensor in which a pressure sensitive element having a piezoresistive effect is formed on a semiconductor substrate and a bridge circuit is formed by using the pressure sensitive element. is there.

【0002】[0002]

【従来の技術】半導体センサ装置としては、シリコン等
の半導体基板に薄肉のダイアフラム部を形成し、前記ダ
イアフラム部にピエゾ抵抗効果を有する圧力検出用の圧
感素子をブリッジ状に構成してなる半導体式圧力センサ
(半導体センサ)を、下ケースに備えられる圧力導入ポ
ートの上端部にベース板を介し配設するとともに、前記
圧力センサと回路基板とをワイヤボンディングによって
電気的に接続し、前記回路基板を介して前記圧力センサ
への電源供給及び前記圧力センサからの信号出力を行う
ためのリードピンを備えた上ケースによって前記圧力セ
ンサ及び前記回路基板を覆ってなる圧力検出装置があ
る。
2. Description of the Related Art A semiconductor sensor device is a semiconductor type device in which a thin diaphragm portion is formed on a semiconductor substrate made of silicon or the like, and a pressure detecting element having a piezoresistive effect is formed in a bridge shape on the diaphragm portion. A pressure sensor (semiconductor sensor) is arranged on the upper end of a pressure introduction port provided in the lower case via a base plate, and the pressure sensor and the circuit board are electrically connected by wire bonding to connect the circuit board. There is a pressure detection device in which the pressure sensor and the circuit board are covered by an upper case having a lead pin for supplying power to the pressure sensor and outputting a signal from the pressure sensor via the pressure sensor.

【0003】このような圧力検出装置は、例えば車両の
エンジンを被測定物とすることがある。エンジンを被測
定物とすると、エンジンオイルの圧力(以下、油圧とい
う)のみならず前記エンジンオイルの温度(以下、油温
という)を検出することが可能な圧力温度検出装置が望
まれており、このような圧力温度検出装置としては、特
開平11−72402号公報に開示されるものがある。
In such a pressure detecting device, for example, an engine of a vehicle may be an object to be measured. When the engine is the object to be measured, there is a demand for a pressure temperature detection device capable of detecting not only the pressure of engine oil (hereinafter referred to as oil pressure) but also the temperature of the engine oil (hereinafter referred to as oil temperature). An example of such a pressure temperature detecting device is disclosed in Japanese Patent Laid-Open No. 11-72402.

【0004】かかる圧力温度検出装置は、サーミスタ等
の温度検出手段を前記油温が検出できるように圧力セン
サを配設するケース内に配設し、前記圧力センサ及び前
記温度検出手段を単一のケース内に配設することで、異
なる被測定対象(油圧及び油温)を検出することが可能
となる。
In such a pressure temperature detecting device, a temperature detecting means such as a thermistor is arranged in a case in which a pressure sensor is arranged so that the oil temperature can be detected, and the pressure sensor and the temperature detecting means are combined into a single unit. By disposing it in the case, it becomes possible to detect different objects to be measured (oil pressure and oil temperature).

【0005】しかしながら、単一の被測定物から異なる
被測定対象を検出する前記圧力温度検出装置において、
前記装置の前記エンジンへの取付は簡素化されるもの
の、前記圧力センサと前記温度検出手段とをそれぞれ前
記ケース内に配設することから、圧力温度検出装置とし
ての構造が複雑になるばかりでなく、構成部品が多くな
ることから装置が大型化してしまうといった問題点を有
していた。
However, in the pressure-temperature detection device for detecting different objects to be measured from a single object to be measured,
Although the mounting of the device to the engine is simplified, since the pressure sensor and the temperature detecting means are respectively arranged in the case, not only the structure as the pressure temperature detecting device becomes complicated, but also However, there is a problem that the device becomes large due to the large number of constituent parts.

【0006】そこで、本願出願人は、構造を複雑にする
ことなく簡単な構成で圧力と温度とを検出することが可
能な半導体センサ装置を特願2001−185737号
で提案している。かかる半導体センサ装置は、半導体基
板上にピエゾ抵抗効果を有する感圧素子を形成し、前記
感圧素子を用いてブリッジ回路を構成するとともに、薄
肉のダイアフラム部を有する半導体センサと、前記半導
体センサと電気的に接続する回路基板とを備え、前記回
路基板に、単一の前記半導体センサからの出力に基づい
て圧力に関する第一の検出信号と温度に関する第二の検
出信号とを出力する第一,第二の出力部を備えてなるも
のである。
Therefore, the applicant of the present application has proposed, in Japanese Patent Application No. 2001-185737, a semiconductor sensor device capable of detecting pressure and temperature with a simple structure without complicating the structure. In such a semiconductor sensor device, a pressure-sensitive element having a piezoresistive effect is formed on a semiconductor substrate, a bridge circuit is formed by using the pressure-sensitive element, and a semiconductor sensor having a thin diaphragm portion, and the semiconductor sensor, A circuit board electrically connected to the circuit board, and outputs a first detection signal relating to pressure and a second detection signal relating to temperature to the circuit board based on an output from a single semiconductor sensor; It comprises a second output section.

【0007】[0007]

【発明が解決しようとする課題】しかしながら、前記半
導体センサ装置は、温度と出力電圧との関係を示す出力
電圧特性T1に、図9の実線で示すような、検出温度範
囲(−40℃〜125℃)の中間で出力電圧が低くなる
非線形性があり、検出される温度に若干の誤差が生じる
虞があるため、前記出力電圧特性T1を図9の点線で示
すような線形の出力電圧特性T2とするべき改善が望ま
れている。
However, in the semiconductor sensor device, the output voltage characteristic T1 showing the relationship between the temperature and the output voltage has a detection temperature range (-40 ° C. to 125 ° C.) as shown by the solid line in FIG. Since there is a non-linearity in which the output voltage decreases in the middle of the temperature range (° C.), And a slight error may occur in the detected temperature, the output voltage characteristic T1 is a linear output voltage characteristic T2 as shown by the dotted line in FIG. Improvements that should be made are desired.

【0008】本発明は、前述した課題に着目し、構造を
複雑にすることなく簡単な構成で圧力と温度とを検出す
ることができ、且つ、温度と出力電圧との関係を示す出
力電圧特性を更に線形にすることで温度の検出精度を向
上させることが可能な半導体センサ装置を提供するもの
である。
In view of the above-mentioned problems, the present invention is capable of detecting pressure and temperature with a simple structure without complicating the structure, and an output voltage characteristic showing a relationship between temperature and output voltage. The present invention provides a semiconductor sensor device capable of improving the temperature detection accuracy by further linearizing.

【0009】[0009]

【課題を解決するための手段】本発明は、前記課題を解
決するため、請求項1に記載の半導体センサ装置のよう
に、半導体基板上にピエゾ抵抗効果を有する感圧素子を
形成し、前記感圧素子を用いてブリッジ回路を構成する
とともに、薄肉のダイアフラム部を有する単一の半導体
センサによって流体の圧力に関する第一の検出信号と前
記流体の温度に関する第二の検出信号とを得る半導体セ
ンサ装置であって、前記流体を導入するため導入口を備
えた圧力導入部と、前記半導体センサに前記流体の圧力
及び温度を伝達するための穴部が設けられ前記半導体セ
ンサを配設する載置部を備え、前記載置部から延設され
た鍔部を前記圧力導入部に接合することで前記導入口の
一端を塞ぐ状態で配設されるベース板と、前記ベース板
上に位置し、前記半導体センサを収納する収納穴部を備
えるとともに、前記半導体センサと電気的に接続される
回路基板と、前記回路基板に備えられ、前記ブリッジ回
路に所定の定電流を供給する定電流源回路と、前記第2
の検出信号の温度特性を調整するとともに、前記ベース
板の近傍に位置する状態で前記回路基板に配設される温
度特性調整手段と、を備えてなるものである。
In order to solve the above problems, the present invention forms a pressure sensitive element having a piezoresistive effect on a semiconductor substrate as in the semiconductor sensor device according to claim 1, A semiconductor sensor that forms a bridge circuit using a pressure-sensitive element and obtains a first detection signal related to the pressure of a fluid and a second detection signal related to the temperature of the fluid by a single semiconductor sensor having a thin diaphragm portion. An apparatus for mounting a semiconductor sensor, the pressure sensor having an inlet for introducing the fluid, and a hole for transmitting the pressure and temperature of the fluid to the semiconductor sensor. A base plate disposed in a state of closing one end of the introduction port by joining a flange portion extended from the mounting portion to the pressure introduction portion, and is located on the base plate, The above A circuit board having a housing hole for housing a conductor sensor and electrically connected to the semiconductor sensor, a constant current source circuit provided on the circuit board and supplying a predetermined constant current to the bridge circuit, The second
In addition to adjusting the temperature characteristic of the detection signal, the temperature characteristic adjusting means is disposed on the circuit board in a state of being located in the vicinity of the base plate.

【0010】また、班発明は、請求項2に記載の半導体
センサ装置のように、前記温度特性調整手段は、少なく
ともサーミスタと正温度係数抵抗とを有するものであ
る。
According to the invention of claim 2, like the semiconductor sensor device according to claim 2, the temperature characteristic adjusting means has at least a thermistor and a positive temperature coefficient resistor.

【0011】また、本発明は、請求項3に記載の半導体
センサ装置のように、前記温度特性調整手段は、前記回
路基板の前記鍔部に対向する位置に配設されてなるもの
である。
Further, according to the present invention, as in the semiconductor sensor device according to the third aspect, the temperature characteristic adjusting means is arranged at a position facing the flange portion of the circuit board.

【0012】また、本発明は、請求項4に記載の半導体
センサ装置のように、前記鍔部と前記温度特性調整手段
との間に熱伝達部材を配設してなるものである。
Further, according to the present invention, as in a semiconductor sensor device according to a fourth aspect, a heat transfer member is arranged between the collar portion and the temperature characteristic adjusting means.

【0013】また、本発明は、請求項5に記載の半導体
センサ装置のように、前記載置部は、前記鍔部に対して
少なくとも一段高くなる位置に設けられてなるものであ
る。
Further, according to the present invention, as in the semiconductor sensor device according to a fifth aspect, the mounting portion is provided at a position higher than the collar portion by at least one step.

【0014】[0014]

【発明の実施の形態】以下、本発明の実施の形態を添付
図面に基づき説明する。
BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the present invention will be described below with reference to the accompanying drawings.

【0015】図1において、半導体センサ装置としての
圧力温度検出装置Aは、下ケース1と、上ケース2と、
ベース板3と、半導体センサ4と、回路基板5と、シー
ルド板6と、グロメット7とから主に構成されている。
In FIG. 1, a pressure / temperature detecting device A as a semiconductor sensor device comprises a lower case 1, an upper case 2,
It is mainly composed of a base plate 3, a semiconductor sensor 4, a circuit board 5, a shield plate 6, and a grommet 7.

【0016】下ケース1は、SUM等の金属材料からな
る取付ねじ部を有する六角部材である圧力導入部1a
と、PBT等の樹脂材料からなるフランジ部1bとを備
え、圧力導入部1aとフランジ部1bとはインサート成
形によって一体的に構成される。また圧力導入部1aの
略中央には、圧力導入穴(導入口)1cが形成されてい
る。
The lower case 1 is a pressure introducing portion 1a which is a hexagonal member having a mounting screw portion made of a metal material such as SUM.
And a flange portion 1b made of a resin material such as PBT, and the pressure introducing portion 1a and the flange portion 1b are integrally formed by insert molding. A pressure introducing hole (introducing port) 1c is formed substantially in the center of the pressure introducing portion 1a.

【0017】上ケース2は、PBT等の樹脂材料から形
成され、上ケース2の開口端部を下ケース1のフランジ
部1bに対して熱加締めすることによって配設固定さ
れ、ベース板3,半導体センサ4,回路基板5等を収納
する。また、上ケース2は、後述する電極リードを介し
て電源供給及び信号出力を行うためのコネクタ部2aを
備えている。
The upper case 2 is made of a resin material such as PBT, and is fixedly arranged by thermally crimping the open end of the upper case 2 to the flange portion 1b of the lower case 1, and the base plate 3, The semiconductor sensor 4, the circuit board 5, etc. are housed. Further, the upper case 2 is provided with a connector portion 2a for supplying power and outputting signals via electrode leads described later.

【0018】ベース板3は、コバール等の金属材料から
構成され、下ケース1における圧力導入部1aの上端部
に抵抗溶接によって配設固定するためのフランジ部(鍔
部)3aが設けられ、このフランジ部3aから一段高く
なった位置には、圧力センサ4を配設するための載置部
3bが設けられている。また載置部3bの略中央には、
半導体センサ4に被測定物の圧力及び温度を伝達するた
めの穴部3cが設けられている。ベース板3は、圧力導
入部1aの上端部に抵抗溶接によって配設固定されるこ
とで、圧力導入穴1cの一端を塞ぐ状態で下ケース1に
配設されることになる。
The base plate 3 is made of a metal material such as Kovar, and is provided with a flange portion (flange portion) 3a for disposing and fixing the pressure introducing portion 1a in the lower case 1 by resistance welding. A mounting portion 3b for disposing the pressure sensor 4 is provided at a position higher than the flange portion 3a. Further, in the substantial center of the mounting portion 3b,
The semiconductor sensor 4 is provided with a hole 3c for transmitting the pressure and temperature of the object to be measured. The base plate 3 is disposed and fixed to the upper end portion of the pressure introducing portion 1a by resistance welding, so that the base plate 3 is disposed in the lower case 1 in a state of closing one end of the pressure introducing hole 1c.

【0019】尚、ベース板3におけるフランジ部3a
は、圧力導入部1aに抵抗溶接できる構成であれば単な
る段差形状であっても良い。
The flange portion 3a of the base plate 3
May have a simple step shape as long as it can be resistance-welded to the pressure introducing portion 1a.

【0020】半導体センサ4は、シリコン等の半導体基
板に薄肉部となるダイアフラム部を形成する半導体チッ
プ4aをガラス基板4b上に配設し、半導体チップ4a
とガラス台座4cとを陽極接合法によって接合してなる
ものである。半導体センサ4は、前記ダイアフラム部に
対応する部位にボロン等の不純物を拡散処理することに
よって、ピエゾ抵抗効果を有する4つの感圧素子となる
抵抗を形成し、この各抵抗をアルミ等の導電性材料を用
いた配線パターンによって接続することで後で詳述する
ブリッジ回路が構成される。
In the semiconductor sensor 4, a semiconductor chip 4a forming a thin diaphragm portion is provided on a glass substrate 4b on a semiconductor substrate made of silicon or the like, and the semiconductor chip 4a is formed.
And the glass pedestal 4c are joined by an anodic joining method. The semiconductor sensor 4 diffuses impurities such as boron in a portion corresponding to the diaphragm portion to form resistors which become four pressure sensitive elements having a piezoresistive effect, and these resistors are made of a conductive material such as aluminum. A bridge circuit, which will be described in detail later, is configured by connecting with a wiring pattern using a material.

【0021】尚、半導体センサ4は、ガラス基板4bの
裏面側にメタライズ層を形成するとともに、半田を介し
てベース板3と接合する。
The semiconductor sensor 4 has a metallized layer formed on the back surface of the glass substrate 4b and is joined to the base plate 3 via solder.

【0022】回路基板5は、紙フェノール,ガラス繊維
入り樹脂及びセラミック等の絶縁材料を支持材とし、後
述する回路構成を得るための所定の配線パターンが表裏
に形成されてなる両面印刷回路基板であり、ベース板3
上に位置するように下ケース1のフランジ部1bの上方
に設けられる載置部1dに配設される。回路基板5は、
後で詳述する回路構成の構成部品である各種電子部品
(半導体センサ4の出力電圧を増幅するための増幅回路
やノイズを除去するためのコンデンサ等)が実装され
る。
The circuit board 5 is a double-sided printed circuit board in which an insulating material such as paper phenol, resin containing glass fiber, and ceramics is used as a supporting material, and predetermined wiring patterns for obtaining a circuit configuration described later are formed on the front and back surfaces. Yes, base plate 3
The mounting portion 1d is provided above the flange portion 1b of the lower case 1 so as to be located above. The circuit board 5
Various electronic components (amplification circuit for amplifying the output voltage of the semiconductor sensor 4, a capacitor for removing noise, etc.), which are components of a circuit configuration described in detail later, are mounted.

【0023】また、回路基板5は、周縁部が下ケース1
の載置部1dに支持される配設構造であって、回路基板
5の略中央には、ベース板3の載置部3bに配設される
半導体センサ4の上方から回路基板5を下ケース1の載
置部1dに配設した際に、回路基板5が半導体センサ4
を取り巻くように配設するための収納穴部5aが形成さ
れている。
In addition, the circuit board 5 has a peripheral portion of the lower case 1
The mounting structure is supported by the mounting portion 1d of the circuit board 5, and the circuit board 5 is arranged in the lower case from above the semiconductor sensor 4 disposed on the mounting portion 3b of the base plate 3 in the approximate center of the circuit board 5. When the circuit board 5 is mounted on the mounting portion 1d of the semiconductor sensor 4 of FIG.
A storage hole portion 5a for arranging so as to surround is formed.

【0024】また、回路基板5の表面の収納穴部5aの
周辺には、複数の電極部が形成され、この電極部と半導
体センサ4に形成される電極パッド(電極部)とは金等
の導電材料からなるワイヤ8によって電気的に接続され
る。また、回路基板5の裏面の収納穴部5aの周辺に
は、圧力温度検出装置Aにおける温度と出力電圧との関
係を示す線形的な出力電圧特性T2(図9参照)にする
べく後で詳述する温度特性調整手段をベース板3の近傍
に配設するための半田付けランド及び配線パターンが形
成されている。
A plurality of electrode portions are formed around the storage hole portion 5a on the surface of the circuit board 5, and the electrode portions and the electrode pads (electrode portions) formed on the semiconductor sensor 4 are made of gold or the like. It is electrically connected by a wire 8 made of a conductive material. Further, in the vicinity of the storage hole 5a on the back surface of the circuit board 5, a detailed output voltage characteristic T2 (see FIG. 9) showing the relationship between the temperature and the output voltage in the pressure temperature detection device A will be described later in detail. Soldering lands and wiring patterns for arranging the above-mentioned temperature characteristic adjusting means near the base plate 3 are formed.

【0025】また、回路基板5には、上ケース2のコネ
クタ部2aにグロメット7を介して配設される電極リー
ド9とリードピン付き貫通コンデンサ10を介し電気的
に接続するリードピン11が実装されている。
On the circuit board 5, there are mounted lead pins 11 which are electrically connected to the connector lead 2a of the upper case 2 via the grommet 7 and the lead-through capacitor 10 with lead pins. There is.

【0026】シールド板6は、SPTE等の金属材料か
らなり、ホルダ部6aと、下ケース1と上ケース2との
間に狭持状態にて配設するためのフランジ部6bとが設
けられている。
The shield plate 6 is made of a metal material such as SPTE, and is provided with a holder portion 6a and a flange portion 6b to be sandwiched between the lower case 1 and the upper case 2. There is.

【0027】ホルダ部6aは、グロメット7の載置面よ
りも一段高くなる位置に設けられ、貫通コンデンサ10
を配設するための配設部6cが形成されるとともに、こ
の配設部6cには、複数の孔部が形成され、この各孔部
に各貫通コンデンサ10が半田を介し配設固定される。
The holder portion 6a is provided at a position one step higher than the mounting surface of the grommet 7, and the through capacitor 10 is provided.
Is formed, and a plurality of holes are formed in the arrangement part 6c, and the feedthrough capacitors 10 are arranged and fixed in the holes by soldering. .

【0028】グロメット7は、ニトリルゴム等の弾性部
材によって構成され、電極リード9がインサート形成さ
れてなる。グロメット7は、上ケース2のコネクタ部2
aに設けられる凹部2bに設けられた穴部2cに電極リ
ード9を挿通させるとともに、グロメット7を凹部2b
に嵌め込むことで、シールド板6のホルダ部6aから一
段低くなった前記載置面に配設される。
The grommet 7 is made of an elastic material such as nitrile rubber, and the electrode leads 9 are insert-formed. The grommet 7 is the connector portion 2 of the upper case 2.
The electrode lead 9 is inserted into the hole 2c provided in the recess 2b provided in the a, and the grommet 7 is provided in the recess 2b.
By being fitted into the holder plate 6a of the shield plate 6, the shield plate 6 is disposed on the mounting surface which is lower than the holder portion 6a.

【0029】グロメット7にインサート成形される電極
リード9は、半導体センサ4への電源供給と半導体セン
サ4からの後述する圧力及び温度に関する検出信号を外
部に伝達するものである。
The electrode lead 9 which is insert-molded in the grommet 7 is for supplying power to the semiconductor sensor 4 and a detection signal from the semiconductor sensor 4 regarding pressure and temperature described later to the outside.

【0030】以上の各部によって圧力温度検出装置Aが
構成される。次に図2を用いて、圧力温度検出装置Aの
回路構成について説明する。圧力温度検出装置Aの回路
構成は、定電流源回路20と、ブリッジ回路21と、圧
力検出増幅回路22と、温度検出増幅回路23とを有す
るもので、ブリッジ回路21以外の各回路は回路基板5
上で構成される。
A pressure temperature detecting device A is constituted by the above-mentioned respective parts. Next, the circuit configuration of the pressure temperature detection device A will be described with reference to FIG. The circuit configuration of the pressure temperature detection device A includes a constant current source circuit 20, a bridge circuit 21, a pressure detection amplification circuit 22, and a temperature detection amplification circuit 23. Each circuit other than the bridge circuit 21 is a circuit board. 5
Composed on.

【0031】定電流源回路20は、定電流源調整用抵抗
20aと、演算増幅器20bと、正温度係数調整用抵抗
20c,正温度係数抵抗20d,サーミスタ20e及び
サーミスタ特性調整用抵抗20fを有する温度特性調整
手段20gとで構成され、ブリッジ回路21へ所定の定
電流を供給する。なお、正温度係数抵抗20dは、温度
が高くなるに従って線形的に抵抗値が大きくなる特性を
もつ抵抗である。
The constant current source circuit 20 includes a constant current source adjusting resistor 20a, an operational amplifier 20b, a positive temperature coefficient adjusting resistor 20c, a positive temperature coefficient resistor 20d, a thermistor 20e and a thermistor characteristic adjusting resistor 20f. It is composed of the characteristic adjusting means 20g and supplies a predetermined constant current to the bridge circuit 21. The positive temperature coefficient resistor 20d is a resistor having a characteristic that the resistance value increases linearly as the temperature rises.

【0032】温度特性調整手段20gは、電源Vccに
対して直列に接続されたサーミスタ20e,正温度係数
抵抗20d及び正温度係数調整用抵抗20cと、サーミ
スタ20eに対して並列接続されたサーミスタ特性調整
用抵抗20fとからなるものである。
The temperature characteristic adjusting means 20g includes a thermistor 20e, a positive temperature coefficient resistor 20d and a positive temperature coefficient adjusting resistor 20c which are connected in series to the power source Vcc, and a thermistor characteristic adjustment which is connected in parallel to the thermistor 20e. Resistor 20f for use.

【0033】ブリッジ回路21は、半導体センサ4のダ
イアフラム部上に形成される4つの感圧素子である抵抗
Ra,Rb,Rc,Rdから形成される。ブリッジ回路
21において、直列接続される第一抵抗群Ra,Rb及
び第二抵抗群Rc,Rdからそれぞれ引き出された中間
電圧va,vbは、圧力検出増幅回路22へ供給され
る。
The bridge circuit 21 is composed of four pressure sensitive elements Ra, Rb, Rc and Rd which are formed on the diaphragm portion of the semiconductor sensor 4. In the bridge circuit 21, the intermediate voltages va and vb respectively drawn from the first resistance group Ra and Rb and the second resistance group Rc and Rd connected in series are supplied to the pressure detection amplification circuit 22.

【0034】圧力検出増幅回路22は、入力インピーダ
ンスの影響の少ない増幅回路によって構成されるもの
で、図3で示す圧力と出力電圧V1との関係を示す圧力
−電圧特性である第一の出力電圧特性T3のゲイン調整
を行うためのゲイン調整用抵抗22a、第一の出力電圧
特性T3のオフセット調整を行うためのオフセット電圧
調整用抵抗22b、ブリッジ回路21における中間電圧
va,vbをそれぞれ入力する第一,第二の演算増幅器
22c,22d等から構成される。圧力検出増幅回路2
2は、中間電圧v1,v2を入力すると中間電圧v1,
v2の差分を増幅して出力電圧(第一の検出信号)V1
として出力し圧力検出するものである。
The pressure detecting / amplifying circuit 22 is composed of an amplifying circuit which is less influenced by the input impedance, and has a first output voltage which is a pressure-voltage characteristic showing the relationship between the pressure and the output voltage V1 shown in FIG. A gain adjusting resistor 22a for performing the gain adjustment of the characteristic T3, an offset voltage adjusting resistor 22b for performing the offset adjustment of the first output voltage characteristic T3, and intermediate voltages va and vb in the bridge circuit 21 are input respectively. It is composed of first and second operational amplifiers 22c and 22d. Pressure detection amplifier circuit 2
2 receives the intermediate voltages v1 and v2, the intermediate voltages v1 and
Amplify the difference between v2 and output voltage (first detection signal) V1
Is output and pressure is detected.

【0035】温度検出増幅回路23は、ブリッジ回路2
1の両端電圧vcを増幅して出力電圧(第二の検出信
号)V2として取り出すものであって、図4で示す温度
と出力電圧V2との関係を示す温度−電圧特性である第
二の出力電圧特性T4の傾きの調整であるゲイン調整を
行うためのゲイン調整用抵抗23a、第二の出力電圧特
性T4のオフセット調整を行うためのオフセット電圧調
整用抵抗23b、ブリッジ回路21における両端電圧v
cを入力するとともに、所定の倍率によって増幅する演
算増幅器23c等から構成される。
The temperature detecting / amplifying circuit 23 is a bridge circuit 2
The second output, which is a temperature-voltage characteristic showing the relationship between the temperature and the output voltage V2 shown in FIG. 4, is obtained by amplifying the voltage vc between both ends of 1 and extracting as the output voltage (second detection signal) V2. A gain adjusting resistor 23a for performing a gain adjustment for adjusting the slope of the voltage characteristic T4, an offset voltage adjusting resistor 23b for performing an offset adjustment of the second output voltage characteristic T4, and a voltage v across the bridge circuit 21.
It is composed of an operational amplifier 23c and the like which inputs c and amplifies it by a predetermined magnification.

【0036】次に、定電流源回路20の作用について詳
述する。正温度係数調整用抵抗20cと正温度係数抵抗
20dとの合成抵抗は、温度が高くなるに従って抵抗値
が大きくなる温度−抵抗値特性(以下、特性T5とい
う。図5参照)を有し、また、サーミスタ20eとサー
ミスタ特性調整用抵抗20fとの合成抵抗は、温度が高
くなるに従って抵抗値が反比例的に小さくなる温度−抵
抗値特性(以下、特性T6という。図6参照)を有して
いる。従って、定電流源回路20において、各特性T
5,T6を含む各抵抗20a,20c,20d,20
e,20fの合成抵抗は、図7に示すような、検出温度
範囲(−40℃〜125℃)の略中間で出力電圧が低く
なる非線形的(下に凸の特性曲線)温度−抵抗値特性
(以下、特性T7という)となることから、定電流源回
路20の基準電圧vdは、図8に示すような、前記検出
温度範囲の略中間で出力電圧が高くなる非線形的(上に
凸の特性曲線)な出力電圧特性T8となる。
Next, the operation of the constant current source circuit 20 will be described in detail. The combined resistance of the positive temperature coefficient adjusting resistor 20c and the positive temperature coefficient resistor 20d has a temperature-resistance value characteristic (hereinafter referred to as characteristic T5; see FIG. 5) in which the resistance value increases as the temperature rises. The combined resistance of the thermistor 20e and the thermistor characteristic adjusting resistor 20f has a temperature-resistance value characteristic (hereinafter referred to as characteristic T6; refer to FIG. 6) in which the resistance value decreases in inverse proportion as the temperature rises. . Therefore, in the constant current source circuit 20, each characteristic T
Each resistor 20a, 20c, 20d, 20 including 5, T6
The combined resistance of e and 20f is a non-linear (convex characteristic curve) temperature-resistance value characteristic in which the output voltage becomes low in the approximate middle of the detection temperature range (-40 ° C to 125 ° C) as shown in FIG. 7. (Hereinafter, referred to as characteristic T7), the reference voltage vd of the constant current source circuit 20 is non-linear (convex upward) as shown in FIG. 8 in which the output voltage is increased substantially in the middle of the detected temperature range. The output voltage characteristic T8 is a characteristic curve).

【0037】従って、定電流源回路20に備えられる温
度特性調整手段20gによって温度補償することで、温
度と出力電圧V2との関係を示す温度−電圧特性である
第二の出力電圧特性T4は、図4に示すように略線形に
なる。つまり、定電流源回路から供給される定電流が仮
に一定電圧であれば、第二の出力電圧特性T4は、図9
で示される出力電圧特性T1で示すように検出温度範囲
の中間で出力電圧が低くなるが、定電流源回路20から
供給される定電流は、検出温度範囲の略中間で高くなる
特性を有するため、第二の出力電圧特性T4は温度補償
され、第二の出力電圧特性T4が略線形になり、温度の
検出精度が向上することになる。
Therefore, the second output voltage characteristic T4, which is the temperature-voltage characteristic showing the relationship between the temperature and the output voltage V2, is obtained by performing temperature compensation by the temperature characteristic adjusting means 20g provided in the constant current source circuit 20. It becomes substantially linear as shown in FIG. That is, if the constant current supplied from the constant current source circuit is a constant voltage, the second output voltage characteristic T4 is as shown in FIG.
As indicated by the output voltage characteristic T1 shown by, the output voltage decreases in the middle of the detection temperature range, but the constant current supplied from the constant current source circuit 20 has a characteristic of increasing in the middle of the detection temperature range. , The second output voltage characteristic T4 is temperature-compensated, the second output voltage characteristic T4 becomes substantially linear, and the temperature detection accuracy is improved.

【0038】即ち、半導体センサ4を構成するブリッジ
回路21の両端電圧vcが図9で示すような下に凸をな
す非線形的な出力電圧特性T1を有するものであること
から、図8で示すような出力電圧特性T1と逆の関係を
なす上に凸の非線形的な特性T8からなる定電流源回路
20の基準電圧Vdを半導体センサ4のブリッジ回路2
1に印加することで、図9で示す理想的な線形を有する
出力電圧特性T2のような線形的な出力電圧特性T4
(図4参照)に基づいた両端電圧vcが得られるもので
ある。
That is, since the voltage vc across the bridge circuit 21 constituting the semiconductor sensor 4 has a downwardly convex non-linear output voltage characteristic T1 as shown in FIG. 9, it is as shown in FIG. The reference voltage Vd of the constant current source circuit 20 having an upwardly convex non-linear characteristic T8 having an inverse relationship with the output voltage characteristic T1 is applied to the bridge circuit 2 of the semiconductor sensor 4.
1 is applied to the linear output voltage characteristic T4 such as the output voltage characteristic T2 having the ideal linearity shown in FIG.
The both-end voltage vc based on (see FIG. 4) is obtained.

【0039】出力電圧特性T4を更に線形的にするため
には、温度特性調整手段20gの構成部品の内、最も温
度補償をするに重要な被測定物の温度(例えば油温)を
検出するサーミスタ20eと正温度係数抵抗20dと
を、回路基板5の裏面側で、かつベース板3のフランジ
部3aとの対向面であるベース板3の近傍に配設するこ
とで達成することが可能である(図1参照)。
In order to make the output voltage characteristic T4 more linear, the thermistor for detecting the temperature (for example, oil temperature) of the object to be measured which is the most important for temperature compensation among the components of the temperature characteristic adjusting means 20g. 20e and the positive temperature coefficient resistor 20d can be achieved by arranging them on the back surface side of the circuit board 5 and in the vicinity of the base plate 3 which is the surface facing the flange portion 3a of the base plate 3. (See Figure 1).

【0040】即ち、前記被測定物の温度の影響を最も受
けやすいベース板3の近傍にサーミスタ20eを配設す
ることによって、半導体センサ4が置かれている環境と
略同等の環境の温度をサーミスタ20eによって検出す
ることが可能となり、温度が高くなるに従って抵抗値が
反比例的に小さくなる特性(図6参照)T6を良好に得
ることが可能となる。
That is, by disposing the thermistor 20e in the vicinity of the base plate 3 most susceptible to the temperature of the object to be measured, the temperature of the environment in which the semiconductor sensor 4 is placed is approximately the same as the temperature of the thermistor. It is possible to detect with the 20e, and it is possible to satisfactorily obtain the characteristic (see FIG. 6) T6 in which the resistance value decreases in inverse proportion as the temperature rises.

【0041】また、正温度係数抵抗20dもベース板3
の近傍に配設することから、正温度係数抵抗20dの抵
抗値は、温度が高くなるに従って抵抗値が大きくなる特
性T5(図5参照)を良好に求めることが可能となる。
The positive temperature coefficient resistor 20d is also connected to the base plate 3
Since the resistance value of the positive temperature coefficient resistor 20d is arranged in the vicinity of, it is possible to favorably obtain the characteristic T5 (see FIG. 5) in which the resistance value increases as the temperature increases.

【0042】従って、定電流源回路20において、各特
性T5,T6を含む各抵抗20a,20c,20d,2
0e,20fの合成抵抗は、被検出体の検出温度に応じ
て良好な特性T7を得ることが可能となることから、定
電流源回路20の基準電圧vdにおいても被測定物の検
出温度に応じた良好な出力電圧特性T8が得られること
から、より線形的な出力電圧特性T4を得ることが可能
となり、温度の検出精度を更に向上させることができ
る。
Therefore, in the constant current source circuit 20, the resistors 20a, 20c, 20d, 2 including the characteristics T5, T6 are included.
Since the combined resistance of 0e and 20f makes it possible to obtain a good characteristic T7 according to the detected temperature of the object to be detected, the reference voltage vd of the constant current source circuit 20 also depends on the detected temperature of the object to be measured. Since a good output voltage characteristic T8 can be obtained, a more linear output voltage characteristic T4 can be obtained, and the temperature detection accuracy can be further improved.

【0043】かかる圧力温度検出装置Aは、半導体基板
上にピエゾ抵抗効果を有する感圧素子を形成し、前記感
圧素子を用いてブリッジ回路21を構成するとともに、
薄肉のダイアフラム部を有する単一の半導体センサ4に
よって流体の圧力に関する第一の検出信号と前記流体の
温度に関する第二の検出信号とを得るものであり、前記
流体を導入するため圧力導入穴1cを備えた圧力導入部
1aと、半導体センサ4に前記流体の圧力及び温度を伝
達するための穴部3cが設けられ半導体センサ4を配設
する載置部3bを備え、載置部3bから延設されたフラ
ンジ部3aを圧力導入部1aと接合することで圧力導入
穴1cの一端を塞ぐ状態を配設されるベース板3と、ベ
ース板3上に位置し、半導体センサ4を収納する収納穴
部5aを備えるとともに半導体センサ4と電気的に接続
される回路基板5と、回路基板5に備えられ、ブリッジ
回路21に所定の定電流を供給する定電流源回路20
と、第二の検出信号の温度特性を調整するとともに、ベ
ース板3の近傍に位置する状態で回路基板5に配設され
る温度特性調整手段20gとを備えてなるものであり、
構造を複雑にすることなく簡単な構成で圧力と温度とを
検出することができ、且つ、温度と出力電圧との関係を
示す出力電圧特性T4を更に線形にすることで温度の検
出精度を向上させることができる。
In the pressure / temperature detecting device A, a pressure sensitive element having a piezoresistive effect is formed on a semiconductor substrate, and a bridge circuit 21 is formed by using the pressure sensitive element.
A single semiconductor sensor 4 having a thin diaphragm portion is used to obtain a first detection signal relating to the pressure of the fluid and a second detection signal relating to the temperature of the fluid, and a pressure introducing hole 1c for introducing the fluid. A pressure introducing portion 1a, and a mounting portion 3b in which the semiconductor sensor 4 is provided with a hole 3c for transmitting the pressure and temperature of the fluid, and the semiconductor sensor 4 is disposed. A base plate 3 arranged so as to close one end of the pressure introducing hole 1c by joining the provided flange portion 3a with the pressure introducing portion 1a, and a storage located on the base plate 3 for storing the semiconductor sensor 4. A circuit board 5 having a hole 5a and electrically connected to the semiconductor sensor 4, and a constant current source circuit 20 provided on the circuit board 5 and supplying a predetermined constant current to the bridge circuit 21.
And a temperature characteristic adjusting means 20g for adjusting the temperature characteristic of the second detection signal and arranged on the circuit board 5 in a state of being located in the vicinity of the base plate 3,
The pressure and temperature can be detected with a simple configuration without complicating the structure, and the temperature detection accuracy is improved by making the output voltage characteristic T4 showing the relationship between the temperature and the output voltage more linear. Can be made.

【0044】また、温度特性調整手段20gは、少なく
ともサーミスタ20eと正温度係数抵抗20dとを有す
ることから、簡単な構成で、また安価に構成することが
可能となる。
Further, since the temperature characteristic adjusting means 20g has at least the thermistor 20e and the positive temperature coefficient resistor 20d, the temperature characteristic adjusting means 20g can be constructed with a simple structure and at a low cost.

【0045】また、ベース板3は、フランジ部3aに対
して載置部3bが一段高くなる位置に設けられ、また回
路基板5のベース板3におけるフランジ部3aに対向す
る位置、即ちフランジ部3aと載置部3bとの段差部分
に対応する回路基板5の裏面側に温度特性調整手段20
gであるサーミスタ20eと正温度係数抵抗20dとを
配設することから、被測定物の温度の影響を最も受けや
すいベース板3の最も近くにサーミスタ20eと正温度
係数抵抗20dとを配設することが可能となるため、出
力電圧特性T4を更に線形にすることが可能となる。
Further, the base plate 3 is provided at a position where the mounting portion 3b is one step higher than the flange portion 3a, and at a position facing the flange portion 3a of the base plate 3 of the circuit board 5, that is, the flange portion 3a. The temperature characteristic adjusting means 20 is provided on the back surface side of the circuit board 5 corresponding to the step between the mounting portion 3b and the mounting portion 3b.
Since the thermistor 20e, which is g, and the positive temperature coefficient resistor 20d are disposed, the thermistor 20e and the positive temperature coefficient resistor 20d are disposed closest to the base plate 3 most susceptible to the temperature of the object to be measured. Therefore, the output voltage characteristic T4 can be made more linear.

【0046】尚、本発明の第一,第二の出力部となる圧
力検出増幅回路22と温度検出増幅回路23の回路構成
にあっては、本発明の実施の形態で説明した回路構成に
限定されるものではなく、図3及び図4で示すような圧
力及び温度に関する出力特性が得られる回路構成であれ
ば良い。
The circuit configurations of the pressure detection amplification circuit 22 and the temperature detection amplification circuit 23, which are the first and second output sections of the present invention, are limited to the circuit configurations described in the embodiments of the present invention. However, the circuit configuration is not limited to this, and may be any circuit configuration that can obtain the output characteristics regarding pressure and temperature as shown in FIGS. 3 and 4.

【0047】また、本発明の実施の形態で説明した温度
特性調整手段20gは、正温度係数調整用抵抗20c,
正温度係数抵抗20d,サーミスタ20e及びサーミス
タ特性調整用抵抗20fを有するものであったが、本発
明における温度特性調整手段は、正温度係数抵抗及びサ
ーミスタを少なくとも備えるものであれば良い。
Further, the temperature characteristic adjusting means 20g described in the embodiment of the present invention includes the positive temperature coefficient adjusting resistor 20c,
Although it has the positive temperature coefficient resistor 20d, the thermistor 20e and the thermistor characteristic adjusting resistor 20f, the temperature characteristic adjusting means in the present invention may be any one that includes at least the positive temperature coefficient resistor and the thermistor.

【0048】また、本発明の実施の形態では、ベース板
3と温度特性調整手段21gの正温度係数抵抗20d及
びサーミスタ20eとの間に若干の隙間があるが、この
隙間に熱伝導部材を介在させることによって、更に線形
的な出力電圧特性T4を得ることができる。前記熱伝導
部材として、例えば信越化学(株)製,型式G747,
商品名オイルコンパウンドが挙げられる。
Further, in the embodiment of the present invention, although there is a slight gap between the base plate 3 and the positive temperature coefficient resistor 20d of the temperature characteristic adjusting means 21g and the thermistor 20e, a heat conducting member is interposed in this gap. By doing so, a more linear output voltage characteristic T4 can be obtained. As the heat conduction member, for example, Shin-Etsu Chemical Co., Ltd., model G747,
The product name is oil compound.

【0049】[0049]

【発明の効果】本発明は、半導体基板上にピエゾ抵抗効
果を有する感圧素子を形成し、前記感圧素子を用いてブ
リッジ回路を構成するとともに、薄肉のダイアフラム部
を有する単一の半導体センサによって流体の圧力に関す
る第一の検出信号と前記流体の温度に関する第二の検出
信号とを得る半導体センサ装置に関し、構造を複雑にす
ることなく簡単な構成で圧力と温度とを検出することが
でき、且つ、温度と出力電圧との関係を示す出力電圧特
性を更に線形にすることで温度の検出精度を向上させる
ことができる。
According to the present invention, a pressure sensitive element having a piezoresistive effect is formed on a semiconductor substrate, a bridge circuit is formed by using the pressure sensitive element, and a single semiconductor sensor having a thin diaphragm portion is formed. A semiconductor sensor device that obtains a first detection signal relating to the pressure of a fluid and a second detection signal relating to the temperature of the fluid by means of which it is possible to detect pressure and temperature with a simple configuration without complicating the structure. In addition, by further linearizing the output voltage characteristic indicating the relationship between the temperature and the output voltage, the temperature detection accuracy can be improved.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施の形態の圧力温度検出装置を示す
要部断面図。
FIG. 1 is a cross-sectional view of essential parts showing a pressure-temperature detection device according to an embodiment of the present invention.

【図2】同上実施の形態の回路構成を示す図。FIG. 2 is a diagram showing a circuit configuration of the above embodiment.

【図3】同上実施の形態の圧力と出力電圧との関係を示
す図。
FIG. 3 is a diagram showing a relationship between pressure and output voltage according to the above embodiment.

【図4】同上実施の形態の温度と出力電圧との関係を示
す図。
FIG. 4 is a diagram showing a relationship between temperature and output voltage according to the embodiment.

【図5】同上実施の形態の温度と、正温度係数調整用抵
抗及び正温度係数抵抗の合成抵抗との関係を示す図。
FIG. 5 is a diagram showing the relationship between the temperature and the combined resistance of the positive temperature coefficient adjusting resistor and the positive temperature coefficient resistor according to the embodiment.

【図6】同上実施の形態の温度と、サーミスタとサーミ
スタ特性調整用抵抗との合成抵抗との関係を示す図。
FIG. 6 is a diagram showing the relationship between the temperature and the combined resistance of the thermistor and the thermistor characteristic adjusting resistor in the embodiment.

【図7】同上実施の形態の温度と、温度特性調整手段の
合成抵抗との関係を示す図。
FIG. 7 is a diagram showing the relationship between the temperature of the above embodiment and the combined resistance of the temperature characteristic adjusting means.

【図8】同上実施の形態の温度と、定電流源回路の基準
電圧との関係を示す図。
FIG. 8 is a diagram showing the relationship between the temperature and the reference voltage of the constant current source circuit according to the embodiment.

【図9】従来の温度と出力電圧との関係を示す図。FIG. 9 is a diagram showing a conventional relationship between temperature and output voltage.

【符号の説明】[Explanation of symbols]

1 下ケース 1a 圧力導入部 1c 圧力導入穴(導入部) 3 ベース板 3a フランジ部(鍔部) 3b 載置部 3c 穴部 4 半導体センサ 5 回路基板 5a 収納穴部 20 定電流源回路 20c 正温度係数調整用抵抗 20d 正温度係数抵抗 20e サーミスタ 20f サーミスタ特性調整抵抗 20g 温度特性調整手段 21 ブリッジ回路 22,24 圧力検出増幅回路(第一の出力部) 23 温度検出増幅回路(第二の出力部) Ra〜Rd 抵抗(感圧素子) va,vb 中間電圧 vc 両端電圧 A 圧力温度検出装置(半導体センサ装置) 1 lower case 1a Pressure introduction part 1c Pressure introduction hole (introduction part) 3 base plate 3a Flange (flange) 3b mounting part 3c hole 4 Semiconductor sensor 5 circuit board 5a Storage hole 20 constant current source circuit 20c Positive temperature coefficient adjustment resistor 20d Positive temperature coefficient resistance 20e thermistor 20f Thermistor characteristic adjustment resistor 20g Temperature characteristic adjustment means 21 bridge circuit 22, 24 Pressure detection amplifier circuit (first output section) 23 Temperature detection amplifier circuit (second output section) Ra to Rd resistance (pressure sensitive element) va, vb intermediate voltage vc voltage across both ends A Pressure temperature detection device (semiconductor sensor device)

フロントページの続き Fターム(参考) 2F055 AA40 BB20 CC02 DD05 EE14 FF02 GG11 GG32 4M112 AA01 BA01 CA01 CA09 CA11 CA12 CA13 DA12 DA18 EA02 EA10 EA11 EA14 FA01 FA02 FA05 GA01 Continued front page    F term (reference) 2F055 AA40 BB20 CC02 DD05 EE14                       FF02 GG11 GG32                 4M112 AA01 BA01 CA01 CA09 CA11                       CA12 CA13 DA12 DA18 EA02                       EA10 EA11 EA14 FA01 FA02                       FA05 GA01

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 半導体基板上にピエゾ抵抗効果を有する
感圧素子を形成し、前記感圧素子を用いてブリッジ回路
を構成するとともに、薄肉のダイアフラム部を有する単
一の半導体センサによって流体の圧力に関する第一の検
出信号と前記流体の温度に関する第二の検出信号とを得
る半導体センサ装置であって、 前記流体を導入するため導入口を備えた圧力導入部と、 前記半導体センサに前記流体の圧力及び温度を伝達する
ための穴部が設けられ前記半導体センサを配設する載置
部を備え、前記載置部から延設された鍔部を前記圧力導
入部に接合することで前記導入口の一端を塞ぐ状態で配
設されるベース板と、 前記ベース板上に位置し、前記半導体センサを収納する
収納穴部を備えるとともに、前記半導体センサと電気的
に接続される回路基板と、 前記回路基板に備えられ、前記ブリッジ回路に所定の定
電流を供給する定電流源回路と、 前記第2の検出信号の温度特性を調整するとともに、前
記ベース板の近傍に位置する状態で前記回路基板に配設
される温度特性調整手段と、 を備えてなることを特徴とする半導体センサ装置。
1. A pressure sensitive element having a piezoresistive effect is formed on a semiconductor substrate, a bridge circuit is formed using the pressure sensitive element, and a single semiconductor sensor having a thin diaphragm portion is used to apply a fluid pressure. Is a semiconductor sensor device that obtains a first detection signal relating to the temperature of the fluid and a second detection signal relating to the temperature of the fluid, the pressure introducing portion having an inlet for introducing the fluid; The introduction port is provided by providing a mounting portion in which a hole for transmitting pressure and temperature is provided and arranging the semiconductor sensor, and by joining a collar portion extended from the mounting portion to the pressure introducing portion. And a circuit board electrically connected to the semiconductor sensor, the circuit board having a base plate disposed so as to close one end of the base plate, a storage hole portion that is located on the base plate, and stores the semiconductor sensor. A plate, a constant current source circuit provided on the circuit board for supplying a predetermined constant current to the bridge circuit, and a state of adjusting the temperature characteristic of the second detection signal and being located in the vicinity of the base plate. 2. A semiconductor sensor device, comprising: a temperature characteristic adjusting means disposed on the circuit board.
【請求項2】 前記温度特性調整手段は、少なくともサ
ーミスタと正温度係数抵抗とを有することを特徴とする
請求項1に記載の半導体センサ装置。
2. The semiconductor sensor device according to claim 1, wherein the temperature characteristic adjusting means includes at least a thermistor and a positive temperature coefficient resistor.
【請求項3】 前記温度特性調整手段は、前記回路基板
の前記鍔部に対向する位置に配設されてなることを特徴
とする請求項1もしくは請求項2に記載の半導体センサ
装置。
3. The semiconductor sensor device according to claim 1, wherein the temperature characteristic adjusting means is arranged at a position facing the flange portion of the circuit board.
【請求項4】 前記鍔部と前記温度特性調整手段との間
に熱伝達部材を配設してなることを特徴とする請求項1
から請求項3の何れかに記載の半導体センサ装置。
4. A heat transfer member is arranged between the collar portion and the temperature characteristic adjusting means.
4. The semiconductor sensor device according to claim 3.
【請求項5】 前記載置部は、前記鍔部に対して少なく
とも一段高くなる位置に設けられてなることを特徴とす
る請求項1に記載の半導体センサ装置。
5. The semiconductor sensor device according to claim 1, wherein the mounting portion is provided at a position that is at least one step higher than the collar portion.
JP2002004075A 2002-01-11 2002-01-11 Semiconductor sensor device Expired - Fee Related JP4244372B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002004075A JP4244372B2 (en) 2002-01-11 2002-01-11 Semiconductor sensor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002004075A JP4244372B2 (en) 2002-01-11 2002-01-11 Semiconductor sensor device

Publications (2)

Publication Number Publication Date
JP2003207406A true JP2003207406A (en) 2003-07-25
JP4244372B2 JP4244372B2 (en) 2009-03-25

Family

ID=27643498

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002004075A Expired - Fee Related JP4244372B2 (en) 2002-01-11 2002-01-11 Semiconductor sensor device

Country Status (1)

Country Link
JP (1) JP4244372B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110006585A (en) * 2019-05-06 2019-07-12 上海掌门科技有限公司 A kind of data acquisition device and method of pressure sensor

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE50101982D1 (en) 2000-02-03 2004-05-19 Zeiss Carl POLISHING HEAD FOR A POLISHING MACHINE

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110006585A (en) * 2019-05-06 2019-07-12 上海掌门科技有限公司 A kind of data acquisition device and method of pressure sensor
CN110006585B (en) * 2019-05-06 2023-10-24 上海掌门科技有限公司 Data acquisition device and method of pressure sensor

Also Published As

Publication number Publication date
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