JP2003124127A - Semiconductor manufacturing apparatus and its exhaust pipeline and maintenance method - Google Patents

Semiconductor manufacturing apparatus and its exhaust pipeline and maintenance method

Info

Publication number
JP2003124127A
JP2003124127A JP2001315860A JP2001315860A JP2003124127A JP 2003124127 A JP2003124127 A JP 2003124127A JP 2001315860 A JP2001315860 A JP 2001315860A JP 2001315860 A JP2001315860 A JP 2001315860A JP 2003124127 A JP2003124127 A JP 2003124127A
Authority
JP
Japan
Prior art keywords
semiconductor manufacturing
exhaust pipe
pipe
gas
gas exhaust
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2001315860A
Other languages
Japanese (ja)
Inventor
Hideyuki Takayama
英之 高山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP2001315860A priority Critical patent/JP2003124127A/en
Publication of JP2003124127A publication Critical patent/JP2003124127A/en
Withdrawn legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a semiconductor manufacturing apparatus in which the adhesion and deposition of reaction products on the internal surface of an exhaust pipeline can be suppressed and the maintenance work of the pipeline can be performed easily and efficiently, and to provide the exhaust pipeline and maintenance method of the device. SOLUTION: The semiconductor manufacturing device body 100 contains a manufacturing chamber 11 to which various kinds of gases are supplied. An exhaust gas generated in the chamber 11 after a reaction is made to flow through a gas exhaust pipeline 12 and finally introduced to an exhaust gas processing mechanism 13, such as a scrubber, pretreatment device, etc. At a prescribed distance of the pipeline 12, an external pipe 14 which evacuates the outer periphery of the pipeline 12 is provided. In addition, at a prescribed part of the external pipe 14, a vacuum port 141 is provided and connected to a vacuum pump. The vacuum pump can use an evacuating system installed to a semiconductor manufacturing line in a shared state. Consequently, the internal gas exhaust pipeline 12 is always kept warm.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、特に半導体装置を
製造する際に発生する排ガスの除害処理を伴なう半導体
製造装置及びその排気配管及びメンテナンス方法に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor manufacturing apparatus, an exhaust pipe, and a maintenance method for the semiconductor manufacturing apparatus, which are accompanied by a process of removing exhaust gas generated when manufacturing a semiconductor device.

【0002】[0002]

【従来の技術】半導体製造装置では、半導体素子の製造
工程で化学気相反応を利用して成膜するCVD(Chemic
al Vapor Deposition )装置、反応性イオンエッチング
装置などのような、各種のガスを扱う装置がある。
2. Description of the Related Art In a semiconductor manufacturing apparatus, a chemical vapor deposition (CVD) method is used to form a film in a semiconductor element manufacturing process.
There are devices that handle various gases such as al Vapor Deposition) devices and reactive ion etching devices.

【0003】このような半導体製造装置本体の製造チャ
ンバから化学気相反応を経て発生する排ガスは、有害な
ものも含まれている。従って、上記排ガスは、有害な状
態を除くべく、スクラバー、除害装置といった排ガス処
理機構を経る。
The exhaust gas generated from the manufacturing chamber of the main body of the semiconductor manufacturing apparatus through the chemical vapor phase reaction contains harmful ones. Therefore, the exhaust gas passes through an exhaust gas treatment mechanism such as a scrubber and an abatement device in order to remove a harmful state.

【0004】図4は、従来の半導体製造装置の要部を示
す概観図である。例えば各種ガスGASが投入されるC
VD装置の処理室41が示されている。ガス排気配管4
2は、チャンバ内における反応後の排ガスを流す。図示
のガス排気配管42は一部であり、排ガスは最終的に上
述の排ガス処理機構、いわゆる除害装置43に導かれ
る。
FIG. 4 is a schematic view showing a main part of a conventional semiconductor manufacturing apparatus. For example, C into which various gases GAS are input
The processing chamber 41 of the VD device is shown. Gas exhaust pipe 4
2 flows the exhaust gas after the reaction in the chamber. The illustrated gas exhaust pipe 42 is a part, and the exhaust gas is finally guided to the above-described exhaust gas treatment mechanism, so-called abatement device 43.

【0005】例えば、ドライポンプDPそれぞれから除
害装置43の間のガス排気配管42には、処理室41か
らの排ガスを排気するため各ドライポンプ(DP)にて
希釈用のN2ガスを流入している。ガス排気配管42に
流れる排ガス中には未反応ガスが含まれているからであ
る。この未反応ガスにより、反応生成物(SiO2系の
物質)が生成され、ガス排気配管42の内壁に付着、堆
積し、配管をつまらせる恐れがある。N2ガスは、ガス
排気配管42内の排ガスを希釈し、この反応生成物の付
着を阻止するように働く。
For example, in order to exhaust the exhaust gas from the processing chamber 41 into the gas exhaust pipe 42 between each dry pump DP and the abatement device 43, N 2 gas for dilution is introduced by each dry pump (DP). is doing. This is because the unreacted gas is contained in the exhaust gas flowing through the gas exhaust pipe 42. Due to this unreacted gas, a reaction product (SiO 2 -based substance) is generated and may be attached to and deposited on the inner wall of the gas exhaust pipe 42 to block the pipe. The N 2 gas serves to dilute the exhaust gas in the gas exhaust pipe 42 and prevent the deposition of this reaction product.

【0006】加えて、ガス排気配管42内を流れる排ガ
スの温度は、チャンバ41から排出された直後の温度に
近いまま、なるべく下がらないようにすることが望まし
い。その適当な温度は80〜120℃である。排気を冷
え難くすることによって、ガス排気配管42内壁への反
応生成物付着をいっそう抑えることができる。
In addition, it is desirable that the temperature of the exhaust gas flowing in the gas exhaust pipe 42 is kept as close to the temperature immediately after being discharged from the chamber 41 as possible and is not lowered as much as possible. The suitable temperature is 80 to 120 ° C. By making it difficult to cool the exhaust gas, it is possible to further suppress the adhesion of reaction products to the inner wall of the gas exhaust pipe 42.

【0007】そこで、ガス排気配管42は所定距離、例
えば除害装置に至るまでの距離を常に保温あるいは加熱
しておく。すなわち、ガス排気配管42の所定距離に対
して断熱材を巻く、電熱線(ヒーター)を巻く等の方策
により、反応生成物の付着を極力阻止するようにしてい
た。
Therefore, the gas exhaust pipe 42 is always kept warm or heated for a predetermined distance, for example, a distance to reach the abatement device. That is, the adhesion of the reaction product is prevented as much as possible by taking measures such as winding a heat insulating material around a predetermined distance of the gas exhaust pipe 42 and winding a heating wire (heater).

【0008】[0008]

【発明が解決しようとする課題】上記のように断熱材の
設置、配管ヒーターの設置等の対策をしてもガス排気配
管内における反応性生物の付着、堆積は完全に防ぐこと
はできない。従って、定期的に配管の一部を取り外し、
内壁に付着した反応生成物の除去を行なうメンテナンス
が必要である。
Even if measures such as the installation of the heat insulating material and the installation of the pipe heater are taken as described above, it is not possible to completely prevent the reaction products from adhering and accumulating in the gas exhaust pipe. Therefore, periodically remove a part of the pipe,
Maintenance is required to remove the reaction products attached to the inner wall.

【0009】上記メンテナンス時には、配管の周囲を巻
いていた断熱材や電熱線(ヒーター)を取り外さなけれ
ばならない。古い断熱材や電熱線(ヒーター)を再利用
するには相当注意して外さなければならず、交換もやむ
を得ない事態になることが少なくない。いずれにして
も、一旦取り外した配管を再度復旧させるまでの一連の
メンテナンス作業に時間と工数がかかる問題がある。
During the above maintenance, the heat insulating material and the heating wire (heater) wound around the pipe must be removed. Reusing old insulation and heating wires (heaters) requires considerable care to remove them, and replacement is often unavoidable. In any case, there is a problem that a series of maintenance work until restoration of the once removed pipe takes time and man-hours.

【0010】本発明は上記のような事情を考慮してなさ
れたもので、排気配管の内壁への反応生成物の付着、堆
積を抑え、かつ容易で効率的な排気配管のメンテナンス
作業が実現される半導体製造装置及びその排気配管及び
メンテナンス方法を提供しようとするものである。
The present invention has been made in view of the above circumstances, and realizes easy and efficient maintenance work of the exhaust pipe while suppressing the adhesion and deposition of reaction products on the inner wall of the exhaust pipe. It is intended to provide a semiconductor manufacturing apparatus, an exhaust pipe for the same, and a maintenance method.

【0011】[0011]

【課題を解決するための手段】本発明に係る半導体製造
装置は、半導体製造に関し、製造チャンバ内での化学気
相反応に伴なって排出される排ガスを導くガス排気配管
と、少なくとも前記ガス排気配管の所定距離において設
けられ配管外周辺が真空化される外周管と、を具備した
ことを特徴とする。
A semiconductor manufacturing apparatus according to the present invention relates to semiconductor manufacturing, and relates to a semiconductor manufacturing apparatus, a gas exhaust pipe for guiding exhaust gas discharged along with a chemical vapor phase reaction in a manufacturing chamber, and at least the gas exhaust pipe. And an outer peripheral pipe which is provided at a predetermined distance of the pipe and whose outer periphery is evacuated.

【0012】上記本発明に係る半導体製造装置によれ
ば、配管外周辺が真空化された外周管により、ガス排気
配管の放熱を防ぎ、排気の温度低下を防ぐ。なお、上記
外周管は、半導体製造系で配備されている真空引き系を
共有して真空化されていることを特徴とする。あるい
は、上記外周管は、専用に配備した真空ポンプを利用し
て真空化されていることを特徴とする。いずれか能力や
コスト等を考慮して実現しやすい方を選択すればよい。
According to the above-described semiconductor manufacturing apparatus of the present invention, the outer peripheral tube whose outer periphery is evacuated prevents the gas exhaust piping from radiating heat and prevents the temperature of exhaust from lowering. The outer peripheral tube is characterized by being evacuated by sharing a vacuuming system provided in a semiconductor manufacturing system. Alternatively, the outer peripheral tube is characterized in that it is evacuated by using a vacuum pump provided exclusively. The one that is easy to implement may be selected in consideration of the capability and cost.

【0013】本発明に係る半導体製造装置の排気配管
は、半導体製造に伴なうガス排気配管であって、両端部
それぞれの中継接続部と、中継接続部間に設けられ、配
管外周辺を真空領域で囲む二重配管部と、を具備したこ
とを特徴とする。
The exhaust pipe of the semiconductor manufacturing apparatus according to the present invention is a gas exhaust pipe associated with semiconductor manufacturing, and is provided between the relay connecting portions at both ends and between the relay connecting portions. And a double pipe section surrounded by a region.

【0014】上記本発明に係る半導体製造装置の排気配
管によれば、配管外周辺を真空領域で囲む二重配管部に
より、ガス排気配管の放熱を防ぎ、排気の温度低下を防
ぐ。なお、一定の真空領域を保つため上記二重配管部は
配管外周辺を真空引きする吸気部が備えられていること
を特徴とする。
According to the exhaust pipe of the semiconductor manufacturing apparatus of the present invention described above, the double pipe portion surrounding the outer periphery of the pipe in the vacuum region prevents heat dissipation from the gas exhaust pipe and prevents the temperature of exhaust gas from decreasing. In addition, in order to maintain a constant vacuum region, the double pipe section is characterized by being provided with an intake section for vacuuming the periphery of the pipe.

【0015】本発明に係る半導体製造装置におけるガス
排気配管のメンテナンス方法は、半導体製造の製造チャ
ンバ内での化学気相反応に伴なって排出される排ガスを
導くガス排気配管について、前記ガス排気配管は、両端
部それぞれの中継接続部と、中継接続部間に設けられ配
管外周辺を真空領域で囲む二重配管部とを具備し、前記
ガス排気配管を2つ以上備え、中継接続部を取り外して
二重配管部を伴なう所定距離のガス排気配管ごと交換す
ることを特徴とする。
A method of maintaining a gas exhaust pipe in a semiconductor manufacturing apparatus according to the present invention relates to a gas exhaust pipe for guiding an exhaust gas discharged along with a chemical vapor phase reaction in a semiconductor manufacturing manufacturing chamber. Is equipped with a relay connection part at each of both ends and a double pipe part provided between the relay connection parts and surrounding the outside of the pipe with a vacuum region. The gas exhaust pipe is provided with two or more, and the relay connection part is removed. It is characterized in that the entire gas exhaust pipe with a double pipe section and a predetermined distance is replaced.

【0016】上記本発明に係る半導体製造装置における
ガス排気配管のメンテナンス方法によれば、中継接続部
を取り外すだけで、二重配管部を伴なう所定距離のガス
排気配管ごと交換できる。交換が容易であるため工数が
かからず、稼動に影響を与え難い。真空領域で保温する
二重配管部を有することにより、断熱材あるいはヒータ
を配管に巻く等消耗しやすい部材は設けない。交換され
たガス排気配管は洗浄して再利用することを特徴とす
る。
According to the above-described gas exhaust pipe maintenance method in the semiconductor manufacturing apparatus of the present invention, the gas exhaust pipe with a predetermined distance including the double pipe portion can be replaced by simply removing the relay connection portion. Since replacement is easy, it does not require man-hours and it is unlikely to affect the operation. By having the double pipe portion that keeps the temperature in the vacuum region, a heat-insulating material or a member such as a heater wound around the pipe and easily consumed is not provided. The replaced gas exhaust pipe is characterized by being cleaned and reused.

【0017】[0017]

【発明の実施の形態】図1は、本発明の一実施形態に係
る半導体製造装置の要部構成を示す概観図である。処理
ガスの燃焼除害による半導体製造装置本体100は、C
VD装置の処理室11を含み、各種ガス(GAS)が投
入される。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a schematic view showing the configuration of a main part of a semiconductor manufacturing apparatus according to an embodiment of the present invention. The semiconductor manufacturing apparatus main body 100 by burning and removing the processing gas is C
Including the processing chamber 11 of the VD device, various gases (GAS) are introduced.

【0018】ガス排気配管12は、チャンバ11内にお
ける反応後の排ガスを流す。すなわち、化学気相反応に
伴なって排出される排ガスを導く配管である。図示のガ
ス排気配管12は一部であり、排ガスは最終的にスクラ
バーや除害装置等の排ガス処理機構13に導かれる。
The gas exhaust pipe 12 allows the exhaust gas after the reaction in the chamber 11 to flow. That is, it is a pipe that guides the exhaust gas discharged along with the chemical vapor reaction. The illustrated gas exhaust pipe 12 is a part, and the exhaust gas is finally guided to an exhaust gas treatment mechanism 13 such as a scrubber or an abatement device.

【0019】本発明ではガス排気配管12の所定距離、
例えばドライポンプDPから排ガス処理機構13までの
配管において、配管外周辺が真空化される外周管14が
設けられている。ガス排気配管12及び外周管14は例
えばステンレスからなる二重配管構成になっている。
In the present invention, a predetermined distance of the gas exhaust pipe 12,
For example, in the pipe from the dry pump DP to the exhaust gas treatment mechanism 13, an outer peripheral pipe 14 is provided, which is vacuumized around the outside of the pipe. The gas exhaust pipe 12 and the outer peripheral pipe 14 have a double pipe structure made of, for example, stainless steel.

【0020】外周管14の所定部には、バキューム口1
41が設けられ真空ポンプに繋がっている。真空ポンプ
は半導体製造のラインで配備されている真空引き系を共
有してもよい。これにより、内管のガス排気配管12は
常に保温される。
A vacuum port 1 is provided at a predetermined portion of the outer peripheral tube 14.
41 is provided and is connected to a vacuum pump. The vacuum pump may share an evacuation system provided in a semiconductor manufacturing line. Thereby, the gas exhaust pipe 12 of the inner pipe is always kept warm.

【0021】ガス排気配管12内を流れる排ガスの温度
は、チャンバ11から排出された直後の温度に近いま
ま、なるべく下がらないように維持される。ガス排気配
管12内を流れる排ガスの温度は、使用したガス種にも
よるが、だいたい50〜60℃に保てればよい。この結
果、ガス排気配管12内での反応生成物の付着、堆積が
抑制される。
The temperature of the exhaust gas flowing through the gas exhaust pipe 12 is maintained close to the temperature immediately after being discharged from the chamber 11 and kept as low as possible. The temperature of the exhaust gas flowing through the gas exhaust pipe 12 depends on the type of gas used, but may be maintained at about 50 to 60 ° C. As a result, adhesion and deposition of reaction products in the gas exhaust pipe 12 are suppressed.

【0022】上記実施形態によれば、配管外周辺が真空
化された外周管14により、ガス排気配管12の放熱を
防ぎ、排気の温度低下を防ぐ。従って、ガス排気配管1
2内壁への反応生成物付着、堆積の防止効果は相当期待
できる。よって、ガス排気配管12内にN2等の希釈ガ
スを多量に流す必要はなくなる。希釈ガスを減少できる
結果、最終的な排ガス処理機構の負荷を軽減できる利点
がある。
According to the above-described embodiment, the outer peripheral pipe 14 whose outer periphery is evacuated prevents the gas exhaust pipe 12 from radiating heat and prevents the temperature of exhaust gas from decreasing. Therefore, the gas exhaust pipe 1
2. The effect of preventing reaction products from adhering to and depositing on the inner wall can be expected considerably. Therefore, it is not necessary to flow a large amount of diluent gas such as N 2 into the gas exhaust pipe 12. As a result of reducing the dilution gas, there is an advantage that the load of the final exhaust gas treatment mechanism can be reduced.

【0023】なお、上記外周管14は、半導体製造系で
配備されている真空引き系を共有して真空化されていて
もよいし、あるいは専用に配備した真空ポンプを利用し
て真空化されてもよい。いずれか能力やコスト等を考慮
して実現しやすい方を選択すればよい。
The outer peripheral tube 14 may be evacuated by sharing the evacuation system provided in the semiconductor manufacturing system, or may be evacuated by using a vacuum pump provided exclusively. Good. The one that is easy to implement may be selected in consideration of the capability and cost.

【0024】図2は、本発明の一実施形態に係る半導体
製造装置の排気配管の要部構成を示す断面図である。ガ
ス排気配管21は両端部にそれぞれOリング取り付け用
の溝を設けたフランジを有する中継接続部22が設けら
れている。中継接続部22の間には配管外周辺を真空領
域で囲む二重配管部23が構成されている。
FIG. 2 is a sectional view showing the structure of the main part of the exhaust pipe of the semiconductor manufacturing apparatus according to one embodiment of the present invention. The gas exhaust pipe 21 is provided with a relay connection portion 22 having flanges provided with grooves for attaching O-rings at both ends. A double pipe portion 23 is formed between the relay connection portions 22 so that the outer periphery of the pipe is surrounded by a vacuum region.

【0025】排気配管21は例えばステンレス製とす
る。すなわち、二重配管部23の内管231は排ガスの
腐食性に耐え得る材質及び厚さを有し、かつ外管232
との間で真空領域を作るから真空にも耐える必要があ
る。外管232はもちろん真空に耐える材質及び厚さを
有する。
The exhaust pipe 21 is made of stainless steel, for example. That is, the inner pipe 231 of the double pipe portion 23 has a material and a thickness that can withstand the corrosiveness of the exhaust gas, and the outer pipe 232.
It is necessary to withstand the vacuum because it creates a vacuum region between and. The outer tube 232 has, of course, a material and a thickness that can withstand a vacuum.

【0026】排気配管21における二重配管部23の外
表面に、内管231と外管232との間で真空領域を作
るバキューム口24が備えられている。バキューム口2
4には例えばステンレス材を含むフレキシブルホース2
5が取付けられるようになっている。
On the outer surface of the double pipe section 23 in the exhaust pipe 21, a vacuum port 24 for forming a vacuum region between the inner pipe 231 and the outer pipe 232 is provided. Vacuum mouth 2
4 is a flexible hose 2 including, for example, a stainless material
5 can be attached.

【0027】ガス排気配管21は接続されるべき別のガ
ス排気配管21a及び21bにおけるフランジを有する
中継接続部22a,22bとそれぞれクランプリング2
6の締め付けを伴い接続される。
The gas exhaust pipe 21 is connected to the other gas exhaust pipes 21a and 21b to be connected with the relay connection portions 22a and 22b having flanges and the clamp ring 2 respectively.
Connected with tightening 6.

【0028】図3は、図2を参照した半導体製造装置に
おけるガス排気配管のメンテナンス方法を示すフローチ
ャートである。実際、少なくとも交換用に同様のガス排
気配管のスペアを準備し、所定の交換時期が来たら、中
継接続部で取り外して二重配管部を伴なう所定距離のガ
ス排気配管ごと交換するようにする(S1〜S2)。取
り外した配管はガス排気配管の堆積物付着などの領域を
除去する洗浄工程を経て保管され(S3〜S4)、再度
の交換時期に利用すべく備える。
FIG. 3 is a flow chart showing a method of maintaining the gas exhaust pipe in the semiconductor manufacturing apparatus with reference to FIG. Actually, prepare a spare of the same gas exhaust pipe for at least replacement, and when the predetermined replacement time comes, remove it at the relay connection part and replace it with the gas exhaust pipe of the predetermined distance with the double pipe part. (S1 and S2). The removed pipe is stored after undergoing a cleaning process to remove areas such as deposits on the gas exhaust pipe (S3 to S4), and is prepared for reuse at the time of replacement.

【0029】上記実施形態におけるガス排気配管のメン
テナンス方法によれば、中継接続部の取り外し作業だけ
で、二重配管部を伴なう所定距離のガス排気配管ごと交
換できる。すなわち、従来のように断熱材あるいはヒー
タをガス排気配管に巻く等、消耗しやすい部材、煩わし
い作業は設けず、交換が容易である。このため工数がか
からず、稼動に影響を与え難い。また、交換されたガス
排気配管は洗浄して再利用されるので無駄がない。
According to the maintenance method of the gas exhaust pipe in the above-mentioned embodiment, the gas exhaust pipe having a predetermined distance including the double pipe portion can be replaced by only removing the relay connection portion. That is, unlike the conventional case, a heat insulating material or a heater is wound around the gas exhaust pipe, and a member that easily wears out and troublesome work are not provided, and the replacement is easy. For this reason, man-hours are not required, and the operation is unlikely to be affected. Further, the replaced gas exhaust pipe is cleaned and reused, so that there is no waste.

【0030】上記各実施形態及び方法によれば、配管外
周辺が真空化されることにより、ガス排気配管の放熱を
防ぎ、排気の温度低下を防ぐ。これにより、ガス排気配
管内壁への反応生成物付着、堆積の防止効果は相当期待
できる。この結果、半導体製造装置からの排ガスに対し
共に流す稀釈ガスを大幅に減少させることができる。こ
のことは、排ガスを除害する際の除害効率を向上させる
ことを意味し、エネルギー環境を配慮した高信頼性の半
導体製造システムの設備に寄与する。
According to each of the above-described embodiments and methods, the outside of the pipe is evacuated to prevent heat dissipation from the gas exhaust pipe and prevent the temperature of exhaust gas from decreasing. Thereby, the effect of preventing the reaction products from adhering to and depositing on the inner wall of the gas exhaust pipe can be expected considerably. As a result, it is possible to greatly reduce the dilution gas that flows together with the exhaust gas from the semiconductor manufacturing apparatus. This means that the efficiency of removing exhaust gas is improved, and it contributes to the equipment of a highly reliable semiconductor manufacturing system in consideration of the energy environment.

【0031】[0031]

【発明の効果】以上説明したように本発明によれば、ガ
ス排気配管外周辺が真空化されることにより、ガス排気
配管外周表面が保温され、排ガスが製造チャンバから排
出された直後の温度に近い状態で通過することになる。
希釈ガスを多量に流さなくても、排気配管の内壁に反応
生成物の付着を防止でき、最終的な排ガス処理機構の負
荷を軽減し、除害効率が向上する。また、外周辺を真空
化するガス排気配管をスペアで準備し定期的に交換す
る。取り外した配管は洗浄して再利用する。この結果、
排気配管の内壁への反応生成物の付着、堆積を抑え、か
つ容易で効率的な排気配管のメンテナンス作業が実現さ
れる半導体製造装置及びその排気配管及びメンテナンス
方法を提供することができる。
As described above, according to the present invention, the outer peripheral surface of the gas exhaust pipe is evacuated, so that the outer peripheral surface of the gas exhaust pipe is kept warm and the exhaust gas is brought to a temperature immediately after being discharged from the manufacturing chamber. You will pass in a close condition.
Even if a large amount of diluent gas does not flow, the reaction products can be prevented from adhering to the inner wall of the exhaust pipe, the load on the final exhaust gas treatment mechanism can be reduced, and the removal efficiency can be improved. Also, prepare a spare gas exhaust pipe to evacuate the outside and replace it regularly. The removed pipe should be washed and reused. As a result,
It is possible to provide a semiconductor manufacturing apparatus, an exhaust pipe, and a maintenance method for the same, which can prevent the reaction product from adhering to and deposit on the inner wall of the exhaust pipe and realize an easy and efficient maintenance work of the exhaust pipe.

【図面の簡単な説明】[Brief description of drawings]

【図1】 本発明の一実施形態に係る半導体製造装置の
要部構成を示す概観図である。
FIG. 1 is a schematic view showing a main configuration of a semiconductor manufacturing apparatus according to an embodiment of the present invention.

【図2】 本発明の一実施形態に係る半導体製造装置の
排気配管の要部構成を示す断面図である。
FIG. 2 is a cross-sectional view showing a main configuration of an exhaust pipe of a semiconductor manufacturing apparatus according to an embodiment of the present invention.

【図3】 図2を参照した半導体製造装置におけるガス
排気配管のメンテナンス方法を示すフローチャートであ
る。
FIG. 3 is a flowchart showing a method of maintaining a gas exhaust pipe in the semiconductor manufacturing apparatus with reference to FIG.

【図4】 従来の半導体製造装置の要部を示す概観図で
ある。
FIG. 4 is a schematic view showing a main part of a conventional semiconductor manufacturing apparatus.

【符号の説明】[Explanation of symbols]

100…半導体製造装置本体 11,41…処理室 12,21,21a,21b,42…ガス排気配管 13…排ガス処理機構 14…外周管 141,24…バキューム口 22,22a,22b…中継接続部 23…二重配管部 231…内管 232…外管 25…フレキシブルホース 26…クランプリング 43…除害装置 S1〜S4…処理ステップ DP…ドライポンプ 100 ... Semiconductor manufacturing equipment main body 11, 41 ... Processing room 12, 21, 21a, 21b, 42 ... Gas exhaust pipe 13 ... Exhaust gas treatment mechanism 14 ... Peripheral tube 141, 24 ... Vacuum mouth 22, 22a, 22b ... Relay connection section 23 ... Double piping section 231 ... Inner tube 232 ... Outer tube 25 ... Flexible hose 26 ... Clamp ring 43 ... Harmful device S1 to S4 ... Processing steps DP ... Dry pump

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】 半導体製造に関し、製造チャンバ内での
化学気相反応に伴なって排出される排ガスを導くガス排
気配管と、 少なくとも前記ガス排気配管の所定距離において設けら
れ配管外周辺が真空化される外周管と、を具備したこと
を特徴とする半導体製造装置。
1. Regarding semiconductor manufacturing, a gas exhaust pipe for guiding exhaust gas discharged along with a chemical vapor phase reaction in a manufacturing chamber, and a vacuum provided at least at a predetermined distance of the gas exhaust pipe, around the outside of the pipe. Outer peripheral tube, and a semiconductor manufacturing apparatus.
【請求項2】 前記外周管は、半導体製造のラインで配
備されている真空引き系を共有して真空化されているこ
とを特徴とする請求項1記載の半導体製造装置。
2. The semiconductor manufacturing apparatus according to claim 1, wherein the outer peripheral tube is evacuated by sharing a vacuuming system provided in a semiconductor manufacturing line.
【請求項3】 前記外周管は、専用に配備した真空ポン
プを利用して真空化されていることを特徴とする請求項
1記載の半導体製造装置。
3. The semiconductor manufacturing apparatus according to claim 1, wherein the outer peripheral tube is evacuated by using a vacuum pump provided exclusively for the outer peripheral tube.
【請求項4】 半導体製造に伴なうガス排気配管であっ
て、 両端部それぞれの中継接続部と、 中継接続部間に設けられ、配管外周辺を真空領域で囲む
二重配管部と、を具備したことを特徴とする半導体製造
装置の排気配管。
4. A gas exhaust pipe for use in semiconductor manufacturing, comprising: a relay connecting portion at each of both ends, and a double pipe portion provided between the relay connecting portions and surrounding the outside of the pipe with a vacuum region. An exhaust pipe for a semiconductor manufacturing apparatus, which is characterized by being provided.
【請求項5】 前記二重配管部は配管外周辺を真空引き
する吸気部が備えられていることを特徴とする請求項4
記載の半導体製造装置の排気配管。
5. The double pipe section is provided with an intake section for evacuating the periphery of the pipe.
Exhaust pipe of the semiconductor manufacturing apparatus described.
【請求項6】 半導体製造の製造チャンバ内での化学気
相反応に伴なって排出される排ガスを導くガス排気配管
について、 前記ガス排気配管は、両端部それぞれの中継接続部と、
中継接続部間に設けられ配管外周辺を真空領域で囲む二
重配管部とを具備し、 前記ガス排気配管のスペアを準備し、中継接続部で取り
外して二重配管部を伴なう所定距離のガス排気配管ごと
交換することを特徴とする半導体製造装置におけるガス
排気配管のメンテナンス方法。
6. A gas exhaust pipe for guiding an exhaust gas discharged in association with a chemical vapor phase reaction in a semiconductor manufacturing chamber, wherein the gas exhaust pipe is provided with relay connecting portions at both ends thereof.
A double pipe part provided between the relay connection parts and surrounding the outside of the pipe with a vacuum region is prepared, and a spare of the gas exhaust pipe is prepared and detached at the relay connection part, and a predetermined distance with the double pipe part is provided. And a gas exhaust pipe maintenance method for a semiconductor manufacturing apparatus, wherein the gas exhaust pipe is replaced together.
【請求項7】 交換された前記ガス排気配管は洗浄して
再利用することを特徴とする請求項6記載の半導体製造
装置におけるガス排気配管のメンテナンス方法。
7. The maintenance method of a gas exhaust pipe in a semiconductor manufacturing apparatus according to claim 6, wherein the replaced gas exhaust pipe is washed and reused.
JP2001315860A 2001-10-12 2001-10-12 Semiconductor manufacturing apparatus and its exhaust pipeline and maintenance method Withdrawn JP2003124127A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001315860A JP2003124127A (en) 2001-10-12 2001-10-12 Semiconductor manufacturing apparatus and its exhaust pipeline and maintenance method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001315860A JP2003124127A (en) 2001-10-12 2001-10-12 Semiconductor manufacturing apparatus and its exhaust pipeline and maintenance method

Publications (1)

Publication Number Publication Date
JP2003124127A true JP2003124127A (en) 2003-04-25

Family

ID=19133971

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP2003124127A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007088940A1 (en) * 2006-02-02 2007-08-09 Tokyo Electron Limited Pressure reducing apparatus
WO2008143442A1 (en) * 2007-05-17 2008-11-27 Lot Vacuum Co., Ltd. Intergrated apparatus for vacuum producing
US10669626B2 (en) 2017-06-26 2020-06-02 Kabushiki Kaisha Toshiba Processing system and processing method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007088940A1 (en) * 2006-02-02 2007-08-09 Tokyo Electron Limited Pressure reducing apparatus
WO2008143442A1 (en) * 2007-05-17 2008-11-27 Lot Vacuum Co., Ltd. Intergrated apparatus for vacuum producing
US10669626B2 (en) 2017-06-26 2020-06-02 Kabushiki Kaisha Toshiba Processing system and processing method

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