JP2003098209A - Inspection device for electronic part - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an inspection device for an electronic part, capable of performing inspection and classification required for electronic parts without any increase in size of a turntable for conveying electronic parts and lowering of throughput, and attaching a post-processing means for the electronic parts. SOLUTION: An inspection device 10 for an electronic part includes a first turntable 12 where a cavity 14 is formed. An electronic part is fed to a cavity 14 by a part feeder 16, intermittently rotated by the first turntable 12, to be inspected by a first, second and third inspection parts 18, 20, 22. The electronic part is discharged by a discharge device 28, and delivered to a cavity 26 in a second turntable 24. According to the inspection data of the inspection parts, a defective part is discharged by a defective part discharge part 30, and ranked and discharged by a ranking and discharge part 32.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a device for inspecting electronic parts, and more particularly to inspecting or measuring the characteristics of electronic parts such as a monolithic ceramic capacitor (hereinafter referred to as "inspection"). The present invention relates to an inspection device for electronic parts.

[0002]

2. Description of the Related Art FIG. 10 is an illustrative view showing one example of a conventional electronic component inspection apparatus. The inspection device 1 includes a disc-shaped turntable 2. On the outer circumference of the turntable 2,
A plurality of cavities 3 for holding electronic components are formed. The turntable 2 is driven so as to rotate intermittently, and an electronic component is supplied to the cavity 3 by the component supply unit 4. The electronic component held in the cavity 3 is conveyed by the rotation of the turntable 2, and as shown in FIG.
The first inspection unit 5 inspects capacitance, dielectric loss tangent, and the like. Furthermore, electronic parts are transported on the turntable 2,
The second inspection unit 6 inspects withstand voltage, insulation resistance, and the like.

After these inspections have been carried out, the turntable 2 conveys the electronic parts to the defective product discharging section 7, and classifies them into defective types, for example, and discharges the defective products.
Further, the turntable 2 conveys the electronic components to the rank-dividing and discharging unit 8, and based on the inspection results of the inspection units 5 and 6, the electronic components are ranked according to, for example, the difference in capacitance, and are classified into respective ranks. Is discharged. In such an inspection apparatus 1, as shown in FIG. 12, there is a turntable 2 in which two or more concentric cavities 3 or more cavities 3 are formed.

In a monolithic ceramic capacitor or the like, the dielectric property is polarized by a withstand voltage test and the electrical characteristics change, so that the electronic components discharged after being classified into predetermined ranks are subjected to post-treatment such as heat treatment. Is applied to restore the characteristics of electronic parts. Such post-processing is performed by a process different from the above-mentioned inspection process.

[0005]

In recent years, high-speed operation of equipment has been required even in inspection devices for electronic parts. However, the withstand voltage inspection and insulation resistance inspection of electronic parts require a predetermined inspection time and number of inspections due to their rated characteristics, so each function as described above is placed within the rotation range of one turntable, and high-speed operation is performed. If the stop time of the intermittent rotation is shortened in order to achieve the above, it is impossible to secure a predetermined inspection time.

When the rotation speed of intermittent rotation is increased,
There is a limit due to physical restrictions such as deterioration of stop accuracy of the turntable. Therefore, if the diameter of the turntable is increased, even if the stop time of intermittent rotation is shortened, the moving time of the electronic component becomes longer, so that the inspection time can be secured. However, in this case, the problem that the turntable stopping accuracy is deteriorated cannot be solved because the moment of inertia increases due to the increase in the diameter of the turntable.

Further, in recent electronic parts, due to the expansion of the rated characteristics and the combination of functions, the inspection time and the number of inspections and the number of inspection items are increasing. Therefore, when all the inspection functions are arranged within the rotation range of one turntable, the stop time of the intermittent rotation of the turntable is increased to secure the inspection time and the number of inspections, and the number of conventional inspection items is reduced. As a result, an inspection unit for a new inspection item is arranged, and as a result, the processing capacity of the inspection device is reduced. On the other hand, if a plurality of inspection devices are introduced, the processing capacity per unit time is improved, but new problems such as a high equipment cost and an increased installation space arise.

Further, the post-treatment time for heating the electronic parts is, for example, 150 ° C. when using an oven of another facility.
It takes 30 to 60 minutes. for that reason,
For the purpose of automating the post-processing work, heat the containers that store the electronic components discharged in the ranking discharge unit,
It is conceivable that the discharged electronic parts are automatically post-processed by being stored in a container. However, in this case, there is a problem in that the processing time differs between the electronic component initially contained in the container and the electronic component finally contained in the container, resulting in a difference in characteristic recovery level.

Therefore, it is conceivable to arrange a post-treatment process within the rotation range of the turntable to secure a constant post-treatment time. However, in this case, in addition to the number of cavities required for the inspection / classification function, cavities for post-treatment are required, and it is necessary to increase the diameter of the turntable according to the number of cavities. Increases driving force and equipment size. If the post-processing function is to be mounted on the turntable without increasing the diameter of the turntable, it is necessary to reduce the number of cavities required for the inspection function, but it takes a certain amount of time for electrical inspection of electronic components. As a result, the processing capacity of the entire device is reduced.

Therefore, a main object of the present invention is to perform necessary inspection and classification as an electronic component without increasing the size of a turntable for transporting the electronic component or deteriorating the processing capacity. An object of the present invention is to provide an inspection device for electronic parts, to which post-processing means can be added.

[0011]

SUMMARY OF THE INVENTION According to the present invention, a rotatable turntable in which a plurality of cavities for holding electronic components are formed in a predetermined pattern, drive means for intermittently rotating the turntable, and a cavity of the turntable. Component supplying means for supplying electronic components to the cavity, inspection means for inspecting the electronic components supplied to the cavity by the component supplying means within the rotation range of the turntable, and a state in which the order and arrangement of the electronic components are maintained. The electronic device includes a discharging means for discharging electronic components from the turntable, a transporting means for receiving and transporting the discharged electronic components, and a sorting means for sorting the electronic components based on the result of the inspection by the inspection means. It is an inspection device for parts. In such an electronic component inspection apparatus, after the electronic component is inspected by the inspection means, a post-processing means may be installed for performing a required post-processing on the electronic component within the rotation range of the turntable. Further, after the electronic device is inspected by the inspection device, a post-processing device may be installed for performing necessary post-processing on the electronic device within the transportation range of the transportation device. Further, as the post-processing means, the electronic component is heated for a predetermined time, or the electronic component is brought into contact with and electrically processed for a predetermined time. Further, as the conveying means, the electronic parts discharged by the discharging means may be a second turntable other than the turntable that rotates intermittently, or a conveyor belt that operates intermittently. Further, it is preferable that a support means is arranged on the lower surface side of the turntable so as to prevent the electronic parts transported by the turntable from falling, jumping out, and being displaced from the cavity while being transported to the discharging means. Further, the cavities of the turntable are arranged in one row on a concentric circle, or are arranged in a plurality of rows on a concentric circle, and the cavities of adjacent rows are arranged on a radial straight line of the turntable. To be At this time, when the cavities formed in the turntable are arranged in one row on a concentric circle, the order of the electronic components is maintained, and when the cavities formed in the turntable are arranged in a plurality of rows. While maintaining the order and arrangement of the electronic parts, the electronic parts are delivered to the carrying means, and the inspection result of the inspection means is sent to the classification means to classify the electronic parts.

By forming the conveying means separately from the turntable and classifying the electronic parts within the conveying range of the conveying means, the sorting means which has been arranged within the rotation range of the turntable is arranged outside the turntable. can do. Therefore, the inspection time can be secured without increasing the size of the turntable or changing the intermittent rotation time of the turntable, and new inspection items can be added. Further, by disposing the classification means outside the turntable, the post-treatment process can be arranged within the rotation range of the turntable, and the post-treatment process can be automated. By disposing such a post-treatment process on the side of the transport means, a new space can be secured within the rotation range of the turntable, and inspection items can be added. As the post-treatment, it is possible to recover the characteristics changed at the time of inspection by heating the electronic component or perform an electrical treatment. Further, if the second turntable that rotates intermittently or the conveyor belt that operates intermittently is used as the conveying means and the conveyor belt is operated in synchronization with the turntable, the discharged electronic components can be received without changing the order or arrangement. You can Further, by providing the supporting means on the lower surface of the turntable, it is possible to prevent the electronic component from dropping from the cavity during transportation. Further, the cavities of the turntable may be arranged in one row on the concentric circle, or may be arranged in a plurality of rows on the concentric circle and the cavities of adjacent rows may be positioned on the radial straight line of the turntable. You may arrange. With such an arrangement, the component supply means can easily supply the electronic component to the cavity. Then, the electronic components conveyed by the turntable are delivered to the conveying means without changing the order and arrangement thereof, so that the electronic components can be classified according to the result of the inspection by the inspection means.

The above objects, other objects, features and advantages of the present invention will become more apparent from the following detailed description of the embodiments of the invention with reference to the drawings.

[0014]

FIG. 1 is an illustrative view showing an example of an electronic component inspection apparatus of the present invention. The inspection device 10 includes a disc-shaped first turntable 12. A plurality of groove-shaped cavities 1 are provided on the outer periphery of the first turntable 12.
4 is formed. The first turntable 12 is attached to a driving device as a driving means, and is intermittently rotated by this driving device. That is, for example, the first turntable 12 is continuously or continuously rotated by a predetermined angle, then stopped for a predetermined time, and again rotated by a predetermined angle.

On the outer periphery of the first turntable 12,
A component supply unit 16 as a component supply means is provided. In the component supply unit 16, an electronic component such as a monolithic ceramic capacitor is supplied to the cavity 14 of the first turntable 12. In addition, when there is a risk that the electronic component falls from the first turntable 12, jumps out, or is displaced, a support plate is provided on the lower surface of the first turntable 12 as a support means.

Further, in the rotation range of the first turntable 12, the first inspection unit 18, the second inspection unit 20, and the third inspection unit are provided downstream of the component supply unit 16 as inspection means.
The inspection unit 22 is provided. When a monolithic ceramic capacitor is used as the electronic component, the first inspecting unit 18 inspects, for example, capacitance and dielectric loss tangent. Further, in the second inspection section 20, the withstand voltage and the insulation resistance are inspected. Further, the second inspection unit 20
If the inspection time is insufficient in the third inspection unit 2
In 2, the withstanding voltage and the insulation resistance are continuously inspected. If there is an additional inspection item other than the above-described inspection, the third inspection unit 22 can inspect the additional item.

A second turntable 24 as a conveying means is provided adjacent to the first turntable 12. The second turntable 24 also has a plurality of cavities 26 formed on the outer periphery thereof and is attached to a drive device for intermittent rotation. The first turntable 12 and the second turntable 24 are intermittently rotated synchronously,
The turntables 12 and 24 are operated so that the turntables 12 and 24 are stopped for a predetermined time at the portions where the cavities 14 and 26 on the outer peripheral portions are adjacent to each other.

A discharge device 28 as a discharge means is provided at a location where the cavities 14 and 26 of the first turntable 12 and the second turntable 24 are adjacent to each other. In the discharging device 28, the electronic components held in the cavity 14 of the first turntable 12 are discharged and
It is delivered to the cavity 26 of the turntable 24. At this time, from the cavity 14 of the first turntable 12 to the cavity 26 of the second turntable 24.
By transferring electronic components one by one,
The order of electronic components on the turntable 12 and the order of electronic components on the second turntable 24 can be the same.

On the outer periphery of the second turntable 24,
A defective product discharge unit 30 and a rank-classified discharge unit 32 are provided as classification means. In the defective product discharging unit 30, for example, a first defective product discharging unit is formed, and the inspection units 18, 20, 2 are provided.
Based on the result of the inspection in 2, it is classified and discharged according to the cause of the defect. The rank-classified discharge unit 32 classifies the electronic parts into five ranks according to characteristics such as capacitance, and discharges the electronic components. The number of these classifications can be changed appropriately.

FIG. 2 shows how the inspection device 10 is used to inspect an electronic component. In the inspection apparatus 10, the component supply unit 16 supplies the electronic component to the cavity 14 of the first turntable 12 and holds the electronic component in the cavity 14. The first turntable 12 is
The drive device intermittently rotates, and electronic components are supplied while the drive device is stopped.

With the first turntable 12, the first
Inspection unit 18, second inspection unit 20, and third inspection unit 2
The electronic components are transported in the order of 2. The inspection part is preferably 3 or more, and more preferably 4 to 5 or more,
If it is too large, the turntable becomes large, which is not preferable. In these inspection units 18, 20, and 22, inspection is performed for electrostatic capacitance, dielectric loss tangent, withstand voltage, insulation resistance, and other items, and the electronic component is conveyed to the discharging device 28. The data related to the inspected result is transferred to the defective product discharging unit 30 and the rank-classifying discharging unit 32.

In the discharging device 28, the electronic components are discharged from the first turntable 12 and the second turntable 2 is discharged.
The electronic component is held in the cavity 26 of No. 4. At this time, the electronic components are delivered to the second turntable 24 in the order held by the first turntable 12. In the discharge device 28, the electronic components are forcibly discharged by, for example, compressed air, gravity, suction, and the like, and even on the second turntable 24 side, the electronic components are reliably captured by a method such as suction. Is used.

By the second turntable 24, the electronic parts are conveyed to the defective product discharge section 30, and the inspection sections 18, 2
Based on the inspection data sent from Nos. 0 and 22, they are classified by defect type and discharged. Further, the electronic components that are not discharged by the defective product discharging unit 30 are conveyed to the rank-classifying discharging unit 32, and are ranked according to the characteristics such as capacitance based on the inspection data of the inspection units 18, 20, 22. It is divided and discharged. At this time, since the electronic components are delivered to the second turntable 24 in the same order as the electronic components held on the first turntable 12, the inspection of the inspection units 18, 20, 22 is performed. Electronic components can be classified according to the data.

As described above, in the inspection device 10, the second
Since there is a defective product discharging section 30 and a rank-classifying discharging section 32 on the turntable 24 side of the first turntable 1
On the second side, it is possible to widen the range in which the inspection unit is provided. Therefore, the inspection time and the number of inspections of the electronic component can be sufficiently secured without increasing the size of the first turntable 12. Thereby, even if the stop time of the first turntable 12 is shortened, high-speed operation can be achieved while maintaining a predetermined inspection time. Also, the first
Since it is not necessary to increase the size of the turntable 12, the rotation speed of the first turntable 12 can be increased to the limit of physical restrictions such as deterioration of stop accuracy, and high speed operation can be achieved in this respect as well. You can

Further, even if the inspection time, the number of inspections, and the inspection items are increased due to the expansion of the rated characteristics of electronic parts and the combination of functions, the inspection is performed in the space where the defective products are conventionally discharged or ranks are discharged. It is possible to prevent the deterioration of the processing capacity of the inspection device 10.
Further, in addition to the first turntable 12 having a portion for inspecting electronic components, a second turntable 24 having a defective product discharging section 30 and a rank-classifying discharging section 32 is separately provided, which is a relatively simple configuration. Inspection device 1
High speed operation of 0 can be achieved. Therefore, it is possible to minimize the problem of soaring equipment costs and installation space.

In such an inspection apparatus 10, as shown in FIG. 3, the cavity 1 of the first turntable 12 is
4 may be formed in two rows on a concentric circle. In this case, the hole-shaped cavities 14 in the adjacent rows are arranged so as to be located on the radial straight line of the first turntable 12.
By arranging the cavities 14 in this way, it is possible to facilitate the supply of electronic components in the component supply unit 16.

In this case, the second turntable 2
The four cavities 26 are also formed in two concentric rows, and the cavities 26 in the adjacent rows are arranged so as to be located on a straight line in the radial direction of the second turntable 24. And
The interval between the cavities 26 adjacent in the concentric direction is not particularly limited, but the cavity 26 in the shape of a hole adjacent in the radial direction.
Is arranged so as to be the same as the interval between the cavities 14 that are adjacent to each other in the radial direction of the first turntable 12. In this way, in the discharging device 28, the cavities 14 and 26 of the two turntables 12 and 24 can be stopped in an overlapping state, and electronic components can be easily delivered and received. Then, the electronic components held on the first turntable 12 are delivered to the second turntable 24 while maintaining their order and arrangement. Thereby, the electronic components can be classified based on the inspection data in the inspection units 18, 20, and 22.

In this way, the two turntables 12,
Even when the 24 cavities 14 and 26 are formed in two rows, the above-described effects can be obtained and the inspection of the electronic component can be speeded up. Of course, three or more rows of cavities 14 and 26 may be formed on the concentric circles of these turntables 12 and 24. Also in this case, the cavities 1 in the adjacent rows
4, 26 are arranged so as to be located on the radial straight lines of the respective turntables 12, 24.

Further, instead of the third inspection section 22 shown in FIG. 1, a post-processing section 34 as a post-processing means may be provided within the rotation range of the first turntable 12 as shown in FIG. Good. In the post-processing unit 34, as shown in FIG. 5, for example, post-processing is performed on the electronic component whose characteristics have been changed by the inspection in the inspection units 18 and 20, and the characteristic of the electronic component is restored. When inspecting a monolithic ceramic capacitor, the voltage applied for the withstand voltage inspection causes polarization in the dielectric and changes the characteristics. Therefore, the post-processing unit 34
The heat treatment in step removes the polarization of the dielectric. As such post-treatment, for example, a post-treatment method can be selected depending on the type of the electronic component, such as contacting the terminal with the electronic component to perform electrical treatment.

In this inspection apparatus 10, by disposing the defective product discharging section 32 and the rank class discharging section 34 on the second turntable 24 side, the post-processing section 34 is within the rotation range of the first turntable 12. Can be placed. As a result, the post-treatment process can be automated, and all electronic components can be treated for a predetermined time. As described above, by inline the processing time of 30 minutes to 60 minutes, which has been conventionally spent in the separate process oven or the like, it is possible to suppress the increase of only a few seconds and reduce the overall production lead time. be able to.

Further, since all the electronic parts can be post-processed in a constant processing time, it is possible to reduce the variation in the characteristic recovery level in the post-processing. In such an inspection device 10, in addition to the first turntable 12 having a portion for inspecting an electronic component, a second turntable 24 having a defective product discharge section 30 and a rank classified discharge section 32 is separately provided. With such a relatively simple configuration, the post-processing function such as heating is provided with the first turntable 12
Can be arranged within the rotation range of. Therefore, the post-processing can be performed in the same device without changing the diameter of the first turntable 12, and an increase in driving force of the first turntable 12 and an increase in equipment size can be avoided. Further, by disposing the defective product discharging section 30 and the rank-classifying discharging section 32 on the second turntable 24 side, it is possible to change the time and frequency of the electrostatic capacity, dielectric loss tangent inspection, withstand voltage, and insulation resistance inspection. Instead, post-processing can be performed in the same device.

Also in the inspection apparatus 10 provided with such a post-processing section 34, as shown in FIG. 6, the first turntable 12 and the second turntable 24 are provided with two concentric circular holes. The cavities 14 and 26 may be formed. Also in this case, the cavities 1 in the adjacent rows
4, 26 are arranged on a straight line in the radial direction of the turntables 12, 24. By forming the cavities 14 and 26 as described above, a large number of electronic components can be inspected. Of course, on each turntable 12, 24,
The cavities 14 and 26 can be formed in three or more rows on a concentric circle.

Further, as shown in FIG. 7, a post-processing section 34 may be arranged on the second turntable 24 side. In this case, as shown in FIG. 8, the electronic device is ejected from the first turntable 12 by the ejection device 28 and is delivered to the second turntable 24, and then the post-processing unit 34.
In, the electronic component is subjected to post-treatment such as heat treatment.
Then, defective products are discharged by the defective product discharge unit 30, and ranked by the rank classification discharge unit 32 to classify electronic components. In such an inspection device 10, since there is no post-processing unit on the first turntable 12 side, it is possible to increase the space of the inspection units 18 and 20 on the first turntable 12 side. Although only the first inspection unit 18 and the second inspection unit 20 are shown in FIG. 7,
A third inspection part 22 as shown in FIG. 1 may be formed. In this way, by disposing the post-processing unit 34 on the second turntable 24 side, it is possible to secure time for inspection,
It is easy to increase new inspection items for electronic parts.

By disposing the post-processing unit 34 on the second turntable 24 side, the inspection units 18, 20, 2 are arranged.
Since the temperature increase of the first turntable 12 having the number 2 is suppressed, the inspection can always be performed at room temperature. Such a post-processing unit 34 is used as the second turntable 2
Also in the inspection device 10 arranged on the fourth side, as shown in FIG. 9, two rows of cavities 14, 26 are concentrically arranged on the first turntable 12 and the second turntable 24.
May be formed, or cavities of three rows or more may be formed.

As the conveying means for conveying the electronic components discharged from the first turntable 12, a conveyor belt or the like may be used in addition to the second turntable.
Electronic components can be conveyed in a straight line. Even in such a case, the above-described effects can be obtained by disposing the defective product discharging unit 30 and the rank-classifying discharging unit 32 on the conveyor belt side.

[0036]

According to the present invention, the electronic parts are transferred from the first turntable to another carrying means, and the electronic parts are classified on the carrying means side, thereby significantly increasing the equipment cost and the equipment size. It is possible to obtain an inspection device for electronic parts, which can secure an inspection time for electronic parts while preventing the above, and can realize high-speed operation. Further, by eliminating the electronic part sorting means from the first turntable side, a space for post-processing of electronic parts can be secured, and post-processing can be automated to realize high-speed operation. it can.

[Brief description of drawings]

FIG. 1 is an illustrative view showing an example of an electronic component inspection apparatus of the present invention.

FIG. 2 is a block diagram showing each step in the inspection device shown in FIG.

FIG. 3 is an illustrative view showing a modified example of the inspection device shown in FIG. 1.

FIG. 4 is an illustrative view showing another example of the electronic component inspection apparatus of the present invention.

5 is a block diagram showing each step in the inspection device shown in FIG.

FIG. 6 is an illustrative view showing a modified example of the inspection device shown in FIG. 4.

FIG. 7 is an illustrative view showing still another example of the electronic component inspection apparatus of the present invention.

8 is a block diagram showing each step in the inspection apparatus shown in FIG.

FIG. 9 is an illustrative view showing a modified example of the inspection device shown in FIG. 7.

FIG. 10 is an illustrative view showing one example of a conventional electronic component inspection apparatus.

11 is a block diagram showing each step of the conventional inspection device shown in FIG.

12 is an illustrative view showing a modified example of the conventional inspection apparatus shown in FIG.

[Explanation of symbols]

10 Inspection device 12 First Turntable 14 cavities 16 parts supply department 18 First Inspection Department 20 Second inspection section 22 Third Inspection Department 24 Second Turntable 26 cavities 28 Ejector 30 Defective product discharge section 32 Rank Discharge Department 34 Post Processing Department

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Claims (8)

[Claims] 1. A rotatable turntable having a plurality of cavities for holding electronic components formed in a predetermined pattern, driving means for intermittently rotating the turntable, and supplying the electronic components to the cavities of the turntable. A component supply unit for inspecting the electronic component supplied to the cavity by the component supply unit within a rotation range of the turntable, the turn while maintaining the order and arrangement of the electronic components An electronic device including a discharging device for discharging the electronic component from the table, a transporting device for receiving and transporting the discharged electronic component, and a sorting device for sorting the electronic component based on a result of inspection by the inspection device. Parts inspection equipment. 2. The post-processing means for performing required post-processing on the electronic component within the rotation range of the turntable after the inspection means has inspected the electronic component. Inspection device for electronic parts. 3. The post-processing unit according to claim 1, further comprising a post-processing unit for performing a required post-processing on the electronic component within a transportation range of the transportation unit after the inspection unit inspects the electronic component. Inspection device for electronic parts. 4. The post-processing means is characterized in that the electronic component is heated for a predetermined time, or is brought into contact with the electronic component to perform an electrical treatment for a predetermined time. The electronic component inspection device according to claim 2 or 3. 5. The conveying means is a second turntable that intermittently rotates the electronic component discharged by the discharging means other than the turntable, or a conveyor belt that operates intermittently. An electronic component inspection apparatus according to any one of claims 1 to 4. 6. A support means for supporting, on the lower surface side of the turntable, the electronic component carried by the turntable so as not to drop, jump out, or be displaced from the cavity while being carried to the discharging means. The electronic device inspection apparatus according to any one of claims 1 to 5, further comprising: 7. The cavities of the turntable are arranged in one row on a concentric circle, or are arranged in a plurality of rows on a concentric circle, and the cavities of adjacent rows are arranged in a radial straight line of the turntable. 7. The electronic component inspection device according to claim 1, which is provided so as to be located above. 8. When the cavities formed in the turntable are arranged in a row on a concentric circle, the cavities formed in the turntable are arranged in a plurality of rows while maintaining the order of the electronic components. In the case where the electronic components are arranged in the same manner, the electronic components are sorted while the order and arrangement of the electronic components are maintained, and the results of the inspection performed by the inspection unit are sent to the transportation unit. The inspection device for an electronic component according to claim 7.