JP2003083906A5 - - Google Patents

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Publication number
JP2003083906A5
JP2003083906A5 JP2001281504A JP2001281504A JP2003083906A5 JP 2003083906 A5 JP2003083906 A5 JP 2003083906A5 JP 2001281504 A JP2001281504 A JP 2001281504A JP 2001281504 A JP2001281504 A JP 2001281504A JP 2003083906 A5 JP2003083906 A5 JP 2003083906A5
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JP
Japan
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JP2001281504A
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JP4695793B2 (ja
JP2003083906A (ja
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Priority to JP2001281504A priority Critical patent/JP4695793B2/ja
Priority claimed from JP2001281504A external-priority patent/JP4695793B2/ja
Publication of JP2003083906A publication Critical patent/JP2003083906A/ja
Publication of JP2003083906A5 publication Critical patent/JP2003083906A5/ja
Application granted granted Critical
Publication of JP4695793B2 publication Critical patent/JP4695793B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2001281504A 2001-09-17 2001-09-17 光反射性球面の光学的観察装置 Expired - Fee Related JP4695793B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001281504A JP4695793B2 (ja) 2001-09-17 2001-09-17 光反射性球面の光学的観察装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001281504A JP4695793B2 (ja) 2001-09-17 2001-09-17 光反射性球面の光学的観察装置

Publications (3)

Publication Number Publication Date
JP2003083906A JP2003083906A (ja) 2003-03-19
JP2003083906A5 true JP2003083906A5 (ja) 2008-10-23
JP4695793B2 JP4695793B2 (ja) 2011-06-08

Family

ID=19105317

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001281504A Expired - Fee Related JP4695793B2 (ja) 2001-09-17 2001-09-17 光反射性球面の光学的観察装置

Country Status (1)

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JP (1) JP4695793B2 (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2437980B (en) * 2006-05-13 2010-05-19 Optical Reference Systems Ltd Apparatus for measuring semiconductor physical characteristics
JP4919502B2 (ja) * 2007-05-21 2012-04-18 有限会社シマテック Ｌｅｄ照明装置
CN104111204B (zh) * 2013-04-22 2017-05-24 联想(北京)有限公司 耐磨性测试设备及底板
CN118294459B (zh) * 2024-06-06 2024-10-18 宁德时代新能源科技股份有限公司 防爆阀缺陷检测方法以及系统

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2507421B2 (ja) * 1987-04-28 1996-06-12 株式会社三協精機製作所 被検体の観測装置
JP3118503B2 (ja) * 1996-07-08 2000-12-18 シーシーエス株式会社 照明装置
JP3215858B2 (ja) * 1998-12-25 2001-10-09 ライオンエンジニアリング株式会社 物品外観検査装置
JP2000294680A (ja) * 1999-04-07 2000-10-20 Rohm Co Ltd Ｂｇａ型電子部品製造装置における半田ボール整列供給機構

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