JP2003075379A - Analyzer for temperature elevation elimination - Google Patents

Analyzer for temperature elevation elimination

Info

Publication number
JP2003075379A
JP2003075379A JP2001267131A JP2001267131A JP2003075379A JP 2003075379 A JP2003075379 A JP 2003075379A JP 2001267131 A JP2001267131 A JP 2001267131A JP 2001267131 A JP2001267131 A JP 2001267131A JP 2003075379 A JP2003075379 A JP 2003075379A
Authority
JP
Japan
Prior art keywords
sample
sample chamber
inert gas
chamber
gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001267131A
Other languages
Japanese (ja)
Other versions
JP3807600B2 (en
Inventor
Tadashi Arii
忠 有井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Denki Co Ltd
Rigaku Corp
Original Assignee
Rigaku Denki Co Ltd
Rigaku Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Denki Co Ltd, Rigaku Corp filed Critical Rigaku Denki Co Ltd
Priority to JP2001267131A priority Critical patent/JP3807600B2/en
Publication of JP2003075379A publication Critical patent/JP2003075379A/en
Application granted granted Critical
Publication of JP3807600B2 publication Critical patent/JP3807600B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To allow a sample to be replaced easily by simple structure, and to preclude the atmospheric air from intruding into a sample chamber or the like in the replacement of the sample for improving measurement accuracy. SOLUTION: This analyzer is provided with the freely openable and closable sample chamber 1a for arranging the sample, an infrared heating furnace 5 for heating the sample arranged in the sample chamber 1a, a mass spectrometer 6 for detecting gas eliminated from the sample by heating, a measuring chamber 3a for arranging a detecting part of a detecting means, and a gas flow passage 2a for communicating the sample chamber 1a with the measuring chamber 3a to be freely separable from the sample chamber 1a. The analyzer is provided also with a sample chamber protecting means for preventing the atmospheric air from intruding into the opened sample chamber 1a, using inert gas, and a flow passage protecting means for preventing the atmospheric air from intruding into the gas passage 2a opened and separated, using the inert gas.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】この発明は、熱分析装置の一
つである昇温脱離分析装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a thermal desorption analyzer which is one of thermal analyzers.

【0002】[0002]

【従来の技術】昇温脱離分析法は、固体試料の温度を一
定速度で昇温させたときに、試料から脱離する発生ガス
量を試料温度の関数として測定するための熱分析手法で
あり、TDS(Thermal Desorption Spectroscopy)ま
たはTPS(Temperature Programmed Desorption)と
も称される。この昇温脱離分析法は、試料を配置する試
料室と、試料室内の試料を加熱する加熱炉と、試料から
脱離したガスを検出する検出手段としての質量分析計
と、高真空雰囲気の測定環境を形成するためのターボ分
子ポンプ(TMP)とを備えた昇温脱離分析装置によっ
て実現される。
2. Description of the Related Art The temperature programmed desorption analysis method is a thermal analysis method for measuring the amount of evolved gas desorbed from a sample as a function of the sample temperature when the temperature of a solid sample is raised at a constant rate. Yes, it is also called TDS (Thermal Desorption Spectroscopy) or TPS (Temperature Programmed Desorption). This temperature programmed desorption analysis method comprises a sample chamber in which a sample is placed, a heating furnace for heating the sample in the sample chamber, a mass spectrometer as a detection means for detecting a gas desorbed from the sample, and a high vacuum atmosphere. It is realized by a thermal desorption analyzer equipped with a turbo molecular pump (TMP) for forming a measurement environment.

【0003】ここで、従来の一般的な昇温脱離分析装置
は、質量分析計の検出部が本体チャンバ内に配置され、
この本体チャンバに対して試料室が着脱自在となってお
り、試料交換の際は試料室を本体チャンバから切り離し
て大気に開放する構成となっていた。したがって、試料
交換に際し試料室内に大気が流入し、湿気を含む大気成
分が試料室の内面に付着することが避けられなかった。
Here, in the conventional general thermal desorption spectroscopy apparatus, the detection part of the mass spectrometer is arranged in the main chamber,
The sample chamber is detachable from the main body chamber, and when the sample is exchanged, the sample chamber is separated from the main body chamber and opened to the atmosphere. Therefore, it is inevitable that the atmosphere flows into the sample chamber during the sample exchange, and atmospheric components including moisture adhere to the inner surface of the sample chamber.

【0004】[0004]

【発明が解決しようとする課題】このように試料交換に
際して湿気を含む大気成分が試料室の内面に付着した場
合、その後に実施される試料の脱離分析において試料室
を加熱したとき、試料室の内面に付着した大気成分が脱
離してガスを発生する。このガスは試料から脱離したガ
スとともに質量分析計で検出されるため、この大気成分
から脱離したガスがバックグラウンドとなって試料特有
の脱離ガスの分解能を低下させてしまうという問題があ
った。
When atmospheric components including moisture adhere to the inner surface of the sample chamber during the sample exchange, the sample chamber is heated when the sample chamber is heated in the subsequent desorption analysis of the sample. Atmospheric components adhering to the inner surface of the are desorbed to generate gas. Since this gas is detected by the mass spectrometer together with the gas desorbed from the sample, there is a problem that the gas desorbed from this atmospheric component becomes the background and the resolution of the desorbed gas peculiar to the sample decreases. It was

【0005】そこで、従来も図4に示すような構造の昇
温脱離分析装置が開発されている。同図に示す従来の昇
温脱離分析装置は、ロードロックチャンバと称する試料
交換室100を備えており、この試料交換室100と試
料室101との間がゲードバルブ102によって開閉自
在となっている。試料交換に際しては、ゲートバルブ1
02を開いて試料室101から測定済みの試料Sを取り
出して試料交換室100に配置し、続いてゲートバルブ
102を閉じた後、試料交換室100に設けられた試料
交換用の開閉扉(図示せず)を開いて試料を交換する。
Therefore, conventionally, a thermal desorption analyzer having a structure as shown in FIG. 4 has been developed. The conventional thermal desorption analyzer shown in FIG. 1 includes a sample exchange chamber 100 called a load lock chamber, and a gate valve 102 allows opening and closing between the sample exchange chamber 100 and the sample chamber 101. . When exchanging samples, gate valve 1
02 is opened to take out the measured sample S from the sample chamber 101, the sample S is placed in the sample exchange chamber 100, the gate valve 102 is closed, and then an opening / closing door for sample exchange provided in the sample exchange chamber 100 (see FIG. Open (not shown) to replace the sample.

【0006】上記従来の昇温脱離分析装置において、試
料室101からの測定済み試料Sの取り出しおよび新規
測定試料の試料室101への搬送には、装置に組み込ま
れた搬送機構が使われる。この搬送機構は複雑で大形の
構造をしているため、装置全体が大形化することは避け
られない。しかも、この搬送機構を用いて試料が搬送さ
れる試料室101内も大きな容積が必要となるため、測
定時の真空排気に時間がかかるばかりか、高真空の実現
が困難であり測定精度が低下する問題があった。また、
試料交換の途中で、搬送機構から試料が脱落することも
あり、脱落した試料の取り出し作業はきわめて煩雑であ
った。
In the above-mentioned conventional thermal desorption analyzer, a transfer mechanism incorporated in the apparatus is used for taking out the measured sample S from the sample chamber 101 and transferring a new measurement sample to the sample chamber 101. Since this transport mechanism has a complicated and large-sized structure, it is inevitable that the entire apparatus becomes large-sized. In addition, since a large volume is required in the sample chamber 101 in which the sample is transferred using this transfer mechanism, not only it takes time to evacuate the vacuum during measurement, but also it is difficult to realize a high vacuum and the measurement accuracy deteriorates. There was a problem to Also,
The sample may fall off from the transport mechanism during the sample exchange, and the work of taking out the dropped sample was extremely complicated.

【0007】本発明はこのような従来の昇温脱離分析装
置特有の事情に鑑みてなされたもので、簡易な構造で容
易に試料交換ができ、しかも試料交換に際して試料室な
どへの大気の侵入を阻止して、測定精度の向上を図るこ
とを目的とする。
The present invention has been made in view of the circumstances peculiar to such a conventional thermal desorption analyzer, and the sample can be easily exchanged with a simple structure. The purpose is to prevent intrusion and improve the measurement accuracy.

【0008】[0008]

【課題を解決するための手段】上記目的を達成するため
に、本発明の昇温脱離分析装置は、試料を配置する開閉
自在な試料室と、この試料室に配置された試料を加熱す
る加熱手段と、加熱により試料から脱離したガスを検出
する検出部を有する検出手段と、開放された前記試料室
内への大気の流入を不活性ガスを用いて阻止する試料室
保護手段と、を備えたことを特徴とする(請求項1)。
In order to achieve the above object, the thermal desorption spectroscopy apparatus of the present invention heats a sample chamber in which a sample is placed and an openable and closable sample chamber. Heating means, a detection means having a detection part for detecting a gas desorbed from the sample by heating, and a sample chamber protection means for blocking the inflow of the atmosphere into the opened sample chamber by using an inert gas, It is characterized by being provided (Claim 1).

【0009】試料交換に際しては、試料室保護手段が不
活性ガスを用いて試料室内への大気の流入を阻止するの
で、試料室内面などに大気成分が付着するおそれがな
く、したがって測定雰囲気中への大気成分の混入による
測定精度の低下を防止することができる。しかも、試料
交換は、開放した試料室の開口から容易に行うことがで
き、さらに試料室保護手段は、不活性ガスを用いた機構
としてあるので、装置を大形化することもない。
During sample replacement, the sample chamber protection means uses an inert gas to block the inflow of the atmosphere into the sample chamber, so there is no risk of atmospheric components adhering to the inside of the sample chamber, etc. It is possible to prevent the measurement accuracy from deteriorating due to the mixing of the atmospheric component. Moreover, sample exchange can be easily performed from the opening of the open sample chamber, and since the sample chamber protection means has a mechanism using an inert gas, the device is not made large.

【0010】また、本発明の昇温脱離分析装置は、上記
構成に加え、検出手段の検出部を配置する測定室と、こ
の測定室と前記試料室とを連通するとともに前記試料室
を切り離し自在なガス導通路と、前記試料室が切り離さ
れて開口したガス導通路内への大気の流入を不活性ガス
を用いて阻止する導通路保護手段と、を備えた構成とす
ることもできる。(請求項2)。
Further, the temperature programmed desorption analyzer of the present invention has, in addition to the above configuration, a measurement chamber in which a detection portion of a detection means is arranged, the measurement chamber and the sample chamber are communicated with each other, and the sample chamber is separated. It is also possible to have a configuration including a free gas passage and a passage protection means for blocking the inflow of the atmosphere into the gas passage opened by disconnecting the sample chamber by using an inert gas. (Claim 2).

【0011】試料室が切り離されたガス導通路には、開
口から大気が侵入してその内面に付着するおそれがあ
る。ガス導通路内面への大気の付着は、試料室内面に大
気が付着した場合と同様に、測定精度の低下をもたら
す。そこで、上記構成とすることにより、試料交換に際
して、導通路保護手段が不活性ガスを用いてガス導通路
内への大気の流入を阻止するので、ガス導通路内面にも
大気成分が付着するおそれがなくなり、測定雰囲気中へ
の大気成分の混入による測定精度の低下をいっそう確実
に防止することができる。
Atmosphere may intrude into the gas communication path from which the sample chamber is separated from the opening and adhere to the inner surface thereof. Adhesion of the atmosphere to the inner surface of the gas communication path causes a decrease in measurement accuracy, as in the case where the atmosphere adheres to the inner surface of the sample chamber. Therefore, with the above-mentioned configuration, when the sample is replaced, the conduction path protection means uses the inert gas to prevent the inflow of the atmosphere into the gas conduction path, so that the atmospheric component may adhere to the inner surface of the gas conduction path. Therefore, it is possible to more reliably prevent the measurement accuracy from being deteriorated due to the mixing of atmospheric components into the measurement atmosphere.

【0012】ここで、試料室保護手段は、前記試料室内
に不活性ガスを供給し、該不活性ガスを試料室の開口か
ら排出する構成、または試料室の開口面に沿って不活性
ガスを放出して、該開口面に不活性ガスの層を形成する
構成とすることができる(請求項3,4)。
Here, the sample chamber protection means is configured to supply an inert gas into the sample chamber and discharge the inert gas from the opening of the sample chamber, or to supply the inert gas along the opening surface of the sample chamber. The layer may be discharged to form a layer of an inert gas on the opening surface (claims 3 and 4).

【0013】また、導通路保護手段は、前記導通路内に
不活性ガスを供給し、該不活性ガスを導通路の開口から
排出する構成、または前記導通路の開口面に沿って不活
性ガスを放出して、該開口面に不活性ガスの層を形成す
る構成とすることができる(請求項3,4)。
Further, the conductive path protecting means is configured to supply an inert gas into the conductive path and discharge the inert gas from an opening of the conductive path, or an inert gas along the opening surface of the conductive path. Can be discharged to form a layer of an inert gas on the opening surface (claims 3 and 4).

【0014】さらに、密閉された前記試料室内に不活性
ガスを緩やかに供給する圧力調整手段を備えれば、測定
に際して高真空に保たれていた試料室内を緩やかに大気
圧近くまで調整することができ、特に粉体試料など急激
な圧力変化に伴い飛散のおそれのある試料を取り出す際
に、好適な試料室内の圧力調整を実現することができる
(請求項5)。
Furthermore, if a pressure adjusting means for gently supplying an inert gas is provided in the closed sample chamber, the sample chamber kept in a high vacuum during measurement can be gently adjusted to near atmospheric pressure. It is possible to realize suitable pressure adjustment in the sample chamber, particularly when taking out a sample such as a powder sample that may be scattered due to a sudden pressure change (claim 5).

【0015】[0015]

【発明の実施の形態】以下、この発明の実施の形態につ
いて図面を参照して詳細に説明する。図1および図2
は、本発明の第1実施形態に係る昇温脱離分析装置を模
式的に示す構成図である。これらの図に示す昇温脱離分
析装置は、保護管1、中継チャンバ2および測定チャン
バ3を備えている。
BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the present invention will now be described in detail with reference to the drawings. 1 and 2
FIG. 1 is a configuration diagram schematically showing a thermal desorption analysis device according to a first embodiment of the present invention. The thermal desorption analyzer shown in these figures includes a protective tube 1, a relay chamber 2, and a measurement chamber 3.

【0016】保護管1は、先端が閉塞された石英管など
耐熱性を有する管体で構成してあり、その中空部内が試
料室1aを形成している。試料室1aには、試料Sが配
置される。ここで、試料Sは、中継チャンバ2から延出
する試料ホルダ4の先端に装着してある。
The protective tube 1 is composed of a tube body having heat resistance such as a quartz tube having a closed end, and the inside of its hollow portion forms a sample chamber 1a. A sample S is placed in the sample chamber 1a. Here, the sample S is attached to the tip of the sample holder 4 extending from the relay chamber 2.

【0017】保護管1の周囲には、加熱手段としての赤
外線加熱炉5が設置してあり、この赤外線加熱炉5によ
り試料室1aに配置された試料Sがその周囲から均一に
加熱される。これら保護管1と赤外線加熱炉5は、図示
横方向へ一体に移動可能となっており、その移動によっ
て保護管1の基端開口部1bが中継チャンバ2の接続部
2bから着脱自在となっている。
An infrared heating furnace 5 as a heating means is installed around the protective tube 1, and the infrared heating furnace 5 uniformly heats the sample S placed in the sample chamber 1a from its surroundings. The protection tube 1 and the infrared heating furnace 5 can be moved integrally in the lateral direction in the figure, and the movement allows the base end opening 1b of the protection tube 1 to be detachable from the connection portion 2b of the relay chamber 2. There is.

【0018】中継チャンバ2の中空部はガス導通路2a
を形成しており、測定チャンバ3内に形成した測定室3
aと試料室1aが、このガス導通路2aを介して直列に
連通している。測定室3aには、質量分析計6(検出手
段)の検出部(イオン源)6aが配置してあり、加熱に
よって試料Sから脱離したガスをこの質量分析計6が測
定室3a内で捕捉して検出する構成となっている。
The hollow portion of the relay chamber 2 has a gas passage 2a.
And the measurement chamber 3 formed in the measurement chamber 3
a and the sample chamber 1a are connected in series via the gas communication path 2a. The detection part (ion source) 6a of the mass spectrometer 6 (detection means) is arranged in the measurement chamber 3a, and the gas desorbed from the sample S by heating is captured by the mass spectrometer 6 in the measurement chamber 3a. Then, it is configured to detect.

【0019】また、測定チャンバ3には、ターボ分子ポ
ンプ7および粗引き用のロータリーポンプ8が連結して
ある。ターボ分子ポンプ7は、試料室1aから測定室3
aにかけての密閉された空間内に残留する不要なガスを
測定室3a側から真空排気して除去するとともに、試料
室1aで試料Sから脱離したガスを測定室3aに導く機
能を有している。
A turbo molecular pump 7 and a rotary pump 8 for roughing are connected to the measuring chamber 3. The turbo molecular pump 7 is provided from the sample chamber 1a to the measurement chamber 3
It has a function of vacuuming and exhausting unnecessary gas remaining in the closed space up to a from the measurement chamber 3a side and guiding the gas desorbed from the sample S in the sample chamber 1a to the measurement chamber 3a. There is.

【0020】本実施形態では、試料室1aと測定室3a
とを、ガス導通路2aを介して直列に連通するととも
に、測定室3a側からターボ分子ポンプ7により真空排
気する構成としたので、真空排気に伴い内部ガスが円滑
に流れて迅速な除去が可能であり、しかも試料室1aで
発生した試料Sからの脱離ガスを効率的に測定室3aへ
と流動させることができる。
In this embodiment, the sample chamber 1a and the measurement chamber 3a
Are connected to each other in series via the gas communication path 2a, and are evacuated from the measurement chamber 3a side by the turbo molecular pump 7, so that the internal gas smoothly flows with vacuum evacuation and can be quickly removed. Moreover, the desorbed gas from the sample S generated in the sample chamber 1a can be efficiently flowed to the measurement chamber 3a.

【0021】中継チャンバ2には、測定チャンバ3との
間にゲートバルブ9が設けてあり、このゲートバルブ9
の開閉操作によって、ガス導通路2aと測定室3aとの
間を開閉自在となっている。また、中継チャンバ2の周
壁には、ゲートバルブ10を介して粗引き用のロータリ
ーポンプ11が連結してある。
A gate valve 9 is provided between the relay chamber 2 and the measurement chamber 3, and the gate valve 9 is provided.
The opening / closing operation of allows the opening / closing between the gas communication path 2a and the measurement chamber 3a. A rotary pump 11 for roughing is connected to the peripheral wall of the relay chamber 2 via a gate valve 10.

【0022】さらに、本実施形態では、中継チャンバ2
の周壁にゲートバルブ20が設けてあり、このゲートバ
ルブ20を介してガス導通路2aに不活性ガス供給路2
1が連結してある。不活性ガス供給路21には、第1,
第2の電磁バルブ22,23を介して、図示しないガス
供給源から乾燥した不活性ガス(例えば、窒素ガス、ア
ルゴンガス、ヘリウムガス)が供給可能となっている。
これらゲートバルブ20、不活性ガス供給路21、第
1,第2の電磁バルブ22,23は、保護管1が切り離
されて開口したガス導通路2aへの大気の流入を不活性
ガスを用いて阻止する導通路保護手段を構成する。
Further, in this embodiment, the relay chamber 2
A gate valve 20 is provided on the peripheral wall of the inert gas supply passage 2a through the gate valve 20 to the gas passage 2a.
1 is connected. In the inert gas supply path 21,
A dry inert gas (for example, nitrogen gas, argon gas, helium gas) can be supplied from a gas supply source (not shown) through the second electromagnetic valves 22 and 23.
The gate valve 20, the inert gas supply path 21, and the first and second electromagnetic valves 22 and 23 use an inert gas to flow the atmosphere into the gas communication path 2a opened by disconnecting the protection tube 1. Conducting path protection means for blocking is constructed.

【0023】なお、第2の電磁バルブ23につながる管
路には、絞り弁24が設けてあり、第2の電磁バルブ2
3を経由して供給される不活性ガスは、この絞り弁24
により抑制されている。この絞り弁24と、第2の電磁
バルブ23乃至ゲートバルブ20にかけての不活性ガス
供給路21は、密閉された試料室1a内に不活性ガスを
緩やかに供給する圧力調整手段を構成する。
A throttle valve 24 is provided in the conduit connecting to the second electromagnetic valve 23.
The inert gas supplied via 3 is the throttle valve 24
Is suppressed by. The throttle valve 24 and the inert gas supply path 21 extending from the second electromagnetic valve 23 to the gate valve 20 constitute pressure adjusting means for gently supplying the inert gas into the closed sample chamber 1a.

【0024】また、保護管1の先端部にもゲートバルブ
25が設けてあり、このゲートバルブ25を介して試料
室1aに不活性ガス供給路26が連結してある。この不
活性ガス供給路26には、上記第1の電磁バルブ22を
介して、図示しないガス供給源から乾燥した不活性ガス
が供給される。これらゲートバルブ25、不活性ガス供
給路26および第1の電磁バルブ22は、開放された試
料室1a内への大気の流入を不活性ガスを用いて阻止す
る試料室保護手段を構成する。
A gate valve 25 is also provided at the tip of the protective tube 1, and an inert gas supply passage 26 is connected to the sample chamber 1a via the gate valve 25. A dry inert gas is supplied to the inert gas supply path 26 from a gas supply source (not shown) via the first electromagnetic valve 22. The gate valve 25, the inert gas supply passage 26, and the first electromagnetic valve 22 constitute a sample chamber protection unit that blocks the inflow of the atmosphere into the opened sample chamber 1a by using an inert gas.

【0025】なお、保護管1には、試料室1a内の真空
度を測定するための真空ゲージ27が設けてある。
The protective tube 1 is provided with a vacuum gauge 27 for measuring the degree of vacuum in the sample chamber 1a.

【0026】次に、上記構成の昇温脱離分析装置におけ
る試料交換の操作手順について説明する。図1に示すよ
うに、試料室1a、ガス導通路2aおよび測定室3aが
密閉され、その内部が高真空に維持された雰囲気中で昇
温脱離分析が終了すると、まず、ゲートバルブ9を閉じ
て、測定室3aを閉塞して真空保持する。次いで、ゲー
トバルブ20と第2の電磁バルブ23を開いて、不活性
ガス供給路21からガス導通路2a乃至試料室1aへ
と、緩やかに不活性ガスを供給して、それらガス導通路
2a乃至試料室1aの内圧を大気圧近くまで上昇させ
る。ここで供給される不活性ガスの単位時間あたりの供
給量は微量としてあり、これにより急激な圧力変化を抑
制して粉体試料などの飛散防止を図っている。
Next, an operation procedure for sample exchange in the thermal desorption analyzer having the above-mentioned configuration will be described. As shown in FIG. 1, when the temperature chamber desorption analysis is completed in an atmosphere in which the sample chamber 1a, the gas communication path 2a and the measurement chamber 3a are hermetically sealed and the inside thereof is maintained in a high vacuum, first, the gate valve 9 is turned on. Then, the measurement chamber 3a is closed and the vacuum is maintained. Next, the gate valve 20 and the second electromagnetic valve 23 are opened to slowly supply the inert gas from the inert gas supply passage 21 to the gas conducting passage 2a to the sample chamber 1a, and then the gas conducting passages 2a to 2a. The internal pressure of the sample chamber 1a is raised to near atmospheric pressure. The amount of the inert gas supplied here per unit time is set to a very small amount, thereby suppressing a rapid pressure change and preventing scattering of the powder sample and the like.

【0027】ガス導通路2a乃至試料室1aの内圧が大
気圧近くまで上昇した後、保護管1を図示左方向へ移動
して、中継チャンバ2から保護管1を切り離す。この操
作により、保護管1から試料Sが露出するとともに、中
継チャンバ2の接続部2bと保護管1の基端開口部1b
がそれぞれ大気に開放される(図2参照)。
After the internal pressure of the gas passage 2a to the sample chamber 1a rises to near atmospheric pressure, the protective tube 1 is moved to the left in the drawing to disconnect the protective tube 1 from the relay chamber 2. By this operation, the sample S is exposed from the protective tube 1, and the connecting portion 2b of the relay chamber 2 and the base end opening portion 1b of the protective tube 1 are exposed.
Are released to the atmosphere (see FIG. 2).

【0028】中継チャンバ2から保護管1を切り離す操
作と同期して、第1の電磁バルブ22を開いて、不活性
ガス供給路21およびゲートバルブ20を介してガス導
通路2aに、乾燥した不活性ガスaを勢いよく供給す
る。このように供給された不活性ガスaは、ガス導通路
2a内に充満するとともに、接続部2b(開口)から放
出されるため、外部からガス導通路2a内への大気の流
入が不活性ガスaにより阻止される。
In synchronism with the operation of disconnecting the protective tube 1 from the relay chamber 2, the first electromagnetic valve 22 is opened and the inert gas supply passage 21 and the gate valve 20 are passed through the gas passage 2a to the dry passage. The active gas a is vigorously supplied. The inert gas a supplied in this manner fills the gas communication path 2a and is discharged from the connection portion 2b (opening), so that the inflow of atmospheric air into the gas communication path 2a from the outside is an inert gas. blocked by a.

【0029】また、第1の電磁バルブ22を開放と同時
に、ゲートバルブ25も開放して、不活性ガス供給路2
6から試料室1a内に乾燥した不活性ガスaを勢いよく
供給する。このように供給された不活性ガスaは、試料
室1a内に充満するとともに、保護管1の基端開口部1
bから放出されるため、外部から試料室1a内への大気
の流入が不活性ガスaにより阻止される。
At the same time that the first electromagnetic valve 22 is opened, the gate valve 25 is also opened, and the inert gas supply passage 2 is opened.
A dry inert gas a is vigorously supplied from 6 into the sample chamber 1a. The inert gas a supplied in this way fills the sample chamber 1a and the base end opening 1 of the protective tube 1
Since it is released from b, the inflow of air from the outside into the sample chamber 1a is blocked by the inert gas a.

【0030】しかも本実施形態では、試料ホルダ4が保
護管1とほぼ同一軸上に配置してあり、保護管の移動に
より試料ホルダ4が露出した状態にあっては、該試料ホ
ルダ4が保護管1における基端開口部1bと対向配置さ
れている。このため保護管1の基端開口部1bから放出
された不活性ガスaが、試料ホルダ4の周囲を流動して
ガスカーテンの層を形成するので、試料ホルダ4への大
気成分の吸着も抑制される。
Moreover, in the present embodiment, the sample holder 4 is arranged on substantially the same axis as the protective tube 1, and the sample holder 4 is protected when the sample holder 4 is exposed by the movement of the protective tube. It is arranged to face the proximal end opening 1b of the tube 1. Therefore, since the inert gas a released from the base end opening 1b of the protective tube 1 flows around the sample holder 4 to form a layer of a gas curtain, adsorption of atmospheric components to the sample holder 4 is also suppressed. To be done.

【0031】試料ホルダ4は、保護管1から露出してい
るので、試料Sの交換はきわめて容易に実施することが
できる。そして、試料交換が終了した後、保護管1を移
動して基端開口部1bを中継チャンバ2の接続部2bへ
連結して、試料室1aおよびガス導通路2aを密閉す
る。さらに、この操作と同期してゲートバルブ20、ゲ
ートバルブ25、第1の電磁バルブ22および第2の電
磁バルブ23を閉じ、試料室1aおよびガス導通路2a
への不活性ガスaの供給を停止する。なお、保護管1に
はリーク弁(図示せず)が設けてあり、試料室1a内が
一定以上の圧力になったとき、該リーク弁を介して試料
室1a内の圧力を開放するように構成されている。
Since the sample holder 4 is exposed from the protective tube 1, the sample S can be replaced very easily. Then, after the sample exchange is completed, the protective tube 1 is moved to connect the base end opening 1b to the connecting portion 2b of the relay chamber 2 to seal the sample chamber 1a and the gas conducting path 2a. Further, in synchronization with this operation, the gate valve 20, the gate valve 25, the first electromagnetic valve 22 and the second electromagnetic valve 23 are closed, and the sample chamber 1a and the gas passage 2a are closed.
The supply of the inert gas a to the is stopped. A leak valve (not shown) is provided in the protective tube 1 so that the pressure in the sample chamber 1a is released via the leak valve when the pressure in the sample chamber 1a reaches a certain pressure or more. It is configured.

【0032】上記試料交換に関する一連の操作が終了し
た後、ゲートバルブ10を開くとともにロータリーポン
プ11を駆動して、試料室1a乃至ガス導通路2a内に
残存する不活性ガスを排出する。続いて、ゲートバルブ
9を開いて、ガス導通路2aと測定室3aとを連通し
て、次の測定操作に移行する。
After the series of operations relating to the sample exchange is completed, the gate valve 10 is opened and the rotary pump 11 is driven to discharge the inert gas remaining in the sample chamber 1a to the gas passage 2a. Then, the gate valve 9 is opened, the gas communication path 2a and the measurement chamber 3a are communicated with each other, and the next measurement operation is performed.

【0033】図3は、本発明の第2実施形態に係る昇温
脱離分析装置を模式的に示す構成図である。なお、先に
示した図1および図2と同一または相当する部分には同
一符号を付してある。図3に示す第2実施形態では、中
継チャンバ2における接続部2bの縁部に、その開口面
に沿って不活性ガスを放出するゲートバルブ30が設け
てあり、このゲートバルブ30が不活性ガス供給路31
を介して第1の電磁バルブ22に連結してある。また、
保護管1の基端縁部にも、基端開口部1bの開口面に沿
って不活性ガスを放出するゲートバルブ32が設けてあ
り、このゲートバルブ32が不活性ガス供給路33を介
して第1の電磁バルブ22に連結してある。
FIG. 3 is a schematic diagram showing a thermal desorption analyzer according to the second embodiment of the present invention. In addition, the same or corresponding portions as those in FIGS. 1 and 2 described above are denoted by the same reference numerals. In the second embodiment shown in FIG. 3, a gate valve 30 that discharges an inert gas is provided along the opening surface at the edge of the connecting portion 2b in the relay chamber 2, and the gate valve 30 is an inert gas. Supply path 31
It is connected to the first electromagnetic valve 22 via. Also,
A gate valve 32 that discharges an inert gas along the opening surface of the base end opening 1b is also provided at the base end edge of the protection tube 1, and the gate valve 32 is provided via an inert gas supply passage 33. It is connected to the first electromagnetic valve 22.

【0034】試料交換に際して、保護管1および中継チ
ャンバ2を開放したときは、上記ゲートバルブ30,3
2を開き、第1の電磁バルブ22から不活性ガス供給路
31,33を介して乾燥した不活性ガスaを、接続部2
bの開口面および基端開口部1bの開口面に沿って放出
する。これにより、中継チャンバ2における接続部2b
の開口面には、不活性ガスaのカーテン(層)が形成さ
れるので、ガス導通路2a内への大気の侵入が阻止され
る。同様に、保護管1における基端開口部1bの開口面
にも、不活性ガスaのカーテン(層)が形成されるの
で、試料室1a内への大気の侵入が阻止される。
When the protective tube 1 and the relay chamber 2 are opened during the sample exchange, the above gate valves 30, 3 are opened.
2 is opened, and the dry inert gas a is supplied from the first electromagnetic valve 22 through the inert gas supply paths 31 and 33 to the connecting portion 2
It discharges along the opening surface of b and the opening surface of the base end opening 1b. Thereby, the connecting portion 2b in the relay chamber 2
Since the curtain (layer) of the inert gas a is formed on the opening surface of, the invasion of the atmosphere into the gas communication path 2a is prevented. Similarly, since the curtain (layer) of the inert gas a is also formed on the opening surface of the base end opening 1b of the protective tube 1, the invasion of the atmosphere into the sample chamber 1a is prevented.

【0035】[0035]

【発明の効果】以上説明したように、本発明によれば、
試料交換に際して、試料室保護手段が不活性ガスを用い
て試料室内への大気の流入を阻止するので、試料室内面
などに大気成分が付着するおそれがなく、したがって測
定雰囲気中への大気成分の混入による測定精度の低下を
防止することができる。しかも、試料交換は、開放した
試料室の開口から容易に行うことができ、さらに試料室
保護手段は、不活性ガスを用いた機構としてあるので、
装置を大形化することもない。
As described above, according to the present invention,
During sample replacement, the sample chamber protection means uses an inert gas to block the inflow of air into the sample chamber, so there is no risk of atmospheric components adhering to the inside of the sample chamber, etc. It is possible to prevent deterioration of measurement accuracy due to mixing. Moreover, the sample exchange can be easily performed from the opening of the open sample chamber, and the sample chamber protection means has a mechanism using an inert gas.
There is no need to upsize the device.

【0036】更に導通路保護手段を備えた構成とすれ
ば、試料交換に際して、この導通路保護手段が不活性ガ
スを用いてガス導通路内への大気の流入を阻止するの
で、ガス導通路内面にも大気成分が付着するおそれがな
くなり、測定雰囲気中への大気成分の混入による測定精
度の低下をいっそう確実に防止することができる。
Further, if the structure is provided with the conduction passage protection means, the passage passage protection means uses an inert gas to prevent the inflow of the atmosphere into the gas conduction passage when the sample is exchanged. Moreover, there is no risk of atmospheric components adhering, and it is possible to more reliably prevent a decrease in measurement accuracy due to the inclusion of atmospheric components in the measurement atmosphere.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1実施形態に係る昇温脱離分析装置
を模式的に示す構成図で、保護管を閉塞した状態を示し
ている。
FIG. 1 is a configuration diagram schematically showing a thermal desorption analyzer according to a first embodiment of the present invention, showing a state in which a protective tube is closed.

【図2】本発明の第1実施形態に係る昇温脱離分析装置
を模式的に示す構成図で、保護管を開放した状態を示し
ている。
FIG. 2 is a configuration diagram schematically showing the thermal desorption analysis apparatus according to the first embodiment of the present invention, showing a state in which a protection tube is opened.

【図3】本発明の第2実施形態に係る昇温脱離分析装置
を模式的に示す構成図である。
FIG. 3 is a configuration diagram schematically showing a thermal desorption analysis apparatus according to a second embodiment of the present invention.

【図4】従来の昇温脱離分析装置を模式的に示す構成図
である。
FIG. 4 is a configuration diagram schematically showing a conventional thermal desorption analysis apparatus.

【符号の説明】[Explanation of symbols]

S:試料 1:保護管1 1a:試料室 1b:基端開口部 2:中継チャンバ 2a:ガス導通路 2b:接続部 3:測定チャンバ 3a:測定室 4:試料ホルダ 5:赤外線加熱炉 6:質量分析計 6a:検出部(イオン源) 7:ターボ分子ポンプ 8,11:ロータリーポンプ 9,10,20,25,30,32:ゲートバルブ 21,26,31,33:不活性ガス供給路 22:第1の電磁バルブ 23:第2の電磁バルブ 24:絞り弁 27:真空ゲージ S: Sample 1: Protection tube 1 1a: sample chamber 1b: Base end opening 2: Relay chamber 2a: Gas conduit 2b: Connection part 3: Measuring chamber 3a: measurement room 4: Sample holder 5: Infrared heating furnace 6: Mass spectrometer 6a: Detection unit (ion source) 7: Turbo molecular pump 8, 11: Rotary pump 9, 10, 20, 25, 30, 32: Gate valve 21, 26, 31, 33: Inert gas supply path 22: First electromagnetic valve 23: Second electromagnetic valve 24: Throttle valve 27: Vacuum gauge

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 試料を配置する開閉自在な試料室と、こ
の試料室に配置された試料を加熱する加熱手段と、加熱
により試料から脱離したガスを検出する検出部を有する
検出手段と、開放された前記試料室内への大気の流入を
不活性ガスを用いて阻止する試料室保護手段と、を備え
たことを特徴とする昇温脱離分析装置。
1. A sample chamber in which a sample is placed and which can be opened and closed, a heating unit for heating the sample placed in the sample chamber, and a detection unit having a detection unit for detecting a gas desorbed from the sample by heating. And a sample chamber protecting means for blocking the inflow of air into the opened sample chamber by using an inert gas.
【請求項2】 請求項1記載の昇温脱離分析装置におい
て、 前記検出手段の検出部を配置する測定室と、この測定室
と前記試料室とを連通するとともに前記試料室を切り離
し自在なガス導通路と、前記試料室が切り離されて開口
したガス導通路内への大気の流入を不活性ガスを用いて
阻止する導通路保護手段と、を備えたことを特徴とする
昇温脱離分析装置。
2. The thermal desorption analysis apparatus according to claim 1, wherein the measurement chamber in which the detection unit of the detection means is disposed, and the measurement chamber and the sample chamber are connected to each other and the sample chamber can be separated. Thermal desorption comprising a gas passage and a passage protection means for blocking the inflow of air into the gas passage opened by disconnecting the sample chamber by using an inert gas. Analysis equipment.
【請求項3】 請求項2記載の昇温脱離分析装置におい
て、 前記試料室保護手段は、前記試料室内に不活性ガスを供
給し、該不活性ガスを試料室の開口から排出する構成で
あり、 前記導通路保護手段は、前記導通路内に不活性ガスを供
給し、該不活性ガスを導通路の開口から排出する構成で
あることを特徴とする昇温脱離分析装置。
3. The temperature programmed desorption analyzer according to claim 2, wherein the sample chamber protection means supplies an inert gas into the sample chamber and discharges the inert gas from an opening of the sample chamber. The thermal desorption analyzer is characterized in that the conduction path protection means is configured to supply an inert gas into the conduction path and discharge the inert gas from an opening of the conduction path.
【請求項4】 請求項2記載の昇温脱離分析装置におい
て、 前記試料室保護手段は、前記試料室の開口面に沿って不
活性ガスを放出して、該開口面に不活性ガスの層を形成
する構成であり、 前記導通路保護手段は、前記導通路の開口面に沿って不
活性ガスを放出して、該開口面に不活性ガスの層を形成
する構成であることを特徴とする昇温脱離分析装置。
4. The temperature programmed desorption analyzer according to claim 2, wherein the sample chamber protection means releases an inert gas along an opening surface of the sample chamber, and the inert gas is discharged to the opening surface. It is a structure that forms a layer, the conductive path protection means is a structure that discharges an inert gas along the opening surface of the conductive path, to form a layer of an inert gas in the opening surface. Thermal desorption analyzer.
【請求項5】 請求項1乃至4のいずれか一項に記載し
た昇温脱離分析装置において、 密閉された前記試料室内に不活性ガスを緩やかに供給す
る圧力調整手段を備えたことを特徴とする昇温脱離分析
装置。
5. The temperature programmed desorption analyzer according to claim 1, further comprising pressure adjusting means for gently supplying an inert gas into the closed sample chamber. Thermal desorption analyzer.
JP2001267131A 2001-09-04 2001-09-04 Thermal desorption analyzer Expired - Fee Related JP3807600B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001267131A JP3807600B2 (en) 2001-09-04 2001-09-04 Thermal desorption analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001267131A JP3807600B2 (en) 2001-09-04 2001-09-04 Thermal desorption analyzer

Publications (2)

Publication Number Publication Date
JP2003075379A true JP2003075379A (en) 2003-03-12
JP3807600B2 JP3807600B2 (en) 2006-08-09

Family

ID=19093311

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP3807600B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011247739A (en) * 2010-05-26 2011-12-08 Rigaku Corp Sample container and evolved gas analysis method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011247739A (en) * 2010-05-26 2011-12-08 Rigaku Corp Sample container and evolved gas analysis method

Also Published As

Publication number Publication date
JP3807600B2 (en) 2006-08-09

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