JP2003057552A5 - - Google Patents
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- JP2003057552A5 JP2003057552A5 JP2001241317A JP2001241317A JP2003057552A5 JP 2003057552 A5 JP2003057552 A5 JP 2003057552A5 JP 2001241317 A JP2001241317 A JP 2001241317A JP 2001241317 A JP2001241317 A JP 2001241317A JP 2003057552 A5 JP2003057552 A5 JP 2003057552A5
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001241317A JP4878708B2 (en) | 2001-08-08 | 2001-08-08 | Confocal scanning microscope, alignment method thereof, program, and storage medium |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001241317A JP4878708B2 (en) | 2001-08-08 | 2001-08-08 | Confocal scanning microscope, alignment method thereof, program, and storage medium |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2003057552A JP2003057552A (en) | 2003-02-26 |
JP2003057552A5 true JP2003057552A5 (en) | 2008-08-14 |
JP4878708B2 JP4878708B2 (en) | 2012-02-15 |
Family
ID=19071786
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2001241317A Expired - Fee Related JP4878708B2 (en) | 2001-08-08 | 2001-08-08 | Confocal scanning microscope, alignment method thereof, program, and storage medium |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4878708B2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE502004002547D1 (en) * | 2004-06-22 | 2007-02-15 | Polytec Gmbh | Device for optically measuring an object |
JP4599941B2 (en) * | 2004-08-20 | 2010-12-15 | 株式会社ニコン | Automatic focus detection apparatus and microscope system including the same |
JP6173154B2 (en) * | 2013-10-01 | 2017-08-02 | オリンパス株式会社 | Microscope system |
DE102018107356A1 (en) | 2018-03-28 | 2019-10-02 | Carl Zeiss Microscopy Gmbh | Autofocus with angle-variable illumination |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3683298B2 (en) * | 1995-02-02 | 2005-08-17 | オリンパス株式会社 | Defect detection microscope |
US5671288A (en) * | 1995-05-31 | 1997-09-23 | Neopath, Inc. | Method and apparatus for assessing slide and specimen preparation quality |
JP4574758B2 (en) * | 1998-03-19 | 2010-11-04 | オリンパス株式会社 | Microscope image observation device |
JP2001091840A (en) * | 1999-09-20 | 2001-04-06 | Olympus Optical Co Ltd | Microscope system |
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2001
- 2001-08-08 JP JP2001241317A patent/JP4878708B2/en not_active Expired - Fee Related