JP2003005079A - Microscopic apparatus - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a microscopic apparatus of a box type which enables an operator to safely set an observation object. SOLUTION: A casing of the microscopic apparatus which is housed with the respective elements of the microscope in the casing (10a) is formed with an inlet and outlet (10b) for putting at least the segment supporting the observation segment of a supporting base (11a) of a moving stage (11) into and out of the casing. The microscope apparatus is provided with detecting means (10g and 10f) for detecting the presence or absence of foreign matter in the inlet and outlet when the supporting base enters the inside of the casing. Accordingly, if there is a possibility that the foreign material is drawn into the casing, this possibility is previously detected.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a microscope apparatus (box type microscope apparatus) in which an imaging optical system, an observation optical system, a moving stage and the like are housed in a housing.

[0002]

2. Description of the Related Art In recent years, a box-type microscope apparatus has been proposed in which various elements such as a microscope optical system and mechanism are housed in a housing. Japanese Unexamined Patent Publication No. 8-271794 and Japanese Unexamined Patent Publication No. 10-3
For example, the microscope device described in Japanese Patent No. 39845.
The box-type microscope device has electrified all drive units related to the speculum such as switching of objective lens and stage movement.
By digitizing an enlarged image formed by the optical system of the microscope by an image acquisition device such as an image sensor, the operator can perform all kinds of operations on a control device such as a computer.

[0003]

Here, in general, an operator of a microscope needs to set an observation object (in most cases, a preparation on which a sample is dropped) to be observed. Setting the observation object means arranging the observation object at an observation position facing the objective lens.

However, since it is difficult for the operator to reach the observation position of the box-type microscope apparatus, the mechanism for pulling the observation object from the outside of the casing to the observation position inside the casing. Is required. In addition, when the mechanism is installed in a box-type microscope device, foreign objects such as the operator's fingers may be accidentally drawn into the housing due to the mechanism being driven, ensuring safety. It is necessary to devise to do so.

Therefore, an object of the present invention is to provide a box-shaped microscope apparatus which allows an operator to safely set an observation object.

[0006]

Means for solving the problems will be described below for each claim. In the following, the reference numerals that represent the correspondence with the elements shown in the drawings will be given in parentheses. However, this code does not limit the present invention.

The microscope apparatus (10) according to claim 1 is
A moving stage (11) including a support table (11a) for supporting the observation object (10A) and a mechanism (115) for moving the support table, and an imaging optical system (15, 15) for forming an image of the observation object. 17) and an observing optical system (18) for observing the image formed by the image forming optical system.
0a) in the microscope device, the housing is provided for moving at least a portion of the support table that is moved by the mechanism that supports the observation object in and out of the housing. A doorway (10b) is formed,
Detecting means (10g, 10g) for detecting the presence / absence of foreign matter at the entrance / exit when the support base enters the inside of the housing.
f) is provided. Therefore, when there is a possibility that a foreign matter may be drawn into the inside of the housing when the support base is drawn in, that is detected in advance.

According to a second aspect of the present invention, there is provided a microscope apparatus according to the first aspect.
In the microscope apparatus described in the paragraph 1, the detection means includes a flexible member (10f) attached near the entrance and exit,
And a switch (10g) whose state changes according to the deformation of the flexible member. The microscope apparatus according to claim 3 includes a moving stage (11) including a support table (10a) for supporting the observation object (10A) and a mechanism (115) for moving the support table, and an image of the observation object. An image forming optical system (15, 17) for forming an image and an observation optical system (1 for observing the image formed by the image forming optical system.
8) and a housing (10a) housed in a housing, in the housing, at least a portion of the support table moving by the mechanism that supports the observation object is provided in the housing. Entrance (10) for entering and exiting
b) is formed, and an opening (11b) for lighting the observation object is drawn in the support, and a foreign substance is drawn in by the edge of the opening when the support enters the inside of the housing. The pull-in prevention portion (21d, 31
d, 41d) are formed. Therefore, when the support base is retracted, it is possible to prevent the foreign matter from being retracted together.

According to a fourth aspect of the present invention, there is provided a microscope apparatus according to the third aspect.
In the microscope apparatus according to [1], the pull-in prevention unit is
It is characterized by comprising a transparent member (21d) covering the opening. The microscope apparatus according to a fifth aspect is the microscope apparatus according to the third aspect, wherein the pull-in prevention portion includes a cutout portion (31d) extending from the opening portion to the end of the support base on the inlet / outlet side. Is characterized by.

According to a sixth aspect of the present invention, there is provided a microscope apparatus according to the third aspect.
In the microscope apparatus according to [1], the pull-in prevention unit is
It comprises an open part (41d, 41a) that opens a front part from the opening to the exit-side end according to an external force applied from the opening toward the exit-side end of the support base. Is characterized by.

[0011]

BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the present invention will be described below with reference to the drawings. <First Embodiment> A first embodiment of the present invention will be described with reference to FIGS. 1, 2, 3, 4, 5, 6, 6, 7, 8 and 9.
An embodiment will be described.

FIG. 1 is an overall configuration diagram of a microscope system 1 of the present embodiment, FIG. 2 is a bird's-eye view of a microscope device 10 that constitutes the microscope system 1, and FIG. 3 is a configuration diagram of the microscope device 10. As shown in FIG. 1, the microscope system 1 includes a microscope device 10, a host computer 50, a display device 60,
An input device 70 such as a keyboard 70a and a mouse 70b is provided.

Inside the host computer 50, a control board of the microscope apparatus 10, a CPU, a memory, and a non-volatile storage unit such as a hard disk are provided. The host computer 50 includes, for example, a GUI (Graphica).
A user interface such as a user interface) is installed, and the operator can give various instructions to the microscope device 10 via the input device 70 (hereinafter, it is assumed that a GUI is installed).

As shown in FIGS. 2 and 3, the microscope apparatus 10 includes elements (reference numerals 11, 17, 1) inside a box-shaped casing 10a.
5, 14, and 16) are stored. In the housing 10a, a support 11a for the moving stage 11
(The stage for supporting the sample 10A to be inspected) is kept horizontal (hereinafter referred to as the XY plane). Here, in the present embodiment, a predetermined direction in the horizontal plane of the support 11a (hereinafter,
The X direction. ) Stroke (maximum movement amount) is sufficiently long. By moving the support 11a in the X direction, the specimen sample 10A is moved from the normal microscope image reading area E1 (this is the normal observation position) to the housing 1.
0a, and vice versa, can be fed from the outside of the casing 10a to the microscope image reading area E1.

Incidentally, reference numeral E2 given to a part of the feeding path shown in FIG. 3 represents a position for obtaining the whole image of the sample 10A to be inspected by the whole image reading optical system 17c and the image pickup section 18. ing. In the case 10a,
At a position corresponding to the feeding path of the support base 11a, the support base 1 is
An opening / closing opening 10b is formed so that 1a can move in and out of the housing 10a.

As shown in FIG. 3, the insertion / removal opening 10b has an opening 10e formed in the housing 10a and an opening 10e formed in the housing 10a as shown in FIG. 4 and FIGS. It includes a lid portion 10c that opens and closes freely, a hinge 10d for opening and closing the lid portion 10c, a flexible plate 10f attached to the inside of the housing 10a, and a foreign matter sensor 10g attached near the flexible plate 10f.

Needless to say, the opening 10e
Is large enough to allow the support 11a to move in and out of the housing 10a. FIG. 4 is an enlarged view of the periphery of the insertion / removal opening 10b as seen from inside the housing 10a (XZ.
The sectional views taken along the plane are as shown in FIGS. 8 to 10. ). The flexible plate 10f is provided with an opening 10h having substantially the same shape as the opening 10e formed in the housing 10a and slightly smaller than the opening 10e. The size of the opening 10h is Z-Y of the support base 11.
It is slightly larger than the size of the cross section in the plane.

The flexible plate 10f has an opening 10 formed therein.
It is affixed to the inner surface of the housing 10a with the center of h aligned with the center of the opening 10e of the housing 10a. The sticking place is not the entire surface where the flexible plate 10f and the housing 10a come into contact with each other, but the place (peripheral portion of the flexible plate 10f) as far away as possible from the opening 10h. This is to allow the flexible plate 10f to have a margin in which bending, which will be described later, may occur.

Here, the flexible plate 10f is a flexible member (metal or the like) having flexibility at least in the direction perpendicular to the surface. The casing 10 is provided on the edge of the opening 10h.
When an external force is applied from the outside to the inside of a, the flexible plate 10f is bent. Incidentally, the lid portion 10c (see FIGS. 3 and 8 to 10) is attached to the flexible plate 10f via a hinge 10d (see FIGS. 3 and 8 to 10). An elastic member (coil spring or the like) not shown is interposed between the lid portion 10c and the flexible plate 10f, and the lid portion 10c is attached in a direction of closing the opening 10e by the elastic force of the elastic member. It is energized.

By the way, as described above, the foreign matter sensor 10g for detecting the bending of the flexible plate 10f is attached to the insertion / removal opening 10b of this embodiment. The foreign matter sensor 10g is a mechanical switch sensor or the like, is fixed to the side of the housing 10a (via an L-shaped plate or the like if necessary), and has its electrical contact only when the flexible plate 10f is bent. It is placed in a position where it is turned on (Fig. 8 ~
(See FIG. 10).

The output indicating the connection state of the foreign matter sensor 10g is connected to the control board of the host computer 50 via the connector 19 (see FIG. 3). Therefore, the signal indicating the bending of the flexible plate 10f is detected by the host computer 50. Regarding the arrangement position of the foreign matter sensor 10g, the flexible plate 10f
The position may be such that the switch is turned off only when is bent. In that case, the host computer 50 detects the bending of the flexible plate 10f by turning off the foreign matter sensor 10g.

FIG. 5 shows a support 11a of the moving stage 11.
FIG. The support 11a of the moving stage 11 has an opening 11 for lighting the sample 10A to be inspected.
b is formed. By covering the opening 11b,
The sample 10A to be inspected is placed. The wiring path for electrically connecting the foreign matter sensor 10g formed in the insertion / removal opening 10b and the connector 19 is shown as if it crosses the optical path in FIG. Are properly selected so that they do not interfere with the speculum.

FIG. 6 is a diagram showing an operation screen displayed by the host computer 50 on the display device 60. On the operation screen, in addition to the images 72 and 74 of the sample 10A to be inspected, images for receiving various inputs by the operator are also displayed. In the present embodiment, the microscope screen 10 is displayed on this operation screen.
Of the support base 11a inside the housing 10a, and the support base 11 pulled out of the housing 10a.
sample insertion / removal button 7 for pulling a into the housing 10a
1 is arranged.

Further, the microscope apparatus 10 of the present embodiment is provided with
As a button having the same function as the sample insertion / removal button 71, a sample insertion / removal button 7 including a mechanical switch such as a limit switch is provided in the vicinity of the insertion / removal opening 10b on the outer surface of the housing 10a.
8 (see FIGS. 1, 2, and 3) are provided. The output indicating the connection state of the sample insertion / removal button 78 is the connector 19
(See FIG. 3) to the control board of the host computer 50.

The host computer 50 uses the sample insertion / removal button 7
When 1 is selected or the sample insertion / ejection button 78 is pressed, an instruction is issued to the actuator 115 (an actuator that drives the moving stage 11; see FIGS. 2 and 3) in the microscope apparatus 10. Thus, when the support base 11a is inside the housing 10a, the support base 11a is moved toward the outside of the housing 10a, and the support base 11a
Is outside the housing 10a, its support 11a
Are moved toward the inside of the support base 11a.

That is, the operator selects the sample insertion / removal button 71 on the operation screen or depresses the sample insertion / removal button 78 on the outer surface of the housing 10a, to thereby support the support base 11a.
Can be moved in and out of the housing 10a. Figure 7
3 is an operation flowchart of the host computer 50 that operates based on the control program of the microscope apparatus 10. The control program is installed in the host computer 50 in advance.

In FIG. 7, the host computer 50
Among the above operations, only the processing relating to taking in and out of the support base 11a is described. In reality, the host computer 50
In addition to this processing, each unit in the microscope apparatus 10 is driven according to various instructions given by the operator on the operation screen (see FIG. 6), and various processing relating to the speculum is executed (for example, the whole image or A detailed image is captured and displayed on the display device 60, or the setting contents of the microscope device 10, that is, the drive voltage of the light source lamp 16a, the dimming degree of the dimming filter 16b, the filter type of the special filter 16c, and the field stop 16.
The diaphragm diameter of d, the diaphragm diameter of the aperture diaphragm 16e, the X-direction position, the Y-direction position and the Z-direction position of the support 11a, the observation magnification, and the like are changed. ).

The processing shown in FIG. 7 will be described below with reference to FIGS. First, before step S1 is executed, as shown in FIG.
Is located inside the housing 10a. In this state, when the host computer 50 recognizes that the sample insertion / ejection button 78 is pressed or the sample insertion / ejection button 71 is selected (step S1YES or step S2YES), the support base 11a is moved in the X direction. Then, as shown in FIG. 9, for example, the support 11a is projected to the outside of the insertion / removal opening 10b to a position where the operator can place the sample 10A to be inspected with his / her fingers (step S3).

After that, when recognizing that the sample insertion / ejection button 78 is pressed or the sample insertion / ejection button 71 is selected (step S4 YES or step S5 YES), the host computer 50, as shown in FIG. The support 11a is moved in the X direction and starts to be stored inside the housing 10a (step S6). By the way, when the support base 11a is pulled into the inside of the housing 10a in this way, it is assumed that the sample 10A to be inspected is not placed on the support base 11a and that the operator does not use the opening 11b formed in the support base 11a. When foreign matter such as the fingers of the person is hung, the foreign matter may be drawn into the housing 10a together and an accident may occur.

That is, in the moving stage 11 for a microscope, the weight of the support base 11a tends to be heavy because the sample 10A to be inspected needs to be finely moved with high precision, and it is also moved. Actuator 115
The power of the robot also becomes so great that the operator cannot resist it due to his / her physical strength. Therefore, for example, when the operator's finger is pulled in, there is a high possibility of being injured by being impacted by each member constituting the microscope apparatus 10. Also,
At the same time, there is a high possibility that the optical system or mechanism in the microscope apparatus 10 will fail.

Further, even if foreign matter other than the operator's fingers is caught in the opening 11b, the optical system and mechanism may be broken. Therefore, the host computer 50
When the housing 10a starts to be stored in step S6, the output of the foreign matter sensor 10g starts to be monitored (step S7). Unless the foreign matter sensor 10g is turned on, it is considered that there is no foreign matter in the insertion / removal opening 10b (step S7NO), and the support base 11a is directly drawn into the housing 10a (step S8NO).

However, as shown in FIG.
When a is pulled in without placing the sample 10A to be inspected and the operator's finger or foreign object is hung on the opening portion 11b of the support 11a, the finger or foreign object is removed from the insertion port 10b. Since it comes into contact with the flexible plate 10f, the flexible plate 10f bends and the foreign matter sensor 10g is turned on.

In such a case, the host computer 50
Detects that the foreign matter sensor 10g is turned on (step S7 YES), and immediately moves the support base 11a to a safe position as shown in FIG. 9 (step S7).
9) After that, the process returns to step S4, and waits again until the operator issues an instruction to pull the support base 11a inside. On the other hand, when the foreign matter sensor 10g is turned off (NO in step S7) and the entire support 11a is retracted into the housing 10a (step S8YES), the process returns to step S1 and the operator again supports the support 11a. Wait until you are instructed to pull out.

As described above, in the microscope system 1 of this embodiment, the housing 10a constituting the microscope apparatus 10 is used.
An insertion / removal opening 10b is formed in the housing, and a foreign matter sensor 10g for detecting the presence / absence of a foreign matter is attached to the insertion / removal opening 10b. Therefore, when there is a possibility that a foreign substance is drawn into the housing 10a when the support base 11a is drawn, it is detected in advance.

When the detection is made, the pulling of the support base 11a is immediately stopped, and the support base 11a is moved to a safe position. Therefore, the support base 11a
This avoids the risk of an accident during the retraction of the, and allows the operator to immediately remove the foreign material.
As a result, the operator can safely set the specimen sample 10A for the microscope device 10.

In this embodiment, the host computer 50 (control program installed in the host computer 50) can be changed as follows. That is, the procedure in step S9 in FIG. 7 is to stop the support base 11a, and the step executed after step S9 is step S1.

In this case, the support base 11a does not automatically return to the safe position, but at least it stops, so there is no possibility of an accident. Even if the foreign matter on the support base 11a cannot be removed only by stopping, if the operator subsequently selects the sample insertion / removal button 78 or the sample insertion / removal button 71, the support base 11a can be placed at a safe position. There is no problem because it can be returned to.

Further, in the present embodiment, the foreign matter sensor 10g
Although a mechanical switch sensor is used as the above, other sensors such as a photo interrupter may be used as long as the bending of the flexible plate 10f can be detected. Further, as the flexible plate 10f described in the present embodiment, a member made of any material such as rubber, film or the like may be used other than metal as long as it has sufficient flexibility.

Although the flexible plate 10f is attached to the lid 10c in this embodiment, it may be attached to the housing 10a. In that case, since the rigidity required for the flexible plate 10f is low, it goes without saying that the degree of freedom in selecting the material of the flexible plate 10f is increased. In addition, in the present embodiment, the microscope device 10 may be configured to emit a warning buzzer or turn on a warning light when the bending of the flexible plate 10f is detected according to the output of the foreign matter sensor 10g. it can.

<Second Embodiment> Next, a second embodiment of the present invention will be described with reference to FIGS. 1, 2, 3, 7, and 11. Here, only the differences from the first embodiment will be described, and description of the same parts will be omitted.

In the microscope system of this embodiment, as shown in FIG.
Unlike the microscope system 1 of the first embodiment shown in FIGS. 2 and 3, the foreign matter sensor 10g (in the first embodiment, the foreign matter sensor 10g is provided in the insertion / removal opening 10b of the microscope device 10) is omitted. Therefore, in the procedure executed by the host computer of the present embodiment, each step (steps S7, S8, S9) executed according to the output of the foreign matter sensor 10g as shown in FIG. 7 is omitted.

Instead, the support of the moving stage arranged in the microscope apparatus of this embodiment is a support 21a as shown in FIG. FIG. 11 shows the support base 2 of this embodiment.
It is a figure explaining 1a. FIG. 11A shows a support base 21.
11A is a perspective view and FIG. 11B is V in FIG. 11A.
It is sectional drawing cut | disconnected by the -V 'line.

The support base 21a of this embodiment has an opening 11b for lighting, similar to the support base 11a of the first embodiment.
However, the opening 11b is different from the support base 11a of the first embodiment in that the transparent glass 21d that covers the opening 11b is filled in the opening 11b. The support 21a has its transparent glass 21d fixed so as not to accidentally come off when it is pulled out or pulled in from the housing 10a.

The support base 21a comprises, for example, a member 21ah having an opening formed therein and a member 21as having an opening substantially similar to the opening formed therein.
By holding the transparent glass 21d from both sides by h and 21as, the transparent glass 21d is fixed. As described above, the support base 21a of the present embodiment has the opening 11b.
Since it is covered with the transparent glass 21d, the support base 2 can be used while performing the function of collecting light for the sample 10A to be inspected.
When the 1a is pulled out of the housing 10a, no foreign matter such as fingers of the operator is hung.

Therefore, even when the support base 21a is drawn into the housing 10a, there is no danger of foreign matter being drawn into the housing 10a together. In addition, in the present embodiment, other transparent member (plastic or the like) may be used instead of the transparent glass 21d. It is sufficient that this member has at least the characteristic that illumination light used in the microscope apparatus can be collected by the sufficient amount of light for the sample 10A to be inspected.

<Third Embodiment> Next, a third embodiment of the present invention will be described with reference to FIG. Here, only the differences from the second embodiment will be described, and description of the same parts will be omitted. The support base of the moving stage arranged in the microscope apparatus of this embodiment is a support base 31a as shown in FIG.

FIG. 12 is a view for explaining the support base 31a of this embodiment. The support base 31a of the present embodiment has a second
Similar to the support base 21a of the embodiment, the opening 1 for lighting is provided.
1b is formed, but instead of the transparent glass 21d being embedded in the opening 11b, the entrance / exit end of the support base 31a from the opening 11b (the most insertion / extraction opening 10b in the state of being inside the housing 10a). Is cut out (notch portion 31).
d).

In FIG. 12, the cutout portion 31d is formed.
The support base 31a has the same width in the Y direction as the width of the opening 11b in the Y direction. In this way, if the cutout portion 31d is formed, the support base 31a is not attached to the housing 10.
Even when a foreign substance such as a finger of the operator is hung on the periphery of the opening 11b or the like while being pulled out of the a, when the support base 31a is pulled into the housing 10a,
The foreign matter can escape to the outside of the housing 10a via the cutout portion 31d.

Therefore, even when the support base 31a is pulled into the inside of the housing 10a, the risk of foreign matter being pulled into the inside of the housing 10a is avoided. <Fourth Embodiment> Next, a fourth embodiment of the present invention will be described with reference to FIGS. Here, only the differences from the second embodiment will be described, and description of the same parts will be omitted.

The support table of the moving stage arranged in the microscope apparatus of this embodiment is a support table 41a as shown in FIGS. FIG. 13 shows the support base 41a of this embodiment.
14 is a diagram for explaining the configuration of FIG. 14, and FIG. 14 is a diagram for explaining the operation of the present embodiment. Like the support base 21a of the second embodiment, the support base 41a of the present embodiment is provided with an opening 11b for light collection. However, instead of the transparent glass 21d being embedded in the opening 11b, an opening is formed. Part 11
Depending on the external force applied from b toward the front surface portion 41e,
The front surface portion 41e is open.

For example, in the support base 41a, as shown in FIG. 13, a rear side portion and a moving-in side portion of the housing 10a are formed of different members, and the moving-in side portion extends in the X direction. It consists of two separate members depending on the centerline (housing 10a
The member on the back side of the member is a member 41ac, and the two members on the entrance and exit sides are
They are referred to as a member 41aL and a member 41aR, respectively. ). The members 41aL and 41aR are rotatably supported by hinges 41dL and 41dR each having a rotation axis in the Z direction.
It is attached to the ac.

Therefore, the member 41aL and the member 41aR
However, when the hinge 41dL and the hinge 41dR are rotated about their respective rotation axes, the front surface portion 41e is opened or closed. Further, each of the hinge 41dL and the hinge 41dR is composed of a spring hinge, etc.
Each of the members 41aL and 41aR is biased in the direction of closing e.

Therefore, if no external force is applied to the support base 41a, as shown in FIG.
Is closed. If the operator's fingers are hung on the peripheral edge of the opening 11b when the support base 41a is pulled out of the housing 10a, when the support base 41a is pulled into the housing 10a. Is applied by the fingers from the opening 11b to the front surface 41e.

At this time, the support base 41a is shown in FIG.
As shown in, the front surface portion 41e is opened according to the force, so that the fingers can be released to the outside of the housing 10a. After the finger is released, the member 41aL and the member 41aR that are urged as described above are
As shown in (c), the front surface portion 41e is closed. That is, according to the present embodiment, even when the support base 41a is pulled into the inside of the housing 10a, fingers and the like are held in the housing 10a.
The danger of an accident being drawn inside is avoided.

<Others> In the microscope system of the first embodiment described above, any of the second to fourth embodiments can be combined and applied. If combined in this way, safety can be ensured more reliably.

[0056]

As described above, according to the present invention,
A box-shaped microscope device that enables an operator to safely set an observation object is realized.

[Brief description of drawings]

FIG. 1 is an overall configuration diagram of a microscope system 1 according to a first embodiment.

FIG. 2 is a bird's-eye view of a microscope device 10 that constitutes the microscope system 1.

FIG. 3 is a configuration diagram of a microscope device 10.

FIG. 4 is an enlarged view of the periphery of an insertion / removal opening 10b as seen from inside the housing 10a.

5 is a perspective view of a support base 11a of the moving stage 11. FIG.

FIG. 6 is a diagram showing an operation screen displayed on the display device 60 by the host computer 50.

7 is an operation flowchart of a host computer 50 that operates based on a control program of the microscope device 10. FIG.

FIG. 8 is a diagram illustrating the operation of the first embodiment.

FIG. 9 is a diagram illustrating the operation of the first embodiment.

FIG. 10 is a diagram illustrating the operation of the first embodiment.

FIG. 11 is a diagram illustrating a support base 21a of the second embodiment.

FIG. 12 is a diagram illustrating a support base 31a according to a third embodiment.

FIG. 13 is a diagram illustrating a configuration of a support base 41a according to a fourth embodiment.

FIG. 14 is a diagram for explaining the operation of the fourth embodiment.

[Explanation of symbols]

1 Microscope System 10 Microscope Device 50 Host Computer 60 Display Device 70 Input Device 80 Work Bench 10a Housing 10b Insertion / Extraction Port 10c Lids 10d, 41d Hinge 10e Opening 10f Flexible Plate 10g Foreign Material Sensor 10A Specimen Sample 11 Moving Stage 11a, 21a, 31a, 41a Support 11b Opening 21d Transparent glass 31d Notch 41e Front part 15 Objective lens holder 16 Transmission illumination 16a Light source lamp 16b Light reduction filter 16c Special filter 16d Field stop 16e Aperture stop 116b, 116c, 116d , 116e, 115, 1
11,117 Actuators 126b, 126c, 126d, 126e, 125, 1
21, 127 Position sensor 17 Optical system support 17a High-magnification detailed image observation optical system 17b Low-magnification detailed image observation optical system 17c Whole image reading optical system 18 Imaging unit 19 Connector E1 Microscope image reading area E2 Whole image reading area 71 , 78 Sample insertion / removal button 72 Overall image 73 Cursor 74 Detailed image 75, 76 Radio button 77 Slider group 77a Lamp adjustment bar 77b Attenuation adjustment bar 77d Field diaphragm adjustment bar 77e Aperture diaphragm adjustment bar 77x X position adjustment bar 77y Y position adjustment Bar 77z Focus adjustment bar 77f Zoom adjustment bar

Claims (6)

[Claims] 1. A moving stage including a support table for supporting an observation object and a mechanism for moving the support table, an imaging optical system for forming an image of the observation object, and an image formation by the imaging optical system. In a microscope apparatus in which an observation optical system for observing the image is housed in a housing, the housing supports at least the observation object of the support table that is moved by the mechanism. A doorway is formed to allow a part to move in and out of the housing, and when the support enters the housing, a detection unit is provided for detecting the presence or absence of foreign matter in the doorway. Microscope device. 2. The microscope apparatus according to claim 1, wherein the detection means includes a flexible member attached near the doorway, and a switch whose state changes according to deformation of the flexible member. A microscope device comprising: 3. A moving stage including a support table for supporting an observation object and a mechanism for moving the support table, an imaging optical system for forming an image of the observation object, and an image formation by the imaging optical system. In a microscope apparatus in which an observation optical system for observing the image is housed in a housing, the housing supports at least the observation object of the support table that is moved by the mechanism. A port is formed to allow the portion to move in and out of the housing, and the support base has an opening for collecting light for the observation object, and the support base when the support base enters the interior of the housing. A microscope apparatus comprising: a pull-in prevention portion that prevents a foreign substance from being drawn in by an edge portion of the opening. 4. The microscope apparatus according to claim 3, wherein the pull-in prevention unit is made of a transparent member that covers the opening. 5. The microscope apparatus according to claim 3, wherein the pull-in prevention unit includes a cutout portion extending from the opening portion to an end of the support base on an inlet / outlet side. 6. The microscope apparatus according to claim 3, wherein the pull-in prevention unit is configured to move in and out of the opening according to an external force applied from the opening toward an end of a side of the support base. A microscope apparatus comprising an open part that opens a front part up to a side end part.