JP2003004780A5 - - Google Patents
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- JP2003004780A5 JP2003004780A5 JP2002063205A JP2002063205A JP2003004780A5 JP 2003004780 A5 JP2003004780 A5 JP 2003004780A5 JP 2002063205 A JP2002063205 A JP 2002063205A JP 2002063205 A JP2002063205 A JP 2002063205A JP 2003004780 A5 JP2003004780 A5 JP 2003004780A5
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- impedance
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- test impedance
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前記パラメータ初期値を前記供試インピーダンスの等価回路を構成するパラメータに代入して前記供試インピーダンスの両端電圧を計算により求め、
前記計算で求めた供試インピーダンスの両端電圧と、実際に測定した前記時系列電圧データとの誤差を求め、
前記誤差が最小となるときの前記供試インピーダンスの等価回路を構成するパラメータを推定することを特徴とするインピーダンスパラメータの推定方法。The voltage across the test impedance when the energization current flowing through the test impedance is changed in a rectangular shape is obtained in time series, and the parameters that constitute the equivalent circuit of the test impedance are calculated from the obtained voltage data. Parameter as the initial value,
Substituting the initial value of the parameter into a parameter constituting the equivalent circuit of the test impedance, and calculating the voltage across the test impedance by calculation,
Obtain the error between the voltage across the test impedance obtained in the calculation and the time-series voltage data actually measured,
A method for estimating an impedance parameter, comprising estimating a parameter constituting an equivalent circuit of the test impedance when the error is minimized.
前記パラメータ初期値を前記供試インピーダンスの等価回路を構成するパラメータに代入して前記供試インピーダンスの両端電圧を計算により求め、
前記計算で求めた供試インピーダンスの両端電圧と、実際に測定した前記時系列電圧データ平均値との誤差を求め、
前記誤差が最小となるときの前記供試インピーダンスの等価回路を構成するパラメータを推定することを特徴とするインピーダンスパラメータの推定方法。The voltage across the test impedance when the energization current passed through the test impedance is changed in a rectangular shape is obtained in time series, and an equivalent circuit of the test impedance is constructed from the average value of the obtained voltage data. Calculate the parameter as the parameter initial value,
Substituting the initial value of the parameter into a parameter constituting the equivalent circuit of the test impedance, and calculating the voltage across the test impedance by calculation,
Obtain the error between the voltage across the test impedance obtained in the calculation and the average value of the time series voltage data actually measured,
A method for estimating an impedance parameter, comprising estimating a parameter constituting an equivalent circuit of the test impedance when the error is minimized.
前記供試インピーダンスに対して、通電電流である直流電流を供給するとともに予め定めた時間だけ前記通電電流に矩形状の電流変化を与えることが可能な電流供給手段と、
前記予め定めた時間の直前の時刻及び前記予め定めた時間内の少なくとも2点の時刻における前記供試インピーダンスの両端電圧を測定する電圧測定手段と、
前記電圧測定手段により得られたデータを用いて前記供試インピーダンスの等価回路を構成するパラメータ値を推定することを特徴とするインピーダンスパラメータの推定装置。In an impedance parameter estimation device that estimates a parameter value that constitutes an equivalent circuit of a test impedance to be measured,
Current supply means capable of supplying a direct current as an energization current to the test impedance and giving a rectangular current change to the energization current for a predetermined time;
Voltage measuring means for measuring a voltage across the test impedance at a time immediately before the predetermined time and at least two points of time within the predetermined time;
An impedance parameter estimation apparatus characterized in that a parameter value constituting an equivalent circuit of the test impedance is estimated using data obtained by the voltage measuring means.
前記供試インピーダンスに対して、通電電流である直流電流を供給するとともに予め定めた時間だけ前記通電電流に矩形状の電流変化を与えることが可能な電流供給手段と、
前記予め定めた時間の直前の時刻及び前記予め定めた時間内の少なくとも2点の時刻における前記供試インピーダンスの両端電圧を測定する電圧測定手段と、
前記電圧測定手段により得られたデータを用いて算出した前記パラメータの初期値と、
この初期値を前記等価回路に適用して供試インピーダンスの両端電圧を計算により求め、
前記電圧測定手段により得られたデータと前記模擬供試インピーダンスの両端電圧との誤差を最小とするカーブフィット手段とから成り、
前記供試インピーダンスの等価回路を構成するパラメータ値を推定することを特徴とするインピーダンスパラメータの推定装置。In an impedance parameter estimation device that estimates a parameter value that constitutes an equivalent circuit of a test impedance to be measured,
Current supply means capable of supplying a direct current as an energization current to the test impedance and giving a rectangular current change to the energization current for a predetermined time;
Voltage measuring means for measuring a voltage across the test impedance at a time immediately before the predetermined time and at least two points of time within the predetermined time;
An initial value of the parameter calculated using data obtained by the voltage measuring means;
Applying this initial value to the equivalent circuit, the voltage across the test impedance is calculated,
The curve fitting means that minimizes the error between the data obtained by the voltage measuring means and the voltage across the simulated test impedance,
An impedance parameter estimating apparatus for estimating a parameter value constituting an equivalent circuit of the test impedance.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002063205A JP3782026B2 (en) | 2001-04-20 | 2002-03-08 | Impedance parameter estimation method and apparatus |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001122218 | 2001-04-20 | ||
JP2001-122218 | 2001-04-20 | ||
JP2002063205A JP3782026B2 (en) | 2001-04-20 | 2002-03-08 | Impedance parameter estimation method and apparatus |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2003004780A JP2003004780A (en) | 2003-01-08 |
JP2003004780A5 true JP2003004780A5 (en) | 2005-09-02 |
JP3782026B2 JP3782026B2 (en) | 2006-06-07 |
Family
ID=26613903
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2002063205A Expired - Lifetime JP3782026B2 (en) | 2001-04-20 | 2002-03-08 | Impedance parameter estimation method and apparatus |
Country Status (1)
Country | Link |
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JP (1) | JP3782026B2 (en) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4511162B2 (en) * | 2003-12-05 | 2010-07-28 | 株式会社チノー | Fuel cell evaluation system |
JP4514580B2 (en) * | 2004-10-29 | 2010-07-28 | 中国電力株式会社 | Display device for capacity measurement |
JP4713228B2 (en) * | 2005-06-08 | 2011-06-29 | 日置電機株式会社 | Battery resistance measuring device |
JP4980104B2 (en) * | 2007-03-15 | 2012-07-18 | 株式会社明電舎 | Device for measuring resistance of measured object |
JP4835757B2 (en) | 2010-01-08 | 2011-12-14 | 横河電機株式会社 | Battery characteristic evaluation device |
US20140111220A1 (en) * | 2011-05-11 | 2014-04-24 | Emazys Technologies Aps | Method for fault diagnosis on solar modules |
JP5589988B2 (en) | 2011-07-28 | 2014-09-17 | 横河電機株式会社 | Battery impedance measuring device |
JP5403437B2 (en) | 2011-07-29 | 2014-01-29 | 横河電機株式会社 | Battery monitoring device |
WO2013108527A1 (en) * | 2012-01-18 | 2013-07-25 | トーカロ株式会社 | Method and assembly for determining insulator state |
JP6035028B2 (en) * | 2012-02-03 | 2016-11-30 | 横河電機株式会社 | Battery characteristics deriving device |
CN104040363B (en) * | 2014-03-06 | 2016-09-28 | 深圳欣锐科技股份有限公司 | A kind of current measuring method and device |
-
2002
- 2002-03-08 JP JP2002063205A patent/JP3782026B2/en not_active Expired - Lifetime
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