JP2002532845A - 衝突誘導解離を使用する分子構造分析用のインライン反射飛翔時間型質量分析計 - Google Patents

衝突誘導解離を使用する分子構造分析用のインライン反射飛翔時間型質量分析計

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Publication number
JP2002532845A
JP2002532845A JP2000588791A JP2000588791A JP2002532845A JP 2002532845 A JP2002532845 A JP 2002532845A JP 2000588791 A JP2000588791 A JP 2000588791A JP 2000588791 A JP2000588791 A JP 2000588791A JP 2002532845 A JP2002532845 A JP 2002532845A
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JP
Japan
Prior art keywords
ions
ion
precursor
mass
reflectron
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Pending
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JP2000588791A
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English (en)
Japanese (ja)
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JP2002532845A5 (enExample
Inventor
チャールス・ディー・マーチン
ガリー・エル・サムエルソン
エドワード・イー・オーエン
ジェフリー・フィンチ
Original Assignee
ジェー・イー・オー・エル・ユー・エス・エー,インコーポレーテッド
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Application filed by ジェー・イー・オー・エル・ユー・エス・エー,インコーポレーテッド filed Critical ジェー・イー・オー・エル・ユー・エス・エー,インコーポレーテッド
Publication of JP2002532845A publication Critical patent/JP2002532845A/ja
Publication of JP2002532845A5 publication Critical patent/JP2002532845A5/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/40Time-of-flight spectrometers
    • H01J49/405Time-of-flight spectrometers characterised by the reflectron, e.g. curved field, electrode shapes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/004Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/005Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by collision with gas, e.g. by introducing gas or by accelerating ions with an electric field

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2000588791A 1998-12-17 1999-12-17 衝突誘導解離を使用する分子構造分析用のインライン反射飛翔時間型質量分析計 Pending JP2002532845A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11261598P 1998-12-17 1998-12-17
US60/112,615 1998-12-17
PCT/US1999/030269 WO2000036633A1 (en) 1998-12-17 1999-12-17 In-line reflecting time-of-flight mass spectrometer for molecular structural analysis using collision induced dissociation

Publications (2)

Publication Number Publication Date
JP2002532845A true JP2002532845A (ja) 2002-10-02
JP2002532845A5 JP2002532845A5 (enExample) 2005-11-17

Family

ID=22344907

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000588791A Pending JP2002532845A (ja) 1998-12-17 1999-12-17 衝突誘導解離を使用する分子構造分析用のインライン反射飛翔時間型質量分析計

Country Status (3)

Country Link
EP (1) EP1153414A1 (enExample)
JP (1) JP2002532845A (enExample)
WO (1) WO2000036633A1 (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006196216A (ja) * 2005-01-11 2006-07-27 Jeol Ltd タンデム飛行時間型質量分析装置
WO2012033094A1 (ja) * 2010-09-08 2012-03-15 株式会社島津製作所 飛行時間型質量分析装置
CN103841745A (zh) * 2012-11-20 2014-06-04 住友重机械工业株式会社 回旋加速器
JPWO2019207737A1 (ja) * 2018-04-26 2021-01-07 株式会社島津製作所 飛行時間型質量分析装置

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0219072D0 (en) * 2002-08-16 2002-09-25 Scient Analysis Instr Ltd Charged particle buncher

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4106796A1 (de) * 1991-03-04 1991-11-07 Wollnik Hermann Ein flugzeit-massenspektrometer als sekundaerstufe eines ms-ms systems
US5689111A (en) * 1995-08-10 1997-11-18 Analytica Of Branford, Inc. Ion storage time-of-flight mass spectrometer

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006196216A (ja) * 2005-01-11 2006-07-27 Jeol Ltd タンデム飛行時間型質量分析装置
WO2012033094A1 (ja) * 2010-09-08 2012-03-15 株式会社島津製作所 飛行時間型質量分析装置
CN103841745A (zh) * 2012-11-20 2014-06-04 住友重机械工业株式会社 回旋加速器
JPWO2019207737A1 (ja) * 2018-04-26 2021-01-07 株式会社島津製作所 飛行時間型質量分析装置

Also Published As

Publication number Publication date
EP1153414A1 (en) 2001-11-14
WO2000036633A1 (en) 2000-06-22
WO2000036633A9 (en) 2001-04-19

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