JP2002368410A - Solder temperature examining object and temperature examining method by using solder - Google Patents
Solder temperature examining object and temperature examining method by using solderInfo
- Publication number
- JP2002368410A JP2002368410A JP2001172998A JP2001172998A JP2002368410A JP 2002368410 A JP2002368410 A JP 2002368410A JP 2001172998 A JP2001172998 A JP 2001172998A JP 2001172998 A JP2001172998 A JP 2001172998A JP 2002368410 A JP2002368410 A JP 2002368410A
- Authority
- JP
- Japan
- Prior art keywords
- solder
- temperature
- investigation
- wiring board
- temperature survey
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Landscapes
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、半田温度調査物及
び半田を用いた温度調査方法に関し、さらに詳しくは、
温度測定装置を用いずにする。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a solder temperature investigation object and a temperature investigation method using solder.
Do not use a temperature measuring device.
【0002】[0002]
【従来の技術】例えばリフロー半田付けを行う場合、リ
フロー装置内を半田付けに適するように温度制御する必
要があり、リフロー装置内での配線基板や電子部品の温
度状態を調査することが従来より行われている。従来で
は、図5に示すように、配線基板1や搭載される電子部
品2の適所に熱電対3を耐熱テープ4で固定し、これを
リフロー装置等の内部に配置し、加熱状態での温度変化
をモニターしてリフロー装置の加熱条件を設定・調整し
ていた。2. Description of the Related Art For example, when performing reflow soldering, it is necessary to control the temperature inside the reflow device so as to be suitable for soldering, and it has been conventionally required to investigate the temperature state of wiring boards and electronic components in the reflow device. Is being done. Conventionally, as shown in FIG. 5, a thermocouple 3 is fixed at an appropriate position on a wiring board 1 or an electronic component 2 to be mounted thereon with a heat-resistant tape 4, and this is disposed inside a reflow device or the like, and the temperature in a heated state is set. By monitoring the change, the heating conditions of the reflow device were set and adjusted.
【0003】[0003]
【発明が解決しようとする課題】しかしながら、このよ
うな従来の熱電対を用いた温度調査方法では、測定装置
の性能や作業性等の理由で温度調査できる個所が限定さ
れるという問題がある。従って、経験則上より温度が低
いと予想される箇所や、耐熱性の低い電子部品を温度調
査対象とするのみであった。実際の製品では、配線基板
の配線パターンや、搭載される電子部品の熱容量の相違
や、加熱状態のムラや、生産時の連続投入による変動等
によって配線基板上の温度分布が均一ではなく、数カ所
の温度測定では基板全体の温度分布を把握することが困
難である。However, in such a conventional method of temperature investigation using a thermocouple, there is a problem that the location where the temperature can be investigated is limited due to the performance and workability of the measuring device. Therefore, only the parts where the temperature is expected to be lower than empirical rules and the electronic components having low heat resistance are subjected to the temperature investigation. In actual products, the temperature distribution on the wiring board is not uniform due to differences in the wiring pattern of the wiring board, the heat capacity of the mounted electronic components, unevenness in the heating state, and fluctuations due to continuous input during production. It is difficult to grasp the temperature distribution of the entire substrate by the temperature measurement described above.
【0004】そこで、本発明は、前記した課題を解決す
べくなされたものであり、温度調査箇所が限定されずに
一度に多数の箇所を温度調査できる半田温度調査物及び
半田を用いた温度調査方法を提供することを目的とす
る。Accordingly, the present invention has been made to solve the above-mentioned problems, and there is no limitation on the number of temperature investigation locations, and a solder temperature investigation object capable of investigating a temperature at many locations at once and a temperature investigation using solder. The aim is to provide a method.
【0005】[0005]
【課題を解決するための手段】請求項1記載の発明は、
半田温度調査物であって、融点の異なる複数種の半田粉
を含むことを特徴としている。According to the first aspect of the present invention,
A solder temperature investigation object, characterized by including a plurality of types of solder powder having different melting points.
【0006】このような構成の請求項1記載の発明で
は、それぞれの種類の半田粉の融点が異なるため、所定
の温度で溶融する半田粉と、この温度で溶融しない半田
粉とが存在する場合に、温度が両方の半田粉の融点の間
の領域にあることが判る。また、全ての種類の半田粉が
溶融していない場合は、温度が全ての半田粉の融点より
低い状態にあることが判る。さらに、全ての半田粉が溶
融している場合は、全ての半田粉の融点より温度が高い
ことが判る。このため、請求項1記載の発明では、熱電
対などの温度測定手段を用いることなく、この半田温度
調査物が配置された各所の温度範囲を認識することが可
能となる。According to the first aspect of the present invention, since the melting points of the respective types of solder powders are different from each other, there is a case where a solder powder that melts at a predetermined temperature and a solder powder that does not melt at this temperature exist. It can be seen that the temperature is in the region between the melting points of both solder powders. When all types of solder powder are not melted, it can be seen that the temperature is lower than the melting points of all solder powders. Further, when all the solder powders are melted, it is found that the temperature is higher than the melting point of all the solder powders. Therefore, according to the first aspect of the present invention, it is possible to recognize the temperature range of each place where the solder temperature investigation object is arranged without using a temperature measuring unit such as a thermocouple.
【0007】また、請求項2記載の発明は、請求項1記
載の半田温度調査物であって、前記複数種の半田粉は、
それぞれ異なる大きさに設定されていることを特徴とす
る。According to a second aspect of the present invention, there is provided the solder temperature investigation product according to the first aspect, wherein the plurality of types of solder powder are:
It is characterized in that they are set to different sizes.
【0008】したがって、請求項2記載の発明では、半
田粉の大きさが種類毎に大きさが異なるため、溶融して
いない状態の半田粉を特定することが可能である。この
ため、目視により、温度状態を知ることが可能となる。Therefore, according to the second aspect of the present invention, since the size of the solder powder is different for each type, it is possible to specify the solder powder that is not melted. For this reason, it becomes possible to know the temperature state visually.
【0009】さらに、請求項3記載の発明は、請求項1
又は請求項2に記載された半田温度調査物であって、前
記複数種の半田粉は、フラックス、添加剤が付加された
ペースト状の半田ペーストであることを特徴とする。Further, the invention according to claim 3 is the invention according to claim 1.
Alternatively, in the solder temperature test article according to claim 2, the plurality of types of solder powder are a paste-like solder paste to which a flux and an additive are added.
【0010】したがって、請求項3記載の発明は、請求
項1及び請求項2に記載された発明の作用に加えて、半
田温度調査物を半田ペーストとしたことにより、温度調
査対象へ付着させ易く、容易に温度調査が行える。Therefore, the invention according to claim 3 has the effect of the invention described in claim 1 and claim 2 and, in addition, because the solder temperature investigation object is a solder paste, it can be easily attached to the temperature investigation object. The temperature can be easily investigated.
【0011】また、請求項4記載の発明は、請求項1乃
至請求項3のいずれかに記載された半田温度調査物であ
って、前記複数種の半田粉は、樹脂で被覆された樹脂固
体物に形成され、この樹脂固体物が耐熱性テープ部に貼
り付けられていることを特徴とする。According to a fourth aspect of the present invention, there is provided the solder temperature investigation product according to any one of the first to third aspects, wherein the plurality of types of solder powders are resin solids coated with a resin. And a resin solid material attached to a heat-resistant tape portion.
【0012】したがって、請求項4記載の発明では、請
求項1〜請求項3に記載された発明の作用に加えて、半
田粉を樹脂で被覆したことにより、半田粉の酸化を防止
する作用がある。Therefore, according to the fourth aspect of the present invention, in addition to the effects of the first to third aspects of the present invention, the effect of preventing the oxidation of the solder powder is obtained by coating the solder powder with the resin. is there.
【0013】請求項5記載の発明は、半田を用いた温度
調査方法であって、融点の異なる複数の半田粉を混合し
た半田温度調査物を作製し、この半田温度調査物を温度
調査対象体の温度調査箇所に固定し、温度調査対象体を
実際の加熱工程によって加熱し、加熱工程後に半田温度
調査物の溶解状態より温度調査箇所の温度を調査するこ
とを特徴とする。According to a fifth aspect of the present invention, there is provided a temperature inspection method using solder, in which a solder temperature investigation object is prepared by mixing a plurality of solder powders having different melting points, and the solder temperature investigation object is subjected to a temperature investigation object. The temperature of the temperature investigation target is heated by an actual heating step, and after the heating step, the temperature of the temperature investigation point is inspected from the melting state of the solder temperature investigation object.
【0014】この半田を用いた温度調査方法では、半田
温度調査物を温度調査対象体の温度調査箇所に固定しこ
の固定した半田温度調査物の溶解状態を観察すること
で、半田加熱に伴う被加熱部の温度域を知ることが可能
となる。In the temperature survey method using the solder, the solder temperature survey object is fixed to a temperature survey site of the temperature survey object, and the melting state of the fixed solder temperature survey object is observed, so that the soldering temperature associated with the solder heating is measured. It becomes possible to know the temperature range of the heating section.
【0015】また、請求項6記載の発明は、請求項5記
載の半田を用いた温度調査方法であって、融点の異なる
それぞれ半田粉を異なる大きさに設定することを特徴と
する。According to a sixth aspect of the present invention, there is provided a temperature inspection method using the solder according to the fifth aspect, wherein solder powders having different melting points are set to different sizes.
【0016】したがって、請求項6記載の発明では、溶
融していない(溶け残った)半田粉の大きさを認識する
ことで、その時点での温度域を知ることが可能である。Therefore, according to the sixth aspect of the present invention, it is possible to know the temperature range at that time by recognizing the size of the solder powder that has not been melted (remaining melted).
【0017】さらに、請求項7記載の発明は、請求項5
又は請求項6記載の半田を用いた温度調査方法であっ
て、前記複数の半田粉にフラックス、添加剤を付加して
ペースト状にしたことを特徴とする。[0017] Further, the invention according to claim 7 is based on claim 5.
Alternatively, in the temperature survey method using solder according to claim 6, a flux and an additive are added to the plurality of solder powders to form a paste.
【0018】したがって、請求項7記載の発明では、請
求項5及び請求項6の発明の作用に加え、半田ペースト
は印刷などによって温度調査対象体に固定できる。Therefore, according to the invention of claim 7, in addition to the effects of the invention of claims 5 and 6, the solder paste can be fixed to the temperature investigation object by printing or the like.
【0019】また、請求項8記載の発明は、請求項5及
び請求項6記載の半田を用いた温度調査方法であって、
複数の半田粉を樹脂で被覆した樹脂固体物とし、この樹
脂固体物を耐熱性テープ部に貼り付けることを特徴とす
る。The invention according to claim 8 is a method for inspecting temperature using solder according to claims 5 and 6,
A plurality of solder powders are coated with a resin to form a resin solid, and the resin solid is attached to a heat-resistant tape portion.
【0020】したがって、請求項8記載の発明では、請
求項5及び請求項6の発明の作用に加え、半田テープを
温度調査対象体に貼り付けするだけで固定できる。Therefore, according to the eighth aspect of the present invention, in addition to the functions of the fifth and sixth aspects of the present invention, the solder tape can be fixed only by sticking it to the temperature investigation object.
【0021】さらに、請求項9記載の発明は、請求項5
乃至請求項8のいずれかに記載された半田を用いた温度
調査方法であって、前記温度調査対象体は、電子部品を
半田付けする配線基板であることを特徴とする。Further, the invention according to claim 9 is the same as the invention according to claim 5.
9. A temperature inspection method using solder according to claim 8, wherein the temperature inspection target is a wiring board for soldering an electronic component.
【0022】したがって、請求項9記載の発明では、半
田付けされる配線基板上に半田温度調査物をまんべんな
く固定して温度調査を行うことにより配線基板の温度分
布を詳細に知ることができる。Therefore, according to the ninth aspect of the present invention, the temperature distribution of the wiring board can be known in detail by fixing the solder temperature investigation object evenly on the wiring board to be soldered and conducting the temperature investigation.
【0023】請求項10記載の発明は、請求項5乃至請
求項8のいずれかに記載された半田を用いた温度調査方
法であって、前記温度調査対象体は、配線パターンが形
成された配線基板であることを特徴とする。According to a tenth aspect of the present invention, there is provided a temperature inspection method using the solder according to any one of the fifth to eighth aspects, wherein the temperature inspection target is a wiring having a wiring pattern formed thereon. It is a substrate.
【0024】したがって、請求項10記載の発明では、
例えば配線パターンの各ランド部の箇所に半田温度調査
物をそれぞれ固定して温度調査を行うことにより配線パ
ターンが温度分布に及ぼす影響を知ることができる。Therefore, according to the tenth aspect of the present invention,
For example, the influence of the wiring pattern on the temperature distribution can be known by fixing the solder temperature investigation object to each land portion of the wiring pattern and performing the temperature investigation.
【0025】請求項11記載の発明は、請求項5乃至請
求項8のいずれかに記載された半田を用いた温度調査方
法であって、前記温度調査対象体は、配線基板及びこの
配線基板に半田付けされる電子部品であることを特徴と
する。According to an eleventh aspect of the present invention, there is provided a temperature inspection method using the solder according to any one of the fifth to eighth aspects, wherein the temperature investigation target includes a wiring board and a wiring board. It is an electronic component to be soldered.
【0026】したがって、請求項11記載の発明では、
電子部品を搭載した配線基板の適所に半田温度調査物を
固定して温度調査を行うことにより電子部品の影響をも
加味した温度分布、つまり、実際の製品の加熱状況を詳
細に知ることができる。Therefore, according to the eleventh aspect of the present invention,
By fixing the solder temperature survey object in the appropriate place on the wiring board on which the electronic component is mounted and conducting a temperature survey, it is possible to know in detail the temperature distribution taking into account the effect of the electronic component, that is, the actual heating situation of the product .
【0027】[0027]
【発明の実施の形態】以下、本発明の実施形態を図面に
基づいて説明する。Embodiments of the present invention will be described below with reference to the drawings.
【0028】図1及び図2は本発明の第1実施形態を示
し、図1(a)は半田ペースト(半田温度調査物)に含
まれる半田粉を模式的に表示した構成図、図1(b)は
半田ペースト(半田温度調査物)に含まれる半田粉が加
熱により状態変化した一例を模式的に表示した構成図、
図2(a)は半田ペーストを配線基板に印刷した状態を
示す平面図、図2(b)は配線基板の加熱により半田ペ
ーストが状態変化した一例を示す平面図である。FIGS. 1 and 2 show a first embodiment of the present invention, and FIG. 1 (a) is a configuration diagram schematically showing solder powder contained in a solder paste (a solder temperature investigation object). b) is a configuration diagram schematically showing an example in which the solder powder contained in the solder paste (solder temperature investigation object) changes state due to heating;
FIG. 2A is a plan view showing a state in which a solder paste is printed on a wiring board, and FIG. 2B is a plan view showing an example in which the state of the solder paste changes due to heating of the wiring board.
【0029】図1(a)に示すように、半田温度調査物
である半田ペースト10は、融点の異なる4種類の半田
粉10a,10b,10c,10dを混合し、この混合
した半田粉10a,10b,10c,10dにフラック
ス、添加剤等を更に混ぜてペースト状に作製されてい
る。半田粉10aの融点をA、半田粉10bの融点を
B、半田粉10cの融点をC、半田粉10dの融点をD
とすると、融点温度はA<B<C<Dという関係にあ
る。使用する半田粉の組成(融点)の具体例としては、
例えば63Sn/37Pb(融点183℃))、95.
8Sn/3.5Ag/0.7Cu(融点217℃))、
96.5Sn/3.5Ag(融点221℃))、99.
3Sn/0.7Cu(融点227℃))、100%Sn
(融点232℃))、95.0Sn/5.0Sb(融点
228〜238℃))等があり、測定温度範囲に応じて
組み合わせる。尚、半田粉(半田粒)の種類や組み合わ
せ並びにそれぞれの半田組成、組成比等は、上記の半田
粉に限定されるものではない。As shown in FIG. 1A, a solder paste 10 which is a solder temperature test object is obtained by mixing four types of solder powders 10a, 10b, 10c and 10d having different melting points, and mixing the solder powders 10a and 10d. A paste is prepared by further mixing fluxes, additives, and the like with 10b, 10c, and 10d. The melting point of the solder powder 10a is A, the melting point of the solder powder 10b is B, the melting point of the solder powder 10c is C, and the melting point of the solder powder 10d is D.
Then, the melting point temperature has a relationship of A <B <C <D. Specific examples of the composition (melting point) of the solder powder used include:
For example, 63Sn / 37Pb (melting point: 183 ° C));
8Sn / 3.5Ag / 0.7Cu (melting point 217 ° C))
96.5Sn / 3.5Ag (melting point: 221 ° C));
3Sn / 0.7Cu (melting point: 227 ° C)), 100% Sn
(Melting point: 232 ° C.)), 95.0 Sn / 5.0 Sb (melting point: 228 to 238 ° C.), and the like, depending on the measurement temperature range. Note that the types and combinations of the solder powders (solder grains) and the respective solder compositions and composition ratios are not limited to the above-described solder powders.
【0030】又、4種類の半田粉10a,10b,10
c,10dは、それぞれ異なる大きさとされ、融点の低
い半田粉から融点の高い半田粉になるに従って徐々に大
きくなるように設けられている。The four types of solder powders 10a, 10b, 10
Each of c and 10d has a different size, and is provided so as to gradually increase in size from low melting point solder powder to high melting point solder powder.
【0031】次に、上記半田ペースト10を使用して配
線基板(温度調査対象体)11の全体の温度分布を調査
する場合を説明する。図2(a)に示すように、半田ペ
ースト10を配線基板11上に等間隔で印刷等により塗
布する。次に、配線基板11を実際の加熱工程(例えば
リフロー半田装置)によって加熱し、加熱工程後に半田
ペースト10の溶解状態を検査する。半田ペースト10
内の4種類の半田粉10a,10b,10c,10d
は、融点が異なるために加熱温度によって溶解・未溶解
状態をそれぞれ示すことになる。Next, a case will be described in which the solder paste 10 is used to investigate the entire temperature distribution of the wiring board (temperature investigation object) 11. As shown in FIG. 2A, the solder paste 10 is applied on the wiring board 11 at equal intervals by printing or the like. Next, the wiring board 11 is heated by an actual heating step (for example, a reflow soldering apparatus), and after the heating step, the melting state of the solder paste 10 is inspected. Solder paste 10
4 types of solder powder 10a, 10b, 10c, 10d
Has different melting points, and thus shows a dissolved and undissolved state depending on the heating temperature.
【0032】つまり、図2(b)に示すように、半田粉
10dの融点Dより高い加熱温度を受けた箇所の半田ペ
ースト10は、溶融状態を示し、半田粉10aの融点A
より低い加熱温度を受けた箇所の半田ペースト10は、
未溶融状態を示し、半田粉10dの融点Dと半田粉10
aの融点Aとの間の加熱温度を受けた箇所の半田ペース
ト10は、半溶融状態を示すことになる。半溶融状態を
更に詳しく説明すると、半田粉10dの融点Dと半田粉
10cの融点Cとの間の加熱温度を受けた箇所の半田ペ
ースト10は、半田粉10dのみが未溶解で他の半田粉
10a,10b,10cが溶解し、半田粉10cの融点
Cと半田粉10bの融点Bとの間の加熱温度を受けた箇
所の半田ペースト10は、半田粉10d,10cが未溶
解で他の半田粉10a,10bが溶解し(図1(b)の
状態)、半田粉10bの融点Bと半田粉10aの融点A
との間の加熱温度を受けた箇所の半田ペースト10は、
半田粉10d,10c,10bが未溶解で半田粉10a
のみが溶解する。In other words, as shown in FIG. 2 (b), the solder paste 10 at a location which has received a heating temperature higher than the melting point D of the solder powder 10d shows a molten state, and the melting point A of the solder powder 10a
The solder paste 10 at a location that has received a lower heating temperature is
It shows an unmelted state, and the melting point D of the solder powder 10d and the solder powder 10d
The portion of the solder paste 10 that has received the heating temperature between the melting point A of FIG. To explain the semi-molten state in more detail, the solder paste 10 at a location which has been subjected to a heating temperature between the melting point D of the solder powder 10d and the melting point C of the solder powder 10c has only the solder powder 10d undissolved and other solder powder. 10a, 10b, and 10c are melted, and the solder paste 10 at a location where a heating temperature between the melting point C of the solder powder 10c and the melting point B of the solder powder 10b is applied, the solder paste 10d and 10c are not melted and other solder The powders 10a and 10b are melted (the state of FIG. 1B), and the melting point B of the solder powder 10b and the melting point A of the solder powder 10a
The solder paste 10 at the location that has received the heating temperature between
Solder powders 10d, 10c and 10b are not melted and solder powder 10a
Only dissolves.
【0033】このように半田ペースト10が加熱温度に
よって溶解状態を変化させるため、加熱工程後の溶け残
った半田ペースト10の状態を検査することによって配
線基板11の各箇所の加熱状態を知ることができる。従
って、加熱状態のムラや、生産時の連続投入による変動
等によって配線基板11上の温度分布の不均一状態をも
含めて配線基板11の全体の温度分布を把握できる。As described above, since the melting state of the solder paste 10 changes depending on the heating temperature, it is possible to know the heating state of each part of the wiring board 11 by inspecting the state of the solder paste 10 remaining after the heating step. it can. Therefore, it is possible to grasp the entire temperature distribution of the wiring board 11 including the non-uniform state of the temperature distribution on the wiring board 11 due to unevenness in the heating state, fluctuation due to continuous input during production, and the like.
【0034】以上より、本発明の温度調査方法は、半田
ペースト10を配線基板11の温度調査箇所に塗布し、
この塗布した半田ペースト10の溶解状態を後から調査
することで温度調査を行う方法であるため、温度調査箇
所が限定されずに一度に多数の箇所を温度調査できる。
又、実際の生産設備や条件をそのまま使用できるため、
低コストに温度調査ができる。更に、実際の生産設備や
条件をそのまま使用し、かつ、温度調査対象体として実
際のものを使用すれば、実際の生産形態における温度分
布を知ることができる。又、示温塗料系を使用する場合
に比べても半田接合に近い状態での調査が可能である。As described above, according to the temperature survey method of the present invention, the solder paste 10 is applied to the temperature survey portion of the wiring board 11,
Since the temperature is investigated by investigating the dissolution state of the applied solder paste 10 later, the temperature investigation can be performed at many locations at once without limiting the temperature investigation location.
Also, since the actual production equipment and conditions can be used as they are,
Temperature survey can be performed at low cost. Furthermore, if the actual production facilities and conditions are used as they are and the actual temperature survey target is used, the temperature distribution in the actual production mode can be known. In addition, it is possible to conduct an investigation in a state close to the solder joint as compared with the case where a temperature indicating paint system is used.
【0035】加えて、前記第1実施形態では、半田温度
調査物は、融点の異なる半田粉10a,10b,10
c,10dがそれぞれ異なる大きさとされているので、
溶け残った半田粉10a,10b,10c,10dの大
きさより加熱温度を推定できるため、迅速な温度調査が
可能である。又、加熱温度に対応する半田ペーストの溶
融状態変化のサンプルを別途作製しておき、このサンプ
ルとの対比によって加熱温度を推定するようにしても良
い。尚、各半田粉10a,10b,10c,10dのサ
イズは、球状等の同一サイズ(例えば同一メッシュサイ
ズで篩いの目の細かさ)でも良いことはもちろんであ
る。In addition, in the first embodiment, the solder temperature test items are the solder powders 10a, 10b, 10
Since c and 10d have different sizes,
Since the heating temperature can be estimated from the size of the unmelted solder powders 10a, 10b, 10c, and 10d, quick temperature investigation is possible. Alternatively, a sample of the change in the molten state of the solder paste corresponding to the heating temperature may be separately prepared, and the heating temperature may be estimated based on a comparison with this sample. The size of each of the solder powders 10a, 10b, 10c, and 10d may be the same size such as a spherical shape (for example, the same mesh size and the fineness of a sieve).
【0036】又、前記第1実施形態では、半田温度調査
物は、複数の半田粉10a,10b,10c,10dに
フラックス、添加剤を付加してペースト状にした半田ペ
ースト10であるので、半田ペースト10を印刷などに
よって配線基板11等の温度調査対象体に固定できるた
め、取扱いが容易である。In the first embodiment, the solder temperature investigation object is the solder paste 10 formed by adding a flux and an additive to a plurality of solder powders 10a, 10b, 10c, and 10d to form a paste. Since the paste 10 can be fixed to the temperature investigation target such as the wiring board 11 by printing or the like, handling is easy.
【0037】更に、前記第1実施形態では、温度調査対
象体は、電子部品を半田付けする配線基板11であるの
で、半田付けされる配線基板11上に半田ペースト10
をまんべんなく固定して温度調査を行うことにより配線
基板11の温度分布を詳細に知ることができる。Further, in the first embodiment, since the object of temperature investigation is the wiring board 11 for soldering electronic components, the solder paste 10 is placed on the wiring board 11 to be soldered.
The temperature distribution of the wiring board 11 can be known in detail by fixing the temperature uniformly and conducting a temperature survey.
【0038】又、組成が異なり、測定温度範囲の異なる
半田ペーストを複数用意し、ディスペンサー等を使用し
て温度調査対象体に複数種類の半田ペーストをそれぞれ
異なる箇所等に塗布すれば、幅広い加熱温度分布などを
知るのに有効である。Further, if a plurality of solder pastes having different compositions and different measurement temperature ranges are prepared, and a plurality of types of solder pastes are applied to different places or the like using a dispenser or the like, a wide range of heating temperatures can be obtained. It is effective to know the distribution.
【0039】図3及び図4は本発明の第2実施形態を示
し、図3(a)は連続的に接続された半田テープ(半田
温度調査物)の平面図、図3(b)は図3(a)のA−
A線断面図、図4は半田テープを配線基板に貼り付けた
状態を示す平面図である。図3(a),(b)に示すよ
うに、半田温度調査物である半田テープ20は、融点の
異なる4種類の半田粉10a,10b,10c,10d
を混合し、この混合した半田粉10a,10b,10
c,10dをフラックスと同様な作用を持つ樹脂(例え
ばロジン系樹脂)21で被覆した樹脂固体物22とし、
この樹脂固体物22を耐熱性テープ部23に貼り付けて
作製されている。各半田粉10a,10b,10c,1
0dがフラックスと同様な作用を持つ樹脂21で被覆さ
れることにより、保管、加熱中の表面酸化が防止され、
又、溶融した半田粉10a,10b,10c,10dが
溶け合える距離で固定される。FIGS. 3 and 4 show a second embodiment of the present invention. FIG. 3 (a) is a plan view of a continuously connected solder tape (solder temperature investigation object), and FIG. A- of 3 (a)
FIG. 4 is a plan view showing a state in which a solder tape is attached to a wiring board. As shown in FIGS. 3 (a) and 3 (b), the solder tape 20 as the solder temperature test object has four types of solder powders 10a, 10b, 10c and 10d having different melting points.
And the mixed solder powders 10a, 10b, 10
c, 10d is a resin solid 22 coated with a resin (for example, rosin-based resin) 21 having the same action as the flux,
The resin solid 22 is attached to a heat-resistant tape portion 23 and manufactured. Each solder powder 10a, 10b, 10c, 1
Od is coated with the resin 21 having the same action as the flux, so that surface oxidation during storage and heating is prevented,
Further, it is fixed at a distance at which the molten solder powders 10a, 10b, 10c, 10d can be melted.
【0040】耐熱性テープ部23は、適当間隔毎に切り
取り部23aが形成された長尺物であり、この切り取り
部23aの箇所で切り離すことにより連続接続された半
田テープ20を容易に分離できるようになっている。4
種類の半田粉10a,10b,10c,10dの構成
は、前記第1実施形態のものと同一なので、説明を省略
する。The heat-resistant tape portion 23 is a long material having cut portions 23a formed at appropriate intervals, and can be separated at the cut portions 23a so that the continuously connected solder tape 20 can be easily separated. It has become. 4
The configurations of the various types of solder powders 10a, 10b, 10c, and 10d are the same as those of the first embodiment, and a description thereof will be omitted.
【0041】次に、上記半田テープ20を使用して配線
基板(温度調査対象体)11の全体の温度分布を調査す
る場合を説明する。図4に示すように、半田テープ20
を配線基板11上に千鳥足形状をなすように張り付け
る。次に、配線基板11を実際の加熱工程(例えばリフ
ロー半田装置)によって加熱し、加熱工程後に半田テー
プ20の各半田粉10a,10b,10c,10dの溶
解状態を検査する。半田テープ20の各半田粉10a,
10b,10c,10dが加熱温度によって溶解状態を
変化させるため、加熱工程後の溶け残った半田粉10
a,10b,10c,10dの状態を検査することによ
って配線基板11の各箇所の加熱状態を知ることができ
る。Next, a case will be described in which the entire temperature distribution of the wiring board (temperature investigation target) 11 is investigated by using the solder tape 20. As shown in FIG.
On the wiring board 11 so as to form a staggered foot shape. Next, the wiring board 11 is heated by an actual heating step (for example, a reflow soldering apparatus), and after the heating step, the melting state of each of the solder powders 10a, 10b, 10c, and 10d of the solder tape 20 is inspected. Each solder powder 10a of the solder tape 20,
Since the melting states of the solder powders 10b, 10c, and 10d are changed according to the heating temperature, the solder powder 10 remaining after the heating process is not melted.
By inspecting the states of a, 10b, 10c, and 10d, the heating state of each part of the wiring board 11 can be known.
【0042】以上より、前記第1実施形態と同様に、半
田テープ20を配線基板11の温度調査箇所に塗布し、
この塗布した半田テープ20の溶解状態を後から調査す
ることで温度調査を行う方法であるため、温度調査箇所
が限定されずに一度に多数の箇所を温度調査できる。
又、実際の生産設備や条件をそのまま使用できるため、
低コストに温度調査ができる。又、実際の生産設備や条
件をそのまま使用し、かつ、温度調査対象体として実際
のものを使用すれば、実際の生産形態における温度分布
を知ることができる。又、示温塗料系を使用する場合に
比べても半田接合に近い状態での調査が可能である。As described above, in the same manner as in the first embodiment, the solder tape 20 is applied to the portion of the wiring board 11 where the temperature is to be investigated.
Since the temperature is checked by checking the melting state of the applied solder tape 20 later, the temperature can be checked at many points at once without limiting the temperature check points.
Also, since the actual production equipment and conditions can be used as they are,
Temperature survey can be performed at low cost. In addition, if the actual production equipment and conditions are used as they are, and the actual object is used as the temperature investigation target, the temperature distribution in the actual production mode can be known. In addition, it is possible to conduct an investigation in a state close to the solder joint as compared with the case where a temperature indicating paint system is used.
【0043】又、前記第2実施形態では、半田テープ2
0を温度調査対象体に貼り付けするだけで固定できるた
め、取扱いが容易である。In the second embodiment, the solder tape 2
Since it can be fixed simply by sticking 0 to the temperature investigation object, handling is easy.
【0044】又、前記第2実施形態では、温度調査対象
体は電子部品を半田付けする配線基板11であるので、
半田付けされる配線基板11上に半田テープ20をまん
べんなく固定して温度調査を行うことにより配線基板1
1の温度分布を詳細に知ることができる。In the second embodiment, since the object of temperature investigation is the wiring board 11 for soldering electronic components,
The soldering tape 20 is evenly fixed on the wiring board 11 to be soldered, and the temperature is checked.
The temperature distribution of No. 1 can be known in detail.
【0045】又、前記第1及び第2実施形態において、
温度調査対象体を配線パターンが形成された配線基板と
し、配線パターンの各ランド部の箇所に半田ペースト1
0又は半田テープ20を固定して温度調査を行えば、配
線パターンが温度分布に及ぼす影響を知ることができ
る。In the first and second embodiments,
The object of temperature investigation is a wiring board on which a wiring pattern is formed, and a solder paste 1 is applied to each land portion of the wiring pattern.
If the temperature is investigated while fixing the solder tape 20 or the solder tape 20, the influence of the wiring pattern on the temperature distribution can be known.
【0046】又、前記第1及び第2実施形態において、
温度調査対象体は配線基板及びこの配線基板に半田付け
される電子部品とし、電子部品を搭載した配線基板の適
所に半田ペースト10又は半田テープ20を固定して温
度調査を行えば、電子部品の影響をも加味した温度分
布、つまり、実際の製品の加熱状況を詳細に知ることが
できる。In the first and second embodiments,
The temperature investigation target is a wiring board and an electronic component to be soldered to the wiring board. If the solder paste 10 or the solder tape 20 is fixed to an appropriate place of the wiring board on which the electronic component is mounted and the temperature is investigated, the electronic component can be inspected. The temperature distribution in consideration of the influence, that is, the actual heating state of the product can be known in detail.
【0047】又、前記第1及び第2実施形態によれば、
半田温度調査物である半田ペースト10及び半田テープ
20が4種類の半田粉10a,10b,10c,10d
の混合で作製されている場合を示したが、測定温度範囲
に応じて2種類以上で、かつ、任意の組成の半田粉より
作製すれば良い、尚、前記第1及び第2実施形態によれ
ば、配線基板11の半田付け面の加熱温度を調査する場
合について説明したが、両面リフロー、フローはんだ付
け時の非はんだ付け面の加熱温度状態を知る目的で、又
は、はんだ付け以外の加熱温度状態を知る目的で使用す
ることもできる。According to the first and second embodiments,
The solder paste 10 and the solder tape 20, which are the solder temperature investigation objects, have four types of solder powders 10a, 10b, 10c, and 10d.
Although the case where it is manufactured by mixing is shown, two or more types may be manufactured according to the measurement temperature range, and may be manufactured from a solder powder having an arbitrary composition. In addition, according to the first and second embodiments, For example, the case of investigating the heating temperature of the soldering surface of the wiring board 11 has been described, but for the purpose of knowing the heating temperature state of the non-soldering surface during double-sided reflow and flow soldering, or the heating temperature other than soldering It can also be used to know the status.
【0048】上記の本発明の第1及び第2の実施形態の
開示の一部をなす論述及び図面は、この発明を限定する
ものであると理解するべきではない。この開示から当業
者には様々な代替え実施の形態、実施例及び運用技術が
明らかとなろう。The discussion and drawings that form part of the above disclosure of the first and second embodiments of the present invention should not be understood as limiting the present invention. From this disclosure, various alternative embodiments, examples, and operation techniques will be apparent to those skilled in the art.
【0049】例えば、第1実施形態では、半田粉の具体
例を列挙して説明したが、これらの半田粉に限定される
ものではなく、組み合わせる半田粉の種類、及び半田組
成、組成比などは適宜変更可能である。また、同一の半
田粉の組み合わせであっても、組成比を変えることによ
り融点が変化するため、同一組成で組成比が異なる半田
粉を組み合わせてもよい。For example, in the first embodiment, specific examples of the solder powder have been listed and described. However, the present invention is not limited to these solder powders. It can be changed as appropriate. Further, even with the same combination of solder powders, since the melting point changes by changing the composition ratio, solder powders having the same composition but different composition ratios may be combined.
【0050】[0050]
【発明の効果】以上説明したように、請求項1記載の発
明によれば、溶解しない半田粉の状態を調査することに
より、加熱温度範囲を認識することができる。このた
め、従来のように熱電対などの温度測定手段を用いるこ
となく、この半田温度調査物が配置された各所の温度範
囲を認識することができる。As described above, according to the first aspect of the present invention, the heating temperature range can be recognized by examining the state of the undissolved solder powder. For this reason, it is possible to recognize the temperature range of each place where the solder temperature investigation object is arranged without using a temperature measuring unit such as a thermocouple as in the related art.
【0051】請求項2記載の発明によれば、半田粉の大
きさが種類毎に大きさが異なるため、溶融していない状
態の半田粉を特定することが可能である。このため、目
視により、温度状態を知ることができる。According to the second aspect of the present invention, since the size of the solder powder is different for each type, it is possible to specify the solder powder that is not melted. For this reason, the temperature state can be known visually.
【0052】請求項3記載の発明によれば、半田温度調
査物を半田ペーストとしたことにより、温度調査対象へ
付着させ易く、容易に温度調査が行える。According to the third aspect of the present invention, since the solder temperature test object is a solder paste, the solder temperature test object can be easily attached to the temperature test object, and the temperature can be easily checked.
【0053】請求項4記載の発明によれば、半田粉を樹
脂で被覆したことにより、半田粉の酸化を防止できる。According to the fourth aspect of the present invention, since the solder powder is covered with the resin, the oxidation of the solder powder can be prevented.
【0054】請求項5記載の発明によれば、温度調査箇
所が限定されずに一度に多数の箇所を温度調査できる。
また、実際の生産設備や条件をそのまま使用できるた
め、低コストに温度調査ができる。さらに、実際の生産
設備や条件をそのまま使用し、かつ、温度調査対象体と
して実際のものを使用すれば、実際の生産形態における
温度分布を知ることができる。又、示温塗料系を使用す
る場合に比べても半田接合に近い状態での調査ができ
る。According to the fifth aspect of the present invention, the temperature can be investigated at many locations at once without limiting the temperature investigation location.
Further, since the actual production equipment and conditions can be used as they are, the temperature can be investigated at low cost. Furthermore, if the actual production equipment and conditions are used as they are and the actual object is used as the temperature investigation target, the temperature distribution in the actual production mode can be known. In addition, it is possible to conduct an investigation in a state close to soldering as compared with the case where a temperature indicating paint system is used.
【0055】請求項6記載の発明によれば、半田温度調
査物が、融点の異なる半田粉がそれぞれ異なる大きさと
されているので、溶け残った半田粉の大きさより加熱温
度を推定できるため、迅速な温度調査ができる。According to the sixth aspect of the present invention, since the solder temperature investigation object has different sizes of solder powders having different melting points, the heating temperature can be estimated from the size of the unmelted solder powder. Temperature survey.
【0056】請求項7記載の発明によれば、半田温度調
査物が、複数の半田粉にフラックス、添加剤を付加して
ペースト状にした半田ペーストであるので、半田ペース
トが印刷などによって温度調査対象体に固定できるた
め、取扱いが容易である。According to the seventh aspect of the present invention, since the solder temperature investigation object is a solder paste obtained by adding a flux and an additive to a plurality of solder powders, the temperature of the solder paste is determined by printing or the like. Since it can be fixed to the object, it is easy to handle.
【0057】請求項8記載の発明によれば、半田温度調
査物が、複数の半田粉を樹脂で被覆した樹脂固体物と
し、この樹脂固体物を耐熱性テープに貼り付けた半田テ
ープであるので、半田テープを温度調査対象体に貼り付
けするだけで固定でき、取扱いが容易である。According to the eighth aspect of the present invention, since the solder temperature investigation object is a resin solid material in which a plurality of solder powders are coated with a resin, and the resin solid material is attached to a heat-resistant tape, It can be fixed simply by sticking the solder tape to the temperature investigation target, and the handling is easy.
【0058】請求項9記載の発明によれば、温度調査対
象体は、電子部品を半田付けする配線基板であるので、
半田付けされる配線基板上に半田温度調査物をまんべん
なく固定して温度調査を行うことにより配線基板の温度
分布を詳細に知ることができる。According to the ninth aspect of the present invention, since the temperature investigation target is a wiring board for soldering electronic components,
The temperature distribution of the wiring board can be known in detail by fixing the solder temperature investigation object evenly on the wiring board to be soldered and conducting the temperature investigation.
【0059】請求項10記載の発明によれば、温度調査
対象体が、配線パターンが形成された配線基板であるの
で、配線パターンの各ランド部の箇所に半田温度調査物
をそれぞれ固定して温度調査を行うことにより配線パタ
ーンが温度分布に及ぼす影響を知ることができる。According to the tenth aspect of the present invention, since the temperature investigation target is the wiring board on which the wiring pattern is formed, the solder temperature investigation object is fixed to each land portion of the wiring pattern and the temperature is measured. The influence of the wiring pattern on the temperature distribution can be known by conducting the investigation.
【0060】請求項11の発明によれば、温度調査対象
体は、配線基板及びこの配線基板に半田付けされる電子
部品であるので、電子部品を搭載した配線基板の適所に
半田温度調査物を固定して温度調査を行うことにより電
子部品の影響をも加味した温度分布、つまり、実際の製
品の加熱状況を詳細に知ることができる。According to the eleventh aspect of the present invention, since the temperature investigation target is a wiring board and an electronic component to be soldered to the wiring board, the solder temperature investigation object is placed at an appropriate position on the wiring board on which the electronic component is mounted. By performing the temperature survey while fixing the temperature, it is possible to know in detail the temperature distribution in consideration of the influence of the electronic component, that is, the actual heating state of the product.
【図1】本発明の第1実施形態を示し、(a)は半田ペ
ースト(半田温度調査物)に含まれる半田粉を模式的に
表示した構成図、(b)は半田ペースト(半田温度調査
物)に含まれる半田粉が状態変化した一例を模式的に表
示した構成図である。1A and 1B show a first embodiment of the present invention, in which FIG. 1A is a configuration diagram schematically showing solder powder contained in a solder paste (solder temperature investigation object), and FIG. FIG. 4 is a configuration diagram schematically showing an example in which the state of solder powder included in the object changes.
【図2】本発明の第1実施形態を示し、(a)は半田ペ
ーストを配線基板に印刷した状態を示す平面図、(b)
は配線基板の加熱により半田ペーストが状態変化した一
例を示す平面図である。FIGS. 2A and 2B show a first embodiment of the present invention, wherein FIG. 2A is a plan view showing a state in which a solder paste is printed on a wiring board, and FIG.
FIG. 4 is a plan view showing an example in which the state of the solder paste changes due to the heating of the wiring board.
【図3】本発明の第2実施形態を示し、(a)は連続接
続された半田テープ(半田温度調査物)の平面図、
(b)は図3(a)のA−A線断面図である。FIG. 3 shows a second embodiment of the present invention, in which (a) is a plan view of a continuously connected solder tape (solder temperature investigation object),
FIG. 3B is a cross-sectional view taken along line AA of FIG.
【図4】本発明の第2実施形態を示し、半田テープを配
線基板に貼り付けた状態を示す平面図である。FIG. 4 is a plan view showing a second embodiment of the present invention and showing a state where a solder tape is attached to a wiring board.
【図5】従来の熱電対を用いた温度調査方法を説明する
平面図である。FIG. 5 is a plan view for explaining a conventional temperature investigation method using a thermocouple.
10 半田ペースト(半田温度調査物) 10a,10b,10c,10d 半田粉 11 配線基板 20 半田テープ(半田温度調査物) 21 樹脂 22 樹脂固定物 23 耐熱性テープ部 DESCRIPTION OF SYMBOLS 10 Solder paste (Solder temperature investigation object) 10a, 10b, 10c, 10d Solder powder 11 Wiring board 20 Solder tape (Solder temperature investigation object) 21 Resin 22 Resin fixed object 23 Heat resistant tape part
フロントページの続き (72)発明者 鈴木 浩江 静岡県榛原郡榛原町布引原206−1 矢崎 部品株式会社内 (72)発明者 岩田 智之 静岡県榛原郡榛原町布引原206−1 矢崎 部品株式会社内 Fターム(参考) 5E319 AA03 AC01 BB05 CC34 CD51 GG15 Continuing from the front page (72) Inventor Hiroe Suzuki 206-1 Nunobikihara, Haibara-cho, Haibara-gun, Shizuoka Prefecture Inside (72) Inventor Tomoyuki Iwata 206-1 Nunobikihara, Haibara-cho, Haibara-gun, Shizuoka Prefecture Inside Yazaki Parts Co., Ltd. F term (reference) 5E319 AA03 AC01 BB05 CC34 CD51 GG15
Claims (11)
を特徴とする半田温度調査物。1. A solder temperature investigation object comprising a plurality of types of solder powder having different melting points.
て、 前記複数種の半田粉は、それぞれ異なる大きさに設定さ
れていることを特徴とする半田温度調査物。2. The solder temperature survey object according to claim 1, wherein the plurality of types of solder powders are set to different sizes.
温度調査物であって、 前記複数種の半田粉は、フラックス、添加剤が付加され
たペースト状の半田ペーストであることを特徴とする半
田温度調査物。3. The solder temperature investigation product according to claim 1, wherein the plurality of types of solder powder is a paste-like solder paste to which a flux and an additive are added. Solder temperature investigation item.
された半田温度調査物であって、 前記複数種の半田粉は、樹脂で被覆された樹脂固体物に
形成され、この樹脂固体物が耐熱性テープ部に貼り付け
られていることを特徴とする半田温度調査物。4. The solder temperature investigation object according to claim 1, wherein the plurality of types of solder powder are formed into a resin solid material covered with a resin. A solder temperature investigation object, wherein the object is attached to a heat-resistant tape portion.
半田温度調査物を作製し、この半田温度調査物を温度調
査対象体の温度調査箇所に固定し、温度調査対象体を実
際の加熱工程によって加熱し、加熱工程後に半田温度調
査物の溶解状態より温度調査箇所の温度を調査すること
を特徴とする半田を用いた温度調査方法。5. A solder temperature survey object in which a plurality of types of solder powders having different melting points are mixed is prepared, and the solder temperature survey object is fixed to a temperature survey point of the temperature survey object, and the temperature survey object is actually heated. A temperature inspection method using solder, wherein the temperature is inspected by heating in a process, and a temperature of a temperature inspection location is inspected from a melting state of the solder temperature inspection object after the heating step.
法であって、 融点の異なる半田粉のそれぞれの大きさを異なる大きさ
に設定することを特徴とする半田を用いた温度調査方
法。6. A temperature survey method using solder according to claim 5, wherein each size of the solder powder having a different melting point is set to a different size. .
半田を用いた温度調査方法であって、 前記複数種の半田粉にフラックス、添加剤を付加してペ
ースト状にしたことを特徴とする半田を用いた温度調査
方法。7. A temperature survey method using solder according to claim 5 or 6, wherein a flux and an additive are added to the plurality of types of solder powder to form a paste. Temperature survey method using solder to be used.
半田を用いた温度調査方法であって、 複数の半田粉を樹脂で被覆した樹脂固体物とし、この樹
脂固体物を耐熱性テープ部に貼り付けることを特徴とす
る半田を用いた温度調査方法。8. A temperature survey method using a solder according to claim 5 or 6, wherein a plurality of solder powders are coated with a resin to form a resin solid, and the resin solid is heat-resistant tape. Temperature investigation method using solder, characterized in that it is attached to a part.
された半田を用いた温度調査方法であって、 前記温度調査対象体は、電子部品を半田付けする配線基
板であることを特徴とする半田を用いた温度調査方法。9. A temperature survey method using solder according to claim 5, wherein the temperature survey target is a wiring board for soldering an electronic component. Temperature survey method using solder to be used.
載された半田を用いた温度調査方法であって、 前記温度調査対象体は、配線パターンが形成された配線
基板であることを特徴とする半田を用いた温度調査方
法。10. A temperature inspection method using a solder according to claim 5, wherein the temperature inspection object is a wiring board on which a wiring pattern is formed. Temperature survey method using solder to be used.
いた温度調査方法であって、 前記温度調査対象体は、配線基板及びこの配線基板に半
田付けされる電子部品であることを特徴とする半田を用
いた温度調査方法。11. The method for investigating a temperature using solder according to claim 5, wherein the object to be inspected is a wiring board and an electronic component to be soldered to the wiring board. Temperature survey method using solder to be used.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001172998A JP2002368410A (en) | 2001-06-07 | 2001-06-07 | Solder temperature examining object and temperature examining method by using solder |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001172998A JP2002368410A (en) | 2001-06-07 | 2001-06-07 | Solder temperature examining object and temperature examining method by using solder |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2002368410A true JP2002368410A (en) | 2002-12-20 |
Family
ID=19014533
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2001172998A Abandoned JP2002368410A (en) | 2001-06-07 | 2001-06-07 | Solder temperature examining object and temperature examining method by using solder |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2002368410A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009053084A (en) * | 2007-08-28 | 2009-03-12 | East Japan Railway Co | Temperature sensor |
JP2013105886A (en) * | 2011-11-14 | 2013-05-30 | Dexerials Corp | Method for determining joining condition of electronic component |
WO2019194071A1 (en) * | 2018-04-02 | 2019-10-10 | 三菱電機株式会社 | Solder jet flow inspection device, mounting board, and jet flow inspection method |
-
2001
- 2001-06-07 JP JP2001172998A patent/JP2002368410A/en not_active Abandoned
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009053084A (en) * | 2007-08-28 | 2009-03-12 | East Japan Railway Co | Temperature sensor |
JP2013105886A (en) * | 2011-11-14 | 2013-05-30 | Dexerials Corp | Method for determining joining condition of electronic component |
WO2019194071A1 (en) * | 2018-04-02 | 2019-10-10 | 三菱電機株式会社 | Solder jet flow inspection device, mounting board, and jet flow inspection method |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7653511B2 (en) | Thermoconductimetric analyzer for soldering process improvement | |
CN108521722A (en) | A kind of SMT paster techniques | |
TWI663011B (en) | Welding method | |
US20060037991A1 (en) | Electronic parts assembling and testing method, and electronic circuit baseboard manufactured by the method | |
TW201440944A (en) | Solder print inspecting device | |
Feng et al. | SAC305 solder reflow: identification of melting and solidification using in-process resistance monitoring | |
TWI407514B (en) | Lead solder indicator and method | |
JP2002368410A (en) | Solder temperature examining object and temperature examining method by using solder | |
Plotog et al. | Working temperatures influence over the solder joints properties | |
Seidel et al. | Experimental identification and prioritization of design and process parameters on hole fill in mini wave soldering | |
Rudajevová et al. | Study of Undercooling and Recalescence During Solidification of Sn 62.5 Pb 36.5 Ag 1 and Sn 96.5 Ag 3 Cu 0.5 Solders in Real Electronic Joints | |
Butterfield et al. | Lead free solder paste flux evaluation and implementation in personal communication devices | |
Sjoberg et al. | High-density assembly and root cause analyses | |
Chung et al. | Influence of halogen-free compound and lead-free solder paste on on-board reliability of green CSP (chip scale package) | |
Norann | Efforts to Develop a 300° C Solder | |
Videkov et al. | A research on solder masks using lead and lead-free solders | |
JP2022185954A (en) | Reflow method | |
JPS6256504A (en) | Forming method for solder powder and cream solder | |
JP2004245751A (en) | Circuit board | |
Koziol et al. | Implementation of lead-free reflow soldering process–the quality issues | |
Greene et al. | A procedure for determining the high‐speed stencil printing performance of solder pastes in an electronic service provider's environment | |
Koziol et al. | Some problems in lead-free assembly process of the miniature and large components on PCB | |
Sharma | Printing Morphology and | |
CN117202533A (en) | SMT substrate mounting and connecting production surface mounting technology | |
Khan | Ball Grid Array Soldering |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20041026 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20060609 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20060613 |
|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20060718 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20070109 |
|
A762 | Written abandonment of application |
Free format text: JAPANESE INTERMEDIATE CODE: A762 Effective date: 20070308 |