JP2002350499A - Test mediating system for semiconductor integrated circuit and test mediating method for it - Google Patents

Abstract

PROBLEM TO BE SOLVED: To improve investment efficiency related to a test of a semiconductor integrated circuit. SOLUTION: This test mediating system for the semiconductor integrated circuit is constructed of test provider terminals TS1-TSm, test demander terminals TD1-TDn, and a test mediating device TM connected mutually via a public communication network N. Each of the test provider terminals TS 1-TSm transmits an operation condition of a semiconductor integrated circuit testing device managed by a test provider to the test mediating device TM, while each of the test demander terminals TD1-TDn transmits a test request related to the semiconductor integrated circuit of a test demander to the test mediating device TM. The test mediating device TM sequentially receives operating condition information to store it, and on the basis of the operating condition information, selects the semiconductor circuit testing device complying with the test request to transmit it to the test demander terminals TD1-TDn.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

The present invention relates to a test mediation system for a semiconductor integrated circuit and a test mediation method therefor.

[0002]

2. Description of the Related Art As is well known, a semiconductor integrated circuit test device (commonly called an IC tester)
Is a device for testing the performance characteristics of a semiconductor integrated circuit such as an IC or various LSIs. The device inputs a test input signal to the semiconductor integrated circuit, and outputs an output signal output from the semiconductor integrated circuit in response to the test input signal. To evaluate the performance of the semiconductor integrated circuit. Such an IC tester operates based on a test program created exclusively for each semiconductor integrated circuit. That is, IC
When a semiconductor integrated circuit is tested using a tester, it is necessary to first create a test program according to the test contents and to mount the test program on an IC tester.

On the other hand, in the conventional semiconductor business, a semiconductor integrated circuit maker has performed the design, production and testing by the IC tester consistently by a semiconductor integrated circuit maker. However, in recent years, the number of design specialists specialized in designing only semiconductor integrated circuits and the number of test specialists specialized in testing only semiconductor integrated circuits are increasing. As is well known, the demand for semiconductor integrated circuits fluctuates greatly, and the above-mentioned specialization is proceeding in order to avoid investment risks.

In such a situation, in the semiconductor business, a test demander composed of a semiconductor integrated circuit maker and a design specialist, etc., and / or a test provider composed of a semiconductor integrated circuit maker and a test specialist are also owned. There is a demand for more efficient operation of such equipment.

[0005] The present invention has been made in view of the above-mentioned problems, and has the following objects. (1) Improve the efficiency of investment related to the testing of semiconductor integrated circuits. (2) The operation rate of the IC tester is leveled. (3) Respond to sudden demand for semiconductor integrated circuits. (4) Test the semiconductor integrated circuit at lower cost. (5) To shorten the time required for testing the semiconductor integrated circuit. (6) Provide a test program at low cost and in a short period of time.

[0006]

In order to achieve the above object, according to the present invention, as a first means relating to a test mediation system for a semiconductor integrated circuit, there is provided a method for a test provider interconnected via a public communication line. The test provider terminal includes a terminal, a test consumer terminal, and a test mediation device. The test provider terminal transmits operating status information of the semiconductor integrated circuit test device managed by the test provider to the test mediation device, and the test consumer terminal. Transmits a test request relating to the semiconductor integrated circuit of the test consumer to the test mediation device, the test mediation device sequentially receives and accumulates the operation status information, and responds to the test request based on the operation status information. Means of selecting a circuit test apparatus and transmitting it to the test consumer terminal is adopted.

Further, as a second means relating to the test mediation system for a semiconductor integrated circuit, the first means
The test mediation apparatus always receives the operation status information sent from the test provider terminal via the public communication line, and always receives the test request sent from the test consumer terminal via the public communication line. A test mediation server, an IC tester database that updates operation status information sequentially received by the test mediation server for each test provider,
A test request database that stores new test requests sequentially received by the test mediation server for each test consumer, and stores answer information corresponding to the test requests; and a semiconductor integrated circuit that responds to each test request based on operation status information. A test device is selected and stored as answer information in a test request database, and a mediation terminal for transmitting the response information from the test mediation server to the test consumer terminal is adopted.

[0008] As a third means relating to the test mediation system for the semiconductor integrated circuit, in the above first or second means, the test mediation device transmits a conversion request relating to a test program of the semiconductor integrated circuit from a test consumer terminal. Upon receipt, a means for transmitting the test program converted in response to the conversion request to the test consumer terminal is employed.

[0009] As a fourth means relating to the test mediation system for semiconductor integrated circuits, in the above first or second means, the test mediation device receives a test program conversion request relating to a test request from a test consumer terminal. Then
A means for converting a test program for a semiconductor integrated circuit test device according to the test request and transmitting the converted test program to a test provider terminal of a test provider managing the semiconductor integrated circuit test device is employed.

As a fifth means relating to the test mediation system for a semiconductor integrated circuit, in the above third or fourth means, the test mediation device employs a means having a program conversion system for automatically converting a test program. .

As a sixth means relating to the test intermediary system for a semiconductor integrated circuit, in any one of the above first to fifth means, the test intermediary device sends a request for creating a test program for the semiconductor integrated circuit from a test consumer terminal. Is received, the test program is transmitted to the test consumer terminal.

As a seventh means relating to the test intermediation system for a semiconductor integrated circuit, in any one of the first to fifth means, the test intermediary device may execute a test request for a test program for a semiconductor integrated circuit relating to a test request. When receiving from the consumer terminal, a means for transmitting a test program to a test provider terminal of a test provider who manages the semiconductor integrated circuit test apparatus according to the test request is employed.

As an eighth means relating to the test intermediary system for a semiconductor integrated circuit, in any one of the above first to seventh means, the test intermediary device transmits a request for providing advice relating to the test of the semiconductor integrated circuit to a test demander. Means for transmitting advice information to the test consumer terminal when received from the test consumer terminal.

As a ninth means relating to a test intermediary system for a semiconductor integrated circuit, in any one of the above first to eighth means, the test intermediation device receives operating status information of a test provider registered in advance, and Means for accepting a test request from a test consumer registered in advance.

On the other hand, according to the present invention, as a first means relating to a method for mediating a test of a semiconductor integrated circuit, operation status information of a semiconductor integrated circuit test device managed by a test provider is sequentially received via a public communication line and accumulated. In addition, a test request of a test demander relating to the semiconductor integrated circuit is sequentially received via a public communication line, and a semiconductor integrated circuit test apparatus which responds to the test request is selected based on the accumulated operation status information to determine a test demand. Means for notifying the user via a public communication line.

As a second means relating to a test mediation method for a semiconductor integrated circuit, in the first means, a test mediation server is connected to a public communication line, so that operating status information and a test request are always received. At the same time, means for notifying an integrated circuit test apparatus responding to the test request to a test consumer using the test mediation server is adopted.

As a third means relating to a test intermediation method for a semiconductor integrated circuit, in the first or second means, when a request for conversion of a test program for a semiconductor integrated circuit is received from a test consumer, the request is converted in accordance with the request for conversion. The converted test program is provided to test consumers.

As a fourth means relating to a method for mediating a test of a semiconductor integrated circuit, in the first or second means,
When a request for conversion of a test program related to a test request is received, a means for converting a test program for a semiconductor integrated circuit test device corresponding to the test request and providing the test program to a test provider managing the semiconductor integrated circuit test device is employed. I do.

As a fifth means relating to a method for mediating a test of a semiconductor integrated circuit, in the above third or fourth means,
A means for automatically converting a test program using a predetermined conversion program is employed.

As a sixth means relating to the test intermediation method for a semiconductor integrated circuit, in any one of the above-mentioned first to fifth means, when a request for the preparation of a test program for a semiconductor integrated circuit is received from a test consumer, the test program And sending it to the test consumer.

As a seventh means relating to a test intermediation method for a semiconductor integrated circuit, in any one of the above-mentioned first to fifth means, when a request for creating a test program for a semiconductor integrated circuit relating to a test request is received from a test consumer. And a means for transmitting a test program to a test provider of a semiconductor integrated circuit test apparatus that responds to the test request.

As an eighth means relating to the test intermediation method of the semiconductor integrated circuit, in any one of the first to seventh means, when a request for providing advice relating to the test of the semiconductor integrated circuit is received from a test demander, A means of transmitting the advice information to the test consumer is adopted.

As a ninth means relating to a test intermediary method for a semiconductor integrated circuit, in any one of the first to eighth means, only the operation status information of a test provider registered in advance is received, and the operation status information registered in advance is registered. A method of receiving only test requests from test consumers is adopted.

[0024]

BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a block diagram showing an embodiment of a test intermediary system for a semiconductor integrated circuit and a test intermediation method according to the present invention.

FIG. 1 is a system configuration diagram of a test mediation system according to the present embodiment. In this figure, the symbol T
M is a test mediation device, N is a public communication line, TD1 to TDn
Is a terminal for test consumers, and TS1 to TSm are terminals for test providers.

The test mediation apparatus TM comprises a test mediation server S, an IC tester database DT, a test request database DR, a program conversion system P and a mediator terminal T as shown in the figure. Such a test mediation device TM is operated and managed by a test mediator that mediates between a test provider and a test consumer involved in a test (test) of a semiconductor integrated circuit.

The test mediation server S always receives the operation status information transmitted from the test provider terminals TS1 to TSm via the public communication line N, and receives the operation status information from the test demander terminals TD1 to TDn. The test request sent via the PC is always accepted. The test mediation server S has a function as a Web server (WWW server) generally used on the Internet, and includes an information providing page (operating status information receiving page) for receiving the operating status information. An information providing page (test request reception page) for receiving a test request is provided.

The test mediation server S has an information providing page (test program reception page) for receiving various requests related to the test program, such as new creation of a test program and conversion of a program language, and advice related to testing of a semiconductor integrated circuit. An information providing page (examination advice receiving page) for receiving a request for providing the information is provided. Further, the test mediation server S has a function as an FTP server for transmitting and receiving a test program as a file on the Internet.

The test mediation server S is provided with an intermediary that operates the test mediation device TM as a business in addition to the operation status information reception page and the test request reception page. Advertisement pages for recruiting test providers widely, as well as advertisement pages for test customers, such as semiconductor integrated circuit manufacturers and design specialists, to mediate performance tests of semiconductor integrated circuits. Have.

The IC tester database DT updates and stores the operation status information of the semiconductor integrated circuit test device sequentially received by the test mediation server S for each test provider. The IC tester database DT includes a table for registering operation status information for each test provider registered as a member in advance, and each time the operation status information is input from the test mediation server S, the table corresponds to the operation status information. Update the operation status information registered in the test provider table. That is, the latest operation status information is always registered in the IC tester database DT for each test provider.

Normally, a test provider manages and operates a plurality of semiconductor integrated circuit test devices, and the specifications may be different for each semiconductor integrated circuit test device. The IC tester database DT includes, for each test provider, in addition to the operating status information of each semiconductor integrated circuit test device, the specifications of each device, for example, the type (logic, memory, ASIC) of the semiconductor integrated circuit to be tested. ,analog,
Etc.) and past test results are registered.

Here, the operation status information is mainly an operation plan of each semiconductor integrated circuit test apparatus over a certain period.
This is information indicating the “empty state” of each semiconductor integrated circuit test device managed and operated by each test provider. By referring to the operation status information, it is possible to grasp when a new test can be assigned to each semiconductor integrated circuit test device.

The test request database DR newly registers a test request sequentially received by the test mediation server S for each test consumer, and stores answer information corresponding to the test request. The test request database DR includes a table (test request table) for registering a test request and corresponding answer information for each test consumer registered in advance as a member, and a new test request is input from the test mediation server S. Each time, the test request is newly registered in the test request table of the corresponding test consumer. That is, the test request database DR stores the test request from the member registration to the present until the present and the corresponding answer information for each test consumer.

The test request database DR is:
A requester (a test demander and / or a test provider) sends a request for providing various requests and advice relating to the test program received by the test mediation server S to a table (request table) provided separately from the test request table.
Register each time. In this request table, answer information is registered for each request.

The test request includes the type of the semiconductor integrated circuit to be tested, the time at which the test consumer desires to test the semiconductor integrated circuit (desired test time), and delivery to the test provider of the semiconductor integrated circuit to be tested. The information includes information such as a possible date, a desired date of receipt from the test provider of the semiconductor integrated circuit, and the necessity of converting or newly creating a test program.

On the other hand, the response information indicates the contents of the response of the intermediary to such a test request, the name of the test provider responding to the test request, the specification of the semiconductor integrated circuit test apparatus for performing the test, the test The information includes information such as a possible time, an estimate of a test cost, a date on which a semiconductor integrated circuit to be tested can be delivered from a test consumer, a date on which the semiconductor integrated circuit can be delivered to a test consumer, and the like.

The program conversion system P is a system for automatically converting a test program (a program to be converted) described in a certain programming language into a test program (a converted program) in another programming language. In the program conversion system P, when the test requester requests the test program to be converted in the test request, the test mediation server S receives the test request from the test requester terminals TD1 to TDn via the public communication line N. Imports the conversion target program and performs automatic conversion.

The intermediary terminal T operates based on a predetermined intermediation program and operation information input by the intermediary, and searches the IC tester database DT to respond to each test request for a semiconductor integrated circuit test. A device is selected, and information relating to the selection is transmitted from the test mediation server S to the test consumer terminals TD1 to TDn as answer information, and is also stored in the test request database DR as answer information. Also, this intermediary terminal T is
From the test mediation server S, the response information operated and input by the mediator in response to the various requests and the advice provision requests related to the test program described above is transmitted from the test mediation server S to the test consumer terminals TD1 to TDn.
And to store it in the test request database DR.

The public communication line N is the Internet which is generally widely used. The test consumer terminals TD1 to TDn transmit the test request of the test consumer to the test mediation device TM (more precisely, the test mediation server S), and are used by each test consumer who has registered as a member in advance. It is an information communication terminal. The test consumer terminals TD1 to TDn have an FTP function for transmitting the test program to the test mediation server S via the Internet in addition to a function (browser) for browsing each information providing page on the Internet.

The test provider terminals TS1 to TSm transmit the operation status information to the test mediation device TM (more precisely, the test mediation server S), and are used by each test provider registered in advance as a member. It is an information communication terminal. These test provider terminals TS1 to TSm have an FTP function for receiving the test program from the test mediation server S via the Internet, in addition to a function (browser) for browsing each information providing page on the Internet.

Next, a test mediation method in the test mediation system configured as described above will be described with reference to the flowchart shown in FIG.

First, a test intermediary that operates the test intermediation apparatus TM to intervene in a performance test on a semiconductor integrated circuit requires a preliminary agreement between a test provider and a test consumer who use the test intermediation service. Conclude a business contract. This business contract is, for example, a test mediation server S
When the test provider and the test provider apply on the advertisement page published above, the contract is concluded based on subsequent negotiations (costs for each service content, etc.).

The test intermediary issues a dedicated ID number and password to the test provider and the test demander who have completed the member registration based on the business contract in this way. By using the ID number and the password, the test provider uploads operation status information and various requests of each semiconductor integrated circuit test device operated by the test provider to the test mediation server S as described below. Also,
The test consumer uploads a test request and various requests to the test mediation server S by using the ID number and the password. The test intermediary
In response to such various uploads by each registered member, the test mediation device TM configured as described above is used to provide each registered member with a response to the test request and a response to the various requests.

The test mediation server S is always running, and upon receiving the operating status information, test requests or various requests transmitted from the registered member to itself (step S1), the test mediation device TM sets this The following processing is performed according to the received content.

That is, when receiving the operation status information from the test provider terminals TS1 to TSm, the test mediation server S specifies the registered member (test provider) based on the ID number attached to the operation status information, and IC tester database DT with operating status information along with information specified by test provider
Output to As a result, the IC tester database DT
Updates and registers the operation status information of the test provider corresponding to the specified information (step S2). Such update registration processing of the operation status information is repeatedly performed each time the operation status information is received from the test provider terminals TS1 to TSm of each test provider. , The latest operation status information is always accumulated.

Next, when the test mediation server S receives the test request from the test requesting / demanding terminals TD1 to TDn, it also specifies the registered member (test demander) based on the ID number attached thereto, and The test request is output to the test request database DR together with the information specified by the consumer. As a result, the test request database DR newly registers a test request in the test request table of the test consumer corresponding to the specified information (step S3). By such a new registration process of the test request, the test requests sequentially received in time series are additionally stored in the test request table of each test consumer. By analyzing the contents of the test request for each test consumer stored in the test request database DR in this way, it is possible to grasp the tendency of the test request for each test demand.

When a new test request is registered in the test request database DR, the occurrence of the new registration is notified to the intermediary terminal T. The intermediary terminal T captures the test request into the intermediary terminal T based on the notification (step S4), and uses the intermediation program to perform IC
By outputting a search request to the tester database DT, an IC tester corresponding to the test request is extracted, and the extracted result is displayed on a screen. Here, the intermediary operating the intermediary terminal T confirms the search result on the screen of the intermediary terminal T, and finally, the process of allocating the IC tester to the test request is completed (step S5).
Then, the final assignment information of the IC tester is output from the intermediary terminal T to the test request database DR,
It is registered as a part of the answer information (step S6).

When a large number of IC testers are extracted, the intermediary operating the intermediary terminal T searches the IC tester database DT to find the plurality of IC testers.
The past test results of the tester and the like are read out, and the number of IC testers that meet the test request is narrowed down to a small number. And
The result of this narrowing is registered in the test request database DR as a part of the answer information.

Normally, the information on the IC tester finally selected in this way is the above-mentioned answer information, that is, the name of the test provider responding to the test request, the specifications of the IC tester to be tested, From the test mediation server S, information such as the timing, the estimation of the test cost, the date on which the semiconductor integrated circuit to be tested can be delivered from the test consumer, the date on which the semiconductor integrated circuit can be delivered to the test consumer, etc. The data is transmitted to the demand terminals TD1 to TDn (step S7).

Here, if the test request is accompanied by a test program (conversion target program) created by the test consumer, and a request for language conversion for an IC tester corresponding to the test request is included. The conversion target program is transferred from the test request database DR to the program conversion system P based on an instruction from the agent terminal T. As a result, the program conversion system P
The conversion target program is automatically converted to generate a converted program (step S8), and the converted program is output to the test request database DR and registered as incidental information of the answer information.

Then, as a reply to the reply information transmitted to the test requesting terminals TD1 to TDn in the above step S7, the test mediation server S transmits the test work relating to the test request via the test requesting terminals TD1 to TDn. When an order is received from the test consumer (step S9), the converted program is read from the test request database DR and transmitted to the test supply / demand terminals TD1 to TDn (step S10). As described above, the mediation process for the test request is completed by the processes in steps S3 to S10.

Subsequently, upon receiving the various requests described above from the test provider terminals TS1 to TSm or the test providing and demanding terminals TD1 to TDn, the test mediation server S outputs the various requests to the test request database DR. It is registered in the request table (step S11). When the new request is registered in the test request database DR in this way, the registration of the new request is notified to the intermediary terminal T, and the intermediary terminal T transmits the new request to the intermediary terminal based on the notification. The data is taken into the terminal T (step S12).

For example, if the request is a test program conversion request (test program conversion request), the program to be converted is attached to the request, so that the program to be converted is also registered in the test request database DR. . Then, the conversion target program is transferred from the test request database DR to the program conversion system P based on the instruction of the intermediary terminal T, and is automatically converted to generate a converted program (step S13). Then, this converted program is registered in the test request database DR (step S14), and the test provider terminals TS1 to TSm of the test provider as the requester or the test demander via the test mediation server S. The test request is transmitted to the terminals TD1 to TDn (step S1).
Five).

When a test program creation request other than the test program conversion request is made, for example, a test program is separately created and transmitted to the requester via the test mediation server S. In addition, when there is a request to provide advice related to the test, the test mediation agent examines the results, compiles the answers, and transmits the information as answer information from the test mediation server S.

According to the present embodiment, the following effects can be obtained. (1) The test intermediary company performs the test by using the test mediation device TM interconnected via the public communication line N to the test provider terminals TS1 to TSm and the test requester terminals TD1 to TDn. Since the intermediary between the consumer and the test supplier is provided, the test supplier can improve the investment efficiency related to the test of the semiconductor integrated circuit, that is, the investment efficiency related to the IC tester, and can increase the operating rate of the IC tester. Can be leveled.

(2) On the other hand, the test demander can easily cope with the sudden demand for the semiconductor integrated circuit and can test the semiconductor integrated circuit at lower cost. (3) Furthermore, since it is possible to quickly respond to various requests from the test provider and the test demander, it is possible to shorten the time required for testing the semiconductor integrated circuit and to reduce the cost of the test program at a low cost. Can be provided.

[0057]

As described above, according to the present invention,
While sequentially receiving and accumulating the operation status information of the semiconductor integrated circuit test device managed by the test provider via the public communication line, and sequentially receiving the test request related to the semiconductor integrated circuit of the test demander via the public communication line, A semiconductor integrated circuit test apparatus that responds to the test request is selected based on the accumulated operation status information and notified to the test consumer via a public communication line, so that the semiconductor integrated circuit between the test provider and the test consumer is selected. The demand and supply related to the test can be balanced.

Therefore, the test supplier can improve the investment efficiency relating to the test of the semiconductor integrated circuit, that is, the investment efficiency relating to the IC tester, and can level the operation rate of the IC tester. On the other hand, on the test consumer side, it is possible to easily respond to sudden demand for semiconductor integrated circuits and to test semiconductor integrated circuits at lower cost.

[Brief description of the drawings]

FIG. 1 is a system configuration diagram of a test mediation system according to an embodiment of the present invention.

FIG. 2 is a flowchart illustrating a mediation method using a test mediation system according to an embodiment of the present invention.

[Explanation of symbols]

 TM: Test mediation device N: Public communication line TD1 to TDn: Test consumer terminal TS1 to TSm: Test provider terminal S: Test mediation server DT: IC tester database DR: Test request database P: Program conversion system T: Intermediary terminal

Claims (18)

[Claims] 1. A test provider terminal (TS1 to TSm), a test consumer terminal (TD1 to TDn), and a test mediator (TM) interconnected via a public communication line (N).
The test provider terminal (TS1 to TSm) transmits the operation status information of the semiconductor integrated circuit test device managed by the test provider to the test mediation device (TM), and the test consumer terminal (TS TD1 to TDn) transmit a test request relating to the semiconductor integrated circuit of the test consumer to the test mediation device (TM). The test mediation device (TM) sequentially receives and accumulates the operation status information, and A test intermediary system for a semiconductor integrated circuit, comprising selecting a semiconductor integrated circuit test device that responds to the test request based on operation status information and transmitting the selected test device to the test consumer terminals (TD1 to TDn). 2. A test mediator (TM) constantly receives operation status information transmitted from a test provider terminal (TS1 to TSm) via a public communication line (N), and a test consumer terminal. A test mediation server (S) that constantly receives a test request sent from (TD1 to TDn) via the public communication line (N), and a test provider that receives operation status information sequentially received by the test mediation server (S). An IC tester database (DT) that is updated every time, and a test request database that newly registers test requests sequentially received by the test mediation server (S) for each test consumer and stores answer information corresponding to the test requests. (DR), and a semiconductor integrated circuit test apparatus that responds to each test request is selected based on the operation status information, and a test request database (D ) Test consumer terminal the response information from the test mediation server (S) with is stored in (T
2. The test mediation system for a semiconductor integrated circuit according to claim 1, further comprising: a mediator terminal (T) for transmitting the mediation data to D1 to TDn). 3. Upon receiving a conversion request related to a test program for a semiconductor integrated circuit from the test consumer terminals (TD1 to TDn), the test mediation device (TM) tests the test program converted according to the conversion request. 3. The test mediation system for a semiconductor integrated circuit according to claim 1, wherein the test mediation is transmitted to a customer terminal (TD1 to TDn). 4. When the test mediation device (TM) receives a test program conversion request related to a test request from the test consumer terminals (TD1 to TDn), the test mediation device (TM) performs a test for a semiconductor integrated circuit test device corresponding to the test request. 3. The test intermediation of a semiconductor integrated circuit according to claim 1, wherein the program is converted and transmitted to a test provider terminal (TS1 to TSm) of a test provider managing the semiconductor integrated circuit test apparatus. system. 5. The test mediation system for a semiconductor integrated circuit according to claim 3, wherein the test mediation device includes a program conversion system for automatically converting a test program. 6. Upon receiving a request to create a test program for a semiconductor integrated circuit from the test consumer terminals (TD1 to TDn), the test mediator (TM) transmits the test program to the test consumer terminals (TD1 to TDn). ),
The test mediation system for a semiconductor integrated circuit according to claim 1, wherein: 7. A test intermediation device (TM) receives a request for creating a test program for a semiconductor integrated circuit relating to a test request from a test consumer terminal (TD1 to TDn), and executes a semiconductor integrated circuit test corresponding to the test request. Test provider terminal (TS1) of the test provider who manages the device
The test mediation system for a semiconductor integrated circuit according to any one of claims 1 to 5, wherein the test program is transmitted to the system. 8. A test mediator (TM), upon receiving a request for providing advice related to a test of a semiconductor integrated circuit from a test consumer terminal (TD1 to TDn), said test consumer terminal (TD1 to TDn) The test mediation system for a semiconductor integrated circuit according to any one of claims 1 to 7, wherein the advice information is transmitted to the system. 9. A test mediation device (TM) for receiving operation status information of a test provider registered in advance and receiving a test request of a test consumer registered in advance.
9. The test mediation system for a semiconductor integrated circuit according to claim 1, wherein: 10. A semiconductor integrated circuit tester operating status information managed by a test provider is sequentially received and stored via a public communication line (N), and a test request of a test demander relating to the semiconductor integrated circuit is sent to the public. A semiconductor integrated circuit test device that responds to the test request is selected based on the operation status information that has been sequentially received via the communication line (N) and notified to the test consumer via the public communication line (N). And a test intermediation method for a semiconductor integrated circuit. 11. By connecting a test mediation server (S) to a public communication line (N), operation status information and a test request are always received, and an integrated circuit test device that responds to the test request is connected to the test mediation server. 2. A test consumer is notified using (S).
0. The test mediation method for a semiconductor integrated circuit according to 0. 12. When a request for conversion of a test program for a semiconductor integrated circuit is received from a test consumer, the test program converted in response to the conversion request is provided to the test consumer. The test mediation method for a semiconductor integrated circuit according to the above. 13. When a request for converting a test program related to a test request is received, the test program is converted for a semiconductor integrated circuit test device corresponding to the test request and provided to a test provider who manages the semiconductor integrated circuit test device. 12. The test mediation method for a semiconductor integrated circuit according to claim 10 or 11, wherein 14. The test mediating method for a semiconductor integrated circuit according to claim 12, wherein the test program is automatically converted using a predetermined conversion program. 15. The method according to claim 10, wherein when a request for creating a test program for a semiconductor integrated circuit is received from a test consumer, the test program is created and transmitted to the test consumer. Test intermediation method for semiconductor integrated circuits. 16. Upon receiving a request for creating a test program for a semiconductor integrated circuit relating to a test request from a test consumer, transmitting the test program to a test provider of a semiconductor integrated circuit test apparatus that responds to the test request. The method for mediating a test of a semiconductor integrated circuit according to claim 10. 17. The method according to claim 10, wherein, when a request for providing advice relating to a test of the semiconductor integrated circuit is received from a test consumer, advice information is transmitted to the test consumer. A test mediation method for semiconductor integrated circuits. 18. The method according to claim 10, wherein only the operation status information of the test provider registered in advance is received, and only the test request of the test consumer registered in advance is received. A test mediation method for semiconductor integrated circuits.