JP2002340783A - Apparatus for thermal shock or thermal cycle test - Google Patents

Apparatus for thermal shock or thermal cycle test

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Publication number
JP2002340783A
JP2002340783A JP2001146477A JP2001146477A JP2002340783A JP 2002340783 A JP2002340783 A JP 2002340783A JP 2001146477 A JP2001146477 A JP 2001146477A JP 2001146477 A JP2001146477 A JP 2001146477A JP 2002340783 A JP2002340783 A JP 2002340783A
Authority
JP
Japan
Prior art keywords
test
thermal shock
gas
thermal
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2001146477A
Other languages
Japanese (ja)
Inventor
Yasuhei Sanada
泰平 真田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2001146477A priority Critical patent/JP2002340783A/en
Publication of JP2002340783A publication Critical patent/JP2002340783A/en
Withdrawn legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To widen a thermal shock controllable range in a thermal shock test and a thermal cycle test, and enable less energy-consuming and more economical tests than conventionally. SOLUTION: Heat insulating walls which are movable or can be fitted to various positions are set in a testing tank. Gates are set to the heat insulating walls and an inner wall of the tank. A duct for sending a gas is set to the gates. When the duct is connected, the gas having temperature differences can be sent from a heat exchanger → the inner wall → the movable heat insulating walls to a testing region. Moreover, the gas can be mixed with a supplied gas while an amount of the exhaust is regulated.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、あらゆる熱衝撃試
験をはじめとする温度変化を与える試験装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test apparatus for giving a temperature change such as any thermal shock test.

【0002】[0002]

【従来の技術】従来は一定容積の気相の試験槽を持った
熱衝撃試験装置、熱サイクル試験装置、環境装置におい
て各試験が行われていた。その槽は対象試験物のサイズ
の如何によらず一定の容積であるため、小さいサイズの
試験対象物に対して試験を行う際にも槽内全体の雰囲気
を目標の温度に合わせるか、又は、目標の熱衝撃を与え
る必要があった。
2. Description of the Related Art Conventionally, various tests have been carried out in a thermal shock test apparatus, a thermal cycle test apparatus, and an environmental apparatus having a gas phase test tank having a fixed volume. Since the tank has a constant volume regardless of the size of the target test object, even when performing a test on a test object of a small size, the atmosphere in the entire tank is adjusted to the target temperature, or It was necessary to give the target thermal shock.

【0003】また従来は、温度プロファイルは槽内の気
相についてとられ、その温度を元に試験が管理されるよ
うなシステムとなっている。
Conventionally, a temperature profile is obtained for a gas phase in a tank, and a test is managed based on the temperature.

【0004】[0004]

【発明が解決しようとする課題】従来は一定容積の気相
の試験槽を持った熱衝撃試験装置、熱サイクル試験装
置、環境装置において各試験が行われていたため、サイ
ズが小さくて熱容量が小さい試験対象物に対して試験を
行う際も槽全体の容積を同じ環境にする必要があったた
め、熱効率が悪く、また、高い熱衝撃を与えることは難
しい。
Conventionally, each test was conducted in a thermal shock test apparatus, a thermal cycle test apparatus, and an environmental apparatus having a gas phase test tank of a fixed volume, so that the size was small and the heat capacity was small. Even when a test is performed on a test object, the entire volume of the tank needs to be in the same environment, so that the thermal efficiency is poor and it is difficult to give a high thermal shock.

【0005】また従来は、温度プロファイルは槽内の気
相についてとられ、その温度を元に試験が管理されるよ
うなシステムとなっているが、実際は、試験対象物の温
度が雰囲気の温度に正確に追従しているとは言えない。
熱容量が大きく且つサイズが比較的小さい物について試
験を行った場合などがその例に挙げられる。その場合、
意図した熱衝撃、温度が正確に試験対象物にかかってい
るとは言えない。
Conventionally, a temperature profile is obtained for a gas phase in a tank, and a test is managed based on the temperature. However, in practice, the temperature of the test object is reduced to the temperature of the atmosphere. I can't say I'm following exactly.
An example is a case where a test is performed on an object having a large heat capacity and a relatively small size. In that case,
It cannot be said that the intended thermal shock and temperature are accurately applied to the test object.

【0006】[0006]

【課題を解決するための手段】可動のまたは取り外し可
能な断熱性の仕切りを使って、試験槽内における試験対
象となる部分の容積を試験対象物に合わせてできるだけ
小さくする。その局所的な部分に雰囲気を送り込むある
いは吸い出すために、仕切りの側面と試験槽内壁側面の
吹き出し口をつなぐエアダクトを用いる。そうすること
で試験対象容積の熱容量又は入れ替えに必要な気体の量
が減るため、高い熱衝撃の試験や経済的な試験を行うこ
とが可能となる。
SUMMARY OF THE INVENTION Using a movable or removable insulating partition, the volume of the part to be tested in the test chamber is made as small as possible in accordance with the test object. An air duct that connects the side of the partition and the outlet on the side of the inner wall of the test tank is used to feed or suck the atmosphere into the local part. By doing so, the heat capacity of the test object volume or the amount of gas required for replacement is reduced, so that a high thermal shock test and an economical test can be performed.

【0007】熱電対のような温度計を用いて試験対象物
の温度を元に排出気体又は外気を吸入気体に量を調節し
ながら混ぜる。これによって、微妙な温度衝撃を経済的
に、また、試験対象物に対して的確に与えることが可能
となる。
Using a thermometer such as a thermocouple, the exhaust gas or the outside air is mixed with the intake gas while adjusting the amount based on the temperature of the test object. This makes it possible to apply a subtle temperature shock economically and accurately to the test object.

【0008】[0008]

【発明の実施の形態】本発明について図面を用いて実施
の形態例を示す。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention will be described with reference to the drawings.

【0009】図1は熱衝撃試験装置の外観である。ここ
では、試験槽が上部、試験対象物を温度変化させるため
気体に温度差をつけるのが下部である。そこから上部へ
温度差をつけられた気体が運ばれる。
FIG. 1 is an external view of a thermal shock test apparatus. Here, the upper part is the test tank, and the lower part is to make a temperature difference between the gases to change the temperature of the test object. From there, the gas with a temperature difference is carried to the upper part.

【0010】図2は試験槽内部を示す。図2中の符号1
は試験対象物であり、符号2で示される可動の断熱壁と
符号3で示されるはめ込み式の断熱壁で試験空間は構成
される。図2の符号2で示す断熱壁の角部は、符号4で
示される試験槽の内側がレールになっており、可動する
ようにはめ込まれている。又、可動の断熱壁2は図3に
示すとおり、符号8のような一定間隔で図4のような構
造の断熱壁3をひっかけることができるような構造にな
っており、意図した高さに調整できる。試験対象部分の
密封性は符号9がゴムのような超弾性体でできていてい
ることで断熱壁3をはさんでいない部分ではある程度保
たれている。
FIG. 2 shows the inside of the test tank. 2 in FIG.
Is a test object, and a test space is constituted by a movable heat insulating wall indicated by reference numeral 2 and a built-in heat insulating wall indicated by reference numeral 3. At the corner of the heat insulating wall indicated by reference numeral 2 in FIG. 2, the inside of the test tank indicated by reference numeral 4 is a rail, and is fitted so as to be movable. Further, as shown in FIG. 3, the movable heat insulating wall 2 has a structure such that the heat insulating wall 3 having the structure as shown in FIG. Can be adjusted. The sealability of the portion to be tested is maintained to a certain extent in a portion where the heat insulating wall 3 is not interposed, because the reference numeral 9 is made of a superelastic material such as rubber.

【0011】図2の断熱壁3は図4に示すような構造に
なっており、図2における可動断熱壁2を一定間隔で垂
直にはめ込めるようになっている。はめ込んでいない部
分の密封性は、図5のように図4の符号10の部分が2
重構造になっており、その奥の隙間には弾性体11が設
置されていることで可動断熱壁2が挟まっている部分
は、該可動断熱壁2を挟むように、可動断熱壁2が挟ま
っていない部分は閉まるようにすることで確保する。図
4の符号12は、断熱壁3をはめ込む時は図4中の状態
で固定しておき、可動断熱壁2をはさんで設置する時は
左方向へリリースする。断熱壁2,3を意図した位置に
固定するには、図2の符号5に示される穴に図6で示さ
れるネジ式停め具で固定する。図7の符号13の部分で
固定すれば、図2の断熱壁2,3のような板の場合は最
小拘束部分で固定される。また、図6の符号14で示さ
れる板の大きさも安定性に寄与する。
The heat insulating wall 3 shown in FIG. 2 has a structure as shown in FIG. 4, and the movable heat insulating wall 2 shown in FIG. As shown in FIG. 5, the sealability of the part that is not fitted is 2 in FIG.
The movable insulating wall 2 is sandwiched between the movable insulating wall 2 and the portion where the movable insulating wall 2 is sandwiched by the elastic body 11 being disposed in the deep gap. Parts that are not closed are secured by closing them. Reference numeral 12 in FIG. 4 is fixed in the state shown in FIG. 4 when the heat insulating wall 3 is fitted, and is released to the left when the movable heat insulating wall 2 is set therebetween. In order to fix the heat insulating walls 2 and 3 at the intended positions, the heat insulating walls 2 and 3 are fixed to the holes indicated by reference numeral 5 in FIG. 2 with the screw-type stoppers shown in FIG. If it fixes in the part of the code | symbol 13 of FIG. 7, in the case of the board | plates like the heat insulation walls 2 and 3 of FIG. The size of the plate indicated by reference numeral 14 in FIG. 6 also contributes to stability.

【0012】試験対象物の大きさに合わせて、可動・は
め込みの断熱壁2,3を意図した位置に設定した後、図
2の符号6に示すようなエアダクトを図2の断熱壁2の
側面にあるゲート、図2の試験槽4の内壁側にあるゲー
トに設置する。片方は気体を送り込むダクト、片方は排
気をするダクトであるが、十分に気体が循環するように
図2の符号15のように気体の流出方向を変える板が設
置されている。図2の試験槽4の内壁側のゲートは熱交
換器への送風路に直結している。またこのダクトは、試
験槽の高さによっては、図2の符号17や図3の符号1
8で示されるとおり、複数のダクト接続用ゲートが存在
し必要に応じて様々な組み合わせの気体の経路を設ける
ことができる。
After setting the movable and fitted heat insulating walls 2 and 3 at intended positions in accordance with the size of the test object, an air duct indicated by reference numeral 6 in FIG. 2 is attached to the side surface of the heat insulating wall 2 in FIG. 2 and the gate on the inner wall side of the test tank 4 in FIG. One is a duct for feeding gas and the other is a duct for exhausting. A plate for changing the outflow direction of gas is provided as indicated by reference numeral 15 in FIG. 2 so that the gas circulates sufficiently. The gate on the inner wall side of the test tank 4 in FIG. 2 is directly connected to the air passage to the heat exchanger. Further, depending on the height of the test tank, this duct is provided with reference numeral 17 in FIG. 2 or reference numeral 1 in FIG.
As shown by 8, a plurality of duct connection gates are present, and various combinations of gas paths can be provided as needed.

【0013】温度差をつけた気体は、図8に示すよう
に、符号19で示された試験対象物の温度を計っている
温度計と気体の吸入経路を決定する図8の符号20の弁
・ファン・熱交換器を制御する図8の符号21で示され
る制御部がリアルタイムで連動していて、試験開始前に
設定した熱衝撃に合わせて送られる。
As shown in FIG. 8, the gas having the temperature difference is connected to a thermometer for measuring the temperature of the test object indicated by reference numeral 19 and a valve indicated by reference numeral 20 in FIG. The control unit indicated by reference numeral 21 in FIG. 8 for controlling the fan / heat exchanger is linked in real time and sent in accordance with the thermal shock set before the start of the test.

【0014】以上のように設定して(図2)、温度範囲
20℃から125℃、仕切りを試験空間が試験槽の容積
の1/6になるように調節してBGAサンプル8枚に対
し熱衝撃を与える試験を行ったところ、従来の同様の加
熱能力をもつ装置で同様の設定で試験を行った場合に比
べて約4倍の速さで試験対象物が125℃に到達した。
また、同様の設定で熱衝撃を20℃から125℃まで毎
分20℃に設定して試験を行ったところ、消費電力は従
来の1/2に抑えられた。
With the above setting (FIG. 2), the temperature range was adjusted from 20 ° C. to 125 ° C., and the partition was adjusted so that the test space became 1/6 of the volume of the test tank, and the heat was applied to eight BGA samples. When a test for applying an impact was performed, the test object reached 125 ° C. about four times faster than a conventional apparatus having a similar heating capacity and a similar setting.
In addition, when a test was performed with the same setting and the thermal shock was set at 20 ° C./min from 20 ° C. to 125 ° C., the power consumption was reduced to の of the conventional power consumption.

【0015】[0015]

【発明の効果】可動のまたは取り外し可能な仕切りを使
って試験対象となる部分の容積を試験対象物に合わせて
できるだけ小さくすることによって、試験空間全体の熱
容量が低い・交換が必要な気体の量が従来に比べて極め
て少なくなり、試験空間や試験対象物を効率良く温度変
化させることができる。また、気相を用いた試験である
にもかかわらず、従来よりも簡単に高い熱衝撃を与える
ことが可能となる。
The heat capacity of the entire test space is low by using a movable or removable partition to reduce the volume of the portion to be tested to the size of the test object as much as possible. Is extremely reduced as compared with the related art, and the temperature of the test space and the test object can be efficiently changed. In addition, despite the test using a gas phase, it is possible to easily apply a higher thermal shock than before.

【0016】また、吸入空気の温度は、熱電対や放射温
度計のような温度計を用いて試験対象物の温度を元に排
出気体又は室温気体を吸入気体に量を調節しながら混ぜ
ることにより、試験対象物に与えたい熱衝撃を正確に制
御できる。
The temperature of the intake air is determined by mixing the exhaust gas or room temperature gas into the intake gas based on the temperature of the test object using a thermometer such as a thermocouple or a radiation thermometer. In addition, the thermal shock to be applied to the test object can be accurately controlled.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の装置の外観図である。FIG. 1 is an external view of an apparatus of the present invention.

【図2】試験室内の正面から見た図である。FIG. 2 is a diagram viewed from the front inside a test chamber.

【図3】縦方向の可動の断熱壁を示す図である。FIG. 3 is a diagram showing a vertically movable heat insulating wall.

【図4】横方向のはめ込み式の断熱壁を示す図である。FIG. 4 is a view showing a heat-insulating wall of a lateral insertion type.

【図5】図4の符号10の部分を拡大して示す図であ
る。
FIG. 5 is an enlarged view showing a portion denoted by reference numeral 10 in FIG. 4;

【図6】図2の符号7の部分を拡大して示す図である。FIG. 6 is an enlarged view showing a portion denoted by reference numeral 7 in FIG. 2;

【図7】図2の断熱壁2,3の固定部分を示す図であ
る。
FIG. 7 is a view showing a fixed portion of the heat insulating walls 2 and 3 of FIG. 2;

【図8】試験槽以外の部分の気体の流れと制御の仕組み
を示す図である。
FIG. 8 is a diagram showing a gas flow and a control mechanism of a portion other than the test tank.

【符号の説明】[Explanation of symbols]

1 試験対象物 2 可動の断熱壁 3 はめ込み式の断熱壁 4 試験槽 6 エアダクト 9 超弾性体 17,18 ダクト接続用ゲート 19 温度計 20 弁・ファン・熱交換器 21 制御部 DESCRIPTION OF SYMBOLS 1 Test object 2 Movable heat insulation wall 3 Embedded heat insulation wall 4 Test tank 6 Air duct 9 Superelastic body 17, 18 Duct connection gate 19 Thermometer 20 Valve / fan / heat exchanger 21 Control unit

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 試験槽内を可動又は取り外し可能な仕切
りで必要最小限の容積となるように区切ることが可能と
なっていることを特徴とする熱サイクル又は熱衝撃を与
える試験装置。
1. A test apparatus for applying a thermal cycle or thermal shock, wherein the inside of a test tank can be partitioned by a movable or removable partition so as to have a minimum necessary volume.
【請求項2】 仕切り壁や試験槽壁の様々な部分に温度
変化を与えるための気体を送り込む又は排出するエアダ
クトを設置するゲートが存在するような請求項1に記載
の熱サイクル又は熱衝撃を与える試験装置。
2. The heat cycle or thermal shock according to claim 1, wherein there is a gate for installing an air duct for feeding or discharging a gas for giving a temperature change to various parts of the partition wall or the test chamber wall. Giving test equipment.
【請求項3】 試験槽に送り込む気体の温度を排出する
気体を吸入前の空気又は熱処理前の空気に混ぜ合わせる
ことによって、試験対象物に与える熱衝撃をコントロー
ルできるような請求項1に記載の熱サイクル又は熱衝撃
を与える試験装置。
3. The method according to claim 1, wherein the temperature of the gas sent into the test vessel is mixed with air before inhalation or air before heat treatment to control the thermal shock applied to the test object. A test device that gives a thermal cycle or thermal shock.
【請求項4】 請求項3に記載の方法で熱衝撃を試験対
象物に与える際に、気相の温度ではなく、試験対象物そ
のものの温度を熱電対又は放射温度計のような温度計を
用いて測定し、その結果を請求項3に記載の方法にフィ
ードバックして与える熱衝撃をコントロールするような
請求項1に記載の熱サイクル又は熱衝撃を与える試験装
置。
4. When a thermal shock is applied to a test object by the method according to claim 3, a thermometer such as a thermocouple or a radiation thermometer is used to measure not the temperature of the gas phase but the temperature of the test object itself. The thermal cycle or thermal shock test apparatus according to claim 1, wherein the thermal shock or thermal shock is controlled by controlling the thermal shock to be applied and measured and fed back to the method according to claim 3.
JP2001146477A 2001-05-16 2001-05-16 Apparatus for thermal shock or thermal cycle test Withdrawn JP2002340783A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001146477A JP2002340783A (en) 2001-05-16 2001-05-16 Apparatus for thermal shock or thermal cycle test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001146477A JP2002340783A (en) 2001-05-16 2001-05-16 Apparatus for thermal shock or thermal cycle test

Publications (1)

Publication Number Publication Date
JP2002340783A true JP2002340783A (en) 2002-11-27

Family

ID=18992127

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001146477A Withdrawn JP2002340783A (en) 2001-05-16 2001-05-16 Apparatus for thermal shock or thermal cycle test

Country Status (1)

Country Link
JP (1) JP2002340783A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104990823A (en) * 2015-05-22 2015-10-21 广州建设工程质量安全检测中心有限公司 Building curtain wall thermal cycle test method and test apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104990823A (en) * 2015-05-22 2015-10-21 广州建设工程质量安全检测中心有限公司 Building curtain wall thermal cycle test method and test apparatus

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