JP2002323994A - System for testing operation input - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an operation input test system in which a simulated operation test of a virtual input by a user can be performed with respect to an operation key such as a switch and a button for performing an operation input. SOLUTION: This operation input test system is provided with a test signal generating device 1 connected to a device 2 to be tested being a target device to be tested and for transmitting a test signal to the device 2 to be tested. The test signal generating device 1 has a setting inputting part 11 for performing an operation input of test contents set by a tester, and a test signal generating part 12 for generating a simulated test signal instead of an operation signal to be given to a controlling part 22 from the operation inputting part 21 of the device 2 to be tested in accordance with the test contents subjected to an operation input to the setting inputting part 11, and performs an operation test by applying the test signal generated by the test signal generating part 12 to a connection line 23 connecting the operation inputting part 21 of the device 2 to be tested to the controlling part 22 in performing the operation test.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an operation input test system for performing an operation test of operation software of a device under test, and more particularly, to an operation key such as a switch or a button for inputting an operation, and to an operation key. The present invention relates to an operation input test system for performing an operation test of a device under test including a control unit that operates according to an operation input by a human.

[0002]

2. Description of the Related Art In recent years, various test apparatuses for inspecting the performance of various electronic devices have been proposed.

[0003] Japanese Patent Application Laid-Open No. 11-215521 discloses an error rate evaluation method and a signal generator. This includes AM television video multiplexed signals and quadrature amplitude modulation (QA).
M) Describes a method of evaluating an error rate of a transmission signal when a signal is multiplexed and optically transmitted, and a test signal generator used in the evaluation method.

On the other hand, Japanese Patent Application Laid-Open No. 2000-165291
Japanese Patent Application Laid-Open Publication No. HEI 10-125131 discloses a CDMA test signal generator. This describes a product-sum operation unit that is used by being incorporated in a mobile terminal using the CDMA communication system and that generates a test communication signal.

[0005]

However, in the various test apparatuses described above, it is assumed that the user has performed an operation input to an operation input unit including switches and operation buttons of the apparatus under test, Couldn't monitor how it works. That is, no function for testing the operation unit selection or operation timing by the user was found.

SUMMARY OF THE INVENTION The present invention has been made in view of the above circumstances, and has as its object to simulate various operations performed by a user with respect to operation keys such as switches and buttons for performing operation inputs. An object of the present invention is to provide an operation input test system capable of performing a test.

[0007]

According to a first aspect of the present invention, an operation input test system is connected to a device under test, which is a device under test, and transmits a test signal to the device under test. A test signal generation device, wherein the test signal generation device is configured to operate and input a test content to be set by a tester, and to operate the device under test according to the test content input to the setting input portion. A test signal generation unit that generates a simulated test signal instead of an operation signal to be given from the input unit to the control unit, and at the time of an operation test, the operation input unit and the control unit of the device under test are An operation test is performed by applying the test signal generated by the test signal generation unit to a connection line to be connected.

According to a second aspect of the present invention, there is provided an operation input test system.
2. The operation input test system according to claim 1, wherein the test signal generation device converts the simulated test signal into a signal in a format corresponding to an input to a device under test and outputs the signal. It is characterized in that it is provided between the tested machines.

According to a third aspect of the present invention, there is provided an operation input test system.
3. The operation input test system according to claim 1, further comprising a monitor connected to at least one of the test signal generation device and the device under test to monitor the operation of the device under test. It is.

The operation input test system according to claim 4 is
4. The operation input test system according to claim 3, wherein the monitor device includes a reporting unit that reports the abnormal event when detecting that a predetermined abnormal event has occurred with respect to a test result of the device under test. It is assumed that.

An operation input test system according to claim 5 is
5. The operation input test system according to claim 1, wherein the setting input unit sets an operation duration of the operation input unit of the device under test as the test content. 6. It is characterized by the following.

An operation input test system according to claim 6 is
6. The operation input test system according to claim 5, wherein the operation continuation time takes a predetermined time value as an input value, and varies a frequency of occurrence for each time value in a predetermined test time section including the predetermined time value. It is characterized in that it can be determined by the value of a given predetermined function.

The operation input test system according to claim 7 is
7. The operation input test system according to claim 6, wherein the function is such that the frequency of occurrence for each time value varies with the value of the Gaussian distribution function with respect to the operation continuation time.

An operation input test system according to claim 8 is:
7. The operation input test system according to claim 6, wherein the function varies the operation frequency with the value of a periodic function having an upper limit and a lower limit with respect to the operation continuation time for each time value. It is.

The operation input test system according to claim 9 is
5. The operation input test system according to claim 1, wherein the setting input unit sets an operation repetition time interval value in the operation input unit of the device under test as the test content. 6. It is characterized by having done.

According to a tenth aspect of the present invention, in the operation input test system according to the ninth aspect, the operation repetition time interval value includes a predetermined time value as an input value and a predetermined time value including the predetermined time value. In the test time section, the frequency of occurrence for each time interval value is determined by a value of a predetermined function.

The operation input test system according to claim 11 is the operation input test system according to claim 10,
The function is characterized in that, with respect to the operation repetition time interval value, the occurrence frequency of each time interval value is given a variation by the value of the Gaussian distribution function.

An operation input test system according to a twelfth aspect is the operation input test system according to the tenth aspect,
The function is characterized in that the frequency of occurrence for each time interval value varies with the value of a periodic function having an upper limit and a lower limit with respect to the operation repetition time interval value.

According to a thirteenth aspect of the present invention, in the operation input test system according to any one of the first to fourth aspects, the setting input unit includes, as the test content, The operation component to be tested in the operation input unit is set.

The operation input test system according to claim 14 is the operation input test system according to claim 13,
The operation component has a predetermined number value as an input value, and in a predetermined operation component number section including the predetermined number value, is determined by a value of a predetermined function that varies the selection frequency for each number value. It is characterized by having done.

An operation input test system according to a fifteenth aspect is the operation input test system according to the fourteenth aspect,
The function is characterized in that the selection frequency of each operation component is given a variation by the value of the Gaussian distribution function for the operation component.

The operation input test system according to claim 16 is the operation input test system according to claim 14,
The function is characterized in that the selection frequency of each operation value is varied with the value of a periodic function having an upper limit and a lower limit with respect to the operation component.

According to a seventeenth aspect of the present invention, there is provided the operation input test system according to any one of the first to sixteenth aspects, wherein an operator of at least one of the setting input unit and the operation input unit is provided. It is characterized by having a history recording unit for recording the operation input history.

The operation input test system according to claim 18 is the operation input test system according to claim 17,
The test signal generation device reads an operation input history recorded in the history recording unit, generates and outputs a test signal according to the operation input history, and causes a device under test to perform an operation according to the operation input history. Is reproduced.

The operation input test system according to the nineteenth aspect is the operation input test system according to the seventeenth aspect,
The test signal generation device reads the operation input history recorded in the history recording unit, processes the operation input history, generates and outputs a test signal corresponding to the operation input history, and performs the processing on the device under test. The operation according to the operation input history is performed.

[0026]

Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is an overall block diagram of an operation input test system according to a first embodiment of the present invention,
FIG. 2 is a block diagram illustrating that an operation test is performed by applying a test signal to a connection line of a device under test.

The first embodiment of the present invention will be described.
The operation input test system performs an operation test of the device under test by applying the test signal generated by the test signal generation device 1 to the device under test.

The test signal generator 1 includes a setting input unit 11
And a test signal generation unit 12.

The setting input unit 11 is an operation keyboard (not shown) for operating and inputting the test contents that the tester wants to set.
And a man-machine interface such as a mouse (not shown). A tester prepares a display such as a CRT or liquid crystal for the tester to input the test contents to be set using this operation keyboard and visually check the setting status. Have been.

The test signal generation unit 12 includes a computer hardware, program software for operating the computer, and a signal generation circuit (not shown) for generating a pulse signal whose time width, generation time interval, and number of continuously generated waves can be set. Shown)
It is comprised including. The test signal generating unit 12 operates the operation input unit 2 of the device under test 2 as the device under test in accordance with the test content input to the setting input unit 11.
Test signals to be provided from 1 to the control unit 22 are generated by various combinations of pulse signals. Then, the generated test signal is converted into a protocol corresponding to the device under test 2 and transmitted to the external I / O 13 of the test signal generation device 1.

The device under test 2 includes an operation input section 21, a control section 22, a connection line 23, an operation state display section 24, and a controlled section 25.

The operation input unit 21 is an operation key such as a switch or a button for performing an operation input. Operation input unit 21
For example, as shown in FIG.
11, a tilt switch 212, a slide switch 213, a liquid crystal touch panel 214, and the like. The push-down button 211 connects two signal lines by a conductive contact surface component (not shown) provided integrally on the back side of the operation unit when pressed. Such push-type buttons 211 include a type that returns to the original state by pressing once and a type that does not return to the original state unless pressed again. The tilt switch 212 is
It has one contact and can select which contact to connect by tilting the operation lever. The operation lever of the tilt changeover switch 212 is always connected to a common potential line, and the conductive lever (not shown) provided integrally on the back side of the operation unit by tilting of the operation lever causes other than the common potential line. And a connection between any one of the two signal lines and the common potential line. The slide changeover switch 213 has two contacts and can select which contact to connect by sliding a slide lever. Similarly, such a slide changeover switch 213 is also always connected to the common potential line, and a conductive contact surface component (not shown) provided integrally on the back side of the operation unit by sliding the slide lever causes a portion other than the common potential line. And a connection between any one of the two signal lines and the common potential line. The liquid crystal touch panel 214 has a plurality of operation units, and can be input by being pressed by a human finger. The liquid crystal touch panel 214 generates a signal indicating an input by a human touch operation.

The control unit 22 includes hardware mainly composed of a microcomputer, program software for operating the microcomputer, and an interface (not shown) for connecting to the connection line 23.
And a signal encoding circuit (not shown) that receives and encodes and demodulates a pulse signal group as a test signal from the test signal generation device 1
It is comprised including. The control unit 22 originally operates in response to a human operation input to the operation keys 21.

The connection line 23 is connected to the operation input unit 21 and the control unit 2.
2 and may be a covered lead wire or a pattern wiring. However, at the time of testing, the end opposite to the control unit 22 side is connected to the external I / O of the test signal generation device 1. Connected to the end of the transmission line L1 extending from O13, the test signal from the test signal generation device 1 is transmitted to the control unit 2
Send to 2. At this time, the signal indicating the operation input to the operation input unit 21 is not transmitted to the control unit 22 because all the signal lines are open at the ends.

The operation state display section 24 is an existing liquid crystal panel or the like which is originally provided in the device under test 2 and displays the operation state to the user regardless of the test of the device under test 2. And a state in which the control unit 22 controls the controlled unit 25, and the like, according to an instruction from the control unit 22.

The controlled unit 25 is a target to be actually controlled by the control unit 22 that has received the test signal. For example, the controlled unit 25 is a lighting driver circuit for controlling a blinking pattern of an LED group,
It may be a power line carrier signal driver circuit that generates a signal for reporting to an external reporting center, or a DSU built-in TA device that connects to a telephone line. The device under test 2 having such a controlled unit 25 is mainly a large-sized electronic device having a large number of operation buttons and switches, and taking an enormous amount of time to evaluate the operation. For example, a center device for disaster prevention and crime prevention and an information management center device such as a call center for nursing care are suitable examples. As described above, the device under test 2 is a device under test on which an operation test is performed by applying a test signal.

Accordingly, if the setting is made in the setting input section 11 of the test signal generating apparatus 1 and the test signal is applied to the connection line 23 as desired by the tester, the user can operate the operation input section 2 as if by the user.
A simulated operation test can be performed on the virtual input of the user as if the operation input was performed from 1.

In FIG. 2, each switch and the control unit 22
Although the form in which the signal connection from the outside has been made possible by disconnecting the connection between the switch and the outside has been shown, the present invention is not limited to this, and mechanical devices such as a push-button 211, a tilt switch 212 and a slide switch 213 are used. For components whose signal transmission to other components does not cause component destruction, the connection between each switch and the control unit 22 is not broken, The transmission line L <b> 1 may be connected to the connection between the portion 22 and the lead wire by soldering. Further, even if the liquid crystal touch panel is used, a liquid crystal touch panel 214 of a type in which signal transmission from the transmission line L1 does not cause component destruction.
If so, the test may be performed without disconnection.

The operation input test system can monitor the operation of the device under test 2 by connecting the monitor device 4. FIG. 3 is an overall block diagram showing a modification of the operation input test system according to the first embodiment of the present invention. The monitor device 4 includes a display monitor 41, an I / F 421, an I / F
422, an operation key group 43, a monitor control unit 44, a notification sound generation unit 45, and an abnormal data memory 46. The display monitor 41 is composed of a display and displays test setting contents and test status. I / F421 is
This interface is connected to the control unit 22 of the device under test 2 and converts the signal representing the operation status of the control unit 22 so that the data can be displayed on the display monitor 41. I / F42
Reference numeral 2 denotes an interface which is connected to the test signal generation unit 12 of the test signal generation device 1 and converts the data representing the operation status of the test signal generation unit 12 so that the data can be displayed on the display monitor 41. The operation key group 43 is capable of performing an operation input typified by a JIS keyboard, and is used by the tester to perform setting input of test contents, control input for forcibly stopping the test, and the like. The monitor control unit 44 includes the monitor device 4
The main control unit is configured to display the conversion data received from the I / Fs 421 and 422 on the display of the display monitor 41 in accordance with the operation input from the operation key group 43. The notification sound generation unit 45 includes a speaker, a buzzer, and the like for performing sound notification. The abnormal data memory 46 stores in advance a determination criterion to be determined as an abnormal value as a test result of the device under test 2. When the monitor control unit 44 detects that a predetermined abnormal event preset in the abnormal data memory 46 has occurred with respect to the test result of the device under test 2, at least the display monitor 41 and the notification sound generating unit 45 Using one of them, a notification indicating an abnormal event is performed.

The monitor device 4 connects the I / F 421 and the control unit 22 via a transmission line L21, and the I / F 422
And the test signal generator 12 are connected via the transmission line L22, and the operation of the test signal generator 1 and the device under test 2 is monitored. However, the monitor device 4 may monitor only one of the test signal generation device 1 and the device under test 2.

The test signal generating apparatus 1 of the operation input test system includes a setting input unit 11 and a test signal generating unit 12, and performs a test according to the test contents set and input by the tester at the setting input unit 11. The signal generation unit 12 generates a test signal and outputs it externally. Further, as a preferable example of the test content, an operation continuation time T1, an operation repetition time interval value T2, and an operation component number Pn are set. FIG. 4 is a flowchart showing a series of flows of a test using the operation input test system. FIG.
FIG. 5 is a generated waveform diagram illustrating a test signal generated in the test of FIG. 4. FIG. 6 is an explanatory diagram taking a Gaussian distribution function as an example as a predetermined function used for the test signals described in FIGS. 4 and 5. FIG. 7 is a flowchart illustrating a process performed based on the concept described with reference to FIG. 6 when setting each test content.

In the operation input test system, when the tester operates and inputs the test contents to be set by the setting input unit 11, the operation duration of the operation switch or button of the operation input unit 21 (the duration of pressing or the duration of ON). Time), the operation repetition time interval value T2 of the operation switch or button of the operation input unit 21 (time interval value from one operation to the next operation), and the operation component number representing the operation switch or button to be tested in the operation input unit 21 Pn can be selected.
Specifically, as shown in FIG. 4, the operation of the test signal generator 12 proceeds. The test signal generation unit 12 receives the number of tests n from the setting input unit 11 (step S10).
0), the mode shifts to a mode for setting the operation continuation time T1 of the operation switch or button of the operation input unit 21 (step S1).
10). When the input for the setting is detected, the test signal generation unit 12 shifts to a mode in which the operation duration T1 is determined by a value of a predetermined function (step S120). At this time, a predetermined time value (c1) is used as an input value on the time axis for the operation continuation time length, and a predetermined test time interval (△ Ttes) including the predetermined time value (c1) is obtained by the function.
The number of occurrences for each time value within t) is varied. If the input for the setting is not detected in step S110, the test signal generation unit 12
Sets the operation duration time T1 as a predetermined standard value (step S130).

Further, the test signal generator 12 determines in step S
120 or after step S130, the operation input unit 2
Operation switch and button operation repeat time interval value T
The mode shifts to a mode for setting 2 (step S140).
When an input for the same setting is detected, the test signal generator 12
Shifts to a mode in which the operation repetition time interval value T2 is determined by a value of a predetermined function (step S150). At this time, a predetermined time interval value (c2) is used as an input value on the time axis for the operation repetition time interval length, and a predetermined test time interval (△ Ttest) including the predetermined time interval value (c2) is obtained by the function. The number of occurrences for each of the time interval values within is varied. If the input for the setting is not detected in step S140, the test signal generation unit 12 sets the operation repetition time interval value T2 as a predetermined standard value (step S1).
60). Then, the test signal generation unit 12 determines in step S1
After 50 or step S160, a test signal is generated and output to the connection line 23 according to the determined operation duration time T1 and operation repetition time interval value T2 (step S170).

Further, after step S170, the test signal generator 12 shifts to a mode for selecting an operation component number Pn representing an operation switch or button to be tested on the operation input unit 21 (step S180). When the input for the setting is detected, the test signal generation unit 12 shifts to a mode in which the operation component number Pn is determined by a value of a predetermined function (step S190). At this time, a predetermined number value (c3) is set as an input value on the number sequence axis for the operation component number Pn, and the predetermined operation component number section (@Ttest) including the predetermined number value (c3) is used by the function. In the number of selections for each number value. If the input for the same setting is not detected in step S180, the test signal generator 12 ends the series of setting reception. In addition,
In step S170, after the operation component number Pn is determined after step S190, the operation component number Pn may be collectively output in step S190. here,
The operation part number section determines the range of the number value assigned to each operation part of the operation input unit 21 on the number order axis. That is, the minimum number value and the maximum number value of the operation component to be tested are determined, and only the operation component having the number value in the section is set as the test object.

Here, as shown in FIG. 5, in order to represent the operation continuation time T1, if the operation continuation time T1 is key-inputted with a numerical value in the setting input section 11, a pulse width corresponding to this input value is generated. . Similarly, when the operation repetition time interval value T2 is expressed, if the operation repetition time interval value T2 is key-inputted with a numerical value, a pulse width according to the input value is generated. Further, when the operation component number Pn is represented, if the number value is key-inputted with a numerical value, the operation component number Pn representing the operation switch or button of the operation input unit 21 to be tested can be selected and set. In addition,
The number value is assigned to all the operation switches and buttons of the operation input unit 21 in advance, and when this is input as a test content, the operation component corresponding to the numerical value is operated.

Next, referring to FIG. 6 and FIG. 7, the test signal generator 12 in steps S120, S150, and S190 will be described.
Will be described in detail by taking a Gaussian distribution function as an example of a function. The reason for adopting the Gaussian distribution function is that it accurately reflects typical statistical phenomena in natural phenomena, and that the variability when humans operate the operation buttons and switches is very similar to the Gaussian distribution function. It is because it is thought that it is.

The test signal generator 12 has a frequency function y represented by the equation (1) in advance.

Y = Nrand (C1, σ, MAX, min) = Gauss (C1, σ, MAX, min) (1) where y is the frequency of occurrence as shown on the vertical axis of FIG. , And the shape of the function is determined by C1, σ, MAX, and min. C1 is an input value representing a predetermined time value (c1) on the time axis of the operation duration time. σ is a standard deviation value giving the degree of spread of the Gaussian distribution function, and is also an input value. MA
X and min are input values of an upper limit and a lower limit, respectively, which give a range to be tested, and the test time interval (時間 Ttes)
t) is determined. Nland is a random number that generates a normal random number and generates C1 as a mode in a range from min to MAX according to the normal random number and input values of C1, σ, MAX, and min. Follows a Gaussian distribution. To generate the normal random numbers, a central limit theorem is used to generate pseudo random numbers that follow a Gaussian distribution.

Here, in FIG. 7, for example, C1 = 10
0 (msec), σ = 30, MAX = 200 (msec
c), min = 50 (msec) is set (step S200). Then, the test signal generation unit 12 generates a normal random number (step S210), and converts this value according to σ = 30 and the average value (mode value) C1 (step S210).
220). The test signal generation unit 12 generates test values for the operation duration time one after another so as to follow the shape of the Gaussian distribution function.

The test value automatically generated as a random number is not used in the test unless it is within a predetermined test time interval (時間 Ttest) (steps S230 and S24).
0), the remaining value groups are used for the actual test (step S250). In short, the function Nland is
Regarding the operation duration T1, a variation is given by the value of the Gaussian distribution function.

Similarly, the function Nrand gives variation in the value of the Gaussian distribution function with respect to the operation repetition time interval value T2. For example, as the operation repetition time interval value T2, as a result of the preliminary experiment, 300 (msec)
It has been confirmed that a value that is extremely close to is frequently generated, and the result of a test in which this value is input and set as the predetermined time value c2 can be sufficiently expected. Similarly, the function Nr
and gives variation in the number of selections for each one of the operation component numbers Pn by the value of the Gaussian distribution function.

The function is not limited to the Gaussian function, but may be a periodic function having an upper limit and a lower limit represented by a sine function, a cosine function, a triangular wave function, a sawtooth waveform, and the like.

Thus, the operation continuation time T
1. With respect to the operation repetition time interval value T2 and the operation component number Pn, it is possible to perform simulations that are close to actual human operations.

In the operation input test system, when the monitor device 4 detects an operation pattern other than a predetermined operation before the test for the operation pattern of the control unit 22 of the device under test 2, The controller 22 determines that an abnormality has occurred in the control unit 22 and performs additional tests with emphasis on the vicinity of the selected values of the operation continuation time T1, the operation repetition time interval value T2, and the operation component number Pn, which are conditions for the occurrence of the abnormality. Therefore, it becomes easier to retest the cause of the abnormality.

Next, a second embodiment of the present invention will be described.
This operation input test system converts a test signal, which is an output of the test signal generation device 1, between the test signal generation device 1 and the device under test 2 into a test signal having a data format for the device under test 2 and outputs the test signal. The second embodiment differs from the first embodiment in that a signal conversion interface unit 3 is provided. In the first embodiment, the test signal generated by the test signal generation unit 12 is
The test signal generation unit 12 itself converts the protocol and sends it out. However, in the present embodiment, the test signal generated by the test signal generation unit 12 is sent out as it is, and the signal conversion interface unit provided separately is used. In step 3, protocol conversion is performed. FIG. 8 is an overall block diagram of the operation input test system according to the second embodiment of the present invention.

The test signal generation unit 12 provided in the test signal generation device 1 generates the test signal described in the above-described first embodiment in accordance with the test content input to the setting input unit 11 and directly receives the test signal. Output in the form The signal conversion interface unit 3 includes a protocol data storage unit 31, a conversion operation key unit 32, a signal conversion control unit 33, and an I / O for connecting to the test signal generation device 1 via the existing transmission line L11.
/ O341 and the device under test 2 via the existing transmission line L12
And an I / O 342 for connection to the The protocol data storage unit 31 stores data that faithfully reproduces communication formats of a plurality of conventionally known communication protocols. Of course, the communication format of the communication protocol originally developed by the tester is also stored as appropriate. The conversion operation key unit 32 is an input device for the tester to input which communication protocol is to be selected before and after conversion among communication protocols stored in the protocol data storage unit 31, and is a JIS standard keyboard. Are used. The signal conversion control unit 33, according to the instruction input of the communication protocol before and after the conversion selected by the conversion operation key unit 32, the protocol data storage unit 3
1 to their communication protocol data (2 before and after conversion)
) Is read, and protocol data (before conversion) received from the I / O 341 is subjected to protocol conversion (after conversion).
Send it to I / O 342.

In other words, the signal conversion interface unit 3 converts the test signal input from the test signal generator 1 into a format corresponding to the input to the device under test 2 based on the information contained in the test signal. And output. That is, when an operator inputs an operation to the operation input unit 21 of the device under test 2, the operation signal is converted into an operation signal that should be generated as an output of the operation input unit 21. As described above, the signal conversion interface unit 3 is an interface circuit having a protocol conversion function of converting a predetermined protocol into another predetermined protocol. Then, an operation test is performed by applying the test signal whose protocol has been converted by the signal conversion interface unit 3 to the connection line 23 of the device under test 2. Therefore, only the signal conversion interface unit 3 needs to be changed in communication software and the specifications of the I / Os 341 and 342 which are input / output interfaces as required, and the change target can be concentrated only in the signal conversion interface unit 3. It is easier to deal with changes.

More specifically, the present embodiment tends to be meaningless when compared with, for example, updating protocol data stored in the test signal generation unit 12 to new protocol data before the test. It is. However,
If the test signal generation unit 12 is designed to convert and transmit a communication protocol such as RS232C, RS485, or HDLC which is well known in the related art, the amount of information that must be stored and held in the test signal generation unit 12 increases. This hinders downsizing of the generation device 1. In addition, in a situation where the test is unsuccessful with the first embodiment described above, even if the cause is the test signal generation device 1, it is determined whether the setting input specification is wrong or the protocol conversion function is wrong. Carving is simply not possible. Thus, as in the present embodiment, only the protocol conversion function is separated from the test signal generation device 1, so that when a test trouble occurs, the cause of the trouble can be easily found at an early stage.

Further, any one of the test signal generating device 1, the device under test 2, the signal conversion interface unit 3, and the monitor device 4 of the operation input test system has the setting input unit 1.
A history recording unit that records an operation input history of the operator in at least one of the operation input unit 1 and the operation input unit 21 is provided. As shown in FIG. 8, a history recording unit 51 corresponding to the setting input unit 11 and a history recording unit 52 corresponding to the operation input unit 21 are prepared. Therefore, the history of test setting input can be viewed later, and can be used as reference for subsequent tests.

Of the operation input histories stored in the history recording unit, the operation input history input from at least one of the setting input unit 11 and the operation input unit 21 is transferred to the test signal generation device 1 or the signal conversion interface unit. 3, the operation can be reproduced in the device under test 2 according to the operation input history. The reproduction operation test at this time is performed by the setting input unit 11 and the operation input unit 21.
Of these, the operation input history with the higher priority is performed first, and then the operation input history with the lower priority is executed. When the operation input history is processed and output as the processing operation input history after being read into the test signal generation device 1 or the signal conversion interface unit 3,
The device under test 2 can execute an operation according to the processing information. Therefore, if there is a problem with the actual operation result,
By gradually changing the settings of the data input by operation, it is possible to mainly test the problem location. Further, not only a mere reproduction test but also an additional test can be performed in accordance with processing information modified based on an actual test result, and the test function can be enhanced.

[0061]

As described above, the operation input test system according to the first aspect of the present invention includes a test signal generator connected to a device under test, which is a device under test, and transmitting a test signal to the device under test. The test signal generation device includes: a setting input unit for performing operation input of a test content that the tester wants to set; and a control unit from the operation input unit of the EUT according to the test content input to the setting input unit. A test signal generation unit that generates a simulated test signal instead of an operation signal to be given to a connection line that connects the operation input unit and the control unit of the device under test during an operation test. Since the operation test is performed by applying the test signal generated by the test signal generation unit, a simulated operation test can be performed for a virtual input of the user.

The operation input test system according to claim 2 is
2. The operation input test system according to claim 1, wherein the test signal generation device converts the simulated test signal into a signal in a format corresponding to an input to a device under test and outputs the signal. Since it is provided between the devices to be tested, the object to be changed can be concentrated only on the signal conversion interface unit, so that it is easy to deal with a system change. In addition, since only the protocol conversion function is separated from the test signal generation device 1, when a test trouble occurs, the cause of the trouble can be easily found at an early stage.

An operation input test system according to claim 3 is
3. The operation input test system according to claim 1, further comprising a monitor device connected to at least one of the test signal generation device and the device under test to monitor the operation of the device under test. Can be confirmed, and the occurrence of an abnormality in the test result can be detected.

The operation input test system according to claim 4 is
4. The operation input test system according to claim 3, wherein the monitor device includes a notifying unit for notifying the abnormal event when detecting that a predetermined abnormal event has occurred with respect to a test result of the device under test. When it is detected that an abnormality has occurred with respect to the result, a notification to that effect can be given.

In the operation input test system according to the fifth to eighth aspects, the operation duration can be set as the test content to be input to the setting input section, and the Gaussian distribution function is used for the operation duration. Since a variation can be given by using a periodical function or a periodic function, a simulation close to the actual operation of a human can be performed.

In the operation input test system according to the ninth to twelfth aspects, an operation repetition time interval value can be set as a test content input to the setting input section. , The variation can be given using a Gaussian distribution function or a periodic function, so that a simulation close to the actual operation of a human can be performed.

According to a thirteenth aspect of the present invention, in the operation input test system, an operation component to be tested by the operation input unit of the device under test can be set as a test content to be operated and input to the setting input unit. With respect to the operation component, the number of selections for each operation component can be given a variation using a Gaussian distribution function or a periodic function, so that a simulation close to the actual operation of a human can be performed. .

According to a seventeenth aspect of the present invention, there is provided the operation input test system according to any one of the first to sixteenth aspects, wherein an operator of at least one of the setting input unit and the operation input unit is provided. Since the history recording unit for recording the operation input history is provided, the history of the test setting input can be viewed later, and can be used as a reference for the subsequent tests.

The operation input test system according to claim 18 is the operation input test system according to claim 17,
The test signal generation device reads the operation input history recorded in the history recording unit, and generates and outputs a test signal according to the operation input history. The corresponding operation can be reproduced.

The operation input test system according to claim 19 is the operation input test system according to claim 17,
The test signal generation device reads the operation input history recorded in the history recording unit, processes the operation input history, generates and outputs a test signal corresponding to the operation input history, and performs the processing on the device under test. The operation according to the operation input history is executed, so if there is a problem with the actual operation result, the setting of the input data is changed little by little to test the problem part intensively can do.

[Brief description of the drawings]

FIG. 1 is a block diagram showing a configuration of an operation input test system according to a first embodiment of the present invention.

FIG. 2 is a block diagram illustrating a configuration of a device under test of the operation input test system according to the first embodiment of the present invention.

FIG. 3 is a block diagram showing a configuration of a modification of the operation input test system according to the first embodiment of the present invention.

FIG. 4 is a flowchart when a test content is operation-input to a setting input unit of the operation input test system according to the first embodiment of the present invention.

FIG. 5 is an explanatory diagram illustrating a test signal generated by a test signal generation unit of the operation input test system according to the first embodiment of the present invention.

FIG. 6 is an explanatory diagram using a Gaussian function as a predetermined function used for a test signal of the operation input test system according to the first embodiment of the present invention.

FIG. 7 is a flowchart when setting each test content of the operation input test system according to the first embodiment of the present invention.

FIG. 8 is a block diagram illustrating a configuration of an operation input test system according to a second embodiment of the present invention.

[Explanation of symbols]

 REFERENCE SIGNS LIST 1 test signal generation device 2 device under test 3 signal conversion interface unit 4 monitoring device 11 setting input unit 12 test signal generation unit 21 operation input unit 22 control unit 23 connection line 45 notification sound generation unit 46 abnormal data memory 51, 52 history recording Part L1 Transmission line

Continued on the front page (51) Int.Cl. ⁷ Identification symbol FI Theme coat II (Reference) H04M 1/24 H04M 1/24 B (72) Inventor Yasumasa Namikoshi 1048 Ojidomazuma, Kadoma City, Osaka Matsushita Electric Works, Ltd. (72) Inventor Naokatsu Oshibe 1048 Kadoma, Kadoma, Osaka Prefecture Inside Matsushita Electric Works, Ltd. Daishi Kuwana 1048 Kazuma Kadoma, Kadoma City, Osaka Prefecture F-term in Matsushita Electric Works Co., Ltd. (reference)

Claims (19)

[Claims] 1. A test signal generation device connected to a device under test as a device under test and transmitting a test signal to the device under test, wherein the test signal generation device operates a test content that a tester wants to set. A test for generating a simulated test signal instead of an operation signal to be given from the operation input unit of the device under test to the control unit in accordance with a setting input unit to be input and a test content operation-input to the setting input unit A signal generation unit, and at the time of an operation test, by applying the test signal generated by the test signal generation unit to a connection line connecting the operation input unit and the control unit of the device under test, An operation input test system characterized in that an operation test is performed. 2. A signal conversion interface for converting the simulated test signal into a signal according to an input to the device under test and outputting the signal between the test signal generating device and the device under test. The operation input test system according to claim 1, wherein the operation input test system is provided. 3. The apparatus according to claim 1, further comprising a monitor connected to at least one of the test signal generator and the device under test and monitoring the operation of the device under test.
The operation input test system as described. 4. The monitoring device according to claim 3, wherein the monitoring device includes a notifying unit that, when detecting that a predetermined abnormal event has occurred with respect to a test result of the device under test, notifies the abnormal event. Operation input test system. 5. The apparatus according to claim 1, wherein the setting input unit sets an operation duration of the operation input unit of the device under test as the test content. The operation input test system according to 1. 6. The operation duration is a value of a predetermined function that takes a predetermined time value as an input value and gives a variation in occurrence frequency for each time value in a predetermined test time section including the predetermined time value. The operation input test system according to claim 5, wherein the operation input test system is determined by: 7. The operation input test system according to claim 6, wherein the function is such that the frequency of occurrence for each time value varies with the value of the Gaussian distribution function with respect to the operation continuation time. 8. The operation input according to claim 6, wherein the function is such that, with respect to the operation continuation time, the occurrence frequency for each time value varies with a value of a periodic function having an upper limit and a lower limit. Testing system. 9. The apparatus according to claim 1, wherein the setting input section sets an operation repetition time interval value in the operation input section of the device under test as the test content. The operation input test system according to any one of the above. 10. The operation repetition time interval value includes a predetermined time value as an input value, and a predetermined test time section including the predetermined time value, which causes a variation in occurrence frequency for each time interval value. The operation input test system according to claim 9, wherein the operation input test system is determined by a function value. 11. The operation input test according to claim 10, wherein the function is such that, with respect to the operation repetition time interval value, the occurrence frequency of each time interval value varies with the value of the Gaussian distribution function. system. 12. The function according to claim 10, wherein the frequency of occurrence of the operation repetition time interval value varies with a value of a periodic function having an upper limit and a lower limit for the occurrence frequency for each time interval value. Operation input test system. 13. The apparatus according to claim 1, wherein the setting input section sets an operation component to be tested by the operation input section of the device under test as the test content. The operation input test system described in any of them. 14. The operation component receives a predetermined number value as an input value, and in a predetermined operation component number section including the predetermined number value, a value of a predetermined function that varies the selection frequency for each number value. 14. The operation input test system according to claim 13, wherein: 15. The operation input test system according to claim 14, wherein the function is such that the selection frequency for each number value of the operation component varies with the value of the Gaussian distribution function. 16. The operation input test according to claim 14, wherein the function is such that the selection frequency of each operation component varies with the value of a periodic function having an upper limit and a lower limit with respect to the operation component. system. 17. The apparatus according to claim 1, further comprising a history recording unit that records an operation input history of an operator in at least one of the setting input unit and the operation input unit. The operation input test system as described. 18. The test signal generation device reads an operation input history recorded in the history recording unit, generates and outputs a test signal according to the operation input history, and causes the device under test to perform the operation input 18. The operation input test system according to claim 17, wherein an operation according to the history is reproduced. 19. The test signal generation device reads an operation input history recorded in the history recording unit, processes the operation input history, generates and outputs a test signal corresponding to the operation input history, 18. The operation input test system according to claim 17, wherein the machine is caused to execute an operation according to the processed operation input history.