JP2002277410A5 - - Google Patents
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- Publication number
- JP2002277410A5 JP2002277410A5 JP2001076942A JP2001076942A JP2002277410A5 JP 2002277410 A5 JP2002277410 A5 JP 2002277410A5 JP 2001076942 A JP2001076942 A JP 2001076942A JP 2001076942 A JP2001076942 A JP 2001076942A JP 2002277410 A5 JP2002277410 A5 JP 2002277410A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001076942A JP2002277410A (en) | 2001-03-16 | 2001-03-16 | Visual inspection method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001076942A JP2002277410A (en) | 2001-03-16 | 2001-03-16 | Visual inspection method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2002277410A JP2002277410A (en) | 2002-09-25 |
| JP2002277410A5 true JP2002277410A5 (en) | 2008-04-24 |
Family
ID=18933785
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2001076942A Pending JP2002277410A (en) | 2001-03-16 | 2001-03-16 | Visual inspection method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2002277410A (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4084257B2 (en) * | 2003-07-15 | 2008-04-30 | 株式会社メガトレード | Printed circuit board inspection equipment |
| JP4804779B2 (en) * | 2004-03-29 | 2011-11-02 | アジュハイテク・インコーポレーテッド | Over-detection prevention system and processing method for visual inspection of printed circuit board in film and tape form |
| JP2006126020A (en) * | 2004-10-29 | 2006-05-18 | Fujitsu Ltd | Defect inspection device and defect inspection method |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000249658A (en) * | 1999-03-02 | 2000-09-14 | Olympus Optical Co Ltd | Inspection apparatus |
| JP2000283929A (en) * | 1999-03-31 | 2000-10-13 | Fujitsu Ltd | Wiring pattern inspection method, and its device |
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2001
- 2001-03-16 JP JP2001076942A patent/JP2002277410A/en active Pending