JP2002273308A - Dry state measuring device and coating film dryer equipped with the device - Google Patents
Dry state measuring device and coating film dryer equipped with the deviceInfo
- Publication number
- JP2002273308A JP2002273308A JP2001073726A JP2001073726A JP2002273308A JP 2002273308 A JP2002273308 A JP 2002273308A JP 2001073726 A JP2001073726 A JP 2001073726A JP 2001073726 A JP2001073726 A JP 2001073726A JP 2002273308 A JP2002273308 A JP 2002273308A
- Authority
- JP
- Japan
- Prior art keywords
- light
- coating film
- drying
- solvent
- dry state
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
- Drying Of Solid Materials (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Coating Apparatus (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、例えば磁気テー
プ、セラミック、工業用テープなど、顔料・不透明粉体
などを含む塗料をフィルム状に成形する際の乾燥技術を
用いた乾燥状態測定装置およびそれを備えた塗膜乾燥機
に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a dry state measuring apparatus and a dry state measuring apparatus using a drying technique when a paint containing pigment, opaque powder, etc., such as a magnetic tape, ceramic, or industrial tape, is formed into a film. The present invention relates to a coating film dryer provided with:
【0002】[0002]
【従来の技術】無機物・有機物を問わず各種粉体とバイ
ンダーを溶媒に分散し塗料を構成し、基材フィルム上に
均一に塗布・乾燥工程を経て形成される、機能性フィル
ム・テープが民生分野・工業分野を問わず、多くの場面
で利用されている。2. Description of the Related Art Functional films and tapes are commercially available, in which various powders and binders, whether inorganic or organic, are dispersed in a solvent to form a coating material and uniformly formed on a base film through a coating and drying process. It is used in many situations, regardless of field or industrial field.
【0003】上記の機能性フィルムの製造方法の概略を
表すと、以下の様になる。即ち、機能性を発現する粉体
と、その粉体同士を結合するバインダーを溶媒中に均一
分散させ塗料を作成する。良好な分散状態が維持された
塗料は、塗工機により基材フィルム上に均一塗布され
る。この際、用いられる塗工機は、基材フィルムを送り
出す送り出し部・基材フィルム上に塗料を塗布するコー
タヘッド・塗布された塗料塗膜を乾燥する乾燥機・乾燥
塗膜が形成されたフィルムをロールに巻き取る巻き取り
部の4部に大別される。[0003] An outline of a method for producing the above-mentioned functional film is as follows. That is, a powder that exhibits functionality and a binder that binds the powders are uniformly dispersed in a solvent to prepare a paint. The coating material in which a good dispersion state is maintained is uniformly applied on the base film by a coating machine. In this case, the coating machine used is a feeding section for feeding the base film, a coater head for applying the coating on the base film, a dryer for drying the applied coating film, and a film on which the dried coating film is formed. Is roughly divided into four parts, ie, a winding part for winding the material into a roll.
【0004】コータヘッドは塗布方式により多種多様で
あり、その塗料の流動特性等を考慮した最適なものが採
用される。コータヘッドで塗膜の形成されたフィルムは
乾燥機に送られ、塗膜の乾燥工程に進む。乾燥機の方式
は、熱風乾燥や電熱等による赤外線乾燥方式など多種多
様であり、塗膜と基材との特性から最適な方式が選択さ
れる。一般に、熱風乾燥は乾燥効率は高いが、表面から
乾燥が進行するため、塗膜にクラックが発生する場合が
ある。また、遠赤外線ヒータによる乾燥の場合、塗膜内
部から加熱が進行するため、表面にクラックは発生し難
いが、乾燥効率が低いため被乾燥物の送りを抑えなけれ
ばならない。乾燥状態の検出手法としては、溶剤の光吸
収スペクトルをモニタするもの、塗膜表面を赤外線放射
温度計でモニタするものなどが考えられる。乾燥が終了
したフィルムは基材フィルムごとロール上に巻き取られ
る。この後、ロール状のフィルムはスリッター等により
一定幅に裁断され、製品や次工程に流される。[0004] There are various types of coater heads depending on the coating method, and the most suitable one is adopted in consideration of the flow characteristics and the like of the paint. The film on which the coating film is formed by the coater head is sent to a dryer, and proceeds to a coating film drying step. There are various types of dryers, such as hot air drying and infrared drying using electric heat, and the most suitable drying method is selected from the characteristics of the coating film and the base material. Generally, hot-air drying has high drying efficiency, but since the drying proceeds from the surface, cracks may occur in the coating film. In the case of drying using a far-infrared heater, cracks are unlikely to occur on the surface because heating proceeds from the inside of the coating film. However, since the drying efficiency is low, the feed of the object to be dried must be suppressed. As a method for detecting the dry state, a method of monitoring the light absorption spectrum of the solvent, a method of monitoring the coating film surface with an infrared radiation thermometer, and the like can be considered. The dried film is wound up on a roll together with the base film. Thereafter, the roll-shaped film is cut into a fixed width by a slitter or the like, and is flowed to a product or the next step.
【0005】[0005]
【発明が解決しようとする課題】技術の進展に伴って形
成されるフィルムへの要求使用の厳しくなり、「より均
一に」「より寸歩精度良く」の観点から、基材フィルム
への塗料塗布精度の高精度化と共に、乾燥条件の最適化
が重要である。それには、均一乾燥がキーポイントで、
塗膜の乾燥状態の観測が不可欠である。しかし、塗膜表
面を赤外線放射温度計での測定は、塗膜周囲に赤外線放
射源がある状態、すなわち乾燥工程中では精度向上が望
めない。また、光吸収スペクトルによる残留溶媒を測定
する場合、溶媒が水などで被乾燥物と分子構造が大きく
異なるものに対しては適応できるが、溶媒が有機溶剤,
被乾燥物に樹脂バインダを含むような場合は、溶媒と被
乾燥物の分子構造が似通っている場合があり、この方法
は適応できない場合がある。また、複数の有機溶媒から
なる複合溶媒を用いた場合も光吸収スペクトル方式での
乾燥状態検出は困難である。With the advancement of technology, the required use of films formed has become strict, and from the viewpoints of "more uniform" and "more precise stepping", coating of paints on substrate films. It is important to optimize the drying conditions as well as to increase the precision. For that, uniform drying is the key point,
It is essential to observe the dryness of the coating. However, when the surface of the coating film is measured by an infrared radiation thermometer, an improvement in accuracy cannot be expected in a state where an infrared radiation source is present around the coating film, that is, during the drying process. Further, when measuring the residual solvent by light absorption spectrum, the method can be applied to the case where the solvent is water or the like and the molecular structure is largely different from that of the substance to be dried.
When the material to be dried contains a resin binder, the molecular structure of the solvent may be similar to that of the material to be dried, and this method may not be applicable. Also, when a complex solvent composed of a plurality of organic solvents is used, it is difficult to detect a dry state by a light absorption spectrum method.
【0006】本発明は、上記の課題を鑑みて成されたも
のであり、乾燥工程中にリアルタイムで乾燥状態を測定
する乾燥状態測定装置および、それを用いた乾燥機を提
供すること、この乾燥機を用いて高精度な積層型セラミ
ック電子部品を作製すること、この電子部品を用いて小
型で高精度な携帯電話や携帯端末などの通信装置を提供
することを目的とする。SUMMARY OF THE INVENTION The present invention has been made in view of the above problems, and has as its object to provide a dry state measuring device for measuring a dry state in real time during a drying process, and a dryer using the same. It is an object of the present invention to manufacture a high-precision multilayer ceramic electronic component using a machine, and to provide a small and high-precision communication device such as a mobile phone or a mobile terminal using the electronic component.
【0007】[0007]
【課題を解決するための手段】上記の目的を達成するた
めに、本願第1の発明の乾燥状態測定装置は、光透過性
を有する溶媒と、前記溶媒中に分散された粉体を少なく
とも構成要素として含む塗料を、光透過性の基材上に塗
布し形成された塗膜において、前記基材及び塗膜に光を
照射する投光手段と、前記塗膜に対して前記投光手段と
反対側に配置された受光手段を有し、前記受光手段が受
光する透過光量の減少により、前記塗膜の乾燥状態を検
出することを特徴とするものである。In order to achieve the above-mentioned object, a dry state measuring apparatus according to a first aspect of the present invention comprises a solvent having a light transmitting property and a powder dispersed in the solvent. In a coating film formed by applying a coating material containing as an element on a light-transmitting substrate, a light projecting unit for irradiating the substrate and the coating film with light, and the light projecting unit for the coating film It has a light receiving means arranged on the opposite side, and detects a dry state of the coating film by reducing the amount of transmitted light received by the light receiving means.
【0008】本願第2の発明の乾燥状態測定装置は、光
透過性を有する溶媒と、前記溶媒中に分散された粉体を
少なくとも構成要素として含む塗料を、基材上に塗布し
形成された塗膜において、前記塗膜側斜め方向より前記
塗膜面に光を照射する投光手段と、前記塗膜に対して前
記投光手段と同じ側に配置された受光手段を有し、前記
受光手段が受光する反射光量の減少により、前記塗膜の
乾燥状態を検出するものである。[0008] The dry state measuring apparatus of the second invention of the present application is formed by applying a solvent having a light transmitting property and a coating material containing at least a powder dispersed in the solvent as a constituent element on a substrate. The coating film includes a light projecting unit configured to irradiate the coating film surface with light from an oblique direction on the coating film side, and a light receiving unit disposed on the same side as the light projecting unit with respect to the coating film. The drying state of the coating film is detected based on a decrease in the amount of reflected light received by the means.
【0009】本願第3の発明の乾燥状態測定装置は、透
過性を有する溶媒と、前記溶媒中に分散された粉体を少
なくとも構成要素として含む塗料を、基材上に塗布し形
成された塗膜において、前記塗膜側斜め方向より前記塗
膜面に光を照射する投光手段と、前記塗膜に対して前記
投光手段と同じ側に配置された受光手段を有し、前記受
光手段が受光する内、直接反射光量と表面散乱による反
射光量の比の変化により、前記塗膜の乾燥状態を検出す
ることを特徴とするものである。A dry state measuring apparatus according to a third aspect of the present invention is a coating apparatus formed by applying a permeable solvent and a coating material containing at least a powder dispersed in the solvent on a substrate. The film includes: a light projecting unit configured to irradiate the coating film surface with light from an oblique direction on the coating film side; and a light receiving unit arranged on the same side as the light projecting unit with respect to the coating film. Detecting the dry state of the coating film by the change in the ratio of the amount of direct reflection and the amount of reflection due to surface scattering.
【0010】本願第4の発明の塗膜乾燥機は、本願第1
から第3の発明の乾燥状態測定装置による乾燥状態情報
により、乾燥温度または乾燥機に対する被乾燥対象の送
り速度を調節する事を特徴とするものである。[0010] The coating film dryer according to the fourth aspect of the present invention is the first type of the present invention.
According to the third aspect of the present invention, the drying temperature or the feed speed of the object to be dried with respect to the dryer is adjusted based on the drying state information obtained by the drying state measuring device of the third invention.
【0011】本願第5の発明の乾燥状態測定装置は、光
透過性を有する溶媒と、前記溶媒中に分散された粉体を
少なくとも構成要素として含む塗料を、光透過性の基材
上に塗布し形成された塗膜において、前記基材及び塗膜
に光を照射する投光手段と、前記塗膜に対して前記投光
手段と反対側にアレー型に配置された受光手段を有し、
前記アレー型受光手段により透過光を画像化し、前記塗
膜の乾燥状態の面内分布を測定できることを特徴とする
ものである。A dry state measuring apparatus according to a fifth aspect of the present invention is a method for applying a paint having at least a component having a light-transmitting solvent and a powder dispersed in the solvent on a light-transmitting substrate. In the formed coating film, a light emitting means for irradiating the base material and the coating film with light, and light receiving means arranged in an array on the opposite side of the light emitting means with respect to the coating film,
The transmitted light is imaged by the array type light receiving means, and the in-plane distribution of the dried state of the coating film can be measured.
【0012】本願第6の発明の乾燥状態測定装置は、光
透過性を有する溶媒と、前記溶媒中に分散された粉体を
少なくとも構成要素として含む塗料を、基材上に塗布し
形成された塗膜において、前記塗膜側斜め方向より前記
塗膜面に光を照射する投光手段と、前記塗膜に対して前
記投光手段と同じ側にアレー型に配置された受光手段を
有し、前記アレー型受光手段により反射光を画像化し、
前記塗膜の乾燥状態の面内分布を測定できることを特徴
とするものである。A dry state measuring apparatus according to a sixth aspect of the present invention is formed by applying a solvent having a light transmitting property and a paint containing at least a powder dispersed in the solvent as a component on a substrate. In the coating film, light-emitting means for irradiating the coating film surface with light from the oblique direction of the coating film, and light-receiving means arranged in an array on the same side as the light-emitting means with respect to the coating film Imaging the reflected light by the array type light receiving means,
The in-plane distribution of the dried state of the coating film can be measured.
【0013】本願第7の発明の乾燥状態測定装置は、透
過性を有する溶媒と、前記溶媒中に分散された粉体を少
なくとも構成要素として含む塗料を、基材上に塗布し形
成された塗膜において、前記塗膜側斜め方向より前記塗
膜面に光を照射する投光手段と、前記塗膜に対して前記
投光手段と同じ側にアレー型に配置された受光手段を有
し、前記アレー型受光手段が受光する内、直接反射光量
と表面散乱による反射光量の比の変化によりを画像化
し、前記塗膜の乾燥状態の面内分布を測定できることを
特徴とするものである。[0013] A dry state measuring apparatus according to a seventh aspect of the present invention is a coating apparatus formed by applying a solvent having permeability and a coating material containing at least a powder dispersed in the solvent as a constituent element to a substrate. In the film, a light projecting means for irradiating the coating film surface with light from the coating film side oblique direction, and a light receiving means arranged in an array type on the same side as the light projecting means with respect to the coating film, While the array type light receiving means receives the light, the change in the ratio between the amount of direct reflection and the amount of reflection due to surface scattering is imaged, and the in-plane distribution of the dried state of the coating film can be measured.
【0014】本願第8の発明の塗膜乾燥機は、本願第5
から第7の発明の乾燥状態測定装置と、塗膜面と平行に
2次元に配置されたヒータを有し、乾燥状態測定装置よ
り得られる前記塗膜面内乾燥状態分布情報により、前記
ヒータの個々の温度を調節できることを特徴とするもの
である。The coating film dryer according to the eighth aspect of the present invention is the same as the fifth aspect of the present invention.
To the seventh aspect of the present invention, and a heater disposed two-dimensionally in parallel to the coating surface, the heater according to the dry state distribution information in the coating film surface obtained from the drying state measurement device, It is characterized in that individual temperatures can be adjusted.
【0015】本願第9の発明の塗膜乾燥機は、本願第5
から第7の発明の乾燥状態測定装置と、被乾燥物の送り
方向に対し幅方向に配列された熱風吹き出しノズルを有
し、前記乾燥状態測定装置より得られる前記塗膜面内乾
燥状態分布情報により、前記熱風吹き出しノズルの開度
や吹き出し方向を調節できることを特徴とするものであ
る。The coating film dryer according to the ninth aspect of the present invention is the same as the fifth aspect of the present invention.
To a drying state measuring device according to the seventh aspect of the present invention, and a hot air blowing nozzle arranged in the width direction with respect to the feed direction of the object to be dried, and the dry state distribution information in the coating film surface obtained from the drying state measuring device. Thus, the opening degree and the blowing direction of the hot-air blowing nozzle can be adjusted.
【0016】本願第10の発明の積層型セラミック電子
部品は、本願第4,8,9の発明の塗膜乾燥機を用いて
作成されたグリーンシートを用いて作成されたことを特
徴とするものである。A multilayer ceramic electronic component according to a tenth aspect of the present invention is characterized in that it is produced using a green sheet produced by using the coating film dryer according to the fourth, eighth and ninth aspects of the present invention. It is.
【0017】本願第11の発明の通信装置は、本願第1
0の発明の積層型セラミック電子部品を用いて、送信回
路または受信回路を構成することを特徴とするものであ
る。The communication device according to the eleventh aspect of the present invention is the communication device according to the first aspect of the present invention.
A transmission circuit or a reception circuit is constituted by using the multilayer ceramic electronic component of the invention.
【0018】本願第12の発明の塗工機は、光透過性を
有する溶媒と、前記溶媒中に分散された粉体を少なくと
も構成要素として含む塗料を、基材上に塗布し形成され
た塗膜において、前記塗膜に照射光を照射する投光手段
と、前記照射光による透過光または反射光または散乱光
のうち1種または複数種の光強度を検出する光検出手段
と、検出された前記光強度の信号から前記塗膜の乾燥状
態を検出する乾燥状態検出手段と、検出された乾燥状態
により塗膜の形成速度または塗料の供給速度または乾燥
機の乾燥温度または乾燥機の風量または乾燥機のヒータ
温度または乾燥機内での送り速度のうち1種または複数
種の調整項目を調整することを特徴とするものである。A coating machine according to a twelfth aspect of the present invention is a coating machine formed by applying a light-transmitting solvent and a coating material containing at least a powder dispersed in the solvent as a component on a substrate. In the film, a light projecting unit that irradiates the coating film with irradiation light, a light detection unit that detects one or a plurality of light intensities of transmitted light, reflected light, or scattered light by the irradiation light, Drying state detecting means for detecting a drying state of the coating film from the signal of the light intensity, and a forming speed of the coating film, a supply speed of the coating material, a drying temperature of the drying machine, an air volume of the drying machine, or drying according to the detected drying state. It is characterized in that one or more kinds of adjustment items are adjusted among the heater temperature of the machine or the feed speed in the dryer.
【0019】[0019]
【発明の実施の形態】以下、本発明の実施の形態を、図
を用いて説明する。Embodiments of the present invention will be described below with reference to the drawings.
【0020】(実施の形態1)本発明の実施の形態1に
よる、乾燥状態測定装置について、図1を用いて説明す
る。フィルムA100は、透明な溶媒および透明な樹脂
の混合体からなる透明部102と、溶媒に不要な粒子1
01の混合体からなる塗料を、基材フィルム108上に
均一塗布され形成された塗膜109からなる。フィルム
A100の上方には、投光手段103が配置され、フィ
ルムA100に照射光A105を照射している。照射光
A105はフィルムA100を透過する際、粒子101
に吸収されたり、散乱光107として散逸し、一部が透
過光としてフィルムA100の下方に置かれた受光手段
104に到達する。(Embodiment 1) A dry state measuring apparatus according to Embodiment 1 of the present invention will be described with reference to FIG. The film A100 includes a transparent portion 102 made of a mixture of a transparent solvent and a transparent resin, and particles 1 unnecessary for the solvent.
01 is composed of a coating film 109 formed by uniformly applying a coating material comprising the mixture of No. 01 on a base film 108. A light projecting unit 103 is disposed above the film A100, and irradiates the film A100 with irradiation light A105. When the irradiation light A105 passes through the film A100, the particles 101
Or is scattered as scattered light 107, and a part of the light reaches the light receiving unit 104 placed below the film A100 as transmitted light.
【0021】次に、図1の乾燥状態測定装置の動きにつ
いて説明する。フィルムA100に照射された照射光1
05は、常に一定強度に制御されている。従って、透過
光106の強度は、塗膜109における光吸収特性や散
乱特性、フィルム厚により変動する。同一ロット内で考
える場合、現在の塗工機の精度を考えると塗膜109の
厚み変動は小さい。従って、透過光106の時間的変動
要因は、主に塗膜109における粒子101による光吸
収特性や、粒子101と透明部102や透明部102内
部界面,塗膜109表面での散乱特性である。塗膜10
9の断面構造を考えると、粒子101の周囲は透明部1
02に覆われて、粒子101は透明部102に含まれる
溶媒には不溶であるため、粒子101による光吸収の時
間的変動も無視できる。最終的に、透過光106の変動
は、透明部102における散乱特性の変化のみに依存す
る。Next, the operation of the dry state measuring device of FIG. 1 will be described. Irradiation light 1 applied to film A100
05 is always controlled to a constant intensity. Therefore, the intensity of the transmitted light 106 varies depending on the light absorption characteristics and scattering characteristics of the coating film 109 and the film thickness. When considering within the same lot, the thickness fluctuation of the coating film 109 is small in consideration of the accuracy of the current coating machine. Therefore, the temporal fluctuation factors of the transmitted light 106 are mainly the light absorption characteristics of the particles 109 in the coating film 109 and the scattering characteristics of the particles 101 on the interface between the transparent portion 102 and the transparent portion 102 and on the surface of the coating film 109. Coating film 10
9, the periphery of the particle 101 is transparent part 1
Since the particles 101 are covered with the particles 02 and are insoluble in the solvent contained in the transparent portion 102, the temporal fluctuation of light absorption by the particles 101 can be ignored. Finally, the fluctuation of the transmitted light 106 depends only on the change of the scattering characteristic in the transparent portion 102.
【0022】透明部102の関連する散乱を詳細に考え
ると、 (1)粒子101と透明部102に含まれるバインダ
(図示せず)との界面 (2)透明部102中に含まれる溶媒(図示せず)が蒸
発することにより発生すする空気層とバインダとの界面 (3)塗膜109の表面層の溶媒蒸発により発生する塗
膜表面の凹凸の3点が主要因である。この中で、(1)
は時間的にほぼ安定しているため、時間的に大きく変動
するのは(2),(3)であり、散乱強度は溶媒の蒸発
のみにほぼ依存することになる。透過光106強度の時
間的変化は、図2のグラフの様になる。溶媒の温度が上
昇した後は、時間と共に蒸発が進み透過光強度は低下す
る。その後、乾燥が終了に近づくと透過光強度の変化は
緩慢になり、乾燥終了後は一定となる。Considering the scattering related to the transparent portion 102 in detail, (1) the interface between the particles 101 and a binder (not shown) included in the transparent portion 102, and (2) the solvent contained in the transparent portion 102 (see FIG. (3) The interface between the air layer and the binder generated by evaporation of the binder (not shown). (3) The three main factors are the unevenness of the coating film surface caused by the evaporation of the solvent in the surface layer of the coating film 109. In this, (1)
Since is substantially stable in time, (2) and (3) greatly fluctuate in time, and the scattering intensity substantially depends only on the evaporation of the solvent. The temporal change in the intensity of the transmitted light 106 is as shown in the graph of FIG. After the temperature of the solvent increases, the evaporation proceeds with time, and the transmitted light intensity decreases. Thereafter, as the drying approaches the end, the change in the transmitted light intensity becomes slow and becomes constant after the end of the drying.
【0023】上記の原理を応用し、図2の乾燥中のフィ
ルムA100の透過光106の時間的変化を追跡し、一
定時間内の透過光強度の変化が、一定値以下になったと
ころで乾燥終了を検出する。By applying the above principle, the temporal change of the transmitted light 106 of the film A 100 during drying shown in FIG. 2 is tracked, and the drying is completed when the change of the transmitted light intensity within a certain time becomes less than a certain value. Is detected.
【0024】尚、この例では一定時間内の透過率強度変
化を評価関数としたが、透過率強度自体が一定値以下に
なれば乾燥終了とすることもできる。しかし、この場
合、フィルム厚みや塗膜種類の変化に対し、より敏感に
なるため、精度の良い検量線により校正する必要があ
る。In this example, the change in the transmittance intensity within a certain period of time is used as the evaluation function. However, when the transmittance intensity itself becomes a certain value or less, the drying can be terminated. However, in this case, it becomes more sensitive to changes in the film thickness and the type of coating film, so that it is necessary to calibrate using a highly accurate calibration curve.
【0025】(実施の形態2)本発明の実施の形態2に
よる乾燥状態測定装置について、図3を用いて説明す
る。フィルムA100は、実施の形態1で述べたものと
全く同様である。異なる点は、投光手段103を塗膜1
09に傾けて配置し、受光手段104を投光手段103
と同じ側に、投光手段103と対峙する様に傾けて配置
している点である。照射光105は投光手段103から
照射された後、塗膜109面で反射され、反射光202
として受光手段104に到達する。散乱光201は塗膜
109面で照射光105が反射される際に発生する。(Embodiment 2) A dry state measuring apparatus according to Embodiment 2 of the present invention will be described with reference to FIG. The film A100 is exactly the same as that described in the first embodiment. The difference is that the light emitting means 103 is
09 and the light receiving means 104
And is arranged so as to be inclined so as to face the light projecting means 103. The irradiation light 105 is irradiated from the light projecting means 103, is reflected by the surface of the coating film 109, and is reflected by the reflected light 202.
And reaches the light receiving means 104. The scattered light 201 is generated when the irradiation light 105 is reflected on the surface of the coating film 109.
【0026】次に、図3の乾燥状態測定装置の動きにつ
いて説明する。実施の形態1同様、投光手段103は一
定強度の照射光105を発するよう制御されている。従
って、受光手段104に到達する反射光202の強度
は、塗膜109での吸収,散乱によるロス分を差し引い
たものとなる。散乱や吸収の発生は実施の形態1と全く
同じものである。従って、反射光202強度の時間的変
化は、主に塗膜109での散乱特性に起因する。散乱光
201も実施の形態1で述べたように、溶媒の乾燥が進
むにつれ、塗膜109内の透明部102に空気層が増加
するため、散乱強度は増加する。従って、散乱によるロ
ス分が増加するため、反射光202は図4に示すよう
に、時間と共に減少する。Next, the operation of the dry state measuring device of FIG. 3 will be described. As in the first embodiment, the light projecting means 103 is controlled to emit irradiation light 105 having a constant intensity. Therefore, the intensity of the reflected light 202 reaching the light receiving unit 104 is obtained by subtracting the loss due to the absorption and scattering in the coating film 109. The generation of scattering and absorption is exactly the same as in the first embodiment. Therefore, the temporal change in the intensity of the reflected light 202 is mainly caused by the scattering characteristics of the coating film 109. As described in Embodiment 1, the scattering intensity of the scattered light 201 also increases as the drying of the solvent progresses because the air layer increases in the transparent portion 102 in the coating film 109. Therefore, since the loss due to scattering increases, the reflected light 202 decreases with time as shown in FIG.
【0027】上記の原理を応用し、実施の形態1と同
様、図4の乾燥中のフィルムA100の反射光202の
時間的変化を追跡し、一定時間内の透過光強度の変化
が、一定値以下になったところで乾燥終了を検出する。By applying the above principle, as in the first embodiment, the temporal change of the reflected light 202 of the film A100 during drying shown in FIG. 4 is tracked, and the change of the transmitted light intensity within a fixed time is a constant value. The end of drying is detected when the following occurs.
【0028】尚、実施の形態1は透過光を利用するた
め、基材フィルムが透明の場合にしか適用できないが、
実施の形態2では金属箔のような基材フィルムで適用で
きる。Since the first embodiment utilizes transmitted light, it can be applied only when the base film is transparent.
In the second embodiment, a base film such as a metal foil can be used.
【0029】(実施の形態3)本発明の実施の形態3に
よる乾燥状態測定装置について、図5を用いて説明す
る。フィルムA100は、実施の形態1,2で述べたも
のと全く同様である。また、フィルムA100及び投光
手段103、アレー型受光手段304の位置関係も実施
の形態2で述べた図3と同様である。異なる点は、投光
手段103の全面にスリット板301を設けたこと、受
光手段204が複数個(本実施の形態の場合は3個)か
らなるアレイ型素子になった点である。スリット板30
1には十字のスリットが設けてあり、照射光106は十
字のスリットを通過した部分のみ塗膜109に照射され
る。(Embodiment 3) A dry state measuring apparatus according to Embodiment 3 of the present invention will be described with reference to FIG. The film A100 is exactly the same as that described in the first and second embodiments. Further, the positional relationship among the film A100, the light projecting means 103, and the array type light receiving means 304 is the same as in FIG. 3 described in the second embodiment. The difference is that a slit plate 301 is provided on the entire surface of the light projecting means 103 and that the light receiving means 204 is an array-type element composed of a plurality (three in this embodiment). Slit plate 30
1 is provided with a cross slit, and the irradiation light 106 irradiates the coating film 109 only at a portion passing through the cross slit.
【0030】次に、図5の乾燥状態測定装置の動きにつ
いて説明する。フィルムA100に対して、投光手段1
03よりスリット板301と通して照射光105を照射
する。この場合、塗膜109の表面にはスリット板30
1の投影像302が映る。図6に投影像302の拡大図
を示す。投影像302を上から見た場合、スリット板3
01の十字スリットを通過した照射光106が直接当た
るスリット透過部305と、スリット透過部305の光
が塗膜109表面で散乱されて見える滲み部306に分
かれる。明るさでは、スリット透過部305が最も明る
く、滲み部306がボヤッと明るくなる。これを反射光
303の強度で考えると、スリット透過部305からの
反射光303bは比較的強く、滲み部306からの反射
光303a,303cは弱いことを意味する。もし、塗
膜109の表面が非常に平滑な場合、滲み部306は全
くないか、有っても非常に非常に小さくなり、反射光3
03bは非常に強く、反射光303a,303cは0に
近い値になる。Next, the operation of the dry state measuring device of FIG. 5 will be described. Light emitting means 1 for film A100
From 03, the irradiation light 105 is irradiated through the slit plate 301. In this case, the slit plate 30
One projected image 302 appears. FIG. 6 is an enlarged view of the projection image 302. When the projected image 302 is viewed from above, the slit plate 3
The slit transmitting portion 305 is directly illuminated by the irradiation light 106 passing through the cross slit No. 01, and the bleeding portion 306 is seen where the light of the slit transmitting portion 305 is scattered on the surface of the coating film 109. Regarding the brightness, the slit transmitting portion 305 is the brightest, and the bleeding portion 306 is bright. Considering this in terms of the intensity of the reflected light 303, the reflected light 303b from the slit transmitting portion 305 is relatively strong, and the reflected lights 303a and 303c from the bleeding portion 306 are weak. If the surface of the coating film 109 is very smooth, there is no bleeding portion 306, or even if there is, the bleeding portion 306 is very small.
03b is very strong, and the reflected light 303a, 303c has a value close to zero.
【0031】ここで、スリット透過部305の明るさと
滲み部306の明るさの比により、塗膜109の反射に
対する散乱特性を、正規化した形で規定できる。具体的
には指向性に優れた受光素子を用いたアレー型受光手段
304を形成し、スリット透過部305からの反射光3
03bを主にBの受光素子で検出し、滲み部306から
の反射光303a,303cを主にA,Cの受光素子で
検出する。その後、受光素子A,Cの検出強度を受光素
子Bでの検出強度で除することで、塗膜109の散乱性
を示す評価関数が得られる。Here, the scattering characteristic with respect to the reflection of the coating film 109 can be specified in a normalized form by the ratio between the brightness of the slit transmitting portion 305 and the brightness of the bleeding portion 306. Specifically, an array type light receiving means 304 using a light receiving element having excellent directivity is formed, and reflected light 3
03b is mainly detected by the B light receiving element, and the reflected lights 303a and 303c from the bleeding portion 306 are mainly detected by the A and C light receiving elements. After that, by dividing the detection intensity of the light receiving elements A and C by the detection intensity of the light receiving element B, an evaluation function indicating the scattering property of the coating film 109 is obtained.
【0032】塗膜109の散乱性に関しては、実施の形
態1,2でも述べたように、時間の経過と共に溶媒が蒸
発するため、散乱特性は強くなる。従って、(滲み部の
明るさ)/(スリット透過部の明るさ)は図7に示すよ
うな形になる。従って、明るさの比の時間的変化を追跡
し、明るさの比が、一定値以上になったところで乾燥終
了を検出する。Regarding the scattering property of the coating film 109, as described in the first and second embodiments, since the solvent evaporates with the passage of time, the scattering property becomes strong. Therefore, (brightness of bleeding portion) / (brightness of slit transmitting portion) has a shape as shown in FIG. Therefore, the temporal change of the brightness ratio is tracked, and the end of drying is detected when the brightness ratio exceeds a certain value.
【0033】尚、実施の形態1,3と同様に、一定時間
内の明るさの比の変化が、一定値以下になったところで
乾燥終了を検出することもできる。As in the first and third embodiments, the end of drying can be detected when the change in the brightness ratio within a certain period of time falls below a certain value.
【0034】(実施の形態4)本発明の実施の形態4に
よる乾燥状態測定装置について、図8を用いて説明す
る。本実施の形態の構成は、実施の形態1における受光
手段104の代わりに、面的な光情報が取得可能な2次
元アレー型受光手段401を用いた点と、投光手段によ
り指向性の少ないものを用いて、十分な広さのフィルム
面積に光を照射する点である。他の構成要素は実施の形
態1と同様である。乾燥状態の検出原理も全く同様であ
る。乾燥状態を面的に検出することにより、乾燥状態の
検出の信頼性を大きく向上できる。即ち、狭い面積で検
出した場合、被乾燥物の端まで乾燥できているかの確認
ができない場合が考えられるが、面的に検出することに
より、このような誤検出を防止できる。(Embodiment 4) A dry state measuring apparatus according to Embodiment 4 of the present invention will be described with reference to FIG. The configuration of the present embodiment is different from the first embodiment in that a two-dimensional array type light receiving unit 401 capable of acquiring planar optical information is used instead of the light receiving unit 104 in the first embodiment, and that the light projecting unit has less directivity. The point is to irradiate a sufficiently large film area with light. Other components are the same as in the first embodiment. The principle of detecting the dry state is exactly the same. By detecting the dry state two-dimensionally, the reliability of dry state detection can be greatly improved. That is, when detection is performed in a small area, it may not be possible to confirm whether or not the end of the object to be dried has been dried. However, such detection can be prevented by detecting the area.
【0035】尚、図8には透過式の例を示したが、反射
式や散乱による明るさの比を利用する方式でも、受光手
段の多素子化により、面的に乾燥状態を検出するがで
き、上記のような利点を実現できる。FIG. 8 shows an example of the transmission type. However, even in the reflection type or the method using the brightness ratio due to scattering, a dry state can be detected in a planar manner by increasing the number of elements of the light receiving means. And the above advantages can be realized.
【0036】(実施の形態5)本発明の実施の形態5に
よる乾燥状態測定装置について、図9を用いて説明す
る。投光手段103、受光手段104で構成される乾燥
状態測定措置は実施の形態1で述べたものと同様であ
る。乾燥炉501は熱風式の乾燥炉で、内部に熱風吐出
ノズル504と吸気ノズル503を有する。熱風の熱源
には、ボイラー(図示せず)から供給されるスチームが
用いられる。乾燥炉501に入ったフィルムA100
は、ローラコンベア502で送られる。(Embodiment 5) A dry state measuring apparatus according to Embodiment 5 of the present invention will be described with reference to FIG. The dry state measuring means constituted by the light projecting means 103 and the light receiving means 104 is the same as that described in the first embodiment. The drying furnace 501 is a hot-air drying furnace, and has a hot-air discharge nozzle 504 and a suction nozzle 503 therein. Steam supplied from a boiler (not shown) is used as a heat source of the hot air. Film A100 in drying oven 501
Is sent by the roller conveyor 502.
【0037】次に、図9の乾燥状態測定装置の動きにつ
いて説明する。乾燥炉501内部に送られたフィルムA
100はローラコンベア502で搬送されつつ、熱風吐
出ノズル504から吐出される熱風で加熱乾燥される。
熱風により加熱・蒸発した溶媒は、熱風と共に吸気ノズ
ル503より排出され、脱臭装置(図示せず)により処
理される。乾燥炉501から出たフィルムA100に
は、投光手段103より照射光105が照射され、その
透過光106を受光手段104で検出する。このとき、
透過光106の強度の変化により、実施の形態1で述べ
た様にフィルムA100の塗膜109の乾燥状態を測定
する。この結果により、熱風吐出ノズル504のノズル
開度やローラコンベア502の送り速度を変化させ、最
適な乾燥条件に調整する。Next, the operation of the dry state measuring device of FIG. 9 will be described. Film A sent inside drying oven 501
100 is heated and dried by hot air discharged from a hot air discharge nozzle 504 while being conveyed by a roller conveyor 502.
The solvent heated and evaporated by the hot air is discharged from the suction nozzle 503 together with the hot air, and is processed by a deodorizing device (not shown). Irradiation light 105 is emitted from the light projecting means 103 to the film A100 coming out of the drying furnace 501, and the transmitted light 106 is detected by the light receiving means 104. At this time,
Based on the change in the intensity of the transmitted light 106, the dry state of the coating film 109 of the film A100 is measured as described in Embodiment 1. Based on this result, the nozzle opening of the hot air discharge nozzle 504 and the feed speed of the roller conveyor 502 are changed to adjust the drying conditions to the optimum.
【0038】尚、本実施の形態では、透過光式の乾燥状
態測定装置の例を示したが、反射光式や散乱による明る
さの比を利用する方式でも、適用可能である。In this embodiment, an example of a transmitted light type dry state measuring apparatus has been described. However, the present invention can also be applied to a reflected light type or a method utilizing a brightness ratio due to scattering.
【0039】(実施の形態6)本発明の実施の形態6に
よる乾燥状態測定装置について、図10を用いて説明す
る。図10は、実施の形態4で述べた乾燥状態測定装置
を応用した、フィルム乾燥機である。乾燥炉501内に
は、フィルムA100の幅方向に複数個(図10では3
個)の熱風吐出ノズル504が配置され、吸気ノズル5
03も熱風吐出ノズル504と同数だけ、対向するよう
に配置されている。また、乾燥炉501にはローラコン
ベア502が有り、被乾燥物であるフィルムA100を
搬送する。(Embodiment 6) A dry state measuring apparatus according to Embodiment 6 of the present invention will be described with reference to FIG. FIG. 10 shows a film dryer to which the drying state measuring device described in Embodiment 4 is applied. In the drying oven 501, a plurality (3 in FIG.
) Hot air discharge nozzles 504 are arranged,
03 are also arranged so as to face the hot air discharge nozzles 504 by the same number. Further, the drying furnace 501 has a roller conveyor 502, which conveys the film A100 to be dried.
【0040】次に、図10の乾燥状態測定装置の動きに
ついて説明する。乾燥炉501内部に送られたフィルム
A100は、実施の形態5と同様にローラコンベア50
2で搬送されつつ、熱風吐出ノズル504から吐出され
る熱風で加熱乾燥される。その後搬出され、投光手段1
03より照射光105を照射し、その透過光106を2
次元アレー型受光手段401で受光し、面的な乾燥状態
を検出する。この2次元アレー型受光手段401は、C
CDでも良いし、撮像管でも良い。2次元アレー型受光
手段401で検出された面的な乾燥状態により、熱風吐
出ノズル504の開度を変化させ、最適な乾燥状態に調
整する。Next, the operation of the dry state measuring device shown in FIG. 10 will be described. The film A100 sent into the drying furnace 501 is supplied to the roller conveyor 50 in the same manner as in the fifth embodiment.
While being conveyed by 2, hot drying is performed by hot air discharged from the hot air discharge nozzle 504. After that, it is carried out and the light emitting means 1
03, irradiation light 105 is emitted, and the transmitted light
Light is received by the dimensional array type light receiving means 401 and a planar dry state is detected. This two-dimensional array type light receiving means 401
It may be a CD or an image pickup tube. The opening degree of the hot air discharge nozzle 504 is changed according to the planar drying state detected by the two-dimensional array type light receiving unit 401 to adjust to the optimal drying state.
【0041】即ち、塗膜109の手前側の乾燥が不十分
である場合、手前側の熱風吐出ノズルの開度を広げて風
量を増加し、乾燥能力を部分的に増加させることによ
り、全体として均一な乾燥状態が実現できる。更に、部
分的に透過光106の強度が非常に大きい場合、塗膜1
09に割れやピンホールが発生している場合があり、こ
のときは乾燥条件を弱めることで解消できることがあ
り、このような場合に塗膜109の欠陥検出器としても
利用できる。That is, when the drying of the front side of the coating film 109 is insufficient, the opening degree of the hot air discharge nozzle on the front side is widened to increase the air volume, and the drying capacity is partially increased. A uniform dry state can be realized. Further, when the intensity of the transmitted light 106 is extremely high in part,
In some cases, cracks or pinholes may occur in 09, and in this case, it may be possible to solve the problem by weakening the drying conditions. In such a case, the coating film 109 can also be used as a defect detector.
【0042】尚、本実施の形態では、透過光式の乾燥状
態測定装置の例を示したが、反射光式や散乱による明る
さの比を利用する方式でも、適用可能である。但し、反
射光式や散乱による明るさの比を利用する方式では、塗
膜欠陥を検出する事が困難になる場合がある。In this embodiment, an example of a transmitted light type dry state measuring apparatus has been described. However, the present invention can also be applied to a reflected light type or a method utilizing a brightness ratio due to scattering. However, it is sometimes difficult to detect a coating film defect in the reflected light method or the method using the brightness ratio due to scattering.
【0043】(実施の形態7)本発明の実施の形態7に
よる乾燥状態測定装置について、図11を用いて説明す
る。図11は、実施の形態4で述べた乾燥状態測定装置
を応用した、フィルム乾燥機である。乾燥炉501内に
は、フィルムA100と平行にセラミック製の遠赤ヒー
タ601が2次元的に配置されている。また、乾燥炉5
01にはローラコンベア502が有り、被乾燥物である
フィルムA100を搬送する。(Embodiment 7) A dry state measuring apparatus according to Embodiment 7 of the present invention will be described with reference to FIG. FIG. 11 shows a film dryer to which the drying state measuring device described in Embodiment 4 is applied. In the drying oven 501, a far infrared heater 601 made of ceramic is two-dimensionally arranged in parallel with the film A100. In addition, drying oven 5
01 has a roller conveyor 502, which conveys a film A100 to be dried.
【0044】次に、図11の乾燥状態測定装置の動きに
ついて説明する。乾燥炉501内部に送られたフィルム
A100は、実施の形態5と同様にローラコンベア50
2で搬送されつつ、遠赤ヒータ601からの赤外線で加
熱乾燥される。また、乾燥炉501には送気ファン(図
示せず)からの吸気が送られ、蒸発した溶媒蒸気は排気
される。その後、フィルムA100は搬出され、投光手
段103より照射光105を照射し、その透過光106
を2次元アレー型受光手段401で受光し、面的な乾燥
状態を検出する。この2次元アレー型受光手段401
は、CCDでも良いし、撮像管でも良い。Next, the operation of the dry state measuring device of FIG. 11 will be described. The film A100 sent into the drying furnace 501 is supplied to the roller conveyor 50 in the same manner as in the fifth embodiment.
While being conveyed by 2, the ink is heated and dried by infrared rays from the far-infrared heater 601. In addition, intake air from an air supply fan (not shown) is sent to the drying furnace 501, and the evaporated solvent vapor is exhausted. Thereafter, the film A100 is carried out, irradiated with irradiation light 105 from the light projecting means 103, and transmitted light 106 thereof.
Is received by the two-dimensional array type light receiving means 401 to detect a planar dry state. This two-dimensional array type light receiving means 401
May be a CCD or an image pickup tube.
【0045】2次元アレー型受光手段401で検出され
た面的な乾燥状態により、遠赤ヒータへの入力電力を変
化させ、最適な乾燥状態に調整する。即ち、塗膜109
の手前側の乾燥が不十分である場合、手前側の列の遠赤
ヒータ601の列に供給する電流を増加させ、ヒータ温
度を上昇させて、乾燥能力を部分的に増加させることに
より、全体として均一な乾燥状態が実現できる。更に、
部分的に透過光106の強度が非常に大きい場合、塗膜
109に割れやピンホールが発生している場合があり、
このときは乾燥条件を弱めることで解消できることがあ
り、このような場合に塗膜109の欠陥検出器としても
利用できる。The input power to the far-infrared heater is changed according to the planar drying state detected by the two-dimensional array type light receiving means 401, and the drying state is adjusted to the optimum. That is, the coating film 109
If the drying on the front side is insufficient, the current supplied to the row of the far-infrared heater 601 on the front side row is increased, the heater temperature is raised, and the drying capacity is partially increased. And a uniform dry state can be realized. Furthermore,
When the intensity of the transmitted light 106 is extremely large in part, cracks and pinholes may be generated in the coating film 109,
In this case, the problem can be solved by weakening the drying conditions, and in such a case, the film 109 can be used as a defect detector.
【0046】尚、本実施の形態では、透過光式の乾燥状
態測定装置の例を示したが、反射光式や散乱による明る
さの比を利用する方式でも、適用可能である。但し、反
射光式や散乱による明るさの比を利用する方式では、塗
膜欠陥を検出する事が困難になる場合がある。In the present embodiment, an example of the transmitted light type dry state measuring apparatus has been described. However, the present invention can also be applied to a reflected light type or a method using a brightness ratio by scattering. However, it is sometimes difficult to detect a coating film defect in the reflected light method or the method using the brightness ratio due to scattering.
【0047】(実施の形態8)本発明の実施の形態8お
ける積層セラミック電子部品について、図12を用いて
説明する。図12は積層セラミック電子部品の断面図を
示す。この積層セラミック電子部品700は、実施の形
態7で述べた塗膜乾燥機により、フィルム状のセラミッ
クグリーンシートを乾燥し作成した後、シート上に印刷
電極を印刷し、積層・焼結することで製造される。(Eighth Embodiment) A multilayer ceramic electronic component according to an eighth embodiment of the present invention will be described with reference to FIG. FIG. 12 shows a sectional view of the multilayer ceramic electronic component. The multilayer ceramic electronic component 700 is prepared by drying and forming a film-like ceramic green sheet using the coating film dryer described in Embodiment 7, printing a printing electrode on the sheet, and stacking and sintering. Manufactured.
【0048】積層型セラミック電子部品700の外形
は、チップ部品である。チップの上面には表層パット7
04が形成されており、チップの底面には表面実装用の
リード電極702が形成されている。積層型セラミック
電子部品700全体の大部分はセラミック部701で、
セラミック部701の内部において、層状または各層を
繋ぐスルーホール状に内部電極703が配置されてい
る。積層型セラミック電子部品700内部には内部電極
703の様々な配置により、各種素子が形成されてい
る。The outer shape of the multilayer ceramic electronic component 700 is a chip component. Surface pad 7 on the upper surface of the chip
04 is formed, and a lead electrode 702 for surface mounting is formed on the bottom surface of the chip. Most of the entire multilayer ceramic electronic component 700 is a ceramic portion 701,
Inside the ceramic portion 701, the internal electrodes 703 are arranged in a layer shape or a through hole shape connecting each layer. Various elements are formed inside the multilayer ceramic electronic component 700 by various arrangements of the internal electrodes 703.
【0049】例として、内蔵コンデンサ部705も形成
され、他の素子と共にフィルターなどを形成するのに使
用される。フィルター特性はカットオフ周波数で決ま
り、カットオフ周波数はコンデンサの静電容量・抵抗値
・コイルのインダクタンスで決まるため、各素子の特性
値には高い精度が要求される。各素子の特性は、素子を
構成している電極の形状・面積と電極間の距離で決ま
る。積層型セラミックでは高精度に厚み制御されたグリ
ーンシートを積み重ねることにより、電極間距離を制御
するため、積層時のシートとシートの界面状態は非常に
重要である。As an example, a built-in capacitor section 705 is also formed and used to form a filter or the like with other elements. Since the filter characteristics are determined by the cut-off frequency, and the cut-off frequency is determined by the capacitance of the capacitor, the resistance value, and the inductance of the coil, high accuracy is required for the characteristic value of each element. The characteristics of each element are determined by the shape and area of the electrodes constituting the element and the distance between the electrodes. In the case of a laminated ceramic, the inter-electrode distance is controlled by stacking green sheets of which the thickness is controlled with high precision. Therefore, the state of the interface between the sheets at the time of lamination is very important.
【0050】界面状態を決定する要因はいくつか考えら
れるが、乾燥による要因は中でも非常に重要である。例
えば、乾燥速度が早すぎるとグリーンシートの表面が粗
くなるため、積層時のシートとシートの密着性が低下
し、内蔵コンデンサ部705の容量変動の原因になる。
また、乾燥状態に斑があると乾燥収縮に偏りができるた
め、焼成時に歪みが発生し素子特性のバラツキが発生す
る。このため乾燥状態を測定し、グリーンシート全体に
渡って均一に乾燥することにより、電極間距離を高精度
に制御でき、焼成時の歪みも解消できるため、積層セラ
ミック電子部品700のフィルタ特性を高精度に安定化
できる。尚、図12において、セラミック部701には
着色されているが、これは図面を判りやすくするためで
あり、セラミック部701も断面を表している。There are several factors that determine the state of the interface, and the factors due to drying are particularly important. For example, if the drying speed is too fast, the surface of the green sheet becomes rough, so that the adhesiveness between the sheets at the time of lamination is reduced, which causes a variation in the capacity of the built-in capacitor unit 705.
In addition, if there is unevenness in the dry state, drying shrinkage can be biased, so that distortion occurs at the time of firing and variations in element characteristics occur. For this reason, by measuring the drying state and drying uniformly over the entire green sheet, the distance between the electrodes can be controlled with high accuracy, and distortion during firing can be eliminated, so that the filter characteristics of the multilayer ceramic electronic component 700 can be improved. Accuracy can be stabilized. In FIG. 12, the ceramic portion 701 is colored to make the drawing easier to understand, and the ceramic portion 701 also shows a cross section.
【0051】次に、この積層セラミック電子部品700
を用いて送信回路または受信回路を構成する携帯電話や
携帯端末などの通信装置について図13を用いて説明す
る。図13は、携帯電話や携帯端末などの通信装置の構
成を示すブロック図である。図11に示されているよう
に、この通信装置は、アンテナ802と、送話マイク8
03と、受話スピーカ804と、ユーザ入力手段805
と、音声処理回路808と、信号処理回路809と、送
信回路811と、受信回路812とで構成されている。Next, the multilayer ceramic electronic component 700
A communication device, such as a mobile phone or a mobile terminal, which forms a transmission circuit or a reception circuit by using FIG. 13 will be described with reference to FIG. FIG. 13 is a block diagram illustrating a configuration of a communication device such as a mobile phone or a mobile terminal. As shown in FIG. 11, the communication device includes an antenna 802 and a transmission microphone 8.
03, a receiving speaker 804, and a user input means 805
, An audio processing circuit 808, a signal processing circuit 809, a transmission circuit 811, and a reception circuit 812.
【0052】次に、この通信装置の動作について説明す
る。送話マイク803より入力されたアナログ音声信号
は、音声処理回路808にてデジタル音声信号に変換さ
れた後、信号処理回路809にて信号処理され、送信回
路811にて周波数変換及び変調された後、所定の送信
出力にてアンテナ802より送信される。Next, the operation of the communication device will be described. The analog audio signal input from the transmission microphone 803 is converted into a digital audio signal by the audio processing circuit 808, processed by the signal processing circuit 809, frequency-converted and modulated by the transmission circuit 811, and Are transmitted from the antenna 802 at a predetermined transmission output.
【0053】一方、アンテナ802によって受信された
信号は、受信回路812にて周波数変換及び復調が行わ
れ、信号処理回路809にてデジタル音声信号を取り出
し、音声処理回路808にてアナログ音声信号に変換さ
れ受話スピーカ804から出力される。制御回路810
は通信装置全体を制御する。ユーザ入力手段805は、
送信先のダイヤル等をユーザが入力するための手段であ
る。On the other hand, the signal received by the antenna 802 is subjected to frequency conversion and demodulation in a receiving circuit 812, a digital audio signal is extracted in a signal processing circuit 809, and converted into an analog audio signal in an audio processing circuit 808. Then, it is output from the receiving speaker 804. Control circuit 810
Controls the entire communication device. The user input means 805
This is a means for the user to input a destination dial or the like.
【0054】ここで、上記の積層セラミック電子部品7
00を送信回路811または受信回路812に使用する
と、送信回路811または受信回路812は、非常に高
性能なフィルター特性を有するため、周波数変換する際
に使用周波数を狭ピッチに設定できる。使用周波数を狭
ピッチに設定できるために、電波の使用効率を向上させ
ることが可能である。Here, the above multilayer ceramic electronic component 7
When 00 is used for the transmission circuit 811 or the reception circuit 812, the transmission circuit 811 or the reception circuit 812 has a very high-performance filter characteristic, so that the frequency used can be set to a narrow pitch when performing frequency conversion. Since the use frequency can be set to a narrow pitch, the use efficiency of radio waves can be improved.
【0055】(実施の形態9)本発明の実施の形態9に
おける塗工機について、図14を用いて説明する。図1
4は塗膜の乾燥状態によるフィードバック制御機能を有
する塗工機である。図14は透明な基材フィルム108
上に粉体・樹脂・溶媒の混合組成からなる塗膜を形成す
るダイコート型塗工機である。ロール状の透明な基材フ
ィルム108は巻き出しロール900に取り付けられ
る。基材フィルム108はフリーロールを介してバック
ロールへ導かれ、第一乾燥室902、第2乾燥室903
を経て、乾燥状態測定装置909を介して、巻き取りロ
ール904で巻き取られる。バックロール901の近傍
にはダイノズル905が配置され、塗料タンク910中
の塗料が送液ポンプ911,送液配管912を介して供
給される。また、第1乾燥室902及び第2乾燥室90
3内部には、上側フローノズル907及び下側フローノ
ズル908が取り付けられている。Ninth Embodiment A coating machine according to a ninth embodiment of the present invention will be described with reference to FIG. Figure 1
Reference numeral 4 denotes a coating machine having a feedback control function based on the dried state of the coating film. FIG. 14 shows a transparent base film 108.
This is a die coat type coating machine that forms a coating film composed of a mixed composition of powder, resin, and solvent. The roll-shaped transparent base film 108 is attached to an unwind roll 900. The base film 108 is guided to a back roll via a free roll, and is provided with a first drying chamber 902 and a second drying chamber 903.
, And is taken up by a take-up roll 904 via a dry state measuring device 909. A die nozzle 905 is arranged near the back roll 901, and the paint in the paint tank 910 is supplied via a liquid feed pump 911 and a liquid feed pipe 912. Further, the first drying chamber 902 and the second drying chamber 90
3, an upper flow nozzle 907 and a lower flow nozzle 908 are attached.
【0056】次に、塗工機の動きについて説明する。塗
料タンク910内には、有機溶剤・樹脂バインダ・セラ
ミック粉体からなる均一な塗料が充填されている。タン
ク内の塗料は、送液ポンプ911により一定流量で、送
液配管912を通してダイノズル905へ供給される。
ここで用いられる送液ポンプには、流量を精密に制御で
きるモーノポンプや精密ギアポンプが使用されることが
多い。ダイノズル905に供給された塗料は、ダイノズ
ル905先端より幅方向に均一に吐出される。Next, the operation of the coating machine will be described. The paint tank 910 is filled with a uniform paint composed of an organic solvent, a resin binder, and ceramic powder. The paint in the tank is supplied to the die nozzle 905 through the liquid supply pipe 912 at a constant flow rate by the liquid supply pump 911.
As the liquid sending pump used here, a mono pump or a precision gear pump capable of precisely controlling the flow rate is often used. The paint supplied to the die nozzle 905 is uniformly discharged in the width direction from the tip of the die nozzle 905.
【0057】一方、巻き出しロール900に巻かれた基
材フィルム108は、バックロール901により非常に
高精度に搬送される。基材フィルム108がバックロー
ル901上にある時、ダイノズル905から吐出された
塗料が、基材フィルム108上に均一に塗布され、WE
Tな塗膜が形成される。形成されたWETな塗膜は第1
乾燥室902内へと搬送され、上下のフローノズル90
7,908より熱風が吹き付けられ、予備乾燥が行われ
る。更に、第2乾燥室903内で熱風が吹き付けられ、
本乾燥により塗膜の乾燥工程が終了する。On the other hand, the base film 108 wound on the unwinding roll 900 is transported by the back roll 901 with very high precision. When the base film 108 is on the back roll 901, the paint discharged from the die nozzle 905 is uniformly applied on the base film 108, and the WE
A T coating film is formed. The formed wet coating is the first
It is transported into the drying chamber 902 and the upper and lower flow nozzles 90
Hot air is blown from 7,908 to perform preliminary drying. Further, hot air is blown in the second drying chamber 903,
The drying step of the coating film is completed by the main drying.
【0058】乾燥工程が終了したフィルムは、乾燥状態
測定装置909により乾燥状態の測定が行われる。ここ
では、実施の形態1〜4で述べな光学式で乾燥状態を検
出する。もし、乾燥が不十分である場合には、第1・2
乾燥室の温度を上昇させたり、熱風の風量増加し乾燥能
力をUPするよう、乾燥状態測定装置909よりフィー
ドバックがかかる。既に乾燥能力の上限近くで、乾燥機
のみの制御では乾燥が十分行えない場合や、塗膜に割れ
が入る場合には、フィルムの搬送速度を低下させ、更に
塗料の吐出量を絞って、乾燥状態を改善するフィードバ
ックが、乾燥状態測定装置909より塗工機全体にかか
る。ここで発生するかも知れない塗膜の割れは、乾燥状
態測定装置909により検出される。The dried state of the film after the drying step is measured by the dry state measuring device 909. Here, the dry state is detected by the optical method described in the first to fourth embodiments. If drying is insufficient, the first and second
Feedback is applied from the drying state measuring device 909 so as to increase the temperature of the drying chamber or increase the amount of hot air to increase the drying capacity. If the drying capacity is already near the upper limit of the drying capacity and drying cannot be performed satisfactorily by controlling only the dryer, or if the coating film is cracked, reduce the film transport speed and further reduce the amount of paint to be dried. Feedback to improve the condition is applied to the entire coating machine from the dry condition measuring device 909. Cracks in the coating film that may occur here are detected by the dry state measuring device 909.
【0059】このように、乾燥状態測定装置909より
塗工機各部にフィードバックをかけ、塗膜成形制御を行
うことにより、乾燥状態を均一化した高精度なグリーン
シート成形が実現できる。As described above, by applying feedback to the respective parts of the coating machine from the dry state measuring device 909 and controlling the coating film formation, it is possible to realize high-precision green sheet molding with a uniform dry state.
【0060】[0060]
【発明の効果】以上のように、本発明によれば、光透過
性を有する溶媒と、前記溶媒中に分散された粉体を少な
くとも構成要素として含む塗料を、基材上に塗布し形成
された塗膜の乾燥状態を高精度に測定することができ
る。As described above, according to the present invention, a light-transmitting solvent and a coating material containing at least a powder dispersed in the solvent are formed on a substrate by coating. The dried state of the applied coating film can be measured with high accuracy.
【0061】また、本発明による乾燥状態測定装置を塗
膜乾燥機に用いることにより、乾燥状態をフィードバッ
クしつつ乾燥を進めるため、塗膜の均一乾燥が実現でき
る。Further, by using the drying state measuring device according to the present invention in a coating film dryer, the drying is advanced while feeding back the drying state, so that the coating film can be uniformly dried.
【0062】更に、本発明による塗膜乾燥機を用いてセ
ラミック用グリーンシートを形成し、このグリーンシー
トで積層セラミック電子部品を形成することにより、内
蔵素子の特性を著しく安定化できる。従って、この素子
でフィルターを構成し、携帯電話や携帯端末の送受信回
路に用いることにより、小型軽量にも関わらず、急峻な
特性フィルターを形成できるため、電波の設定周波数を
狭ピッチに設定でき、周波数帯の利用効率を向上でき
る。Further, by forming a ceramic green sheet using the coating film dryer according to the present invention and forming a multilayer ceramic electronic component using this green sheet, the characteristics of the built-in element can be remarkably stabilized. Therefore, by forming a filter with this element and using it for a transmission / reception circuit of a mobile phone or a mobile terminal, a steep characteristic filter can be formed despite its small size and light weight, so that the set frequency of radio waves can be set to a narrow pitch, The use efficiency of the frequency band can be improved.
【図1】本発明の実施の形態1における乾燥状態測定装
置の構成図FIG. 1 is a configuration diagram of a dry state measuring device according to a first embodiment of the present invention.
【図2】本発明の実施の形態1の乾燥状態測定装置にお
ける透過光強度変化を示す特性図FIG. 2 is a characteristic diagram showing a transmitted light intensity change in the dry state measuring device according to the first embodiment of the present invention.
【図3】本発明の実施の形態2における乾燥状態測定装
置の構成図FIG. 3 is a configuration diagram of a dry state measuring device according to a second embodiment of the present invention.
【図4】本発明の実施の形態2の乾燥状態測定装置にお
ける透過光強度変化を示す特性図FIG. 4 is a characteristic diagram showing a change in transmitted light intensity in the dry state measuring apparatus according to the second embodiment of the present invention.
【図5】本発明の実施の形態3における乾燥状態測定装
置の構成図FIG. 5 is a configuration diagram of a dry state measuring device according to a third embodiment of the present invention.
【図6】本発明の実施の形態3の乾燥状態測定装置にお
ける投影像拡大図FIG. 6 is an enlarged view of a projected image in the dry state measuring device according to the third embodiment of the present invention.
【図7】本発明の実施の形態3の乾燥状態測定装置にお
ける明るさの比を示す特性図FIG. 7 is a characteristic diagram showing a brightness ratio in the dry state measuring device according to the third embodiment of the present invention.
【図8】本発明の実施の形態4における乾燥状態測定装
置の構成図FIG. 8 is a configuration diagram of a dry state measuring device according to a fourth embodiment of the present invention.
【図9】本発明の実施の形態5における塗膜乾燥機の構
成図FIG. 9 is a configuration diagram of a coating film dryer according to a fifth embodiment of the present invention.
【図10】本発明の実施の形態6における塗膜乾燥機の
構成図FIG. 10 is a configuration diagram of a coating film dryer according to a sixth embodiment of the present invention.
【図11】本発明の実施の形態7における塗膜乾燥機の
構成図FIG. 11 is a configuration diagram of a coating film dryer according to a seventh embodiment of the present invention.
【図12】本発明の実施の形態8における積層セラミッ
ク部品断面図FIG. 12 is a sectional view of a multilayer ceramic component according to an eighth embodiment of the present invention.
【図13】本発明の実施の形態8における通信装置の構
成ブロック図FIG. 13 is a configuration block diagram of a communication device according to an eighth embodiment of the present invention.
【図14】本発明の実施の形態9における塗工機の構成
図FIG. 14 is a configuration diagram of a coating machine according to a ninth embodiment of the present invention.
100 フィルムA 101 粒子 102 透明部、樹脂+溶媒 103 投光手段 104 受光手段 105 照射光 106 透過光 107,201 散乱光 108 基材フィルム 109 塗膜 202,303 反射光 301 スリット板 302 投影像 304 アレー型受光手段 305 スリット透過部 306 滲み部 401 2次元アレー型受光手段 501 乾燥炉 502 ローラコンベア 503 吸気ノズル 504 熱風吐出ノズル 700 積層セラミック部品 701 セラミック部 702 リード電極 703 内部電極 704 表層パット 705 内蔵コンデンサ部 802 アンテナ 803 送話マイク 804 受話スピーカ 805 ユーザ入力手段 808 音声処理回路 809 信号処理回路 810 制御回路 811 送信回路 812 受信回路 REFERENCE SIGNS LIST 100 Film A 101 Particles 102 Transparent part, resin + solvent 103 Light emitting means 104 Light receiving means 105 Irradiation light 106 Transmitted light 107, 201 Scattered light 108 Base film 109 Coating film 202, 303 Reflected light 301 Slit plate 302 Projected image 304 Array Type light receiving means 305 slit transmitting part 306 bleeding part 401 two-dimensional array type light receiving means 501 drying oven 502 roller conveyor 503 intake nozzle 504 hot air discharge nozzle 700 laminated ceramic parts 701 ceramic part 702 lead electrode 703 internal electrode 704 surface layer pad 705 built-in capacitor part 802 antenna 803 transmitting microphone 804 receiving speaker 805 user input means 808 audio processing circuit 809 signal processing circuit 810 control circuit 811 transmitting circuit 812 receiving circuit
───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) B05D 5/06 B05D 5/06 C 7/00 7/00 A 7/24 301 7/24 301H F26B 21/00 F26B 21/00 A 23/04 23/04 B 25/00 25/00 A G01N 21/49 G01N 21/49 Z A 21/59 21/59 Z Fターム(参考) 2G059 AA05 BB06 BB09 BB10 BB15 DD16 EE01 EE02 FF04 GG00 KK01 KK04 MM09 3L113 AA02 AB02 AB06 AC01 AC10 AC31 AC48 AC49 AC50 BA26 BA32 CA20 CB01 CB06 CB21 CB23 CB25 DA11 DA24 DA25 4D075 AC56 AC72 AC80 AC84 AC94 AC95 AC96 BB24Z BB33Z BB37Z BB91Z BB93Z BB95Z CA47 DA04 DB31 DB63 DC21 DC27 EA05 EA10 EA12 EA43 EC30 4F042 AA22 BA04 BA11 BA12 BA13 BA19 BA22 CA09 CB02 DB01 DB10 DB17 DB19 DB25 DB36 DB37 DC01 DF23 ED03 ED05 ED08 ──────────────────────────────────────────────────続 き Continued on the front page (51) Int.Cl. 7 Identification symbol FI Theme coat ゛ (Reference) B05D 5/06 B05D 5/06 C 7/00 7/00 A 7/24 301 7/24 301H F26B 21 / 00 F26B 21/00 A 23/04 23/04 B 25/00 25/00 A G01N 21/49 G01N 21/49 Z A 21/59 21/59 Z F term (reference) 2G059 AA05 BB06 BB09 BB10 BB15 DD16 EE01 EE02 FF04 GG00 KK01 KK04 MM09 3L113 AA02 AB02 AB06 AC01 AC10 AC31 AC48 AC49 AC50 BA26 BA32 CA20 CB01 CB06 CB21 CB23 CB25 DA11 DA24 DA25 4D075 AC56 AC72 AC80 AC84 AC94 AC95 AC96 BB24Z BB33ZBB37 BB33Z BB37 BB33ZBB BB33Z31 EA43 EC30 4F042 AA22 BA04 BA11 BA12 BA13 BA19 BA22 CA09 CB02 DB01 DB10 DB17 DB19 DB25 DB36 DB37 DC01 DF23 ED03 ED05 ED08
Claims (12)
分散された粉体を少なくとも構成要素として含む塗料
を、光透過性の基材上に塗布し形成された塗膜におい
て、前記基材及び塗膜に光を照射する投光手段と、前記
塗膜に対して前記投光手段と反対側に配置された受光手
段を有し、前記受光手段が受光する透過光量の減少によ
り、前記塗膜の乾燥状態を検出することを特徴とする乾
燥状態測定装置。1. A coating film formed by applying a light-transmitting solvent and a paint containing at least a powder dispersed in the solvent as a constituent element on a light-transmitting substrate. Light-emitting means for irradiating the material and the coating with light, and light-receiving means arranged on the opposite side to the light-emitting means with respect to the coating, and by reducing the amount of transmitted light received by the light-receiving means, A dry state measuring device for detecting a dry state of a coating film.
分散された粉体を少なくとも構成要素として含む塗料
を、基材上に塗布し形成された塗膜において、前記塗膜
側斜め方向より前記塗膜面に光を照射する投光手段と、
前記塗膜に対して前記投光手段と同じ側に配置された受
光手段を有し、前記受光手段が受光する反射光量の減少
により、前記塗膜の乾燥状態を検出することを特徴とす
る乾燥状態測定装置。2. A coating film formed by applying a solvent having a light transmitting property and a coating material containing at least a powder dispersed in the solvent as a component on a substrate, and forming a coating film on the coating film side obliquely. Light emitting means for irradiating the coating film surface with light,
A light-receiving unit disposed on the same side as the light-projecting unit with respect to the coating film, wherein a drying state of the coating film is detected based on a decrease in the amount of reflected light received by the light-receiving unit. Condition measuring device.
散された粉体を少なくとも構成要素として含む塗料を、
基材上に塗布し形成された塗膜において、前記塗膜側斜
め方向より前記塗膜面に光を照射する投光手段と、前記
塗膜に対して前記投光手段と同じ側に配置された受光手
段を有し、前記受光手段が受光する内、直接反射光量と
表面散乱による反射光量の比の変化により、前記塗膜の
乾燥状態を検出することを特徴とする乾燥状態測定装
置。3. A paint having at least a permeable solvent and a powder dispersed in the solvent as components.
In a coating film formed by applying on a substrate, a light projecting unit that irradiates the coating film surface with light from an oblique direction on the coating film side, and is disposed on the same side as the light projecting unit with respect to the coating film. A dry state measuring device for detecting the dry state of the coating film based on a change in a ratio of a directly reflected light amount and a reflected light amount due to surface scattering while the light receiving unit receives light.
状態測定装置による乾燥状態情報により、乾燥温度また
は乾燥機に対する被乾燥対象の送り速度を調節する事を
特徴とする塗膜乾燥機。4. A coating film dryer wherein a drying temperature or a feed speed of an object to be dried with respect to the dryer is adjusted based on the drying state information obtained by the drying state measuring device according to claim 1. .
分散された粉体を少なくとも構成要素として含む塗料
を、光透過性の基材上に塗布し形成された塗膜におい
て、前記基材及び塗膜に光を照射する投光手段と、前記
塗膜に対して前記投光手段と反対側にアレー型に配置さ
れた受光手段を有し、前記アレー型受光手段により透過
光を画像化し、前記塗膜の乾燥状態の面内分布を測定で
きることを特徴とする乾燥状態測定装置。5. A coating film formed by applying a solvent having a light transmitting property and a paint containing at least a powder dispersed in the solvent as a constituent element on a light transmitting substrate, wherein A light projecting means for irradiating light to the material and the coating film; and a light receiving means arranged in an array on the opposite side of the light emitting means with respect to the coating film. Wherein the in-plane distribution of the dried state of the coating film can be measured.
分散された粉体を少なくとも構成要素として含む塗料
を、基材上に塗布し形成された塗膜において、前記塗膜
側斜め方向より前記塗膜面に光を照射する投光手段と、
前記塗膜に対して前記投光手段と同じ側にアレー型に配
置された受光手段を有し、前記アレー型受光手段により
反射光を画像化し、前記塗膜の乾燥状態の面内分布を測
定できることを特徴とする乾燥状態測定装置。6. A coating film formed by applying a solvent having a light transmitting property and a coating material containing at least a powder dispersed in the solvent as a constituent element on a base material, wherein the coating film side oblique direction Light emitting means for irradiating the coating film surface with light,
A light-receiving means arranged in an array on the same side as the light-projecting means with respect to the coating film, imaging reflected light by the array-type light receiving means, and measuring an in-plane distribution of the coating film in a dry state; A dry state measuring device characterized in that it can be used.
散された粉体を少なくとも構成要素として含む塗料を、
基材上に塗布し形成された塗膜において、前記塗膜側斜
め方向より前記塗膜面に光を照射する投光手段と、前記
塗膜に対して前記投光手段と同じ側にアレー型に配置さ
れた受光手段を有し、前記アレー型受光手段が受光する
内、直接反射光量と表面散乱による反射光量の比の変化
を画像化し、前記塗膜の乾燥状態の面内分布を測定でき
ることを特徴とする乾燥状態測定装置。7. A coating material comprising a solvent having permeability and a powder dispersed in the solvent as at least a constituent element.
In a coating film formed by applying on a base material, a light projecting unit that irradiates the coating film surface with light from an oblique direction on the coating film side, and an array type on the same side as the light projecting unit with respect to the coating film. The array type light receiving means receives light, and the change in the ratio of the amount of direct reflected light and the amount of reflected light due to surface scattering can be imaged, and the in-plane distribution of the dried state of the coating film can be measured. A dry state measuring device characterized by the above-mentioned.
状態測定装置と、塗膜面と平行に2次元に配置されたヒ
ータを有し、前記乾燥状態測定装置より得られる塗膜面
内乾燥状態分布情報により、前記ヒータの個々の温度を
調節できることを特徴とする塗膜乾燥機。8. A dry state measuring device according to claim 5, further comprising a heater arranged two-dimensionally in parallel with the coated surface, and a coated surface obtained from the dry state measured device. A coating film dryer wherein the individual temperatures of the heaters can be adjusted according to the inside drying state distribution information.
状態測定装置と、被乾燥物の送り方向に対し幅方向に配
列された熱風吹き出しノズルを有し、前記乾燥状態測定
装置より得られる前記塗膜面内乾燥状態分布情報によ
り、前記熱風吹き出しノズルの開度や吹き出し方向を調
節できることを特徴とする塗膜乾燥機。9. A drying state measuring device according to claim 5, further comprising a hot air blowing nozzle arranged in a width direction with respect to a feeding direction of the object to be dried, wherein the drying state measuring device is obtained from the drying state measuring device. A coating film dryer characterized in that the degree of opening and the blowing direction of the hot-air blowing nozzle can be adjusted based on the information on the in-plane drying state distribution of the coating film.
塗膜乾燥機を用いて作成されたグリーンシートを用いて
作成されたことを特徴とする積層型セラミック電子部
品。10. A multilayer ceramic electronic component produced using a green sheet produced using the coating film dryer according to any one of claims 4, 8, and 9.
子部品を用いて、送信回路または受信回路を構成するこ
とを特徴とする通信装置。11. A communication device comprising a transmission circuit or a reception circuit using the multilayer ceramic electronic component according to claim 10.
に分散された粉体を少なくとも構成要素として含む塗料
を、基材上に塗布し形成された塗膜において、前記塗膜
に照射光を照射する投光手段と、前記照射光による透過
光または反射光または散乱光のうち1種または複数種の
光強度を検出する光検出手段と、検出された前記光強度
の信号から前記塗膜の乾燥状態を検出する乾燥状態検出
手段と、検出された乾燥状態により塗膜の形成速度また
は塗料の供給速度または乾燥機の乾燥温度または乾燥機
の風量または乾燥機のヒータ温度または乾燥機内での送
り速度のうち1種または複数種の調整項目を調整するこ
とを特徴とする塗工機。12. A coating film formed by applying a solvent having a light transmitting property and a coating material containing at least a powder dispersed in the solvent as a constituent element to a coating film formed on a base material. Light emitting means for irradiating light, light detecting means for detecting one or more kinds of light intensity of transmitted light, reflected light or scattered light by the irradiation light, and the coating film from a signal of the detected light intensity A drying state detecting means for detecting a drying state of the film, a coating film forming speed or a paint supplying speed, a drying temperature of a drying machine, an air flow rate of a drying machine, a heater temperature of a drying machine, or a temperature in a drying machine depending on the detected drying state. A coating machine which adjusts one or more kinds of adjustment items among feed speeds.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001073726A JP2002273308A (en) | 2001-03-15 | 2001-03-15 | Dry state measuring device and coating film dryer equipped with the device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001073726A JP2002273308A (en) | 2001-03-15 | 2001-03-15 | Dry state measuring device and coating film dryer equipped with the device |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2002273308A true JP2002273308A (en) | 2002-09-24 |
Family
ID=18931106
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2001073726A Pending JP2002273308A (en) | 2001-03-15 | 2001-03-15 | Dry state measuring device and coating film dryer equipped with the device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2002273308A (en) |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006064663A1 (en) * | 2004-12-13 | 2006-06-22 | Konica Minolta Photo Imaging, Inc. | Method of producing coating substance |
JP2010285498A (en) * | 2009-06-10 | 2010-12-24 | Nitto Denko Corp | Adhesive tape manufacturing system |
JP2013253729A (en) * | 2012-06-06 | 2013-12-19 | Nitto Denko Corp | Heating device, method of drying coated film and method of manufacturing coated film |
JP2015004686A (en) * | 2014-09-08 | 2015-01-08 | 関西ペイント株式会社 | Film for optical characteristic measurement and material for optical characteristic measurement |
JP2015184141A (en) * | 2014-03-24 | 2015-10-22 | コニカミノルタ株式会社 | Processing device and particle fixing method |
EP2310783B1 (en) * | 2008-08-06 | 2016-03-30 | Airbus Operations GmbH | Method for the contact-less detection of the degree of dryness of a coat of varnish on the exterior skin of an aircraft |
JP2017073338A (en) * | 2015-10-09 | 2017-04-13 | 東京エレクトロン株式会社 | Inspection device, reduced-pressure drying device, and method for controlling reduced-pressure drying device |
JP2018161616A (en) * | 2017-03-24 | 2018-10-18 | 東芝テック株式会社 | Droplet dispensing device |
CN110418956A (en) * | 2018-01-08 | 2019-11-05 | 株式会社Lg化学 | Monitor the device and method of the drying regime of electrode base board |
WO2021205920A1 (en) * | 2020-04-06 | 2021-10-14 | 富士フイルム株式会社 | Method for producing coating film |
-
2001
- 2001-03-15 JP JP2001073726A patent/JP2002273308A/en active Pending
Cited By (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006064663A1 (en) * | 2004-12-13 | 2006-06-22 | Konica Minolta Photo Imaging, Inc. | Method of producing coating substance |
EP2310783B1 (en) * | 2008-08-06 | 2016-03-30 | Airbus Operations GmbH | Method for the contact-less detection of the degree of dryness of a coat of varnish on the exterior skin of an aircraft |
JP2010285498A (en) * | 2009-06-10 | 2010-12-24 | Nitto Denko Corp | Adhesive tape manufacturing system |
JP2013253729A (en) * | 2012-06-06 | 2013-12-19 | Nitto Denko Corp | Heating device, method of drying coated film and method of manufacturing coated film |
US9874517B2 (en) | 2014-03-24 | 2018-01-23 | Konica Minolta, Inc. | Processing apparatus and particle securing method |
JP2015184141A (en) * | 2014-03-24 | 2015-10-22 | コニカミノルタ株式会社 | Processing device and particle fixing method |
JP2015004686A (en) * | 2014-09-08 | 2015-01-08 | 関西ペイント株式会社 | Film for optical characteristic measurement and material for optical characteristic measurement |
CN110544752A (en) * | 2015-10-09 | 2019-12-06 | 东京毅力科创株式会社 | Substrate processing apparatus and method for controlling substrate processing apparatus |
JP2017073338A (en) * | 2015-10-09 | 2017-04-13 | 東京エレクトロン株式会社 | Inspection device, reduced-pressure drying device, and method for controlling reduced-pressure drying device |
CN110544752B (en) * | 2015-10-09 | 2022-01-07 | 东京毅力科创株式会社 | Substrate processing system and control method of substrate processing system |
JP2018161616A (en) * | 2017-03-24 | 2018-10-18 | 東芝テック株式会社 | Droplet dispensing device |
US11213813B2 (en) | 2017-03-24 | 2022-01-04 | Toshiba Tec Kabushiki Kaisha | Droplet dispensing apparatus |
JP7019303B2 (en) | 2017-03-24 | 2022-02-15 | 東芝テック株式会社 | Droplet dispenser |
CN110418956A (en) * | 2018-01-08 | 2019-11-05 | 株式会社Lg化学 | Monitor the device and method of the drying regime of electrode base board |
EP3674687A4 (en) * | 2018-01-08 | 2020-11-25 | Lg Chem, Ltd. | Method and apparatus for monitoring dry state of electrode substrate |
CN110418956B (en) * | 2018-01-08 | 2022-03-11 | 株式会社Lg化学 | Apparatus and method for monitoring dry state of electrode substrate |
US11448597B2 (en) | 2018-01-08 | 2022-09-20 | Lg Energy Solution, Ltd. | Method for monitoring dry state of electrode substrate |
WO2021205920A1 (en) * | 2020-04-06 | 2021-10-14 | 富士フイルム株式会社 | Method for producing coating film |
JPWO2021205920A1 (en) * | 2020-04-06 | 2021-10-14 | ||
JP7358631B2 (en) | 2020-04-06 | 2023-10-10 | 富士フイルム株式会社 | Coating film manufacturing method |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP3251844B1 (en) | Real time inspection and correction techniques for direct writing systems | |
JP2002273308A (en) | Dry state measuring device and coating film dryer equipped with the device | |
US11292271B2 (en) | Heating device, liquid discharge apparatus, and printer | |
US20100033545A1 (en) | Ink Jet Printer and a Process of Ink Jet Printing | |
EP2056096A2 (en) | Producing method of wired circuit board comprising an inspection | |
JPS597923B2 (en) | A device for measuring the amount of paint on an object | |
CA2550164A1 (en) | Method and apparatus for measuring grammage | |
US11883789B2 (en) | Microwave heating method, microwave heating apparatus, and chemical reaction method | |
EP3857187B1 (en) | Apparatus and method for composite sheet weight determinations | |
JP2003232737A (en) | Apparatus and method for optically measuring polymer quantity printed on substrate using optical characteristics of polymer | |
CN104160266A (en) | Articles incorporating thermographic phosphors, and methods and apparatus for authenticating such articles | |
JP2019136771A (en) | Solder mounting method and microwave heating device | |
CN117275858B (en) | Laser resistance-adjusting process method of thick film resistor and thick film resistor manufacturing process method | |
CN115621420A (en) | Electrode manufacturing apparatus, energy storage device manufacturing apparatus, liquid discharge apparatus, electrode manufacturing method, and recording medium | |
WO2000046033A1 (en) | Object-to-be-printed detector and print detecting method | |
JP2017140782A (en) | Recording device and method for registering recording medium | |
WO2016199683A1 (en) | Method for measuring basis weight, method for manufacturing laminated film, and device for measuring basis weight | |
JP2002168782A (en) | Particle percentage content detection device and coating machine equipped therewith | |
US20150268165A1 (en) | Processing apparatus and particle securing method | |
CA2351461C (en) | Gel point sensor | |
JP2020173958A (en) | Microwave heating device and microwave heating method | |
US7262867B2 (en) | Device to determine the thickness of a conductive layer | |
JP4135571B2 (en) | Sheet manufacturing equipment | |
JP2003220355A (en) | Coverage judgment device | |
US12005698B2 (en) | Heating device and liquid discharge apparatus |